AD80052BR

a Clock Recovery and Data Retiming Phase-Locked Loop AD800/AD802 FEATURES Standard Products 44.736 Mbps—DS-3 51.84 Mbps—STS-1 155.52 Mbps—STS-3 or STM-1 Accepts NRZ Data, No Preamble Required Recovered Clock and Retimed Data Outputs Phase-Locked Loop Type Clock Recovery—No Crystal Required Random Jitter: 208 Peak-to-Peak Pattern Jitter: Virtually Eliminated 10KH ECL Compatible Single Supply Operation: –5.2 V or +5 V Wide Operating Temperature Range: –408C to +858C PRODUCT DESCRIPTION The AD800 and AD802 employ a second order phase-locked loop architecture to perform clock recovery and data retiming on Non-Return to Zero, NRZ, data. This architecture is capable of supporting data rates between 20 Mbps and 160 Mbps. The products described here have been defined to work with standard telecommunications bit rates. 45 Mbps DS-3 and 52 Mbps STS-1 are supported by the AD800-45 and AD800-52 respectively. 155 Mbps STS-3 or STM-1 are supported by the AD802-155. Unlike other PLL-based clock recovery circuits, these devices do not require a preamble or an external VCXO to lock onto input data. The circuit acquires frequency and phase lock using two control loops. The frequency acquisition control loop initially acquires the clock frequency of the input data. The phase-lock loop then acquires the phase of the input data, and ensures that the phase of the output signals track changes in the phase of the input data. The loop damping of the circuit is dependent on the value of a user selected capacitor; this defines jitter peaking performance and impacts acquisition time. The devices exhibit 0.08 dB jitter peaking, and acquire lock on random or scrambled data within 4 × 105 bit periods when using a damping factor of 5. FUNCTIONAL BLOCK DIAGRAM CD DATA INPUT ØDET COMPENSATING ZERO ∑ LOOP FILTER VCO RECOVERED CLOCK OUTPUT fDET RETIMED DATA OUTPUT RETIMING DEVICE AD800/AD802 FRAC OUTPUT During the process of acquisition the frequency detector provides a Frequency Acquisition (FRAC) signal which indicates that the device has not yet locked onto the input data. This signal is a series of pulses which occur at the points of cycle slip between the input data and the synthesized clock signal. Once the circuit has acquired frequency lock no pulses occur at the FRAC output. The inclusion of a precisely trimmed VCO in the device eliminates the need for external components for setting center frequency, and the need for trimming of those components. The VCO provides a clock output within ± 20% of the device center frequency in the absence of input data. The AD800 and AD802 exhibit virtually no pattern jitter, due to the performance of the patented phase detector. Total loop jitter is 20° peak-to-peak. Jitter bandwidth is dictated by mask programmable fractional loop bandwidth. The AD800, used for data rates < 90 Mbps, has been designed with a nominal loop bandwidth of 0.1% of the center frequency. The AD802, used for data rates in excess of 90 Mbps, has a loop bandwidth of 0.08% of center frequency. All of the devices operate with a single +5 V or –5.2 V supply. REV. B Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 617/329-4700 Fax: 617/326-8703 (VEE = VMIN to VMAX, VCC = GND, TA = TMIN to TMAX, Loop Damping Factor = 5, unless otherwise noted) AD800/AD802–SPECIFICATIONS Parameter1 Condition AD800-45BQ Min Typ Max NOMINAL CENTER FREQUENCY OPERATING TEMPERATURE RANGE (TMIN to TMAX) K Grade B Grade Min AD800-52BR Typ Max 44.736 –40 AD802-155KR/BR Min Typ Max 51.84 85 –40 155.52 85 0 –40 Units MHz 70 85 °C °C TRACKING RANGE 43 45.5 49 53 155 156 Mbps CAPTURE RANGE 43 45.5 49 53 155 156 Mbps 14 18 30 37 Degrees Degrees 0.2 0.8 1 2.06 2.37 STATIC PHASE ERROR ρ = 1, TA = +25°C, VEE = –5.2 V ρ=1 RECOVERED CLOCK SKEW tRCS (Figure 1) SETUP TIME tSU (Figure 1) 0.2 2 3 10 11.5 0.6 1 TRANSITIONLESS DATA RUN OUTPUT JITTER JITTER TOLERANCE JITTER TRANSFER Damping Factor Capacitor, CD ζ = 1, Nominal ζ = 5, Nominal ζ = 10, Nominal Peaking ζ = 1, Nominal ζ = 5, Nominal ζ = 10, Nominal Bandwidth 0.2 2 3 10 11.5 0.6 1 240 ρ=1 27–1 PRN Sequence 223–1 PRN Sequence f = 10 Hz f = 2.3 kHz f = 30 kHz f = 1 MHz f = 30 Hz f = 300 Hz f = 2 kHz f = 20 kHz f = 6.5 kHz f = 65 kHz 2 2.5 2.5 240 2 2.5 2.5 4.7 4.7 2,500 3.5 5.4 5.4 4.7 4.7 2,500 240 Bit Periods 9.7 9.7 Degrees rms Degrees rms Degrees rms 3,000 7.6 0.9 Unit Intervals Unit Intervals Unit Intervals Unit Intervals Unit Intervals Unit Intervals Unit Intervals Unit Intervals Unit Intervals Unit Intervals 6.5 0.47 0.47 830 83 7.4 0.47 2.0 0.26 ns ns 8.2 0.22 0.82 6.8 0.15 0.68 2.2 0.047 0.22 nF µF µF TA = +25°C, VEE = –5.2 V TA = +25°C, VEE = –5.2 V TA = +25°C, VEE = –5.2 V 2 0.08 0.02 45 2 0.08 0.02 52 2 0.08 0.02 130 dB dB dB kHz ACQUISITION TIME ρ = 1/2 TA = +25°C VEE = –5.2 V ζ=1 ζ=5 ζ = 10 1 × 104 3 × 105 8 × 105 8 × 105 1 × 104 3 × 105 8 × 105 8 × 105 1.5 × 104 Bit Periods 4 × 105 8 × 105 Bit Periods 1.4 × 106 Bit Periods POWER SUPPLY Voltage (VMIN to VMAX) Current TA = +25°C –4.5 TA = +25°C, VEE = –5.2 V –5.2 125 INPUT VOLTAGE LEVELS Input Logic High, VIH Input Logic Low, VIH TA = +25°C OUTPUT VOLTAGE LEVELS Output Logic High, VOH Output Logic Low, VOL TA = +25°C INPUT CURRENT LEVELS Input Logic High, IIH Input Logic Low, IIL TA = +25°C OUTPUT SLEW TIMES Rise Time (tR) Fall Time (tF) TA = +25°C 20%–80% 80%–20% SYMMETRY Recovered Clock Output ρ = 1/2, TA = +25°C VEE = –5.2 V –5.5 170 180 –4.5 –5.2 125 –5.5 170 180 –4.5 –5.2 140 –5.5 180 205 Volts mA mA –1.084 –1.95 –0.72 –1.084 –1.594 –1.95 –0.72 –1.084 –1.594 –1.95 –0.72 Volts –1.594 Volts –1.084 –1.95 –0.72 –1.60 –0.72 –1.60 –0.72 –1.60 Volts Volts 125 80 µA µA 1.5 1.5 ns ns 55 % –1.084 –1.95 125 80 0.75 0.75 45 125 80 1.5 1.5 55 –1.084 –1.95 0.75 0.75 45 1.5 1.5 55 0.75 0.75 45 NOTES 1 Refer to Glossary for parameter definition. Specifications subject to change without notice. –2– REV. B AD800/AD802 ABSOLUTE MAXIMUM RATINGS* THERMAL CHARACTERISTICS Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –6 V Input Voltage (Pin 16 or Pin 17 to VCC) . . . . VEE to +300 mV Maximum Junction Temperature SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+150°C Ceramic DIP Package . . . . . . . . . . . . . . . . . . . . . . +175°C Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C Lead Temperature Range (Soldering 60 sec) . . . . . . . +300°C ESD Rating AD800 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1500 V AD802 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000 V SOIC Package Cerdip Package θJC θJA 22°C/W 25°C/W 75°C/W 90°C/W Use of a heatsink may be required depending on operating environment. GLOSSARY Maximum and Minimum Specifications Maximum and minimum specifications result from statistical analyses of measurements on multiple devices and multiple test systems. Typical specifications indicate mean measurements. Maximum and minimum specifications are calculated by adding or subtracting an appropriate guardband from the typical specification. Device-to-device performance variation and test system-to-test system variation contribute to each guardband. *Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to an absolute maximum rating condition for an extended period may adversely affect device reliability. Nominal Center Frequency DATAOUT 50% (PIN 2) This is the frequency that the VCO will operate at with no input signal present and the loop damping capacitor, CD, shorted. CLKOUT 50% (PIN 5) Tracking Range SETUP TIME tSU This is the range of input data rates over which the PLL will remain in lock. RECOVERED CLOCK SKEW, tRCS Capture Range This is the range of input data rates over which the PLL can acquire lock. Figure 1. Recovered Clock Skew and Setup (See Previous Page) Static Phase Error PIN DESCRIPTIONS Number Mnemonic Description 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 DATAOUT DATAOUT VCC2 CLKOUT CLKOUT VEE VEE VCC1 AVEE ASUBST CF2 CF1 AVCC VCC1 VEE DATAIN DATAIN SUBST FRAC 20 FRAC Differential Retimed Data Output Differential Retimed Data Output Digital Ground Differential Recovered Clock Output Differential Recovered Clock Output Digital VEE Digital VEE Digital Ground Analog VEE Analog Substrate Loop Damping Capacitor Input Loop Damping Capacitor Input Analog Ground Digital Ground Digital VEE Differential Data Input Differential Data Input Digital Substrate Differential Frequency Acquisition Indicator Output Differential Frequency Acquisition Indicator Output This is the steady-state phase difference, in degrees, between the recovered clock sampling edge and the optimum sampling instant, which is assumed to be halfway between the rising and falling edges of a data bit. Gate delays between the signals that define static phase error, and IC input and output signals prohibit direct measurement of static phase error. Data Transition Density, r This is a measure of the number of data transitions, from “0” to “1” and from “1” to “0,” over many clock periods. ρ is the ratio (0 ≤ ρ ≤ 1) of data transitions to clock periods. Jitter This is the dynamic displacement of digital signal edges from their long term average positions, measured in degrees rms, or Unit Intervals (UI). Jitter on the input data can cause dynamic phase errors on the recovered clock sampling edge. Jitter on the recovered clock causes jitter on the retimed data. Output Jitter This is the jitter on the retimed data, in degrees rms, due to a specific pattern or some psuedo-random input data sequence (PRN Sequence). Jitter Tolerance Jitter tolerance is a measure of the PLL’s ability to track a jittery input data signal. Jitter on the input data is best thought of as phase modulation, and is usually specified in unit intervals. ORDERING GUIDE Device Center Frequency Fractional Loop Bandwidth Description Operating Temperature Package Option AD800-45BQ AD800-52BR AD802-155BR AD802-155KR 44.736 MHz 51.84 MHz 155.52 MHz 155.52 MHz 0.1% 0.1% 0.08% 0.08% –40°C to +85°C –40°C to +85°C –40°C to +85°C 0°C to +70°C Q-20 R-20 R-20 R-20 REV. B 20-Pin Cerdip 20-Pin Plastic SOIC 20-Pin Plastic SOIC 20-Pin Plastic SOIC –3– AD800/AD802 The PLL must provide a clock signal which tracks this phase modulation in order to accurately retime jittered data. In order for the VCO output to have a phase modulation which tracks the input jitter, some modulation signal must be generated at the output of the phase detector (see Figure 21). The modulation output from the phase detector can only be produced by a phase error between the data input and the clock input. Hence, the PLL can never perfectly track jittered data. However, the magnitude of the phase error depends on the gain around the loop. At low frequencies the integrator provides very high gain, and thus very large jitter can be tracked with small phase errors between input data and recovered clock. At frequencies closer to the loop bandwidth, the gain of the integrator is much smaller, and thus less input jitter can be tolerated. The PLL data output will have a bit error rate less than 1 3 10–10 when in lock and retiming input data that has the specified jitter applied to it. Symmetry Symmetry is calculated as (100 3 on time)/period, where on time equals the time that the clock signal is greater than the midpoint between its “0” level and its “1” level. Bit Error Rate vs. Signal-to-Noise Ratio The AD800 and AD802 were designed to operate with standard ECL signal levels at the data input. Although not recommended, smaller input signals are tolerable. Figure 8, 14, and 20 show the bit error rate performance versus input signal-tonoise ratio for input signal amplitudes of full 900 mV ECL, and decreased amplitudes of 80 mV and 20 mV. Wideband amplitude noise is summed with the data signals as shown in Figure 2. The full ECL and 80 mV signals give virtually indistinguishable results. The 20 mV signals also provide adequate performance when in lock, but signal acquisition may be impaired. POWER COMBINER Jitter Transfer ∑ The PLL exhibits a low-pass filter response to jitter applied to its input data. DATA IN 0.47µF DIFFERENTIAL SIGNAL SOURCE Bandwidth D.U.T. AD800/AD802 0.47µF This describes the frequency at which the PLL attenuates sinusoidal input jitter by 3 dB. 50Ω 50Ω ∑ DATA IN POWER COMBINER Peaking This describes the maximum jitter gain of the PLL in dB. 75Ω 1.0µF POWER SPLITTER Damping Factor, z 180Ω –5.2V GND ζ describes how the PLL will track an input signal with a phase step. A greater value of ζ corresponds to less overshoot in the PLL response to a phase step. ζ is a standard constant in second FILTER 100MHz – AD802-155 33MHz – AD800-52 NOISE SOURCE order feedback systems. Acquisition Time This is the transient time, measured in bit periods, required for the PLL to lock on input data from its free-running state. USING THE AD800 AND THE AD802 SERIES Ground Planes Use of one ground plane for connections to both analog and digital grounds is recommended. Output signal sensitivity to power supply noise (PECL configuration, Figure 22) is less using one ground plane than when using separate analog and digital ground planes. Power Supply Connections Use of a 10 µF tantalum capacitor between VEE and ground is recommended. Use of 0.1 µF ceramic capacitors between IC power supply or substrate pins and ground is recommended. Power supply decoupling should take place as close to the IC as possible. Refer to schematics, Figure 22 and Figure 26, for advised connections. Sensitivity of IC output signals (PECL configuration, Figure 22) to high frequency power supply noise (at 2 3 the nominal data rate) can be reduced through the connection of signals AVCC and VCC1, and the addition of a bypass network. The type of bypass network to consider depends on the noise tolerance required. The more complex bypass network schemes tolerate greater power supply noise levels. Refer to Figures 23 and 24 for bypassing schemes and power supply sensitivity curves. Figure 2. Bit Error Rate vs. Signal-to-Noise Ratio Test: Block Diagram Transmission Lines Use of 50 Ω transmission lines are recommended for DATAIN, CLKOUT, DATAOUT, and FRAC signals. Terminations Termination resistors should be used for DATAIN, CLKOUT, DATAOUT, and FRAC signals. Metal, thick film, 1% tolerance resistors are recommended. Termination resistors for the DATAIN signals should be placed as close as possible to the DATAIN pins. Connections from VEE to lead resistors for DATAIN, DATAOUT, FRAC, and CLKOUT signals should be individual, not daisy chained. This will avoid crosstalk on these signals. Loop Damping Capacitor, C D A ceramic capacitor may be used for the loop damping capacitor. Input Buffer Use of an input buffer, such as a 10H116 Line Receiver IC, is suggested for an application where the DATAIN signals do not come directly from an ECL gate, or where noise immunity on the DATAIN signals is an issue. –4– REV. B Typical Characteristics–AD800/AD802 52 10 9 8 48 JITTER – Degrees rms CENTER FREQUENCY – MHz 50 46 44 42 7 6 5 4 3 2 40 1 38 –40 –20 0 20 40 60 80 0 –40 100 –20 0 TEMPERATURE – °C 20 40 60 80 100 TEMPERATURE – °C Figure 3. AD800-45 Center Frequency vs. Temperature Figure 4. AD800-45 Jitter vs. Temperature 100 52 UNIT INTERVALS – p-p DATA RATE – Mbps 50 48 46 44 42 AD800-45 10 DS-3 MASK 1 40 38 –40 0.1 –20 0 20 40 60 80 10 100 0 10 1 2 3 4 5 10 10 10 JITTER FREQUENCY – Hz TEMPERATURE – °C 10 10 6 Figure 6. AD800-45 Jitter Tolerance Figure 5. AD800-45 Capture and Tracking Range vs. Temperature 1E-1 55 CD = 0.68µF 51 5E-2 3E-2 2E-2 49 1E-2 BIT ERROR RATE DATA RATE – Mbps 53 47 45 43 41 20 80 1 S 1 erfc 2 2 N 2 1E-3 80 1E-4 1E-5 ECL 20 1E-7 39 1E-9 1E-11 37 35 0 0.05 0.10 0.15 0.20 0.25 10 0.30 INPUT JITTER – UI p-p Figure 7. AD800-45 Acquisition Range vs. Input Jitter REV. B 12 14 16 18 S/N – dB 20 22 24 Figure 8. AD800-45 Bit Error Rate vs. Input Jitter –5– 58 10 56 9 8 54 JITTER – Degrees rms CENTER FREQUENCY – MHz AD800/AD802 52 50 48 46 7 6 5 4 3 44 2 42 1 40 –40 –20 0 20 40 60 80 0 –40 100 –20 0 20 40 60 80 100 TEMPERATURE – °C TEMPERATURE – °C Figure 9. AD800-52 Center Frequency vs. Temperature Figure 10. AD800-52 Jitter vs. Temperature 100 58 56 UNIT INTERVALS – p-p DATA RATE – Mbps 54 52 50 48 46 AD800-52 10 OC-1 MASK 1 44 42 40 –40 0.1 –20 0 20 40 60 80 100 10 0 10 1 2 Figure 11. AD800-52 Capture and Tracking Range vs. Temperature 10 4 10 5 Figure 12. AD800-52 Jitter Tolerance 60 1E-1 CD = 0.68µF 58 5E-2 3E-2 2E-2 56 54 BIT ERROR RATE DATA RATE – Mbps 3 10 10 JITTER FREQUENCY – Hz TEMPERATURE – °C 52 50 48 46 44 80 20 1E-2 1 S 1 erfc 2 2 N 2 1E-3 1E-4 80 1E-5 1E-6 ECL 20 1E-8 1E-10 42 40 0 0.05 0.10 0.15 0.20 0.25 0.30 10 INPUT JITTER – UI p-p Figure 13. AD800-52 Acquisition Range vs. Input Jitter 12 14 16 18 S/N – dB 20 22 24 Figure 14. AD800-52 Bit Error Rate vs. Input Jitter –6– REV. B AD800/AD802 180 10 9 8 160 JITTER – Degrees rms CENTER FREQUENCY – MHz 170 150 140 130 7 6 5 4 3 120 2 110 1 100 –40 –20 0 20 40 60 80 0 –40 100 –20 0 TEMPERATURE – °C 20 40 60 80 100 TEMPERATURE – °C Figure 15. AD802-155 Center Frequency vs. Temperature Figure 16. AD802-155 Output Jitter vs. Temperature 100 200 180 AD802-155 10 UI – Pk-Pk DATA RATE – Mbps 190 170 160 1 150 140 130 –40 CCITT G.958 STM1 TYPE A MASK 0.1 –20 0 20 40 60 80 100 10 2 10 3 4 Figure 17. AD802-155 Capture Range, Tracking Range vs. Temperature 6 10 7 10 8 Figure 18. AD802-155 Jitter Tolerance 100 1E-1 5E-2 3E-2 2E-2 10 BIT ERROR RATE 1 1E-2 ECL 1 S 1 erfc 2 2 N 2 1E-3 1E-4 1E-5 1E-6 CCITT G.958 STM1 TYPE A MASK 0.1 80mV 20mV AD802 – 155 INPUT JITTER – UI 5 10 10 10 JITTER FREQUENCY – Hz TEMPERATURE – °C 80mV & ECL 20mV 1E-8 1E-10 1E-12 0 1 100 10 JITTER FREQUENCY – Hz 1000 10 Figure 19. AD802-155 Minimum Acquisition Range vs. Jitter Frequency, TMIN to TMAX VMIN to VMAX REV. B 12 14 16 18 S/N – dB 20 22 24 Figure 20. AD802-155 Bit Error Rate vs. Input Jitter –7– AD800/AD802 THEORY OF OPERATION The AD800 and AD802 are phase-locked loop circuits for recovery of clock from NRZ data. The architecture uses a frequency detector to aid initial frequency acquisition, refer to Figure 21 for a block diagram. Note the frequency detector is always in the circuit. When the PLL is locked, the frequency error is zero and the frequency detector has no further effect. Since the frequency detector is always in circuit, no control functions are needed to initiate acquisition or change mode after acquisition. The frequency detector also supplies a frequency acquisition (FRAC) output to indicate when the loop is acquiring lock. During the frequency acquisition process the FRAC output is a series of pulses of width equal to the period of the VCO. These pulses occur on the cycle slips between the data frequency and the VCO frequency. With a maximum density (1010 . . .) data pattern, every cycle slip will produce a pulse at FRAC. However, with random data, not every cycle slip produces a pulse. The density of pulses at FRAC increases with the density of data transitions. The probability that a cycle slip will produce a pulse increases as the frequency error approaches zero. After the frequency error has been reduced to zero, the FRAC output will have no further pulses. At this point the PLL begins the process of phase acquisition, with a settling time of roughly 2000 bit periods. Valid retimed data can be guaranteed by waiting 2000 bit periods after the last FRAC pulse has occurred. Jitter caused by variations of density of data transitions (pattern jitter) is virtually eliminated by use of a new phase detector (patented). Briefly, the measurement of zero phase error does not cause the VCO phase to increase to above the average run rate set by the data frequency. The jitter created by a 27–1 pseudo-random code is 1/2 degree, and this is small compared to random jitter. The damping ratio of the phase-locked loop is user programmable with a single external capacitor. At 155 MHz a damping ratio of 10 is obtained with a 0.22 µF capacitor. More generally, the damping ratio scales as 1.7 × f DATA × CD . At 155 MHz a damping ratio of 1 is obtained with a 2.2 nF capacitor. A lower damping ratio allows a faster frequency acquisition; generally the acquisition time scales directly with the capacitor value. However, at damping ratios approaching one, the acquisition time no longer scales directly with the capacitor value. The acquisition time has two components: frequency acquisition and phase acquisition. The frequency acquisition always scales with capacitance, but the phase acquisition is set by the loop bandwidth of the PLL and is independent of the damping ratio. Thus, the 0.08% fractional loop bandwidth sets a minimum acquisition time of 15,000 bit periods. Note the acquisition time for a damping factor of 1 is specified as 15,000 bit periods. This comprises 13,000 bit periods for frequency acquisition and 2,000 periods for phase acquisition. Compare this to the 400,000 bit periods acquisition time specified for a damping ratio of 5; this consists entirely of frequency acquisition, and the 2,000 bit periods of phase acquisition is negligible. While lower damping ratio affords faster acquisition, it also allows more peaking in the jitter transfer response (jitter peaking). For example, with a damping ratio of 10 the jitter peaking is 0.02 dB, but with a damping factor of 1, the peaking is 2 dB. DATA INPUT Ø DET TS + 1 ∑ 1 S VCO f DET The jitter bandwidth for the AD802-155 is 0.08% of the center frequency. This figure is chosen so that sinusoidal input jitter at 130 kHz will be attenuated by 3 dB. The jitter bandwidths of the AD800-45 and AD800-52 are 0.1% of the respective center frequencies. The jitter bandwidth of the AD800 or the AD802 is mask programmable from 0.01% to 1% of the center frequency. A device with a very low loop bandwidth (0.01% of the center frequency) could effectively filter (clean up) a jittery timing reference. Consult the factory if your application requires a special loop bandwidth. RECOVERED CLOCK OUTPUT RETIMING DEVICE RETIMED DATA OUTPUT FRAC OUTPUT Figure 21. AD800 and AD802 Block Diagram –8– REV. B AD800/AD802 5.0V C5 0.1 5.0V C13 0.1 R13 154 R1 100 R2 100 C3 0.1 J1 R10 154 R9 154 DATAOUT R5 100 R6 100 R12 154 R7 100 C6 0.1 J3 CLKOUT 1 DATAOUT 2 DATAOUT 3 VCC2 R11 154 4 CLKOUT DATAIN 17 CLKOUT DATAIN 16 5 J4 CLKOUT 6 R8 100 C7 0.1 R4 100 R3 100 5.0V C10 0.1 FRAC 19 VEE VCC1 VEE AV CC VCC1 8 C8 0.1 9 AV EE 10 ASUBST Z1 IN 5.0V C2 10µF BYPASS NETWORK FRAC FRAC R16 100 C15 0.1 SUBST 18 VEE 7 C17 0.1 FRAC 20 C9 0.1 5.0V C4 0.1 5.0V R18 100 C14 0.1 R17 100 R15 100 DATAOUT J2 R14 154 R19 130 R20 130 15 R21 80.6 14 12 CF2 11 5.0V 5.0V C11 C16 0.1 CD 16 2 15 3 14 4 13 Z2 10H116 5 C12 0.1 13 CF1 R22 80.6 1 R23 130 R24 130 12 6 11 7 10 8 9 C19 0.1 J6 DATAIN DATAIN C20 0.1 AD800/802 OUT J5 R26 80.6 R25 80.6 C21 0.1 5.0V Figure 22. Evaluation Board Schematic, Positive Supply Table I. Evaluation Board, Positive Supply: Components List Reference Designator Description Quantity R1–8, R15–18 R9–14 R19, 20, 23, 24 R21, 22, 25, 26 CD C2 C3–C21 Z1 Z2 Resistor, 100 Ω, 1% Resistor, 154 Ω, 1% Resistor, 130 Ω, 1% Resistor, 80.6 Ω, 1% Capacitor, Loop Damping (See Specifications Page) Capacitor, 10 µF, Tantalum Capacitor, 0.1 µF, Ceramic Chip AD800/AD802 10H116, ECL Line Receiver 12 6 4 4 1 1 17 1 1 3.0 (A) IN 0.1µF TO DEVICE (B) IN 0.1µF BEAD WITH ONE LOOP IN C2 10µF (C) IN 5.0V (A) 2.5 BEADS WITH ONE LOOP BEAD WITH TWO LOOPS 0.1µF BEAD WITH TWO LOOPS (D) IN TO DEVICE JITTER – ns p-p (B) BYPASS NETWORK (A, B, C, OR D) TO DEVICE TO DEVICE (C) 1.5 1.0 (D) BEAD WITH TWO LOOPS 0.5 0.1µF TO DEVICE BYPASS NETWORK COMPONENTS: CAPACITOR ..........CERAMIC CHIP FERRITE BEAD......1/4 IN. STACKPOLE CARBO 57-1392 0 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 NOISE – V p-p @ 311MHz Figure 23. Bypass Network Schemes REV. B 2.0 Figure 24. AD802-155 Output Jitter vs. Supply Noise (PECL Configuration) –9– AD800/AD802 NOISE IN 50Ω 10 TURNS SENSE 0.47µF 0.47µF 5V 10µF AD802-155 BYPASS NETWORK (A, B, C, OR D) IN MICRO METALS T50-10 TO DEVICE PINS 8, 13, 14 PIN 3 PINS 6, 7, 9 10, 15, 18 Figure 25. Power Supply Noise Sensitivity Test Circuit, PECL Configuration –5.2V R2 100 R1 100 J1 R10 154 –5.2V C3 0.1 R9 154 C12 0.1 R21 274 DATAOUT DATAOUT R5 100 J2 R6 100 –5.2V J3 R12 154 R7 100 R11 154 J4 CLKOUT R4 100 DATAOUT FRAC 20 2 DATAOUT FRAC 19 FRAC FRAC C8 0.1 C4 0.1 CLKOUT 1 R22 274 R8 100 R3 100 C5 0.1 3 VCC2 4 CLKOUT DATAIN 17 5 CLKOUT DATAIN 16 6 VEE VEE 15 7 VEE VCC1 14 8 VCC1 9 –5.2V –5.2V SUBST 18 AV EE 10 ASUBST C2 10 C6 0.1 –5.2V C9 0.1 R15 130 R16 130 16 2 15 3 14 Z2 4 13 10H116 –5.2V C7 0.1 —5.2V 1 5 12 AVCC 13 6 11 CF1 12 7 10 8 9 CF2 R13 80.6 R14 80.6 C11 0.1 R20 130 R19 130 J5 DATAIN CD 11 J6 DATAIN Z1 AD800/802 –5.2V R17 80.6 C10 0.1 R18 80.6 Figure 26. Evaluation Board Schematic, Negative Supply Table II. Evaluation Board, Negative Supply: Components List Reference Designator Description Quantity R1–8 R9–12 R13, 14, 17, 18 R15, 16, 19, 20 R21, 22 CD C2 C3–C12 Z1 Z2 Resistor, 100 Ω, 1% Resistor, 154 Ω, 1% Resistor, 80.6 Ω, 1% Resistor, 130 Ω, 1% Resistor, 274 Ω, 1% Capacitor, Loop Damping (See Specifications Page) Capacitor, 10 µF, Tantalum Capacitor, 0.1 µF, Ceramic Chip AD800/AD802 10H116, ECL Line Receiver 8 4 4 4 2 1 1 10 1 1 –10– REV. B AD800/AD802 Figure 27. Negative Supply Configuration: Component Side (Top Layer) Figure 29. Positive Supply Configuration: Component Side (Top Layer) Figure 28. Negative Supply Configuration: Solder Side Figure 30. Positive Supply Configuration: Solder Side REV. B –11– AD800/AD802 OUTLINE DIMENSIONS Dimensions shown in inches and (mm). 20-Pin Small Outline IC Package (R-20) 20 C1725a–7.5–12/93 0.512 (13.00) 0.496 (12.60) 11 0.300 (7.60) 0.292 (7.40) 0.419 (10.65) 0.394 (10.00) 1 10 0.50 (1.27) BSC 0.019 (0.48) 0.014 (0.36) 0.104 (2.64) 0.093 (2.36) 0.011 (0.28) 0.004 (0.10) 0.015 (0.38) 0.007 (0.18) 0.050 (1.27) 0.016 (0.40) 20-Pin Cerdip Package (Q-20) 0.005 (0.13) MIN 0.098 (2.49) MAX 20 11 1 10 0.310 (7.87) 0.220 (5.59) PIN 1 1.060 (26.92) MAX 0.060 (1.52) 0.015 (0.38) 0.200 (5.08) MAX 0.150 (3.81) MIN 0.200 (5.08) 0.125 (3.18) 0.100 (2.54) BSC 0.070 (1.78) 0.030 (0.76) 0.015 (0.38) 0.008 (0.20) 15 ° 0° SEATING PLANE PRINTED IN U.S.A. 0.023 (0.58) 0.014 (0.36) 0.320 (8.13) 0.290 (7.37) –12– REV. B