5 kV, 7-Channel,
SPIsolator Digital Isolators for SPI
ADuM4151/ADuM4152/ADuM4153
Data Sheet
FUNCTIONAL BLOCK DIAGRAMS
VDD1 1
ENCODE
DECODE
MCLK 3
ENCODE
DECODE
MO 4
DECODE
ENCODE
MI 5
ENCODE
DECODE
VIA 7
VIB 8
GENERAL DESCRIPTION
The ADuM4151/ADuM4152/ADuM4153 isolators also provide
three additional independent low data rate isolation channels in
three different channel direction combinations. Data in the slow
channels is sampled and serialized for a 250 kbps data rate with
up to 2.5 µs of jitter in the low speed channels.
17 SI
16 SO
14 VOA
CONTROL
BLOCK
CONTROL
BLOCK
VOC 9
13 VOB
12 VIC
11 GND2
GND1 10
Figure 1. ADuM4151 Functional Block Diagram
ADuM4152
20
VDD2
GND1 2
ENCODE
DECODE
19
GND2
MCLK 3
ENCODE
DECODE
18
SCLK
MO 4
DECODE
ENCODE
17
SI
DECODE
16
SO
MSS 6
15
SSS
VIA 7
14
VOA
13
VIB
MI 5
The ADuM4151/ADuM4152/ADuM41531 are 7-channel,
SPIsolator™ digital isolators optimized for isolated serial peripheral
interfaces (SPIs). Based on the Analog Devices, Inc., iCoupler®
chip scale transformer technology, the low propagation delay in
the CLK, MO/SI, MI/SO, and SS SPI bus signals supports SPI
clock rates of up to 17 MHz. These channels operate with 14 ns
propagation delay and 1 ns jitter to optimize timing for SPI.
18 SCLK
VOB 8
ENCODE
CONTROL
BLOCK
CONTROL
BLOCK
VOC 9
12
VIC
GND1 10
11
GND2
12370-002
Industrial programmable logic controllers (PLCs)
Sensor isolation
19 GND2
15 SSS
MSS 6
VDD1 1
APPLICATIONS
20 VDD2
ADuM4151
GND1 2
Figure 2. ADuM4152 Functional Block Diagram
VDD1 1
ADuM4153
20
VDD2
GND1 2
ENCODE
DECODE
19
GND2
MCLK 3
ENCODE
DECODE
18
SCLK
SI
MO 4
DECODE
ENCODE
17
MI 5
ENCODE
DECODE
16
SO
MSS 6
15
SSS
VOA 7
14
VIA
VOB 8
CONTROL
BLOCK
CONTROL
BLOCK
13
VIB
VOC 9
12
VIC
GND1 10
11
GND2
12370-003
Supports up to 17 MHz SPI clock speed
4 high speed, low propagation delay, SPI signal isolation
channels
Three 250 kbps data channels
20-lead SOIC_IC package with 8.3 mm creepage
High temperature operation: 125°C
High common-mode transient immunity: >25 kV/µs
Safety and regulatory approvals
UL recognition per UL 1577
5000 V rms for 1 minute SOIC long package
CSA Component Acceptance Notice 5A
VDE certificate of conformity
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12
Maximum working insulation voltage (VIORM): 849 V peak
12370-001
FEATURES
Figure 3. ADuM4153 Functional Block Diagram
1
Protected by U.S. Patents 5,952,849; 6,873,065; 6,262,600; and 7,075,329. Other patents are pending.
Rev. B
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ADuM4151/ADuM4152/ADuM4153
Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
Recommended Operating Conditions .................................... 12
Applications ....................................................................................... 1
Absolute Maximum Ratings ......................................................... 13
General Description ......................................................................... 1
ESD Caution................................................................................ 13
Functional Block Diagrams ............................................................. 1
Pin Configurations and Function Descriptions ......................... 14
Revision History ............................................................................... 2
Typical Performance Characteristics ........................................... 17
Specifications..................................................................................... 3
Applications Information .............................................................. 18
Electrical Characteristics—5 V Operation................................ 3
Introduction ................................................................................ 18
Electrical Characteristics—3.3 V Operation ............................ 5
Printed Circuit Board (PCB) Layout ....................................... 19
Electrical Characteristics—Mixed 5 V/3.3 V Operation ........ 7
Propagation Delay Related Parameters ................................... 19
Electrical Characteristics—Mixed 3.3 V/5 V Operation ........ 9
DC Correctness and Magnetic Field Immunity ..................... 19
Package Characteristics ............................................................. 10
Power Consumption .................................................................. 20
Regulatory Information ............................................................. 11
Insulation Lifetime ..................................................................... 20
Insulation and Safety Related Specifications .......................... 11
Outline Dimensions ....................................................................... 22
DIN V VDE V 0884-10 (VDE V 0884-10): 2006-12
Insulation Characteristics.......................................................... 12
Ordering Guide .......................................................................... 22
REVISION HISTORY
7/2017—Rev. A to Rev. B
Changes to Logic High Output Voltages Parameter, Table 6 ...... 6
Changes to Logic High Output Voltages Parameter, Table 9 ...... 8
Changes to Logic High Output Voltages Parameter, Table 12 ... 10
Changes to Table 20, Pin 3, Direction Column .......................... 14
Changes to Table 21, Pin 3, Direction Column .......................... 15
Change to Table 22, Pin 3, Direction Column............................ 16
3/2015—Rev. 0 to Rev. A
Changes to Features Section............................................................ 1
Changes to Table 2 ............................................................................ 3
Changes to Table 5 ............................................................................ 5
Changes to Table 8 ............................................................................ 7
Changes to Table 11 .......................................................................... 9
Changes to Table 14 ........................................................................ 11
Changes to Table 16 ........................................................................ 12
Changes to High Speed Channels Section .................................. 18
10/2014—Revision 0: Initial Version
Rev. B | Page 2 of 22
Data Sheet
ADuM4151/ADuM4152/ADuM4153
SPECIFICATIONS
ELECTRICAL CHARACTERISTICS—5 V OPERATION
All typical specifications are at TA = 25°C and VDD1 = VDD2 = 5 V. Minimum and maximum specifications apply over the entire
recommended operation range: 4.5 V ≤ VDD1 ≤ 5.5 V, 4.5 V ≤ VDD2 ≤ 5.5 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching
specifications are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted.
Table 1. Switching Specifications
Parameter
MCLK, MO, SO
SPI Clock Rate
Data Rate Fast (MO, SO)
Propagation Delay
Pulse Width
Pulse Width Distortion
Codirectional Channel Matching 1
Jitter, High Speed
MSS
Data Rate Fast
Propagation Delay
Pulse Width
Pulse Width Distortion
Setup Time 2
Jitter, High Speed
VIA, VIB, VIC
Data Rate Slow
Propagation Delay
Pulse Width
Jitter, Low Speed
VIx 3 Minimum Input Skew 4
Symbol
SPIMCLK
DRFAST
tPHL, tPLH
PW
PWD
tPSKCD
JHS
DRFAST
tPHL, tPLH
PW
PWD
MSSSETUP
JHS
DRSLOW
tPHL, tPLH
PW
JLS
tVIx SKEW3
Min
A Grade
Typ
Max
Min
1
2
25
100
B Grade
Typ
Max
12
12.5
3
3
2
2
1
21
1
2
25
100
21
1.5
3
10
1
1
250
2.6
0.1
4
2.5
10
34
25
12.5
3
0.1
4
17
34
14
250
2.6
2.5
10
Unit
MHz
Mbps
ns
ns
ns
ns
ns
Test Conditions/Comments
Within PWD limit
50% input to 50% output
Within PWD limit
|tPLH − tPHL|
Mbps
ns
ns
ns
ns
ns
Within PWD limit
50% input to 50% output
Within PWD limit
|tPLH − tPHL|
kbps
µs
µs
µs
ns
Within PWD limit
50% input to 50% output
Within PWD limit
Codirectional channel matching is the absolute value of the difference in propagation delays between any two channels with inputs on the same side of the isolation barrier.
The MSS signal is glitch filtered in both speed grades, whereas the other fast signals are not glitch filtered in the B grade. To guarantee that MSS reaches the output
ahead of another fast signal, set up MSS prior to the competing signal by different times depending on speed grade.
3
VIx = VIA, VIB, or VIC.
4
An internal asynchronous clock not available to users samples the low speed signals. If edge sequence in codirectional channels is critical to the end application, the
leading pulse must be at least 1 tVIx SKEW time ahead of a later pulse to guarantee the correct order or simultaneous arrival at the output.
1
2
Table 2. Supply Current
Device Number
ADuM4151
ADuM4152
ADuM4153
Symbol
IDD1
IDD2
IDD1
IDD2
IDD1
IDD2
1 MHz, A Grade
Min
Typ
Max
4.0
8.5
6.0
11
4.8
8.5
6.5
10.5
4.0
8.5
6.0
10.5
17 MHz, B Grade
Min
Typ
Max
14.0
22
13.5
23
14.0
21.5
14.0
22.5
14.0
22
13.3
21
Rev. B | Page 3 of 22
Unit
mA
mA
mA
mA
mA
mA
Test Conditions/Comments
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
ADuM4151/ADuM4152/ADuM4153
Data Sheet
Table 3. For All Models 1, 2, 3
Parameter
DC SPECIFICATIONS
MCLK, MSS, MO, SO, VIA, VIB, VIC
Logic High Input Threshold
Logic Low Input Threshold
Input Hysteresis
Input Current per Channel
SCLK, SSS, MI, SI, VOA, VOB, VOC
Logic High Output Voltages
VOH
Logic Low Output Voltages
VOL
VDD1, VDD2 Undervoltage Lockout
Supply Current per High Speed Channel
Dynamic Input Supply Current
Dynamic Output Supply Current
Supply Current for All Low Speed Channels
Quiescent Side 1 Current
Quiescent Side 2 Current
AC SPECIFICATIONS
Output Rise/Fall Time
Common-Mode Transient Immunity 4
Symbol
Min
VIH
VIL
VIHYST
II
0.7 × VDDx
Typ
Max
0.3 × VDDx
500
+0.01
−1
Test Conditions/Comments
V
V
mV
µA
0 V ≤ VINPUT ≤ VDDx
UVLO
5.0
4.8
0.0
0.2
2.6
IDDI(D)
IDDO(D)
0.080
0.046
mA/Mbps
mA/Mbps
IDD1(Q)
IDD2Q)
4.3
6.1
mA
mA
2.5
35
ns
kV/µs
tR/tF
|CM|
VDDx − 0.1
VDDx − 0.4
+1
Unit
25
0.1
0.4
V
V
V
V
V
IOUTPUT = −20 µA, VINPUT = VIH
IOUTPUT = −4 mA, VINPUT = VIH
IOUTPUT = 20 µA, VINPUT = VIL
IOUTPUT = 4 mA, VINPUT = VIL
10% to 90%
VINPUT = VDDx, VCM = 1000 V,
transient magnitude = 800 V
VDDx = VDD1 or VDD2.
VINPUT is the input voltage of any of the MCLK, MSS, MO, SO, VIA, VIB, or VIC pins.
3
IOUTPUT is the output current of any of the SCLK, SSS, MI, SI, VOA, VOB, or VOC pins.
4
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining output voltages within the VOH and VOL limits. The common-mode
voltage slew rates apply to both rising and falling common-mode voltage edges.
1
2
Rev. B | Page 4 of 22
Data Sheet
ADuM4151/ADuM4152/ADuM4153
ELECTRICAL CHARACTERISTICS—3.3 V OPERATION
All typical specifications are at TA = 25°C and VDD1 = VDD2 = 3.3 V. Minimum and maximum specifications apply over the entire
recommended operation range: 3.0 V ≤ VDD1 ≤ 3.6 V, 3.0 V ≤ VDD2 ≤ 3.6 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching
specifications are tested with CL =15 pF and CMOS signal levels, unless otherwise noted.
Table 4. Switching Specifications
Parameter
MCLK, MO, SO
SPI Clock Rate
Data Rate Fast (MO, SO)
Propagation Delay
Pulse Width
Pulse Width Distortion
Codirectional Channel
Matching1
Jitter, High Speed
MSS
Data Rate Fast
Propagation Delay
Pulse Width
Pulse Width Distortion
Setup Time 2
Jitter, Low Speed
VIA, VIB, VIC
Data Rate Slow
Propagation Delay
Pulse Width
Jitter, Low Speed
VIx 3 Minimum Input Skew 4
Symbol
SPIMCLK
DRFAST
tPHL, tPLH
PW
PWD
tPSKCD
Min
DRSLOW
tPHL, tPLH
PW
JLS
tVIx SKEW3
Min
B Grade
Typ Max
1
2
30
100
12.5
34
20
12.5
3
4
JHS
DRFAST
tPHL, tPLH
PW
PWD
MSSSETUP
JLS
A Grade
Typ Max
3
2
1
1
2
30
100
12.5
1.5
3
10
2.5
2.5
250
2.6
0.1
4
0.1
4
2.5
10
Test Conditions/Comments
MHz
Mbps
ns
ns
ns
ns
Within PWD limit
50% input to 50% output
Within PWD limit
|tPLH − tPHL|
ns
34
30
3
Unit
250
2.6
2.5
10
Mbps
ns
ns
ns
ns
ns
Within PWD limit
50% input to 50% output
Within PWD limit
|tPLH − tPHL|
kbps
µs
µs
µs
ns
Within PWD limit
50% input to 50% output
Within PWD limit
|tPLH − tPHL|
Codirectional channel matching is the absolute value of the difference in propagation delays between any two channels with inputs on the same side of the isolation barrier.
The MSS signal is glitch filtered in both speed grades, whereas the other fast signals are not glitch filtered in the B grade. To guarantee that MSS reaches the output
ahead of another fast signal, set up MSS prior to the competing signal by different times depending on speed grade.
3
VIx = VIA, VIB, or VIC.
4
An internal asynchronous clock not available to users samples the low speed signals. If edge sequence in codirectional channels is critical to the end application, the
leading pulse must be at least 1 tVIx SKEW time ahead of a later pulse to guarantee the correct order or simultaneous arrival at the output.
1
2
Table 5. Supply Current
Device Number
ADuM4151
ADuM4152
ADuM4153
Symbol
IDD1
IDD2
IDD1
IDD2
IDD1
IDD2
1 MHz, A Grade/B Grade
Min
Typ
Max
3.8
7
5.1
8
3.7
6.5
5.2
8
3.7
6.5
5.2
9
17 MHz, B Grade
Min
Typ
Max
10.5
18
9.0
17
11.7
18
10.0
16
11.7
18
10.0
15
Rev. B | Page 5 of 22
Unit
mA
mA
mA
mA
mA
mA
Test Conditions/Comments
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
ADuM4151/ADuM4152/ADuM4153
Data Sheet
Table 6. For All Models 1, 2, 3
Parameter
DC SPECIFICATIONS
MCLK, MSS, MO, SO, VIA, VIB, VIC
Logic High Input Threshold
Logic Low Input Threshold
Input Hysteresis
Input Current per Channel
SCLK, SSS, MI, SI, VOA, VOB, VOC
Logic High Output Voltages
VOH
Logic Low Output Voltages
VOL
VDD1, VDD2 Undervoltage Lockout
Supply Current per High Speed Channel
Dynamic Input Supply Current
Dynamic Output Supply Current
Supply Current for All Low Speed Channels
Quiescent Side 1 Current
Quiescent Side 2 Current
AC SPECIFICATIONS
Output Rise/Fall Time
Common-Mode Transient Immunity 4
Symbol
Min
VIH
VIL
VIHYST
II
0.7 × VDDx
Typ
Max
0.3 × VDDx
500
+0.01
−1
Test Conditions/Comments
V
V
mV
µA
0 V ≤ VINPUT ≤ VDDx
UVLO
3.3
3.1
0.0
0.2
2.6
IDDI(D)
IDDO(D)
0.086
0.019
mA/Mbps
mA/Mbps
IDD1(Q)
IDD2Q)
2.9
4.7
mA
mA
2.5
35
ns
kV/µs
tR/tF
|CM|
VDDx − 0.1
VDDx − 0.4
+1
Unit
25
0.1
0.4
V
V
V
V
V
IOUTPUT = −20 µA, VINPUT = VIH
IOUTPUT = −4 mA, VINPUT = VIH
IOUTPUT = 20 µA, VINPUT = VIL
IOUTPUT = 4 mA, VINPUT = VIL
10% to 90%
VINPUT = VDDx, VCM = 1000 V,
transient magnitude = 800 V
VDDx = VDD1 or VDD2.
VINPUT is the input voltage of any of the MCLK, MSS, MO, SO, VIA, VIB, or VIC pins.
3
IOUTPUT is the output current of any of the SCLK, SSS, MI, SI, VOA, VOB, or VOC pins.
4
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining output voltages within the VOH and VOL limits. The common-mode
voltage slew rates apply to both rising and falling common-mode voltage edges.
1
2
Rev. B | Page 6 of 22
Data Sheet
ADuM4151/ADuM4152/ADuM4153
ELECTRICAL CHARACTERISTICS—MIXED 5 V/3.3 V OPERATION
All typical specifications are at TA = 25°C, VDD1 = 5 V, and VDD2 = 3.3 V. Minimum and maximum specifications apply over the entire
recommended operation range: 4.5 V ≤ VDD1 ≤ 5.5 V, 3.0 V ≤ VDD2 ≤ 3.6 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching
specifications are tested with CL =15 pF and CMOS signal levels, unless otherwise noted.
Table 7. Switching Specifications
Parameter
MCLK, MO, SO
SPI Clock Rate
Data Rate Fast (MO, SO)
Propagation Delay
Pulse Width
Pulse Width Distortion
Codirectional Channel
Matching1
Jitter, High Speed
MSS
Data Rate Fast
Propagation Delay
Pulse Width
Pulse Width Distortion
Setup Time 2
Jitter, High Speed
VIA, VIB, VIC
Data Rate Slow
Propagation Delay
Pulse Width
Jitter, Low Speed
VIx 3 Minimum Input Skew 4
Symbol
SPIMCLK
DRFAST
tPHL, tPLH
PW
PWD
tPSKCD
Min
DRSLOW
tPHL, tPLH
PW
JLS
tVIx SKEW3
Min
B Grade
Typ Max
1
2
27
100
15.6
34
16
12.5
3
3
JHS
DRFAST
tPHL, tPLH
PW
PWD
MSSSETUP
JHS
A Grade
Typ Max
3
2
1
1
2
27
100
12.5
1.5
3
10
1
1
250
2.6
0.1
4
0.1
4
2.5
10
Test Conditions/Comments
MHz
Mbps
ns
ns
ns
ns
1/(4 × tPHL)
Within PWD limit
50% input to 50% output
Within PWD limit
|tPLH − tPHL|
ns
34
26
3
Unit
250
2.6
2.5
10
Mbps
ns
ns
ns
ns
ns
Within PWD limit
50% input to 50% output
Within PWD limit
|tPLH − tPHL|
kbps
µs
µs
µs
ns
Within PWD limit
50% input to 50% output
Within PWD limit
Codirectional channel matching is the absolute value of the difference in propagation delays between any two channels with inputs on the same side of the isolation barrier.
The MSS signal is glitch filtered in both speed grades, whereas the other fast signals are not glitch filtered in the B grade. To guarantee that MSS reaches the output
ahead of another fast signal, set up MSS prior to the competing signal by different times depending on speed grade.
3
VIx = VIA, VIB, or VIC.
4
An internal asynchronous clock not available to users samples the low speed signals. If edge sequence in codirectional channels is critical to the end application, the
leading pulse must be at least 1 tVIx SKEW time ahead of a later pulse to guarantee the correct order or simultaneous arrival at the output.
1
2
Table 8. Supply Current
Device Number
ADuM4151
ADuM4152
ADuM4153
Symbol
IDD1
IDD2
IDD1
IDD2
IDD1
IDD2
1 MHz, A Grade/B Grade
Min
Typ
Max
4.0
8.5
4.6
8
4.8
8.5
5.0
8
4.0
8.5
4.7
9
17 MHz, B Grade
Min
Typ
Max
13.9
22
9.0
17
14.0
21.5
10.0
16
14.0
22
10.0
15
Rev. B | Page 7 of 22
Unit
mA
mA
mA
mA
mA
mA
Test Conditions/Comments
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
ADuM4151/ADuM4152/ADuM4153
Data Sheet
Table 9. For All Models 1, 2, 3
Parameter
DC SPECIFICATIONS
MCLK, MSS, MO, SO, VIA, VIB, VIC
Logic High Input Threshold
Logic Low Input Threshold
Input Hysteresis
Input Current per Channel
SCLK, SSS, MI, SI, VOA, VOB, VOC
Logic High Output Voltages
Logic Low Output Voltages
VDD1, VDD2 Undervoltage Lockout
Supply Current for All Low Speed Channels
Quiescent Side 1 Current
Quiescent Side 2 Current
AC SPECIFICATIONS
Output Rise/Fall Time
Common-Mode Transient Immunity 4
Symbol
Min
VIH
VIL
VIHYST
II
0.7 × VDDx
VOH
VDDX − 0.1
VDDX − 0.4
Typ
Max
0.3 × VDDx
500
+0.01
−1
+1
Unit
Test Conditions/Comments
V
V
mV
µA
0 V ≤ VINPUT ≤ VDDx
UVLO
VDDX
VDDX – 2.0
0.0
0.2
2.6
IDD1(Q)
IDD2Q)
4.3
4.7
mA
mA
2.5
35
ns
kV/µs
VOL
tR/tF
|CM|
25
0.1
0.4
V
V
V
V
V
IOUTPUT = −20 µA, VINPUT = VIH
IOUTPUT = −4 mA, VINPUT = VIH
IOUTPUT = 20 µA, VINPUT = VIL
IOUTPUT = 4 mA, VINPUT = VIL
10% to 90%
VINPUT = VDDX, VCM = 1000 V,
transient magnitude = 800 V
VDDx = VDD1 or VDD2.
VINPUT is the input voltage of any of the MCLK, MSS, MO, SO, VIA, VIB, or VIC pins.
3
IOUTPUT is the output current of any of the SCLK, SSS, MI, SI, VOA, VOB, VOC pins.
4
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining output voltages within the VOH and VOL limits. The common-mode
voltage slew rates apply to both rising and falling common-mode voltage edges.
1
2
Rev. B | Page 8 of 22
Data Sheet
ADuM4151/ADuM4152/ADuM4153
ELECTRICAL CHARACTERISTICS—MIXED 3.3 V/5 V OPERATION
All typical specifications are at TA = 25°C, VDD1 = 3.3 V, and VDD2 = 5 V. Minimum and maximum specifications apply over the entire
recommended operation range: 3.0 V ≤ VDD1 ≤ 3.6 V, 4.5 V ≤ VDD2 ≤ 5.5 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching
specifications are tested with CL =15 pF and CMOS signal levels, unless otherwise noted.
Table 10. Switching Specifications
Parameter
MCLK, MO, SO
SPI Clock Rate
Data Rate Fast (MO, SO)
Propagation Delay
Pulse Width
Pulse Width Distortion
Codirectional Channel Matching 1
Jitter, High Speed
MSS
Data Rate Fast
Propagation Delay
Pulse Width
Pulse Width Distortion
Setup Time 2
Jitter, High Speed
VIA, VIB, VIC
Data Rate
Propagation Delay
Pulse Width
Jitter, Low Speed
VIx 3 Minimum Input Skew 4
Symbol
SPIMCLK
DRFAST
tPHL, tPLH
PW
PWD
tPSKCD
JHS
DRFAST
tPHL, tPLH
PW
PWD
MSSSETUP
JHS
DRSLOW
tPHL, tPLH
PW
JLS
tVIx SKEW3
Min
A Grade
Typ
Max
Min
B Grade
Typ
Max
1
2
27
100
15.6
34
16
12.5
3
5
3
2
1
1
2
27
100
34
27
12.5
2
3
1.5
10
1
1
250
2.6
0.1
4
0.1
4
2.5
10
250
2.6
2.5
10
Unit
Test Conditions/Comments
MHz
Mbps
ns
ns
ns
ns
ns
Within PWD limit
50% input to 50% output
Within PWD limit
|tPLH − tPHL|
Mbps
ns
ns
ns
ns
ns
Within PWD limit
50% input to 50% output
Within PWD limit
|tPLH − tPHL|
kbps
µs
µs
µs
ns
Within PWD limit
50% input to 50% output
Within PWD limit
|tPLH − tPHL|
Codirectional channel matching is the absolute value of the difference in propagation delays between any two channels with inputs on the same side of the isolation barrier.
The MSS signal is glitch filtered in both speed grades, whereas the other fast signals are not glitch filtered in the B grade. To guarantee that MSS reaches the output
ahead of another fast signal, it must be set up prior to the competing signal by different times depending on speed grade.
3
VIx = VIA, VIB, or VIC.
4
An internal asynchronous clock not available to users samples the low speed signals. If edge sequence in codirectional channels is critical to the end application, the
leading pulse must be at least 1 tVIx SKEW time ahead of a later pulse to guarantee the correct order or simultaneous arrival at the output.
1
2
Table 11. Supply Current
Device Number
ADuM4151
ADuM4152
ADuM4153
Symbol
IDD1
IDD2
IDD1
IDD2
IDD1
IDD2
1 MHz, A Grade/B Grade
Min
Typ
Max
2.8
7
6.0
10.5
3.5
6.5
6.5
10.5
2.8
6.5
6.0
10.5
17 MHz, B Grade
Min
Typ
Max
10.5
18
13.0
23
11.7
18
13.4
22.5
11.7
18
13.4
21
Rev. B | Page 9 of 22
Unit
mA
mA
mA
mA
mA
mA
Test Conditions/Comments
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
CL = 0 pF, low speed channels
ADuM4151/ADuM4152/ADuM4153
Data Sheet
Table 12. For All Models 1, 2, 3
Parameter
DC SPECIFICATIONS
MCLK, MSS, MO, SO, VIA, VIB, VIC
Logic High Input Threshold
Logic Low Input Threshold
Input Hysteresis
Input Current per Channel
SCLK, SSS, MI, SI, VOA, VOB, VOC
Logic High Output Voltages
VOH
Logic Low Output Voltages
VOL
VDD1, VDD2 Undervoltage Lockout
Supply Current for All Low Speed Channels
Quiescent Side 1 Current
Quiescent Side 2 Current
AC SPECIFICATIONS
Output Rise/Fall Time
Common-Mode Transient Immunity 4
Symbol
Min
Typ
VIH
VIL
VIHYST
II
0.7 × VDDx
Max
0.3 × VDDx
500
+0.01
−1
VDDx − 0.1
VDDx − 0.4
+1
Unit
Test Conditions/Comments
V
V
mV
µA
0 V ≤ VINPUT ≤ VDDx
UVLO
VDDX
VDDX − 2.0
0.0
0.2
2.6
IDD1(Q)
IDD2Q)
2.9
6.1
mA
mA
2.5
35
ns
kV/µs
tR/tF
|CM|
25
0.1
0.4
V
V
V
V
V
IOUTPUT = −20 µA, VINPUT = VIH
IOUTPUT = −4 mA, VINPUT = VIH
IOUTPUT = 20 µA, VINPUT = VIL
IOUTPUT = 4 mA, VINPUT = VIL
10% to 90%
VINPUT = VDDX, VCM = 1000 V,
transient magnitude = 800 V
VDDx = VDD1 or VDD2.
VINPUT is the input voltage of any of the MCLK, MSS, MO, SO, VIA, VIB, VIC pins.
3
IOUTPUT is the output current of any of the SCLK, SSS, MI, SI, VOA, VOB, VOC pins.
4
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining output voltages within the VOH and VOL limits. The common-mode
voltage slew rates apply to both rising and falling common-mode voltage edges.
1
2
PACKAGE CHARACTERISTICS
Table 13.
Parameter
Resistance (Input to Output) 1
Capacitance (Input to Output)1
Input Capacitance 2
IC Junction to Ambient Thermal Resistance
1
2
Symbol
RI-O
CI-O
CI
θJA
Min
Typ
1012
1.0
4.0
46
Max
Unit
Ω
pF
pF
°C/W
Test Conditions/Comments
f = 1 MHz
Thermocouple located at center of package underside
The device is considered a 2-terminal device: Pin 1 through Pin 10 are shorted together, and Pin 11 through Pin 20 are shorted together.
Input capacitance is from any input data pin to ground.
Rev. B | Page 10 of 22
Data Sheet
ADuM4151/ADuM4152/ADuM4153
REGULATORY INFORMATION
The ADuM4151/ADuM4152/ADuM4153 are approved by the organizations listed in Table 14. See Table 19 and the Insulation Lifetime
section for the recommended maximum working voltages for specific cross isolation waveforms and insulation levels.
Table 14.
UL
Recognized Under UL 1577
Component Recognition Program 1
5000 V rms Single Protection
File E214100
CSA
Approved under CSA Component Acceptance
Notice 5A
Basic insulation per CSA 60950-1-07+A1+A2
and IEC 60950-12nd Ed+A1+A2., 800 V rms
(1131 V peak) maximum working voltage 3
Reinforced Insulation per CSA 60950-107+A1+A2 and IEC 60950-1 2nd Ed.+A1+A2,
400 V rms (565 V peak) maximum working
voltage
Reinforced insulation (2MOPP) per IEC 60601-1
Ed.3.1, 250 V rms (353 V peak) maximum
working
File 205078
VDE
Certified according to DIN V VDE V 0884-10
(VDE V 0884-10):2006-12 2
Reinforced insulation, 849 V peak
File 2471900-4880-0001
In accordance with UL 1577, each model is proof tested by applying an insulation test voltage ≥6000 V rms for 1 second (current leakage detection limit = 10 µA).
In accordance with DIN V VDE V 0884-10, each model is proof tested by applying an insulation test voltage ≥ 1590 V peak for 1 second (partial discharge detection limit = 5 pC).
The asterisk (*) marked on the component designates DIN V VDE V 0884-10 approval.
3
Use at working voltages above 400 VAC RMS shortens lifetime of the isolator significantly. See Table 19 for recommended maximum working voltages under ac and dc conditions.
1
2
INSULATION AND SAFETY RELATED SPECIFICATIONS
Table 15.
Parameter
Rated Dielectric Insulation Voltage
Minimum External Air Gap (Clearance)
Symbol
L(I01)
Value
5000
8.3
Unit
V rms
mm min
Minimum External Tracking (Creepage)
L(I02)
8.3
mm min
Minimum Internal Gap (Internal Clearance)
Tracking Resistance (Comparative Tracking Index)
Material Group
CTI
0.017
>400
II
mm min
V
Rev. B | Page 11 of 22
Test Conditions/Comments
1-minute duration
Measured from input terminals to output terminals,
shortest distance through air
Measured from input terminals to output terminals,
shortest distance path along body
Insulation distance through insulation
DIN IEC 112/VDE 0303, Part 1
Material group (DIN VDE 0110, 1/89, Table 1)
ADuM4151/ADuM4152/ADuM4153
Data Sheet
DIN V VDE V 0884-10 (VDE V 0884-10): 2006-12 INSULATION CHARACTERISTICS
These isolators are suitable for reinforced electrical isolation only within the safety limit data. Maintenance of the safety data is ensured by
protective circuits. The asterisk (*) marked on packages denotes DIN V VDE V 0884-10 approval.
Table 16.
Description
Installation Classification per DIN VDE 0110
For Rated Mains Voltage ≤ 150 V rms
For Rated Mains Voltage ≤ 300 V rms
For Rated Mains Voltage ≤ 400 V rms
Climatic Classification
Pollution Degree per DIN VDE 0110, Table 1
Maximum Working Insulation Voltage
Input-to-Output Test Voltage, Method b1
Input-to-Output Test Voltage, Method a
After Environmental Tests Subgroup 1
After Input and/or Safety Test Subgroup 2
and Subgroup 3
Highest Allowable Overvoltage
Surge Isolation Voltage
Safety Limiting Values
VIORM × 1.875 = Vpd(m), 100% production test,
tini = tm = 1 sec, partial discharge < 5 pC
VIORM × 1.5 = Vpd(m), tini = 60 sec, tm = 10 sec,
partial discharge < 5 pC
VIORM × 1.2 = Vpd(m), tini = 60 sec, tm = 10 sec,
partial discharge < 5 pC
VIOSM(TEST) = 10 kV, 1.2 µs rise time, 50 µs, 50% fall time
Maximum value allowed in the event of a
failure (see Figure 4)
Case Temperature
Safety Total Dissipated Power
Insulation Resistance at TS
SAFE LIMITING POWER (W)
Test Conditions/Comments
VIO = 500 V
Symbol
Characteristic
Unit
VIORM
Vpd(m)
I to IV
I to III
I to II
40/105/21
2
849
1592
V peak
V peak
Vpd(m)
1274
V peak
Vpd(m)
1019
V peak
VIOTM
VIOSM
6000
6250
V peak
V peak
TS
PS
RS
130
2.4
>109
°C
W
Ω
3.0
RECOMMENDED OPERATING CONDITIONS
2.5
Table 17.
Parameter
Operating Temperature Range
Supply Voltage Range 1
Input Signal Rise and Fall Times
2.0
1.5
1
1.0
50
100
AMBIENT TEMPERATURE (°C)
150
12370-004
0
Value
−40°C to +125°C
3.0 V to 5.5 V
1.0 ms
See the DC Correctness and Magnetic Field Immunity section for information
on the immunity to the external magnetic fields.
0.5
0
Symbol
TA
VDD1, VDD2
Figure 4. Thermal Derating Curve, Dependence of Safety Limiting Values
with Case Temperature per DIN V VDE V 0884-10
Rev. B | Page 12 of 22
Data Sheet
ADuM4151/ADuM4152/ADuM4153
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 19. Maximum Continuous Working Voltage1
Table 18.
Parameter
60 Hz AC Voltage
Value
400 V rms
DC Voltage
1173 V peak
Parameter
Storage Temperature (TST) Range
Ambient Operating Temperature (TA)
Range
Supply Voltages (VDD1, VDD2)
Input Voltages (VIA, VIB, VIC, MCLK, MO,
SO, MSS)
Output Voltages (SCLK, SSS, MI, SI,
VOA, VOB, VOC)
Average Current per Output Pin1
Common-Mode Transients2
1
2
Rating
−65°C to +150°C
−40°C to +125°C
−0.5 V to +7.0 V
−0.5 V to VDDx + 0.5 V
−0.5 V to VDDx + 0.5 V
See the Insulation Lifetime section for more details.
Other pollution degree and material group requirements yield a different limit.
3
Some system level standards allow components to use the printed wiring
board (PWB) creepage values. The supported dc voltage may be higher for
those standards.
1
2
−10 mA to +10 mA
−100 kV/µs to +100 kV/µs
See Figure 4 for maximum safety rated current values across temperature.
Refers to common-mode transients across the insulation barrier. Commonmode transients exceeding the absolute maximum ratings may cause latch-up
or permanent damage.
Constraint
20-year lifetime at
0.1% failure rate, zero
average voltage
Limited by the
creepage of the
package,
Pollution Degree 2,
Material Group II2, 3
ESD CAUTION
Stresses at or above those listed under Absolute Maximum
Ratings may cause permanent damage to the product. This is a
stress rating only; functional operation of the product at these
or any other conditions above those indicated in the operational
section of this specification is not implied. Operation beyond
the maximum operating conditions for extended periods may
affect product reliability.
Rev. B | Page 13 of 22
ADuM4151/ADuM4152/ADuM4153
Data Sheet
VDD1
1
20
VDD2
GND1
2
19
GND2
MCLK
3
18
SCLK
MO
4
17
SI
MI
ADuM4151
5
16
SO
MSS
6
TOP VIEW
(Not to Scale)
VIA
15
SSS
7
14
VOA
VIB 8
13
VOB
VOC 9
12
VIC
GND1 10
11
GND2
12370-005
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
Figure 5. ADuM4151 Pin Configuration
Table 20. ADuM4151 Pin Function Descriptions
Pin No.
1
Mnemonic
VDD1
Direction
Power
2, 10
3
4
5
6
GND1
MCLK
MO
MI
MSS
Return
Input
Input
Output
Input
7
8
9
11, 19
12
13
14
15
16
17
18
20
VIA
VIB
VOC
GND2
VIC
VOB
VOA
SSS
SO
SI
SCLK
VDD2
Input
Input
Output
Return
Input
Output
Output
Output
Input
Output
Output
Power
Description
Input Power Supply for Isolator Side 1. A bypass capacitor from VDD1 to GND1 to local ground is
required.
Ground 1. Ground reference for Isolator Side 1.
SPI Clock from the Master Controller.
SPI Data from the Master to the Slave MO/SI Line.
SPI Data from the Slave to the Master MI/SO Line.
Slave Select from the Master. This signal uses an active low logic. The slave select pin requires a 10 ns
setup time from the next clock or data edge.
Low Speed Data Input A.
Low Speed Data Input B.
Low Speed Data Output C.
Ground 2. Ground reference for Isolator Side 2.
Low Speed Data Input C.
Low Speed Data Output B.
Low Speed Data Output A.
Slave Select to the Slave. This signal uses an active low logic.
SPI Data from the Slave to the Master MI/SO Line.
SPI Data from the Master to the Slave MO/SI Line.
SPI Clock from the Master Controller.
Input Power Supply for Isolator Side 2. A bypass capacitor from VDD2 to GND2 to local ground is
required.
Rev. B | Page 14 of 22
ADuM4151/ADuM4152/ADuM4153
VDD1
1
20
VDD2
GND1
2
19
GND2
MCLK
3
18
SCLK
MO
4
SI
MI
ADuM4152
17
5
16
SO
MSS
6
TOP VIEW
(Not to Scale)
VIA
15
SSS
7
14
VOA
VOB 8
13
VIB
VOC 9
12
VIC
GND1 10
11
GND2
12370-006
Data Sheet
Figure 6. ADuM4152 Pin Configuration
Table 21. ADuM4152 Pin Function Descriptions
Pin No.
1
2, 10
3
4
5
6
Mnemonic
VDD1
GND1
MCLK
MO
MI
MSS
Direction
Power
Return
Input
Input
Output
Input
7
8
9
11, 19
12
13
14
15
16
17
18
20
VIA
VOB
VOC
GND2
VIC
VIB
VOA
SSS
SO
SI
SCLK
VDD2
Input
Output
Output
Return
Input
Input
Output
Output
Input
Output
Output
Power
Description
Input Power Supply for Isolator Side 1. A bypass capacitor from VDD1 to GND1 to local ground is required.
Ground 1. Ground reference for Isolator Side 1.
SPI Clock from the Master Controller.
SPI Data from the Master to the Slave MO/SI Line.
SPI Data from the Slave to the Master MI/SO Line.
Slave Select from the Master. This signal uses an active low logic. The slave select pin requires a 10 ns
setup time from the next clock or data edge.
Low Speed Data Input A.
Low Speed Data Output B.
Low Speed Data Output C.
Ground 2. Ground reference for Isolator Side 2.
Low Speed Data Input C.
Low Speed Data Input B.
Low Speed Data Output A.
Slave Select to the Slave. This signal uses an active low logic.
SPI Data from the Slave to the Master MI/SO Line.
SPI Data from the Master to the Slave MO/SI Line.
SPI Clock from the Master Controller.
Input Power Supply for Isolator Side 2. A bypass capacitor from VDD2 to GND2 to local ground is required.
Rev. B | Page 15 of 22
Data Sheet
VDD1
1
20
VDD2
GND1
2
19
GND2
MCLK
3
18
SCLK
MO
4
17
SI
MI
ADuM4153
5
16
SO
MSS
6
TOP VIEW
(Not to Scale)
VOA
15
SSS
7
14
VIA
VOB 8
13
VIB
VOC 9
12
VIC
GND1 10
11
GND2
12370-007
ADuM4151/ADuM4152/ADuM4153
Figure 7. ADuM4153 Pin Configuration
Table 22. ADuM4153 Pin Function Descriptions
Pin No.
1
2, 10
3
4
5
6
Mnemonic
VDD1
GND1
MCLK
MO
MI
MSS
Direction
Power
Return
Input
Input
Output
Input
7
8
9
11, 19
12
13
14
15
16
17
18
20
VOA
VOB
VOC
GND2
VIC
VIB
VIA
SSS
SO
SI
SCLK
VDD2
Output
Output
Output
Return
Input
Input
Input
Output
Input
Output
Output
Power
Description
Input Power Supply for Isolator Side 1. A bypass capacitor from VDD1 to GND1 to local ground is required.
Ground 1. Ground reference for Isolator Side 1.
SPI Clock from the Master Controller.
SPI Data from the Master to the Slave MO/SI Line
SPI Data from the Slave to the Master MI/SO Line.
Slave Select from the Master. This signal uses an active low logic. The slave select pin requires a 10 ns
setup time from the next clock or data edge.
Low Speed Data Output A.
Low Speed Data Output B.
Low Speed Data Output C.
Ground 1. Ground reference for Isolator Side 2.
Low Speed Data Input C.
Low Speed Data Input B.
Low Speed Data Input A.
Slave Select to the Slave. This signal uses an active low logic.
SPI Data from the Slave to the Master MI/SO Line.
SPI Data from the Master to the Slave MO/SI Line.
SPI Clock from the Master Controller.
Input Power Supply for Isolator Side 2. A bypass capacitor from VDD2 to GND2 to local ground is required.
Table 23. ADuM4151/ADuM4152/ADuM4153 Power-Off Default State Truth Table (Positive Logic) 1
VDD1 State
VDD2 State
Side 1 Outputs
Side 2 Outputs
SSS
Comments
Unpowered
Powered
Z
Z
Z
Powered
Unpowered
Z
Z
Z
Outputs on an unpowered side are high impedance within
one diode drop of ground
Outputs on an unpowered side are high impedance within one
diode drop of ground
1
Z is high impedance.
Rev. B | Page 16 of 22
Data Sheet
ADuM4151/ADuM4152/ADuM4153
TYPICAL PERFORMANCE CHARACTERISTICS
4.0
7
3.5
DYNAMIC SUPPLY CURRENT
PER OUTPUT CHANNEL (mA)
5
5.0V
3.3V
4
3
2
1
5.0V
2.5
2.0
3.3V
1.5
1.0
0.5
40
DATA RATE (Mbps)
80
60
0
Figure 8. Typical Dynamic Supply Current per Input Channel vs. Data Rate
for 5.0 V and 3.3 V Operation
0
80
60
40
DATA RATE (Mbps)
Figure 11. Typical Dynamic Supply Current per Output Channel vs. Data Rate
for 5.0 V and 3.3 V Operation
30
25
IDD2 SUPPLY CURRENT (mA)
25
20
5.0V
3.3V
15
10
5
0
20
40
DATA RATE (Mbps)
80
60
20
5.0V
15
3.3V
10
5
0
12370-022
0
0
20
80
60
25
16
3.3V
14
PROPAGATION DELAY (ns)
3.3V
12
10
40
DATA RATE (Mbps)
Figure 12. Typical IDD2 Supply Current vs. Data Rate for
5.0 V and 3.3 V Operation
Figure 9. Typical IDD1 Supply Current vs. Data Rate for
5.0 V and 3.3 V Operation
PROPAGATION DELAY (ns)
20
12370-021
20
0
12370-020
0
IDD1 SUPPLY CURRENT (mA)
3.0
12370-023
DYNAMIC SUPPLY CURRENT
PER INPUT CHANNEL (mA)
6
5.0V
8
6
4
20
5.0V
15
10
5
10
60
AMBIENT TEMPERATURE (°C)
110
0
–40
12370-012
0
–40
10
60
AMBIENT TEMPERATURE (°C)
Figure 10. Typical Propagation Delay vs. Ambient Temperature for High
Speed Channels Without Glitch Filter (See the High Speed Channels Section)
110
12370-013
2
Figure 13. Typical Propagation Delay vs. Ambient Temperature for High
Speed Channels with Glitch Filter (See the High Speed Channels Section)
Rev. B | Page 17 of 22
ADuM4151/ADuM4152/ADuM4153
Data Sheet
APPLICATIONS INFORMATION
The ADuM4151/ADuM4152/ADuM4153 are a family of devices
created to optimize isolation of SPI for speed and to provide
additional low speed channels for control and status monitoring
functions. The isolators are based on differential signaling
iCoupler technology for enhanced speed and noise immunity.
High Speed Channels
The ADuM4151/ADuM4152/ADuM4153 have four high speed
channels. The first three channels, CLK, MI/SO, and MO/SI
(the slash indicates the connection of the particular input and
output channel across the isolator), are optimized for either low
propagation delay in the B grade or high noise immunity in the
A grade. The difference between the grades is the addition of a
glitch filter to these three channels in the A grade version,
which increases the propagation delay. The B grade version,
with a maximum propagation delay of 14 ns, supports a
maximum clock rate of 17 MHz in the standard 4-wire SPI.
However, because the glitch filter is not present in the B grade
version, ensure that spurious glitches of less than 10 ns are not
present.
Glitches of less than 10 ns in the B grade devices can cause the
missing of the second edge of the glitch. This pulse condition is
then seen as a spurious data transition on the output that is
corrected by a refresh or the next valid data edge. It is recommended
to use the A grade devices in noisy environments.
The relationship between the SPI signal paths and the pin
mnemonics of the ADuM4151/ADuM4152/ADuM4153 and the
data directions is detailed in Table 24.
Table 24. Pin Mnemonics Correspondence to the SPI Signal
Path Names
SPI Signal Path
CLK
MO/SI
MI/SO
SS
Master Side 1
MCLK
MO
MI
MSS
Data Direction
→
→
←
→
Slave Side 2
SCLK
SI
SO
SSS
prevents short pulses from propagating to the output or causing
other errors in operation. The MSS signal requires a 10 ns setup
time in the B grade devices prior to the first active clock edge to
allow the added propagation time of the glitch filter.
Low Speed Data Channels
The low speed data channels are provided as economical
isolated datapaths where timing is not critical. The dc value of
all high and low speed inputs on a given side of the devices are
sampled simultaneously, packetized and shifted across an
isolation coil. The high speed channels are compared for dc
accuracy, and the low speed data is transferred to the appropriate
low speed outputs. The process is then reversed by reading the
inputs on the opposite side of the devices, packetizing them and
sending them back for similar processing. The dc correctness data
for the high speed channels is handled internally, and the low
speed data is clocked to the outputs simultaneously.
A free running internal clock regulates this bidirectional data
shuttling. Because data is sampled at discrete times based on
this clock, the propagation delay for a low speed channel is
between 0.1 µs and 2.6 µs, depending on where the input data
edge changes with respect to the internal sample clock.
Figure 14 illustrates the behavior of the low speed channels and
the relationship between the codirectional channels.
•
•
•
The datapaths are SPI mode agnostic. The CLK and MO/SI SPI
datapaths are optimized for propagation delay and channel to
channel matching. The MI/SO SPI datapath is optimized for
propagation delay. The devices do not synchronize to the clock
channels; therefore, there are no constraints on the clock
polarity or the timing with respect to the data lines. To allow
compatibility with nonstandard SPI interfaces, the MI pin is
always active, and does not tristate when the slave select is not
asserted. This precludes tying several MI lines together without
adding a trisate buffer or multiplexor.
SS (slave select bar) is typically an active low signal. SS can have
many different functions in SPI and SPI like busses. Many of
these functions are edge triggered; therefore, the SS path contains a
glitch filter in both the A grade and the B grade. The glitch filter
Rev. B | Page 18 of 22
Point A: When data is sampled between the input edges of
two low speed data inputs, a very narrow gap between
edges is increased to the width of the output clock.
Point B: Data edges that occur on codirectional channels
between samples are sampled and simultaneously sent to
the outputs, which synchronizes the data edges between
the two channels at the outputs.
Point C: Data pulses that are less than the minimum low
speed pulse width may not be transmitted because they
may not be sampled.
SAMPLE CLOCK
INPUT A A
INPUT B
B
A
C
B
OUTPUT A
OUTPUT B
A
C
OUTPUT CLOCK
Figure 14. Slow Channel Timing
12370-014
INTRODUCTION
Data Sheet
ADuM4151/ADuM4152/ADuM4153
The ADuM4151/ADuM4152/ADuM4153 digital isolators
require no external interface circuitry for the logic interfaces.
Power supply bypassing is strongly recommended at both the
VDD1 and VDD2 supply pins (see Figure 15). The capacitor value
must be between 0.01 µF and 0.1 µF. The total lead length
between both ends of the capacitor and the input power supply
pin must not exceed 20 mm.
BYPASS < 10mm
VDD1
VDD2
GND2
GND1
SCLK
ADuM4151/
ADuM4152/
ADuM4153
MCLK
MO
MI
SI
SO
MSS
SSS
VIA/VOA
VOA/VIA
12370-015
VIB/VOB
VIB/VOB
VIC
VOC
GND2
GND1
Figure 15. Recommended PCB Layout
In applications involving high common-mode transients, it is
important to minimize board coupling across the isolation
barrier. Furthermore, design the PCB layout so that any
coupling that does occur affects all pins equally on a given
component side. Failure to ensure this may cause voltage
differentials between pins that exceed the absolute maximum
ratings of the device, thereby leading to latch-up or permanent
damage.
PROPAGATION DELAY RELATED PARAMETERS
Propagation delay is a parameter that describes the time it takes
a logic signal to propagate through a component. The input to
output propagation delay time for a high to low transition may
differ from the propagation delay time of a low to high
transition.
INPUT
50%
OUTPUT
tPHL
12370-016
tPLH
50%
Figure 16. Propagation Delay Parameters
Pulse width distortion is the maximum difference between
these two propagation delay values and an indication of how
accurately the timing of the input signal is preserved.
Positive and negative logic transitions at the isolator input cause
narrow (~1 ns) pulses to be sent via the transformer to the decoder.
The decoder is bistable and is, therefore, either set or reset by
the pulses indicating input logic transitions. In the absence of
logic transitions at the input for more than ~1.2 µs, a periodic
set of refresh pulses indicative of the correct input state are sent
via the low speed channel to ensure dc correctness at the output.
If the low speed decoder receives no pulses for more than about
5 µs, the input side is assumed to be unpowered or nonfunctional,
in which case, the isolator output is forced to a high-Z state by
the watchdog timer circuit.
The limitation on the magnetic field immunity of the device is
set by the condition in which induced voltage in the transformer
receiving coil is sufficiently large to either falsely set or reset the
decoder. The following analysis defines such conditions. The
ADuM4151/ADuM4152/ADuM4153 were examined in a 3 V
operating condition because it represents the most susceptible
mode of operation for this product.
The pulses at the transformer output have an amplitude greater
than 1.5 V. The decoder has a sensing threshold of about 1.0 V;
thereby, establishing a 0.5 V margin in which induced voltages
can be tolerated. The voltage induced across the receiving coil is
given by
V = (−dβ/dt)∑πrn2; n = 1, 2, …, N
where:
β is the magnetic flux density.
rn is the radius of the nth turn in the receiving coil.
N is the number of turns in the receiving coil.
Given the geometry of the receiving coil in the ADuM4151/
ADuM4152/ADuM4153 and an imposed requirement that the
induced voltage be, at most, 50% of the 0.5 V margin at the
decoder, a maximum allowable magnetic field is calculated as
shown in Figure 17.
100
Channel to channel matching refers to the maximum amount
the propagation delay differs between channels within a single
ADuM4151/ADuM4152/ADuM4153 component.
Rev. B | Page 19 of 22
10
1
0.1
0.01
0.001
1k
10k
100k
1M
10M
MAGNETIC FIELD FREQUENCY (Hz)
100M
Figure 17. Maximum Allowable External Magnetic Flux Density
12370-017
PRINTED CIRCUIT BOARD (PCB) LAYOUT
DC CORRECTNESS AND MAGNETIC FIELD
IMMUNITY
MAXIMUM ALLOWABLE MAGNETIC FLUX
DENSITY (kgauss)
The low speed data system is carefully designed so that staggered
data transitions at the inputs become either synchronized or
pushed apart when they are presented at the output. Edge order
is always preserved for as long as the edges are separated by at
least tVIx SKEW. In other words, if one edge is leading another at
the input, the order of the edges is not reversed by the isolator.
ADuM4151/ADuM4152/ADuM4153
Data Sheet
For example, at a magnetic field frequency of 1 MHz, the
maximum allowable magnetic field of 0.5 kgauss, induces a
voltage of 0.25 V at the receiving coil. This voltage is about 50%
of the sensing threshold and does not cause a faulty output
transition. If such an event occurs, with the worst-case polarity,
during a transmitted pulse, the interference reduces the
received pulse from >1.0 V to 0.75 V. This voltage is still well
above the 0.5 V sensing threshold of the decoder.
These quiescent currents add to the high speed current as is
shown in the following equations for the total current for each
side of the isolator. Dynamic currents are taken from Table 3
and Table 6 for the respective voltages.
The preceding magnetic flux density values correspond to
specific current magnitudes at given distances away from the
ADuM4151/ADuM4152/ADuM4153 transformers. Figure 18
expresses these allowable current magnitudes as a function of
frequency for selected distances. The ADuM4151/ADuM4152/
ADuM4153 are insensitive to external fields. Only extremely
large, high frequency currents, very close to the component are
a concern. For the 1 MHz example noted, placing a 1.2 kA
current 5 mm away from the ADuM4151/ADuM4152/
ADuM4153 affects component operation.
For Side 2, the supply current is given by
DISTANCE = 1m
100
IDD1 = IDDI(D) × (fMCLK + fMO + fMSS) +
fMI × (IDDO(D) + ((0.5 × 10−3) × CL(MI) × VDD1)) + IDD1(Q)
IDD2 = IDDI(D) × fSO +
fSCLK × (IDDO(D) +((0.5 × 10−3) × CL(SCLK) × VDD2)) +
fSI × (IDDO(D) +((0.5 × 10−3) × CL(SI) × VDD2)) +
fSSS × (IDDO(D) +((0.5 × 10−3) × CL(SSS) × VDD2)) + IDD2(Q)
where:
IDDI(D), IDDO(D) are the input and output dynamic supply currents
per channel (mA/Mbps).
fx is the logic signal data rate for the specified channel (Mbps).
CL(x) is the load capacitance of the specified output (pF).
VDDx is the supply voltage of the side being evaluated (V).
IDD1(Q), IDD2(Q) are the specified Side 1 and Side 2 quiescent
supply currents (mA).
Figure 8 and Figure 11 show the typical supply current per
channel as a function of data rate for an input and unloaded
output. Figure 9 and Figure 12 show the total IDD1 and IDD2 supply
currents as a function of data rate for the ADuM4151/ADuM4152/
ADuM4153 channel configurations with all high speed channels
running at the same speed and the low speed channels at idle.
10
DISTANCE = 100mm
1
DISTANCE = 5mm
0.1
INSULATION LIFETIME
0.01
1k
10k
100k
1M
10M
100M
MAGNETIC FIELD FREQUENCY (Hz)
12370-018
MAXIMUM ALLOWABLE CURRENT (kA)
1000
For Side 1, the supply current is given by
Figure 18. Maximum Allowable Current for Various Current to
ADuM4151/ADuM4152/ADuM4153 Spacings
At combinations of strong magnetic field and high frequency,
any loops formed by the PCB traces may induce sufficiently
large error voltages to trigger the thresholds of succeeding
circuitry. Take care to avoid PCB structures that form loops.
POWER CONSUMPTION
The supply current at a given channel of the ADuM4151/
ADuM4152/ADuM4153 isolators is a function of the supply
voltage, the data rate of the channel, and the output load of the
channel and whether it is a high or low speed channel.
All insulation structures eventually break down when subjected
to voltage stress over a sufficiently long period. The rate of
insulation degradation is dependent on the characteristics of the
voltage waveform applied across the insulation as well as the
materials and material interfaces.
Two types of insulation degradation are of primary interest:
breakdown along surfaces exposed to the air and insulation
wear out. Surface breakdown is the phenomenon of surface
tracking and the primary determinant of surface creepage
requirements in system level standards. Insulation wear out is
the phenomenon where charge injection or displacement
currents inside the insulation material cause long-term
insulation degradation.
The low speed channels draw a constant quiescent current
caused by the internal ping-pong datapath. The operating
frequency is low enough that the capacitive losses caused by
the recommended capacitive load are negligible compared to
the quiescent current. The explicit calculation for the data rate
is eliminated for simplicity, and the quiescent current for each
side of the isolator due to the low speed channels can be found
in Table 3, Table 6, Table 9, and Table 12 for the particular
operating voltages.
Rev. B | Page 20 of 22
ADuM4151/ADuM4152/ADuM4153
Calculation and Use of Parameters Example
Surface tracking is addressed in electrical safety standards by
setting a minimum surface creepage based on the working
voltage, the environmental conditions, and the properties of the
insulation material. Safety agencies perform characterization
testing on the surface insulation of components that allow the
components to be categorized into different material groups.
Lower material group ratings are more resistant to surface
tracking and, therefore, can provide adequate lifetime with
smaller creepage. The minimum creepage for a given working
voltage and material group is in each system level standard and
is based on the total rms voltage across the isolation, pollution
degree, and material group. The material group and creepage
for the ADuM4151/ADuM4152/ADuM4153 isolators are
detailed in Table 15.
The following is an example that frequently arises in power
conversion applications. Assume that the line voltage on one
side of the isolation is 240 V ac rms, and a 400 V dc bus voltage
is present on the other side of the isolation barrier. The isolator
material is polyimide. To establish the critical voltages in
determining the creepage clearance and lifetime of a device, see
Figure 19 and the following equations.
Insulation Wear Out
The lifetime of insulation due to wear out is determined by its
thickness, the material properties, and the voltage stress applied.
It is important to verify that the product lifetime is adequate at
the application working voltage. The working voltage supported
by an isolator for wear out may not be the same as the working
voltage supported for tracking. It is the working voltage
applicable to tracking that is specified in most standards.
Testing and modeling have shown that the primary driver of
long-term degradation is displacement current in the polyimide
insulation causing incremental damage. The stress on the
insulation can be broken down into broad categories, such as
dc stress, which causes very little wear out because there is no
displacement current, and an ac component time varying
voltage stress, which causes wear out.
The ratings in certification documents are usually based on 60 Hz
sinusoidal stress because this stress reflects isolation from line
voltage. However, many practical applications have combinations
of 60 Hz ac and dc across the barrier, as shown in Equation 1.
Because only the ac portion of the stress causes wear out, the
equation can be rearranged to solve for the ac rms voltage, as
shown in Equation 2. For insulation wear out with the
polyimide materials used in this product, the ac rms voltage
determines the product lifetime.
VRMS = VAC RMS 2 + VDC 2
(1)
VAC RMS = VRMS 2 − VDC 2
(2)
or
where:
VAC RMS is the time varying portion of the working voltage.
VRMS is the total rms working voltage.
VDC is the dc offset of the working voltage.
ISOLATION VOLTAGE
Surface Tracking
VAC RMS
VRMS
VPEAK
VDC
TIME
Figure 19. Critical Voltage Example
The working voltage across the barrier from Equation 1 is
VRMS = VAC RMS 2 + VDC 2
VRMS = 2402 + 4002
VRMS = 466 V
The 466 V rms is the working voltage used together with the
material group and pollution degree when looking up the
creepage required by a system standard.
To determine if the lifetime is adequate, obtain the time varying
portion of the working voltage. The ac rms voltage can be
obtained from Equation 2.
VAC RMS = VRMS 2 − VDC 2
VAC RMS = 4662 − 4002
VAC RMS = 240 V
In this case, the ac rms voltage is simply the line voltage of
240 V rms. This calculation is more relevant when the waveform is
not sinusoidal. The value is compared to the limits for the working
voltage listed in Table 19 for the expected lifetime, less than a 60 Hz
sine wave, and it is well within the limit for a 50-year service life.
Note that the dc working voltage limit in Table 19 is set by the
creepage of the package as specified in IEC 60664-1. This value
may differ for specific system level standards
Rev. B | Page 21 of 22
12370-019
Data Sheet
ADuM4151/ADuM4152/ADuM4153
Data Sheet
OUTLINE DIMENSIONS
15.40
15.30
15.20
1.93 REF
20
11
7.60
7.50
7.40
1
10.51
10.31
10.11
10
PIN 1
MARK
2.64
2.54
2.44
2.44
2.24
45°
SEATING
PLANE
1.27 BSC
8°
0°
1.01
0.76
0.51
0.46
0.36
0.32
0.23
11-15-2011-A
0.30
0.20
0.10
COPLANARITY
0.1
0.71
0.50
0.31
0.25 BSC
GAGE
PLANE
COMPLIANT TO JEDEC STANDARDS MS-013
Figure 20. 20-Lead Standard Small Outline Package, with Increased Creepage [SOIC_IC]
Wide Body
(RI-20-1)
Dimension shown in millimeters
ORDERING GUIDE
Model 1, 2, 3
ADuM4151ARIZ
ADuM4151ARIZ-RL
No. of
Inputs,
VDD1 Side
5
5
No. of
Inputs,
VDD2 Side
2
2
Maximum
Data Rate
(MHz)
1
1
Maximum
Propagation
Delay, 5 V (ns)
25
25
Isolation
Rating
(V ac)
5000
5000
Temperature
Range
−40°C to +125°C
−40°C to +125°C
ADuM4151BRIZ
ADuM4151BRIZ-RL
5
5
2
2
17
17
14
14
5000
5000
−40°C to +125°C
−40°C to +125°C
ADuM4152ARIZ
ADuM4152ARIZ-RL
4
4
3
3
1
1
25
25
5000
5000
−40°C to +125°C
−40°C to +125°C
ADuM4152BRIZ
ADuM4152BRIZ-RL
4
4
3
3
17
17
14
14
5000
5000
−40°C to +125°C
−40°C to +125°C
ADuM4153ARIZ
ADuM4153ARIZ-RL
3
3
4
4
1
1
25
25
5000
5000
−40°C to +125°C
−40°C to +125°C
ADuM4153BRIZ
ADuM4153BRIZ-RL
3
3
4
4
17
17
14
14
5000
5000
−40°C to +125°C
−40°C to +125°C
EVAL-ADuM3151Z
1
2
3
Package
Description
20-Lead SOIC_IC
20-Lead SOIC_IC,
13” Tape and Reel
20-Lead SOIC_IC
20-Lead SOIC_IC,
13” Tape and Reel
20-Lead SOIC_IC
20-Lead SOIC_IC,
13” Tape and Reel
20-Lead SOIC_IC
20-Lead SOIC_IC,
13” Tape and Reel
20-Lead SOIC_IC
20-Lead SOIC_IC,
13” Tape and Reel
20-Lead SOIC_IC
20-Lead SOIC_IC,
13” Tape and Reel
Evaluation Board
Package
Option
RI-20-1
RI-20-1
RI-20-1
RI-20-1
RI-20-1
RI-20-1
RI-20-1
RI-20-1
RI-20-1
RI-20-1
RI-20-1
RI-20-1
Z = RoHS Compliant Part.
The EVAL-ADuM3151Z uses a functionally equivalent device for evaluation. The pad layout on the EVAL-ADuM3151Z board does not support the 20-lead SOIC_IC package.
To evaluate the functionality of the alternative low speed channel configurations of the ADuM4152 and the ADuM4153, the user must purchase an ADuM3152 or an
ADuM3153 and replace the component on the EVAL-ADuM3151Z evaluation board.
©2014–2017 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D12370-0-7/17(B)
Rev. B | Page 22 of 22
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