08055C104KAT2A

X7R Dielectric General Specifications X7R formulations are called “temperature stable” ceramics and fall into EIA Class II materials. X7R is the most popular of these intermediate dielectric constant materials. Its temperature variation of capacitance is within ±15% from -55°C to +125°C. This capacitance change is non-linear. Capacitance for X7R varies under the influence of electrical operating con-ditions such as voltage and frequency. X7R dielectric chip usage covers the broad spectrum of industrial applications where known changes in capacitance due to applied voltages are acceptable. PART NUMBER (see page 2 for complete part number explanation) 0805 5 C 103 M A T 2 A Size (L” x W”) Voltage 4V = 4 6.3V = 6 10V = Z 16V = Y 25V = 3 50V = 5 100V = 1 200V = 2 500V = 7 Dielectric X7R = C Capacitance Code (In pF) 2 Sig. Digits + Number of Zeros Capacitance Tolerance J = ± 5%* K = ±10% M = ± 20% Failure Rate A = Not Applicable Terminations T = Plated Ni and Sn 7 = Gold Plated* Z= FLEXITERM®** Packaging 2 = 7” Reel 4 = 13” Reel Special Code A = Std. Product *≤1µF only, contact factory for additional values *Optional termination **See FLEXITERM® X7R section Contact Factory For Multiples NOTE: Contact factory for availability of Termination and Tolerance Options for Specific Part Numbers. Contact factory for non-specified capacitance values. 042718 19 19 X7R Dielectric Specifications and Test Methods Parameter/Test X7R Specification Limits Measuring Conditions Operating Temperature Range Capacitance -55ºC to +125ºC Within specified tolerance Temperature Cycle Chamber Dissipation Factor ≤ 10% for ≥ 50V DC rating≤ 12.5% for 25V DC rating ≤ 12.5% for 25V and 16V DC rating ≤ 12.5% for ≤ 10V DC rating Contact Factory for DF by PN Freq.: 1.0 kHz ± 10% Voltage: 1.0Vrms ± .2V For Cap > 10µF, 05Vrm @ 120Hz Insulation Resistance 100,000MΩ or 1000MΩ - µF, whichever is less Charge device with rated voltage for 120 ± 5 secs @ room temp/humidity No breakdown or visual defects Charge device with 250% of rated voltage for 1-5 seconds, w/charge and discharge current limited to 50 mA (max) Note: Charge device with 150% of rated voltage for 500V devices. Dielectric Strength Resistance to Flexure Stresses Appearance Capacitance Variation Meets Initial Values (As Above) Insulation Resistance ≥ Initial Value x 0.3 Appearance Capacitance Variation Resistance to Solder Heat Insulation Resistance Meets Initial Values (As Above) 20 Dip device in eutectic solder at 260ºC for 60seconds. Store at room temperature for 24 ± 2hours before measuring electrical properties. Meets Initial Values (As Above) No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes ≤ ±7.5% Step 2: Room Temp ≤ 3 minutes Dissipation Factor Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes Insulation Resistance Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes Meets Initial Values (As Above) Repeat for 5 cycles and measure after 24 ± 2 hours at room temperature No visual defects ≤ ±12.5% Charge device with 1.5 rated voltage (≤ 10V) in test chamber set at 125ºC ± 2ºC for 1000 hours (+48, -0) Dissipation Factor ≤ Initial Value x 2.0 (See Above) Insulation Resistance ≥ Initial Value x 0.3 (See Above) If RV > 10V then Life Test voltage will be 2xRV but there are exceptions (please contact AVX for further details on exceptions) Dielectric Strength Meets Initial Values (As Above) Remove from test chamber and stabilize at room temperature for 24 ± 2 hours before measuring. Appearance Capacitance Variation Load Humidity Dip device in eutectic solder at 230 ± 5ºC for 5.0 ± 0.5 seconds ≤ ±7.5% Meets Initial Values (As Above) Dielectric Strength Appearance Capacitance Variation Load Life ≥ 95% of each terminal should be covered with fresh solder No defects,