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BQ2011KSN-D121

BQ2011KSN-D121

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    SOIC16

  • 描述:

    IC BATT PWR SUP CIRCUIT FIXED

  • 数据手册
  • 价格&库存
BQ2011KSN-D121 数据手册
bq2011K Gas Gauge IC for High Discharge Rates Features General Description ➤ Conservative and repeatable measurement of available charge in rechargeable batteries The bq2011K Gas Gauge IC is intended for battery-pack installation to maintain an accurate record of a battery’s available charge. The IC monitors a voltage drop across a sense resistor connected in series between the negative battery terminal and ground to determine charge and discharge activity of the battery. The bq2011K is designed for systems such as power tools with very high discharge rates. ➤ Designed for portable equipment such as power tools with high discharge rates ➤ Designed for battery pack integration - 120µA typical standby current (self-discharge estimation mode) Small size enables implementations in as little as 1 2 square inch of PCB ➤ Direct drive of LEDs for capacity display ➤ Self-discharge compensation using internal temperature sensor ➤ Simple single-wire serial communications port for subassembly testing ➤ 16-pin narrow SOIC Pin Connections Battery self-discharge is estimated based on an internal timer and temperature sensor. Compensations for battery temperature and rate of charge or discharge are applied to the charge, discharge, and selfdischarge calculations to provide available charge information across a wide range of operating conditions. Initial battery capacity is set using the PROG1-4 and SPFC pins. Actual battery capacity is automatically “learned” in the course of a discharge cycle from full to empty and may be displayed depending on the display mode. Nominal available charge may be directly indicated using a five-segment LED display. These segments are used to graphically indicate nominal available charge. The bq2011K supports a simple single-line bidirectional serial link to an external processor (common ground). The bq2011K outputs battery information in response to external commands over the serial link. To support subassembly testing, the outputs may also be controlled by command. The external processor may also overwrite some of the bq2011K gas gauge data registers. The bq2011K may operate directly from four cells. With the REF output and an external transistor, a simple, inexpensive regulator can be built to provide VCC from a greater number of cells. Internal registers include available charge, temperature, capacity, battery ID, and battery status. Pin Names LCOM LCOM 1 16 VCC SEG1/PROG1 2 15 REF SEG2/PROG2 3 14 NC SEG3/PROG3 4 13 DQ SEG4/PROG4 5 12 RBI SEG5 6 11 SB SPFC 7 10 DISP VSS 8 9 SR 16-Pin Narrow SOIC PN2011JK.eps LED common output SEG1/PROG1 LED segment 1/ Program 1 input SEG2/PROG2 LED segment 2 / Program 2 input SEG3/PROG3 LED segment 3/ Program 3 input SEG4/PROG4 LED segment 4/ Program 4 input SEG5 LED segment 5 SPFC Programmed full count selection input 10/97 B 1 REF Voltage reference output NC No connect DQ Serial communications input/output RBI Register backup input SB Battery sense input DISP Display control input SR Sense resistor input VCC 3.0–6.5V VSS Negative battery terminal bq2011K Pin Descriptions LCOM LED common No connect DISP Display control input DISP floating allows the LED display to be active during certain charge and discharge conditions. Transitioning DISP low activates the display for 4 ± 0.5 seconds. Open-drain output switches VCC to source current for the LEDs. The switch is off during initialization to allow reading of PROG1-4 pull-up or pull-down program resistors. LCOM is high impedance when the display is off. SEG1– SEG5 NC SB LED display segment outputs This input monitors the single-cell voltage potential through a high-impedance resistive divider network for the end-of-discharge voltage (EDV) threshold and maximum cell voltage (MCV). Each output may activate an LED to sink the current sourced from LCOM, the battery, or VCC. PROG1– PROG4 Programmed full count selection inputs (dual function with SEG1 - SEG4) RBI DQ Programmed full count selection input Serial I/O pin This is an open-drain bidirectional pin. This three-level input pin along with PROG1-3 define the programmed full count (PFC) thresholds described in Table 1. The state of the SPFC pin is only read immediately after a reset condition. SR Register backup input This input is used to provide backup potential to the bq2011K registers during periods when VCC < 3V. A storage capacitor should be connected to RBI. These three-level input pins define the programmed full count (PFC) in conjunction with SPFC pin, define the display mode and enable or disable self-discharge. SPFC Secondary battery input REF Voltage reference output for regulator REF provides a voltage reference output for an optional micro-regulator. Sense resistor input VCC Supply voltage input The voltage drop (VSR) across the sense resistor RS is monitored and integrated over time to interpret charge and discharge activity. The SR input is tied to the low side of the sense resistor and battery pack ground (see Figure 1). VSR > VSS indicates discharge, and VSR < VSS indicates charge. The effective voltage drop, VSRO, as seen by the bq2011K is VSR + VOS (see Table 4). VSS Ground 2 bq2011K Figure 1 shows a typical battery pack application of the bq2011K using the LED display with absolute mode as a charge-state indicator. The absolute display mode uses the programmed full count (PFC) as the full reference, forcing each segment of the display to represent a fixed amount of charge. A push-button display feature is available for momentarily enabling the LED display. Functional Description General Operation The bq2011K determines battery capacity by monitoring the amount of charge input to or removed from a rechargeable battery. The bq2011K measures discharge and charge currents, estimates self-discharge, monitors the battery for low-battery voltage thresholds, and compensates for temperature and charge/discharge rates. The charge measurement is made by monitoring the voltage across a smallvalue series sense resistor between the battery’s negative terminal and ground. The available battery charge is determined by monitoring this voltage over time and correcting the measurement for the environmental and operating conditions. The bq2011K monitors the charge and discharge currents as a voltage across a sense resistor (see RS in Figure 1). A filter between the negative battery terminal and the SR pin may be required if the rate of change of the battery current is too great. Register Backup The bq2011K RBI input pin is intended to be used with a storage capacitor to provide backup potential to the in- R1 bq2011K Gas Gauge IC Q1 ZVNL110A REF LCOM SEG1/PROG1 C1 0.1 F VCC RB1 VCC SB SEG2/PROG2 RB2 SEG3/PROG3 DISP SEG4/PROG4 VSS SEG5 RS SR SPFC RBI DQ Charger Indicates optional. Directly connect to VCC across 4 cells (4.8V nominal and should not exceed 6.5V) with a resistor and a Zener diode to limit voltage during charge. Otherwise, R1, C1, and Q1 are needed for regulation of >4 cells. Load Programming resistors and ESD-protection diodes are not shown. R-C on SR may be required (application-specific), where the maximum R should not exceed 20K. FG201103.eps Figure 1. Application Diagram: LED Display, Absolute Mode 3 bq2011K ternal bq2011K registers when VCC momentarily drops below 3.0V. VCC is output on RBI when VCC is above 3.0V. TMPGG (hex) After VCC rises above 3.0V, the bq2011K checks the internal registers for data loss or corruption. If data has changed, then the NAC register is cleared, and the LMD register is loaded with the initial PFC. Voltage Thresholds In conjunction with monitoring VSR for charge/discharge currents, the bq2011K monitors the single-cell battery potential through the SB pin. The single-cell voltage potential is determined through a resistor-divider network per the following equation: RB1 = N −1 RB2 where N is the number of cells, RB1 is connected to the positive battery terminal, and RB2 is connected to the negative battery terminal. The single-cell battery voltage is monitored for the end-of-discharge voltage (EDV) and for maximum cell voltage (MCV). The EDV threshold level is used to determine when the battery has reached an “empty” state, and the MCV threshold is used for fault detection during charging. The MCV threshold for the bq2011K is fixed at: 0x < -30°C 1x -30°C to -20°C 2x -20°C to -10°C 3x -10°C to 0°C 4x 0°C to 10°C 5x 10°C to 20°C 6x 20°C to 30°C 7x 30°C to 40°C 8x 40°C to 50°C 9x 50°C to 60°C Ax 60°C to 70°C Bx 70°C to 80°C Cx > 80°C Layout Considerations The bq2011K measures the voltage differential between the SR and VSS pins. VOS (the offset voltage at the SR pin) is greatly affected by PC board layout. For optimal results, the PC board layout should follow the strict rule of a single-point ground return. Sharing high-current ground with small signal ground causes undesirable noise on the small signal nodes. Additionally: VMCV = 2.00V The EDV threshold varies as a function of discharge current as follows: VSRO (mV) 0 < VSRO ≤ 10 10 < VSRO ≤ 20 20 < VSRO ≤ 40 40 < VSRO ≤ 60 VSRO > 60 Temperature Range VEDV (V) 1.160 1.124 1.060 0.960 0 (OVLD) Reset Reset can be accomplished with a command over the serial port as described on page 13. ■ The capacitors (SB and VCC) should be placed as close as possible to the SB and VCC pins, respectively, and their paths to VSS should be as short as possible. A high-quality ceramic capacitor of 0.1µf is recommended for VCC. ■ The sense resistor (RS) should be as close as possible to the bq2011K. ■ The R-C on the SR pin should be located as close as possible to the SR pin. The maximum R should not exceed 20K. Gas Gauge Operation The operational overview diagram in Figure 2 illustrates the operation of the bq2011K. The bq2011K accumulates a measure of charge and discharge currents, as well as an estimation of self-discharge. Charge currents are temperature and rate compensated, whereas selfdischarge is only temperature compensated. Temperature The bq2011K internally determines the temperature in 10°C steps centered from -35°C to +85°C. The temperature steps are used to adapt charge and discharge rate compensations, self-discharge counting, and available charge display translation. The temperature range is available over the serial port in 10°C increments as shown below: The main counter, Nominal Available Charge (NAC), represents the available battery capacity at any given time. Battery charging increments the NAC register, while battery discharging and self-discharge decrement 4 bq2011K the NAC register and increment the DCR (Discharge Count Register). 2. Programmed Full Count (PFC) or initial battery capacity: The Discharge Count Register (DCR) is used to update the Last Measured Discharge (LMD) register only if a complete battery discharge from full to empty occurs without any partial battery charges. Therefore, the bq2011K adapts its capacity determination based on the actual conditions of discharge. The initial LMD and gas gauge rate values are programmed by using PFC. The PFC also provides the 100% reference for the absolute display mode. The bq2011K is configured for a given application by selecting a PFC value from Table 1. The correct PFC may be determined by multiplying the rated battery capacity in mAh by the sense resistor value: The battery’s initial capacity is equal to the Programmed Full Count (PFC) shown in Table 1. Until LMD is updated, NAC counts up to but not beyond this threshold during subsequent charges. This approach allows the gas gauge to be charger-independent and compatible with any type of charge regime. 1. Battery capacity (mAh) * sense resistor (Ω) = PFC (mVh) Selecting a PFC slightly less than the rated capacity for absolute mode provides capacity above the full reference for much of the battery’s life. Last Measured Discharge (LMD) or learned battery capacity: Example: Selecting a PFC Value LMD is the last measured discharge capacity of the battery. On initialization (application of VCC or battery replacement), LMD = PFC. During subsequent discharges, the LMD is updated with the latest measured capacity in the Discharge Count Register (DCR) representing a discharge from full to below EDV. A qualified discharge is necessary for a capacity transfer from the DCR to the LMD register. The LMD also serves as the 100% reference threshold used by the relative display mode. Inputs Given: Sense resistor = 0.002Ω Number of cells = 6 Capacity = 1800mAh, NiCd cells Current range = 1A to 80A Absolute display mode Self-discharge = C 80 Voltage drop across sense resistor = 2mV to 160mV Charge Current Discharge Current Self-Discharge Timer Rate and Temperature Compensation Temperature Compensation + Main Counters and Capacity Reference (LMD) + - Nominal Available Charge (NAC) < Last Measured Discharged (LMD) Temperature Step, Other Data Temperature Translation Outputs Chip-Controlled Available Charge LED Display + Discharge Count Qualified Register (DCR) Transfer Serial Port FG201104.eps Figure 2. Operational Overview 5 bq2011K Therefore: 3. 1800mAh * 0.002Ω = 3.6mVh Nominal Available Charge (NAC): NAC counts up during charge to a maximum value of LMD and down during discharge and self discharge to 0. NAC is reset to 0 on initialization and on the first valid charge following discharge to EDV. To prevent overstatement of charge during periods of overcharge, NAC stops incrementing when NAC = LMD. Select: PFC = 35840 counts or 3.39mVh SPFC = Z (float) PROG1, PROG2 = H or Z PROG3 = L PROG4 = H or Z Note: NAC is set to the value in LMD when PROG4 is pulled low during a reset. The initial full battery capacity is 3.39mVh (1695mAh) until the bq2011K “learns” a new capacity with a qualified discharge from full to EDV. Table 1. bq2011K Programmed Full Count mVh Selections Programmed Full Count (PFC) mVh Scale 40192 3.81 1 32256 3.05 1 28928 2.74 1 Display Mode SPFC PROG1 PROG2 PROG3 10560 H H or Z H or Z H or Z 10560 Z H or Z H or Z H or Z L H or Z H or Z H or Z 10560 H L H or Z H or Z 10560 Z L H or Z H or Z 10560 L L H or Z H or Z 10560 Absolute 25856 2.45 1 35840 3.39 1 23296 2.21 1 Table 2. Programmed Self-Discharge PROG4 NAC Reset Value Self-Discharge H or Z NAC = 0 Enabled L NAC = PFC Disabled 6 bq2011K 4. Discharge Count Register (DCR): Self-Discharge Estimation The DCR counts up during discharge independent of NAC and could continue increasing after NAC has decremented to 0. Prior to NAC = 0 (empty battery), both discharge and self-discharge increment the DCR. After NAC = 0, only discharge increments the DCR. The DCR resets to 0 when NAC = LMD. The DCR does not roll over but stops counting when it reaches FFFFh. The bq2011K continuously decrements NAC and increments DCR for self-discharge based on time and temperature. The self-discharge count rate is programmed to be a nominal 1 80 * NAC rate per day or disabled per Table 2. This is the rate for a battery temperature between 20–30°C. The NAC register cannot not be decremented below 0. The DCR value becomes the new LMD value on the first charge after a valid discharge to VEDV if: Count Compensations The bq2011K determines fast charge when the NAC updates at a rate of ≥2 counts/sec. Charge activity is compensated for temperature and rate before updating the NAC and/or DCR. Self-discharge estimation is compensated for temperature before updating the NAC or DCR. No valid charge initiations (charges greater than 256 NAC counts; or 0.006 – 0.01C) occurred during the period between NAC = LMD and EDV detected. The self-discharge count is not more than 4096 counts (8% to 18% of PFC, specific percentage threshold determined by PFC). Charge Compensation Two charge efficiency factors are used for trickle charge and fast charge. Fast charge is defined as a rate of charge resulting in ≥ 2 NAC counts/sec (≥ 0.15C to 0.32C depending on PFC selections; see Table 1). The compensation defaults to the fast charge factor until the actual charge rate is determined. The temperature is ≥ 0°C when the EDV level is reached during discharge. The valid discharge flag (VDQ) indicates whether the present discharge is valid for LMD update. Charge Counting Temperature adapts the charge rate compensation factors over three ranges between nominal, warm, and hot temperatures. The compensation factors are shown below. Charge activity is detected based on a negative voltage on the VSR input. If charge activity is detected, the bq2011K increments NAC at a rate proportional to VSRO (VSR + VOS) and, if enabled, activates an LED display if VSRO < -2mV. Charge actions increment the NAC after compensation for charge rate and temperature. The bq2011K determines a valid charge activity sustained at a continuous rate equivalent to VSRO < -400µV. A valid charge equates to a sustained charge activity greater than 256 NAC counts. Once a valid charge is detected, charge counting continues until V SRO rises above -400µV. Charge Temperature Trickle Charge Compensation Fast Charge Compensation 50°C 0.70 0.85 Discharge Counting Discharge Compensation All discharge counts where VSRO > 500µV cause the NAC register to decrement and the DCR to increment. Exceeding the fast discharge threshold (FDQ) if the rate is equivalent to VSRO > 2mV activates the display, if enabled. The display remains active for 10 seconds after VSRO falls below 2mV. Corrections for the rate of discharge are made by adjusting EDV thresholds. The compensation factor used during discharge is set to 1.00 for all rates and temperatures. The recoverable charge at colder temperatures is adjusted for display purposes only. See page 13. 7 bq2011K Self-Discharge Compensation Current-Sensing Error The self-discharge compensation is programmed for a nominal rate of 1 80 * NAC per day or disabled. This is the rate for a battery within the 20–30°C temperature range (TMPGG = 6x). This rate varies across 8 ranges from 70°C, doubling with each higher temperature step (10°C). See Table 3. Table 4 illustrates the current-sensing error as a function of V SR . A digital filter eliminates charge and discharge counts to the NAC register when VSRO (VSR + VOS) is between -400µV and 500µV. Table 3. Self-Discharge Compensation The bq2011K includes a simple single-pin (DQ plus return) serial data interface. A host processor uses the interface to access various bq2011K registers. Battery characteristics may be easily monitored by adding a single contact to the battery pack. The open-drain DQ pin on the bq2011K should be pulled up by the host system, or may be left floating if the serial interface is not used. Temperature Range Communicating With the bq2011K Self-Discharge Compensation Typical Rate/Day < 10°C NAC 10–20°C NAC 20–30°C NAC 30–40°C NAC 40–50°C NAC 50–60°C NAC 60–70°C NAC > 70°C NAC 320 160 The interface uses a command-based protocol, where the host processor sends a command byte to the bq2011K. The command directs the bq2011K to either store the next eight bits of data received to a register specified by the command byte or output the eight bits of data specified by the command byte. 80 40 20 10 The communication protocol is asynchronous return-toone. Command and data bytes consist of a stream of eight bits that have a maximum transmission rate of 333 bits/sec. The least-significant bit of a command or data byte is transmitted first. The protocol is simple enough that it can be implemented by most host processors using either polled or interrupt processing. Data input from the bq2011K may be sampled using the pulse-width capture timers available on some microcontrollers. 5 2 .5 Error Summary The LMD is susceptible to error on initialization or if no updates occur. On initialization, the LMD value includes the error between the programmed full capacity and the actual capacity. This error is present until a valid discharge occurs and LMD is updated (see the DCR description in the “Layout Considerations” section). The other cause of LMD error is battery wear-out. As the battery ages, the measured capacity must be adjusted to account for changes in actual battery capacity. Communication is normally initiated by the host processor sending a BREAK command to the bq2011K. A BREAK is detected when the DQ pin is driven to a logic-low state for a time, tB or greater. The DQ pin should then be returned to its normal ready-high logic state for a time, tBR. The bq2011K is now ready to receive a command from the host processor. The return-to-one data bit frame consists of three distinct sections. The first section is used to start the transmission by either the host or the bq2011K taking the DQ pin to a Table 4. bq2011K Current-Sensing Errors Symbol Parameter Typical INL Integrated non-linearity error ±2 INR Integrated nonrepeatability error ±1 Maximum Units Notes ±4 % Add 0.1% per °C above or below 25°C and 1% per volt above or below 4.25V. ±2 % Measurement repeatability given similar operating conditions. 8 bq2011K logic-low state for a period, tSTRH,B. The next section is the actual data transmission, where the data should be valid by a period, tDSU, after the negative edge used to start communication. The data should be held for a period, tDV, to allow the host or bq2011K to sample the data bit. The W/R bit of the command register is used to select whether the received command is for a read or a write function. The final section is used to stop the transmission by returning the DQ pin to a logic-high state by at least a period, tSSU, after the negative edge used to start communication. The final logic-high state should be held until a period, tSV, to allow time to ensure that the bit transmission was stopped properly. The timings for data and break communication are given in the serial communication timing specification and illustration sections. CMDR Bits The W/R values are: 7 6 5 4 3 2 1 0 W/R - - - - - - - Where W/R is: Communication with the bq2011K is always performed with the least-significant bit being transmitted first. Figure 3 shows an example of a communication sequence to read the bq2011K NAC register. bq2011K Registers 0 The bq2011K outputs the requested register contents specified by the address portion of CMDR. 1 The following eight bits should be written to the register specified by the address portion of CMDR. The lower seven-bit field of CMDR contains the address portion of the register to be accessed. Attempts to write to invalid addresses are ignored. The bq2011K command and status registers are listed in Table 5 and described below. Command Register (CMDR) CMDR Bits The write-only CMDR register is accessed when eight valid command bits have been received by the bq2011K. The CMDR register contains two fields: ■ W/R bit ■ Command address 7 - 6 5 AD6 AD5 4 AD4 3 AD3 2 AD2 1 0 AD1 AD0 (LSB) Primary Status Flags Register (FLGS1) The read-only FLGS1 register (address=01h) contains the primary bq2011K flags. Written by Host to bq2011K CMDR = 03h LSB MSB Break 1 1 0 0 0 0 0 0 Received by Host to bq2011K NAC = 65h LSB MSB 1 0 1 0 0 11 0 DQ TD201103.eps Figure 3. Typical Communication With the bq2011K 9 bq2011K Table 5. bq2011K Command and Status Registers Symbol Register Name Control Field Loc. (hex) Read/ Write 7(MSB) 6 5 4 3 2 1 0(LSB) CMDR Command register 00h Write W/R AD6 AD5 AD4 AD3 AD2 AD1 AD0 FLGS1 Primary status flags register 01h Read CHGS BRP MCV n/u VDQ n/u EDV n/u Temperature TMPGG and gas gauge 02h register Read TMP3 TMP2 TMP1 TMP0 GG3 GG2 GG1 GG0 NACH Nominal available charge high byte register 03h R/W NACH7 NACH6 NACH5 NACH4 NACH3 NACH2 NACH1 NACH0 NACL Nominal available charge low byte register 17h Read NACL7 NACL6 BATID Battery identification register 04h R/W BATID7 BATID6 BATID5 BATID4 BATID3 BATID2 BATID1 BATID0 LMD Last measured discharge register 05h R/W LMD7 LMD6 LMD5 LMD4 LMD3 LMD2 LMD1 LMD0 FLGS2 Secondary status flags register 06h Read CR DR2 DR1 DR0 n/u n/u n/u OVLD OCTL Output control register 0ah Write 1 OC5 OC4 OC3 OC2 OC1 n/u OCE RST Reset register 39h Write RST 0 0 0 0 0 0 0 Note: n/u = not used 10 NACL5 NACL4 NACL3 NACL2 NACL1 NACL0 bq2011K mains set until either LMD is updated or one of three actions that can clear VDQ occurs: The charge status flag (CHGS) is asserted when a valid charge rate is detected. Charge rate is deemed valid when VSRO < -400µV. A VSRO of greater than400µV or discharge activity clears CHGS. ■ The self-discharge count register (SDCR) has exceeded the maximum acceptable value (4096 counts) for an LMD update. ■ A valid charge action equal to 256 NAC counts with VSRO < -400µV. ■ The EDV flag was set at a temperature below 0°C The CHGS values are: FLGS1 Bits 7 6 5 4 3 2 1 0 CHGS - - - - - - - The VDQ values are: Where CHGS is: 0 1 FLGS1 Bits Either discharge activity detected or VSRO > -400µV VSRO < -400µV The battery replaced flag (BRP) is asserted whenever the potential on the SB pin (relative to VSS), VSB, rises above 0.1V and determines the internal registers have been corrupted. The BRP flag is also set when the bq2011K is reset (see the RST register description). BRP is cleared if either the bq2011K is charged until NAC = LMD or discharged until EDV is reached. BRP = 1 signifies that the device has been reset. 5 4 3 2 1 0 - BRP - - - - - - bq2011K is charged until NAC = LMD or discharged until the EDV flag is asserted 1 Initial or full VCC reset, or a serial port initiated reset has occurred 6 5 4 3 2 1 0 - - MCV - - - - - 0 VDQ - - - 0 SDCR ≥ 4096, subsequent valid charge action detected, or EDV is asserted with the temperature less than 0°C 1 On first discharge after NAC = LMD 7 6 5 4 3 2 1 0 - - - - - - EDV - 0 Valid charge action detected 1 VSB < VEDV The read-only TMPGG register (address=02h) contains two data fields. The first field contains the battery temperature. The second field contains the available charge from the battery. TMPGG Temperature Bits 7 Where MCV is: VSB > 2.0V 1 - Temperature and Gas Gauge Register (TMPGG) FLGS1 Bits 7 1 2 - Where EDV is: The MCV values are: VSB < 2.0V 3 - FLGS1 Bits The maximum cell voltage flag (MCV) is asserted whenever the potential on the SB pin (relative to VSS) is above 2.0V. The MCV flag is asserted until the condition causing MCV is removed. 0 4 - The EDV values are: Where BRP is: 0 5 The end-of-discharge warning flag (EDV) warns the user that the battery is empty. SEG1 blinks at a 4Hz rate. EDV detection is disabled if OVLD = 1. The EDV flag is latched until a valid charge has been detected. FLGS1 Bits 6 6 Where VDQ is: The BRP values are: 7 7 6 TMP3 TMP2 5 4 TMP1 TMP0 3 2 1 - - - 0 The bq2011K contains an internal temperature sensor. The temperature is used to set charge efficiency factors as well as to adjust the self-discharge coefficient. The temperature register contents may be translated as shown in Table 6. The valid discharge flag (VDQ) is asserted when the bq2011K is discharged from NAC=LMD. The flag re- 11 bq2011K The adjustment between > 0°C and -20°C < T < 0°C has a 4°C hysteresis. Table 6. Temperature Register Contents Nominal Available Charge Register (NAC) TMP3 TMP2 TMP1 TMP0 Temperature 0 0 0 0 T < -30°C 0 0 0 1 -30°C < T < -20°C 0 0 1 0 -20°C < T < -10°C 0 0 1 1 -10°C < T < 0°C 0 1 0 0 0°C < T < 10°C 0 1 0 1 10°C < T < 20°C 0 1 1 0 20°C < T < 30°C 0 1 1 1 30°C < T < 40°C If SEG4 = 0 on reset, then NACH = PFC and NACL = 0. If SEG4 = Z or H, the NACH and NACL registers are cleared to zero. NACL stops counting when NACH reaches zero. When the bq2011K detects a valid charge, NACL resets to zero; writing to the NAC register affects the available charge counts and, therefore, affects the bq2011K gas gauge operation. 1 0 0 0 40°C < T < 50°C Battery Identification Register (BATID) 1 0 0 1 50°C < T < 60°C 1 0 1 0 60°C < T < 70°C 1 0 1 1 70°C < T < 80°C 1 1 0 0 T > 80°C The read/write NACH register (address=03h) and the read-only NACL register (address=17h) are the main gas gauging registers for the bq2011K. The NAC registers are incremented during charge actions and decremented during discharge and self-discharge actions. The correction factors for charge/discharge efficiency are applied automatically to NAC. The read/write BATID register (address=04h) is available for use by the system to determine the type of battery pack. The BATID contents are retained as long as VCC is greater than 2V. The contents of BATID have no effect on the operation of the bq2011K. There is no default setting for this register. Last Measured Discharge Register (LMD) LMD is a read/write register (address=05h) that the bq2011K uses as a measured full reference. The bq2011K adjusts LMD based on the measured discharge capacity of the battery from full to empty. In this way the bq2011K updates the capacity of the battery. LMD is set to PFC during a bq2011K reset. The bq2011K calculates the available charge as a function of NAC, temperature, and a full reference, either LMD or PFC. The results of the calculation are available via the display port or the gas gauge field of the TMPGG register. The register is used to give available capacity in 1 16 increments from 0 to 15 16. Secondary Status Flags Register (FLGS2) TMPGG Gas Gauge Bits 7 6 5 4 3 2 1 0 - - - - GG3 GG2 GG1 GG0 The read-only FLGS2 register (address=06h) contains the secondary bq2011K flags. The charge rate flag (CR) is used to denote the fast charge regime. Fast charge is assumed whenever a charge action is initiated. The CR flag remains asserted if the charge rate does not fall below 2 counts/sec. The gas gauge display and the gas gauge portion of the TMPGG register are adjusted for cold temperature dependencies. A piece-wise correction is performed as follows: Temperature The CR values are: FLGS2 Bits Available Capacity Calculation > 0°C NAC / “Full Reference” -20°C < T < 0°C 0.75 * NAC / “Full Reference” < -20°C 0.5 * NAC / “Full Reference” 7 6 5 4 3 2 1 0 CR - - - - - - - Where CR is: 12 0 When charge rate falls below 2 counts/sec 1 When charge rate is above 2 counts/sec bq2011K The fast charge regime efficiency factors are used when CR = 1. When CR = 0, the trickle charge efficiency factors are used. The time to change CR varies due to the user-selectable count rates. Reset Register (RST) The reset register (address=39h) provides the means to perform a software-controlled reset of the device. A full device reset may be accomplished by first writing LMD (address = 05h) to 00h and then writing the RST register contents from 00h to 80h. Setting any bit other than the most-significant bit of the RST register is not allowed, and results in improper operation of the bq2011K. The discharge rate flags, DR2–0, are bits 6–4. FLGS2 Bits 7 6 5 4 3 2 1 - DR2 DR1 DR0 - - - 0 Resetting the bq2011K sets the following: They are used to determine the present discharge regime as follows: ■ LMD = PFC ■ VDQ, OCE, and NAC = 0 (NAC = PFC when PROG4 = L) BRP = 1 DR2 DR1 DR0 VSRO(mV) 0 0 0 0 < VSRO ≤ 10 ■ 0 0 1 10 < VSRO ≤ 20 Display 0 1 0 20 < VSRO ≤ 40 0 1 1 40 < VSRO ≤ 60 1 0 0 VSRO > 60 The bq2011K can directly display capacity information using low-power LEDs. If LEDs are used, the segment pins should be tied to VCC, the battery, or the LCOM pin through resistors for programming the bq2011K. The bq2011K displays the battery charge state in absolute mode. In absolute mode, each segment represents a fixed amount of charge, based on the initial PFC. In absolute mode, each segment represents 20% of the PFC. As the battery wears out over time, it is possible for the LMD to be below the initial PFC. In this case, all of the LEDs may not turn on, representing the reduction in the actual battery capacity. The overload flag (OVLD) is asserted when a discharge overload is detected, VSRO > 60mV. OVLD remains asserted as long as the condition is valid. FLGS2 Bits 7 6 5 4 3 2 1 0 - - - - - - - OVLD The capacity display is also adjusted for the present battery temperature. The temperature adjustment reflects the available capacity at a given temperature but does not affect the NAC register. The temperature adjustments are detailed in the TMPGG register description. Output Control Register (OCTL) The write-only OCTL register (address=0ah) provides the system with a means to check the display connections for the bq2011K. The segment drivers may be overwritten by data from OCTL when the least-significant bit of OCTL, OCE, is set. The data in bits OC5–1 of the OCTL register (see Table 5 for details) is output onto the segment pins, SEG5–1, respectively if OCE=1. Whenever OCE is written to 1, the MSB of OCTL should be set to a 1. The OCE register location must be cleared to return the bq2011K to normal operation. OCE may be cleared by either writing the bit to a logic zero via the serial port or by resetting the bq2011K as explained below. Note: Whenever the OCTL register is written, the MSB of OCTL should be written to a logic one. When DISP is tied to VCC, the SEG1–5 outputs are inactive. When DISP is left floating, the display becomes active during charge if the NAC registers are counting at a rate equivalent to VSRO < -2mV or fast discharge if the NAC registers are counting at a rate equivalent to VSRO > 2mV. When DISP is left floating, the display also becomes active after the detection of a discharge signal with a minimum amplitude of VSR > 20mV (10A for RS = 0.002Ω) and a minimum pulse width of 25ms. When DISP is pulled low, the segment outputs become active for 4s, ± 0.5s. 13 bq2011K The segment outputs are modulated as two banks, with segments 1, 3, and 5 alternating with segments 2 and 4. The segment outputs are modulated at approximately 320Hz, with each bank active for 30% of the period. Microregulator The bq2011K can operate directly from 4 cells. To facilitate the power supply requirements of the bq2011K, an REF output is provided to regulate an external lowthreshold n-FET. A micropower source for the bq2011K can be inexpensively built using the FET and an external resistor. SEG1 blinks at a 4Hz rate whenever VSB has been detected to be below VEDV to indicate a low-battery condition or NAC is less than 10% of PFC. 14 bq2011K Absolute Maximum Ratings Symbol Parameter Minimum Maximum Unit VCC Relative to VSS -0.3 7.0 V All other pins Relative to VSS -0.3 7.0 V VSR Relative to VSS TOPR Operating temperature Note: Notes -0.3 7.0 V Minimum 100Ω series resistor should be used to protect SR in case of a shorted battery (see the bq2011K application note for details). 0 70 °C Commercial Permanent device damage may occur if Absolute Maximum Ratings are exceeded. Functional operation should be limited to the Recommended DC Operating Conditions detailed in this data sheet. Exposure to conditions beyond the operational limits for extended periods of time may affect device reliability. DC Voltage Thresholds (TA = TOPR; V = 3.0 to 6.5V) Symbol Parameter Minimum Typical Maximum Unit Notes 0.96 ∗ VEDV VEDV 1.04 ∗ VEDV V SB - - -400 µV VSR + VOS VEDV End-of-discharge warning VSRQ Valid charge VSRD Valid discharge 500 - - µV VSR + VOS VMCV Maximum single-cell voltage 1.95 2.0 2.05 V SB Note: For proper operation of the threshold detection circuit, VCC must be at least 1.5V greater than the voltage being measured. 15 bq2011K DC Electrical Characteristics (TA = TOPR) Symbol VCC VOS VREF RREF ICC Parameter Supply voltage Minimum Typical Maximum Unit Notes VCC excursion from < 2.0V to ≥ 3.0V initializes the unit. 3.0 4.25 6.5 V - ±50 ±150 µV DISP = VCC Reference at 25°C 5.7 6.0 6.3 V IREF = 5µA Reference at -40°C to +85°C 4.5 - 7.5 V IREF = 5µA Reference input impedance 2.0 5.0 - MΩ VREF = 3V - 90 135 µA VCC = 3.0V, DQ = 0 - 120 180 µA VCC = 4.25V, DQ = 0 - 170 250 µA VCC = 6.5V, DQ = 0 Offset referred to VSR Normal operation VSB Battery input 0 - VCC V RSBmax SB input impedance 10 - - MΩ 0 < VSB < VCC IDISP DISP input leakage - - 5 µA VDISP = VSS ILCOM LCOM input leakage -0.2 - 0.2 µA DISP = VCC IRBI RBI data-retention current - - 100 nA VRBI > VCC < 3V RDQ Internal pulldown 500 - - KΩ VSR Sense resistor input -0.3 - 2.0 V RSR SR input impedance VIHPFC PROG/SPFC logic input high VILPFC PROG/SPFC logic input low VIZPFC PROG/SPFC logic input Z IIHPFC 10 - - MΩ VCC - 0.2 - - V VSR > VSS = discharge; VSR < VSS = charge -200mV < VSR < VCC SPFC, PROG1-4 - - VSS + 0.2 V SPFC, PROG1-4 float - float V SPFC, PROG1-4 PROG/SPFC input high current - 1.2 - µA VPFC = VCC/2 IILPFC PROG/SPFC input low current - 1.2 - µA VPFC = VCC/2 VOLSL SEGX output low, low VCC - 0.1 - V VCC = 3V, IOLS ≤ 1.75mA SEG1–SEG5 VOLSH SEGX output low, high VCC - 0.4 - V VCC = 6.5V, IOLS ≤ 11.0mA SEG1–SEG5 VOHML LCOM output high, low VCC VCC - 0.3 - - V VCC = 3V, IOHLCOM = -5.25mA VOHMH LCOM output high, high VCC VCC - 0.6 - - V -33 - - mA IOHLCOM LCOM source current VCC = 6.5V, IOHLCOM = -33.0mA At VOHLCOM = VCC - 0.6V IOLS SEGX sink current 11.0 - - mA At VOLSH = 0.4V, VCC = 6.5V IOL Open-drain sink current 5.0 - - mA At VOL = VSS + 0.3V, DQ IOL ≤ 5mA, DQ VOL Open-drain output low - - 0.5 V VIHDQ DQ input high 2.5 - - V DQ VILDQ DQ input low - - 0.8 V DQ RFLOAT Float state external impedance - 5 - MΩ Note: All voltages relative to VSS. 16 SPFC, PROG1-4 bq2011K Serial Communication Timing Specification (TA = TOPR) Symbol Parameter Minimum Typical Maximum Unit tCYCH Cycle time, host to bq2011K 3 - - ms tCYCB Cycle time, bq2011K to host 3 - 6 ms tSTRH Start hold, host to bq2011K 5 - - ns tSTRB Start hold, bq2011K to host 500 - - µs tDSU Data setup - - 750 µs tDH Data hold 750 - - µs tDV Data valid 1.50 - - ms tSSU Stop setup - - 2.25 ms tSH Stop hold 700 - - µs tSV Stop valid 2.95 - - ms tB Break 3 - - ms tBR Break recovery 1 - - ms Note: Notes See note The open-drain DQ pin should be pulled to at least VCC by the host system for proper DQ operation. DQ may be left floating if the serial interface is not used. Serial Communication Timing Illustration DQ (R/W "1") DQ (R/W "0") tSTRH tSTRB tDH tDSU tDV tSH tSSU DQ (BREAK) tSV tCYCH, tCYCB, tB tBR TD201002.eps 17 bq2011K 16-Pin SOIC Narrow (SN) 16-Pin SN (SOIC Narrow) D e Dimension Minimum A 0.060 A1 0.004 B 0.013 C 0.007 D 0.385 E 0.150 e 0.045 H 0.225 L 0.015 All dimensions are in inches. B E H A C A1 .004 L 18 Maximum 0.070 0.010 0.020 0.010 0.400 0.160 0.055 0.245 0.035 bq2011K Data Sheet Revision History Change No. Page No. Description Nature of Change 1 6 Removed relative display mode from Table 1 Correction Notes: Change 1 = Oct. 1997 B changes from Oct. 1995. Ordering Information bq2011K Temperature Range: blank = Commercial (0 to +70°C) Package Option: SN = 16-pin narrow SOIC Device: bq2011K Gas Gauge IC 19 PACKAGE OPTION ADDENDUM www.ti.com 11-Oct-2005 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Eco Plan (2) Qty BQ2011KSN-D121 OBSOLETE SOIC D 16 TBD Call TI Call TI BQ2011KSN-D121TR OBSOLETE SOIC D 16 TBD Call TI Call TI Lead/Ball Finish MSL Peak Temp (3) (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS) or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. 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