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BQ29330DBT

BQ29330DBT

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    TFSOP30

  • 描述:

    IC BATT PROT LI-ION 2-4C 30TSSOP

  • 数据手册
  • 价格&库存
BQ29330DBT 数据手册
bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 2-SERIES, 3-SERIES, AND 4-SERIES CELL LITHIUM-ION OR LITHIUM-POLYMER BATTERY PROTECTION AFE Check for Samples: bq29330 FEATURES 1 • • • • • • • 2-Series, 3-Series, or 4-Series Cell Protection Control Can Directly Interface with the bq803x-Based Gas Gauge Family Watchdog and POR for the Host Provides Individual Cell Voltages and Battery Voltage to Battery Management Host Capable of Operation With 5-mΩ Sense Resistor Integrated Cell Balancing Drive I2C Compatible User Interface Allows Access to Battery Information Programmable Threshold and Delay for Overload Short Circuit in Discharge and Short Circuit in Charge • • • • • • NMOS FET Drive for Charge and Discharge FETs Host Control can Initiate Sleep and Ship Power Modes Integrated 2.5-V, 16-mA LDO Integrated 3.3-V, 25-mA LDO Supply Voltage Range from 4.5 V to 28 V Low Supply Current of 100 μA Typical APPLICATIONS • • • Notebook Computers Medical and Test Equipment Instrumentation and Measurement Systems DESCRIPTION The bq29330 is a 2-series, 3-series, and 4-series cell lithium-ion battery pack full-protection analog front end (AFE) IC that incorporates a 2.5-V, 16-mA and 3.3-V, 25-mA low dropout regulator (LDO). The bq29330 also integrates an I2C-compatible interface to extract battery parameters such as battery voltage, individual cell voltages, and control output status. Other parameters such as current protection thresholds and delays can also be programmed into the bq29330 to increase the flexibility of the battery management system. SYSTEM DIAGRAM Discharge / Charge / Precharge FETs Fuse Pack + Oscillator and PLL System Interface 2K Bytes of Data Flash 6K x 22 Mask ROM Nch FET Drive (Charge Pumps) 32.768 kHz Watchdog & Protection Timing I2 C System Interface RAM Configuration, Status and Control Registers 2K Bytes of RAM 24K x 22 Program Flash LDO + Reset T1 TOUT and LEDOUT Power Support Standard Delta-Sigma A-to-D Converter Analog Output Drive Integrating Delta-Sigma A-to-D Converter 2-Tier Overcurrent Protection Precharge Control Cell, Bat and Pack Voltage Translation Host Interface UART & Data Management Internal Only SMBus HDQ UART 2.5 V Reset Cell Balancing Drive 16 Dig GPIO & Peripherals 8 Dig GPIO or Analog GPI Pack – 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2005–2012, Texas Instruments Incorporated bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. DESCRIPTION (CONTINUED) The bq29330 provides safety protection for overload, short circuit in charge, and short circuit in discharge conditions and can also provide cell overvoltage, battery overvoltage and battery undervoltage protection with the battery management host. In overload, short circuit in charge and short circuit in discharge conditions, the bq29330 turns off the FET drive autonomously, depending on the internal configuration setting. The communications interface allows the host to observe and control the status of the bq29330, enable cell balancing, enter different power modes, set current protection levels, and set the blanking delay times. Cell balancing of each cell can be performed via a cell bypass path integrated into the bq29330, which can be enabled via the internal control register accessible via the I2C-compatible interface. The maximum bypass current is set via an external series resistor and internal FET on resistance (typ. 400 Ω). ORDERING INFORMATION (1) PACKAGE TA TSSOP(DBT) –40°C to 110°C (1) (2) (2) QFN(RSM) (2) bq29330DBT bq29330RSM For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. The bq29330 can be ordered in tape and reel by adding the suffix R to the orderable part number, i.e., bq29330DBTR. SPACER THERMAL INFORMATION bq29330 THERMAL METRIC (1) TSSOP (DBT) QFN (RSM) 30 PINS 32 PINS θJA, High K Junction-to-ambient thermal resistance 81.4 37.4 θJC(top) Junction-to-case(top) thermal resistance 16.2 30.6 θJB Junction-to-board thermal resistance 34.1 7.7 ψJT Junction-to-top characterization parameter 0.4 0.4 ψJB Junction-to-board characterization parameter 33.6 7.5 θJC(bottom) Junction-to-case(bottom) thermal resistance N/A 2.6 (1) 2 UNITS °C/W For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 PACKAGE OPTION PIN DIAGRAMS SRN 6 25 WDI TOUT SRP VC5 7 24 LEDOUT 8 23 VC4 9 22 SDATA SCLK 26 26 XRST 5 25 NC CELLXALERT 27 27 SCLK VSS 28 28 30 3 4 29 SDATA XRST XALERT 29 VSS 30 2 31 1 32 CELLCELL+ REG REG CELL+ RSM PACKAGE (TOP VIEW) TSSOP PACKAGE (TOP VIEW) TOUT SRP 3 22 LEDOUT VC5 4 21 VSS VSS VC4 5 20 NC PMS VC3 VC2 6 19 7 18 PMS GPOD VC1 8 17 ZVCHG 12 19 VCC 13 18 NC CHG 14 17 PACK NC 15 16 DSG BAT VC1 BAT ZVCHG 16 VC2 PACK VCC GPOD 20 NC 21 11 NC CHG NC DSG 10 9 VC3 15 23 14 2 13 WDI NC 12 24 11 1 10 SRN PIN FUNCTIONS PIN NAME DESCRIPTION DBT NO. RSM NO. CELL– 1 28 Output of scaled value of the measured cell voltage. CELL+ 2 29 Output of scaled value of the measured cell voltage. REG 3 30 Integrated 2.5-V regulator output VSS 4, 23 31,21 XRST 5 32 Power supply ground Active-low output SRN 6 1 Current sense terminal SRP 7 3 Current sense positive terminal when charging relative to SRN; current sense negative terminal when discharging relative to SRN VC5 8 4 Sense voltage input terminal for most negative cell; balance current input for least positive cell. VC4 9 5 Sense voltage input terminal for least positive cell, balance current input for least positive cell, and return balance current for third most positive cell. VC3 10 6 Sense voltage input terminal for third most positive cell, balance current input for third most positive cell, and return balance current for second most positive cell. VC2 11 7 Sense voltage input terminal for second most positive cell, balance current input for second most positive cell, and return balance current for most positive cell. VC1 12 8 Sense voltage input terminal for most positive cell, balance current input for most positive cell, and battery stack measurement input BAT 13 9 Device power supply input CHG 14 11 Charge pump, charge N-CH FET gate drive DSG 16 13 Charge pump output, discharge N-CH FET gate drive PACK 17 15 PACK positive terminal and alternative power source VCC 19 16 Power supply voltage ZVCHG 20 17 Connect the precharge P-CH FET drive here GPOD 21 18 NCH FET open-drain output PMS 22 19 Determines CHG output state on POR LEDOUT 24 22 3.3-V output for LED display power supply TOUT 25 23 Provides thermistor bias current Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 3 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com PIN FUNCTIONS (continued) PIN NAME DESCRIPTION DBT NO. RSM NO. WDI 26 24 Digital input that provides the timing clock for the OC and SC delays and also acts as the watchdog clock. SCLK 28 25 Open-drain serial interface clock with internal 10-kΩ pullup to VREG SDATA 29 26 Open-drain bidirectional serial interface data with internal 10-kΩ pullup to VREG XALERT 30 27 Open-drain output used to indicate status register changes. With internal 100-kΩ pullup to VREG 15,18,27 2, 10, 12, 14, 20 NC Not electrically connected to the IC FUNCTIONAL BLOCK DIAGRAM GG VDD GG RST PACK– RZVCHG PACK+ C PACK DSG CHG ZVCHG 2nd Protection REG REG VCC RST GG LED INPUT LEDOUT CHG_ON NCH GATE DRIVER PMS DSG_ON FET LOGIC ZVCHG_ON 3.3-V LDO GATE DRIVER C 2.5-V LDO POR LED BAT VC1 CELL 4 VC2 GG INTERFACE SDATA GG INTERFACE SCLK WDI WATCHDOG TIMER SHIP_ON SLEEP_ON SDATA SCLK SERIAL INTERFACE 32 kHz INPUT FROM GG CELL SELECTION SWITCHES CELL 2 VC4 CELL 1 OUTPUT CTL CELL+ STATE CTL FUNCTION CTL CELL SEL 0.975V BAT/25 OLV PACK/25 CELL VOLTAGE TRANSLATION SCC DRIVE CONTROL SCD OVERLOAD COMPARATOR OPEN DRAIN OUTPUT C CELL– OLD TOUT R GG ANALOG INPUT CELL GG TS INPUT THERM C THERM GND THERMISTOR OVERCURRENT SRP DELAY SHORT CIRCUIT COMPARATOR SHORT_CIRCUIT 4 CELL 3 VC3 VC5 ALERT TO GG GPOD CELL1..4 REGISTERS STATUS XALERT OPEN DRAIN OUTPUT POWER MODE CIRCUIT Submit Documentation Feedback R SNS SRN Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 SAFETY STATE DIAGRAM LEGEND: UVLO = Undervoltage Lock Out KEY: Disabled = OFF and cannot be changed via firmware Enabled= Can be changed by firmware No Power Supply Power Supply to PACK Power Supply to PACK UVLO Mode CHG: OFF DSG: OFF ZVCHG: OFF VREG: OFF RST: HIGH I2 C: Disabled Current Protection: Disabled VCELL: Disabled Watchdog: Disabled Therm, Output: Disabled Internal VLED < 2.3 V Internal VLED> 2.4 V 32 kHz Resumes FirmwareCommand 32 kHz Input Halted and tWTO expired Firmware Command No supply PACK DSG: OFF voltage Mode DSG: OFF Firmware Command Sleep Mode Firmware Command Firmware Command WTO Mode Firmware Command & No Supply to PACK Firmware Command Normal Mode CHG: ON DSG: ON ZVCHG: OFF VREG/VLED: 2.5V/3.3V RST: Driven low after tRST I2 C: Enabled Current Protection: Enabled VCELL: Enabled Watchdog: Enabled Therm, Output: Enabled 32 kHz Input Halted and t WTO expired CHG: OFF DSG: OFF ZVCHG: OFF VREG/VLED: 2.5 V/3.3 V RST: Pulsed I2 C: Enabled Current Protection: Enabled VCELL: Enabled Watchdog: Enabled Therm, Output: Enabled Ship Mode CHG: OFF DSG: OFF ZVCHG: OFF VREG/VLED: OFF/OFF I2 C: Disabled Current Protection: Disabled VCELL: Disabled Watchdog: Disabled Therm, Output: Disabled VSR > VOL or VSCD for a period of tOL or tSCD Respectively, or VSR > VSCC for a period of tSCC Current Protection Mode CHG: OFF DSG: OFF ZVCHG: OFF VREG/VLED: 2.5 V/3.3 V I2 C: Enabled Current Protection: Enabled VCELL: Enabled Watchdog: Enabled Therm, Output: Enabled CHG: OFF DSG: OFF ZVCHG: OFF VREG/VLED: ON/ON I2 C: Enabled Current Protection: Enabled VCELL: Enabled Watchdog: Enabled Therm, Output: Disabled Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 5 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range (unless otherwise noted) (1) (2) bq29330 Supply voltage range Input voltage range Output voltage range (VCC, BAT) –0.3 to 34 (VC1, VC2, VC3, VC4, PACK, PMS) –0.3 to 34 (VC5) –0.3 to 1.0 (SRP, SRN) –1.0 to 1.0 (VC1 to VC2, VC2 to VC3, VC3 to VC4, VC4 to VC5) –0.3 to 8.5 (WDI, SCLK, SDATA) –0.3 to 8.5 (DSG,CHG) –0.3 to BAT (ZVCHG) –0.3 to 34 (GPOD) –0.3 to 34 (TOUT, SDATA, CELL, XALERT, XRST, LEDOUT) –0.3 to 7 (CELL+) –0.3 to 7 Current for cell balancing Storage temperature range, Tstg (1) (2) UNIT V 10 mA –65 to 150 °C Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltages are with respect to ground of this device except VCn–VC(n+1), where n=1, 2, 3, 4 cell voltage. RECOMMENDED OPERATING CONDITIONS MIN VI(STARTUP) Supply voltage ( VCC, BAT) 4.5 Start up voltage (VCC, BAT) 5.5 VC1, VC2, VC3, VC4 VC5 VI Input voltage range SRP, SRN VCn – VC(n+1), (n=1, 2, 3, 4 ) NOM VIL VO VO Logic level input voltage SCLK, SDATA, WDI Output voltage GPOD Output voltage range V 0 0.5 –0.5 0.5 0 5.0 0.8×REG REG 0 0.2×REG 25 REG CELL+, CELL– 0.975 CREG 1.0 External LEDOUT capacitor CLED 2.2 Extend CELL output capacitor CCELL IOL GPOD 6 V V μF μF 1 WDI V μF 0.1 RPACK TA V 25 XALERT, SDATA, XRST WDI high time V VDD External 2.5-V REG capacitor Input frequency UNIT 25 0 PACK, PMS VIH MAX mA 1 kΩ 32.768 kHz μs 2 Operating temperature –25 85 °C Functional temperature –40 110 °C Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 ELECTRICAL CHARACTERISTICS SUPPLY CURRENT, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TA = 25°C TYP MAX UNIT 140 190 μA 220 μA ICC1 Supply Current 1 No load at REG, LEDOUT, TOUT, XALERT, SCLK, SDATA, ZVCHG= off, WDI = 32 kHz VMEN = on, VC5 = VC4 = VC3 = VC2 = VC1 = 0 V select VC5 = VC4 = 0 V ICC2 Supply Current 2 No load at REG, LEDOUT TOUT, XALERT, SCLK, SDATA. ZVCHG = off, WDI = 32 kHz, VMEN = off TA = –40°C to 110°C 105 185 μA I(SLEEP) Sleep current CHG, DSG and ZVCHG = off, REG = on, VMEN = off, WDI no clock, SLEEP = 1 TA = –40°C to 110°C 30 50 μA I(SHUTDOWN) Shutdown mode CHG, DSG and ZVCHG = off, REG = off, VMEN = off, WDI no clock, VPACK = 0 V, VC1 = VC2 = VC3 = VC4 = 3.5 V TA = –40°C to 110°C 0.1 1 μA 2.5 2.59 TA = –40°C to 110°C 2.5 V LDO, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V, IOUT 33 = 0 mA (unless otherwise noted) V(REG) Regulator output voltage 4.5 V < VCC or BAT ≤ 25 V, IOUT25 ≤ 16 mA Regulator output change with temperature VCC or BAT = 14 V, IOUT25 = 2 mA ΔV(EGTEMP) ΔV(REGLINE) Line regulation ΔV(REGLOAD) I(REGMAX) Load regulation Current limit TA = –40°C to 110°C 2.41 V TA = –40°C to 110°C ±0.2% 5.4 V ≤ VCC or BAT ≤ 25 V, IOUT25 = 2 mA TA = 25°C 3 10 mV VCC or BAT = 14 V, 0.2 mA ≤ IOUT25 ≤ 2 mA TA = 25°C 7 15 mV VCC or BAT = 14 V, 0.2 mA ≤ IOUT25 ≤ 16 mA TA = 25°C 15 50 mV VCC or BAT = 14 V, REG = 2 V TA = 25°C 16 75 VCC or BAT = 14 V, REG = 0 V TA = 25°C 5 45 mA 3.3 V LED, TA = 25°C, CREG = 1.0 μF , CL = 2.2 μF, VCC or BAT = 14 V, IOUT25 = 0 mA (unless otherwise noted) VO(LED) Regulator output voltage 4.5 V < VCC or BAT ≤ 25 V, IOUT33 ≤ 10 mA Regulator output change with temperature VCC or BAT = 14 V, IOUT33 = 2 mA ΔV(LEDEMP) ΔV(LEDLINE) Line regulation 5.4 V ≤ VCC or BAT ≤ 25 V, IOUT33 = 2 mA ΔV(LEDLOAD) Load regulation I(LEDMAX) Current limit 6.5 V < VCC or BAT ≤ 25 V, IOUT33 ≤ 25 mA VCC or BAT = 14 V, 0.2 mA ≤ IOUT33 ≤ 2 mA VCC or BAT = 14 V, 0.2 mA ≤ IOUT33 ≤ 25 mA VCC or BAT = 14 V, REG = 3 V VCC or BAT = 14 V, REG = 0 V TA = –40°C to 110°C 3 3.3 3.6 3 3.3 3.6 TA = –40°C to 110°C ±0.2% TA = 25°C 3 10 7 15 40 100 TA = 25°C TA = 25°C V mV mV 25 125 12 50 2.4 2.6 V 100 Ω 1 μA mA THERMISTOR DRIVE, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted) VTOUT RDS(ON) ITOUT = 0 mA TOUT Pass-element series resistance ITOUT = –1 mA at TOUT pin, RDS(ON) = [VREG – VOUT (TOUT)] / 1 mA TA = –40°C to 110°C 50 SHUTDOWN WAKE, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted) VSTARTUP PACK Exit shutdown threshold VCC or BAT = 14 V, PACK = 1.4 V POR, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted) VPOR VREGTH– Hysteresis (Vregth+ – Vregth–) –3% 1.8 3% V 50 150 250 mV Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 7 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com ELECTRICAL CHARACTERISTICS (Continued) CELL VOLTAGE MONITOR, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted) PARAMETER V(CELLOUT) REF MIN TYP MAX VCn – VCn+1 = 0 V, 8 V ≤ VDD ≤ 25 V TEST CONDITIONS 0.950 0.975 1 VCn – VCn+1 = 4.5 V, 8 V ≤ VDD ≤ 25 V 0.275 0.3 0.325 Mode (1) , 8 V ≤ VDD ≤ 25 V UNIT V –1% 0.975 1% V PACK Mode [Register Address = 0x03, b1(PACK) = 1, b0( VMEN) = 1] –2% PACK/18 2% V BAT Mode [Register Address = 0X03, b6(BAT) = 1, b0 ( VMEN) = 1] –2% BAT/18 2% V CELL output CMRR Common mode rejection CELL max to CELL min 40 dB V(CELLSLEW) CELL output rise Min to Max 10% to 90% 9 ms K CELL scale factor I(VCELLOUT) VICR R(BAL) (1) K = {CELL output (VC5 = 0 V, VC4 = 4.5 V) –CELL output (VC5 = VC4 = 0 V)} / 4.5 0.147 0.150 0.153 K = {CELL output (VC2 = 13.5 V, VC1 = 18 V) –CELL output (VC2 = VC1 = 13.5 V)} / 4.5 0.147 0.150 0.153 12 18 μA –1 mV Drive current VCn– VCn+1 = 0 V , Vcell = 0 V, TA = –40° to 110° CELL output offset error CELL output (VC2 = 18 V, VC1 = 18 V) –CELL output (VC2 = VC1 = 0 V) Cell balance internal resistance RDS(ON) for internal FET switch at VDS = 2 V –50% 400 50% Ω MAX UNIT Register Address = 0x04, b2(CAL0) = b3(CAL1) = 1, Register Address = 0x03, b0(VMEN) = 1 CURRENT PROTECTION DETECTION, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted) PARAMETER V(OLT) OL detection threshold voltage range, typical (1) ΔV(OLT) OL detection threshold voltage program step SCC detection threshold voltage range, typical V(SCCT) (2) ΔV(SCCT) SCC detection threshold voltage program step V(SCDT) SCD detection threshold voltage range, typical (3) ΔV(SCDT) SCD detection threshold voltage program step VOL(acr) OL detection threshold voltage accuracy(1) V(SCC_acr) V(SCD_acr) (1) (2) (3) 8 SCC detection threshold voltage accuracy(2) SCD detection threshold voltage accuracy(3) TEST CONDITIONS MIN TYP RSNS = 0 –50 –205 RSNS = 1 –25 –102.5 RSNS = 0 –5 RSNS = 1 –2.5 RSNS = 0 RSNS = 1 RSNS = 0 RSNS is set in FUNCTION_CTL register mV 100 475 50 237.5 25 RSNS = 1 RSNS = 0 –100 –475 RSNS = 1 –50 –237.5 –25 RSNS = 1 –12.5 mV mV 12.5 RSNS = 0 mV mV mV VOL = –25 mV (typ) –15 –25 –35 VOL = –100 mV (typ) (RSNS = 0,1) –90 –100 –110 VOL = –205 mV (typ) –185 –205 –225 VSCC = 50 mV (typ) 30 50 70 VSCC = 200 mV (typ) (RSNS = 0,1) 180 200 220 VSCC = 475 mV (typ) 428 475 523 VSCD = –50 mV (typ) –30 –50 –70 VSCD = –200 mV (typ) (RSNS = 0,1) –180 –200 –220 VSCD = –475 mV (typ) –426 –475 –523 mV mV mV See OLV register for setting detection threshold See SCC register for setting detection threshold See SCD register for setting detection threshold Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 ELECTRICAL CHARACTERISTICS (Continued) FET DRIVE CIRCUIT, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted) PARAMETER VO(FETON) V(ZCHG) VO(FETOF Output voltage, charge, and discharge FETs on ZVCHG clamp voltage TEST CONDITIONS VO(FETOND) = V(DSG) – Vpack VGS connect 10 MΩ TA = 25°C VO(FETONC) = V(CHG) – VBAT VGS connect 10 MΩ TA = 25°C TA = –40°C to 110°C TA = –40°C to 110°C BAT = 4.5 V MIN TYP MAX 7.5 12 15.5 8 12 16 7.5 12 15.5 8 12 16 3.3 3.5 3.7 VFETOND = VDSG – Vpack 0.2 VFETONC = VCHG – VBAT 0.2 F) Output voltage, charge, and discharge FETs off tr Rise time CL = 4700 pF tf Fall time CL = 4700 pF UNIT V V V V V(CHG): Vpack ≥ Vpack + 4 V 400 1000 V(DSG): VBAT ≥ VBAT + 4 V 400 1000 V(CHG): Vpack + VCHG (FETON) ≥ pack + 1 V 40 200 V(DSG): VC1 + VDSG (FETON) ≥ VC1 + 1 V 40 200 60 100 200 6 10 20 1 3 6 μs μs LOGIC, TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted) XALERT R(PUP) Internal pullup resistance SDATA, SCLK TA = –40°C to 110°C XRST VOL VIH XALERT 0.2 SDATA, IOUT = 200 μA 0.4 Low Logic level output voltage GPOD, IOUT = 50 μA SCLK (hysteresis input) Hysteresis 0.6 TA = –40°C to 110°C VCC or BAT = 7 V, VREG = 1.5 V, XRST, IOUT = 200 μA kΩ V 0.4 450 mV AC ELECTRICAL CHARACTERISTICS TA = 25°C, CREG = 1 μF, CL = 2.2 μF, VCC or BAT = 14 V (unless otherwise noted) PARAMETER MIN TYP MAX UNIT 250 500 1000 ms WDT detect time 50 100 150 μs XRST Active high time 100 250 560 μs tWDTINT WDT start up detect time tWDWT tRST TEST CONDITIONS Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 9 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com AC TIMING REQUIREMENTS (I2C compatible serial interface) TA = 25°C, CREG = 1 μF, VCC or BAT = 14 V (unless otherwise noted) PARAMETER MIN MAX UNIT ns tr SCLK, SDATA rise time 1000 tf SCLK, SDATA fall time 300 tw(H) SCLK pulse width high 4 μs tw(L) SCLK pulse width low 4.7 μs tsu(STA) Setup time for start condition 4.7 μs th(STA) Start condition hold time after which first clock pulse is generated 4 μs tsu(DAT) Data setup time 250 ns th(DAT) Data hold time 0 μs tsu(STOP) Setup time for Stop condition 4 μs tsu(BUF) Time the bus must be free before new transmission can start 4.7 μs tv Clock low to data out valid th(CH) Data out hold time after clock low 10 fSCL Clock frequency 0 tsu(STA) tw(H) tf tw(L) ns 900 ns 100 kHz ns tr SCLK tr SDATA Start Condition SDA Input th(STA) 1 SCLK tf Stop Condition SDA Change th(DAT) tsu(DAT) 3 7 2 th(ch) 8 9 MSB SDATA ACK Start Condition tv tsu(STOP) SCLK SDATA 1 2 3 7 MSB 8 9 tsu(BUF) ACK Stop Condition 10 Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 FUNCTIONAL DESCRIPTION LOW DROP OUTPUT REGULATOR (LEDOUT) The inputs for this regulator can be derived from the VCC or BAT terminals. The output is a fixed voltage of typically 3.3 V with the minimum output capacitance for stable operation of 2.2 μF and is also internally current limited. This output is used for LED drive, power supply source for REG (2.5 V) and bq29330 internal circuit. During normal operation, the regulator limits output current to typically 50 mA. Until the internal regulator circuit is correctly powered, the DSG and CHG FET drives are low (FETs = OFF). LOW DROP OUTPUT REGULATOR (REG) The inputs for this regulator can be derived from the LED (3.3 V). The output is typically 2.5 V with the minimum output capacitance for stable operation of 1 μF and is also internally current limited. During normal operation, the regulator limits output current to typically 50 mA. INITIALIZATION From a shutdown situation, the bq29330 requires a voltage greater that start-up voltage (VSTARTUP) applied to the PACK pin to enable its integrated regulator and provide the regulators power source. Once the REG output is stable, the power source of the regulator is switched to VCC. After the regulator has started, it then continues to operate through the VCC input. If the VCC input is below the minimum operating range, then the bq29330 will not operate if the supply to the PACK input is removed. If the voltage at VLED falls below about 2.3 V, the internal circuit turns off the FETs and disables all controllable functions including the REG, LEDOUT, and TOUT outputs. The initial state of the CHG and DSG FET drive is low (OFF) and the ZVCHG FET drive is low (ON). OVERLOAD DETECTION The overload detection is used to detect abnormal currents in the discharge direction. This feature is used to protect the pass FETs, cells, and any other inline components from excessive discharge current conditions. The detection circuit also incorporates a blanking delay before driving the control for the pass FETs to the OFF state. The overload sense voltage is set in the OLV register, and delay time is set in the OLD register. The thresholds can be individually programmed from 50 mV to 205 mV in 5-mV steps with the default being 50 mV. If the RSNS bit in the FUNCTION_CTL register is set to 1, then the voltage threshold, programmable step size, and hysteresis is divided by 2. SHORT CIRCUIT IN CHARGE AND SHORT CIRCUIT IN DISCHARGE DETECTION The short current circuit in charge and short circuit in discharge detections are used to detect severe abnormal current in the charge and discharge directions, respectively. This safety feature is used to protect the pass FETs, cells, and any other inline components from excessive current conditions. The detection circuit also incorporates a blanking delay before driving the control for the pass FETs to the OFF state. The short circuit in charge threshold and delay time are set in the SCC register. The short circuit in discharge threshold and delay time are set in the SCD register. The short-circuit thresholds can be programmed from 100 mV to 475 mV in 25-mV steps. If the RSNS bit in the FUNCTION_CTL register is set to 1, then the voltage threshold, programmable step size, and hysteresis is divided by 2. OVERLOAD, SHORT CIRCUIT IN CHARGE AND SHORT CIRCUIT IN DISCHARGE DELAY The overload delay (default = 1 ms) allows the system to momentarily accept a high current condition without disconnecting the supply to the load. The delay time can be increased via the OLD register which can be programmed for a range of 1 ms to 31 ms with 2-ms steps. The short circuit in charge and short circuit in discharge delays (default = 0 μs) are programmable in the SCC and SCD registers, respectively. These registers can be programmed from 0 μs to 915 μs with 61-μs steps. Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 11 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com OVERLOAD, SHORT CIRCUIT IN CHARGE AND SHORT CIRCUIT IN DISCHARGE RESPONSE When an overload, short circuit in charge, or short circuit in discharge fault is detected, the FETs are turned off. The STATUS (b0…b3) register reports the details of overload, short circuit in charge or short-circuit discharge. The respective STATUS (b0…b3) bits are set to 1 and the XALERT output is triggered. This condition is latched until the STATE_CONTROL (b7) is set and then reset. If a FET is turned on after resetting STATE_CONTROL (b0) and the error condition is still present on the system, then the device again enters the protection response state. 2-, 3-, or 4-CELL CONFIGURATION In a 2-cell configuration, VC1 and VC2 are shorted to VC3. In a 3-cell configuration, VC1 is shorted to VC2. CELL VOLTAGE The cell voltage is translated to allow a system host to measure individual series elements of the battery. The series element voltage is translated to a GND-based voltage equal to 0.15 ±0.003 of the series element voltage. This provides a range from 0 to 4.5 V. The translation output is presented between CELL+ and CELL– pins of the bq29330 and is inversely proportional to the input using the following equation. Where, V(CELLOUT) = –K × V(CELLIN) + 0.975 (V) Programming CELL_SEL (b1, b0) selects the individual series element. The CELL_SEL (b3, b2) selects the voltage monitor mode, cell monitor, offset, etc. CALIBRATION OF CELL VOLTAGE MONITOR AMPLIFIER GAIN The cell voltage monitor amplifier has an offset, and to increase accuracy, this can be calibrated. The following procedure shows how to measure and calculate the offset as an example. Step 1 Set CAL1=1, CAL0=1, VMEN=1. VREF is trimmed to 0.975 V within ±1%; measuring VREF eliminates its error. Measure internal reference voltage VREF from VCELL directly. VREF = measured reference voltage Step 2 Set CAL1=0, CAL0=1, CELL1=0, CELL0=0, VMEN=1. The output voltage includes the offset and represented by: VOUT(4-5) = VREF + (1 + K) × VOS (V) Where K = CELL Scaling Factor VOS = Offset voltage at input of the internal operational amplifier Step 3 Set CAL1=1, CAL0=0, CELL1=0, CELL0=0, VMEN=1. Measure scaled REF voltage through VCELL amplifier. The output voltage includes the scale factor error and offset and is represented by: V(OUTR) = VREF + (1 + K) × VOS – K × VREF (V) Step 4 Calculate (VOUT(4-5) –V(OUTR)) / VREF. The result is the actual scaling factor, KACT and is represented by: KACT = (VOUT(4-5) –V(OUTR)) / VREF = (VREF + (1 + K) × VOS) – (VREF + (1 + K) × VOS – K × VREF)/VREF = K × VREF/VREF = K 12 Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 Step 5 Calculate the actual offset value where: VOS(ACT) = (V(OUTR) – VREF) / (1 + KACT) Step 6 Calibrated cell voltage is calculated by: VCn – VC(n+1) = { VREF + (1 + KACT ) × VOS(ACT) – V(CELLOUT)}/KACT = {VOUT(4-5) – V(CELLOUT)}/KACT To seek greater accuracy, it is better to measure VOS(ACT) for each cell voltage. Set CAL1=0, CAL0=0, CELL1=0, CELL0=1, VMEN=1. Set CAL1=0, CAL0=0, CELL1=1, CELL0=0, VMEN=1. Set CAL1=0, CAL0=0, CELL1=1, CELL0=1, VMEN=1. Measure VOUT(3-4), VOUT(2-3), VOUT(1-2), VC4 – VC5 = {VOUT(4-5) – V(CELLOUT)}/KACT VC3 – VC4 = {VOUT(3-4) – V(CELLOUT)}/KACT VC2 – VC3 = {VOUT(2-3) – V(CELLOUT)}/KACT VC1 – VC2 = {VOUT(1-2) – V(CELLOUT)}/KACT BATTERY PACK AND BATTERY STACK MEASUREMENTS The PACK (battery pack) and VC1 (battery stack) inputs can be translated to the CELL+, CELL– outputs of the bq29330 through control bits in the FUNCTION_CONTROL register. If PACK is set, then the input at the PACK is divided by 18 and presented at the CELL+, CELL– outputs. If the BAT bit is set, then the input to VC1 is divided by 18 and presented at the CELL+, CELL– outputs. If setting both bits at the same time, VC1 is presented at the CELL+, CELL– outputs. CELL BALANCE CONTROL The cell balance control allows a small bypass path to be controlled for any one series element. The purpose of this bypass path is to reduce the current into any one cell during charging to bring the series elements to the same voltage. Series resistors placed between the input pins and the positive series element nodes control the bypass current value. Individual series element selection is made using bits 4 through 7 of CELL_SEL register. Series input resistors between 500 Ω and 1 kΩ are recommended for effective cell balancing. XALERT (XALERT) XALERT is driven Low, when WDF, OL, SCC, or SCD OC are detected. To clear XALERT, toggle (from 0, set to 1, then reset to 0) STATE_CONTROL, LTCLR (bit 7), then read the STATUS register. THERMISTOR DRIVE CIRCUIT (TOUT) The TOUT pin can be enabled to drive a thermistor from REG. The typical thermistor resistance is 10 kΩ at 25°C. The default state for this is OFF to conserve power. The maximum output impedance is 100 Ω. TOUT is enabled in FUNCTION_CONTROL register (bit 3). GENERAL PURPOSE OPEN DRAIN DRIVE CIRCUIT (GPOD) The General Purpose Open Drain output has 1-mA current source drive with a maximum output voltage of 25 V. The OD output is enabled or disabled by OUTPUT_CONTROL register (bit 4) and has a default state of OFF. Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 13 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com LATCH CLEAR (LTCLR) When a protection fault occurs, the state is latched. To clear the fault flag, toggle (from 0, set 1, then reset to 0) the LTCLR bit in the STATE_CONTROL register (bit 7). The OL, SCC, SCD, and WDF bits are unlatched by this function. The FETs can now be controlled by programming the OUTPUT_CONTROL register, and the XALERT output can be cleared by reading the STATUS register. Fault Timeout Expired STATUS Register Read FET Control Access by Host Fault Flag Set LTCLR Bit XALERT Output Figure 1. LTCLR and XLAERT Clear Timing POR and WATCHDOG RESET (XRST) The XRST pin is activated by activation of the REG output. This holds the host in reset for the duration of the tRST period, allowing the VREG to stabilize before the host is released from reset. When the regulator power is down, XRST is active below the regulator’s voltage of 1.8 V. Also, when a watchdog fault is detected, the XRST is also activated to ensure a valid reset of the battery management host. VREGTH+ REG Output VREGTH- tRST RST Output Figure 2. XRST Timing Chart – Power Up and Power Down WATCHDOG INPUT (WDI) The WDI input is required as a time base for delay timing when determining fault detection and is used as part of the system watchdog. Initially, the watchdog monitors the host oscillator start-up; if there is no response from the host within tWDINT of tRST expiring, then the bq29330 turns CHG, DSG, and ZVCHG FETs off. It then activates the XRST output in an attempt to reset the host. Once the watchdog has been started during this wake-up period, it monitors the host for an oscillation stop condition which is defined as a period of tWDWT where no clock input is received. If an oscillator stop condition is identified, then the watchdog turns the CHG, DSG, and ZVCHG FETs off. The bq29330 then activates the XRST output in an attempt to reset the host. 14 Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 If the host clock oscillation is started after the reset, the bq29330 still has the WDF flag set until it is cleared. See the LTCLR section for further details on clearing the fault flags. During Sleep mode, the watchdog function is not disabled. REG Output tDWTINIT(500 ms) tDWTINIT(500 ms) REG Output tRST WDI Input XALERT CHG, DSG, and ZVCHG = OFF FET Control Access by Host WDRST = L REG Output tDWTINIT(500 ms) tDWTINIT(500 ms) REG Output tRST tRST tRST WDI Input XALERT CHG, DSG, and ZVCHG = OFF FET Control Access by Host WDRST = H Figure 3. Watchdog Timing Chart – WDI Fault at Start-up Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 15 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com REG Output Normal Operation tWDWT tDWTINIT(500 ms) tDWTINIT(500 ms) REG Output tRST WDI Input XALERT CHG, DSG, and ZVCHG = OFF FET Control Access by Host WDRST = L REG Output Normal Operation tWDWT tDWTINIT(500 ms) tDWTINIT(500 ms) REG Output tRST tRST tRST WDI Input XALERT CHG, DSG, and ZVCHG = OFF FET Control Access by Host WDRST = H Figure 4. Watchdog Timing Chart – WDI Fault After Startup DSG and CHG NCH FET DRIVER CONTROL The bq29330 drives either the DSG or CHG FET off if an OL, SCC, or SCD safety threshold is breached depending on the current direction. The host can force any FET on or off only if the bq29330 integrated protection control allows. The default-state of the FET drive is off. A host can control the FET drive by programming OUTPUT_CONTROL (b2...b0), where b0 is used to control the discharge FET, b1 is used to control the charge FET, and b2 is used to control the ZVCHG FET. These controls are only valid when not in the initialized state. The CHG drive FET can be powered by PACK and the DSG FET can be powered by BAT. When the bq29330 powers down, the NCH FET drivers power down to GND causing the FETs to turn off. 16 Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 PRECHARGE AND 0 V CHARGING The bq29330 supports both a charger that has a precharge mode and one that does not. The bq29330 also supports charging even when the battery falls to 0 V. In order to charge, the charge FET (CHG) must be turned on to create a current path. When the VBAT is ~0 V, the V(PACK) is as low as the battery voltage. In this case, the supply voltage for the device is too low to operate. POWER MODES The bq29330 has three power modes, normal, sleep, and ship. The following table outlines the operational functions during these power modes. Table 1. Outlines the Operational Functions POWER MODE Normal TO ENTER POWER MODE TO EXIT POWER MODE STATE_CONTROL, SLEEP( b0) = 0 and STATE_CONTROL, SHIP ( b1) = 0 MODE DESCRIPTION The battery is in normal operation with protection, power management and battery monitoring functions available and operating. The supply current of this mode varies as the host can enable and disable various power management features. Sleep STATE_CONTROL, SLEEP( b0) = 1 and STATE_CONTROL, SHIP ( b1) = 0 STATE_CONTROL, SLEEP( b0) = 0 CHG, DSG, and ZVCHG OFF, OL, SCC, and SCD function is disabled. Cell AMP, GPOD , CELL BAL, and WDF is not disabled Ship STATE_CONTROL, SHIP ( b1) = 1 and supply at the PACK < VWAKE Supply voltage to PACK Supply The bq29330 is completely shut down as in the sleep mode. In addition, the REG output is disabled, I2C interface is powered down, and memory is not valid. VOLTAGE BASED EXIT FROM SHUTDOWN If a voltage greater than VSTARTUP is applied to the PACK pin, then the bq29330 exits shutdown and enters normal mode. COMMUNICATIONS The I2C-compatible serial communications provides read and write access to the bq29330 data area. The data is clocked via separate data (SDATA) and clock (SCLK) pins. The bq29330 acts as a slave device and does not generate clock pulses. Communication to the bq29330 can be provided from GPIO pins or an I2C supporting port of a host system controller. The slave address for the bq29330 is 7 bits, and the value is 0100 000 (0x20). (MSB) I2C Address +R/W bit (MSB) Write 0 (LSB) I2C Address (0x20) 1 0 0 (LSB) 0 Read 0 0 0 1 The bq29330 does NOT have the following functions compatible with the I2C specification. • The bq29330 is always regarded as a slave. • The bq29330 does not support the General Code of the I2C specification, and therefore will not return an ACK but may return a NACK. • The bq29330 does not support the Address Auto Increment, which allows continuous reading and writing. • The bq29330 will allow data to be written or read from the same location without re-sending the location address. Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 17 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com … … SCLK SDATA A6 A5 … A4 … A0 R/W ACK 0 Start R7 R6 R5 … … R0 D7 ACK 0 D6 … D0 D5 0 Slave Address ACK 0 Data Register Address Stop Note: Slave = bq29330 Figure 5. I2C-Bus Write to bq29330 SCLK … A6 SDATA … A5 … A0 R/W ACK 0 Start R7 R6 … R0 ACK 0 … … A0 A6 R/W ACK 0 Slave Address 1 Start Register Address D7 D6 … D0 NACK 0 Master Drives NACK and Stop Slave Drives The Data Slave Address Note: Slave = bq29330 Stop Figure 6. I2C-Bus Read from bq29330: Protocol A … SCLK SDATA A6 … A5 … A0 R/W ACK R7 … R6 … R0 ACK A6 A5 … … A0 R/W ACK D7 … D0 NACK 0 Start Slave Register Address Stop Start Slave Address Note: Slave = bq29330 Slave Drives The Data Master Drives Stop NACK and Stop Figure 7. I2C-Bus Read from bq29330: Protocol B REGISTER MAP The bq29330 has nine addressable registers. These registers provide status, control, and configuration information for the battery protection system. NAME ADDR TYPE STATUS 0x00 R OUTPUT_CONTROL 0x01 R/W Output pin control from system host and external pin status STATE_CONTROL 0x02 R/W State control FUNCTION_CONTROL 0x03 R/W Function control CELL _SEL 0x04 R/W Battery cell select for cell translation and balance bypass and select mode for calibration OLV 0x05 R/W Overload voltage threshold OLD 0x06 R/W Overload delay time SCC 0x07 R/W Short circuit in charge current threshold voltage and delay SCD 0x08 R/W Short circuit in discharge current threshold voltage and delay 18 DESCRIPTION Status register Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 NAME ADDR TYPE STATUS 0x00 OUTPUT_ CONTROL BIT MAP B7 B6 B5 B4 B3 B2 B1 B0 R 0 0 0 ZV WDF OL SCC SCD 0x01 R/W 0 0 PMS_CHG GPOD XZV CHG DSG LTCLR STATE_ CONTROL 0x02 R/W 0 0 0 RSNS WDRST WDDIS SHIP SLEEP FUNCTION_ CONTROL 0x03 R/W 0 0 0 0 TOUT BAT PACK VMEN CELL _SEL 0x04 R/W CB3 CB2 CB1 CB0 CAL1 CAL0 CELL1 CELL0 OLV 0x05 R/W 0 0 0 OLV4 OLV3 OLV2 OLV1 OLV0 OLD 0x06 R/W 0 0 0 0 OLD3 OLD2 OLD1 OLD0 SCC 0x07 R/W SCCD3 SCCD2 SCCD1 SCCD0 SCCV3 SCCV2 SCCV1 SCCV0 SCD 0x08 R/W SCDD3 SCDD2 SCDD1 SCDD0 SCDV3 SCDV2 SCDV1 SCDV0 STATUS: Status register 7 0 6 0 5 0 STATUS REGISTER (0x00) 4 3 ZV WDF 2 OL 1 SCC 0 SCD The STATUS register provides information about the current state of the bq29330. STATUS b0 (SCD): This bit indicates a short circuit in discharge condition. 0= Voltage below the short circuit in discharge threshold (default). 1= Voltage greater than or equal to the short circuit in discharge threshold. STATUS b1 (SCC): This bit indicates a short circuit in charge condition in the charge direction. 0= Voltage below the short circuit in charge threshold (default). 1= Voltage greater than or equal to the short circuit in charge threshold. STATUS b2 (OL): This bit indicates an overload condition. 0= Voltage less than or equal to the overload threshold (default). 1= Voltage greater than overload threshold. STATUS b3 (WDF): This bit indicates a watchdog fault condition has occurred. 0= 32-kHz oscillation is normal (default). 1= 32-kHz oscillation stopped or not started, and the watchdog has timed out. STATUS b4 (ZV): This bit indicates ZVCHG output is clamped. 0= ZVCHG pin is not clamped (default). 1= ZVCHG pin is clamped. STATUS b5, b6, b7: Reserved OUTPUT_CONTROL : Output control register 7 0 6 0 5 PMS_CHG OUTPUT_CONTROL REGISTER (0x01) 4 3 GPOD XZV 2 CHG 1 DSG 0 LTCLR The OUTPUT_CONTROL register controls the outputs of the bq29330 and can show the state of the external pin corresponding to the control. OUTPUT_ CONTROL b0 (LTCLR): When a fault is latched, this bit releases the fault latch when toggled from 0 to 1 and back to 0 (default =0). 0= (default) 0->1 ->0 clears the fault latches, allowing STATUS to be cleared on its next read. Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 19 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com OUTPUT_ CONTROL b1 (DSG): This bit controls the external discharge FET. 0= Discharge FET is off and is controlled by the system host (default). 1= Discharge FET is on, and the bq29330 is in normal operating mode. OUTPUT_ CONTROL b2 (CHG): This bit controls the external charge FET. 0= Charge FET is off, and is controlled by the system host (default). 1= Charge FET is on, and the bq29330 is in normal operating mode. OUTPUT_CONTROL b3(ZV): This bit enables or disables the precharge function. 0= ZVCHG FET is on, and is controlled by the system host (default). 1= ZVCHG FET is off, and the bq29330 is in normal operating mode. OUTPUT_CONTROL b4 (GPOD): This bit enables or disables the GPOD output. 0= GPOD is high impedance (default). 1= GPOD output is active (GND). OUTPUT_CONTROL b5 (PMS_CHG): This bit enables the CHG output for 0-V charge, when PMS terminal is connected to Pack. 0= CHG FET is off (When PMS = GND, default). 1= CHG FET is on by connecting CHG and PACK terminal. (When PMS = PACK, default). STATE_CONTROL : State control register 7 0 6 0 5 0 STATE_CONTROL REGISTER (0x02) 4 3 RSNS WDRST 2 WDDIS 1 SHIP 0 SLEEP The STATE_CTL register controls the outputs of the bq29330 and can be used to clear certain states. STATE_CONTROL b0 (SLEEP): This bit is used to enter the sleep power mode. 0= bq29330 exits sleep mode (default). 1= bq29330 enters the sleep mode. STATE_CONTROL b1 (SHIP): This bit is used to enter the ship power mode when Pack supply voltage is not applied. 0= bq29330 is in normal mode (default). 1= bq29330 enters ship mode when pack voltage is removed. STATE_CONTROL b2 (WDDIS): This bit is used to enable the watchdog timer. 0= Watchdog timer is enabled (default). 1= Watchdog timer is disabled. STATE_CONTROL b3 (WDRST): This bit is used to enable the reset for GC, when watchdog timer is active. 0= Reset output is disabled, when watchdog timer is active (default). 1= 2 Times reset output is enabled, when watchdog timer is active. STATE_CONTROL b4 (RSNS): This bit sets the OL, SCC, and SCD thresholds into a range suitable for a low sense resistor value by dividing the OLV, SCCV, and SCDV selected voltage thresholds by 2. 0= Current protection voltage threshold as programmed (default) 1= Current protection voltage thresholds divided by 2 as programmed STATE_CONTROL b6..7 (0): These bits are not used and should be set to 0. 20 Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 FUNCTION_CONTROL : Function control register 7 0 6 0 FUNCTION_CTL REGISTER (0x03) 4 3 0 TOUT 5 0 2 BAT 1 PACK 0 VMEN The FUNCTION_CONTROL register enables and disables features of the bq29330. FUNCTION_CONTROL b0 (VMEN): This bit enables or disables the cell and battery voltage monitoring function. 0= Disable voltage monitoring (default). CELL output is pulled down to GND level. 1= Enable voltage monitoring FUNCTION_CONTROL b1 (PACK): This bit is used to translate the PACK input to the CELL+, CELL– pins when VMEN = 1. The PACK input voltage is divided by 18 and is presented on CELL+, CELL– pins regardless of the CELL_SEL register settings. 0= CELL_SEL (b0, b1) settings determine CELL+, CELL– output when VMEN = 1(default). 1= PACK input translated to CELL output regardless of CELL_SEL (b0, b1) selection when VMEN=1 FUNCTION_CTL b2 (BAT): This bit is used to translate the BAT input to the CELL+, CELL– pins when VMEN=1. The VC5 input voltage is divided by 18 and is presented on CELL+, CELL– regardless of the CELL_SEL register settings. 0= CELL_SEL (b0, b1) settings determine CELL+, CELL– output when VMEN = 1(default). 1= BAT input translated to CELL+, CELL– output regardless of CELL_SEL (b0, b1) selection when VMEN = 1 This bit priority is higher than PACK(b1). FUNCTION_CONTROL b3 (TOUT): This bit controls the power to the thermistor. 0= Thermistor power is off (default). 1= Thermistor power is on. CELL_SEL : Cell select register 7 CB3 6 CB2 CELL_SEL REGISTER (0x04) 4 3 CB0 CAL1 5 CB1 2 CAL0 1 CELL1 0 CELL0 This register determines cell selection for voltage measurement and translation, cell balancing, and the operational mode of the cell voltage monitoring. CELL_SEL b0–b1 (CELL0–CELL1): These two bits select the series cell for voltage measurement translation. CELL1 CELL0 0 0 VC4–VC5, Bottom series element (default) SELECTED CELL 0 1 VC4–VC3, Second lowest series element 1 0 VC3–VC2, Second highest series element 1 1 VC1–VC2, Top series element Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 21 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com CELL_SEL b2–b3 (CAL1, CAL0): These bits determine the mode of the voltage monitor block CAL1 CAL0 0 0 Cell translation for selected cell (default) SELECTED MODE 0 1 Offset measurement for selected cell 1 0 Monitor the VREF value for gain calibration 1 1 Monitor the VREF directly value for gain calibration, bypassing the translation circuit CELL_SEL b4–b7 (CB0 – CB3): These 4 bits select the series cell for cell balance bypass path. CELL_SEL b4 (CB0): This bit enables or disables the bottom series cell balance charge bypass path. 0= Disable bottom series cell balance charge bypass path (default) 1= Enable bottom series cell balance charge bypass path CELL_SEL b5 (CB1): This bit enables or disables the second lowest series cell balance charge bypass path. 0= Disable series cell balance charge bypass path (default) 1= Enable series cell balance charge bypass path CELL_SEL b6 (CB2): This bit enables or disables the second highest cell balance charge bypass path. 0= Disable series cell balance charge bypass path (default) 1= Enable series cell balance charge bypass path CELL_SEL b7 (CB3): This bit enables or disables the highest series cell balance charge bypass path. 0= Disable series cell balance charge bypass path (default) 1= Enable series cell balance charge bypass path OLV: Overload Voltage threshold register 7 0 6 0 5 0 OLV REGISTER (0x05) 4 3 OLV4 OLV3 2 OLV2 1 OLV1 0 OLV0 OLV (b4–b0): These four bits select the value of the overload threshold with a default of 0000. OLV (b5–b7): These bits are not used and should be set to 0. OLV (b4–b0) configuration bits with corresponding voltage threshold (1) 0x00 –0.050 V 0x08 –0.090 V 0x01 –0.055 V 0x09 –0.095 V 0x02 –0.060 V 0x0a –0.100 V 0x03 –0.065 V 0x0b –0.105 V 0x04 –0.070 V 0x0c –0.110 V 0x05 –0.075 V 0x0d –0.115 V 0x06 –0.080 V 0x0e –0.120 V 0x07 –0.085 V 0x0f –0.125 V (1) 22 0x10 0x11 0x12 0x13 0x14 0x15 0x16 0x17 –0.130 –0.135 –0.140 –0.145 –0.150 –0.155 –0.160 –0.165 V V V V V V V V 0x18 0x19 0x1a 0x1b 0x1c 0x1d 0x1e 0x1f –0.170 –0.175 –0.180 –0.185 –0.190 –0.195 –0.200 –0.205 V V V V V V V V If RSNS bit is FUNCTION_CONTROL = 1, then the corresponding voltage threshold is divided by 2. Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 bq29330 www.ti.com SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 OLD: Overload Delay time configuration register 7 0 6 0 OLD REGISTER (0x07) 4 3 0 OLD3 5 0 2 OLD2 1 OLD1 0 OLD0 OLD(b3–b0): These four bits select the value of the delay time for overload with a default of 0000. 0x00 1 ms 0x04 9 ms 0x08 17 ms 0x01 3 ms 0x05 11 ms 0x09 19 ms 0x02 5 ms 0x06 13 ms 0x0a 21 ms 0x03 7 ms 0x07 15 ms 0x0b 23 ms 0x0c 0x0d 0x0e 0x0f 25 27 29 31 ms ms ms ms SCC : Short Circuit In Charge configuration register 7 SCCD3 6 SCCD2 5 SCCD1 SCC REGISTER (0x08) 4 3 SCCD0 SCCV3 2 SCCV2 1 SCCV1 0 SCCV0 This register selects the short circuit in charge voltage threshold and delay. SCCV (b3–b0) : These lower nibble bits 0x00 0.100 V 0x01 0.125 V 0x02 0.150 V 0x03 0.175 V (1) select the value of the short circuit 0x04 0.200 V 0x05 0.225 V 0x06 0.250 V 0x07 0.275 V in charge voltage threshold with 0000 as the default. (1) 0x08 0.300 V 0x0c 0.400 V 0x09 0.325 V 0x0d 0.425 V 0x0a 0.350 V 0x0e 0.450 V 0x0b 0.375 V 0x0f 0.475 V If RSNS bit is FUNCTION_CTL = 1, then the corresponding voltage threshold is divided by 2. SCCD (b7–b4): These upper nibble bits select the value of the short circuit in charge delay time. Exceeding the voltage threshold for longer than this period turns off the CHG and DSG outputs. 0000 is the default. 0x00 0 μs 0x04 244 μs 0x08 488 μs 0x01 61 μs 0x05 305 μs 0x09 549 μs 0x02 122 μs 0x06 366 μs 0x0a 610 μs 0x03 183 μs 0x07 427 μs 0x0b 671 μs short circuit in charge 0x0c 0x0d 0x0e 0x0f 732 μs 793 μs 854 μs 915 μs 1 SCDV1 0 SCDV0 SCD : Short Circuit In Discharge configuration register 7 SCDD3 6 SCDD2 5 SCDD1 SCD REGISTER (0x08) 4 3 SCDD0 SCDV3 2 SCDV2 This register selects the short circuit in discharge voltage threshold and delay. SCDV(b3–b0) : These lower nibble bits 0x00 –0.100 V 0x01 –0.125 V 0x02 –0.150 V 0x03 –0.175 V (1) select the value of the short circuit in discharge voltage threshold with 0000 as the default. (1) 0x04 –0.200 V 0x08 –0.300 V 0x0c –0.400 0x05 –0.225 V 0x09 –0.325 V 0x0d –0.425 0x06 –0.250 V 0x0a –0.350 V 0x0e –0.450 0x07 –0.275 V 0x0b –0.375 V 0x0f –0.475 V V V V If RSNS bit is FUNCTION_CTL = 1, then the corresponding voltage threshold is divided by 2. SCCD (b7–b4): These upper nibble bits select the value of the short circuit in charge delay time. Exceeding the voltage threshold for longer than this period will turn off the CHG and DSG outputs. 0000 is the default. 0x00 0 μs 0x04 244 μs 0x08 488 μs 0x01 61 μs 0x05 305 μs 0x09 549 μs 0x02 122 μs 0x06 366 μs 0x0a 610 μs 0x03 183 μs 0x07 427 μs 0x0b 671 μs Short Circuit in charge 0x0c 0x0d 0x0e 0x0f 732 μs 793 μs 854 μs 915 μs Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 23 bq29330 SLUS673E – SEPTEMBER 2005 – REVISED MARCH 2012 www.ti.com REVISION HISTORY Changes from Original (September 2005) to Revision A Page • Changed package name From: SSOP(DBT) To: TSSOP(DBT) in the Ordering Information Table .................................... 2 • Changed the SCLK pin description From: Open-drain bi-directional serial interface clock with internal 10-kΩ pullup to VREG To: Open-drain serial interface clock with internal 10-kΩ pullup to VREG ................................................................. 4 • Changed Supply Current 2 From: XALERT, SCLK, SDATA. ZVCHG = off, Input WDI, To: XALERT, SCLK, SDATA. ZVCHG = off, WDI = 32 kHz, ................................................................................................................................................ 7 • Changed Calibration of Cell Voltage Monitor Amplifier Gain, Step 3 - From: Set CAL1=1, CAL0=1, CELL1=0, CELL0=0, VMEN=1. To: Set CAL1=1, CAL0=0, CELL1=0, CELL0=0, VMEN=1. ............................................................. 12 Changes from Revision A (December 2005) to Revision B • Page Deleted the QFN(RHB) package from the Ordering Information Table, the Package Option Pin Diagrams, and the Pin Functions table. .............................................................................................................................................................. 2 Changes from Revision B (August 2006) to Revision C Page • Changed BAT Pin description From: Charge pump, charge N-CH FET gate drive To: Device power supply input ............ 3 • Changed ELECTRICAL CHARACTERISTICS - CURRENT PROTECTION DETECTION section - positive and negative values were not properly displayed. ....................................................................................................................... 8 • Changed Figure 3 - Watchdog Timing Chart – WDI Fault at Start-up ................................................................................ 15 • Added Figure 4 - Watchdog Timing Chart – WDI Fault After Startup ................................................................................ 16 Changes from Revision C (March 2009) to Revision D Page • Added the RSM package to the Ordering Information Table ............................................................................................... 2 • Added the RSM pin out package illustration. ........................................................................................................................ 3 Changes from Revision D (July 2009) to Revision E Page • Changed the device numbers in the Ordering Information Table From: bq29330ADBT and bq29330ARSM To: bq29330DBT and bq29330RSM ........................................................................................................................................... 2 • Added Thermal Information .................................................................................................................................................. 2 • Changed the AC Timing Requiremenst Table, fSCL - Clock frequency MAX value From: 400 kHz To: 100 kHz ............... 10 24 Submit Documentation Feedback Copyright © 2005–2012, Texas Instruments Incorporated Product Folder Link(s): bq29330 PACKAGE OPTION ADDENDUM www.ti.com 13-Aug-2021 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) BQ29330DBT ACTIVE TSSOP DBT 30 60 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 110 29330 BQ29330DBTG4 ACTIVE TSSOP DBT 30 60 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 110 29330 BQ29330DBTR ACTIVE TSSOP DBT 30 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 110 29330 BQ29330DBTRG4 ACTIVE TSSOP DBT 30 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 110 29330 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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