CDCLVD1216RGZT

CDCLVD1216 www.ti.com SCAS900B – OCTOBER 2010 – REVISED JANUARY 2011 2:16 Low Additive Jitter LVDS Buffer Check for Samples: CDCLVD1216 FEATURES 1 • • • • • • • • • • • • 2:16 Differential Buffer Low Additive Jitter: 3000 V Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions” is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability. The outputs can handle permanent short. RECOMMENDED OPERATING CONDITIONS Device supply voltage, VCC Ambient temperature, TA MIN TYP MAX 2.375 2.5 2.625 V 85 °C –40 UNIT THERMAL INFORMATION CDCLVD1216 THERMAL METRIC (1) RGZ(48 PINS) θJA Junction-to-ambient thermal resistance 30.6 θJC(top) Junction-to-case(top) thermal resistance 28.5 θJB Junction-to-board thermal resistance 10.5 ψJT Junction-to-top characterization parameter 0.4 ψJB Junction-to-board characterization parameter 10.2 θJC(bottom) Junction-to-case(bottom) thermal resistance 3.1 (1) UNITS °C/W For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. ELECTRICAL CHARACTERISTICS At VCC = 2.375V to 2.625V, TA = –40°C to 85°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT IN_SEL CONTROL INPUT CHARACTERISTICS VdI3 3 State VdIH Input high voltage Open VdIL Input low voltage IdIH Input high current VCC = 2.625 V, VIH = 2.625 V IdIL Input low current VCC = 2.625 V, VIL= 0V Rpull(IN_SEL) Input pull-up/ pull-down resistor 0.5×VCC V 0.7×VCC V 0.2×VCC V 30 μA –30 μA 200 kΩ 2.5V LVCMOS (see Figure 7) INPUT CHARACTERISTICS fIN Input frequency External threshold voltage applied to complementary input 200 MHz 1.5 V Vth + 0.1 VCC V 0 Vth – 0.1 V 10 μA Vth Input threshold voltage VIH Input high voltage VIL Input low voltage IIH Input high current VCC = 2.625 V, VIH = 2.625 V IIL Input low current VCC = 2.625 V, VIL = 0 V ΔV/ΔT Input edge rate 20%–80% CIN Input capacitance 2.5 Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated 4 Product Folder Links: CDCLVD1216 1.1 –10 1.5 μA V/ns pF CDCLVD1216 www.ti.com SCAS900B – OCTOBER 2010 – REVISED JANUARY 2011 ELECTRICAL CHARACTERISTICS (continued) At VCC = 2.375V to 2.625V, TA = –40°C to 85°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT DIFFERENTIAL INPUT CHARACTERISTICS fIN Input frequency Clock input 800 MHz VIN, Differential input voltage peak-to-peak VICM = 1.25 V 0.3 1.6 VPP VICM Input common mode voltage range VIN, DIFF, PP > 0.4 V 1.0 VCC – 0.3 V IIH Input high current VCC = 2.625 V, VIH = 2.625 V 10 μA IIL Input low current VCC = 2.625, VIL = 0 V ΔV/ΔT Input edge rate 20%–80% CIN Input capacitance DIFF –10 0.75 μA V/ns 2.5 pF LVDS OUTPUT CHARACTERISTICS |VOD| Differential output voltage magnitude ΔVOD Change in differential output voltage magnitude VOC(SS) Steady-state common mode output voltage ΔVOC(SS) Steady-state common mode output voltage VIN, DIFF, PP = 0.6V, RL = 100 Ω Vring Output overshoot and undershoot Percentage of output amplitude VOD VOS Output ac common mode VIN, DIFF, PP = 0.6V, RL = 100 Ω IOS Short-circuit output current VOD = 0 V tPD Propagation delay VIN, DIFF, PP = 0.3 V tSK, PP Part-to-part skew tSK, O Output skew VIN, DIFF, PP = 0.3V, RL = 100 Ω tSK,P Pulse skew(with 50% duty cycle input) Crossing-point-to-crossing-point distortion tRJIT Random additive jitter (with 50% duty cycle input) Edge speed 0.75 V/ns, 10 kHz – 20 MHz tR/tF Output rise/fall time 20% to 80%, 100 Ω, 5 pF ICCSTAT Static supply current Outputs unterminated, f = 0 Hz ICC100 Supply current ICC800 Supply current 250 450 mV –15 15 mV 1.1 1.375 –15 15 V mV 10% 40 1.5 –50 50 70 mVPP ±24 mA 2.5 ns 600 ps 55 ps 50 ps 0.3 ps, RMS 300 ps 17 28 mA All outputs, RL = 100 Ω, f = 100 MHz 107 140 mA All outputs, RL = 100 Ω, f = 800 MHz 147 180 mA 1.25 1.35 V VAC_REF CHARACTERISTICS VAC_REF Reference output voltage VCC = 2.5 V Iload = 100 µA 1.1 Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated Product Folder Links: CDCLVD1216 5 CDCLVD1216 SCAS900B – OCTOBER 2010 – REVISED JANUARY 2011 www.ti.com Typical Additive Phase Noise Characteristics for 100 MHz Clock PARAMETER MIN TYP MAX UNIT phn100 Phase noise at 100 Hz offset -132.9 dBc/Hz phn1k Phase noise at 1 kHz offset -138.8 dBc/Hz phn10k Phase noise at 10 kHz offset -147.4 dBc/Hz phn100k Phase noise at 100 kHz offset -153.6 dBc/Hz phn1M Phase noise at 1 MHz offset -155.2 dBc/Hz phn10M Phase noise at 10 MHz offset -156.2 dBc/Hz phn20M Phase noise at 20 MHz offset -156.6 dBc/Hz tRJIT Random additive jitter from 10 kHz to 20 MHz 171 fs, RMS Typical Additive Phase Noise Characteristics for 737.27 MHz Clock PARAMETER phn100 Phase noise at 100 Hz offset phn1k Phase noise at 1 kHz offset phn10k Phase noise at 10 kHz offset phn100k MIN TYP MAX UNIT -80.2 dBc/Hz -114.3 dBc/Hz -138 dBc/Hz Phase noise at 100 kHz offset -143.9 dBc/Hz phn1M Phase noise at 1 MHz offset -145.2 dBc/Hz phn10M Phase noise at 10 MHz offset -146.5 dBc/Hz phn20M Phase noise at 20 MHz offset -146.6 dBc/Hz tRJIT Random additive jitter from 10 kHz to 20 MHz 65 fs, RMS 6 Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated Product Folder Links: CDCLVD1216 CDCLVD1216 www.ti.com SCAS900B – OCTOBER 2010 – REVISED JANUARY 2011 TYPICAL CHARACTERISTICS Phase Noise - dBc/Hz INPUT- AND OUTPUT-CLOCK PHASE NOISES vs FREQUENCY FROM the CARRIER (TA = 25°C and VCC = 2.5V) Input clock RMS jitter is 32 fs from 10 kHz to 20 MHz and additive RMS jitter is 152 fs Figure 3. 100 MHz Input and Output Phase Noise Plot spacer VOD − Differential Output Voltage − mV 350 TA = 25oC 340 2.625V 330 320 2.5V 310 300 2.375V 290 280 270 260 250 0 100 200 300 400 500 600 700 800 Frequency − MHz Figure 4. Differential Output Voltage vs Frequency Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated Product Folder Links: CDCLVD1216 7 CDCLVD1216 SCAS900B – OCTOBER 2010 – REVISED JANUARY 2011 www.ti.com TYPICAL CHARACTERISTICS (continued) TEST CONFIGURATIONS Oscilloscope 100 W LVDS Figure 5. LVDS Output DC Configuration During Device Test Phase Noise Analyzer LVDS 50 W Figure 6. LVDS Output AC Configuration During Device Test VIH Vth IN VIL IN Vth Figure 7. DC Coupled LVCMOS Input During Device Test VOH OUTNx VOD OUTPx VOL 80% VOUT,DIFF,PP (= 2 x VOD) 20% 0V tr tf Figure 8. Output Voltage and Rise/Fall Time 8 Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated Product Folder Links: CDCLVD1216 CDCLVD1216 www.ti.com SCAS900B – OCTOBER 2010 – REVISED JANUARY 2011 TYPICAL CHARACTERISTICS (continued) INNx INPx tPLH0 tPHL0 tPLH1 tPHL1 OUTN0 OUTP0 OUTN1 OUTP1 tPLH2 tPHL2 OUTN2 OUTP2 OUTN15 tPHL15 tPLH15 OUTP15 A. Output skew is calculated as the greater of the following: As of the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn (n = 0, 1, 2, ..15) B. Part to part skew is calculated as the greater of the following: As the difference between the fastest and the slowest tPLHn or the difference between the fastest and the slowest tPHLn across multiple devices (n = 0, 1, 2, ..15) Figure 9. Output Skew and Part-to-Part Skew Vring OUTNx VOD 0 V Differential OUTPx Figure 10. Output Overshoot and Undershoot Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated Product Folder Links: CDCLVD1216 9 CDCLVD1216 SCAS900B – OCTOBER 2010 – REVISED JANUARY 2011 www.ti.com TYPICAL CHARACTERISTICS (continued) VOS GND Figure 11. Output AC Common Mode APPLICATION INFORMATION THERMAL MANAGEMENT For reliability and performance reasons, the die temperature should be limited to a maximum of +125°C. The device package has an exposed pad that provides the primary heat removal path to the printed circuit board (PCB). To maximize the heat dissipation from the package, a thermal landing pattern including multiple vias to a ground plane must be incorporated into the PCB within the footprint of the package. The thermal pad must be soldered down to ensure adequate heat conduction to of the package. Check the mechanical data at the end of the data sheet for land and via pattern examples. POWER SUPPLY FILTERING High-performance clock buffers are sensitive to noise on the power supply, which can dramatically increase the additive jitter of the buffer. Thus, it is essential to reduce noise from the system power supply, especially when jitter/phase noise is critical to the application. Filter capacitors are used to eliminate the low-frequency noise from the power supply, where the bypass capacitors provide the low impedance path for high-frequency noise and guard the power-supply system against the induced fluctuations. These bypass capacitors also provide instantaneous current surges as required by the device and should have low equivalent series resistance (ESR). To properly use the bypass capacitors, they must be placed close to the power-supply pins and laid out with short loops to minimize inductance. It is recommended to add as many high-frequency (for example, 0.1 μF) bypass capacitors as there are supply pins in the package. It is recommended, but not required, to insert a ferrite bead between the board power supply and the chip power supply that isolates the high-frequency switching noises generated by the clock driver; these beads prevent the switching noise from leaking into the board supply. Choose an appropriate ferrite bead with low dc resistance because it is imperative to provide adequate isolation between the board supply and the chip supply, as well as to maintain a voltage at the supply pins that is greater than the minimum voltage required for proper operation. Board Supply Chip Supply Ferrite Bead 1 µF 10µF 0.1 µF (x6) Figure 12. Power Supply Filtering 10 Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated Product Folder Links: CDCLVD1216 CDCLVD1216 www.ti.com SCAS900B – OCTOBER 2010 – REVISED JANUARY 2011 LVDS OUTPUT TERMINATION The proper LVDS termination for signal integrity over two 50 Ω lines is 100 Ω between the outputs on the receiver end. Either dc-coupled termination or ac-coupled termination can be used for LVDS outputs. It is recommended to place termination resister close to the receiver. If the receiver is internally biased to a voltage different than the output common mode voltage of the CDCLVD1216, ac-coupling should be used. If the LVDS receiver has internal 100 Ω termination, external termination must be omitted. Unused outputs can be left open without connecting any trace to the output pins. Z = 50 W 100 W CDCLVD1216 LVDS Z = 50 W Figure 13. LVDS Output DC Termination 100 nF Z = 50 W 100 W CDCLVD1216 LVDS Z = 50 W 100 nF Figure 14. LVDS Output AC Termination with Receiver Internally Biased Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated Product Folder Links: CDCLVD1216 11 CDCLVD1216 SCAS900B – OCTOBER 2010 – REVISED JANUARY 2011 www.ti.com INPUT TERMINATION The CDCLVD1216 inputs can be interfaced with LVDS, LVPECL, or LVCMOS drivers. LVDS Driver can be connected to CDCLVD1216 inputs with dc or ac coupling as shown Figure 15 and Figure 16 respectively. Z = 50 W 100 W LVDS CDCLVD1216 Z = 50 W Figure 15. LVDS Clock Driver Connected to CDCLVD1216 Input (DC coupled) 100 nF Z = 50 W LVDS CDCLVD1216 Z = 50 W 100 nF 50 W 50 W VAC_REF Figure 16. LVDS Clock Driver Connected to CDCLVD1216 Input (AC coupled) Figure 17 shows how to connect LVPECL inputs to the CDCLVD1216. The series resistors are required to reduce the LVPECL signal swing if the signal swing is >1.6 VPP. 75 W 100 nF Z = 50 W CDCLVD1216 LVPECL Z = 50 W 75 W 150 W 150 W 100 nF 50 W 50 W VAC_REF Figure 17. LVPECL Clock Driver Connected to CDCLVD1216 Input 12 Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated Product Folder Links: CDCLVD1216 CDCLVD1216 www.ti.com SCAS900B – OCTOBER 2010 – REVISED JANUARY 2011 Figure 18 illustrates how to couple a 2.5 V LVCMOS clock input to the CDCLVD1216 directly. The series resistance (RS) should be placed close to the LVCMOS driver if needed. 3.3 V LVCMOS clock input swing needs to be limited to VIH ≤ VCC. RS LVCMOS (2.5V) Z = 50 W CDCLVD1216 V V Vth = IH + IL 2 Figure 18. 2.5V LVCMOS Clock Driver Connected to CDCLVD1216 Input For unused inputs, it is recommended to ground both input pins (INP, INN) using 1 kΩ resistors. Spacer REVISION HISTORY Changes from Original (October 2010) to Revision A Page • Changed Feature - Low Output Skew of 45 ps (Max) To: Low Output Skew of 55 ps (Max) .............................................. 1 • Changed tSK, O Output Skew From: 45 ps (Max) To: 55 ps (Max) ........................................................................................ 5 • Deleted the Recommended PCB Layout illustration .......................................................................................................... 10 Changes from Revision A (November 2010) to Revision B • Page Changed the device status From: Product Preview To: Production ..................................................................................... 1 Submit Documentation Feedback Copyright © 2010–2011, Texas Instruments Incorporated Product Folder Links: CDCLVD1216 13 PACKAGE OPTION ADDENDUM www.ti.com 10-Dec-2020 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) CDCLVD1216RGZR ACTIVE VQFN RGZ 48 2500 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 CDCLVD 1216 CDCLVD1216RGZT ACTIVE VQFN RGZ 48 250 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 85 CDCLVD 1216 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of