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DAC8411IDCKR

DAC8411IDCKR

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    SC70-6

  • 描述:

    SC70-6 1

  • 数据手册
  • 价格&库存
DAC8411IDCKR 数据手册
Product Folder Sample & Buy Support & Community Tools & Software Technical Documents DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 DAC8x11 2-V to 5.5-V, 80-μA, 14- and 16-Bit, Low-Power, Single-Channel, Digital-to-Analog Converters in SC70 Package 1 Features 3 Description • The DAC8311 (14-bit) and DAC8411 (16-bit) devices are low-power, single-channel, voltage output digitalto-analog converters (DAC). They provide excellent linearity and minimize undesired code-to-code transient voltages while offering an easy upgrade path within a pin-compatible family. All devices use a versatile, 3-wire serial interface that operates at clock rates of up to 50 MHz and is compatible with standard SPI™, QSPI™, Microwire, and digital signal processor (DSP) interfaces. 1 • • • • • • • • • • Relative Accuracy: – 1 LSB INL (DAC8311: 14-bit) – 4 LSB INL (DAC8411: 16-bit) microPower Operation: 80 μA at 2 V Power-Down: 0.5 μA at 5 V, 0.1 μA at 2 V Wide Power Supply: 2 V to 5.5 V Power-On Reset to Zero Scale Straight Binary Data Format Low Power Serial Interface With SchmittTriggered Inputs: Up to 50 MHz On-Chip Output Buffer Amplifier, Rail-to-Rail Operation SYNC Interrupt Facility Extended Temperature Range –40°C to 125°C Pin-Compatible Family in a Tiny, 6-Pin SC70 Package All devices use an external power supply as a reference voltage to set the output range. The devices incorporate a power-on reset (POR) circuit that ensures the DAC output powers up at 0 V and remains there until a valid write to the device occurs. The DAC8311 and DAC8411 contain a power-down feature, accessed over the serial interface, that reduces current consumption of the device to 0.1 μA at 2 V in power down mode. The low power consumption of these devices in normal operation makes it ideally suited for portable, battery-operated equipment. The power consumption is 0.55 mW at 5 V, reducing to 2.5 μW in power-down mode. 2 Applications • • • • Portable, Battery-Powered instruments Process Controls Digital Gain and Offset Adjustment Programmable Voltage and Current Sources These devices are pin-compatible with the DAC5311, DAC6311, and DAC7311, offering an easy upgrade path from 8-, 10-, and 12-bit resolution to 14- and 16bit. All devices are available in a small, 6-pin, SC70 package. This package offers a flexible, pincompatible, and functionally-compatible drop-in solution within the family over an extended temperature range of –40°C to 125°C. Simplified Schematic AVDD GND Power-On Reset Device Information(1) PART NUMBER REF(+) DAC Register 14-/16-Bit DAC Output Buffer VOUT DAC8311 DAC8411 PACKAGE SC70 (6) BODY SIZE (NOM) 2.00 mm × 1.25 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Input Control Logic SYNC SCLK Power-Down Control Logic Resistor Network DIN 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Table of Contents 1 2 3 4 5 6 7 8 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Device Comparison ............................................... Pin Configuration and Functions ......................... Specifications......................................................... 1 1 1 2 3 3 4 7.1 7.2 7.3 7.4 7.5 7.6 7.7 7.8 4 4 4 4 5 7 7 9 Absolute Maximum Ratings ...................................... ESD Ratings.............................................................. Recommended Operating Conditions....................... Thermal Information .................................................. Electrical Characteristics........................................... Timing Requirements: 14-Bit ................................... Timing Requirements: 16-Bit .................................... Typical Characteristics .............................................. Detailed Description ............................................ 22 8.1 Overview ................................................................. 22 8.2 Functional Block Diagram ....................................... 22 8.3 Feature Description................................................. 22 8.4 Device Functional Modes........................................ 24 8.5 Programming........................................................... 25 9 Application and Implementation ........................ 27 9.1 Application Information............................................ 27 9.2 Typical Applications ................................................ 28 10 Power Supply Recommendations ..................... 31 11 Layout................................................................... 32 11.1 Layout Guidelines ................................................. 32 11.2 Layout Example .................................................... 32 12 Device and Documentation Support ................. 33 12.1 12.2 12.3 12.4 12.5 Related Links ........................................................ Community Resources.......................................... Trademarks ........................................................... Electrostatic Discharge Caution ............................ Glossary ................................................................ 33 33 33 33 33 13 Mechanical, Packaging, and Orderable Information ........................................................... 33 4 Revision History NOTE: Page numbers for previous revisions may differ from page numbers in the current version. Changes from Revision B (May 2013) to Revision C • Page Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section ................................................................................................. 1 Changes from Revision A (August, 2011) to Revision B Page • Changed all 1.8V to 2.0V throughout data sheet ................................................................................................................... 1 • Deleted 1.8-V Typical Characteristics section ........................................................................................................................ 9 • Changed X-axis for Figure 35............................................................................................................................................... 13 • Changed X-axis for Figure 36............................................................................................................................................... 13 Changes from Original (August, 2008) to Revision A Page • Changed specifications and test conditions for input low voltage parameter......................................................................... 6 • Changed specifications and test conditions for input high voltage parameter ....................................................................... 6 2 Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 5 Device Comparison Table 1. Related Devices RELATED DEVICES 16-BIT 14-BIT 12-BIT 10-BIT 8-BIT Pin and Function Compatible DAC8411 DAC8311 DAC7311 DAC6311 DAC5311 Table 2. Package Information PRODUCT MAXIMUM RELATIVE ACCURACY (LSB) MAXIMUM DIFFERENTIAL NONLINEARITY (LSB) DAC8411 ±8 ±2 DAC8311 ±4 ±1 6 Pin Configuration and Functions DCK Package 6-Pin SC70 Top View SYNC 1 6 VOUT SCLK 2 5 GND DIN 3 4 AVDD/VREF Pin Functions PIN NAME NO. I/O DESCRIPTION AVDD/VREF 4 I Power Supply Input, +2 V to +5.5 V. DIN 3 I Serial Data Input. Data is clocked into the 24-bit (DAC8411) or 16-bit (DAC8311) input shift register on the falling edge of the serial clock input. GND 5 — SCLK 2 I Serial Clock Input. Data can be transferred at rates up to 50 MHz. Ground reference point for all circuitry on the part. SYNC 1 I Level-triggered control input (active low). This is the frame sychronization signal for the input data. When SYNC goes low, it enables the input shift register and data are transferred in on the falling edges of the following clocks. The DAC is updated following the 24th (DAC8411) or 16th (DAC8311) clock cycle, unless SYNC is taken high before this edge, in which case the rising edge of SYNC acts as an interrupt and the write sequence is ignored by the DAC8x11. Refer to the DAC8311 and DAC8411 SYNC Interrupt sections for more details. VOUT 6 O Analog output voltage from DAC. The output amplifier has rail-to-rail operation. Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 3 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) Voltage Temperature (1) MIN MAX UNIT AVDD to GND –0.3 6 V Digital input voltage to GND –0.3 AVDD +0.3 V VOUT to GND –0.3 AVDD +0.3 V 150 °C 150 °C Junction, TJ max Storage, Tstg –65 Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 7.2 ESD Ratings VALUE Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001 V(ESD) (1) (2) Electrostatic discharge (1) UNIT ±1000 Charged-device model (CDM), per JEDEC specification JESD22C101 (2) ±500 V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 7.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT TA Operating temperature –40 +125 °C AVDD Supply voltage 2.0 +5.5 V 7.4 Thermal Information DAC8x11 THERMAL METRIC (1) DCK (SC70) UNIT 6 PINS RθJA Junction-to-ambient thermal resistance 216.4 °C/W RθJC(top) Junction-to-case (top) thermal resistance 52.1 °C/W RθJB Junction-to-board thermal resistance 65.9 °C/W ψJT Junction-to-top characterization parameter 1.3 °C/W ψJB Junction-to-board characterization parameter 65.2 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance N/A °C/W (1) 4 For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report, SPRA953. Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 7.5 Electrical Characteristics at AVDD = 2 V to 5.5 V, RL = 2 kΩ to GND, and CL = 200 pF to GND, and TA = –40°C to +125°C unless otherwise noted. PARAMETER DAC8411, DAC8311 TEST CONDITIONS MIN TYP MAX ±4 ±8 ±4 ±12 ±0.5 ±2 UNIT STATIC PERFORMANCE (1) Resolution DAC8411 Relative accuracy 16 3.6 V to 5 V Measured by the line passing through codes 485 and 64714 2 V to 3.6 V Differential nonlinearity Resolution DAC8311 Differential nonlinearity Measured by the line passing through two codes (2) Offset error drift LSB Bits ±1 ±4 LSB ±0.125 ±1 LSB ±0.05 ±4 All zeros loaded to the DAC register Full-scale error All ones loaded to DAC register mV μV/°C 3 Zero code error 0.2 Gain error Gain temperature coefficient LSB 14 Measured by the line passing through codes 120 and Relative accuracy 16200 Offset error Bits mV 0.04 0.2 % of FSR 0.05 ±0.15 % of FSR AVDD = 5 V ±0.5 AVDD = 2 V ±1.5 ppm of FSR/°C OUTPUT CHARACTERISTICS Output voltage range Output voltage settling time (3) 0 RL = 2 kΩ, CL = 200 pF, AVDD = 5 V, 1/4 scale to 3/4 scale RL = 2 MΩ, CL = 470 pF Slew rate Capacitive load stability Code change glitch impulse RL = ∞ RL = 2 kΩ 1LSB change around major carry Power-up time 10 μs 12 μs 0.7 V/μs 470 pF pF 0.5 nV-s 0.5 nV-s 17 mV 0.5 Ω AVDD = 5 V 50 mA AVDD = 3 V 20 mA Coming out of power-down mode 50 μs RL = 2 kΩ, CL = 200 pF, AVDD = 5 V DC output impedance Short-circuit current V 1000 Digital feedthrough Power-on glitch impulse 6 AVDD AC PERFORMANCE SNR THD SFDR TA= 25°C, BW = 20 kHz, 16-bit level, AVDD = 5 V, fOUT = 1 kHz, 1st 19 harmonics removed for SNR calculation SINAD DAC output noise density (4) DAC output noise (5) (1) (2) (3) (4) (5) 88 dB –66 dB 66 dB 66 dB TA= 25°C, at zero-scale input, fOUT = 1 kHz, AVDD = 5 V 17 nV/√Hz TA= 25°C, at mid-code input, fOUT = 1 kHz, AVDD = 5 V 110 nV/√Hz TA= 25°C, at mid-code input, 0.1 Hz to 10 Hz, AVDD = 5 V 3 μVpp Linearity calculated using a reduced code range of 485 to 64714 for 16-bit, and 120 to 16200 for 14-bit, output unloaded. Straight line passing through codes 485 and 64714 for 16-bit, and 120 and 16200 for 14-bit, output unloaded. Specified by design and characterization, not production tested. For more details, see Figure 33. For more details, see Figure 34. Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 5 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Electrical Characteristics (continued) at AVDD = 2 V to 5.5 V, RL = 2 kΩ to GND, and CL = 200 pF to GND, and TA = –40°C to +125°C unless otherwise noted. PARAMETER DAC8411, DAC8311 TEST CONDITIONS MIN TYP MAX UNIT LOGIC INPUTS (3) ±1 μA AVDD = 2.7 V to 5.5 V 0.3 × AVDD V AVDD = 2 V to 2.7 V 0.1 × AVDD V Input current VINL, input low voltage VINH, input high voltage AVDD = 2.7 V to 5.5 V 0.7 × AVDD V AVDD = 2 V to 2.7 V 0.9 × AVDD V Pin capacitance 1.5 3 pF 5.5 V POWER REQUIREMENTS AVDD 2 Normal mode VINH = AVDD and VINL = GND, at mid-scale code (6) IDD All power-down mode Normal mode VINH = AVDD and VINL = GND, at mid-scale code (6) VINH = AVDD and VINL = GND, at mid-scale code (6) Power dissipation All power-down mode (6) 6 VINH = AVDD and VINL = GND, at mid-scale code (6) AVDD = 3.6 V to 5.5 V 110 160 AVDD = 2.7 V to 3.6 V 95 150 AVDD = 2 V to 2.7 V 80 140 AVDD = 3.6 V to 5.5 V 0.5 3.5 AVDD = 2.7 V to 3.6 V 0.4 3.0 AVDD = 2 V to 2.7 V 0.1 2.0 AVDD = 3.6 V to 5.5 V 0.55 0.88 AVDD = 2.7 V to 3.6 V 0.25 0.54 AVDD = 2 V to 2.7 V 0.14 0.38 AVDD = 3.6 V to 5.5 V 2.50 19.2 AVDD = 2.7 V to 3.6 V 1.08 10.8 AVDD = 2 V to 2.7 V 0.72 8.1 μA μA mW μW For more details, see Figure 14 and Figure 55. Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 7.6 Timing Requirements: 14-Bit All specifications at –40°C to 125°C, and AVDD = 2 V to 5.5 V, unless otherwise noted. (1) PARAMETER TEST CONDITIONS f(SCLK) Serial clock frequency t1 SCLK cycle time t2 SCLK high time t3 SCLK low time t4 SYNC to SCLK rising edge setup time t5 Data setup time t6 Data hold time t7 SCLK falling edge to SYNC rising edge t8 Minimum SYNC high time t9 16th SCLK falling edge to SYNC falling edge t10 SYNC rising edge to 16th SCLK falling edge (for successful SYNC interrupt) (1) (2) (2) MIN TYP MAX AVDD = 2.0 V to 3.6 V 20 AVDD = 3.6 V to 5.5 V 50 AVDD = 2 V to 3.6 V 50 AVDD = 3.6 V to 5.5 V 20 AVDD = 2 V to 3.6 V 25 AVDD = 3.6 V to 5.5 V 10 AVDD = 2 V to 3.6 V 25 AVDD = 3.6 V to 5.5 V 10 AVDD = 2 V to 3.6 V 0 AVDD = 3.6 V to 5.5 V 0 AVDD = 2 V to 3.6 V 5 AVDD = 3.6 V to 5.5 V 5 AVDD = 2 V to 3.6 V 4.5 AVDD = 3.6 V to 5.5 V 4.5 AVDD = 2 V to 3.6 V 0 AVDD = 3.6 V to 5.5 V 0 AVDD = 2 V to 3.6 V 50 AVDD = 3.6 V to 5.5 V 20 AVDD = 2 V to 3.6 V 100 AVDD = 3.6 V to 5.5 V 100 AVDD = 2 V to 3.6 V 15 AVDD = 3.6 V to 5.5 V 15 UNIT MHz ns ns ns ns ns ns ns ns ns ns All input signals are specified with tR = tF = 3 ns (10% to 90% of AVDD) and timed from a voltage level of (VIL + VIH)/2. See Figure 1 timing diagram. 7.7 Timing Requirements: 16-Bit All specifications at –40°C to 125°C, and AVDD = 2 V to 5.5 V, unless otherwise noted. (1) PARAMETER TEST CONDITIONS f(SCLK) Serial clock frequency t1 SCLK cycle time t2 SCLK high time t3 SCLK low time t4 SYNC to SCLK rising edge setup time t5 Data setup time t6 Data hold time t7 SCLK falling edge to SYNC rising edge (1) (2) (2) MIN TYP MAX AVDD = 2.0 V to 3.6 V 20 AVDD = 3.6 V to 5.5 V 50 AVDD = 2 V to 3.6 V 50 AVDD = 3.6 V to 5.5 V 20 AVDD = 2 V to 3.6 V 25 AVDD = 3.6 V to 5.5 V 10 AVDD = 2 V to 3.6 V 25 AVDD = 3.6 V to 5.5 V 10 AVDD = 2 V to 3.6 V 0 AVDD = 3.6 V to 5.5 V 0 AVDD = 2 V to 3.6 V 5 AVDD = 3.6 V to 5.5 V 5 AVDD = 2 V to 3.6 V 4.5 AVDD = 3.6 V to 5.5 V 4.5 AVDD = 2 V to 3.6 V 0 AVDD = 3.6 V to 5.5 V 0 UNIT MHz ns ns ns ns ns ns ns All input signals are specified with tR = tF = 3 ns (10% to 90% of AVDD) and timed from a voltage level of (VIL + VIH)/2. See Figure 2 timing diagram. Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 7 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Timing Requirements: 16-Bit (continued) All specifications at –40°C to 125°C, and AVDD = 2 V to 5.5 V, unless otherwise noted.(1) (2) PARAMETER TEST CONDITIONS t8 Minimum SYNC high time t9 24th SCLK falling edge to SYNC falling edge t10 SYNC rising edge to 24th SCLK falling edge (for successful SYNC interrupt) AVDD = 2 V to 3.6 V 50 AVDD = 3.6 V to 5.5 V 20 AVDD = 2 V to 3.6 V 100 AVDD = 3.6 V to 5.5 V 100 AVDD = 2 V to 3.6 V 15 AVDD = 3.6 V to 5.5 V 15 TYP MAX UNIT ns ns ns t9 t1 SCLK MIN 1 16 t8 t2 t3 t4 t7 SYNC t10 t6 t5 DB15 DIN DB0 DB15 Figure 1. Serial Write Operation: 14-Bit (DAC8311) t9 t1 SCLK 1 24 t8 t3 t4 t2 t7 SYNC t6 t10 t5 DIN DB23 DB0 DB23 Figure 2. Serial Write Operation: 16-Bit (DAC8411) 8 Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 7.8 Typical Characteristics 7.8.1 Typical Characteristics: AVDD = 5 V at TA = 25°C, AVDD = 5 V, and DAC loaded with mid-scale code, unless otherwise noted. 2 AVDD = 5V 0 -1 -2 0.2 0.5 DLE (LSB) DLE (LSB) 1.0 0 -0.5 -1.0 0 8192 16384 24576 32768 40960 49152 0.1 0 -0.1 -0.2 57344 65536 0 4096 6144 8192 10240 12288 14336 16384 Digital Input Code Figure 3. DAC8411 16-Bit Linearity Error and Differential Linearity Error vs Code (–40°C) Figure 4. DAC8311 14-Bit Linearity Error and Differential Linearity Error vs Code (–40°C) 2 AVDD = 5V 0 -1 -2 0.2 0.5 DLE (LSB) DLE (LSB) AVDD = 5V 1 LE (LSB) LE (LSB) 6 4 2 0 -2 -4 -6 0 -0.5 -1.0 0 8192 16384 24576 32768 40960 49152 0.1 0 -0.1 -0.2 57344 65536 0 2048 4096 6144 8192 10240 12288 14336 16384 Digital Input Code Digital Input Code Figure 5. DAC8411 16-Bit Linearity Error and Differential Linearity Error vs Code (25°C) Figure 6. DAC8311 14-Bit Linearity Error and Differential Linearity Error vs Code (25°C) 6 4 2 0 -2 -4 -6 2 AVDD = 5V LE (LSB) LE (LSB) 2048 Digital Input Code 1.0 AVDD = 5V 1 0 -1 -2 1.0 0.2 0.5 DLE (LSB) DLE (LSB) AVDD = 5V 1 LE (LSB) LE (LSB) 6 4 2 0 -2 -4 -6 0 -0.5 -1.0 0 8192 16384 24576 32768 40960 49152 57344 65536 0.1 0 -0.1 -0.2 0 2048 4096 6144 8192 10240 12288 14336 16384 Digital Input Code Digital Input Code Figure 7. DAC8411 16-Bit Linearity Error and Differential Linearity Error vs Code (125°C) Figure 8. DAC8311 14-Bit Linearity Error and Differential Linearity Error vs Code (125°C) Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 9 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Typical Characteristics: AVDD = 5 V (continued) at TA = 25°C, AVDD = 5 V, and DAC loaded with mid-scale code, unless otherwise noted. 0.4 5.5 Analog Output Voltage (V) Zero-Code Error (mV) AVDD = 5V 0.3 0.2 0.1 0 -40 -25 -10 5.0 4.5 4.0 3.5 3.0 AVDD = 5V DAC Loaded with FFFFh 2.5 5 20 35 50 65 80 95 110 125 0 2 Temperature (°C) 10 0.6 AVDD = 5V DAC Loaded with 0000h AVDD = 5V Analog Output Voltage (V) 0.4 Offset Error (mV) 8 Figure 10. Source Current at Positive Rail 0.6 0.2 0 -0.2 -0.4 -0.6 -40 -25 -10 0.4 0.2 0 5 20 35 50 65 80 95 110 125 0 2 Temperature (°C) 4 6 8 10 ISINK (mA) Figure 11. Offset Error vs Temperature Figure 12. Sink Current at Negative Rail 120 0.06 AVDD = 5.5V AVDD = 5V Power-Supply Current (mA) 0.04 Full-Scale Error (mV) 6 ISOURCE (mA) Figure 9. Zero-Code Error vs Temperature 0.02 0 -0.02 -0.04 -0.06 -40 -25 -10 100 80 60 5 20 35 50 65 80 95 110 125 0 8192 16384 24576 32768 40960 49152 57344 65536 Digital Input Code Temperature (°C) Figure 13. Full-Scale Error vs Temperature 10 4 Submit Documentation Feedback Figure 14. Power-Supply Current vs Digital Input Code Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 Typical Characteristics: AVDD = 5 V (continued) at TA = 25°C, AVDD = 5 V, and DAC loaded with mid-scale code, unless otherwise noted. 140 1.6 AVDD = 5V Quiescent Current (mA) Power-Supply Current (mA) AVDD = 5V 130 120 110 100 -40 -25 -10 5 20 35 50 65 80 95 1.2 0.8 0.4 0 -40 -25 -10 110 125 5 20 Temperature (°C) Figure 15. Power-Supply Current vs Temperature 50 65 80 95 110 125 Figure 16. Power-Down Current vs Temperature 50 2000 SYNC Input (all other digital inputs = GND) AVDD = 5.5V 45 40 1500 35 Sweep from 0V to 5.5V Occurrences Power-Supply Current (mA) 35 Temperature (°C) 1000 Sweep from 5.5V to 0V 30 25 20 15 500 10 5 -50 136 140 128 Figure 18. Power-Supply Current Histogram Figure 17. Power-Supply Current vs Logic Input Voltage 94 AVDD = 5V, fS = 225kSPS, -1dB FSR Digital Input, Measurement Bandwidth = 20kHz 132 IDD (mA) VLOGIC (V) -40 120 5.0 124 4.5 112 4.0 116 3.5 104 3.0 108 2.5 96 2.0 100 1.5 88 1.0 92 0.5 80 0 84 0 0 AVDD = 5V, fS = 225kSPS, -1dB FSR Digital Input, Measurement Bandwidth = 20kHz THD 92 SNR (dB) THD (dB) -60 2nd Harmonic -70 90 88 -80 3rd Harmonic 86 -90 84 -100 0 1 2 3 4 5 0 fOUT (kHz) 1 2 3 4 5 fOUT (kHz) Figure 19. Total Harmonic Distortion vs Output Frequency Figure 20. Signal-to-Noise Ratio vs Output Frequency Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 11 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Typical Characteristics: AVDD = 5 V (continued) at TA = 25°C, AVDD = 5 V, and DAC loaded with mid-scale code, unless otherwise noted. 0 AVDD = 5V, fOUT = 1kHz, fS = 225kSPS, Measurement Bandwidth = 20kHz VOUT (500mV/div) 20 Gain (dB) -40 -60 -80 -100 AVDD = 5V Clock Feedthrough Impulse ~0.5nV-s -120 -140 0 5 10 15 Time (500ns/div) 20 Frequency (kHz) Figure 22. Clock Feedthrough 5 V, 2 mHz, Midscale VOUT (100mV/div) AVDD = 5V From Code: 7FFFh To Code: 8000h Clock Feedthrough ~0.5nV-s AVDD = 5V From Code: 8000h To Code: 7FFFh VOUT (100mV/div) Figure 21. Power Spectral Density Clock Feedthrough ~0.5nV-s Glitch Impulse < 0.5nV-s Time (5ms/div) Time (5ms/div) Glitch Impulse < 0.5nV-s AVDD = 5V From Code: 2000h To Code: 2001h Figure 24. Glitch Energy 5 V, 16-Bit, 1LSB Step, Falling Edge VOUT (100mV/div) VOUT (100mV/div) Figure 23. Glitch Energy 5 V, 16-Bit, 1LSB Step, Rising Edge Clock Feedthrough ~0.5nV-s AVDD = 5V From Code: 2001h To Code: 2000h Clock Feedthrough ~0.5nV-s Glitch Impulse < 0.5nV-s Time (5ms/div) Time (5ms/div) Figure 25. Glitch Energy 5 V, 14-Bit, 1LSB Step, Rising Edge 12 Submit Documentation Feedback Glitch Impulse < 0.5nV-s Figure 26. Glitch Energy 5 V, 14-Bit, 1LSB Step, Falling Edge Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 Typical Characteristics: AVDD = 5 V (continued) at TA = 25°C, AVDD = 5 V, and DAC loaded with mid-scale code, unless otherwise noted. AVDD = 5V From Code: 0000h To Code: FFFFh AVDD = 5V From Code: FFFFh To Code: 0000h Rising Edge 1V/div Zoomed Rising Edge 100mV/div Falling Edge 1V/div Zoomed Falling Edge 100mV/div Trigger Pulse 5V/div Trigger Pulse 5V/div Time (2ms/div) Time (2ms/div) Figure 27. Full-Scale Settling Time 5-V Rising Edge Figure 28. Full-Scale Settling Time 5-V Falling Edge AVDD = 5V From Code: C000h To Code: 4000h Falling Edge 1V/div Rising Edge 1V/div Zoomed Falling Edge 100mV/div Zoomed Rising Edge 100mV/div AVDD = 5V From Code: 4000h To Code: C000h Trigger Pulse 5V/div Trigger Pulse 5V/div Time (2ms/div) Time (2ms/div) 17mV AVDD (2V/div) AVDD = 5V DAC = Zero Scale Load = 200pF || 10kW Figure 30. Half-Scale Settling Time 5-V Falling Edge AVDD = 5V DAC = Zero Scale Load = 200pF || 10kW VOUT (20mV/div) VOUT (20mV/div) AVDD (2V/div) Figure 29. Half-Scale Settling Time 5-V Rising Edge Time (5ms/div) Time (10ms/div) Figure 31. Power-On Reset to 0 V Power-On Glitch Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Figure 32. Power-Off Glitch Submit Documentation Feedback 13 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Typical Characteristics: AVDD = 5 V (continued) at TA = 25°C, AVDD = 5 V, and DAC loaded with mid-scale code, unless otherwise noted. 300 AVDD = 5V, DAC = Midscale, No Load AVDD = 5V VNOISE (1mV/div) Noise (nV/ÖHz) 250 200 150 Midscale 100 3mVPP Zero Scale Full Scale 50 0 10 100 1k 10k Time (2s/div) 100k Frequency (Hz) Figure 34. DAC Output Noise 0.1 Hz to 10 Hz Bandwidth Figure 33. DAC Output Noise Density vs Frequency 120 0.4 AVDD = 2.0V to 5.5V 110 Quiescent Current (mA) Power-Supply Current (mA) AVDD = 2.0V to 5.5V 100 90 80 70 0.3 0.2 0.1 0 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 2.0 2.5 Figure 35. Power-Supply Current vs Power-Supply Voltage 14 Submit Documentation Feedback 3.0 3.5 4.0 4.5 5.0 5.5 AVDD (V) AVDD (V) Figure 36. Power-Down Current vs Power-Supply Voltage Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 7.8.2 Typical Characteristics: AVDD = 3.6 V at TA = 25°C, and AVDD = 3.6 V, unless otherwise noted. 100 140 AVDD = 3.6V Power-Supply Current (mA) Power-Supply Current (mA) AVDD = 3.6V 90 80 70 60 50 0 130 120 110 100 90 80 -40 -25 -10 8192 16384 24576 32768 40960 49152 57344 65536 35 50 65 80 95 110 125 Figure 37. Power-Supply Current vs Digital Input Code Figure 38. Power-Supply Current vs Temperature 1.2 SYNC Input (all other digital inputs = GND) AVDD = 3.6V Quiescent Current (mA) Power-Supply Current (mA) 20 Temperature (°C) 1200 900 Sweep from 0V to 3.6V 600 300 0.8 0.4 Sweep from 3.6V to 0V 0 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 0 -40 -25 -10 4.0 VLOGIC (V) 5 20 35 50 65 80 95 110 125 Temperature (°C) Figure 39. Power-Supply Current vs Logic Input Voltage Figure 40. Power-Down Current vs Temperature 3.7 0.6 AVDD = 3.6V DAC Loaded with 0000h 3.5 Analog Output Voltage (V) Analog Output Voltage (V) 5 Digital Input Code 3.3 3.1 2.9 2.7 AVDD = 3.6V DAC Loaded with FFFFh 2.5 0 2 4 0.4 0.2 0 6 8 10 0 2 ISOURCE (mA) 4 6 8 10 ISINK (mA) Figure 41. Source Current at Positive Rail Figure 42. Sink Current at Negative Rail Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 15 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Typical Characteristics: AVDD = 3.6 V (continued) at TA = 25°C, and AVDD = 3.6 V, unless otherwise noted. 50 45 AVDD = 3.6V 40 Occurrences 35 30 25 20 15 10 5 126 130 118 122 110 114 102 106 94 98 86 90 78 82 70 74 0 IDD (mA) Figure 43. Power-Supply Current Histogram 7.8.3 Typical Characteristics: AVDD = 2.7 V 6 4 2 0 -2 -4 -6 2 AVDD = 2.7V LE (LSB) LE (LSB) at TA = 25°C, and AVDD = 2.7 V, unless otherwise noted. -2 0.2 DLE (LSB) DLE (LSB) 0 -1 1.0 0.5 0 -0.5 0.1 0 -0.1 -0.2 -1.0 0 16 AVDD = 2.7V 1 8192 16384 24576 32768 40960 49152 57344 65536 0 2048 4096 6144 8192 10240 12288 14336 16384 Digital Input Code Digital Input Code Figure 44. DAC8411 16-Bit Linearity Error and Differential Linearity Error vs Code (–40°C) Figure 45. DAC8311 14-Bit Linearity Error and Differential Linearity Error vs Code (–40°C) Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 Typical Characteristics: AVDD = 2.7 V (continued) 6 4 2 0 -2 -4 -6 2 AVDD = 2.7V LE (LSB) LE (LSB) at TA = 25°C, and AVDD = 2.7 V, unless otherwise noted. -2 0.2 DLE (LSB) DLE (LSB) 0.5 0 -0.5 0.1 0 -0.1 -0.2 -1.0 0 8192 16384 24576 32768 40960 49152 0 57344 65536 2048 4096 6144 8192 10240 12288 14336 16384 Digital Input Code Digital Input Code Figure 46. DAC8411 16-Bit Linearity Error and Differential Linearity Error vs Code (25°C) Figure 47. DAC8311 14-Bit Linearity Error and Differential Linearity Error vs Code (25°C) 6 4 2 0 -2 -4 -6 2 AVDD = 2.7V LE (LSB) LE (LSB) 0 -1 1.0 AVDD = 2.7V 1 0 -1 -2 0.2 DLE (LSB) 1.0 DLE (LSB) AVDD = 2.7V 1 0.5 0 -0.5 0.1 0 -0.1 -0.2 -1.0 0 8192 16384 24576 32768 40960 49152 0 57344 65536 2048 4096 6144 8192 10240 12288 14336 16384 Digital Input Code Digital Input Code Figure 48. DAC8411 16-Bit Linearity Error and Differential Linearity Error vs Code (125°C) Figure 49. DAC8311 14-Bit Linearity Error and Differential Linearity Error vs Code (125°C) 0.4 2.8 Analog Output Voltage (V) Zero-Code Error (mV) AVDD = 2.7V 0.3 0.2 0.1 0 -40 -25 -10 2.6 2.4 2.2 AVDD = 2.7V DAC Loaded with FFFFh 2.0 5 20 35 50 65 80 95 110 125 0 2 Temperature (°C) 4 6 8 10 ISOURCE (mA) Figure 50. Zero-Code Error vs Temperature Figure 51. Source Current at Positive Rail Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 17 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Typical Characteristics: AVDD = 2.7 V (continued) at TA = 25°C, and AVDD = 2.7 V, unless otherwise noted. 0.6 0.6 AVDD = 2.7V DAC Loaded with 0000h AVDD = 2.7V Analog Output Voltage (V) Offset Error (mV) 0.4 0.2 0 -0.2 -0.4 -0.6 -40 -25 -10 0.4 0.2 0 5 20 35 50 65 80 95 110 125 0 2 4 Temperature (°C) Figure 52. Offset Error vs Temperature AVDD = 2.7V Power-Supply Current (mA) 0.04 Full-Scale Error (mV) 10 100 AVDD = 2.7V 0.02 0 -0.02 -0.04 -0.06 -40 -25 -10 90 80 70 60 50 5 20 35 50 65 80 95 0 110 125 8192 16384 24576 32768 40960 49152 57344 65536 Digital Input Code Temperature (°C) Figure 54. Full-Scale Error vs Temperature Figure 55. Power-Supply Current vs Digital Input Code 120 1.0 AVDD = 2.7V AVDD = 2.7V 110 Quiescent Current (mA) Power-Supply Current (mA) 8 Figure 53. Sink Current at Negative Rail 0.06 100 90 80 70 -40 -25 -10 5 20 35 50 65 80 95 110 125 0.8 0.6 0.4 0.2 0 -40 -25 -10 Temperature (°C) Submit Documentation Feedback 5 20 35 50 65 80 95 110 125 Temperature (°C) Figure 56. Power-Supply Current vs Temperature 18 6 ISINK (mA) Figure 57. Power-Down Current vs Temperature Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 Typical Characteristics: AVDD = 2.7 V (continued) at TA = 25°C, and AVDD = 2.7 V, unless otherwise noted. 50 800 AVDD = 2.7V 45 40 600 35 Occurrences Power-Supply Current (mA) SYNC Input (all other digital inputs = GND) Sweep from 0V to 2.7V 400 Sweep from 2.7V to 0V 30 25 20 15 200 10 5 VLOGIC (V) 104 96 100 92 IDD (mA) Figure 58. Power-Supply Current vs Logic Input Voltage Figure 59. Power-Supply Current Histogram 88 -20 AVDD = 2.7V, fS = 225kSPS, -1dB FSR Digital Input, Measurement Bandwidth = 20kHz AVDD = 2.7V, fS = 225kSPS, -1dB FSR Digital Input, Measurement Bandwidth = 20kHz 86 THD SNR (dB) -40 THD (dB) 88 3.0 84 2.5 76 2.0 80 1.5 72 1.0 68 0.5 60 0 64 0 0 -60 84 2nd Harmonic 82 -80 3rd Harmonic 80 -100 0 1 2 3 4 5 0 fOUT (kHz) 1 2 3 4 5 fOUT (kHz) Figure 60. Total Harmonic Distortion vs Output Frequency Figure 61. Signal-to-Noise Ratio vs Output Frequency 0 AVDD = 2.7V, fOUT = 1kHz, fS = 225kSPS, Measurement Bandwidth = 20kHz VOUT (500mV/div) 20 Gain (dB) -40 -60 -80 -100 AVDD = 2.7V Clock Feedthrough Impulse ~0.4nV-s -120 -140 0 5 10 15 Time (5ms/div) 20 Frequency (kHz) Figure 62. Power Spectral Density Figure 63. Clock Feedthrough 2.7 V, 20 mHz, Midscale Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 19 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Typical Characteristics: AVDD = 2.7 V (continued) at TA = 25°C, and AVDD = 2.7 V, unless otherwise noted. AVDD = 2.7V From Code: 8000h To Code: 7FFFh Glitch Impulse < 0.3nV-s Clock Feedthrough ~0.4nV-s VOUT (100mV/div) VOUT (100mV/div) AVDD = 2.7V From Code: 7FFFh To Code: 8000h Glitch Impulse < 0.3nV-s Clock Feedthrough ~0.4nV-s Time (5ms/div) Time (5ms/div) Figure 64. Glitch Energy 2.7 V, 16-Bit, 1LSB Step, Rising Edge Figure 65. Glitch Energy 2.7 V, 16-Bit, 1LSB Step, Falling Edge AVDD = 2.7V From Code: 2001h To Code: 2000h Glitch Impulse < 0.3nV-s Clock Feedthrough ~0.4nV-s VOUT (100mV/div) VOUT (100mV/div) AVDD = 2.7V From Code: 2000h To Code: 2001h Clock Feedthrough ~0.4nV-s Time (5ms/div) Glitch Impulse < 0.3nV-s Time (5ms/div) Figure 66. Glitch Energy 2.7 V, 14-Bit, 1LSB Step, Rising Edge Figure 67. Glitch Energy 2.7 V, 14-Bit, 1LSB Step, Falling Edge AVDD = 2.7V From Code: 0000h To Code: FFFFh AVDD = 2.7V From Code: FFFFh To Code: 0000h Falling Edge 1V/div Rising Edge 1V/div Zoomed Rising Edge 100mV/div Trigger Pulse 2.7V/div Zoomed Falling Edge 100mV/div Trigger Pulse 2.7V/div Time (2ms/div) Time (2ms/div) Figure 68. Full-Scale Settling Time 2.7 V Rising Edge 20 Submit Documentation Feedback Figure 69. Full-Scale Settling Time 2.7 V Falling Edge Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 Typical Characteristics: AVDD = 2.7 V (continued) at TA = 25°C, and AVDD = 2.7 V, unless otherwise noted. AVDD = 2.7V From Code: 4000h To Code: C000h AVDD = 2.7V From Code: C000h To Code: 4000h Falling Edge 1V/div Rising Edge 1V/div Zoomed Rising Edge 100mV/div Trigger Pulse 2.7V/div Trigger Pulse 2.7V/div Time (2ms/div) Time (2ms/div) AVDD (1V/div) AVDD = 2.7V DAC = Zero Scale Load = 200pF || 10kW Figure 71. Half-Scale Settling Time 2.7 V Falling Edge AVDD = 2.7V DAC = Zero Scale Load = 200pF || 10kW VOUT (20mV/div) VOUT (20mV/div) AVDD (1V/div) Figure 70. Half-Scale Settling Time 2.7 V Rising Edge 17mV Zoomed Falling Edge 100mV/div Time (10ms/div) Time (5ms/div) Figure 72. Power-On Reset to 0-V Power-On Glitch Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Figure 73. Power-Off Glitch Submit Documentation Feedback 21 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com 8 Detailed Description 8.1 Overview The DAC8x11 family of devices are low-power, single-channel, voltage output DACs. These devices are monotonic by design, provide excellent linearity, and minimize undesired code-to-code transient voltages while offering an easy upgrade path within a pin-compatible family. All devices use a versatile, 3-wire serial interface that operates at clock rates of up to 50 MHz and is compatible with standard SPI, QSPI, Microwire, and digital signal processor (DSP) interfaces. 8.2 Functional Block Diagram AVDD GND Power-On Reset REF(+) DAC Register Input Control Logic SYNC SCLK Output Buffer 14-/16-Bit DAC Power-Down Control Logic VOUT Resistor Network DIN 8.3 Feature Description 8.3.1 DAC Section The DAC8311 and DAC8411 are fabricated using Texas Instruments' proprietary HPA07 process technology. The architecture consists of a string DAC followed by an output buffer amplifier. Because there is no reference input pin, the power supply (AVDD) acts as the reference. Figure 74 shows a block diagram of the DAC architecture. AVDD REF (+) DAC Register Resistor String VOUT Output Amplifier GND Figure 74. DAC8x11 Architecture The input coding to the DAC8311 and DAC8411 is straight binary, so the ideal output voltage is given by: D VOUT = AVDD ´ n 2 where • • 22 n = resolution in bits; either 14 (DAC8311) or 16 (DAC8411). D = decimal equivalent of the binary code that is loaded to the DAC register; it ranges from 0 to 16,383 for the 14-bit DAC8311, or 0 to 65,535 for the 16-bit DAC8411. Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 Feature Description (continued) 8.3.2 Resistor String The resistor string section is shown in Figure 75. It is simply a string of resistors, each of value R. The code loaded into the DAC register determines at which node on the string the voltage is tapped off to be fed into the output amplifier by closing one of the switches connecting the string to the amplifier. The resistor string architecture is inherently monotonic. VREF RDIVIDER VREF 2 R R To Output Amplifier R R Figure 75. Resistor String 8.3.3 Output Amplifier The output buffer amplifier is capable of generating rail-to-rail voltages on its output which gives an output range of 0V to AVDD. The output amplifier is capable of driving a load of 2 kΩ in parallel with 1000 pF to GND. The source and sink capabilities of the output amplifier can be seen in the Typical Characteristics section for each device. The slew rate is 0.7 V/μs with a half-scale settling time of typically 6 μs with the output unloaded. 8.3.4 Power-On Reset to Zero-Scale The DAC8x11 contains a power-on reset circuit that controls the output voltage during power up. On power up, the DAC register is filled with zeros and the output voltage is 0 V. The DAC register remains that way until a valid write sequence is made to the DAC. This design is useful in applications where it is important to know the state of the output of the DAC while it is in the process of powering up. The occurring power-on glitch impulse is only a few mV (typically, 17 mV; see Figure 31, Figure 72, or Figure 31). Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 23 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com 8.4 Device Functional Modes 8.4.1 Power-Down Modes The DAC8x11 contains four separate modes of operation. These modes are programmable by setting two bits (PD1 and PD0) in the control register. Table 3 shows how the state of the bits corresponds to the mode of operation of the device. Table 3. Modes of Operation for the DAC8x11 PD1 PD0 OPERATING MODE NORMAL MODE 0 0 Normal Operation 0 1 Output 1 kΩ to GND 1 0 Output 100 kΩ to GND 1 1 High-Z POWER-DOWN MODES When both bits are set to 0, the device works normally with a standard power consumption of typically 80 μA at 2 V. However, for the three power-down modes, the typical supply current falls to 0.5 μA at 5 V, 0.4 μA at 3 V, and 0.1 μA at 2.0 V. Not only does the supply current fall, but the output stage is also internally switched from the output of the amplifier to a resistor network of known values. The advantage of this architecture is that the output impedance of the part is known while the part is in power-down mode. There are three different options. The output is connected internally to GND either through a 1-kΩ resistor or a 100-kΩ resistor, or is left open-circuited (High-Z). See Figure 76 for the output stage. Amplifier Resistor String DAC VOUT Power-down Circuitry Resistor Network Figure 76. Output Stage During Power-Down All linear circuitry is shut down when the power-down mode is activated. However, the contents of the DAC register are unaffected when in power-down. The time to exit power-down is typically 50 μs for AVDD = 5 V and AVDD = 3 V. See the Typical Characteristics: AVDD = 5 V for each device for more information. 24 Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 8.5 Programming 8.5.1 DAC8311 Serial Interface The DAC8311 has a 3-wire serial interface (SYNC, SCLK, and DIN) compatible with SPI, QSPI, and Microwire interface standards, as well as most DSPs. See Figure 1 for an example of a typical write sequence. 8.5.1.1 DAC8311 Input Shift Register The input shift register is 16 bits wide, as shown in Figure 77. The first two bits (PD0 and PD1) are reserved control bits that set the desired mode of operation (normal mode or any one of three power-down modes) as indicated in Table 3. The write sequence begins by bringing the SYNC line low. Data from the DIN line are clocked into the 16-bit shift register on each falling edge of SCLK. The serial clock frequency can be as high as 50 MHz, making the DAC8311 compatible with high-speed DSPs. On the 16th falling edge of the serial clock, the last data bit is clocked in and the programmed function is executed. At this point, the SYNC line may be kept low or brought high. In either case, it must be brought high for a minimum of 20 ns before the next write sequence so that a falling edge of SYNC can initiate the next write sequence. 8.5.1.2 DAC8311 SYNC Interrupt In a normal write sequence, the SYNC line is kept low for at least 16 falling edges of SCLK and the DAC is updated on the 16th falling edge. However, bringing SYNC high before the 16th falling edge acts as an interrupt to the write sequence. The shift register is reset and the write sequence is seen as invalid. Neither an update of the DAC register contents or a change in the operating mode occurs, as shown in Figure 78. Figure 77. DAC8311 Data Input Register DB15 PD1 DB14 PD0 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 DB0 D0 LEGEND: R/W = Read/Write; R = Read only; -n = value after reset CLK SYNC DIN DB15 DB0 DB15 Invalid Write Sequence: SYNC HIGH before 16th Falling Edge DB0 Valid Write Sequence: Output Updates on 16th Falling Edge Figure 78. DAC8311 SYNC Interrupt Facility 8.5.2 DAC8411 Serial Interface The DAC8411 has a 3-wire serial interface (SYNC, SCLK, and DIN) compatible with SPI, QSPI, and Microwire interface standards, as well as most DSPs. See the Figure 1 for an example of a typical write sequence. 8.5.2.1 DAC8411 Input Shift Register The input shift register is 24 bits wide, as shown in Figure 79. The first two bits are reserved control bits (PD0 and PD1) that set the desired mode of operation (normal mode or any one of three power-down modes) as indicated in Table 3. The last six bits are don't care. The write sequence begins by bringing the SYNC line low. Data from the DIN line are clocked into the 24-bit shift register on each falling edge of SCLK. The serial clock frequency can be as high as 50 MHz, making the DAC8411 compatible with high-speed DSPs. On the 18th falling edge of the serial clock, the last data bit is clocked in and the programmed function is executed. The last six bits are don't care. Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 25 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com At this point, the SYNC line may be kept low or brought high. In either case, it must be brought high for a minimum of 20 ns before the next write sequence so that a falling edge of SYNC can initiate the next write sequence. As previously mentioned, it must be brought high again before the next write sequence. The SYNC line may be brought high after the 18th bit is clocked in because the last six bits are don't care. 8.5.2.2 DAC8411 SYNC Interrupt In a normal write sequence, the SYNC line is kept low for 24 falling edges of SCLK and the DAC is updated on the 18th falling edge, ignoring the last six don't care bits. However, bringing SYNC high before the 18th falling edge acts as an interrupt to the write sequence. The shift register is reset and the write sequence is seen as invalid. Neither an update of the DAC register contents or a change in the operating mode occurs, as shown in Figure 80. Figure 79. DAC8411 Data Input Register DB23 PD1 PD0 D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 DB7 D1 DB6 D0 DB5 X X X X X X LEGEND: R/W = Read/Write; R = Read only; -n = value after reset 18th Falling Edge CLK 18 18th/24th Falling Edge 24 18 24 SYNC DIN DB23 DB6 DB5 DB0 DB23 Invalid/Interrupted Write Sequence: Output/Mode Does Not Update on the 18th Falling Edge DB6 DB5 DB0 Valid Write Sequence: Output/Mode Updates on the 18th or 24th Falling Edge Figure 80. DAC8411 SYNC Interrupt Facility 26 Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 9 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 9.1 Application Information 9.1.1 Microprocessor Interfacing 9.1.1.1 DAC8x11 to 8051 Interface Figure 81 shows a serial interface between the DAC8x11 and a typical 8051-type microcontroller. The setup for the interface is as follows: TXD of the 8051 drives SCLK of the DAC8x11, while RXD drives the serial data line of the part. The SYNC signal is derived from a bit programmable pin on the port. In this case, port line P3.3 is used. When data are to be transmitted to the DAC8x11, P3.3 is taken low. The 8051 transmits data only in 8-bit bytes; thus, only eight falling clock edges occur in the transmit cycle. To load data to the DAC, P3.3 remains low after the first eight bits are transmitted, and a second write cycle is initiated to transmit the second byte of data. P3.3 is taken high following the completion of this cycle. The 8051 outputs the serial data in a format which has the LSB first. The DAC8x11 requires its data with the MSB as the first bit received. Therefore, the 8051 transmit routine must take this requirement into account, and mirror the data as needed. 80C51/80L51(1) DAC8x11(1) P3.3 SYNC TXD SCLK RXD DIN NOTE: (1) Additional pins omitted for clarity. Figure 81. DAC8x11 to 80C51/80l51 Interfaces 9.1.1.2 DAC8x11 to Microwire Interface Figure 82 shows an interface between the DAC8x11 and any Microwire-compatible device. Serial data are shifted out on the falling edge of the serial clock and are clocked into the DAC8x11 on the rising edge of the SK signal. Microwire DAC8x11(1) CS SYNC SK SCLK SO DIN NOTE: (1) Additional pins omitted for clarity. Figure 82. DAC8x11 to Microwire Interface Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 27 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Application Information (continued) 9.1.1.3 DAC8x11 to 68HC11 Interface Figure 83 shows a serial interface between the DAC8x11 and the 68HC11 microcontroller. SCK of the 68HC11 drives the SCLK of the DAC8x11, while the MOSI output drives the serial data line of the DAC. The SYNC signal is derived from a port line (PC7), similar to what was done for the 8051. DAC8x11(1) 68HC11(1) PC7 SYNC SCK SCLK MOSI DIN NOTE: (1) Additional pins omitted for clarity. Figure 83. DAC8X11 to 68HC11 Interface The 68HC11 should be configured so that its CPOL bit is a '0' and its CPHA bit is a '1'. This configuration causes data appearing on the MOSI output to be valid on the falling edge of SCK. When data are being transmitted to the DAC, the SYNC line is taken low (PC7). Serial data from the 68HC11 are transmitted in 8-bit bytes with only eight falling clock edges occurring in the transmit cycle. Data are transmitted MSB first. In order to load data to the DAC8x11, PC7 is held low after the first eight bits are transferred, and a second serial write operation is performed to the DAC; PC7 is taken high at the end of this procedure. 9.2 Typical Applications 9.2.1 Loop Powered Transmitter The described loop powered transmitter can accurately source currents from 4 mA to 20 mA. VREG Regulator V+ R5 122.15 kΩ VREG/VREF R2 + 30.542 kΩ Q1 U1 OPA317 R6 60.4 Ω 4.32 kΩ R3 R4 26.7 Ω Return Figure 84. Loop Powered Transmitter Schematic 9.2.1.1 Design Requirements The transmitter has only two external input terminals; a supply connection and a ground (or return) connection. The transmitter communicates back to the host, typically a PLC analog input module, by precisely controlling the magnitude of the return current. In order to conform to the 4-mA to 20-mA communication standards, the complete transmitter must consume less than 4 mA of current. 28 Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 Typical Applications (continued) The complete design of this circuit is outlined in TIPD158, Low Cost Loop-Powered 4-20mA Transmitter EMC/EMI Tested Reference Design. The design is expected to be low-cost and deliver immunity to the IEC61000-4 suite of tests with minimum impact on the accuracy of the system. Reference design TIPD158 includes the design goals, simulated results, and measured performance. 9.2.1.2 Detailed Design Procedure Amplifier U1 uses negative feedback to make sure that the potentials at the inverting (V–) and noninverting (V+) input terminals are equal. In this configuration, V– is directly tied to the local GND; therefore, the potential at the noninverting input terminal is driven to local ground. Thus, the voltage difference across R2 is the DAC output voltage (VOUT), and the voltage difference across R5 is the regulator voltage (VREG). These voltage differences cause currents to flow through R2 and R5, as illustrated in Figure 85. VREG Regulator VREG/R2 VREG/VREF DAC V+ R5 V+ R2 VOUT + Q1 U1 0A VDAC/R1 iloop V– R6 iq i1 R3 R4 i2 iout Return Figure 85. Voltage to Current Conversion The currents from R2 and R5 sum into i1 (defined in Equation 1), and i1 flows through R3. VDAC VREG i1  R2 R5 (1) Amplifier U2 drives the base of Q1, the NPN bipolar junction transistor (BJT), to allow current to flow through R4 so that the voltage drops across R3 and R4 remain equal. This design keeps the inverting and noninverting terminals at the same potential. A small part of the current through R4 is sourced by the quiescent current of all of the components used in the transmitter design (regulator, amplifier, and DAC). The voltage drops across R3 and R4 are equal; therefore, different-sized resistors cause different current flow through each resistor. Use these different-sized resistors to apply gain to the current flow through R4 by controlling the ratio of resistor R3 to R4, as shown in Equation 2: V  i1 ˜ R3 i1 ˜ R3 9± L2 ˜ 5 4 Ÿ L2 R4 (2) 9  9± The current gain in the circuit helps allow a majority of the output current to come directly from the loop through Q1 instead of from the voltage-to-current converter. This current gain, in addition to the low-power components, keeps the current consumption of the voltage-to-current converter low. Currents i1 and i2 sum to form output current iout, as shown in Equation 3: iout i1  i2 VDAC VREG R3   R2 R5 R4 §V · V ˜ ¨ DAC  REG ¸ R5 ¹ © R2 § VDAC VREG · § R3 ·  ¨ ¸ ˜ ¨1  ¸ R R R 5 ¹ © 4¹ © 2 Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback (3) 29 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com Typical Applications (continued) The complete transfer function, arranged as a function of input code, is shown in Equation 4. The remaining sections divide this circuit into blocks for simplified discussion. § VREG ˜ Code · § V R · iout Code ¨ Resolution  REG ¸ ˜ ¨ 1  3 ¸ ¨2 ¸ R5 ¹ © R4 ¹ ˜ R2 © (4) Resistor R6 is included to reduce the gain of transistor Q1, and therefore, reduce the closed-loop gain of the voltage-to-current converter for a stable design. Size resistors R2, R3, R4, and R5 based on the full-scale range of the DAC, regulator voltage, and the desired current output range of the design. 9.2.1.3 Application Curves Figure 86 shows the measured transfer function of the circuit. Figure 87 shows the total unadjusted error (TUE) of the circuit, staying below 0.15 %FSR. 0.20 20 Output Current TUE (%FSR) 0.15 Output Current (mA) 16 12 8 0.10 0.05 0.00 -0.05 -0.10 -0.15 -0.20 4 0 1024 2048 3072 0 4096 1024 2048 3072 4096 DAC Code DAC Code Figure 86. Output Current vs Code Figure 87. Current Total Unadjusted Error vs Code 9.2.2 Using the REF5050 as a Power Supply for the DAC8x11 As a result of the extremely low supply current required by the DAC8x11, an alternative option is to use a REF5050 5 V precision voltage reference to supply the required voltage to the part, as shown in Figure 88. This option is especially useful if the power supply is too noisy or if the system supply voltages are at some value other than 5 V. The REF5050 outputs a steady supply voltage for the DAC8x11. If the REF5050 is used, the current needed to supply DAC8x11 is typically 110 μA at 5V, with no load on the output of the DAC. When the DAC output is loaded, the REF5050 also needs to supply the current to the load. The total current required (with a 5-kΩ load on the DAC output) is: 110 μA + (5 V / 5 kΩ) = 1.11 mA The load regulation of the REF5050 is typically 0.002%/mA, resulting in an error of 90 μV for the 1.1 -mA current drawn from it. This value corresponds to a 1.1 LSB error at 16bit (DAC8411). +5.5V +5V REF5050 1mF Three-Wire Serial Interface 110mA SYNC SCLK VOUT = 0V to 5V DAC8x11 DIN Figure 88. REF5050 as Power Supply to DAC8x11 30 Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 Typical Applications (continued) For other power-supply voltages, alternative references such as the REF3030 (3 V), REF3033 (3.3 V), or REF3220 (2.048 V) are recommended. For a full list of available voltage references from TI, see TI web site at www.ti.com. 9.2.3 Bipolar Operation Using the DAC8x11 The DAC8x11 has been designed for single-supply operation but a bipolar output range is also possible using the circuit in Figure 89. The circuit shown gives an output voltage range of ±5V. Rail-to-rail operation at the amplifier output is achievable using an OPA211, OPA340, or OPA703 as the output amplifier. For a full list of available operational amplifiers from TI, see TI web site at www.ti.com The output voltage for any input code can be calculated as follows: é æ R2 ö ù æ D ö æ R + R2 ö VO = ê AVDD ´ ç n ÷ ´ ç 1 ÷ - AVDD ´ ç ÷ú è 2 ø è R1 ø êë è R1 ø úû where • • n = resolution in bits; either 14 (DAC8311) or 16 (DAC8411). D = the input code in decimal; either 0 to 16,383 (DAC8311) or 0 to 65,535 (DAC8411). (5) With AVDD = 5 V, R1 = R2 = 10 kΩ: ǒ Ǔ V O + 10 n D *5V 2 (6) The resulting output voltage range is ±5V. Code 000h corresponds to a –5-V output and FFFFh (16-bit level) corresponding to a 5-V output. R2 10kW +5V +5.5V R1 10kW OPA211 VOUT AVDD 10mF ±5V DAC8x11 - 5.5V 0.1mF Three-Wire Serial Interface Figure 89. Bipolar Operation With the DAC8x11 10 Power Supply Recommendations The DAC8x11 is designed to operate with a unipolar analog power supply ranging from 2 V to 5.5 V on the AVDD pin. The AVDD pin supplies power to the digital and analog circuits (including the resistor string) inside the DAC. The current consumption of this pin is specified in the Electrical Characteristics table. Use a 1-μF to 10-μF capacitor in parallel with a 0.1-μF bypass capacitor on this pin to remove high-frequency noise. Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 31 DAC8311, DAC8411 SBAS439C – AUGUST 2008 – REVISED JULY 2015 www.ti.com 11 Layout 11.1 Layout Guidelines A precision analog component requires careful layout, adequate bypassing, and clean, well-regulated power supplies. The DAC8x11 offers single-supply operation; it will often be used in close proximity with digital logic, microcontrollers, microprocessors, and digital signal processors. The more digital logic present in the design and the higher the switching speed, the more difficult it will be to achieve good performance from the converter. Because of the single ground pin of the DAC8x11, all return currents, including digital and analog return currents, must flow through the GND pin. Ideally, GND would be connected directly to an analog ground plane. This plane would be separate from the ground connection for the digital components until they were connected at the power entry point of the system. The power applied to AVDD should be well-regulated and low-noise. Switching power supplies and dc/dc converters often have high-frequency glitches or spikes riding on the output voltage. In addition, digital components can create similar high-frequency spikes as the internal logic switches state. This noise can easily couple into the DAC output voltage through various paths between the power connections and analog output. This condition is particularly true for the DAC8x11, as the power supply is also the reference voltage for the DAC. As with the GND connection, AVDD should be connected to a 5 V power supply plane or trace that is separate from the connection for digital logic until they are connected at the power entry point. In addition, TI strongly recommends the 1 μF to 1 μF and 0.1 μF bypass capacitors. In some situations, additional bypassing may be required, such as a 100 μF electrolytic capacitor or even a Pi filter made up of inductors and capacitors—all designed to essentially low-pass filter the 5 V supply, removing the high-frequency noise. 11.2 Layout Example U1 Digital IO Analog IO Bypass Capacitors Figure 90. Recommended Layout 32 Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 DAC8311, DAC8411 www.ti.com SBAS439C – AUGUST 2008 – REVISED JULY 2015 12 Device and Documentation Support 12.1 Related Links The table below lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to sample or buy. Table 4. Related Links PARTS PRODUCT FOLDER SAMPLE & BUY TECHNICAL DOCUMENTS TOOLS & SOFTWARE SUPPORT & COMMUNITY DAC8311 Click here Click here Click here Click here Click here DAC8411 Click here Click here Click here Click here Click here 12.2 Community Resources The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use. TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers. Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support. 12.3 Trademarks E2E is a trademark of Texas Instruments. SPI, QSPI are trademarks of Motorola, Inc. All other trademarks are the property of their respective owners. 12.4 Electrostatic Discharge Caution These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. 12.5 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 13 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: DAC8311 DAC8411 Submit Documentation Feedback 33 PACKAGE OPTION ADDENDUM www.ti.com 9-Mar-2021 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan (2) Lead finish/ Ball material MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) (6) DAC8311IDCKR ACTIVE SC70 DCK 6 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 D83 DAC8311IDCKT ACTIVE SC70 DCK 6 250 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 D83 DAC8411IDCKR ACTIVE SC70 DCK 6 3000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 D84 DAC8411IDCKT ACTIVE SC70 DCK 6 250 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 D84 DAC8411IDCKTG4 ACTIVE SC70 DCK 6 250 RoHS & Green NIPDAU Level-2-260C-1 YEAR -40 to 125 D84 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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DAC8411IDCKR
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    DAC8411IDCKR
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    DAC8411IDCKR
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