DS91M124
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SNLS287E – AUGUST 2008 – REVISED APRIL 2013
DS91M124 125 MHz 1:4 M-LVDS Repeater with LVCMOS Input
Check for Samples: DS91M124
FEATURES
DESCRIPTION
•
The DS91M124 is a 1:4 M-LVDS repeater for driving
and distributing clock or data signals to up to four
multipoint networks.
1
2
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•
•
•
•
•
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DC - 125 MHz / 250 Mbps Low Jitter, Low
Skew, Low Power Operation
Independent Driver Enable Pins
Conforms to TIA/EIA-899 M-LVDS Standard
Controlled Transition Times Minimize
Reflections
8 kV ESD on M-LVDS I/O Pins Protects
Adjoining Components
Flow-Through Pinout Simplifies PCB Layout
Industrial Operating Temperature Range
(−40°C to +85°C)
Available in a Space Saving SOIC-16 Package
APPLICATIONS
•
•
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Multidrop / Multipoint Clock and Data
Distribution
High-Speed, Low Power, Short-Reach
Alternative to TIA/EIA-485/422
Clock Distribution in AdvancedTCA (ATCA)
and MicroTCA (μTCA) Backplanes
M-LVDS (Multipoint LVDS) is a new family of bus
interface devices based on LVDS technology
specifically designed for multipoint and multidrop
cable and backplane applications. It differs from
standard LVDS in providing increased drive current to
handle double terminations that are required in multipoint applications. Controlled transition times
minimize reflections that are common in multipoint
configurations due to unterminated stubs.
A single DS91M124 channel is a 1:4 repeater that
accepts LVTTL/LVCMOS signals at the driver inputs
and converts them to differential M-LVDS signal
levels. It features independent driver enable pins for
each driver output.
The DS91M124 has a flow-through pinout for easy
PCB layout. It provides a new alternative for high
speed multipoint interface applications. It is packaged
in a space saving SOIC-16 package.
Typical Application
Line Card in SLOT 1
DS91M124
Line Card in SLOT N-1
Line Card in SLOT N
M-LVDS Receivers
M-LVDS Receivers
RT
Z0
RT
RT
Z0
RT
RT
Z0
RT
RT
Z0
RT
RT = ZLOADED
BACKPLANE
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2008–2013, Texas Instruments Incorporated
DS91M124
SNLS287E – AUGUST 2008 – REVISED APRIL 2013
www.ti.com
Pin Diagram
DE0
1
16
B0
DE1
2
15
A0
DE2
3
14
A1
VDD
4
13
B1
GND
5
12
B2
DI
6
11
A2
N/C
7
10
A3
DE3
8
9
B3
Figure 1. SOIC Package
See Package Number D0016A
Logic Diagram
DE0
B0
A0
DE1
B1
A1
DI
B2
A2
DE2
B3
A3
DE3
Pin Descriptions
Number
Name
I/O, Type
1, 2, 3, 8
DE
I, LVCMOS
Driver enable pin: When a DE pin is low, the corresponding driver output is
disabled. When a DE pin is high, the corresponding driver output is enabled.
There is a 300 kΩ pulldown resistor on each DE pin.
Description
6
DI
I, LVCMOS
Driver input pin.
5
GND
Power
10, 11, 14, 15
A
O, M-LVDS
Ground pin.
Non-inverting driver output pins.
9, 12, 13, 16
B
O, M-LVDS
Inverting driver output pins.
4
VDD
Power
7
N/C
N/A
Power supply pin, +3.3V ± 0.3V
NO CONNECT pin.
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
2
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Absolute Maximum Ratings
SNLS287E – AUGUST 2008 – REVISED APRIL 2013
(1) (2)
−0.3V to +4V
Power Supply Voltage
−0.3V to (VDD + 0.3V)
LVCMOS Input Voltage
−1.9V to +5.5V
M-LVDS Output Voltage
M-LVDS Output Short Circuit Current Duration
Continuous
Junction Temperature
+140°C
−65°C to +150°C
Storage Temperature Range
Lead Temperature Range
Soldering (4 sec.)
+260°C
Maximum Package Power Dissipation @ +25°C
D0016A Package
2.21W
Derate D0016A Package
19.2 mW/°C above +25°C
Package Thermal Resistance (4-Layer, 2 oz. Cu, JEDEC)
θJA
+52°C/W
θJC
+19°C/W
ESD Susceptibility
HBM
MM
(2)
(3)
(4)
(5)
≥8 kV
(4)
CDM
(1)
(3)
≥250V
(5)
≥1250V
“Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of
device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or
other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating
Conditions indicate conditions at which the device is functional and the device should not be operated beyond such conditions.
If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and
specifications.
Human Body Model, applicable std. JESD22-A114C
Machine Model, applicable std. JESD22-A115-A
Field Induced Charge Device Model, applicable std. JESD22-C101-C
Recommended Operating Conditions
Min
Typ
Max
Units
3.0
3.3
3.6
V
−1.4
+3.8
V
LVTTL Input Voltage High VIH
2.0
VDD
V
LVTTL Input Voltage Low VIL
0
0.8
V
+85
°C
Supply Voltage, VDD
Voltage at Any Bus Terminal (Separate or Common-Mode)
Operating Free Air
−40
Temperature TA
+25
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DC Electrical Characteristics
Over supply voltage and operating temperature ranges, unless otherwise specified.
Parameter
(1) (2) (3) (4)
Test Conditions
Min
Typ
Max
Units
V
LVCMOS DC Specifications
VIH
High-Level Input Voltage
2.0
VDD
VIL
Low-Level Input Voltage
GND
0.8
V
IIH
High-Level Input Current
VIH = 3.6V
IIL
Low-Level Input Current
VCL
Input Clamp Voltage
-15
±1
15
μA
VIL = 0V
-15
±1
15
μA
IIN = -18 mA
-1.5
RL = 50Ω, CL = 5 pF
Figure 2
Figure 4
480
650
mV
−50
50
mV
2.10
V
0
50
mV
0
2.4
V
0
2.4
V
V
M-LVDS DC Specifications
|VAB|
Differential Output Voltage Magnitude
ΔVAB
Change in Differential Output Voltage Magnitude
Between Logic States
VOS(SS)
Steady-State Common-Mode Output Voltage
|ΔVOS(SS)|
Change in Steady-State Common-Mode Output Voltage
Between Logic States
VA(OC)
Maximum Steady-State Open-Circuit Output Voltage
VB(OC)
Maximum Steady-State Open-Circuit Output Voltage
VP(H)
Voltage Overshoot, Low-to-High Level Output
VP(L)
Voltage Overshoot, High-to-Low Level Output
IOS
Output Short-Circuit Current
(5)
(5)
(6)
0.30
Figure 2
Figure 3
RL = 50Ω
Figure 5
RL = 50Ω, CL = 5 pF
CD = 0.5 pF
Figure 7
Figure 8
Figure 6
Driver High-Impedance Output Current
IB
Driver High-Impedance Output Current
1.2VSS
V
−0.2VSS
43
mA
0
32
μA
VA = 0V or 2.4V, VB = 1.2V
−20
20
μA
VA = −1.4V, VB = 1.2V
−32
0
μA
VA = 3.8V, VB = 1.2V
0
32
μA
VA = 0V or 2.4V, VB = 1.2V
−20
20
μA
VA = −1.4V, VB = 1.2V
−32
0
μA
IAB
Driver High-Impedance Output Differential Curent
(IA − IB)
VA = VB, −1.4V ≤ V ≤ 3.8V
−4
4
IA(OFF)
Driver High-Impedance Output Power-Off Current
VA = 3.8V, VB = 1.2V
DEn = 0V
0V ≤ VDD ≤ 1.5V
0
32
VA = 0V or 2.4V, VB = 1.2V
DEn = 0V
0V ≤ VDD ≤ 1.5V
−20
20
VA = −1.4V, VB = 1.2V
DEn = 0V
0V ≤ VDD ≤ 1.5V
−32
0
(1)
(2)
(3)
(4)
(5)
(6)
4
V
-43
VA = 3.8V, VB = 1.2V
IA
1.6
μA
μA
μA
μA
The Electrical Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except as
otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and
are not ensured.
Current into device pins is defined as positive. Current out of device pins is defined as negative. All voltages are referenced to ground
except VOD and ΔVOD.
Typical values represent most likely parametric norms for VDD = +3.3V and TA = +25°C, and at the Recommended Operation Conditions
at the time of product characterization and are not ensured.
CL includes fixture capacitance and CD includes probe capacitance.
Specification is ensured by characterization and is not tested in production.
Output short circuit current (IOS) is specified as magnitude only, minus sign indicates direction only.
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SNLS287E – AUGUST 2008 – REVISED APRIL 2013
DC Electrical Characteristics (continued)
Over supply voltage and operating temperature ranges, unless otherwise specified. (1)(2)(3)(4)
Parameter
IB(OFF)
IAB(OFF)
Test Conditions
Driver High-Impedance Output Power-Off Current
Driver High-Impedance Output Power-Off Current
(IA(OFF) − IB(OFF))
Min
Typ
Max
Units
μA
VA = 3.8V, VB = 1.2V
DEn = 0V
0V ≤ VDD ≤ 1.5V
0
32
VA = 0V or 2.4V, VB = 1.2V
DEn = 0V
0V ≤ VDD ≤ 1.5V
−20
20
VA = −1.4V, VB = 1.2V
DEn = 0V
0V ≤ VDD ≤ 1.5V
−32
0
VA = VB, −1.4V ≤ V ≤ 3.8V
DEn = 0V
0V ≤ VDD ≤ 1.5V
−4
4
μA
μA
μA
CA
Driver Output Capacitance
7.8
pF
CB
Driver Output Capacitance
7.8
pF
CAB
Driver Output Differential Capacitance
3
pF
CA/B
Driver Output Capacitance Balance (CA/CB)
ICCL
Loaded Supply Current Enabled
ICCZ
VDD = 0V
No Load Supply Current Disabled
1
RL = 50Ω (All Outputs)
DI = VDD or GND
DEn = VDD or GND (All
Outputs)
65
75
mA
DI = VDD or GND,
DEn = GND (All Outputs)
19
24
mA
Switching Characteristics
Over supply voltage and operating temperature ranges, unless otherwise specified.
Parameter
(1) (2) (3)
Min
Typ
Max
Units
tPHL
Differential Propagation Delay High to Low
Test Conditions
1.8
3.9
6.5
ns
tPLH
Differential Propagation Delay Low to High
1.8
3.9
6.5
ns
0
25
100
ps
0
70
250
ps
0
1.5
2
ns
tSKD1
Differential Pulse Skew |tPHL − tPLH|
tSKD2
Channel-to-Channel Skew
tSKD3
Differential Part-to-Part Skew
(Constant TA and VDD)
(4) (7)
tSKD4
Differential Part-to-Part Skew
(4) (8)
(4) (6)
Rise Time
tTHL
Fall Time
tPHZ
Disable Time High to Z
tPLZ
Disable Time Low to Z
tPZH
Enable Time Z to High
tPZL
Enable Time Z to Low
fMAX
Maximum Operating Frequency
(2)
(3)
(4)
(5)
(6)
(7)
(8)
RL = 50Ω
CL = 5 pF,
CD = 0.5 pF
Figure 7
Figure 8
(4)
tTLH
(1)
(4) (5)
(4)
4.7
ns
1.1
0
2.0
3.0
ns
1.1
2.0
3.0
ns
6
11
ns
6
11
ns
6
11
ns
6
11
RL = 50Ω
CL = 5 pF,
CD = 0.5 pF
Figure 9
Figure 10
(4)
125
ns
MHz
The Electrical Characteristics tables list ensured specifications under the listed Recommended Operating Conditions except as
otherwise modified or specified by the Electrical Characteristics Conditions and/or Notes. Typical specifications are estimations only and
are not ensured.
Typical values represent most likely parametric norms for VDD = +3.3V and TA = +25°C, and at the Recommended Operation Conditions
at the time of product characterization and are not ensured.
CL includes fixture capacitance and CD includes probe capacitance.
Specification is ensured by characterization and is not tested in production.
tSKD1, |tPLHD − tPHLD|, Pulse Skew, is the magnitude difference in differential propagation delay time between the positive going edge and
the negative going edge of the same channel.
tSKD2, Channel-to-Channel Skew, is the difference in propagation delay (tPLHD or tPHLD) among all output channels.
tSKD3, Part-to-Part Skew, is defined as the difference between the minimum and maximum differential propagation delays. This
specification applies to devices at the same VDD and within 5°C of each other within the operating temperature range.
tSKD4, Part-to-Part Skew, is the differential channel-to-channel skew of any event between devices. This specification applies to devices
over recommended operating temperature and voltage ranges, and across process distribution. tSKD4 is defined as |Max − Min|
differential propagation delay.
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Test Circuits and Waveforms
Figure 2. Differential Driver Test Circuit
A
~ 1.9V
B
~ 1.3V
'VOS(SS)
VOS
VOS(PP)
Figure 3. Differential Driver Waveforms
Figure 4. Differential Driver Full Load Test Circuit
Figure 5. Differential Driver DC Open Test Circuit
6
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Figure 6. Differential Driver Short-Circuit Test Circuit
Figure 7. Driver Propagation Delay and Transition Time Test Circuit
Figure 8. Driver Propagation Delays and Transition Time Waveforms
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Figure 9. Driver TRI-STATE Delay Test Circuit
Figure 10. Driver TRI-STATE Delay Waveforms
8
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Typical Performance Characteristics
3.4
3.4
f = 125 MHz
DRIVER FALL TIME (10-90%) (ns)
DRIVER RISE TIME (10-90%) (ns)
f = 125 MHz
3.0
VCC = 3.0 V
2.6
2.2
1.8
VCC = 3.6 V
VCC = 3.3 V
1.4
1.0
-50
-10
30
70
110
3.0
VCC = 3.0 V
2.6
2.2
1.8
1.4
VCC = 3.3 V
1.0
-50
150
-10
TEMPERATURE (°C)
750
600
450
f = 1 MHz
VCC = 3.3V
TA = 25°C
150
0
25
50
75
100
125
f = 125 MHz
VCC = 3.0 V
5.0
4.5
4.0
3.5
VCC = 3.6 V
3.0
VCC = 3.3 V
2.5
-50
-10
70
110
150
Figure 14. Driver Propagation Delay (tPLHD) as a Function
of Temperature
5.5
180
f = 125 MHz
VCC = 3.0 V
5.0
POWER SUPPLY CURRENT (mA)
DRIVER PROPAGATION DELAY (tPHLD) (ns)
30
TEMPERATURE (°C)
Figure 13. Driver Output Signal Amplitude as a Function of
Resistive Load
4.5
4.0
3.5
VCC = 3.6 V
2.5
-50
150
5.5
RESISTIVE LOAD (:)
3.0
110
Figure 12. Driver Fall Time as a Function of Temperature
DRIVER PROPAGATION DELAY (tPLHD) (ns)
VOD - DRIVER OUTPUT AMPLITUDE (mV)
900
0
70
TEMPERATURE (°C)
Figure 11. Driver Rise Time as a Function of Temperature
300
30
VCC = 3.6 V
VCC = 3.3 V
VCC = 3.3V
TA = 25°C
RL = 50: On all CH)
150
120
4 Outputs ON
3 Outputs ON
90
2 Outputs ON
60
30
1 Output ON
0
-10
30
70
110
150
0
TEMPERATURE (°C)
25
50
75
100
125
FREQUENCY (MHz)
Figure 15. Driver Propagation Delay (tPHLD) as a Function
of Temperature
Figure 16. Driver Power Supply Current as a Function of
Frequency
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REVISION HISTORY
Changes from Revision D (April 2013) to Revision E
•
10
Page
Changed layout of National Data Sheet to TI format ............................................................................................................ 9
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PACKAGE OPTION ADDENDUM
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10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
DS91M124TMA/NOPB
ACTIVE
SOIC
D
16
48
RoHS & Green
SN
Level-1-260C-UNLIM
-40 to 85
DS91M124
TMA
DS91M124TMAX/NOPB
ACTIVE
SOIC
D
16
2500
RoHS & Green
SN
Level-1-260C-UNLIM
-40 to 85
DS91M124
TMA
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of