LM2725, LM2726
www.ti.com
SNVS144D – NOVEMBER 2000 – REVISED MARCH 2013
LM2725/LM2726 High Speed Synchronous MOSFET Drivers
Check for Samples: LM2725, LM2726
FEATURES
DESCRIPTION
•
•
•
•
•
•
The LM2725/LM2726 is a family of dual MOSFET
drivers that drive both the top MOSFET and bottom
MOSFET in a push-pull structure simultaneously. It
takes a logic level PWM input and splits it into two
complimentary signals with a typical 20ns dead time
in between. The built-in shoot-through protection
circuitry prevents the top and bottom FETs from
turning on simultaneously. With a bias voltage of 5V,
the peak sourcing and sinking current for each driver
of the LM2725 is about 1.2A and that of the LM2726
is about 3A. In an SOIC-8 package, each driver is
able to handle 50mA average current. When EN
signal is asserted the input UVLO (Under Voltage
Lock Out) ensures that all the driver outputs stay low
until the supply rail exceeds the power-on threshold
during system power on, or after the supply rail drops
below power-on threshold by a specified hysteresis
during system power down. The cross-conduction
protection circuitry detects both the driver outputs and
will not turn on a driver until the other driver output is
low. The top gate bias voltage needed by the top
MOSFET can be obtained through an external
bootstrap structure. Minimum input pulse width is as
low as 55ns.
1
2
High Peak Output Current
Adaptive Shoot-Through Protection
36V SW Pin Absolute Maximum Voltage
Input Under-Voltage-Lock-Out
Typical 20ns Internal Delay
Plastic 8-pin SOIC Package
APPLICATIONS
•
•
•
High Current DC/DC Power Supplies
High Input Voltage Switching Regulators
Microprocessors
Typical Application
+
5
10
Note: for ultra low-frequency operation (such as
skip mode at light load), D1 should be a fast
recovery type diode instead of a Schottky.
D1
Vin (up to 35V)
+
LM2725/ LM2726
C2
1U
6
5
PWM
SIGNAL
VCC
C1
CBOOT
3
HG
2
EN
4
PWM_IN
SW
1
8
GND
LG
7
0.1U
Cin
Q1
L1
Vout
+
Q2
Cout
U1
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2000–2013, Texas Instruments Incorporated
LM2725, LM2726
SNVS144D – NOVEMBER 2000 – REVISED MARCH 2013
www.ti.com
Connection Diagram
8-Lead Small Outline Package
SW
1
8
GND
HG
2
7
LG
CBOOT
3
6
VCC
PWM_IN
4
5
EN
Figure 1. Top View
PIN DESCRIPTIONS
Pin
Name
1
SW
Top driver return. Should be connected to the common node of top and bottom FETs.
2
HG
Top gate drive output.
3
CBOOT
Bootstrap. Accepts a bootstrap voltage for powering the high-side driver.
4
PWM_IN
Accepts a 5V-logic control signal.
5
EN
6
VCC
7
LG
8
GND
Function
Chip Enable. Active HIGH. Must be asserted during power up and down.
Connect to +5V supply.
Bottom gate drive output.
Ground.
Block Diagram
+4V ~ +7V
CBOOT
VIN (up to 35V)
HG
VCC
Q1
PFET
Power
On
Reset
SW
+
VOUT
-
EN
Q2
Logic
PWM_IN
LG
Shoot-through
Protection
2
Items in bold
are external
to the IC.
GND
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Copyright © 2000–2013, Texas Instruments Incorporated
Product Folder Links: LM2725 LM2726
LM2725, LM2726
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SNVS144D – NOVEMBER 2000 – REVISED MARCH 2013
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION (1)
ORDER NUMBER
PACKAGE TYPE
LM2726M
SOIC
LM2726M/NOPB
(1)
STATUS
NRND
NRND
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
Absolute Maximum Ratings
(1) (2)
VCC
7.5V
CBOOT
42V
CBOOT to SW
8V
SW to PGND
36V
Junction Temperature
+150°C
Power Dissipation
(3)
720mW
−65° to 150°C
Storage Temperature
ESD Susceptibility
Human Body Model
(4)
1 kV
Soldering Time, Temperature
(1)
(2)
(3)
(4)
10sec., 300°C
Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating ratings are conditions under which
the device operates correctly. The gaurnteed specifications apply only for the listed test conditions. Some performance characteristics
may degrade when the part is not operated under listed conditions.
If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and
specifications.
Maximum allowable power dissipation is a function of the maximum junction temperature, TJMAX, the junction-to-ambient thermal
resistance, θJA, and the ambient temperature, TA. The maximum allowable power dissipation at any ambient temperature is calculated
using: PMAX = (TJMAX-TA) / θJA. The junction-to-ambient thermal resistance, θJA, for LM2725/LM2726 is 172°C/W. For a TJMAX of 150°C
and TA of 25°C, the maximum allowable power dissipation is 0.7W.
ESD machine model susceptibility is 100V.
Operating Ratings
(1)
VCC
4V to 7V
Junction Temperature Range
(1)
0° to 125°C
Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating ratings are conditions under which
the device operates correctly. The gaurnteed specifications apply only for the listed test conditions. Some performance characteristics
may degrade when the part is not operated under listed conditions.
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Product Folder Links: LM2725 LM2726
3
LM2725, LM2726
SNVS144D – NOVEMBER 2000 – REVISED MARCH 2013
www.ti.com
Electrical Characteristics
LM2725
VCC = CBOOT = 5V, SW = GND = 0V, unless otherwise specified. Typicals and limits appearing in plain type apply for TA =
TJ = +25°C. Limits appearing in boldface type apply over the entire operating temperature range.
Symbol
Parameter
Condition
Min
Typ
Max
Units
POWER SUPPLY
Iq_op
Operating Quiescent Current
PWM_IN = 0V
180
250
µA
Iq_sd
Shutdown Quiescent Current
EN = 0V, PWM_IN = 0V
0.5
15
µA
Peak Pull-Up Current
Test Circuit 1, Vbias = 5V, R =
0.1Ω
1.2
A
Pull-Up Rds_on
ICBOOT = IHG = 0.7A
2.4
Ω
Peak Pull-down Current
Test Circuit 2, Vbias = 5V, R =
0.1Ω
−1.0
A
TOP DRIVER
Pull-down Rds_on
ISW = IHG = 0.7A
1.4
Ω
t4
Rise Time
Timing Diagram, CLOAD = 3.3nF
17
ns
t6
Fall Time
10
ns
t3
Pull-Up Dead Time
Timing Diagram
23
ns
t5
Pull-Down Delay
Timing Diagram, from PWM_IN
Falling Edge
21
ns
Peak Pull-Up Current
Test Circuit 3, Vbias = 5V, R =
0.1Ω
1.2
A
Pull-up Rds_on
IVCC = ILG = 0.7A
2.6
Ω
Peak Pull-down Current
Test Circuit 4, Vbias = 5V, R =
0.1Ω
−2
A
BOTTOM DRIVER
Pull-down Rds_on
IGND = ILG = 0.7A
0.65
Ω
t8
Rise Time
Timing Diagram, CLOAD = 3.3nF
18
ns
t2
Fall Time
6
ns
t7
Pull-up Dead Time
Timing Diagram
28
ns
t1
Pull-down Delay
Timing Diagram, from PWM_IN
Rising Edge
15
ns
Vuvlo_up
Power On Threshold
VCC rises from 0V toward 5V
3.0
V
Vuvlo_dn
Under-Voltage-Lock-Out
Threshold
2.5
V
Vuvlo_hys
Under-Voltage-Lock-Out
Hysteresis
0.5
V
VIH_EN
EN Pin High Input
VIL_EN
EN Pin Low Input
Ileak_EN
EN Pin Leakage Current
LOGIC
ton_min
2.4
EN = VCC = 5V
−2
2
VCC = 5V, EN = 0V
−2
2
Minimum Positive Input Pulse
Width
Minimum Negative Input Pulse
Width
(2)
(1)
(2)
4
V
µA
55
(1)
toff_min
V
0.8
ns
55
If after a rising edge, a falling edge occurs sooner than the specified value, the IC may intermittently fail to turn on the bottom gate when
the top gate is off. As the falling edge occurs sooner and sooner, the driver may start to ignore the pulse and produce no output.
If after a falling edge, a rising edge occurs sooner than the specified value, the IC may intermittently fail to turn on the top gate when the
bottom gate is off. As the rising edge occurs sooner and sooner, the driver may start to ignore the pulse and produce no output.
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Product Folder Links: LM2725 LM2726
LM2725, LM2726
www.ti.com
SNVS144D – NOVEMBER 2000 – REVISED MARCH 2013
Electrical Characteristics
LM2725 (continued)
VCC = CBOOT = 5V, SW = GND = 0V, unless otherwise specified. Typicals and limits appearing in plain type apply for TA =
TJ = +25°C. Limits appearing in boldface type apply over the entire operating temperature range.
Condition
Min
VIH_PWM
Symbol
PWM_IN High Level Input
Voltage
Parameter
When PWM_IN pin goes high
from 0V
2.4
VIL_PWM
PWM_IN Low Level Input
Voltage
When PWM_IN pin goes low
from 5V
Typ
Max
Units
V
0.8
Electrical Characteristics
LM2726
VCC = CBOOT = 5V, SW = GND = 0V, unless otherwise specified. Typicals and limits appearing in plain type apply for TA =
TJ = +25°C. Limits appearing in boldface type apply over the entire operating temperature range.
Symbol
Parameter
Condition
Min
Typ
Max
Units
POWER SUPPLY
Iq_op
Operating Quiescent Current
PWM_IN = 0V
185
250
µA
Iq_sd
Shutdown Quiescent Current
EN = 0V, PWM_IN = 0V
0.5
15
µA
Peak Pull-Up Current
Test Circuit 1, Vbias = 5V, R =
0.1Ω
3.0
A
Pull-Up Rds_on
ICBOOT = IHG = 1.0A
1.2
Ω
Peak Pull-down Current
Test Circuit 2, Vbias = 5V, R =
0.1Ω
−3.2
A
TOP DRIVER
Pull-down Rds_on
ISW = IHG = 1.0A
0.5
Ω
t4
Rise Time
Timing Diagram, CLOAD = 3.3nF
17
ns
t6
Fall Time
12
ns
t3
Pull-Up Dead Time
Timing Diagram
19
ns
t5
Pull-Down Delay
Timing Diagram, from PWM_IN
from Falling Edge
27
ns
Peak Pull-Up Current
Test Circuit 3, Vbias = 5V, R =
0.1Ω
3.2
A
Pull-up Rds_on
IVCC = ILG = 1.0A
1.1
Ω
Peak Pull-down Current
Test Circuit 4, Vbias = 5V, R =
0.1Ω
−3.2
A
Pull-down Rds_on
IGND = ILG = 1.0A
0.6
Ω
t8
Rise Time
Timing Diagram, CLOAD = 3.3nF
17
ns
t2
Fall Time
14
ns
t7
Pull-up Dead Time
Timing Diagram
12
ns
t1
Pull-down Delay
Timing Diagram, from PWM_IN
Rising Edge
13
ns
Vuvlo_up
Power On Threshold
VCC rises from 0V toward 5V
2.8
V
Vuvlo_dn
Under-Voltage-Lock-Out
Threshold
2.5
V
Vuvlo_hys
Under-Voltage-Lock-Out
Hysteresis
0.3
V
VIH_EN
EN Pin High Input
VIL_EN
EN Pin Low Input
Ileak_EN
EN Pin Leakage Current
BOTTOM DRIVER
LOGIC
2.4
V
0.25
EN = VCC = 5V
−2
2
VCC = 5V, EN = 0V
−2
2
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V
µA
5
LM2725, LM2726
SNVS144D – NOVEMBER 2000 – REVISED MARCH 2013
www.ti.com
Electrical Characteristics
LM2726 (continued)
VCC = CBOOT = 5V, SW = GND = 0V, unless otherwise specified. Typicals and limits appearing in plain type apply for TA =
TJ = +25°C. Limits appearing in boldface type apply over the entire operating temperature range.
Symbol
ton_min
Parameter
Condition
Min
Typ
Minimum Positive Input Pulse
Width
ns
Minimum Negative Input Pulse
Width
55
(2)
VIH_PWM
PWM_IN High Level Input
Voltage
When PWM_IN pin goes high
from 0V
VIL_PWM
PWM_IN Low Level Input
Voltage
When PWM_IN pin goes low
from 5V
(1)
(2)
Units
55
(1)
toff_min
Max
2.4
V
0.25
If after a rising edge, a falling edge occurs sooner than the specified value, the IC may intermittently fail to turn on the bottom gate when
the top gate is off. As the falling edge occurs sooner and sooner, the driver may start to ignore the pulse and produce no output.
If after a falling edge, a rising edge occurs sooner than the specified value, the IC may intermittently fail to turn on the top gate when the
bottom gate is off. As the rising edge occurs sooner and sooner, the driver may start to ignore the pulse and produce no output.
TEST CIRCUIT DIAGRAMS
PWM_IN
t7
t2
t5
t8
t1
LG
t3
t4
t6
HG
Figure 2. Timing Diagram
Figure 3. Enable Pin Shutdown
6
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LM2725, LM2726
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SNVS144D – NOVEMBER 2000 – REVISED MARCH 2013
Test Circuits
3
5
Vbias
6
4
CBOOT
HG
EN
LG
VCC
SW
PWM_IN
GND
2
7
VX
R
1
8
Width = 200ns,
One Shot.
Figure 4. Test Circuit 1
3
5
Vbias
6
4
CBOOT
HG
EN
LG
VCC
PWM_IN
SW
GND
2
7
VX
R
1
8
Vbias
Width = 200ns,
One Shot.
Figure 5. Test Circuit 2
3
5
Vbias
6
4
CBOOT
LG
EN
HG
VCC
SW
PWM_IN
GND
7
2
VX
R
1
8
Width = 200ns,
One Shot.
Figure 6. Test Circuit 3
3
5
Vbias
6
4
CBOOT
LG
EN
HG
VCC
PWM_IN
SW
GND
7
2
VX
R
1
8
Vbias
Width = 200ns,
One Shot.
Figure 7. Test Circuit 4
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7
LM2725, LM2726
SNVS144D – NOVEMBER 2000 – REVISED MARCH 2013
Ipull_up =
www.ti.com
Vx
R
Ipull_down =
(1)
Vbias - Vx
R
(2)
Vbias - Vx
Rds_pull_up =
.R
Vx
(3)
Rds_pull_down =
Vx
.R
Vbias - Vx
(4)
Typical Waveforms
8
Figure 8. Switching Waveforms of Test Circuit
Figure 9. When Input Goes High
Figure 10. When Input Goes Low
Figure 11. Minimum Positive Pulse
Figure 12. Turn-Off
Figure 13. Normal Operation at 250kHz
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Product Folder Links: LM2725 LM2726
LM2725, LM2726
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SNVS144D – NOVEMBER 2000 – REVISED MARCH 2013
Functional Description
The LM2725/2726 drivers were designed to be used in systems supporting low-power states, such as notebook
computers’ Suspend-To-RAM (STR), etc. A typical application scenario would be powering up and powering
down the driver while having EN asserted, i.e. at logic high level. During a low-power state of the whole system
when the load is not powered, the EN input can be pulled to logic low level to shutdown the driver thus reducing
its power.
The EN pin functions as a "Chip Enable." When it is asserted high, the chip is fully powered on and fully
functional. When the EN pin is low, the power is disconnected from the internal POR (Power-On-Reset) and the
bandgap reference blocks by a P-FET. This is done to lower the quiescent current Iq from 180µA typical in
normal operation to 0.5µA typical in shutdown mode. The HG and LG drivers are still powered to maintain the
external NFETs.
The POR circuit also performs the UVLO (Under Voltage Lockout) function and, therefore, the POR must be
powered on during the driver powering up and down. This means that the EN pin must be allowed to transition
high or low with the VCC rail. Having the EN pin low during startup prevents the POR circuit from biasing up,
which can potentially cause an unpredicted state in the HG output.
The HG high-side driver circuit includes a latch. A signal from the POR block resets the latch, turning HG output
off. Without the POR signal, this latch may be indeterminate in its initial state upon powering up. The slew rate of
CB-SW voltage may affect the latch's initial state, as well as normal leakage paths through the transistors
controlling the latch.
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9
LM2725, LM2726
SNVS144D – NOVEMBER 2000 – REVISED MARCH 2013
www.ti.com
REVISION HISTORY
Changes from Revision C (March 2013) to Revision D
•
10
Page
Changed layout of National Data Sheet to TI format ............................................................................................................ 9
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PACKAGE OPTION ADDENDUM
www.ti.com
9-Nov-2016
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
Device Marking
(4/5)
LM2726M
LIFEBUY
SOIC
D
8
95
TBD
Call TI
Call TI
2726
M
LM2726M/NOPB
LIFEBUY
SOIC
D
8
95
Green (RoHS
& no Sb/Br)
CU SN
Level-1-260C-UNLIM
2726
M
LM2726MX
LIFEBUY
SOIC
D
8
2500
TBD
Call TI
Call TI
2726
M
LM2726MX/NOPB
LIFEBUY
SOIC
D
8
2500
Green (RoHS
& no Sb/Br)
CU SN
Level-1-260C-UNLIM
2726
M
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
9-Nov-2016
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
8-Apr-2013
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
LM2726MX
SOIC
D
8
2500
330.0
12.4
6.5
5.4
2.0
8.0
12.0
Q1
LM2726MX/NOPB
SOIC
D
8
2500
330.0
12.4
6.5
5.4
2.0
8.0
12.0
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
8-Apr-2013
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
LM2726MX
SOIC
D
8
2500
367.0
367.0
35.0
LM2726MX/NOPB
SOIC
D
8
2500
367.0
367.0
35.0
Pack Materials-Page 2
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Products
Applications
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www.ti.com/audio
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www.ti.com/automotive
Amplifiers
amplifier.ti.com
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www.ti.com/communications
Data Converters
dataconverter.ti.com
Computers and Peripherals
www.ti.com/computers
DLP® Products
www.dlp.com
Consumer Electronics
www.ti.com/consumer-apps
DSP
dsp.ti.com
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www.ti.com/energy
Clocks and Timers
www.ti.com/clocks
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Medical
www.ti.com/medical
Logic
logic.ti.com
Security
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Power Mgmt
power.ti.com
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www.ti.com/space-avionics-defense
Microcontrollers
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Video and Imaging
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RFID
www.ti-rfid.com
OMAP Applications Processors
www.ti.com/omap
TI E2E Community
e2e.ti.com
Wireless Connectivity
www.ti.com/wirelessconnectivity
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