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LM57-Q1
SNIS191A – JULY 2015 – REVISED JULY 2015
LM57-Q1 Resistor-Programmable Temperature Switch and Analog Temperature Sensor
1 Features
3 Description
•
The LM57-Q1 device is a precision, dual-output,
temperature switch with analog temperature sensor
output for wide temperature applications such as
automotive grade. The trip temperature (TTRIP) is
selected from 256 possible values in the range of
–40°C to 160°C. The VTEMP is a class AB analog
voltage output that is proportional to temperature with
a programmable negative temperature coefficient
(NTC). Two external 1% resistors set the TTRIP and
VTEMP slope. The digital and analog outputs enable
protection and monitoring of system thermal events.
1
•
•
•
•
•
•
•
•
•
•
Qualified for Automotive Applications, for
Commercial Device See LM57 Data Sheet
AEC-Q100 Qualified with the Following Results:
– Temperature Grade 0 Extended: −50°C to
+160°C with Excursions up to 170°C Operating
Temperature Range
– Temperature Grade 0: −50°C to +150°C
Operating Temperature Range
– Temperature Grade 1: −50°C to +125°C
Operating Temperature Range
– HBM ESD Component Classification Level 2
– CDM ESD Component Classification Level C5
Trip Temperature Set by External Resistors with
Accuracy of ±2.3°C from −40°C to +150°C
Resistor Tolerance Contributes Zero Error
Push-Pull and Open-Drain Switch Outputs
Wide Operating Temperature Range of −50°C to
160°C
Very Linear Analog VTEMP Temp Sensor Output
with ±1.3°C Accuracy from −50°C to +150°C
Short-Circuit Protected Analog and Digital Outputs
Latching Function for Digital Outputs
TRIP-TEST Pin Allows In-System Testing
Low Power Minimizes Self-Heating to Under
0.02°C
TOVER is active-high with a push-pull structure. TOVER
is active-low with an open-drain structure. Tying
TOVER to TRIP-TEST will latch the output after it trips.
The output can be cleared by forcing TRIP-TEST low.
Driving the TRIP-TEST high will assert the digital
outputs. A processor can check the state of TOVER or
TOVER , confirming they changed to an active state.
This allows for in situ verification that the comparator
and output circuitry are functional after system
assembly. When TRIP-TEST is high, the trip-level
reference voltage appears at the VTEMP pin. The
system could then use this voltage to calculate the
threshold of the LM57-Q1.
Device Information
2 Applications
•
•
Built-in thermal hysteresis (THYST) prevents the digital
outputs from oscillating. The TOVER and TOVER digital
outputs will assert when the die temperature exceeds
TTRIP and will de-assert when the temperature falls
below a temperature equal to TTRIP minus THYST.
PART NUMBER
Automotive
Down Hole and Avionics
PACKAGE
LM57 -Q1
3.00 mm × 6.40 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
(2) For device comparison see Device Comparison Table .
Temperature Transfer Function
VDD Supply
(+2.4V to +5.5V)
3,500
J2 (-5.166mV/°C)
J3 (-7.752mV/°C)
J4 (-10.339mV/°C)
J5 (-12.924mV/°C)
Analog
ADC Input
LM57
Microcontroller
RSENSE1
RSENSE2
SENSE1
TOVER
SENSE2
TOVER
TRIP TEST
Digital In
Digital Out
VTEMP VOLTAGE (mV)
3,000
VTEMP
BODY SIZE (NOM)
TSSOP (8)
LM57-Q1 Overtemperature Alarm
VDD
(1) (2)
2,500
2,000
1,500
1,000
GND
500
0
-50
-25
0
25
50
75
100
125
150
175
TEMPERTURE (C)
C101
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
LM57-Q1
SNIS191A – JULY 2015 – REVISED JULY 2015
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Table of Contents
1
2
3
4
5
6
Features ..................................................................
Applications ...........................................................
Description .............................................................
Device Comparison Table.....................................
Pin Configuration and Functions .........................
Specifications.........................................................
6.1
6.2
6.3
6.4
6.5
6.6
6.7
7
1
1
1
3
4
5
Absolute Maximum Ratings ...................................... 5
ESD Ratings.............................................................. 5
Recommended Operating Conditions....................... 5
Thermal Information .................................................. 6
Electrical Characteristics........................................... 6
Switching Characteristics .......................................... 9
Typical Characteristics ........................................... 10
Detailed Description ............................................ 12
7.1 Overview ................................................................. 12
7.2 Functional Block Diagram ....................................... 12
7.3 Feature Description................................................. 13
7.4 Device Functional Modes........................................ 23
8
Application and Implementation ........................ 26
8.1 Application Information............................................ 26
8.2 Typical Application .................................................. 26
9 Power Supply Recommendations...................... 28
10 Layout................................................................... 28
10.1 Layout Guidelines ................................................. 28
10.2 Layout Example .................................................... 29
10.3 Temperature Considerations................................. 29
11 Device and Documentation Support ................. 30
11.1
11.2
11.3
11.4
11.5
2
30
30
30
30
30
12 Mechanical, Packaging, and Orderable
Information ........................................................... 30
Changes from Revision Initial Release (July 2015) to Revision A
•
Documentation Support .......................................
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
Page
Changed feature bullet automotive description and added description of the automotive grades and ESD
classifications ......................................................................................................................................................................... 1
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SNIS191A – JULY 2015 – REVISED JULY 2015
4 Device Comparison Table
ORDER NUMBER
LM57BISD-5, LM57BISDX-5
(1)
LM57BISD-10, LM57BISDX-10
LM57CISD-5, LM57CISD-5
(1)
(1)
LM57CISD-10, LM57CISDX-10
(1)
PACKAGE
GRADE (TEMP RANGE)
VTEMP
ACCURACY
TRIP POINT
ACCURACY
HYSTERESIS
WSON/SD/NGR
/DFN (8)
Commercial (-50°C to
150°C)
±0.8°C
±1.5°C
5°C
WSON/SD/NGR
/DFN (8)
Commercial (-50°C to
150°C)
±0.8°C
±1.5°C
10°C
WSON/SD/NGR
/DFN (8)
Commercial (-50°C to
150°C)
±1.3°C
±2.3°C
5°C
WSON/SD/NGR
/DFN (8)
Commercial (-50°C to
150°C)
±1.3°C
±2.3°C
10°C
LM57FPW, LM57FPWR
(1)
PW/TSSOP (8)
Commercial (-50°C to
150°C)
±1.3°C
±2.3°C
5°C
LM57TPW, LM57TPWR
(1)
PW/TSSOP (8)
Commercial (-50°C to
150°C)
±1.3°C
±2.3°C
10°C
LM57FSPWQ1, LM57FSPWRQ1
PW/TSSOP (8)
Automotive Grade 0
Extended (-50°C to
160°C)
±1.3°C
±2.3°C
5°C
LM57TSPWQ1, LM57TSPWRQ1
PW/TSSOP (8)
Automotive Grade 0
Extended (-50°C to
160°C)
±1.3°C
±2.3°C
10°C
LM57FEPWQ1, LM57FEPWRQ1
PW/TSSOP (8)
Automotive Grade 0
±1.3°C
Standard (-50°C to 150°C)
±2.3°C
5°C
LM57TEPWQ1, LM57TEPWRQ1
PW/TSSOP (8)
Automotive Grade 0
±1.3°C
Standard (-50°C to 150°C)
±2.3°C
10°C
LM57FQPWQ1, LM57FQPWRQ1
PW/TSSOP (8)
Automotive Grade 1
±1.3°C
Standard (-50°C to 125°C)
±2.3°C
5°C
LM57TQPWQ1, LM57TQPWRQ1
PW/TSSOP (8)
Automotive Grade 1
±1.3°C
Standard (-50°C to 125°C)
±2.3°C
10°C
(1)
For Commercial grade device complete datasheet see LM57.
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5 Pin Configuration and Functions
TSSOP/PW Package
8-Pin
Top View
GND
1
8
VTEMP
SENSE1
2
7
TOVER
SENSE2
3
6
TOVER
VDD
4
5
TRIP TEST
LM57
Pin Functions
PIN
NAME
GND
NO.
1
TYPE
EQUIVALENT CIRCUIT
Ground
—
DESCRIPTION
Power supply ground
VDD
SENSE1
2
Trip-point resistor sense. One of two sense pins which selects the
temperature at which TOVER and TOVER will assert.
—
GND
GND
VDD
SENSE2
3
Trip-point resistor sense. One of two sense pins which selects the
temperature at which TOVER and TOVER will assert.
—
GND
GND
VDD
4
Power
Supply voltage
VDD
TRIP
TEST
5
Digital
Input
1 PA
TRIP TEST pin. Active High input.
If TRIP TEST = 0 (default), then the VTEMP output has the analog
temperature sensor output voltage.
If TRIP TEST = 1, then TOVER and TOVER outputs are asserted and VTEMP =
VTRIP, the temperature trip voltage.
Tie this pin to ground if not used.
GND
TOVER
6
Digital
Output
GND
Overtemperature switch output
Active low, open-drain (see LM57-Q1 VTEMP Voltage-to-Temperature
Equations regarding required pullup resistor.)
Asserted when the measured temperature exceeds the Trip Point
Temperature or if TRIP TEST = 1
This pin may be left open if not used.
VDD
TOVER
7
Overtemperature switch output
Active high, push-pull
Asserted when the measured temperature exceeds the trip point
temperature or if TRIP TEST = 1
This pin may be left open if not used.
Digital
Output
GND
4
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Pin Functions (continued)
PIN
NAME
NO.
TYPE
EQUIVALENT CIRCUIT
DESCRIPTION
VDD
VSENSE
VTEMP
8
VTEMP analog voltage output
If TRIP TEST = 0, then VTEMP = VTS, temperature sensor output voltage
If TRIP TEST = 1, then VTEMP = VTRIP, temperature trip voltage
This pin may be left open if not used.
Analog
Output
GND
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1) (2)
MIN
MAX
UNIT
Supply voltage
−0.3
6
V
Voltage at TOVER
−0.3
6
V
Voltage at TOVER , VTEMP, TRIP-TEST, SENSE1, and SENSE2
−0.3
(VDD + 0.3 V)
V
5
mA
Storage temperature for LM57FSPWQ1 and LM57TSPWQ1
−65
175
°C
Storage temperature for all LM57-Q1 except LM57FSPWQ1 and LM57TSPWQ1
−65
150
°C
Current at any pin
(1)
(2)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Soldering process must comply with Reflow Temperature Profile specifications. Refer to www.ti.com/packaging.
6.2 ESD Ratings
VALUE
V(ESD)
(1)
Electrostatic discharge
Human-body model (HBM), per AEC Q100-002
(1)
UNIT
±2000
Charged-device model (CDM), per AEC Q100-011
V
±750
AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
6.3 Recommended Operating Conditions
MIN
NOM
MAX
UNIT
2.4
5.5
V
−50
150
°C
-50
125
°C
2.4
5.5
V
−50
170
°C
FOR ALL PARTS GRADE 0 AND GRADE 1 EXCEPT GRADE 0 EXTENDED (LM57FSPWQ1 and LM57TSPWQ1)
Supply voltage
Free air temperature range (TMIN ≤ TA ≤ TMAX) LM57FEPWQ1, and LM57TEPWQ1
LM57FQPWQ1, LM57TQPWQ1
GRADE 0 EXTENDED (LM57FSPWQ1 AND LM57TSPWQ1)
Supply voltage
Free air temperature range (TMIN ≤ TA ≤ TMAX) Temperature Profile for LM57-Q1 Automotive Grade 0
Extended High Temperature Operational Life Test
(HTOL) - Hours of Operation: (1)
1700 hours at TJ = TC = 160°C
10 hours at TJ = TC = 170°C
(1)
Except for HTOL testing, which was conducted as described, all other testing was to AEC-Q100 Grade 0 flow. Full details on reliability
testing are available upon request.
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6.4 Thermal Information
LM57-Q1
THERMAL METRIC
(1)
PW (TSSOP)
UNIT
8 PINS
RθJA
Junction-to-ambient thermal resistance
RθJC(top)
RθJB
ψJT
Junction-to-top characterization parameter
ψJB
RθJC(bot)
(1)
183
°C/W
Junction-to-case (top) thermal resistance
66
°C/W
Junction-to-board thermal resistance
111
°C/W
8
°C/W
Junction-to-board characterization parameter
110
°C/W
Junction-to-case (bottom) thermal resistance
—
°C/W
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
6.5 Electrical Characteristics
Unless otherwise noted, these specifications apply for VDD = 2.4 to 5.5 V and over free air temperature range. These limits do
not include DC load regulation. These stated accuracy limits are with reference to the values in Table 1.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
TRIP POINT ACCURACY FOR ALL LM57-Q1 EXCEPT LM57FSPWQ1 AND LM57TSPWQ1
Trip Point Accuracy
(Includes 1% set-resistor
tolerance)
J2
TA = −41°C to
52°C
VDD = 2.4 V to 5.5
V
±2.3
°C
J3
TA = 52°C to
97°C
VDD = 2.4 V to 5.5
V
±2.3
°C
J4
TA = 97°C to
119°C
VDD = 2.4 V to 5.5
V
±2.3
°C
J5
TA = 119°C to
free air
temperature max
VDD = 2.4 V to 5.5
V
±2.3
°C
TRIP POINT ACCURACY FOR LM57-Q1 AUTOMOTIVE GRADE 0 EXTENDED (LM57FSPWQ1 and LM57TSPWQ1)
Trip point accuracy
(Includes 1% set-resistor
tolerance)
6
J2
TA = −41°C to
52°C
J3
TA = 52°C to
97°C
J4
TA = 97°C to
119°C
J5
TA = 119°C to
160°C
J5
TA = 150°C to
160°C
VDD = 2.4 V to 5.5
V
±2.3
VDD = 2.4 V to 5.5
V
±2.5
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Electrical Characteristics (continued)
Unless otherwise noted, these specifications apply for VDD = 2.4 to 5.5 V and over free air temperature range. These limits do
not include DC load regulation. These stated accuracy limits are with reference to the values in Table 1.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VTEMP ANALOG TEMPERATURE SENSOR OUTPUT ACCURACY FOR ALL LM57-Q1 EXCEPT LM57FSPWQ1 and LM57TSPWQ1
VTEMP Accuracy
(These stated accuracy
limits are with reference to
the values in Table 1,
LM57-Q1 VTEMP
Temperature-to-Voltage.)
J2
TA = −50°C to
free air
temperature max
VDD = 2.4 V to 5.5
V
±1.3
°C
J3
TA = −50°C to
free air
temperature max
VDD = 2.4 V to 5.5
V
±1.3
°C
TA = 20°C to
50°C
VDD = 2.4 V to 5.5
V
±1.3
TA = 0°C to free
air temperature
max
VDD = 2.7 V to 5.5
V
±1.3
TA = −50°C to
0°C
VDD = 3.1 V to 5.5
V
±1.3
TA = 60°C to
free air
temperature max
VDD = 2.4 V to 5.5
V
±1.3
TA = 20°C to
50°C
VDD = 2.9 V to 5.5
V
±1.3
TA = 0°C to free
air temperature
max
VDD = 3.2 V to 5.5
V
±1.3
TA = −50°C to
0°C
VDD = 4 V to 5.5
V
±1.3
J4
J5
°C
°C
VTEMP ANALOG TEMPERATURE SENSOR OUTPUT ACCURACY FOR LM57-Q1 AUTOMOTIVE GRADE 0 EXTENDED (LM57FSPWQ1
and LM57TSPWQ1)
J2
J3
TA = 150°C to
160°C
TA = –50°C to
150°C
TA = 150°C to
160°C
TA = –50°C to
150°C
TA = 20°C to
50°C
VTEMP accuracy
(These stated accuracy
limits are with reference to
the values in Table 1,
LM57-Q1 VTEMP
temperature-to-voltage.)
J4
TA = 0°C to
150°C
TA = 150°C to
160°C
TA = –50°C to
0°C
TA = 150°C to
160°C
TA = 60°C to
150°C
J5
VDD = 2.4 V to 5.5
V
VDD = 2.4 V to 5.5
V
VDD = 2.4 V to 5.5
V
±1.5
°C
±1.3
±1.5
°C
±1.3
±1.3
±1.3
VDD = 2.7 V to 5.5
V
VDD = 3.1 V to 5.5
V
VDD = 2.4 V to 5.5
V
±1.5
±1.3
±1.5
±1.3
TA = 20°C to
50°C
VDD = 2.9 V to 5.5
V
±1.3
TA = 0°C to
150°C
VDD = 3.2 V to 5.5
V
±1.3
TA = –50°C to
0°C
VDD = 4 V to 5.5
V
±1.3
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Electrical Characteristics (continued)
Unless otherwise noted, these specifications apply for VDD = 2.4 to 5.5 V and over free air temperature range. These limits do
not include DC load regulation. These stated accuracy limits are with reference to the values in Table 1.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
OTHER TEMPERATURE SENSOR SPECIFICATIONS
J2: −50°C to 52°C
VTEMP sensor gain
−5.166
J3: 52°C to 97°C
−7.752
J4: 97°C to 119°C
−10.339
J5: 119°C to 160°C
−12.924
mV/°C
0.18
Line regulation DC: supplyto-VTEMP (1)
Temp = 90°C
μV/V
−84
dB
Source ≤ 240 µA, (VDD – VTEMP) ≥ 200 mV; TA
= −50°C to 150°C
Load regulation: VTEMP
output (2)
Maximum Load
capacitance: VTEMP output
IS
Supply current: quiescent
(3)
mV
58
−1
mV
Sink ≤ 300 µA, VTEMP ≥ 360 mV; TA = −50°C
to 150°C
1
Source or sink = 100 µA; TA = −50°C to 150°C
1
Ω
No output series resistor required; (See VTEMP
Capacitive Loads )
1100
pF
for all LM57-Q1 for TA ≤ 150°C
24
28
µA
TA = 150°C to 160°C for LM57FSPWQ1 and
LM57TSPWQ1
24
29
µA
TA = 170°C for LM57FSPWQ1 and
LM57TSPWQ1
26
µA
TRIP-TEST INPUT
VIH
Logic 1 threshold voltage
VIL
Logic 0 threshold voltage
IIH
Logic 1 input current
IIL
Logic 0 input leakage
current (4)
VDD – 0.5
TA = −50°C to 150°C
V
0.5
V
1.4
3
µA
0.001
1
µA
TOVER (PUSH-PULL, ACTIVE-HIGH) OUTPUT
VOH
Logic 1 push-pull output
voltage
VOL
Logic 0 output voltage
Source ≤ 600 µA
VDD – 0.2
Source ≤ 1.2 mA
VDD – 0.45
V
Sink ≤ 600 µA
0.2
Sink ≤ 1.2 mA
0.45
V
TOVER (OPEN-DRAIN, ACTIVE-LOW) OUTPUT
VOL
Logic 0 output voltage
IOH
Logic 1 output leakage
current (4)
(1)
(2)
(3)
(4)
8
Sink ≤ 600 µA
0.2
Sink ≤1.2 mA
0.45
Temperature = 30°C;
0.001
1
V
µA
Line regulation (DC) is calculated by subtracting the output voltage at the highest supply voltage from the output voltage at the lowest
supply voltage. The typical DC line regulation specification does not include the output voltage shift discussed in VTEMP Voltage Shift .
Source currents are flowing out of the LM57-Q1. Sink currents are flowing into the LM57-Q1. Load Regulation is calculated by
measuring VTEMP at 0 μA and subtracting the value with the conditions specified.
Supply current refers to the quiescent current of the LM57-Q1 only and does not include any load current
This current is leakage current only and is therefore highest at high temperatures. Prototype test indicate that the leakage is well below
1 μA over the full temperature range. This 1 μA specification reflects the limitations of measuring leakage at room temperature. For this
reason only, the leakage current is not specified at a lower value.
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Electrical Characteristics (continued)
Unless otherwise noted, these specifications apply for VDD = 2.4 to 5.5 V and over free air temperature range. These limits do
not include DC load regulation. These stated accuracy limits are with reference to the values in Table 1.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
5°C hysteresis option (all LM57F for TA ≤
150°C)
4.7
5
5.4
°C
10°C hysteresis option (all LM57T for TA ≤
150°C)
9.6
10
10.6
°C
5°C hysteresis option (LM57FSPWQ1); TA =
150°C to 160°C
4.6
5
5.4
°C
10°C hysteresis option (LM57TSPWQ1); TA =
150°C to 160°C
9.4
10
10.6
°C
HYSTERESIS
THYST
Hysteresis temperature
6.6 Switching Characteristics
Unless otherwise noted, these specifications apply for VDD = 2.4 to 5.5 V over the free air temperature range.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
tEN
Maximum time from power on
to digital output enabled
1.5
ms
tVTEMP
Maximum time from power on
to analog temperature
(VTEMP) valid
1.5
ms
VDD
1.3V
tEN
TOVER
Enabled
TOVER
Enabled
Figure 1. Definition of tEN
VDD
tVTEMP
Valid
VTEMP
Figure 2. Definition of tVTEMP
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30
30
29
29
28
28
27
27
26
IDD (PA)
IDD (PA)
6.7 Typical Characteristics
T = 150°C
T = 30°C
25
24
26
VDD = 5.5V
25
24
23
23
T = -40°C
22
VDD = 2.4V
22
21
21
20
2.4
2.8
3.2
3.6
4.0
4.4
4.8
5.2
20
-50 -30 -10 10 30 50 70 90 110 130 150
5.6
TEMPERATURE (°C)
VDD (V)
Figure 4. Supply Current vs Temperature
Overhead =
400 mV
Overhead =
100 mV
DELTA_VOUT (mV)
DELTA VOUT (mV)
Figure 3. Supply Current vs Supply Voltage
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
-1.2
-1.4
-1.6
-1.8
-2.0
-2.2
-2.4
-2.6
-2.8
-3.0
Overhead =
200 mV
0
100
200
300
400
500
600
3.0
2.8
2.6
2.4
2.2
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
VDD = 2.4V
VDD = 2.7V
VDD = 3.3V
VDD = 5.0V
0
700
200 400 600 800 1000 1200 1400 1600
LOAD (PA)
Figure 5. Load Regulation: Change In VTEMP vs Source
Current Overhead Is Vdd-Vtemp
Figure 6. Load Regulation: Change In VTEMP vs Sink Current
VTEMP (mV)
949
948
947
946
945
2.4
2.8
3.2
3.6
4
4.4
4.8
5.2
5.6
5oC HYSTERESIS (oC) 10oC HYSTERESIS (oC
LOAD (PA)
950
10.2
HYST J5
10.1
10.0
HYST J2
HYST J3
HYST J4
9.9
|
|
5.2
HYST J3
5.1
5.0
4.9
2.4
HYST J2
2.8
3.2
HYST J5
3.6
4.0
4.4
HYST J4
4.8
5.2
5.6
VDD
VDD (V)
Figure 7. Line Regulation: VTEMP vs Supply Voltage
10
VDD = 3.5V
Figure 8. Line Regulation: Hysteresis vs Supply Voltage
30°C
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5oC HYSTERESIS (oC) 10oC HYSTERESIS (oC)
Typical Characteristics (continued)
VDD (V)
3
2
1
Tover
VOUTPUT (V)
0
3
|
|
2
Vtemp
1
0
-1
0
1
2
3
4
5
6
7
8
9
10.2
HYST J5
10.1
HYST J3
10.0
HYST J4
HYST J2
9.9
|
|
5.2
HYST J3
HYST J5
5.1
5.0
HYST J4
HYST J2
4.9
-50 -30 -10 10 30 50 70 90 110 130 150
TEMPERATURE (oC)
TIME (ms)
Figure 9. Start-Up Response
Figure 10. Hysteresis vs Temperature
2.0
MAX LImit
1.5
VTEMP Accuracy (C)
1.0
0.5
0.0
-0.5
-1.0
-1.5
MIN Limit
-2.0
±50
±25
0
25
50
75
100
125
DUT Temperature (C)
150
175
C102
Conditions: J2, VDD=5V
Figure 11. J2 Accuracy Specification Over Temperature
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7 Detailed Description
7.1 Overview
The LM57-Q1 is a precision, dual-output, temperature switch with analog temperature sensor output. The trip
temperature (TTRIP) is selected from 256 possible values by using two external 1% resistors. The VTEMP class AB
analog output provides a voltage that is proportional to temperature. The LM57-Q1 includes an internal reference
DAC, analog temperature sensor and analog comparator. The reference DAC is connected to one of the
comparator inputs. The reference DAC output voltage (VTRIP) is controlled by the value of resistance applied to
the SENSE pins. The resistance value sets one of 16 "logic" levels at the SENSE pins. These "logic" levels are
then decoded and applied to the DAC input, thus the actual resistance tolerance does not directly affect the
threshold level accuracy. The result of the reference DAC voltage and the temperature sensor output comparison
is provided on two output pins TOVER and TOVER.
The VTEMP output has a programmable gain. The output gain has 4 possible settings as described in Figure 12.
The gain setting is dependent on the trip point selected by resistance applied to the SENSE pins.
Built-in temperature hysteresis (THYST) prevents the digital outputs from oscillating. The TOVER and TOVER will
activate when the die temperature exceeds TTRIP and will release when the temperature falls below a
temperature equal to TTRIP minus THYST. TOVER is active-high with a push-pull structure. TOVER , is active-low with
an open-drain structure. There are two different hysteresis options available that are factory preset. The preset
hysteresis can be selected by purchasing the proper order number as described in Device Comparison Table .
Driving the TRIP-TEST high will activate the digital outputs. A processor can check the logic level of the TOVER or
TOVER , confirming that they changed to their active state. This allows for system production testing verification
that the comparator and output circuitry are functional after system assembly. When the TRIP-TEST pin is high,
the trip-level reference voltage appears at the VTEMP pin. Tying TOVER to TRIP-TEST will latch the output after it
trips. It can be cleared by forcing TRIP-TEST low or powering off the LM57-Q1.
7.2 Functional Block Diagram
VDD = 2.4V to 5.5V
TRIP TEST
SENSE1
LM57
SENSE2
VTRIP
DAC
TOVER
GAIN
TEMP SENSOR
(negative temp
coefficient)
TRIP
TEST = 1
+
-
TRIP
TEST = 0
VDD
TOVER
VTEMP
GND
12
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7.3 Feature Description
7.3.1
LM57-Q1 VTEMP Temperature-to-Voltage Transfer Function
The value of the RSENSE resistors select a trip point and a corresponding VTEMP gain (J2, J3, J4, or J5).The trip
point range associated with a given gain is shown in bold green or bold red italics in Table 1. Temperatures
above 150°C apply to the LM57FSPWQ1 and LM57TSPWQ1 only and are highlighted in red and italics in
Table 1. The VTEMP gain is selected by the RSENSE resistors. VTEMP is valid over the entire temperature range.
The VTEMP gain is selected by the RSENSE resistors. VTEMP is valid over the entire temperature range.
3,500
J2 (-5.166mV/°C)
J3 (-7.752mV/°C)
J4 (-10.339mV/°C)
J5 (-12.924mV/°C)
VTEMP VOLTAGE (mV)
3,000
2,500
2,000
1,500
1,000
500
0
-50
-25
0
25
50
75
100
125
150
175
TEMPERTURE (C)
C101
Figure 12. Temperature Transfer Characteristics
Table 1. LM57-Q1 VTEMP Temperature to Voltage
Temperature (°C)
(1)
(1)
VTEMP VOLTAGE (mV)
J2 (-5.166 mV/°C)
J3 (–7.752 mV/°C)
J4 (–10.339 mV/°C)
J5 (–12.924 mV/°C)
–50
1352.56
2028.80
2705.20
3381.40
–49
1347.60
2021.35
2695.26
3368.98
–48
1342.64
2013.90
2685.32
3356.55
–47
1337.67
2006.44
2675.38
3344.12
–46
1332.70
1998.98
2665.43
3331.68
–45
1327.73
1991.52
2655.47
3319.23
–44
1322.76
1984.05
2645.51
3306.78
–43
1317.78
1976.58
2635.54
3294.32
–42
1312.81
1969.11
2625.57
3281.85
–41
1307.82
1961.63
2615.60
3269.38
–40
1302.84
1954.15
2605.62
3256.90
–39
1297.86
1946.66
2595.63
3244.41
–38
1292.87
1939.17
2585.64
3231.92
–37
1287.88
1931.68
2575.64
3219.42
–36
1282.88
1924.18
2565.64
3206.92
–35
1277.89
1916.68
2555.63
3194.41
–34
1272.89
1909.17
2545.62
3181.89
The RSENSE resistors select a trip point and a corresponding VTEMP gain (J2, J3, J4, or J5). The trip point range associated with a given
gain is shown in bold green or red on this table. Temperatures above 150°C apply to the LM57FSPWQ1 and LM57TSPWQ1 only and
are italicized and highlighted in red. The VTEMP gain is selected by the RSENSE resistors. VTEMP is valid over the entire temperature
range.
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Feature Description (continued)
Table 1. LM57-Q1 VTEMP Temperature to Voltage
Temperature (°C)
14
(1)
(continued)
VTEMP VOLTAGE (mV)
J2 (-5.166 mV/°C)
J3 (–7.752 mV/°C)
J4 (–10.339 mV/°C)
J5 (–12.924 mV/°C)
–33
1267.88
1901.66
2535.60
3169.37
–32
1262.88
1894.15
2525.58
3156.84
–31
1257.87
1886.63
2515.56
3144.30
–30
1252.86
1879.11
2505.52
3131.76
–29
1247.85
1871.59
2495.49
3119.21
–28
1242.84
1864.06
2485.44
3106.66
–27
1237.82
1856.53
2475.40
3094.10
–26
1232.80
1848.99
2465.34
3081.53
–25
1227.78
1841.45
2455.29
3068.96
–24
1222.75
1833.91
2445.23
3056.38
–23
1217.73
1826.36
2435.16
3043.79
–22
1212.70
1818.81
2425.09
3031.20
–21
1207.67
1811.26
2415.01
3018.60
–20
1202.63
1803.70
2404.93
3006.00
–19
1197.59
1796.13
2394.84
2993.38
–18
1192.55
1788.57
2384.74
2980.77
–17
1187.51
1781.00
2374.65
2968.14
–16
1182.46
1773.42
2364.54
2955.51
–15
1177.42
1765.85
2354.44
2942.87
–14
1172.37
1758.26
2344.32
2930.23
–13
1167.31
1750.68
2334.20
2917.58
–12
1162.26
1743.09
2324.08
2904.93
–11
1157.20
1735.50
2313.95
2892.26
–10
1152.14
1727.90
2303.82
2879.60
–9
1147.07
1720.30
2293.68
2866.92
–8
1142.01
1712.69
2283.54
2854.24
–7
1136.94
1705.09
2273.39
2841.55
–6
1131.87
1697.47
2263.24
2828.86
–5
1126.79
1689.86
2253.08
2816.16
–4
1121.72
1682.24
2242.91
2803.45
–3
1116.64
1674.61
2232.74
2790.74
–2
1111.56
1666.99
2222.57
2778.02
–1
1106.47
1659.35
2212.39
2765.30
0
1101.39
1651.72
2202.21
2752.57
1
1096.30
1644.08
2192.02
2739.83
2
1091.20
1636.44
2181.82
2727.08
3
1086.11
1628.79
2171.62
2714.33
4
1081.01
1621.14
2161.42
2701.58
5
1075.91
1613.48
2151.21
2688.82
6
1070.81
1605.83
2141.00
2676.05
7
1065.71
1598.16
2130.78
2663.27
8
1060.60
1590.50
2120.55
2650.49
9
1055.49
1582.83
2110.32
2637.70
10
1050.38
1575.15
2100.09
2624.91
11
1045.26
1567.48
2089.85
2612.10
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Feature Description (continued)
Table 1. LM57-Q1 VTEMP Temperature to Voltage
Temperature (°C)
(1)
(continued)
VTEMP VOLTAGE (mV)
J2 (-5.166 mV/°C)
J3 (–7.752 mV/°C)
J4 (–10.339 mV/°C)
J5 (–12.924 mV/°C)
12
1040.14
1559.80
2079.60
2599.30
13
1035.02
1552.11
2069.35
2586.48
14
1029.90
1544.42
2059.10
2573.66
15
1024.77
1536.73
2048.84
2560.84
16
1019.65
1529.03
2038.57
2548.01
17
1014.51
1521.33
2028.30
2535.17
18
1009.38
1513.63
2018.03
2522.32
19
1004.25
1505.92
2007.75
2509.47
20
999.11
1498.21
1997.46
2496.61
21
993.97
1490.49
1987.17
2483.75
22
988.82
1482.77
1976.88
2470.88
23
983.68
1475.05
1966.58
2458.00
24
978.53
1467.32
1956.27
2445.12
25
973.38
1459.59
1945.96
2432.23
26
968.22
1451.86
1935.64
2419.34
27
963.07
1444.12
1925.32
2406.43
28
957.91
1436.38
1915.00
2393.53
29
952.74
1428.63
1904.67
2380.61
30
947.58
1420.88
1894.33
2367.69
31
942.41
1413.13
1883.99
2354.76
32
937.24
1405.37
1873.64
2341.83
33
932.07
1397.61
1863.29
2328.89
34
926.90
1389.84
1852.94
2315.94
35
921.72
1382.07
1842.57
2302.99
36
916.54
1374.30
1832.21
2290.03
37
911.36
1366.52
1821.84
2277.07
38
906.17
1358.74
1811.46
2264.10
39
900.98
1350.96
1801.08
2251.12
40
895.79
1343.17
1790.69
2238.14
41
890.60
1335.38
1780.30
2225.15
42
885.41
1327.58
1769.90
2212.15
43
880.21
1319.78
1759.50
2199.15
44
875.01
1311.98
1749.09
2186.14
45
869.81
1304.17
1738.68
2173.12
46
864.60
1296.36
1728.26
2160.10
47
859.39
1288.54
1717.84
2147.07
48
854.18
1280.72
1707.41
2134.04
49
848.97
1272.90
1696.98
2121.00
50
843.75
1265.07
1686.54
2107.95
51
838.53
1257.24
1676.10
2094.90
52
833.31
1249.41
1665.65
2081.84
53
828.09
1241.57
1655.20
2068.77
54
822.86
1233.73
1644.74
2055.70
55
817.63
1225.88
1634.28
2042.62
56
812.40
1218.03
1623.81
2029.54
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Feature Description (continued)
Table 1. LM57-Q1 VTEMP Temperature to Voltage
Temperature (°C)
16
(1)
(continued)
VTEMP VOLTAGE (mV)
J2 (-5.166 mV/°C)
J3 (–7.752 mV/°C)
J4 (–10.339 mV/°C)
J5 (–12.924 mV/°C)
57
807.17
1210.18
1613.34
2016.44
58
801.93
1202.32
1602.86
2003.35
59
796.69
1194.46
1592.38
1990.24
60
791.45
1186.60
1581.89
1977.13
61
786.20
1178.73
1571.40
1964.02
62
780.96
1170.86
1560.90
1950.89
63
775.71
1162.98
1550.40
1937.76
64
770.46
1155.10
1539.89
1924.63
65
765.20
1147.22
1529.37
1911.49
66
759.94
1139.33
1518.86
1898.34
67
754.68
1131.44
1508.33
1885.19
68
749.42
1123.54
1497.80
1872.02
69
744.16
1115.64
1487.27
1858.86
70
738.89
1107.74
1476.73
1845.68
71
733.62
1099.83
1466.19
1832.50
72
728.35
1091.92
1455.64
1819.32
73
723.07
1084.01
1445.08
1806.13
74
717.79
1076.09
1434.53
1792.93
75
712.51
1068.17
1423.96
1779.72
76
707.23
1060.24
1413.39
1766.51
77
701.94
1052.31
1402.82
1753.30
78
696.65
1044.38
1392.24
1740.07
79
691.36
1036.44
1381.65
1726.84
80
686.07
1028.50
1371.07
1713.61
81
680.77
1020.55
1360.47
1700.36
82
675.48
1012.60
1349.87
1687.11
83
670.17
1004.65
1339.27
1673.86
84
664.87
996.69
1328.66
1660.60
85
659.56
988.73
1318.04
1647.33
86
654.25
980.77
1307.42
1634.05
87
648.94
972.80
1296.80
1620.77
88
643.63
964.83
1286.17
1607.49
89
638.31
956.85
1275.53
1594.19
90
632.99
948.87
1264.89
1580.89
91
627.67
940.89
1254.25
1567.59
92
622.35
932.90
1243.60
1554.28
93
617.02
924.91
1232.94
1540.96
94
611.69
916.92
1222.28
1527.63
95
606.36
908.92
1211.61
1514.30
96
601.02
900.91
1200.94
1500.97
97
595.69
892.91
1190.27
1487.62
98
590.34
884.90
1179.59
1474.27
99
585.00
876.88
1168.90
1460.92
100
579.66
868.87
1158.21
1447.55
101
574.31
860.84
1147.52
1434.18
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Feature Description (continued)
Table 1. LM57-Q1 VTEMP Temperature to Voltage
Temperature (°C)
(1)
(continued)
VTEMP VOLTAGE (mV)
J2 (-5.166 mV/°C)
J3 (–7.752 mV/°C)
J4 (–10.339 mV/°C)
J5 (–12.924 mV/°C)
102
568.96
852.82
1136.81
1420.81
103
563.61
844.79
1126.11
1407.43
104
558.25
836.76
1115.40
1394.04
105
552.89
828.72
1104.68
1380.65
106
547.53
820.68
1093.96
1367.24
107
542.17
812.63
1083.23
1353.84
108
536.80
804.59
1072.50
1340.42
109
531.43
796.53
1061.77
1327.01
110
526.06
788.48
1051.02
1313.58
111
520.69
780.42
1040.28
1300.15
112
515.31
772.35
1029.53
1286.71
113
509.93
764.29
1018.77
1273.26
114
504.55
756.21
1008.01
1259.81
115
499.17
748.14
997.24
1246.36
116
493.78
740.06
986.47
1232.89
117
488.39
731.98
975.69
1219.42
118
483.00
723.89
964.91
1205.95
119
477.61
715.80
954.12
1192.46
120
472.21
707.70
943.33
1178.98
121
466.81
699.61
932.53
1165.48
122
461.41
691.50
921.73
1151.98
123
456.00
683.40
910.92
1138.47
124
450.60
675.29
900.11
1124.96
125
445.19
667.18
889.29
1111.44
126
439.78
659.06
878.47
1097.91
127
434.36
650.94
867.64
1084.38
128
428.94
642.81
856.81
1070.84
129
423.52
634.68
845.97
1057.29
130
418.10
626.55
835.13
1043.74
131
412.67
618.41
824.28
1030.18
132
407.25
610.27
813.43
1016.62
133
401.82
602.13
802.57
1003.05
134
396.38
593.98
791.71
989.47
135
390.95
585.83
780.84
975.89
136
385.51
577.67
769.97
962.30
137
380.07
569.51
759.09
948.70
138
374.63
561.35
748.20
935.10
139
369.18
553.18
737.32
921.49
140
363.73
545.01
726.42
907.87
141
358.28
536.84
715.52
894.25
142
352.83
528.66
704.62
880.62
143
347.37
520.48
693.71
866.99
144
341.91
512.29
682.80
853.35
145
336.45
504.10
671.88
839.70
146
330.99
495.91
660.95
826.05
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Feature Description (continued)
Table 1. LM57-Q1 VTEMP Temperature to Voltage
Temperature (°C)
18
(1)
(continued)
VTEMP VOLTAGE (mV)
J2 (-5.166 mV/°C)
J3 (–7.752 mV/°C)
J4 (–10.339 mV/°C)
J5 (–12.924 mV/°C)
147
325.52
487.71
650.03
812.39
148
320.05
479.51
639.09
798.73
149
314.58
471.30
628.15
785.05
150
309.10
463.09
617.21
771.38
151
303.63
454.88
606.26
757.69
152
298.15
446.66
595.30
744.00
153
292.66
438.44
584.35
730.30
154
287.18
430.22
573.38
716.60
155
281.69
421.99
562.41
702.89
156
276.20
413.76
551.44
689.17
157
270.71
405.52
540.46
675.45
158
265.22
397.28
529.47
661.72
159
259.72
389.04
518.48
647.99
160
254.22
380.79
507.49
634.25
161
248.71
372.54
496.49
620.50
162
243.21
364.28
485.48
606.75
163
237.70
356.02
474.47
592.98
164
232.19
347.76
463.46
579.22
165
226.68
339.50
452.44
565.45
166
221.16
331.23
441.41
551.67
167
215.64
322.95
430.38
537.88
168
210.12
314.67
419.35
524.09
169
204.60
306.39
408.31
510.29
170
199.07
298.11
397.26
494.59
171
193.54
289.82
386.21
480.52
172
188.01
281.52
375.15
466.44
173
182.48
273.23
364.09
452.36
174
176.94
264.92
353.03
438.27
175
171.40
256.62
341.96
424.17
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LM57-Q1 VTEMP Voltage-to-Temperature Equations
VTEMP= a (T-30)2+ b (T-30) + c
where
•
VTEMP is in mV and T is in °C
(1)
2
T
b b 4 a( c VTEMP )
2a
30 qC
where
•
T is in °C and VTEMP is in mV
(2)
Table 2. LM57-Q1 VTEMP Voltage-to-Temperature Equations Coefficients
Trip-Point
Region
LM57-Q1 Trip Point Range
a
b
J2
−41°C to 52°C
– 0.00129
− 5.166
947.6
J3
52°C to 97°C
– 0.00191
− 7.752
1420.9
J4
97°C to 119°C
– 0.00253
− 10.339
1894.3
J5
119°C to 160°C
– 0.00316
− 12.924
2367.7
c
7.3.2 RSENSE
The LM57-Q1 uses the voltage at the two SENSE pins to set the trip point for the temperature switch. It is
possible to drive the two SENSE pins with a voltage equal to the value generated by the resistor and the internal
current-source and have the same switch point. Thus one can use an external DAC to drive each SENSE pin,
allowing for the temperature trip point to be set dynamically by the system processor. Table 3 shows the RSENSE
value and its corresponding generated SENSE pin voltage (the center value).
Table 3. RSENSE Values (kΩ) vs SENSE Pin Voltage (mV)
RSENSE (kΩ)
SENSE Pin Voltage (mV)
Center Value
976
1875
825
1585
698
1341
590
1134
499
959
412
792
340
653
280
538
226
434
178
342
140
269
105
202
75
146
46.4
87
22.6
43
0.01
0
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7.3.3 Resistor Selection
Table 4. Trip Point (°C) vs Sense Resistor (RSENSE) Values (Ω)
(1)
RSENSE2
J2
RSENSE1
(1)
(2)
20
(2)
J3
(2)
J4
(2)
J5
976 kΩ
825 kΩ
698 kΩ
590 kΩ
499 kΩ
412 kΩ
340 kΩ
280 kΩ
226 kΩ
178 kΩ
140 kΩ
105 kΩ
75 kΩ
46.4 kΩ
976 kΩ
–40.68
–16.26
7.33
30.38
52.73
67.77
82.74
97.47
108.61
119.62
128.46
137.28
146.08
154.77
825 kΩ
–39.13
–14.76
8.79
31.81
53.68
68.71
83.67
98.17
109.30
120.18
129.01
137.83
146.62
155.31
698 kΩ
–37.57
–13.27
10.24
33.24
54.62
69.65
84.60
98.86
110.00
120.73
129.56
138.38
147.16
155.85
590 kΩ
–36.03
–11.78
11.70
34.67
55.56
70.59
85.53
99.56
110.70
121.28
130.12
138.93
147.71
156.39
499 kΩ
–34.49
–10.29
13.15
36.10
56.50
71.52
86.46
100.25
111.39
121.84
130.67
139.49
148.25
156.93
412 kΩ
–32.95
–8.81
14.60
37.53
57.44
72.46
87.40
100.95
112.09
122.39
131.22
140.04
148.80
157.46
340 kΩ
–31.41
–7.32
16.05
38.95
58.39
73.40
88.33
101.64
112.79
122.94
131.77
140.59
149.34
158.00
280 kΩ
–29.88
–5.83
17.49
40.38
59.33
74.33
89.26
102.34
113.48
123.50
132.32
141.14
149.88
158.54
226 kΩ
–28.34
–4.35
18.93
41.81
60.27
75.27
90.19
103.03
114.18
124.05
132.87
141.69
150.43
159.08
178 kΩ
–26.83
–2.88
20.36
43.23
61.21
76.20
91.12
103.73
114.87
124.60
133.43
142.24
150.97
159.62
140 kΩ
–25.32
–1.42
21.79
44.65
62.15
77.14
92.05
104.42
115.57
125.15
133.98
142.79
151.51
160.16
105 kΩ
–23.80
0.04
23.22
46.07
63.08
78.07
92.99
105.11
116.26
125.71
134.53
143.34
152.06
75 kΩ
–22.29
1.50
24.65
47.50
64.02
79.01
93.92
105.81
116.95
126.26
135.08
143.89
152.60
46.4 kΩ
–20.77
2.96
26.08
48.92
64.96
79.94
94.84
106.50
117.65
126.81
135.63
144.44
153.14
22.6 kΩ
–19.26
4.42
27.51
50.33
65.90
80.87
95.77
107.19
118.34
127.36
136.18
144.99
153.68
0.01 kΩ
–17.75
5.88
28.94
51.75
66.84
81.81
96.70
107.89
119.04
127.91
136.73
145.54
154.23
Temperatures above 150°C apply to the LM57FSPWQ1 and LM57TSPWQ1 only and are italicized.
There are four gains corresponding to each of the four Temperature Trip Point Ranges:
J2 (-5.166 mV/°C) is the temperature sensor output gain used for Temperature Trip Points −40.68°C to 51.8°C.
J3 (-7.752 mV/°C) is for Trip Points 52°C to 97°C.
J4 (-10.339 mV/°C) for 97°C to 119°C.
J5 (-12.924 mV/°C) for 119°C to 160°C.
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Table 5. VTEMP (mV) at the Trip Point vs Sense Resistor (RSENSE) Value (Ω)
(1)
RSENSE2
J2
RSENSE1
(1)
(2)
(2)
J3
(2)
J4
(2)
J5
(2)
976 kΩ
825 kΩ
698 kΩ
590 kΩ
499 kΩ
412 kΩ
340 kΩ
280 kΩ
226 kΩ
178 kΩ
140 kΩ
105 kΩ
75 kΩ
46.4 kΩ
976 kΩ
1306.23
1183.77
1064.00
945.63
1243.67
1125.34
1006.75
1185.27
1066.00
1184.05
1064.59
944.83
824.96
705.99
825 kΩ
1298.50
1176.23
1056.56
938.23
1236.27
1117.93
999.34
1177.83
1058.52
1176.57
1057.10
937.33
817.53
698.60
698 kΩ
1290.72
1168.70
1049.13
930.83
1228.88
1110.52
991.92
1170.40
1051.03
1169.10
1049.62
929.83
810.09
691.20
590 kΩ
1283.03
1161.16
1041.69
923.43
1221.48
1103.10
984.51
1162.96
1043.55
1161.63
1042.13
922.33
802.66
683.81
499 kΩ
1275.33
1153.62
1034.26
916.02
1214.09
1095.69
977.09
1155.52
1036.07
1154.16
1034.65
914.83
795.22
676.41
412 kΩ
1267.64
1146.09
1026.82
908.62
1206.69
1088.28
969.66
1148.09
1028.59
1146.68
1027.16
907.33
787.78
669.02
340 kΩ
1259.94
1138.55
1019.38
901.22
1199.30
1080.87
962.22
1140.65
1021.10
1139.21
1019.67
899.83
780.35
661.62
280 kΩ
1252.25
1131.02
1011.99
893.82
1191.90
1073.45
954.78
1133.22
1013.62
1131.74
1012.19
892.33
772.91
654.22
226 kΩ
1244.55
1123.48
1004.62
886.42
1184.50
1066.04
947.35
1125.78
1006.14
1124.27
1004.70
884.83
765.48
646.83
178 kΩ
1236.99
1116.05
997.26
879.02
1177.11
1058.63
939.91
1118.35
998.66
1116.79
997.22
877.33
758.04
639.43
140 kΩ
1229.38
1108.61
989.89
871.61
1169.71
1051.22
932.48
1110.91
991.17
1109.32
989.73
869.82
750.61
632.04
105 kΩ
1221.76
1101.18
982.53
864.21
1162.32
1043.80
925.04
1103.48
983.69
1101.85
982.25
862.32
743.17
75 kΩ
1214.15
1093.74
975.16
856.81
1154.92
1036.39
917.61
1096.04
976.21
1094.38
974.76
854.82
735.74
46.4 kΩ
1206.53
1086.30
967.80
849.41
1147.53
1028.98
910.17
1088.60
968.73
1086.90
967.28
847.32
728.30
22.6 kΩ
1198.92
1078.87
960.43
842.01
1140.13
1021.57
902.74
1081.17
961.24
1079.43
959.79
839.82
720.86
0.01 kΩ
1191.30
1071.43
953.07
834.62
1132.74
1014.15
895.30
1073.73
953.76
1072.04
952.31
832.32
713.43
Items italicized and highlighted in red apply to the LM57FSPWQ1 and LM57TSPWQ1 only.
There are four gains corresponding to each of the four Temperature Trip Point Ranges:
J2 (-5.166 mV/°C) is the temperature sensor output gain used for Temperature Trip Points −40.68°C to 51.8°C.
J3 (-7.752 mV/°C) is for Trip Points 52°C to 97°C.
J4 (-10.339 mV/°C) for 97°C to 119°C.
J5 (-12.924 mV/°C) for 119°C to 160°C.
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7.3.4 TOVER and TOVER Digital Outputs
The TOVER active high, push-pull output and the TOVER Active Low, Open-Drain Output both assert at the same
time whenever the Die Temperature reaches the Trip Point. They also assert simultaneously whenever the TRIP
TEST pin is set high. Both outputs de-assert when the die temperature goes below the (Temperature Trip Point)
- (Hysteresis). These two types of digital outputs enable the user the flexibility to choose the type of output that is
most suitable for his design.
Either the TOVER or the TOVER Digital Output pins can be left open if not used.
The TOVER Active Low, Open-Drain Digital Output, if used, requires a pullup resistor between this pin and VDD.
7.3.4.1 TOVER and TOVER Noise Immunity
The LM57-Q1 has some noise immunity to a premature trigger due to noise on the power supply. With the die
temperature at 1°C below the trip point, there are no premature triggers for a square wave injected into the
power supply with a magnitude of 100 mVPP over a frequency range of 100 Hz to 2 MHz. Above the frequency a
premature trigger may occur.
With the die temperature at 2°C below the trip point, and a magnitude of 200 mVPP, there are no premature
triggers from 100 Hz to 300 kHz. Above that frequency a premature trigger may occur.
Therefore if the supply line is noisy, it is recommended that a local supply decoupling capacitor be used to
reduce that noise.
7.3.5 Trip Test Digital Input
The TRIP TEST pin provides a means to test the digital outputs by causing them to assert, regardless of
temperature.
In addition, when the TRIP TEST pin is pulled high the VTEMP pin will be at the VTRIP voltage.
7.3.6 VTEMP Analog Temperature Sensor Output
The VTEMP push-pull output provides the ability to sink and source significant current. This is beneficial when, for
example, driving dynamic loads like an input stage on an analog-to-digital converter (ADC). In these applications
the source current is required to quickly charge the input capacitor of the ADC. See the Typical Application
section for more discussion of this topic. The LM57-Q1 is ideal for this and other applications which require
strong source or sink current.
7.3.6.1 VTEMP Noise Considerations
A load capacitor on VTEMP can help to filter noise.
For noisy environments, TI recommends a 100 nF supply decoupling capacitor placed closed across VDD and
GND pins of LM57-Q1.
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7.3.6.2 VTEMP Capacitive Loads
The VTEMP Output handles capacitive loading well. In an extremely noisy environment, or when driving a switched
sampling input on an ADC, it may be necessary to add some filtering to minimize noise coupling. Without any
precautions, the VTEMP can drive a capacitive load less than or equal to 1100 pF as shown in Figure 13. For
capacitive loads greater than 1100 pF, a series resistor is required on the output, as shown in Figure 14, to
maintain stable conditions.
VDD
VDD
VTEMP
VTEMP
LM57
RS
LM57
GND
GND
CLOAD d 1100 pF
Figure 13. LM57-Q1 With No Isolation Resistor
Required
CLOAD > 1100 pF
Figure 14. LM57-Q1 With Series Resistor for
Capacitive Loading Greater than 1100 pF
Table 6. CLOAD and RS Values of Figure 14
CLOAD
Minimum RS
1.1 to 99 nF
3 kΩ
100 to 999 nF
1.5 kΩ
1 μF
750 Ω
7.3.6.3 VTEMP Voltage Shift
The LM57-Q1 is very linear over temperature and supply voltage range. Due to the intrinsic behavior of an
NMOS/PMOS rail-to-rail buffer, a slight shift in the output can occur when the supply voltage is ramped over the
operating range of the device. The location of the shift is determined by the relative levels of VDD and VTEMP. The
shift typically occurs when VDD − VTEMP = 1 V.
This slight shift (a few millivolts) takes place over a wide change (approximately 200 mV) in VDD or VTEMP. Since
the shift takes place over a wide temperature change of 5°C to 20°C, VTEMP is always monotonic. The accuracy
specifications in the Electrical Characteristics table already includes this possible shift.
7.4 Device Functional Modes
The LM57-Q1 has several modes of operation as detailed in the following drawings.
VDD
RSENSE2
RSENSE1
SENSE1
TOVER
SENSE2
Asserts when TDIE > TTRIP
LM57
See text
TRIP TEST
GND
Figure 15. Temperature Switch Using Push-Pull Output
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Device Functional Modes (continued)
VDD
100k
SENSE1
RSENSE2
RSENSE1
TOVER
SENSE2
Asserts when TDIE > TTRIP
LM57
See text
TRIP TEST
GND
Figure 16. Temperature Switch Using Open-Drain Output
As shown in Figure 17 the LM57-Q1 has a TRIP Test input simplifying in situ board conductivity testing. Forcing
TRIP TEST pin "HIGH" will drive the TOVER pin "LOW" and the TOVER pin "HIGH".
VDD
100k
TOVER
TRIP TEST
LM57
TOVER
GND
Figure 17. Trip Test Digital Output Test Circuit
In the circuit shown in Figure 18 when TOVER goes active high, it drives trip test high. Trip test high causes TOVER
to stay high. It is therefore latched. To release the latch, power down, then power up. The LM57-Q1 always
comes up in a released condition.
VDD
TOVER
TRIP TEST
LM57
TOVER
GND
Figure 18. Simple Latch Circuit
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Device Functional Modes (continued)
The TRIP TEST pin, normally used to check the operation of the TOVER and TOVER pins, may be used to latch the
outputs whenever the temperature exceeds the programmed limit and causes the digital outputs to assert. As
shown in Figure 19, when TOVER goes high, the TRIP TEST input is also pulled high and causes TOVER output to
latch high and the TOVER output to latch low. Momentarily switching the TRIP TEST input low will reset the LM57Q1 to normal operation. The resistor limits the current out of the TOVER output pin.
VDD
100k
TOVER
TRIP TEST
RESET
Momentary
LM57
TOVER
GND
Figure 19. Latch Circuit Using TOVER Output
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8 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8.1 Application Information
The LM57-Q1 has several outputs allowing for varying system implementations.
8.1.1 ADC Input Considerations
The LM57-Q1 has an analog temperature sensor output (VTEMP) that can be directly connected to an ADC
(Analog to Digital Converter) input. Most CMOS ADCs found in microcontrollers and ASICs have a sampled data
comparator input structure. When the ADC charges the sampling cap, it requires instantaneous charge from the
output of the analog source such as the LM57-Q1 temperature sensor and many op amps. This requirement is
easily accommodated by the addition of a capacitor (CFILTER). The size of CFILTER depends on the size of the
sampling capacitor and the sampling frequency. Because not all ADCs have identical input stages, the charge
requirements will vary. The general ADC application shown in Figure 20 is an example only.
SAR Analog-to-Digital Converter
Reset
+2.4V to +5.5V
Input
Pin
LM57
VDD
RIN
Sample
VTEMP
CBP
CPIN
CFILTER
CSAMPLE
GND
Figure 20. Suggested Connection to a Sampling Analog-to-Digital Converter Input Stage
8.2 Typical Application
VDD Supply
(+2.4V to +5.5V)
VDD
VTEMP
Analog
ADC Input
LM57
Microcontroller
RSENSE2
RSENSE1
SENSE1
TOVER
SENSE2
TOVER
TRIP TEST
Digital In
Digital Out
GND
Figure 21. Typical Application Schematic with Microcontroller TRIP TEST Control
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Typical Application (continued)
8.2.1 Design Requirements
By simply selecting the value of two resistors the trip point of the LM57-Q1 can easily be programmed as
described in the following section. If standard 1% values are used the actual trip point threshold is not degraded
and stands as described in the Electrical Characteristics section ( ).
8.2.2 Detailed Design Procedure
8.2.2.1 Selection of RSENSE Resistors
To set the trip point:
1.
2.
3.
4.
5.
Locate the desired trip temperature in .
Identify the corresponding RSENSE2 value by following the column up to the resistor value.
Identify the corresponding RSENSE1 value by following the row leftwards to the resistor value.
Use only the EIA E96 standard resistor values from the list.
Use only a resistor with 1% tolerance and a temperature coefficient of 100 ppm (or better). These restrictions
are necessary to stay at the selected setting, and not to slip into an adjacent setting.
6. This is consistent with using resistors from the thick film chip resistors CRCW0402 family. These are
available with very small dimensions of L = 1 mm, W = 0.5 mm, H = 0.35 mm.
7. Note that the resistor tolerance does not diminish the accuracy of the trip point. As can be seen in the block
diagram these inputs drive the logic inputs of a DAC thus their tolerance does affect the trip point accuracy
unless the DAC setting slips into an adjacent level. See patent number 6924758.
8.2.3 Application Curves
The typical performance of the LM57TSPWQ1 temperature sensor output can be seen in Figure 22. Figure 23
shows the output behavior of the LM57-Q1 TOVER output.
2.0
MAX LImit
VTEMP Accuracy (C)
1.5
Trip Point
1.0
Trip Point - Hysteresis
0.5
VTEMP Output
(Temp. of Leads)
0.0
-0.5
TOVER
-1.0
-1.5
MIN Limit
-2.0
±50
±25
0
25
50
75
100
125
150
DUT Temperature (C)
175
C102
Figure 22. J2 VTEMP Accuracy Characteristics
Figure 23. Output Transfer Characteristic
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Typical Application (continued)
8.2.4 Grounding of the TRIP TEST Pin
The circuit in Figure 24 shows the TRIP TEST pin grounded. This allows the LM57-Q1 to function autonomously
without microcontroller intervention. In all other respects this circuit functions similarly to the circuit shown in
Figure 21.
VDD Supply
(+2.4V to +5.5V)
VDD
VTEMP
LM57
RSENSE2
RSENSE1
Microcontroller
SENSE1
TOVER
SENSE2
TOVER
Digital In
TRIP TEST
GND
Figure 24. Typical Application Schematic without Microcontroller TRIP TEST Control
9 Power Supply Recommendations
Power supply bypass capacitors are optional and may be required if the supply line is noisy. TI recommends that
a local supply decoupling capacitor be used to reduce noise. For noisy environments, TI recommends a 100-nF
supply decoupling capacitor placed closed across VDD and GND pins of LM57-Q1.
10 Layout
10.1 Layout Guidelines
The LM57-Q1 can be applied easily in the same way as other integrated-circuit temperature sensors. It can be
glued or cemented to a surface. The temperatures of the lands and traces to the other leads of the LM57-Q1 will
also affect the temperature reading.
Alternatively, the LM57-Q1 can be mounted inside a sealed-end metal tube, and can then be dipped into a bath
or screwed into a threaded hole in a tank. As with any IC, the LM57-Q1 and accompanying wiring and circuits
must be kept insulated and dry, to avoid leakage and corrosion. This is especially true if the circuit may operate
at cold temperatures where condensation can occur. If moisture creates a short circuit from the VTEMP output to
ground or VDD, the VTEMP output from the LM57-Q1 will not be correct. Printed-circuit coatings are often used to
ensure that moisture cannot corrode the leads or circuit traces.
28
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10.2 Layout Example
VIA to ground plane
VIA to power plane
GND
VTEMP
SENSE1
TOVER
SENSE2
TOVER
VDD
TRIP TEST
RSENSE1
RSENSE2
0.1 µ F
Figure 25. PW (TSSOP) Package Layout Example
10.3 Temperature Considerations
The junction temperature of the LM57-Q1 is the actual temperature being measured. The thermal resistance
junction-to-ambient (RθJA) is the parameter (from ) used to calculate the rise of a device junction temperature due
to its power dissipation. Equation 3 is used to calculate the rise in the die temperature of the LM57-Q1.
7J 7A 5TJA ª¬ 9DD,Q 9DD ±9TEMP ,L º¼
where
•
•
•
•
TA is the ambient temperature.
IQ is the quiescent current.
IL is the load current on VTEMP.
RθJA can be found in
(3)
For example using an LM57-Q1 in the PW (TSSOP) package, in an application where TA = 30°C, VDD = 5.5 V,
IDD = 28 μA, J5 gain, VTEMP = 2368 mV, and IL = 0 μA, the total temperature rise would be [183°C/W × 5.5 V × 28
μA] = 0.028°C. To minimize self-heating, the load current on VTEMP should be minimized.
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11 Device and Documentation Support
11.1 Documentation Support
11.1.1 Related Documentation
For related documentation, see the following:
• LM57 Commercial Data Sheet.
• Reflow Temperature Profile specifications, www.ti.com/packaging.
• IC Package Thermal Metrics application report, SPRA953
11.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
11.3 Trademarks
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
11.4 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
11.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
12 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
LM57FEPWQ1
ACTIVE
TSSOP
PW
8
150
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 150
LM57FE
LM57FEPWRQ1
ACTIVE
TSSOP
PW
8
2000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 150
LM57FE
LM57FQPWQ1
ACTIVE
TSSOP
PW
8
150
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 125
LM57FQ
LM57FQPWRQ1
ACTIVE
TSSOP
PW
8
2000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 125
LM57FQ
LM57FSPWQ1
ACTIVE
TSSOP
PW
8
150
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 160
LM57FS
LM57FSPWRQ1
ACTIVE
TSSOP
PW
8
2000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 160
LM57FS
LM57TEPWQ1
ACTIVE
TSSOP
PW
8
150
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 150
LM57TE
LM57TEPWRQ1
ACTIVE
TSSOP
PW
8
2000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 150
LM57TE
LM57TQPWQ1
ACTIVE
TSSOP
PW
8
150
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 125
LM57TQ
LM57TQPWRQ1
ACTIVE
TSSOP
PW
8
2000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 125
LM57TQ
LM57TSPWQ1
ACTIVE
TSSOP
PW
8
150
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 160
LM57TS
LM57TSPWRQ1
ACTIVE
TSSOP
PW
8
2000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-50 to 160
LM57TS
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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