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SN65LVDS100, SN65LVDT100, SN65LVDS101, SN65LVDT101
SLLS516E – AUGUST 2002 – REVISED JULY 2015
SN65LVDx10x Differential Translator/Repeater
1 Features
•
•
•
•
•
1
•
•
•
•
3 Description
The SN65LVDS100, SN65LVDT100, SN65LVDS101,
and SN65LVDT101 are high-speed differential
receivers and drivers connected as repeaters. The
receiver accepts low-voltage differential signaling
(LVDS), positive-emitter-coupled logic (PECL), or
current-mode logic (CML) input signals at rates up to
2 Gbps and repeats it as either an LVDS or PECL
output signal. The signal path through the device is
differential for low radiated emissions and minimal
added jitter.
Designed for Signaling Rates ≥ 2 Gbps
Total Jitter < 65 ps
Low-Power Alternative for the MC100EP16
Low 100-ps (Maximum) Part-to-Part Skew
25 mV of Receiver Input Threshold Hysteresis
Over 0-V to 4-V Input Voltage Range
Inputs Electrically Compatible With LVPECL,
CML, and LVDS Signal Levels
3.3-V Supply Operation
LVDT Integrates 110-Ω Terminating Resistor
Offered in SOIC and MSOP
Device Information(1)
PART NUMBER
SN65LVDS100
2 Applications
•
•
•
Wireless Infrastructure
Telecom Infrastructure
Printers
SN65LVDT100
SN65LVDS101
SN65LVDT101
PACKAGE
BODY SIZE (NOM)
SOIC (8)
4.90 mm × 3.91 mm
VSSOP (8)
3.00 mm × 3.00 mm
SOIC (8)
4.90 mm × 3.91 mm
VSSOP (8)
3.00 mm × 3.00 mm
SOIC (8)
4.90 mm × 3.91 mm
VSSOP (8)
3.00 mm × 3.00 mm
SOIC (8)
4.90 mm × 3.91 mm
VSSOP (8)
3.00 mm × 3.00 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Dual Eye Diagram
FUNCTIONAL DIAGRAM
EYE PATTERN
SN65LVDS100 and SN65LVDS101
VCC
A
8
4
2
7
6
B
VBB
3
SN65LVDT100 and SN65LVDT101
2
A
7
110 W
6
3
B
Y
Z
2 Gbps
223 - 1 PRBS
VCC = 3.3 V
VID= 200 mV
VIC = 1.2 V
Vert.Scale= 200 mV/div
1 GHz
Y
Z
Horizontal Scale= 200 ps/div
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. UNLESS OTHERWISE NOTED, this document contains PRODUCTION
DATA.
SN65LVDS100, SN65LVDT100, SN65LVDS101, SN65LVDT101
SLLS516E – AUGUST 2002 – REVISED JULY 2015
www.ti.com
Table of Contents
1
2
3
4
5
6
7
8
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Description (Continued) ........................................
Device Options.......................................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
3
3
3
4
8.1
8.2
8.3
8.4
8.5
8.6
8.7
4
4
4
5
5
6
7
Absolute Maximum Ratings ......................................
ESD Ratings..............................................................
Recommended Operating Conditions.......................
Thermal Information ..................................................
Electrical Characteristics...........................................
Switching Characteristics ..........................................
Typical Characteristics ..............................................
9 Parameter Measurement Information ................ 12
10 Detailed Description ........................................... 15
10.1 Overview ............................................................... 15
10.2 Functional Block Diagram ..................................... 15
10.3 Feature Description............................................... 15
10.4 Device Functional Modes...................................... 20
11 Application and Implementation........................ 21
11.1 Application Information.......................................... 21
11.2 Typical Application ................................................ 22
12 Power Supply Recommendations ..................... 30
13 Layout................................................................... 30
13.1 Layout Guidelines ................................................. 30
13.2 Layout Example .................................................... 32
14 Device and Documentation Support ................. 33
14.1
14.2
14.3
14.4
14.5
Related Links ........................................................
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
33
33
33
33
33
15 Mechanical, Packaging, and Orderable
Information ........................................................... 33
4 Revision History
Changes from Revision D (December 2014) to Revision E
•
Page
Changed Features From: "Over 0-V to 4-V Common-Mode Range" To: "Over 0-V to 4-V Input Voltage Range" ................ 1
Changes from Revision C (June 2004) to Revision D
•
2
Page
Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device Functional
Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device
and Documentation Support section, and Mechanical, Packaging, and Orderable Information section .............................. 1
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SLLS516E – AUGUST 2002 – REVISED JULY 2015
5 Description (Continued)
The outputs of the SN65LVDS100 and SN65LVDT100 are LVDS levels as defined by TIA/EIA-644-A. The
outputs of the SN65LVDS101 and SN65LVDT101 are compatible with 3.3-V PECL levels. Both drive differential
transmission lines with nominally 100-Ω characteristic impedance.
The SN65LVDT100 and SN65LVDT101 include a 110-Ω differential line termination resistor for less board space,
fewer components, and the shortest stub length possible. They do not include the VBB voltage reference found in
the SN65LVDS100 and SN65LVDS101. VBB provides a voltage reference of typically 1.35 V below VCC for use in
receiving single-ended input signals and is particularly useful with single-ended 3.3-V PECL inputs. When VBB is
not used, it should be unconnected or open.
All devices are characterized for operation from –40°C to 85°C.
6 Device Options
ORDERABLE PART NUMBER
OUTPUT
TERMINATION RESISTOR
VBB
SN65LVDS100D
LVDS
No
Yes
SN65LVDS100DGK
LVDS
No
Yes
No
SN65LVDT100D
LVDS
Yes
SN65LVDT100DGK
LVDS
Yes
No
SN65LVDS101D
LVPECL
No
Yes
SN65LVDS101DGK
LVPECL
No
Yes
SN65LVDT101D
LVPECL
Yes
No
SN65LVDT101DGK
LVPECL
Yes
No
7 Pin Configuration and Functions
SN65LVDS100 and SN65LVDS101
D AND DGK PACKAGE
(TOP VIEW)
NC
A
B
VBB
1
8
2
7
3
6
4
5
SN65LVDT100 and SN65LVDT101
D AND DGK PACKAGE
(TOP VIEW)
NC
A
B
NC
VCC
Y
Z
GND
1
8
2
7
3
6
4
5
VCC
Y
Z
GND
NC = Not Connected
Pin Functions
PIN
SN65LVDS100,
SN65LVDS101
SN65LVDT100,
SN65LVDT101
I/O
A
2
2
I
Differential non-inverting input
B
3
3
I
Differential inverting input
GND
5
5
—
Ground
NC
1
1, 4
—
No connect
VBB
4
—
O
Voltage reference
VCC
8
8
—
Supply voltage
Y
7
7
O
Differential non-inverting output
Z
6
6
O
Differential inverting output
NAME
Copyright © 2002–2015, Texas Instruments Incorporated
DESCRIPTION
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8 Specifications
8.1 Absolute Maximum Ratings (1)
over operating free-air temperature range unless otherwise noted
MIN
MAX
UNIT
VCC
Supply voltage range (2)
–0.5
4
V
IBB
VBB output current
–0.5
0.5
mA
0
4.3
V
1
V
VI
Voltage range, (A, B, Y, Z)
VO
VID
(1)
(2)
Differential voltage, |VA – VB| ('LVDT100 and 'LVDT101 only)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
8.2 ESD Ratings
V(ESD)
Electrostatic discharge
Human body model (HBM), per
ANSI/ESDA/JEDEC JS-001 (1)
VALUE
UNIT
Pins 2, 3, 5, 6, 7
±5000
V
All pins except 2, 3, 5, 6, 7
±2000
V
±1500
V
Charged-device model (CDM), per JEDEC specification JESD22-C101
(1)
(2)
(2)
Tested in accordance with JEDEC Standard 22, Test Method A114-A.7.
Tested in accordance with JEDEC Standard 22, Test Method C101.
8.3 Recommended Operating Conditions
Supply voltage, VCC
Magnitude of differential input voltage |VID|
Operating free-air temperature, TA
(1)
4
NOM
MAX
3
3.3
3.6
'LVDS100 or 'LVDS101
0.1
1
'LVDT100 or 'LVDT101
0.1
0.8
Input voltage (any combination of common-mode or input signals), VI
VBB output current, IO(VBB)
MIN
UNIT
V
V
0
4
V
–400 (1)
12
µA
–40
85
°C
The algebraic convention, in which the less positive (more negative) limit is designated minimum, is used in this data sheet.
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SLLS516E – AUGUST 2002 – REVISED JULY 2015
8.4 Thermal Information
THERMAL METRIC
RθJA
(1)
SN65LVDS100, SN65LVDT100, SN65LVDS101,
SN65LVDT101
(1)
D
DGK
8 PINS
8 PINS
Junction-to-ambient thermal resistance
208
263
Power dissipation rating: TA ≤ 25°C
151
377
Power dissipation rating: TA ≤ 85°C
192
481
UNIT
°C/W
mW
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
8.5 Electrical Characteristics
over recommended operating conditions (unless otherwise specified)
PARAMETER
ICC
PD
TEST CONDITIONS
TYP (1)
MAX
Supply current, 'LVDx100
No load or input
25
30
Supply current, 'LVDx101
RL = 50 Ω to 1 V, No input
50
61
Device power dissipation, 'LVDx100
RL = 100 Ω, No input
Device power dissipation, 'LVDx101
Y and Z to VCC – 2 V through 50 Ω
No input
Reference voltage output, 'LVDS100
IO = –400 µA or 12 µA
or 'LVDS101
VBB
MIN
UNIT
mA
110
116
142
VCC – 1.4 VCC – 1.35
VCC – 1.3
mW
mV
SN65LVDS100 and SN65LVDS101 INPUT CHARACTERISTICS (see Figure 30)
Positive-going differential input
voltage threshold
VIT+
VIT–
Negative-going differential input
voltage threshold
II
Input current
100
See Figure 30 and Table 1
mV
–100
VI = 0 V or 2.4 V
Second input at 1.2 V
–20
VI = 4 V, Second input at 1.2 V
II(OFF)
Power off input current
VCC = 1.5 V, VI = 0 V or 2.4 V
Second input at 1.2 V
–20
Input offset current (|IIA - IIB|)
VIA = VIB, 0 ≤ VIA ≤ 4 V
Ci
Small-signal input capacitance to
GND
VI = 1.2 V
µA
33
µA
20
µA
VCC = 1.5 V, VI = 4 V
Second input at 1.2 V
IIO
20
33
–6
6
0.6
µA
pF
SN65LVDT100 and SN65LVDT101 INPUT CHARACTERISTICS (see Figure 30)
Positive-going differential input
voltage threshold
VIT+
VIT–
Negative-going differential input
voltage threshold
II
Input current
II(OFF)
R(T)
Ci
(1)
100
See Figure 30 and Table 1
mV
–100
VI = 0 V or 2.4 V, Other input open
–40
40
VI = 4 V, Other input open
Power off input current
Differential input resistance
Small-signal differential input
capacitance
VCC = 1.5 V, VI = 0 V or 2.4 V
Other input open
66
–40
40
µA
VCC = 1.5 V, VI = 4 V
Other input open
66
VID = 300 mV or 500 mV
VIC = 0 V or 2.4 V
90
110
132
VCC = 0 V, VID = 300 mV or 500 mV
VIC = 0 V or 2.4 V
90
110
132
VI = 1.2 V
µA
Ω
0.6
pF
Typical values are with a 3.3-V supply voltage and room temperature
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Electrical Characteristics (continued)
over recommended operating conditions (unless otherwise specified)
PARAMETER
TEST CONDITIONS
MIN
TYP (1)
MAX
247
340
454
UNIT
SN65LVDS100 and SN65LVDT100 OUTPUT CHARACTERISTICS (see Figure 30)
|VOD|
Differential output voltage magnitude
Δ|VOD|
Change in differential output voltage
magnitude between logic states
VOC(SS)
Steady-state common-mode output
voltage
ΔVOC(SS)
Change in steady-state commonmode output voltage between logic
states
VOC(PP)
Peak-to-peak common-mode output
voltage
IOS
Short-circuit output current
VO(Y) or VO(Z) = 0 V
IOS(D)
Differential short-circuit output
current
VOD = 0 V
See Figure 31
See Figure 32
mV
–50
50
1.125
1.375
–50
50
mV
150
mV
–24
24
mA
–12
12
mA
50
V
SN65LVDS101 and SN65LVDT101 OUTPUT CHARACTERISTICS (see Figure 30)
50 Ω to VCC – 2 V, See Figure 39
VOH
High-level output voltage
VOL
Low-level output voltage
|VOD|
50-Ω load to VCC – 2 V, See
Differential output voltage magnitude
Figure 39
VCC = 3.3 V, 50-Ω load to 2.3 V
50 Ω to VCC – 2 V, See Figure 39
VCC = 3.3 V, 50-Ω load to 2.3 V
VCC – 1.25 VCC – 1.02
2055
2280
VCC – 0.9
2405
VCC – 1.83 VCC – 1.61 VCC – 1.53
V
mV
V
1475
1690
1775
mV
475
575
750
mV
MIN
TYP (1)
MAX
UNIT
tPLH
Propagation delay time, 'LVDx100
low-to-high-level output 'LVDx101
300
470
800
400
630
900
tPHL
Propagation delay time, 'LVDx100
high-to-low-level output 'LVDx100
300
470
800
400
630
900
tr
Differential output signal rise time
(20% to 80%)
tf
Differential output signal fall time
(20% to 80%)
tsk(p)
Pulse skew (|tPHL – tPLH|) (2)
8.6 Switching Characteristics
over recommended operating conditions (unless otherwise noted)
PARAMETER
(3)
tsk(pp)
Part-to-part skew
tjit(per)
RMS period jitter (4)
tjit(cc)
Peak cycle-to-cycle jitter (5)
tjit(pp)
Peak-to-peak jitter
tjit(det)
Peak-to-peak deterministic jitter (6)
(1)
(2)
(3)
(4)
(5)
(6)
6
TEST CONDITIONS
ps
ps
See Figure 33
5
VID = 0.2 V, See Figure 33
220
ps
220
ps
50
ps
100
ps
1
3.7
ps
6
23
ps
2 GHz PRBS, 223 – 1 run length
VID = 200 mV, VIC = 1.2 V
See Figure 34
28
65
ps
2 GHz PRBS, 27 – 1 run length
VID = 200 mV, VIC = 1.2 V
See Figure 34
17
48
ps
1 GHz 50% duty-cycle square-wave
input
VID = 200 mV, VIC = 1.2 V
See Figure 34
All typical values are at 25°C and with a 3.3-V supply.
tsk(p) is the magnitude of the time difference between the tPLH and tPHL of any output of a single device.
tsk(pp) is the magnitude of the time difference in propagation delay time between any specified terminals of two devices when both
devices operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
Period jitter is the deviation in cycle time of a signal with respect to the ideal period over a random sample of 1,000,000 cycles.
Cycle-to-cycle jitter is the variation in cycle time of a signal between adjacent cycles, over a random sample of 1,000 adjacent cycle
pairs.
Deterministic jitter is the sum of pattern-dependent jitter and pulse-width distortion.
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8.7 Typical Characteristics
55
60
LVDS101= Loaded
45
I CC - Supply Current - mA
I CC - Supply Current - mA
LVDS101 = Loaded
50
VCC = 3.3 V
TA = 25°C
VIC = 1.2 V
VID= 200 mV
35
LVDS100
25
15
0
200
1000
400
600
800
Frequency - MHz
30
LVDS100
20
10
-40
1200
0
20
40
60
80
100
Figure 2. Supply Current vs Free-Air Temperature
700
t pd - Propagation Delay Time - ps
600
LVDS101
600
500
LVDS100
400
VCC = 3.3 V
TA = 25°C
VIC = 1.2 V
VID= 200 mV
300
200
VCC = 3.3 V
TA = 25°C
VID= 200 mV
f = 150 MHz
550
tPHL
500
tPLH
450
400
350
300
0
200
400
600
800
1000
1200
0
f - Frequency - MHz
Figure 3. Differential Output Voltage vs Frequency
1
2
3
4
VIC - Common-Mode Input Voltage - V
5
Figure 4. SN65LVDS100 Propagation Delay Time vs
Common-Mode Input Voltage
750
550
VCC = 3.3 V
TA = 25°C
VID= 200 mV
f = 150 MHz
700
t pd - Propagation Delay Time - ps
t pd - Propagation Delay Time - ps
-20
TA - Free-Air Temperature - °C
Figure 1. Supply Current vs Frequency
V OD - Differential Output Voltage - mV
VCC = 3.3 V
VIC = 1.2 V
VID= 200 mV
f = 750 MHz
40
tPHL
650
tPLH
600
550
500
450
VCC = 3.3 V
VID= 200 mV
f = 150 MHz
tPLH
500
tPHL
450
400
350
0
1
2
3
4
5
VIC - Common-Mode Input Voltage - V
Figure 5. SN65LVDS101 Propagation Delay Time vs
Common-Mode Input Voltage
Copyright © 2002–2015, Texas Instruments Incorporated
-40
-20
0
20
40
60
80
100
TA - Free-Air Temperature - °C
Figure 6. SN65LVDS100 Propagation Delay Time vs Free-Air
Temperature
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Typical Characteristics (continued)
30
VCC = 3.3 V
VID= 200 mV
f = 150 MHz
700
25
Peak-To-Peak Jitter - ps
t pd - Propagation Delay Time - ps
750
650
tPLH
600
tPHL
550
20
15
VID = 0.3 V
10
VID = 0.5 V
VID = 0.8 V
500
5
450
-40
-20
0
20
40
60
80
0
200
100
TA - Free-Air Temperature - °C
400
600
800
f - Frequency - MHz
Figure 7. SN65LVDS101 Propagation Delay Time vs Free-Air
Temperature
Figure 8. SN65LVDS100 Peak-to-Peak Jitter vs Frequency
60
Peak-To-Peak Jitter - ps
Peak-To-Peak Jitter - ps
25
40
30
VID = 0.3 V
20
10
20
15
VID = 0.8 V
10
VID = 0.3 V
5
VID = 0.8 V
300
VID = 0.5 V
800
1300
1800
Data Rate - Mbps
0
200
2300
30
VCC = 3.3 V
TA = 25°C
VIC = 400 mV
Input = PRBS 223-1
Peak-To-Peak Jitter - ps
40
VID = 0.5 V
30
20
0
300
800
1000
VCC = 3.3 V
TA = 25°C
VIC = 1.2 V
Input = Clock
25
10
600
Figure 10. SN65LVDS101 Peak-to-Peak Jitter vs Frequency
60
VID = 0.8 V
400
f - Frequency - MHz
Figure 9. SN65LVDS100 Peak-to-Peak Jitter vs Data Rate
Peak-To-Peak Jitter - ps
VCC = 3.3 V
TA = 25°C
VIC = 400 mV
Input = Clock
VID = 0.5 V
0
50
1000
30
VOC = 3.3 V
TA = 25°C
VIC = 400 mV
Input = PRBS 223-1
50
20
15
VID = 0.8 V
VID = 0.5 V
10
VID = 0.3 V
5
VID = 0.3 V
0
800
1300
1800
Data Rate - Mbps
2300
Figure 11. SN65LVDS101 Peak-to-Peak Jitter vs Data Rate
8
VCC = 3.3 V
TA = 25°C
VIC = 400 mV
Input = Clock
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200
400
600
f - Frequency - MHz
800
1000
Figure 12. SN65LVDS100 Peak-to-Peak Jitter vs Frequency
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Typical Characteristics (continued)
30
60
Peak-To-Peak Jitter - ps
50
40
25
Peak-To-Peak Jitter - ps
VCC = 3.3 V
TA = 25°C
VIC= 1.2 V
Input = PRBS 223-1
VID = 0.3 V
VID = 0.8 V
VID = 0.5 V
30
20
10
800
1300
1800
Data Rate - Mbps
15
10
0
200
2300
VID = 0.5 V
400
Peak-To-Peak Jitter - ps
25
VID = 0.8 V
VID = 0.5 V
30
20
10
20
15
VID = 0.8 V
VID = 0.5 V
10
5
800
1300
1800
Data Rate - Mbps
0
200
2300
Figure 15. SN65LVDS101 Peak-to-Peak Jitter vs Data Rate
400
600
800
f - Frequency - MHz
1000
30
VCC = 3.3 V
TA = 25°C
VIC = 2.9 V
Input = PRBS 223-1
25
Peak-To-Peak Jitter - ps
Peak-To-Peak Jitter - ps
VID = 0.3 V
Figure 16. SN65LVDS100 Peak-to-Peak Jitter vs Frequency
60
40
VID = 0.3 V
VID = 0.8 V
20
10
VCC = 3.3 V
TA = 25°C
VIC = 2.9 V
Input = Clock
20
15
VID = 0.5 V
10
VID = 0.8 V
5
VID = 0.5 V
0
300
1000
VCC = 3.3 V
TA = 25°C
VIC = 2.9 V
Input = Clock
VID = 0.3 V
30
800
30
VCC = 3.3 V
TA = 25°C
VIC= 1.2 V
Input = PRBS 223-1
40
50
600
Figure 14. SN65LVDS101 Peak-to-Peak Jitter vs Frequency
60
0
300
VID = 0.8 V
VID = 0.3 V
f - Frequency - MHz
Figure 13. SN65LVDS100 Peak-to-Peak Jitter vs Data Rate
Peak-To-Peak Jitter - ps
20
5
0
300
50
VCC = 3.3 V
TA = 25°C
VIC= 1.2 V
Input = Clock
800
1300
1800
2300
0
200
VID = 0.3 V
400
600
800
1000
Data Rate - Mbps
f - Frequency - MHz
Figure 17. SN65LVDS100 Peak-to-Peak Jitter vs Data Rate
Figure 18. SN65LVDS101 Peak-to-Peak Jitter vs Frequency
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Typical Characteristics (continued)
50
60
Peak-To-Peak Jitter - ps
50
Peak-To-Peak Jitter - ps
VID = 0.3 V
40
VID = 0.5 V
30
VID = 0.8 V
20
VCC = 3.3 V
TA = 25°C
VIC = 2.9 V
Input = PRBS 223-1
10
0
300
1300
800
VCC = 3.3 V
VIC = 1.2 V
VID= 200 mV
Input = 2 Gbps 223-1
40
LVDS100
30
20
LVDS101
10
1800
0
-40
2300
Data Rate - Mbps
Figure 19. SN65LVDS101 Peak-to-Peak Jitter vs Data Rate
100
70
300
60
250
50
VCC = 3.3 V,
VIC = 1.2 V,
|V ID| = 200 mV,
TA = 25°C,
Input = Clock
200
150
40
30
100
80
20
50
0
500
1000
1500
VCC = 3.3 V,
VIC = 1.2 V,
|V ID| = 200 mV,
TA = 25°C,
Input = PRBS 223-1
60
40
20
10
Added Random Jitter
0
Peak-to-Peak Jitter - ps
350
2000
0
0
0
2500
1000
f - Frequency - MHz
3000
4000
Figure 22. SN65LVDS100 Peak-to-Peak Jitter vs Data Rate
100
50
VCC = 3.3 V,
VIC = 1.2 V,
|V ID| = 200 mV,
TA = 25°C,
Input = PRBS 223-1
80
40
Peak-to-Peak Jitter - ps
VCC = 3.3 V,
VIC = 1.2 V,
|V ID| = 200 mV,
TA = 25°C,
Input = Clock
Period Jitter - ps
V OD - Differential Output Voltage - mV
700
60
540
30
460
20
380
10
20
0
2000
0
40
Added Random Jitter
300
0
400
800
1200
1600
f - Frequency - MHz
Figure 23. SN65LVDS101 Differential Output Voltage vs
Frequency
10
2000
Data Rate - Mbps
Figure 21. SN65LVDS100 Differential Output Voltage vs
Frequency
620
100
Figure 20. SN65LVDS100 Peak-to-Peak Jitter vs Free-Air
Temperature
80
Period Jitter - ps
V OD - Differential Output Voltage - mV
400
-20
0
20
40
60
80
TA - Free-Air Temperature - °C
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0
1000
2000
3000
4000
5000
Data Rate - Mbps
Figure 24. SN65LVDS101 Peak-to-Peak Jitter vs Data Rate
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Typical Characteristics (continued)
Horizontal Scale= 200 ps/div
LVPECL-to-LVDS
Figure 25. SN65LVDS100 Mbps, 223 – 1 PRBS
Horizontal Scale= 100 ps/div
LVPECL-to-LVDS
Figure 26. SN65LVDS100 Gbps, 223 – 1 PRBS
Horizontal Scale= 200 ps/div
LVDS-to-LVPECL
Figure 27. SN65LVDS101 Mbps, 223 – 1 PRBS
Horizontal Scale= 100 ps/div
LVDS-to-LVPECL
Figure 28. SN65LVDS101 Gbps, 223 – 1 PRBS
20
3.6 V, 85°C
3 V, 85°C
Input Voltage Threshold - mV
15
3.6 V, -40°C
10
VIT+
5
3 V, -40°C
0
|VOD| = 250 mV,
RL = 100 Ω,
Nominal Process
3 V, -40°C
-5
-10
VIT-
3.6 V, -40°C
-15
3.6 V, 85°C
-20
0
3 V, 85°C
1
2
3
4
5
Common-Mode Input Voltage - V
VIT is a steady-state parameter. The switching time is influenced by the input overdrive above this steady-state threshold up to a differential
input voltage magnitude of 100 mV.
Figure 29. SN65LVDS100 Simulated Input Voltage Threshold vs Common-Mode Input Voltage, Supply Voltage, and
Temperature
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9 Parameter Measurement Information
IIA
VID
VIC
VIA+VIB
Y
B
Z
IO
VBB
VOD
VIA
VO(Y)
VIB
2
A
+
VBB
-
VOC
VO(Z)
IIB
Figure 30. Voltage and Current Definitions
Table 1. Receiver Input Voltage Threshold Test
APPLIED VOLTAGES
(1)
RESULTING DIFFERENTIAL
INPUT VOLTAGE
RESULTING COMMONMODE INPUT VOLTAGE
OUTPUT (1)
VIA
VIB
VID
VIC
1.25 V
1.15 V
100 mV
1.2 V
1.15 V
1.25 V
–100 mV
1.2 V
L
4.0 V
3.9 V
100 mV
3.95 V
H
3.9 V
4. 0 V
–100 mV
3.95 V
L
0.1 V
0.0 V
100 mV
0.05 V
H
0.0 V
0.1 V
–100 mV
0.05 V
L
1.7 V
0.7 V
1000 mV
1.2 V
H
0.7 V
1.7 V
–1000 mV
1.2 V
L
4.0 V
3.0 V
1000 mV
3.5 V
H
3.0 V
4.0 V
–1000 mV
3.5 V
L
1.0 V
0.0 V
1000 mV
0.5 V
H
0.0 V
1.0 V
–1000 mV
0.5 V
L
H
H = high level, L = low level
3.74 kΩ
Y
VOD
Z
+
_
100 Ω
0 V ≤ V(test) ≤ 2.4 V
3.74 kΩ
Figure 31. SN65LVDx100 Differential Output Voltage (VOD) Test Circuit
A
Y
A
1.4 V
B
1.0 V
49.9 Ω ±1%
VID
VOC(PP)
B
Z
49.9 Ω ±1%
1 pF
VOC
VOC(SS)
VOC
NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 0.25 ns, pulse repetition rate
(PRR) = 0.5 Mpps, pulse width = 500 ± 10 ns. CL includes instrumentation and fixture capacitance within 0.06 mm of
the device under test. The measurement of VOC(PP) is made on test equipment with a –3 dB bandwidth of at least 300
MHz.
Figure 32. Test Circuit and Definitions for the SN65LVDx100 Driver Common-Mode Output Voltage
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A
Y
VOD
1 pF
VID
VIA
100 W
Z
B
VIA
1.4 V
VIB
1V
VID
0.4 V
0V
-0.4 V
VIB
VOD
OR
50 W
tPLH
tPHL
100%
0V
80%
50 W
VOD
+
-
20%
VCC - 2V
tf
0%
tr
NOTE: All input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 0.25 ns, pulse repetition rate
(PRR) = 50 Mpps, pulse width = 10 ± 0.2 ns. CL includes instrumentation and fixture capacitance within 0.06 mm of
the device under test. Measurement equipment provides a bandwidth of 5 GHz minimum.
Figure 33. Timing Test Circuit and Waveforms
IDEAL OUTPUT
CLOCK INPUT
0V
0V
1/fo
1/fo
Period Jitter
ACTUAL OUTPUT
Cycle to Cycle Jitter
ACTUAL OUTPUT
0V
0V
tc(n)
tc(n)
tjit(cc) = |tc(n) - tc(n+1)|
tjit(per) = |tc(n) - 1/fo|
PRBS INPUT
PRBS OUTPUT
0V
tc(n+1)
0V
tjit(pp)
Figure 34. Driver Jitter Measurement Waveforms
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Power Supply 1
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+
3.3V
-
+
Power Supply 2
1.22V
J3
DUT
GND
J2
EVM
GND
J6
J4
J5
Agilent
E4862B
Pattern
Generator
(Note A)
J1
VCC
100
J7
50
DUT
Matched
Cables
SMA to SMA
Matched
Cables
SMA to SMA
EVM
A.
Source jitter is subtracted from the measured values.
B.
TDS JIT3 jitter analysis software installed
50
Tektronix
TDS6604
Oscilloscope
(Note B)
Figure 35. Jitter Setup Connections for SN65LVDS100 and SN65LVDS101
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10 Detailed Description
10.1 Overview
The SN65LVDx10x family of devices are fully differential, high-speed translators/repeaters. All devices in the
family include a wide common-mode range receiver that accepts low-voltage differential signals covering a
variety of standards. A receiver with an input sensitivity of ±100 mV and 25 mV of hysteresis is incorporated. The
SN65LVDx100 devices include an output driver that meets all the specifications of the LVDS standard (TIA/EIA644A). The SN65LVDx101 devices include an output driver that is compatible with 3.3-V PECL levels.
The SN65LVDx10x family is intended to drive a 100-Ω transmission line. This transmission line may be a printedcircuit board (PCB) or cabled interconnect. With transmission lines, optimum signal quality and power delivery is
reached when a transmission line is terminated with a load equal to the characteristic impedance of the
interconnecting media. Likewise, the driven 100-Ω transmission line should be terminated with a matched
resistance.
10.2 Functional Block Diagram
SN65LVDS100 and SN65LVDS101
VCC
A
8
4
VBB
2
7
Y
6
B
Z
3
SN65LVDT100 and SN65LVDT101
2
A
7
110 W
6
3
B
Y
Z
10.3 Feature Description
10.3.1 Receiver Features
10.3.1.1 Voltage Range and Common-Mode Range
The receiver circuit incorporated into the SN65LVDx10x family supports receiving most low-voltage differential
signals. This wide common-mode range receiver can accept any input signal between 0 and 4 V. Without
referencing any specific standard, we can analyze the range of signals that can be input to this family of devices.
Assuming an input signal has a 400-mV differential input voltage |(V+ – V–)|, the maximum recommended input
voltage is 4 V. The absolute value of the most positive signal of a differential input would be VMAX:
VMAX = VCM + ½ (VDIFF)
where
•
•
VCM = common-mode voltage
VDIFF = differential voltage
(1)
Therefore, using our VMAX of 4 V and VDIFF of 400 mV, we see that we can simultaneously support a differential
voltage of 400 mV and a common-mode voltage of 3.8 V. As is obvious from Equation 1, the common-mode and
differential voltages are coupled: as the differential voltage increases in magnitude, the maximum common-mode
voltage supported decreases.
Using a similar analysis, and considering the 0-V minimum input voltage, we can see that we could
simultaneously support a differential voltage of 400 mV and a common-mode voltage of 0.2 V. Thus, we have a
receiver that can support common-mode voltages in the approximate range of 0.2 V to 3.8 V.
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Feature Description (continued)
The 400-mV example alluded to above is a reasonable maximum differential input voltage across a wide variety
of standards (LVDS, M-LVDS, CML, LVPECL, and so on). We can use the specifications for any of these
standards to understand the value of this wide input range receiver.
A standard compliant LVDS driver generates a 350-mV differential signal with a common-mode voltage of 1.2 V.
The noninverting output thus resides at 1.375 V, while the inverting signal is at a voltage of 1.025 V. Because the
SN65LVDx10x family receiver operates over a range of 0 V to 4 V, the wide common-mode receiver then can
accept signals that are common-mode shifted by –1.025 V to 2.625 V. Similar analysis can be performed for any
other input signal.
10.3.1.2 Sensitivity
Table 2 provides a truth table for the SN65LVDx10x family. Again, the same receiver circuitry is used on each of
the devices in this family; therefore, the truth table is the same for all family devices. When the differential input
voltage is greater than 100 mV, the receiver outputs a HI level. If the differential input voltage is less than –100
mV, the receiver outputs a LO level.
Between these two thresholds the receiver output is indeterminate. When the input signal falls in this –100 mV <
VID < 100 mV range, the receiver output state cannot be determined unambiguously. Having said that, it is
important to note that the SN65LVDx10x family receivers include 25 mV of hysteresis. The hysteresis is
incorporated into the design to prevent the output switching when the receiver input voltage is close to 0 V (for
example, the receiver inputs are open-circuited, or the receiver is connected to a driver that is high-impedance).
With the open-circuited input and when the magnitude of the differential noise voltage on the bus is low
(approximately < ±10 mV), the hysteresis serves to hold the device output at the last known state. This feature
helps prevent chattering on the device output.
Noticeably absent from this receiver is any integrated failsafe feature. External components may be added to the
receiver circuit to provide failsafe. Such an implementation is covered below.
10.3.1.3 Failsafe Considerations
Failsafe, in regard to a line receiver, usually means that the output goes to a defined logical state with no input
signal. To keep added jitter to an absolute minimum, the SN65LVDS100 does not include this feature. It does
exhibit 25 mV of input voltage hysteresis to prevent oscillation and keep the output in the last state prior to inputsignal loss (assuming the differential noise in the system is less than the hysteresis).
Should failsafe be required, it may be added externally with a 1.6-kΩ pullup resistor to the 3.3-V supply and a
1.6-kΩ pulldown resistor to ground as shown in Figure 36 The default output state is determined by which line is
pulled up or down and is the user's choice. The location of the 1.6-kΩ resistors is not critical. However, the 100Ω resistor should be located at the end of the transmission line.
3.3 V
1.6 kΩ
100 Ω
1.6 kΩ
Figure 36. External Failsafe Circuit
Addition of this external failsafe will reduce the differential noise margin and add jitter to the output signal. The
roughly 100-mV steady-state voltage generated across the 100-Ω resistor adds (or subtracts) from the signal
generated by the upstream line driver. If the differential output of the line driver is symmetrical about zero volts,
then the input at the receiver will appear asymmetrical with the external failsafe. Perhaps more important, is the
extra time it takes for the input signal to overcome the added failsafe offset voltage.
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Feature Description (continued)
In Figure 37 and using an external failsafe, the high-level differential voltage at the input of the SN65LVDS100
reaches 340 mV and the low-level –400 mV indicating a 60-mV differential offset induced by the external failsafe
circuitry. The figure also reveals that the lowest peak-to-peak time jitter does not occur at zero-volt differential
(the nominal input threshold of the receiver) but at –60 mV, the failsafe offset.
The added jitter from external failsafe increases as the signal transition times are slowed by cable effects. When
a ten-meter CAT-5 UTP cable is introduced between the driver and receiver, the zero-crossing peak-to-peak jitter
at the receiver output adds 250 ps when the external failsafe is added with this specific test set up. If external
failsafe is used in conjunction with the SN65LVDS100, the noise margin and jitter effects should be budgeted.
Figure 37. Receiver Input Eye Pattern with External Failsafe
10.3.1.4 VBB Voltage Reference
Pin 4 (VBB) on the SN65LVDS10x devices acts a voltage reference. This is an output signal from the device, with
a nominal value of VCC – 1.35 V. This output can be used when receiving a single-ended input signal. This
voltage reference would then be connected to the inverting input pin on the device (pin 3: B). The application
where such a use makes sense is when the device is to receive a single-ended 3.3-V LVPECL signal. The
common-mode voltage of a 3.3-V LVPECL signal is approximately 1.35 V below the device supply rail. While the
value of VBB is ideal for single-ended LVPECL signals, its use may be extended to other single-ended inputs as
long as the active single-ended signal is conditioned to have a common-mode voltage close to the nominal value
of VBB.
Caution is in order when using the VBB signal. The expected application when using this signal is as a voltage
reference to high-impedance input. The maximum current that can be sourced by this pin is 400 μA, while the
maximum current that can be sunk is 12 μA. In cases where the SN65LVDS10x device is to be used without
using VBB as a reference, the VBB pin should be left unconnected.
10.3.1.5 Integrated Termination
The SN65LVDT10x devices are identical to the SN65LVDS10x devices in all regards, with the addition that the
SN65LVDT10x devices incorporate an integrated termination resistor along with the receiver. This termination
would take the place of the matched load-line termination mentioned above. The SN65LVDT10x can be used in
a point-to-point system or in a multidrop system when it is the last receiver on the multidrop bus. The
SN65LVDT10x should not be used at every node in a multidrop system as this would change the loaded bus
impedance throughout the bus resulting in multiple reflections and signal distortion.
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10.3.1.6 Receiver Equivalent Schematic
The SN65LVDx10x equivalent input schematic diagram is shown in Figure 38. The receiver input is a highimpedance differential pair in the case of the SN65LVDS10x. The SN65LVDT10x devices include an internal
termination resistor of 110 Ω across the input port. 7-V Zener diodes are included on each input to provide ESD
protection.
INPUT
VCC
VCC
7V
350
VCC
B
A
110
VCC
(SN65LVDT only)
215
A
215
A
7V
A
350
A
Figure 38. Receiver Equivalent Schematic
10.3.2 Driver Features
10.3.2.1 Signaling Rate, Edge Rate, and Added Jitter
The SN65LVDT10x family has been designed to provide uncompromising signal quality at signaling rates up to 2
Gbps, and beyond. Specifying a maximum signaling rate (the signaling rate is the same as the bit rate) for a
device depends on the eye quality that can be achieved. This eye quality is driven by a number of factors, with
two of the most critical parameters being the rise or fall time and added jitter.
The rise and fall times for a device are critical for an obvious reason: the time it takes for a device to change
states will be a limiting factor in how fast a device can be operated. If a device is operated much faster than the
speed at which it can change states, the vertical opening of the eye diagram will be decreased. In some cases
this may be perfectly acceptable. As an example, assume an SN65LVDS100 is being using to receive a CML
signal, and translate the CML signal into an LVDS signal. At speeds up to 2 Gbps (or 1 GHz for a clock signal
because there are 2 bit times for each clock cycle), the LVDS output signal will have a differential output voltage
of at least 247 mV, with a nominal value of 340 mV (see the Electrical Characteristics section for reference). If
the input is at a higher speed, there is no circuitry within the SN65LVDS100 that would prevent the device from
trying to output an LVDS signal. As the signaling rate is increased beyond 2 Gbps, the output signal would show
a decrease in vertical eye opening. This decrease may not impact the utility of the device at the system level.
Signal chain noise analysis would need to be performed to determine whether the overall system would be
affected.
In a similar way, we can see the effect of added jitter, and how it can place upper limits on the useful operating
rate. At the stated 2-Gbps signaling rate, the unit interval (UI) time, tUI, is the reciprocal of 2 Gbps, or 500 ps. As
added jitter is introduced by a device such as the SN65LVDT10x family, it serves to close down the eye pattern
horizontally (or in time). As the output eye diagram will eventually be used to recover the transmitted or encoded
data, the jitter tolerance at the eventual consumer would determine if the eye closure introduced by a
SN65LVDT10x is acceptable. The nominal total jitter for the SN65LVDT10x family devices is 28 ps, while the
worst case jitter is 65 ps. The 28 ps represents less than 6% of the UI and the 65 ps represents 13% of the UI.
Both values will generally be within the amount of added jitter that can be tolerated in a system.
10.3.2.2 SN65LVDx100 LVDS Output
10.3.2.2.1 Driver Output Voltage
The SN65LVDx100 driver operates and meets all the specified performance requirements for supply voltages in
the range of 3 V to 3.6 V. The driver output voltage has a nominal value of 340 mV, with maximum and minimum
output voltages that meet the LVDS standard specifications of 247 mV and 454 mV, respectively.
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10.3.2.2.2 Driver Offset
An LVDS compliant driver is required to maintain the common-mode output voltage at 1.2 V (±75 mV). The
SN65LVDx100 incorporates sense circuitry and a control loop to source common-mode current and keep the
output signal within specified values. Further, the device maintains the output common-mode voltage at this set
point over the full 3-V to 3.6-V supply range.
10.3.2.3 SN65LVDx101 LVPECL Output
10.3.2.3.1 Driver Voltage
The SN65LVDx101 driver is an LVPECL differential driver. Figure 40 shows an equivalent output schematic for
the SN65LVDx101 driver. The differential signal output of the driver is simply the output of the differential pair,
emitter-coupled to the device output. For an ECL class device such as this, the output base-emitter diodes must
always be on. This need for the consistently active output stages helps explain the classical ECL load shown in
Figure 39.
VOY
+
VOD
VOZ
50 Ω
50 Ω
+
-
VCC - 2V
Figure 39. Typical Termination for LVPECL Output Driver (SN65LVDx101)
Figure 39 shows that the SN65LVDx101 outputs drive 50-Ω loads terminated to a supply that is 2 V below the
supply voltage of the SN65LVDx101 device. Driving a load that is referenced to a supply 2 V below the device
supply assures that the final transistor stages in the output driver are always on. A common question for those
new to ECL devices concerns the implementation of this output load. There is no need generally to have a
regulated supply to support this. A Thevenin load is often used to create a 50-Ω effective termination, at a
common-mode voltage 2 V below the local supply rail. Many other implementations have been used. The key to
the specific load that is implemented lies in the understanding that the ECL driver output stage is a voltage
driver, with the output voltage always referenced to the positive power rail for the device. The load that is driven
must ensure that the final transistors on each output leg are in the active regions at all times.
10.3.2.4 Driver Equivalent Schematics
The SN65LVDx10x equivalent output schematic diagrams are shown in Figure 40. The SN65LVDx10x output is
represented by a differential pair with 7-V Zener diodes on each output leg. The Zener diodes provide ESD
protection. The SN65LVDx10x1 LVPECL output is represented by a differential pair, with follower stages, and
with 7-V Zener diodes on each output leg for ESD protection.
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OUTPUT
(SN65LVDS100 and SN65LVDT100)
OUTPUT
(SN65LVDS101 and SN65LVDT101)
VCC
VCC
R
R
R
Y
R
Y
VCC
Z
7V
7V
Z
7V
7V
Figure 40. Driver Equivalent Schematics
10.4 Device Functional Modes
Table 2. SN65LVDx10x Truth Table
OUTPUTS (1)
DIFFERENTIAL INPUT
(1)
20
VID = VA – VB
Y
Z
VID ≥ 100 mV
H
L
–100 mV < VID < 100 mV
?
?
VID ≤ –100 mV
L
H
Open
?
?
H = high level, L = low level, ? = indeterminate
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11 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
11.1 Application Information
The SN65LVDx10x are single-channel repeaters/translators. The functionality of these devices is simple, yet
extremely flexible, leading to their use in designs ranging from wireless base stations to desktop computers.
SN65LVDx10x devices are often used as buffers to regenerate or repeat the signal at their port. The devices in
this family can accept any differential signal that meets the input port requirements specified herein. The input
signal does not need to comply with any particular standard to be repeated: it just needs to fall within the
common-mode input range of these devices, and have a differential input signal of at least 100 mV in magnitude.
With such an input the designer can use a SN65LVDx100 device to repeat the digital input signal, and generate
an output signal that carries the information at its input port, and complies with all the requirements of the LVDS
standard. Similarly, an SN65LVDx101 device is a general-purpose differential receiver that repeats the input data
at its output port, while complying with LVPECL output specifications.
Translating from one signaling standard to a different signaling standard is a common application issue. Two ICs
that use different signaling standards may need to communicate with each other. An FPGA may output an LVDS
signal and an ASIC may be designed to receive LVPECL inputs. Directly connecting the two devices would end
up with communication errors. In such a case an SN65LVDS101 can be used to translate between the
incompatible standards. The common application issue of converting from one standard to another are covered
in Typical Application.
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11.2 Typical Application
11.2.1 PECL to LVDS Translation
VCC
SN65LVDS100
ECL
100
VEE
50
50
VCC-2 V
Figure 41. PECL to LVDS Translation
11.2.1.1 Design Requirements
DESIGN PARAMETER
EXAMPLE VALUE
PECL Source Supply Voltage (VCC)
3.3 V
SN65LVDS100 Supply Voltage
3.0 to 3.6 V
Driver Signaling Rate
DC to 2000 Mbps
Interconnect Characteristic Impedance
100 Ω
Termination Resistance
50 Ω to VCC – 2 V on each side of transmission line
11.2.1.2 Detailed Design Requirements
Translating an LVPECL signal to LVDS is straightforward using the SN65LVDS100. The common-mode output of
an LVPECL driver is approximately 2 V, while the differential output voltage would be approximately 600 to 800
mV. 2 V is right in the middle of the common-mode range of the SN65LVDS100, while the differential voltage is
more than enough signal for the high-sensitivity receiver. As shown in Figure 41, 50-Ω pulldown resistors to
VCC – 2 V are needed, and the rationale for these have been discussed earlier.
11.2.1.3 Application Curve
Horizontal Scale= 200 ps/div
LVPECL-to-LVDS
Figure 42. SN65LVDS100 Mbps, 223 – 1 PRBS
22
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11.2.2 LVDS to 3.3-V PECL Translation
LVDS
SN65LVDT101
3.3 V
PECL
LVDS
50Ω
50Ω
1.3 V
Figure 43. LVDS to 3.3-V PECL Translation
11.2.2.1 Design Requirements
DESIGN PARAMETER
EXAMPLE VALUE
LVDS Source Supply Voltage (VCC)
3.3 V
SN65LVDT101 Supply Voltage
3.0 to 3.6 V
Driver Signaling Rate
DC to 2000 Mbps
Interconnect Characteristic Impedance
100 Ω
Termination Resistance
Integrated in SN65LVDT101
11.2.2.2 Detailed Design Requirements
Translating an LVDS signal to LVPECL is conveniently done using the SN65LVDT101. The common-mode
output of an LVDS driver is 1.2 V, while the differential output voltage would be approximately 350 mV. 1.2 V is
well within the common-mode range of the SN65LVDT101, while the differential voltage is more than enough
signal for the high-sensitivity receiver. The integrated variant of the LVPECL translators is used here as it
includes precisely the load required for operation of an LVDS driver. This circuit is shown in Figure 43.
11.2.2.3 Application Curve
Horizontal Scale= 200 ps/div
LVDS-to-LVPECL
Figure 44. SN65LVDS101 Mbps, 223 – 1 PRBS
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11.2.3 5-V PECL to 3.3-V PECL Translation
5V
ECL
SN65LVDS101
3.3 V
PECL
50Ω
50Ω
50Ω
50Ω
VEE
3V
1.3 V
Figure 45. 5-V PECL to 3.3-V PECL Translation
11.2.3.1 Design Requirements
DESIGN PARAMETER
EXAMPLE VALUE
PECL Source Supply Voltage (VCC)
5.0 V
SN65LVDS101 Supply Voltage
3.0 to 3.6 V
Driver Signaling Rate
DC to 2000 Mbps
Interconnect Characteristic Impedance
100 Ω
Termination Resistance
50 Ω to VCC – 2 V on each side of transmission line
11.2.3.2 Detailed Design Requirements
At times a 5-V PECL will need to be converted to a 3.3-V PECL signal. When the 5-V signal is encoded (8b10b
for example), ac-coupling can be used. Figure 45 shows how to translate a 5-V PECL signal to 3.3-V PECL when
a dc connection is needed.
The 50-Ω pulldown resistors to VCC – 2 V are familiar by now. The SN65LVDS101 provides the 3.3-V based
LVPECL signal.
A level of care must be exercised with this solution. The absolute voltage levels at the input pins to the
SN65LVDS101 must be less than or equal to 4 V. With a 5-V PECL signal, the non-inverting output will generally
be just below 4 V. If the 5-V PECL supply goes much above 5 V, the input voltage at the SN65LVDS101 may
violate the specifications. Ensure that the worst-case high-output voltage from the 5-V PECL driver will be within
the range of the SN65LVDS101.
11.2.3.3 Application Curve
Reference: Figure 44
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11.2.4 CML to LVDS or 3.3-V PECL Translation
VTT
50
CML
50
SN65LVDS100 or
SN65LVDS101
Figure 46. CML to LVDS or 3.3-V PECL Translation
11.2.4.1 Design Requirements
DESIGN PARAMETER
EXAMPLE VALUE
CML Termination Supply Voltage (VTT)
3.3 V
SN65LVDS10x Supply Voltage
3.0 to 3.6 V
Driver Signaling Rate
DC to 2000 Mbps
Interconnect Characteristic Impedance
100 Ω
Termination Resistance
50 Ω to VTT on each side of transmission line
11.2.4.2 Detailed Design Requirements
Current-mode logic (CML) signals are designed to drive a 100-Ω transmission line with a load termination being
two 50-Ω pullup resistors to a power supply. This circuit is shown in Figure 46. Common CML drivers include 16mA current sources that serve to develop the differential output signal. Using this 16-mA current source and
assuming a 3.3-V CML driver is being used, the common-mode output of the driver in Figure 46 is 2.9 V and the
differential output voltage is 800 mV. Both values are well within the operational envelope of the SN65LVDx10x
family receivers.
To convert from 3.3-V CML signals to LVDS signals, the driver and receiver are connected in a straightforward
fashion. The SN65LVDS100 is used in this circuit to convert to an LVDS output, while the SN65LVDS101 is used
to convert to LVPECL.
Again, the reader will notice that the integrated termination devices in the SN65LVDx10x family are not
mentioned for this conversion. The ‘LVDT devices incorporate a shunt 100-Ω termination which are not
appropriate when a pullup termination is needed.
11.2.4.3 Application Curve
Reference: Figure 44
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11.2.5 Single-Ended 3.3-V PECL to LVDS Translation
3.3 V
SN65LVDS100
ECL
Z0 = 50
100
LVDS
50
VEE
VBB
0.01 F
22 k
Figure 47. Single-Ended 3.3-V PECL to LVDS Translation
11.2.5.1 Design Requirements
DESIGN PARAMETER
EXAMPLE VALUE
ECL Supply Voltage
3.3 V
SN65LVDS100 Supply Voltage
3.0 to 3.6 V
Driver Signaling Rate
DC to 2000 Mbps
Interconnect Characteristic Impedance
50 Ω
Termination Resistance
50 Ω to GND
VBB Current to GND
91 µA
11.2.5.2 Detailed Design Requirements
The SN65LVDx10x family of devices provides the flexibility to translate single-ended input signals to differential
outputs. The output can be either LVDS or LVPECL, depending on the choice of SN65LVDS10x that is used.
Figure 47 demonstrates how to convert a single-ended LVPECL signal to an LVDS signal.
The common receiver used in this family will work with any pair of input signals that comply with its input
requirements. In this example, let’s assume the single-sided LVPECL signal has a high-level voltage of VCC – 1 V
= 2.3 V. Assume the low-level output voltage is VCC – 1.6 V = 1.7 V. The common-mode of these two levels is 2
V, which happens to be VCC – 1.3 V.
To use a single-ended signal with these receivers, we need to bias the unused input of the differential receiver.
In this case we will bias the inverting input pin. With the high and low signal levels calculated above, we see the
optimum bias point for the unused pin would be the common-mode or average signal level. The VBB pin provides
this needed voltage. VBB has a nominal value of VCC – 1.35 V.
The 22-kΩ resistor in the circuit serves to limit the dc current being sourced by VBB. This resistor setting will limit
the current to less than 100 μA, well within the recommended maximum value of 400 μA.
The drawback of a single-ended to differential-converted shown here is that the unused pin is being set to a fixed
value that will be close to the signal common-mode voltage. Any deviation from VBB (in the actual signal
common-mode) results in duty-cycle distortion at the differential output. Whether or not this is an issue is
application dependent. If, for example, the input signal is a clock signal and clocking only happens on one edge,
the distortion may be acceptable.
11.2.5.3 Application Curve
Reference: Figure 42
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11.2.6 Single-Ended CMOS to LVDS Translation
VDD
1 V < VDD < 4 V
CMOS
VDD/600 A*
SN65LVDS100
100
0.01 F
LVDS
VDD/600 A*
* closest standard value
Figure 48. Single-Ended CMOS to LVDS Translation
11.2.6.1 Design Requirements
DESIGN PARAMETER
EXAMPLE VALUE
CMOS Supply Voltage (VDD)
1 V < VDD < 4 V
SN65LVDS100 Supply Voltage
3.0 to 3.6 V
Driver Signaling Rate
DC to 500 Mbps
VBB Current to GND
91 µA (VDD = 4 V)
11.2.6.2 Detailed Design Requirements
The SN65LVDx10x family of devices can also translate a CMOS input signals to differential outputs. The output
can be either LVDS or LVPECL, depending on the choice of SN65LVDS10x that is used. Figure 48 demonstrates
how to convert a CMOS signal to an LVDS signal.
The CMOS signal in this case can be from any power rail up to 4 V (not a common rail, but the maximum
allowable input at the receiver nonetheless). The unused or inverting signal in this case is biased to VDD/2 which
will be equal to the common-mode of the CMOS input signal.
There is less concern with this circuit with regards to duty-cycle distortion, as we have assumed that the CMOS
driver and the local voltage divider are referenced to the same rail. If different rails were used, the usual cautions
on duty-cycle distortion would apply.
11.2.6.3 Application Curve
Reference: Figure 42
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11.2.7 Single-Ended CMOS to 3.3-V PECL Translation
VDD
1 V < VDD < 4 V
CMOS
VDD/600 μA*
SN65LVDS101
3.3 V
PECL
50Ω
0.01 μF
∗ closest standard
value
50Ω
VDD/600 μA*
1.3 V
Figure 49. Single-Ended CMOS to 3.3-V PECL Translation
11.2.7.1 Design Requirements
DESIGN PARAMETER
EXAMPLE VALUE
CMOS Supply Voltage (VDD)
1 V < VDD < 4 V
SN65LVDS101 Supply Voltage
3.0 to 3.6 V
Driver Signaling Rate
DC to 500 Mbps
VBB Current to GND
91 µA (VDD = 4 V)
11.2.7.2 Detailed Design Requirements
Figure 49 demonstrates how to implement a CMOS to LVPECL translation. The elements in this circuit are now
familiar, so the reader is referred to the previous discussions.
11.2.7.3 Application Curve
Reference: Figure 44
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11.2.8 Receipt of AC-Coupled Signals
C
50
C
SN65LVDS100 or
SN65LVDS101
50
VBB
0.01 F
22 k
Figure 50. Receipt of AC-Coupled Signals
11.2.8.1 Design Requirements
DESIGN PARAMETER
EXAMPLE VALUE
AC-coupling capacitor
10 nF
SN65LVDS100 Supply Voltage
3.0 to 3.6 V
Driver Signaling Rate
Up to 500 Mbps
VBB Current to GND
91 µA (VDD = 4 V)
Low-Frequency Cutoff of RC Filter
318 kHz
11.2.8.2 Detailed Design Requirements
The general need to convert ac-coupled signals to either LVDS or LVPECL is shown in Figure 50. The
transmission line is terminated with a center-tapped 100-Ω resistor network. The center tap is tied to the
previously discussed VBB bias reference. The bias reference is current limited with the same 22-kΩ resistor to
ground. The use of VBB is chosen for ease. This sets the common-mode at the receiver input approximately in
the middle of the receiver input range (approximately 2 V).
The ac-coupling capacitors used on the input signal may be integrated into the source destination device, or may
be discretely inserted on board. The capacitance value and the 50-Ω to ground terminations serve as a highpass filter, blocking dc content. With a 10-nF capacitor the low-frequency zero is at 318 kHz. The reader needs
to understand the frequency content of the incoming signal to determine whether this zero location is appropriate.
11.2.8.3 Application Curve
Reference: Figure 42
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12 Power Supply Recommendations
The LVDS drivers in this data sheet are designed to operate from a single power supply, with supply voltages in
the range of 3.0 V to 3.6 V. In a typical application, a driver and a receiver may be on separate boards, or even
separate equipment. In these cases, separate supplies would be used at each location. The expected ground
potential difference between the driver power supply and the receiver power supply would be less than |±1 V|.
Board level and local device level bypass capacitance should be used and have been covered.
13 Layout
13.1 Layout Guidelines
13.1.1 Microstrip vs. Stripline Topologies
As per SLLD009, modern printed-circuit boards usually offer designers two transmission line options: Microstrip
and stripline. Microstrips are traces on the outer layer of a PCB, as shown in Figure 51.
Figure 51. Microstrip Topology
On the other hand, striplines are traces between two ground planes. Striplines are less prone to emissions and
susceptibility problems since the reference planes effectively shield the embedded traces. However, from the
standpoint of high-speed transmission, juxtaposing two planes creates additional capacitance. TI recommends
routing LVDS signals on microstrip transmission lines, if possible. The PCB traces allow designers to specify the
necessary tolerances for ZO based on the overall noise budget and reflection allowances. Footnotes 1, 2, and 3
provide formulas for ZO and tPD for differential and single-ended traces. (1) (2) (3)
Figure 52. Stripline Topology
13.1.2 Dielectric Type and Board Construction
The speeds at which signals travel across the board dictates the choice of dielectric. FR-4, or equivalent, usually
provides adequate performance for use with LVDS signals. If rise or fall times of TTL/CMOS signals are less
than 500 ps, empirical results indicate that a material with a dielectric constant near 3.4, such as Rogers™ 4350
or Nelco N4000-13 is better suited. Once the designer chooses the dielectric, there are several parameters
pertaining to the board construction that can affect performance. The following set of guidelines were developed
experimentally through several designs involving LVDS devices:
• Copper weight: 15 g or 1/2 oz start, plated to 30 g or 1 oz
• All exposed circuitry should be solder-plated (60/40) to 7.62 μm or 0.0003 in (minimum).
• Copper plating should be 25.4 μm or 0.001 in (minimum) in plated-through-holes.
• Solder mask over bare copper with solder hot-air leveling
(1)
(2)
(3)
30
Howard Johnson & Martin Graham.1993. High Speed Digital Design – A Handbook of Black Magic. Prentice Hall PRT. ISBN number
013395724.
Mark I. Montrose. 1996. Printed Circuit Board Design Techniques for EMC Compliance. IEEE Press. ISBN number 0780311310.
Clyde F. Coombs, Jr. Ed, Printed Circuits Handbook, McGraw Hill, ISBN number 0070127549.
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Layout Guidelines (continued)
13.1.3 Recommended Stack Layout
Following the choice of dielectrics and design specifications, you must decide how many levels to use in the
stack. To reduce the TTL/CMOS-to-LVDS crosstalk, it is a good practice to have at least two separate signal
planes as shown in Figure 53.
Layer 1: Routed Plane (LVDS Signals)
Layer 2: Ground Plane
Layer 3: Power Plane
Layer 4: Routed Plane (TTL/CMOS Signals)
Figure 53. Four-Layer PCB Board
NOTE
The separation between layers 2 and 3 should be 127 μm (0.005 in). By keeping the
power and ground planes tightly coupled, the increased capacitance acts as a bypass for
transients.
One of the most common stack configurations is the six-layer board, as shown in Figure 54.
Layer 1: Routed Plane (LVDS Signals)
Layer 2: Ground Plane
Layer 3: Power Plane
Layer 4: Ground Plane
Layer 5: Ground Plane
Layer 4: Routed Plane (TTL Signals)
Figure 54. Six-Layer PCB Board
In this particular configuration, it is possible to isolate each signal layer from the power plane by at least one
ground plane. The result is improved signal integrity; however, fabrication is more expensive. Using the 6-layer
board is preferable, since it offers the layout designer more flexibility in varying the distance between signal
layers and referenced planes, in addition to ensuring reference to a ground plane for signal layers 1 and 6.
13.1.4 Separation Between Traces
The separation between traces depends on several factors; however, the amount of coupling that can be
tolerated usually dictates the actual separation. Low-noise coupling requires close coupling between the
differential pair of an LVDS link to benefit from the electromagnetic field cancellation. The traces should be 100-Ω
differential and thus coupled in the manner that best fits this requirement. In addition, differential pairs should
have the same electrical length to ensure that they are balanced, thus minimizing problems with skew and signal
reflection.
In the case of two adjacent single-ended traces, one should use the 3-W rule, which stipulates that the distance
between two traces must be greater than two times the width of a single trace, or three times its width measured
from trace center to trace center. This increased separation effectively reduces the potential for crosstalk. The
same rule should be applied to the separation between adjacent LVDS differential pairs, whether the traces are
edge-coupled or broadside-coupled.
W
Differential Traces
LVDS
Pair
S=
Minimum spacing as
defined by PCB vendor
W
t2 W
Single-Ended Traces
TTL/CMOS
Trace
W
Figure 55. 3-W Rule for Single-Ended and Differential Traces (Top View)
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Layout Guidelines (continued)
You should exercise caution when using autorouters, because they do not always account for all factors affecting
crosstalk and signal reflection. For instance, it is best to avoid sharp 90° turns to prevent discontinuities in the
signal path. Using successive 45° turns tends to minimize reflections.
13.1.5 Crosstalk and Ground Bounce Minimization
To reduce crosstalk, it is important to provide a return path for high-frequency currents that is as close as
possible to its originating trace. A ground plane usually achieves this. Because the returning currents always
choose the path of lowest inductance, they are most likely to return directly under the original trace, thus
minimizing crosstalk. Lowering the area of the current loop lowers the potential for crosstalk. Traces kept as short
as possible with an uninterrupted ground plane running beneath them emit the minimum amount of
electromagnetic field strength. Discontinuities in the ground plane increase the return path inductance and should
be avoided.
13.2 Layout Example
See Layout Guidelines examples.
At least two or three times the width of an individual trace should separate single-ended traces and differential
pairs to minimize the potential for crosstalk. Single-ended traces that run in parallel for less than the wavelength
of the rise or fall times usually have negligible crosstalk. Increase the spacing between signal paths for long
parallel runs to reduce crosstalk. Boards with limited real estate can benefit from the staggered trace layout, as
shown in Figure 56.
Layer 1
Layer 6
Figure 56. Staggered Trace Layout
This configuration lays out alternating signal traces on different layers; thus, the horizontal separation between
traces can be less than 2 or 3 times the width of individual traces. To ensure continuity in the ground signal path,
TI recommends having an adjacent ground via for every signal via, as shown in Figure 57. Note that vias create
additional capacitance. For example, a typical via has a lumped capacitance effect of 1/2 pF to 1 pF in FR4.
Signal Via
Signal Trace
Uninterrupted Ground Plane
Signal Trace
Uninterrupted Ground Plane
Ground Via
Figure 57. Ground Via Location (Side View)
Short and low-impedance connection of the device's ground pins to the PCB ground plane reduces ground
bounce. Holes and cutouts in the ground planes can adversely affect current return paths if they create
discontinuities that increase returning current loop areas.
To minimize EMI problems, TI recommends avoiding discontinuities below a trace (for example, holes, slits, and
so on) and keeping traces as short as possible. Zoning the board wisely by placing all similar functions in the
same area, as opposed to mixing them together, helps reduce susceptibility issues.
32
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14 Device and Documentation Support
14.1 Related Links
The table below lists quick access links. Categories include technical documents, support and community
resources, tools and software, and quick access to sample or buy.
Table 3. Related Links
PARTS
PRODUCT FOLDER
SAMPLE & BUY
TECHNICAL
DOCUMENTS
TOOLS &
SOFTWARE
SUPPORT &
COMMUNITY
SN65LVDS100
Click here
Click here
Click here
Click here
Click here
SN65LVDT100
Click here
Click here
Click here
Click here
Click here
SN65LVDS101
Click here
Click here
Click here
Click here
Click here
SN65LVDT101
Click here
Click here
Click here
Click here
Click here
14.2 Community Resources
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
14.3 Trademarks
E2E is a trademark of Texas Instruments.
Rogers is a trademark of Rogers Corporation.
All other trademarks are the property of their respective owners.
14.4 Electrostatic Discharge Caution
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
14.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
15 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OPTION ADDENDUM
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14-Oct-2022
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
Samples
(4/5)
(6)
SN65LVDS100D
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
DL100
Samples
SN65LVDS100DG4
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
DL100
Samples
SN65LVDS100DGK
ACTIVE
VSSOP
DGK
8
80
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
AZK
Samples
SN65LVDS100DGKG4
ACTIVE
VSSOP
DGK
8
80
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
AZK
Samples
SN65LVDS100DGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green NIPDAU | NIPDAUAG
Level-1-260C-UNLIM
-40 to 85
AZK
Samples
SN65LVDS100DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
DL100
Samples
SN65LVDS101D
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
DL101
Samples
SN65LVDS101DGK
ACTIVE
VSSOP
DGK
8
80
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
AZM
Samples
SN65LVDS101DGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
AZM
Samples
SN65LVDS101DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
DL101
Samples
SN65LVDT100D
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
DE100
Samples
SN65LVDT100DGK
ACTIVE
VSSOP
DGK
8
80
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
AZL
Samples
SN65LVDT100DGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
AZL
Samples
SN65LVDT100DGKRG4
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
AZL
Samples
SN65LVDT100DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
DE100
Samples
SN65LVDT101D
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
DE101
Samples
SN65LVDT101DG4
ACTIVE
SOIC
D
8
75
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
DE101
Samples
SN65LVDT101DGK
ACTIVE
VSSOP
DGK
8
80
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
BAF
Samples
SN65LVDT101DGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
BAF
Samples
SN65LVDT101DR
ACTIVE
SOIC
D
8
2500
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 85
DE101
Samples
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
14-Oct-2022
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
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