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TAS5705PAP

TAS5705PAP

  • 厂商:

    BURR-BROWN(德州仪器)

  • 封装:

    HTQFP64_EP

  • 描述:

    IC AMP AUDIO PWR 20W STER 64TQFP

  • 数据手册
  • 价格&库存
TAS5705PAP 数据手册
TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 20-W STEREO DIGITAL AUDIO POWER AMPLIFIER WITH EQ AND DRC Check for Samples: TAS5705 FEATURES 1 • 23 • • Audio Input/Output – 20-W Into an 8-Ω Load From an 18-V Supply – Wide Power-Supply Range From (8 V to 23 V) – Efficient Class-D Operation Eliminates Need for Heat Sinks – Requires Only Two Power-Supply Rails – Two Serial Audio Inputs (Four Audio Channels) – Supports 32-kHz–192-kHz Sample Rates (LJ/RJ/I2S) – Headphone PWM Outputs – Subwoofer PWM Outputs Audio/PWM Processing – Independent Channel Volume Controls With 24-dB to –100-dB Range – Soft Mute (50% Duty Cycle) – Programmable Dynamic Range Control – 16 Adaptable Biquads for Speaker EQ – Seven Biquads for Left and Right Channels – Two Biquads for Subwoofer Channel – Adaptive Coefficients for DRC Filters – Programmable Input and Output Mixers – DC Blocking Filters – Loudness Compensation for Subwoofer – Automatic Sample Rate Detection and Coefficient Banking for DRC and EQ General Features – Serial Control Interface Operational Without MCLK – Factory-Trimmed Internal Oscillator Enables Automatic Detection of Incoming • Sample Rates – Thermal and Short-Circuit Protection Benefits – EQ: Speaker Equalization Improves Audio Performance – DRC: Dynamic Range Compression. Enables Power Limiting, Speaker Protection, Easy Listening, Night-Mode Listening – Autobank Switching: Preload Coefficients for Different Sample Rates. No Need to Write Any Coefficients to the Part When Sample Rate Changes. – Autodetect: Automatically Detects Sample-Rate Changes. No Need for External Microprocessor Intervention DESCRIPTION The TAS5705 is a 20-W, efficient, digital audio power amplifier for driving stereo bridge-tied speakers. Two serial data inputs allow processing of up to four discrete audio channels and seamless integration to most digital audio processors and MPEG decoders. The device accepts a wide range of input data and clock rates. A fully programmable data path allows these channels to be routed to the internal speaker drivers or output via the line-level subwoofer or headphone PWM outputs. The TAS5705 is a slave-only device receiving clocks from external sources. The TAS5705 operates at a 384-kHz switching rate for 32-, 48-, 96-,and 192-kHz data and 352.8-kHz switching rate for 44.1-, 88.2and 176.4-kHz data. The 8× oversampling combined with the fourth-order noise shaper provides a flat noise floor and excellent dynamic range from 20 Hz to 20 kHz. 1 2 3 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PurePath Digital is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2008–2009, Texas Instruments Incorporated TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com SIMPLIFIED APPLICATION DIAGRAM 3.3 V DVDD/AVDD 8 V–23 V PVDD OUT_A LRCLK Digital Audio Source SCLK BST_A MCLK SDIN1 LC Left LC Right BST_B SDIN2 OUT_B 2 I C Control SDA OUT_C SCL BST_C BST_D MUTE Control Inputs HPSEL OUT_D RESET PLL_FLTP Loop Filter PLL_FLTM 8 V–23 V TAS5102 PDN SOUT+ SUB_PWM+ SIN+ SUB_PWM– SIN– BKND_ERR FAULT VALID RESET Subwoofer SOUT– HPR_PWM HPL_PWM RC Filter TPA6110A2 (HP Amplifier) B0264-01 2 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 FUNCTIONAL VIEW Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 3 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com FAULT Undervoltage Protection FAULT Internal Pullup Resistors to VREG 4 4 VREG Power On Reset Protection and I/O Logic AGND Temp. Sense GND VALID Overcurrent Protection Isense OC_ADJ BST_D PVDD_D PWM Controller PWM_D PWM Rcv Ctrl Timing Gate Drive OUT_D BTL-Configuration Pulldown Resistor PGND_CD GVDD_CD Regulator GVDD_CD BST_C PVDD_C PWM_C PWM Rcv Ctrl Timing Gate Drive OUT_C BTL-Configuration Pulldown Resistor PGND_CD BST_B PVDD_B PWM_B PWM Rcv Ctrl Timing Gate Drive OUT_B BTL-Configuration Pulldown Resistor GVDD_AB Regulator PGND_AB GVDD_AB BST_A PVDD_A PWM_A PWM Rcv Ctrl Timing Gate Drive OUT_A BTL-Configuration Pulldown Resistor PGND_AB B0034-04 Figure 1. Power Stage Functional Block Diagram 4 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 64-PIN, HTQFP PACKAGE (TOP VIEW) PGND_AB PGND_AB OUT_B OUT_B PVDD_B PVDD_B BST_B BST_C PVDD_C PVDD_C OUT_C OUT_C PGND_CD PGND_CD OUT_D OUT_A PAP Package (Top View) 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 OUT_A PVDD_A PVDD_A BST_A GVDD_AB SSTIMER TEST1 OC_ADJ FAULT AVDD AVSS PLL_FLTM PLL_FLTP VR_ANA DVDD RESET 1 2 3 4 5 6 48 47 46 45 44 43 OUT_D PVDD_D PVDD_D BST_D 7 8 9 10 11 12 13 14 15 16 42 41 40 39 38 37 36 35 34 33 GND GND SUB_PWM+ SUB_PWM– HPR_PWM HPL_PWM GVDD_CD VREG VALID BKND_ERR MCLK DVDD SDA SCL HPSEL STEST TEST2 DVSS MUTE LRCLK SCLK SDIN2 SDIN1 DVSSO VR_DIG PDN VREG_EN OSC_RES 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 P0071-01 TERMINAL FUNCTIONS TERMINAL NAME TYPE NO. (1) 5-V TOLERANT TERMINATION DESCRIPTION (2) AVDD 10 P 3.3-V analog power supply. Needs close decoupling capacitor. AVSS 11 P Analog 3.3-V supply ground BKND_ERR 35 DI BST_A 4 P High-side bootstrap supply for half-bridge A BST_B 57 P High-side bootstrap supply for half-bridge B BST_C 56 P High-side bootstrap supply for half-bridge C BST_D 45 P High-side bootstrap supply for half-bridge D (1) (2) Pullup Active-low. A back-end error sequence is generated by applying logic LOW to this terminal. This pin is connected to an external power stage. If no external power stage is used, connect this pin directly to DVDD. TYPE: A = analog; D = 3.3-V digital; P = power/ground/decoupling; I = input; O = output All pullups are 20-μA weak pullups and all pulldowns are 20-μA weak pulldowns. The pullups and pulldowns are included to assure proper input logic levels if the terminals are left unconnected (pullups → logic 1 input; pulldowns → logic 0 input). Devices that drive inputs with pullups must be able to sink 50 μA while maintaining a logic-0 drive level. Devices that drive inputs with pulldowns must be able to source 50 μA while maintaining a logic-1 drive level. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 5 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com TERMINAL FUNCTIONS (continued) TERMINAL NAME TYPE NO. (1) 5-V TOLERANT TERMINATION DESCRIPTION (2) DVDD 15, 33 P 3.3-V digital power supply DVSS 20 P Digital ground DVSSO 26 P FAULT 9 DO GND Oscillator ground Pullup Overtemperature, overcurrent, and undervoltage fault reporting. Active-low indicates fault. If high, normal operation. 41, 42 P Analog ground for power stage GVDD_AB 5 P Gate drive internal regulated output for AB channels GVDD_CD 44 P Gate drive internal regulated output for CD channels HPL_PWM 37 DO HPR_PWM 38 DO HPSEL 30 DI 5-V Headphone select, active-high. When a logic high is applied, device enters headphone mode and speakers are MUTED (HARD MUTE). When a logic LOW is applied, device is in speaker mode and headphone outputs become line outputs or are disabled. When in line out mode, this terminal functionality is disabled (see system control register 2. LRCLK 22 DI 5-V Input serial audio data left/right clock (sampling rate clock) MCLK 34 DI 5-V MCLK is the clock master input. The input frequency of this clock can range from 4.9 MHz to 49.2 MHz. MUTE 21 DI 5-V OC_ADJ 8 AO Analog overcurrent programming. Requires 22-kΩ resistor to ground. OSC_RES 19 AO Oscillator trim resistor. Connect an 18.2-kΩ, 1% tolerance resistor to DVSSO. OUT_A 1, 64 O Output, half-bridge A OUT_B 60, 61 O Output, half-bridge B OUT_C 52, 53 O Output, half-bridge C OUT_D 48, 49 O Output, half-bridge D 17 DI PGND_AB 62, 63 P Power ground for half-bridges A and B PGND_CD 50, 51 P Power ground for half-bridges C and D PLL_FLTM 12 AO PLL negative loop filter terminal PLL_FLTP 13 AI PLL positive loop filter terminal PVDD_A 2, 3 P Power supply input for half-bridge output A (8 V–23 V) PVDD_B 58, 59 P Power supply input for half-bridge output B (8 V–23 V) PVDD_C 54, 55 P Power supply input for half-bridge output C (8 V–23 V) PVDD_D 46, 47 P RESET 16 DI 5-V SCL 29 DI 5-V PDN 6 Headphone left-channel PWM output. Headphone right-channel PWM output. 5-V Pullup Pullup Performs a soft mute of outputs, active-low. A logic low on this pin sets the outputs equal to 50% duty cycle. A logic high on this pin allows normal operation. The mute control provides a noiseless volume ramp to silence. Releasing mute provides a noiseless ramp to previous volume. Power down, active-low. PDN powers down all logic, stops all clocks, and stops output switching whenever a logic low is applied. When PDN is released, the device powers up all logic, starts all clocks, and performs a soft start that returns to the previous configuration determined by register settings. Power supply input for half-bridge output D (8 V–23 V) Pullup Reset, active-low. A system reset is generated by applying a logic low to this terminal. RESET is an asynchronous control signal that restores the DAP to its default conditions, sets the VALID outputs low, and places the PWM in the hard-mute state (stops switching). Master volume is immediately set to full attenuation. Upon the release of RESET, if PDN is high, the system performs a 4–5-ms device initialization and sets the volume at mute. I2C serial control clock input Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 TERMINAL FUNCTIONS (continued) TERMINAL NAME TYPE (1) 5-V TOLERANT NO. TERMINATION DESCRIPTION (2) SCLK 23 DI 5-V Serial audio data clock (shift clock). SCLK is the serial audio port input data bit clock. SDA 28 DIO 5-V I2C serial control data interface input/output SDIN1 25 DI 5-V Serial audio data 1 input is one of the serial data input ports. SDIN1 supports three discrete (stereo) data formats. SDIN2 24 DI 5-V Serial audio data 2 input is one of the serial data input ports. SDIN2 supports three discrete (stereo) data formats. SSTIMER 6 AI Controls ramp time of OUT_X for pop-free operation. Leave this pin floating for BD mode. Requires capacitor of 2.2 nF to GND in AD mode. The capacitor determines the ramp time of PWM outputs from 0% to 50%. For 2.2 nF, start/stop time is ~10 ms. STEST 31 DI Test pin. Connect directly to GND. SUB_PWM– 39 DO Subwoofer negative PWM output SUB_PWM+ 40 DO Subwoofer positive PWM output TEST1 7 DI Test pin. Connect directly to GND. TEST2 32 DI Test pin. Connect directly to DVDD. VALID 36 DO Output indicating validity of ALL PWM channels, active-high. This pin is connected to an external power stage. If no external power stage is used, leave this pin floating. VR_ANA 14 P Internally regulated 1.8-V analog supply voltage. This terminal must not be used to power external devices. VR_DIG 27 P Internally regulated 1.8V digital supply voltage.This terminal must not be used to power external devices. VREG 43 P 3.3 Regulator output. Not to be used as s supply or connected to any other components other than decoupling caps. Add decoupling capacitors with pins 42 and 41. VREG_EN 18 DI Pulldown Voltage regulator enable. Connect directly to GND. ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range (unless otherwise noted) Supply voltage Input voltage (1) VALUE UNIT DVDD, AVDD –0.3 to 3.6 V PVDD_X –0.3 to 30 V OC_ADJ –0.3 to 4.2 V –0.5 to DVDD + 0.5 V 3.3-V digital input 5-V tolerant (2) –0.5 to DVDD + 2.5 V OUT_x to PGND_X digital input 32 (3) V BST_x to PGND_X 43 (3) V Input clamp current, IIK (VI < 0 or VI > 1.8 V) ±20 mA Output clamp current, IOK (VO < 0 or VO > 1.8 V) ±20 mA 0 to 85 °C 0 to 150 °C –40 to 125 °C Operating free-air temperature Operating junction temperature range Storage temperature range, Tstg (1) (2) (3) Stresses beyond those listed under absolute ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operation conditions are not implied. Exposure to absolute-maximum conditions for extended periods may affect device reliability. 5-V tolerant inputs are PDN, RESET, MUTE, SCLK, LRCLK, MCLK, SDIN1, SDIN2, SDA, SCL, and HPSEL. DC voltage + peak ac waveform measured at the pin should be below the allowed limit for all conditions. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 7 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com DISSIPATION RATINGS PACKAGE DERATING FACTOR ABOVE TA = 25°C TA ≤ 25°C POWER RATING TA = 70°C POWER RATING TA = 85°C POWER RATING 10-mm × 10-mm QFP 40 mW/°C 5W 3.2 W 2.6 W RECOMMENDED OPERATING CONDITIONS MIN NOM MAX Digital/analog supply voltage DVDD, AVDD 3 3.3 3.6 V Half-bridge supply voltage PVDD_X 8 23 V VIH High-level input voltage 3.3-V TTL, 5-V tolerant 2 5.5 V VIL Low-level input voltage 3.3-V TTL, 5-V tolerant TA Operating ambient temperature range 0 TJ Operating junction temperature range 0 RL (BTL) RL (SE) LO (BTL) LO (SE) Load impedance Output filter: L = 15 μH, C = 0.68 μF Output-filter inductance Minimum output inductance under short-circuit condition 6 8 3.2 4 UNIT 0.8 V 85 °C 150 °C Ω 10 μH 10 PWM OPERATION AT RECOMMENDED OPERATING CONDITIONS PARAMETER Output sample rate 2×–1× oversampled TEST CONDITIONS MODE VALUE UNIT 32–kHz data rate ±2% 12× sample rate 384 kHz 44.1-, 88.2-, 176.4-kHz data rate ±2% 8×, 4×, and 2× sample rates 352.8 kHz 48-, 96-, 192-kHz data rate ±2% 8×, 4×, and 2× sample rates 384 kHz PLL INPUT PARAMETERS AND EXTERNAL FILTER COMPONENTS PARAMETER fMCLKI TEST CONDITIONS Frequency, MCLK (1 / tcyc2) MIN TYP 4.9 MCLK duty cycle 40% MCLK minimum high time 8 MCLK minimum low time 8 50% UNIT 49.2 MHz 60% ns ns LRCLK allowable drift before LRCLK reset 8 MAX 4 MCLKs External PLL filter capacitor C1 SMD 0603 Y5V 47 nF External PLL filter capacitor C2 SMD 0603 Y5V 4.7 nF External PLL filter resistor R SMD 0603, metal film 470 Ω Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ELECTRICAL CHARACTERISTICS DC Characteristics TA = 25°, PVCC_X = 18 V, DVDD = AVDD = 3.3 V, RL= 8 Ω, BTL mode (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX VOH High-level output voltage 3.3-V TTL and 5-V tolerant (1) IOH = –4 mA VOL Low-level output voltage 3.3-V TTL and 5-V tolerant (1) IOL = 4 mA 0.5 3.3-V TTL VI = VIL ±2 5-V tolerant (1) VI = 0 V, DVDD = 3 V ±2 3.3-V TTL VI = VIH 5-V tolerant VI = 5.5 V, DVDD = 3 V IIL (2) IIH (2) Low-level input current High-level input current 2.4 IDD Digital supply current IPVDD Analog supply current No load (all PVDD inputs) V ±2 ±20 Normal Mode Digital supply voltage (DVDD, AVDD) 65 83 Power down (PDN = low) 8 23 Reset (RESET = low) 23 38.5 IPVDD(PDN) Power-down current No load (all PVDD inputs) Power down (PDN = low) IPVDD(RESET) Reset current No load (all PVDD inputs) Reset (RESET = low) 30 60 5 6.3 5 6.3 Drain-to-source resistance, LS TJ = 25°C, includes metallization resistance Drain-to-source resistance, HS TJ = 25°C, includes metallization resistance 180 Vuvp Undervoltage protection limit PVDD falling 7.2 Vuvp,hyst Undervoltage protection limit PVDD rising OTE (3) Overtemperature error rDS(on) UNIT V μA μA mA mA 180 mΩ I/O Protection OTEHYST OLPC (3) Extra temperature drop required to recover from error Overload protection counter fPWM = 384 kHz IOC Overcurrent limit protection Resistor—programmable, max. current, ROCP = 22 kΩ IOCT Overcurrent response time ROCP OC programming resistor range RPD Internal pulldown resistor at Connected when RESET is active to provide bootstrap the output of each half-bridge capacitor charge. (1) (2) (3) 7.6 V 150 °C 30 °C 0.63 ms 4.5 Resistor tolerance = 5% for typical value; the minimum resistance should not be less than 20 kΩ. This value is not adjustable. It must be fixed at 22 kΩ. 20 V A 150 ns 22 kΩ 3 kΩ 5-V tolerant inputs are PDN, RESET, MUTE, SCLK, LRCLK, MCLK, SDIN1, SDIN2, SDA, SCL, and HPSEL. IIL or IIH for pins with internal pullup can go up to 50 μA. Specified by design Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 9 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com AC Characteristics (BTL) PVDD_X = 18 V, BTL mode, RL = 8 Ω, ROC = 22 KΩ, CBST = 33 nF, audio frequency = 1 kHz, AES17 filter, fPWM = 384 kHz, TA = 25°C (unless otherwise noted). All performance is in accordance with recommended operating conditions, unless otherwise specified. PARAMETER PO TEST CONDITIONS MIN PVDD = 18 V,10% THD, 1-kHz input signal 20.0 PVDD = 18 V, 7% THD, 1-kHz input signal 18.6 PVDD = 12 V, 10% THD, 1-kHz input signal Power output per channel Total harmonic distortion + noise 8.3 PVDD = 8 V, 10% THD, 1-kHz input signal 3.9 PVDD = 8 V, 7% THD, 1-kHz input signal 3.7 PVDD = 12 V; PO = 4.5 W (half-power) PVDD = 8 V; PO = 2 W (half-power) MAX 9 PVDD = 12 V, 7% THD, 1-kHz input signal PVDD = 18 V; PO = 10 W (half-power) THD+N TYP UNIT W 0.12% 0.1% 0.24% Output integrated noise A-weighted 50 μV Crosstalk PO = 1 W, f = 1kHz –73 dB SNR Signal-to-noise ratio A-weighted, f = 1 kHz, maximum power at THD < 0.1% 105 dB PD Power dissipation due to idle losses (IPVDD_X) PO = 0 W, 4 channels switching (2) 0.6 W Vn (1) (2) (1) SNR is calculated relative to 0-dBFS input level. Actual system idle losses are affected by core losses of output inductors. AC Characteristics (Single-Ended Output) PVDD_X = 18 V, SE mode, RL = 4 Ω, ROC = 22 kΩ, CBST = 33-nF, audio frequency = 1 kHz, AES17 filter, fPWM = 384 kHz, ambient temperature = 25°C (unless otherwise noted). All performance is in accordance with recommended operating conditions, unless otherwise specified. PARAMETER PO Power output per channel TEST CONDITIONS MIN TYP MAX PVDD = 18 V, 10% THD 10 PVDD = 18 V, 7% THD 9 PVDD = 12 V, 10% THD 4.5 PVDD = 12 V, 7% THD UNIT W 4 PVDD = 18V, Po =5 W (half-power) 0.2 PVDD = 12V, Po =2.25 W (half-power) 0.2 THD+ N Total harmonic distortion + noise Vn Output integrated noise A-weighted 50 μV SNR Signal-to-noise ratio (1) A-weighted 105 dB DNR Dynamic range A-weighted, input level = –60 dBFS using TAS5086 modulator 105 dB PD Power dissipation due to idle losses (IPVDD_X) 0.6 W (1) (2) 10 PO = 0 W, 4 channels switching (2) % SNR is calculated relative to 0-dBFS input level. Actual system idle losses are affected by core losses of output inductors. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 SERIAL AUDIO PORTS SLAVE MODE over recommended operating conditions (unless otherwise noted) TEST CONDITIONS PARAMETER CL = 30 pF MIN TYP 1.024 MAX UNIT 12.288 MHz fSCLKIN Frequency, SCLK 32 × fS, 48 × fS, 64 × fS tsu1 Setup time, LRCLK to SCLK rising edge 10 ns th1 Hold time, LRCLK from SCLK rising edge 10 ns tsu2 Setup time, SDIN to SCLK rising edge 10 ns th2 Hold time, SDIN from SCLK rising edge 10 LRCLK frequency 32 48 192 SCLK duty cycle 40% 50% 60% LRCLK duty cycle 40% 50% 60% 32 64 SCLK edges –1/4 1/4 SCLK period SCLK rising edges between LRCLK rising edges t(edge) LRCLK clock edge with respect to the falling edge of SCLK ns kHz Figure 2. Slave Mode Serial Data Interface Timing Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 11 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com I2C SERIAL CONTROL PORT OPERATION Timing characteristics for I2C Interface signals over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN No wait states MAX UNIT 400 kHz fSCL Frequency, SCL tw(H) Pulse duration, SCL high 0.6 tw(L) Pulse duration, SCL low 1.3 tr Rise time, SCL and SDA 300 ns tf Fall time, SCL and SDA 300 ns tsu1 Setup time, SDA to SCL th1 Hold time, SCL to SDA t(buf) μs μs 100 ns 0 ns Bus free time between stop and start condition 1.3 μs tsu2 Setup time, SCL to start condition 0.6 μs th2 Hold time, start condition to SCL 0.6 μs tsu3 Setup time, SCL to stop condition 0.6 μs CL Load capacitance for each bus line 400 tw(H) tw(L) pF tf tr SCL tsu1 th1 SDA T0027-01 Figure 3. SCL and SDA Timing SCL t(buf) th2 tsu2 tsu3 SDA Start Condition Stop Condition T0028-01 Figure 4. Start and Stop Conditions Timing 12 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 RESET TIMING (RESET) Control signal parameters over recommended operating conditions (unless otherwise noted) PARAMETER MIN td(VALID_LOW) Time to assert VALID (reset to power stage) low tw(RESET) Pulse duration, RESET active td(I2C_ready) Time to enable I2C td(run) Device start-up time (after start-up command via I2C) TYP MAX UNIT 100 100 ns 200 ns 3.5 ms 10 RESET ms Earliest time that hard mute could be exited tw(RESET) VALID td(I2C_ready) td(run) td(VALID_LOW) System initialization. Start system 2 Enable via I C. T0029-05 NOTE: On power up, it is recommended that the TAS5705 RESET be held LOW for at least 100 μs after DVDD has reached 3.0 V. RESET assertion is ignored if applied while part is powered down Figure 5. Reset Timing POWER-DOWN (PDN) TIMING Control signal parameters over recommended operating conditions (unless otherwise noted) PARAMETER td(VALID_LOW) Time to assert VALID (reset to power stage) low td(STARTUP) Device startup time tw Minimum pulse duration required MIN TYP MAX UNIT μs 725 μs 650 μs 1 PDN tw VALID td(STARTUP) td(VALID_LOW) T0030-04 NOTE: PDNZ assertion is ignored if applied when part is in RESET Figure 6. Power-Down Timing Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 13 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com DVDD PVDD T0317-01 Figure 7. Power Up and Power Down of Power Supplies DVDD > 100 ms RESET tpower_down PDN T0318-01 NOTE: tpower_down = time to wait before powering down the supplies after PDN assertion = 725 μs + power-stage stop time defined by register 0x1A Figure 8. Terminal Control and DVDD 14 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 BACK-END ERROR (BKND_ERR) Control signal parameters over recommended operating conditions (unless otherwise noted) PARAMETER MIN TYP tw(ER) Minimum pulse duration, BKND_ERR active (active-low) tp(valid_high) Programmable. Time to stay in the VALID (reset to the power stage) low state. After tp(valid_high), the TAS5705 attempts to bring the system out of the VALID low state if BKND_ERR is high. 300 Time TAS5705 takes to bring VALID (reset to the power stage) low after BKND_ERR assertion. 400 tp(valid_low) MAX UNIT 350 ns ms ns tw(ER) BKND_ERR VALID Normal Operation Normal Operation tp(valid_high) tp(valid_low) T0031-04 Figure 9. Error Recovery Timing MUTE TIMING (MUTE) Control signal parameters over recommended operating conditions (unless otherwise noted) PARAMETER td(VOL) MIN Volume ramp time (= number of steps × step size). Number of steps is defined by volume configuration register 0x0E (see Volume Configuration Register ). Step size = 4 LRCLKs if fS ≤ 48 kHz; else 8 LRCLKs if fS ≤ 96 kHz ; else 16 LRCLKs TYP MAX 1024 UNIT steps MUTE VOLUME Normal Operation Normal Operation td(VOL) td(VOL) 50-50 Duty Cycle T0032-03 Figure 10. Mute Timing Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 15 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com HEADPHONE SELECT (HPSEL) PARAMETER MIN tw(MUTE) Pulse duration, HPSEL active td(VOL) Soft volume update time t(SW) Switch-over time (controlled by start/stop period register, 0x1A) (1) MAX UNIT 350 ns (1) ms 0.2 ms See Defined by the volume slew rate setting (see the volume configuration register, 0x0E). Figure 11 and Figure 12 show functionality when bit 4 in the HP configuration register is set to DISABLE (not in line-out mode). See register 0x05 for details. If bit 4 is not set, than the HP PWM outputs are not disabled when HPSEL is brought low. HPSEL Spkr Volume td(VOL) HP Volume td(VOL) t(SW) VALID T0267-01 Figure 11. HPSEL Timing for Headphone Insertion HPSEL HP Volume td(VOL) Spkr Volume td(VOL) t(SW) VALID T0268-01 Figure 12. HPSEL Timing for Headphone Extraction 16 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 TYPICAL CHARACTERISTICS, BTL CONFIGURATION TOTAL HARMONIC DISTORTION + NOISE (BTL) vs FREQUENCY TOTAL HARMONIC DISTORTION + NOISE (BTL) vs FREQUENCY 10 THD+N − Total Harmonic Distortion + Noise − % THD+N − Total Harmonic Distortion + Noise − % 10 PVDD = 18 V RL = 8 Ω 1 P=5W 0.1 0.01 0.001 20 P=1W P = 10 W 100 1k PVDD = 12 V RL = 8 Ω 1 P = 2.5 W 0.1 P=5W 0.01 0.001 20 10k 20k P = 0.5 W 100 1k f − Frequency − Hz 10k 20k f − Frequency − Hz G003 G002 Figure 13. Figure 14. TOTAL HARMONIC DISTORTION + NOISE (BTL) vs FREQUENCY TOTAL HARMONIC DISTORTION + NOISE (BTL) vs OUTPUT POWER 10 THD+N − Total Harmonic Distortion + Noise − % THD+N − Total Harmonic Distortion + Noise − % 10 PVDD = 8 V RL = 8 Ω 1 P = 0.5 W 0.1 P=1W P = 2.5 W 0.01 0.001 20 100 1k 10k 20k PVDD = 18 V RL = 8 Ω 1 f = 1 kHz 0.1 f = 20 Hz 0.01 f = 10 kHz 0.001 0.01 f − Frequency − Hz G001 Figure 15. 0.1 1 10 PO − Output Power − W 40 G006 Figure 16. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 17 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com TYPICAL CHARACTERISTICS, BTL CONFIGURATION (continued) TOTAL HARMONIC DISTORTION + NOISE (BTL) vs OUTPUT POWER TOTAL HARMONIC DISTORTION + NOISE (BTL) vs OUTPUT POWER 10 THD+N − Total Harmonic Distortion + Noise − % THD+N − Total Harmonic Distortion + Noise − % 10 PVDD = 12 V RL = 8 Ω 1 f = 1 kHz 0.1 f = 20 Hz 0.01 f = 10 kHz 0.001 0.01 0.1 1 PO − Output Power − W 1 f = 1 kHz 0.1 f = 20 Hz 0.01 f = 10 kHz 0.001 0.01 40 10 PVDD = 8 V RL = 8 Ω 0.1 1 10 40 PO − Output Power − W G005 Figure 17. Figure 18. EFFICIENCY vs OUTPUT POWER SUPPLY CURRENT vs TOTAL OUTPUT POWER G004 3.0 100 RL = 8 Ω 90 2.5 80 Efficiency − % PVDD = 18 V IDD − Supply Current − A PVDD = 12 V 70 PVDD = 8 V 60 50 40 30 2.0 1.5 PVDD = 18 V 1.0 PVDD = 12 V 20 0.5 10 PVDD = 8 V RL = 8 Ω 0.0 0 0 2 4 6 8 10 12 14 16 PO − Output Power (Per Channel) − W 18 20 0 10 15 20 25 30 PO − Total Output Power − W G007 Figure 19. 18 5 35 40 G008 Figure 20. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 TYPICAL CHARACTERISTICS, BTL CONFIGURATION (continued) OUTPUT POWER vs SUPPLY VOLTAGE CROSSTALK vs FREQUENCY 25 −60 RL = 8 Ω −65 20 PO = 1 W PVDD = 18 V RL = 8 Ω Crosstalk − dB PO − Output Power − W −70 15 THD+N = 10% 10 −75 Right to Left −80 Left to Right −85 THD+N = 1% −90 5 −95 0 6 8 10 12 14 16 18 20 −100 20 PVDD − Supply Voltage − V G009 Figure 21. 100 1k 10k 20k f − Frequency − Hz G012 Figure 22. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 19 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com TYPICAL CHARACTERISTICS, SE CONFIGURATION TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY 10 VCC = 18 V RL = 4 Ω (SE) Gain = 3 dB THD+N − Total Harmonic Distortion + Noise − % THD+N − Total Harmonic Distortion + Noise − % 10 1 PO = 5 W 0.1 PO = 2.5 W PO = 0.5 W 0.01 0.001 20 100 1k VCC = 18 V RL = 4 Ω (SE) Gain = 3 dB 1 PO = 5 W 0.1 PO = 2.5 W PO = 0.5 W 0.01 0.001 20 10k 20k 100 1k f − Frequency − Hz 10k 20k f − Frequency − Hz G012 G012 Figure 23. Figure 24. TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER OUTPUT POWER vs SUPPLY VOLTAGE 18 f = 1 kHz RL = 4 Ω (SE) Gain = 3 dB f = 1 kHz RL = 4 Ω (SE) Gain = 3 dB 15 1 PO − Output Power − W THD+N − Total Harmonic Distortion + Noise − % 10 0.1 VCC = 18 V VCC = 12 V 12 THD+N = 10% 9 6 THD+N = 1% 0.01 3 0.001 0.01 0 0.1 1 PO − Output Power − W 10 40 5 15 20 VCC − Supply Voltage − V G013 Figure 25. 20 10 25 G014 Figure 26. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 DETAILED DESCRIPTION POWER SUPPLY To facilitate system design, the TAS5705 needs only a 3.3-V digital supply in addition to the (typical) 18-V power-stage supply. An internal voltage regulator provides suitable voltage levels for the gate drive circuitry. Additionally, all circuitry requiring a floating voltage supply, e.g., the high-side gate drive, is accommodated by built-in bootstrap circuitry requiring only a few external capacitors. In order to provide good electrical and acoustical characteristics, the PWM signal path for the output stage is designed as identical, independent half-bridges. For this reason, each half-bridge has separate bootstrap pins (BST_X), and power-stage supply pins (PVDD_X). The gate drive voltages (GVDD_AB and GVDD_CD) are derived from the PVDD voltage. Separate, internal voltage regulators reduce and regulate the PVDD voltage to a voltage appropriate for efficient gave drive operation. Special attention should be paid to placing all decoupling capacitors as close to their associated pins as possible. In general, inductance between the power-supply pins and decoupling capacitors must be avoided. For a properly functioning bootstrap circuit, a small ceramic capacitor must be connected from each bootstrap pin (BST_X) to the power-stage output pin (OUT_X). When the power-stage output is low, the bootstrap capacitor is charged through an internal diode connected between the gate-drive power-supply pin (GVDD_X) and the bootstrap pin. When the power-stage output is high, the bootstrap capacitor potential is shifted above the output potential and thus provides a suitable voltage supply for the high-side gate driver. In an application with PWM switching frequencies in the range from 352 kHz to 384 kHz, it is recommended to use 33-nF ceramic capacitors, size 0603 or 0805, for the bootstrap supply. These 33-nF capacitors ensure sufficient energy storage, even during minimal PWM duty cycles, to keep the high-side power stage FET (LDMOS) fully turned on during the remaining part of the PWM cycle. Special attention should be paid to the power-stage power supply; this includes component selection, PCB placement, and routing. As indicated, each half-bridge has independent power-stage supply pins (PVDD_X). For optimal electrical performance, EMI compliance, and system reliability, it is important that each PVDD_X pin is decoupled with a 100-nF ceramic capacitor placed as close as possible to each supply pin. The TAS5705 is fully protected against erroneous power-stage turnon due to parasitic gate charging. SYSTEM POWER-UP/POWER-DOWN SEQUENCE Powering Up The outputs of the H-bridges remain in a low-impedance state until the internal gate-drive supply voltage (GVDD_XY) and external VREG voltages are above the undervoltage protection (UVP) voltage threshold (see the DC Characteristics section of this data sheet). It is recommended to hold PVDD_X low until DVDD (3.3 V) is powered up while powering up the device. This allows an internal circuit to charge the external bootstrap capacitors by enabling a weak pulldown of the half-bridge output. The output impedance is approximately 3 kΩ. This means that the TAS5705 should be held in reset for at least 100 μs to ensure that the bootstrap capacitors are charged. This also assumes that the recommended 0.033-μF bootstrap capacitors are used. Changes to bootstrap capacitor values change the bootstrap capacitor charge time. See Figure 7 and Figure 8. Powering Down Apply PDN (assert low). Wait for the power stage to shut down. Power down PVDD. Then power down DVDD. Then de-assert PDN. See Figure 8 for recommended timing. ERROR REPORTING The FAULT pin is an active-low, open-drain output. Its function is for protection-mode signaling to a system-control device. Any fault resulting in device shutdown is signaled by the FAULT pin going low (see Table 1). Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 21 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com Table 1. FAULT Output States FAULT DESCRIPTION 0 Overcurrent (OC) or undervoltage (UVP) warning or overtemperature error (OTE) 1 Junction temperature lower than 150°C and no faults (normal operation) Note that asserting RESET low forces the FAULT signal high, independent of faults being present. To reduce external component count, an internal pullup resistor to 3.3 V is provided on the FAULT output. Level compliance for 5-V logic can be obtained by adding external pullup resistors to 5 V (see the Electrical Characteristics section of this data sheet for further specifications). DEVICE PROTECTION SYSTEM The TAS5705 contains advanced protection circuitry carefully designed to facilitate system integration and ease of use, as well as to safeguard the device from permanent failure due to a wide range of fault conditions such as short circuits, overtemperature, and undervoltage. The TAS5705 responds to a fault by immediately setting the power stage in a high-impedance (Hi-Z) state and asserting the FAULT pin low. The device automatically recovers when the fault condition has been removed. Overcurrent (OC) Protection With Current Limiting The device has independent, fast-reacting current detectors on all high-side and low-side power-stage FETs. The detector outputs are closely monitored by two protection systems. The first protection system controls the power stage in order to prevent the output current further increasing, i.e., it performs a cycle-by-cycle current-limiting function, rather than prematurely shutting down during combinations of high-level music transients and extreme speaker load impedance drops. If the high-current condition situation persists, i.e., the power stage is being overloaded, a second protection system triggers a latching shutdown, resulting in the power stage being set in the high-impedance (Hi-Z) state. The device returns to normal operation once the fault condition (i.e., a short circuit on the output) is removed. Current limiting and overcurrent protection are not independent for half-bridges A and B and, respectively, C and D. That is, if the bridge-tied load between half-bridges A and B causes an overcurrent fault, half-bridges A, B, C, and D are shut down. The overcurrent protection threshold is set by a resistor to ground from the OC_ADJ pin. A value of 22 kΩ will result in an overcurrent threshold of 4.5 A. This resistor value should not be changed. Overtemperature Protection The TAS5705 has a two-level temperature-protection system that asserts an active-high warning signal (OTW) when the device junction temperature exceeds 125°C (nominal) and, if the device junction temperature exceeds 150°C (nominal), the device is put into thermal shutdown, resulting in all half-bridge outputs being set in the high-impedance (Hi-Z) state and FAULT being asserted low. OTE is latched in this case. To clear the OTE latch, RESET must be asserted. Thereafter, the device resumes normal operation. Undervoltage Protection (UVP) and Power-On Reset (POR) The UVP and POR circuits of the TAS5705 fully protect the device in any power-up/down and brownout situation. While powering up, the POR circuit resets the overload circuit (OLP) and ensures that all circuits are fully operational when the GVDD_XY and VREG supply voltages reach 5.7 V (typical) and 2.7 V, respectively. Although GVDD_XY and VREG are independently monitored, a supply voltage drop below the UVP threshold on VREG or either GVDD_XY pin results in all half-bridge outputs immediately being set in the high-impedance (Hi-Z) state and FAULT being asserted low. The device automatically resumes operation when all supply voltages have increased above the UVP threshold. DEVICE RESET One reset pin is provided for control of half-bridges A/B/C/D. When RESET is asserted low, all four power-stage FETs in half-bridges A, B, C, and D are forced into a high-impedance (Hi-Z) state. 22 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 In BTL modes, to accommodate bootstrap charging prior to switching start, asserting the reset input low enables weak pulldown of the half-bridge outputs. In the SE mode, the weak pulldowns are not enabled, and it is therefore recommended to ensure bootstrap capacitor charging by providing a low pulse on the PWM inputs when reset is asserted high. Asserting the reset input low removes any fault information to be signaled on the FAULT output, i.e., FAULT is forced high. A rising-edge transition on the reset input allows the device to resume operation after an overcurrent fault. SSTIMER FUNCTIONALITY The SSTIMER pin uses a capacitor connected between this pin and ground to control the output duty cycle when a transition occurs on the RESET pin. The capacitor on the SSTIMER pin is slowly charged through an internal current source, and the charge time determines the rate at which the output transitions from a near zero duty cycle to the duty cycle that is present on the inputs. This allows for a smooth transition with no audible pop or click noises when the RESET pin transitions from high-to-low or low-to-high. For a high-to-low transition of the RESET pin (shutdown case), it is important for the modulator to remain switching for a period of at least 10 ms (if using a 2.2 nF capacitor). Larger capacitors will increase the start-up/shutdown time, while capacitors smaller than 2.2 nF will decrease the start-up/shutdown time. The inputs MUST remain switching on the shutdown transition to allow the outputs to slowly ramp down the duty cycle to near zero before completely shutting off. The SSTIMER pin should be left floating for BD modulation and also for SE (single-ended) mode. CLOCK, AUTODETECTION, AND PLL The TAS5705 DAP is a slave device. It accepts MCLK, SCLK, and LRCLK. The digital audio processor (DAP) supports all the sample rates and MCLK rates that are defined in the clock control register . The TAS5705 checks to verify that SCLK is a specific value of 32 fS, 48 fS, or 64 fS. The DAP only supports a 1 × fS LRCLK. The timing relationship of these clocks to SDIN1/2 is shown in subsequent sections. The clock section uses MCLK or the internal oscillator clock (when MCLK is unstable or absent) to produce the internal clock. The DAP can autodetect and set the internal clock-control logic to the appropriate settings for the frequencies of 32 kHz, normal speed (44.1 or 48 kHz), double speed (88.2 kHz or 96 kHz), and quad speed (176.4 kHz or 192 kHz). The automatic sample-rate detection can be disabled and the values set via I2C in the clock control register. The DAP also supports an AM interference-avoidance mode during which the clock rate is adjusted, in concert with the PWM sample rate converter, to produce a PWM output at 7 × fS, 8 × fS, or 6 × fS. The sample rate must be set manually during AM interference avoidance and when de-emphasis is enabled. SERIAL DATA INTERFACE Serial data is input on SDIN1/2. The PWM outputs are derived from SDIN1/2. The TAS5705 DAP accepts 32-, 44.1-, 48-, 88.2-, 96-, 176.4-, and 192-kHz serial data in 16-, 18-, 20-, or 24-bit data in left-justified, right-justified, and I2S serial data formats. PWM Section The TAS5705 DAP device uses noise-shaping and sophisticated error-correction algorithms to achieve high power efficiency and high-performance digital audio reproduction. The DAP uses a fourth-order noise shaper that has >100-dB SNR performance from 20 Hz to 20 kHz. The PWM section accepts 24-bit PCM data from the DAP and outputs four PWM audio output channels. The TAS5705 PWM SECTION supports bridge-tied loads. The PWM section has individual-channel dc-blocking filters that can be enabled and disabled. The filter cutoff frequency is less than 1 Hz. Individual-channel de-emphasis filters for 32-, 44.1-, and 48-kHz are included and can be enabled and disabled. Finally, the PWM section has an adjustable maximum modulation limit of 93.8% to 99.2%. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 23 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com I2C-COMPATIBLE SERIAL CONTROL INTERFACE The TAS5705 DAP has an I2C serial control slave interface to receive commands from a system controller. The serial control interface supports both normal-speed (100-kHz) and high-speed (400-kHz) operations without wait states. As an added feature, this interface operates even if MCLK is absent. The serial control interface supports both single-byte and multibyte read and write operations for status registers and the general control registers associated with the PWM. The I2C interface supports a special mode which permits I2C write operations to be broken up into multiple data-write operations that are multiples of 4 data bytes. These are 6-, 10-, 14-, 18-, ... etc., -byte write operations that are composed of a device address, read/write bit, subaddress, and any multiple of 4 bytes of data. This permits the system to write large register values incrementally without blocking other I2C transactions. 24 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 SDIN2 SDIN1 SDI 0x04 SDIN1L SDIN1R SDIN2L SDIN2R 6 4 3 2 1 0x20 R' Down Mix 0x21 L' SUB 2 BQ 7 BQ 7 BQ 0x21 (L'+R')/2 0x21 Bass Management RS LS RF LF 0x21 Vol6 0x0D Vol 4 0x0B Vol 3 0x0A Vol 2 0x09 Vol1 0x08 DRC2 drc2_ coeff Drc2_en drc1_ coeff Drc1_en Drc2_dis drc1_ coeff Drc1_en drc1_ coeff Drc1_en DRC1 drc1_ coeff Drc1_en Drc1_dis LF+ Noise Shaper AD/BD B T L PWM3 0x13 0x20 PWM2 0x12 PWM1 0x11 Sub+ B T L 0x20 Sub– B T L PWM6 0x16 PWM5 0x15 PWM4 0x14 0x20 RF– RF+ LF– 0x20 Noise Shaper AD Noise Shaper AD Noise Shaper AD/BD 0x20 Noise Shaper AD/BD 0x20 6 6 6 6 6 6 6 6 0x25 B0263-01 HPR HPL Sub+ Sub– Out_D Out_C Out_B Out_A TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 BQ (0x24) Loudness (0x23) Master Volume 0x07 Figure 27. TAS5705 DAP Data Flow Diagram With I2C Registers Submit Documentation Feedback 25 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com SERIAL INTERFACE CONTROL AND TIMING I2S Timing I2S timing uses LRCLK to define when the data being transmitted is for the left channel and when it is for the right channel. LRCLK is low for the left channel and high for the right channel. A bit clock running at 32, 48, or 64 × fS is used to clock in the data. There is a delay of one bit clock from the time the LRCLK signal changes state to the first bit of data on the data lines. The data is written MSB first and is valid on the rising edge of bit clock. The DAP masks unused trailing data-bit positions. 2 2-Channel I S (Philips Format) Stereo Input 32 Clks LRCLK (Note Reversed Phase) 32 Clks Right Channel Left Channel SCLK SCLK MSB 24-Bit Mode 23 22 LSB 9 8 5 4 5 4 1 0 1 0 1 0 MSB LSB 23 22 9 8 5 4 19 18 5 4 1 0 15 14 1 0 1 0 20-Bit Mode 19 18 16-Bit Mode 15 14 T0034-01 NOTE: All data presented in 2s-complement form with MSB first. Figure 28. I2S 64-fS Format 26 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 2 2-Channel I S (Philips Format) Stereo Input/Output (24-Bit Transfer Word Size) LRCLK 24 Clks 24 Clks Left Channel Right Channel SCLK SCLK MSB 24-Bit Mode 23 22 MSB LSB 17 16 9 8 5 4 13 12 5 4 1 0 9 1 0 3 2 1 0 LSB 23 22 17 16 9 8 5 4 19 18 13 12 5 4 1 0 15 14 9 1 0 3 2 1 20-Bit Mode 19 18 16-Bit Mode 15 14 8 8 T0092-01 NOTE: All data presented in 2s-complement form with MSB first. Figure 29. I2S 48-fS Format 2 2-Channel I S (Philips Format) Stereo Input LRCLK 16 Clks 16 Clks Left Channel Right Channel SCLK SCLK MSB 16-Bit Mode 15 14 13 12 MSB LSB 11 10 9 8 5 4 3 2 1 0 15 14 13 12 LSB 11 10 9 8 5 4 3 2 1 T0266-01 NOTE: All data presented in 2s-complement form with MSB first. Figure 30. I2S 32-fS Format Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 27 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com Left-Justified Left-justified (LJ) timing uses LRCLK to define when the data being transmitted is for the left channel and when it is for the right channel. LRCLK is high for the left channel and low for the right channel. A bit clock running at 32, 48, or 64 × fS is used to clock in the data. The first bit of data appears on the data lines at the same time LRCLK toggles. The data is written MSB first and is valid on the rising edge of the bit clock. The DAP masks unused trailing data-bit positions. 2-Channel Left-Justified Stereo Input 32 Clks 32 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 LSB 9 8 5 4 5 4 1 0 1 0 1 0 MSB LSB 23 22 9 8 5 4 19 18 5 4 1 0 15 14 1 0 1 0 20-Bit Mode 19 18 16-Bit Mode 15 14 T0034-02 NOTE: All data presented in 2s-complement form with MSB first. Figure 31. Left-Justified 64-fS Format 28 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 2-Channel Left-Justified Stereo Input (24-Bit Transfer Word Size) 24 Clks 24 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 21 LSB 17 16 9 8 5 4 13 12 5 4 1 0 9 1 0 1 0 MSB LSB 21 17 16 9 8 5 4 19 18 17 13 12 5 4 1 0 15 14 13 9 1 0 23 22 1 0 20-Bit Mode 19 18 17 16-Bit Mode 15 14 13 8 8 T0092-02 NOTE: All data presented in 2s-complement form with MSB first. Figure 32. Left-Justified 48-fS Format 2-Channel Left-Justified Stereo Input 16 Clks 16 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 16-Bit Mode 15 14 13 12 LSB 11 10 9 8 5 4 3 2 1 0 MSB 15 14 13 12 LSB 11 10 9 8 5 4 3 2 1 0 T0266-02 NOTE: All data presented in 2s-complement form with MSB first. Figure 33. Left-Justified 32-fS Format Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 29 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com Right-Justified Right-justified (RJ) timing uses LRCLK to define when the data being transmitted is for the left channel and when it is for the right channel. LRCLK is high for the left channel and low for the right channel. A bit clock running at 32, 48, or 64 × fS is used to clock in the data. The first bit of data appears on the data line 8 bit-clock periods (for 24-bit data) after LRCLK toggles. In RJ mode, the LSB of data is always clocked by the last bit clock before LRCLK transitions. The data is written MSB first and is valid on the rising edge of bit clock. The DAP masks unused leading data bit positions. 2-Channel Right-Justified (Sony Format) Stereo Input 32 Clks 32 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode LSB 23 22 19 18 15 14 1 0 19 18 15 14 1 0 15 14 1 0 MSB LSB 23 22 19 18 15 14 1 0 19 18 15 14 1 0 15 14 1 0 20-Bit Mode 16-Bit Mode T0034-03 Figure 34. Right-Justified 64-fS Format 30 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 2-Channel Right-Justified Stereo Input (24-Bit Transfer Word Size) 24 Clks 24 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 LSB 19 18 15 14 6 5 2 1 0 19 18 15 14 6 5 2 1 0 15 14 6 5 2 1 0 LSB MSB 23 22 19 18 15 14 6 5 2 1 0 19 18 15 14 6 5 2 1 0 15 14 6 5 2 1 0 20-Bit Mode 16-Bit Mode T0092-03 Figure 35. Right-Justified 48-fS Format 2-Channel Right-Justified Stereo Input (24-Bit Transfer Word Size) 24 Clks 24 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 LSB 19 18 15 14 6 5 2 1 0 19 18 15 14 6 5 2 1 0 15 14 6 5 2 1 0 LSB MSB 23 22 19 18 15 14 6 5 2 1 0 19 18 15 14 6 5 2 1 0 15 14 6 5 2 1 0 20-Bit Mode 16-Bit Mode T0092-03 Figure 36. Right-Justified 32-fS Format Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 31 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com I2C SERIAL CONTROL INTERFACE The TAS5705 DAP has a bidirectional I2C interface that is compatible with the I2C (Inter IC) bus protocol and supports both 100-kHz and 400-kHz data transfer rates for single- and multiple-byte write and read operations. This is a slave-only device that does not support a multimaster bus environment or wait-state insertion. The control interface is used to program the registers of the device and to read device status. The DAP supports standard-mode I2C bus operation (100 kHz maximum) and fast I2C bus operation (400 kHz maximum). The DAP performs all I2C operations without I2C wait cycles. General I2C Operation The I2C bus employs two signals, SDA (data) and SCL (clock), to communicate between integrated circuits in a system. Data is transferred on the bus serially, one bit at a time. The address and data can be transferred in byte (8-bit) format, with the most significant bit (MSB) transferred first. In addition, each byte transferred on the bus is acknowledged by the receiving device with an acknowledge bit. Each transfer operation begins with the master device driving a start condition on the bus and ends with the master device driving a stop condition on the bus. The bus uses transitions on the data terminal (SDA) while the clock is high to indicate start and stop conditions. A high-to-low transition on SDA indicates a start, and a low-to-high transition indicates a stop. Normal data-bit transitions must occur within the low time of the clock period. These conditions are shown in Figure 37. The master generates the 7-bit slave address and the read/write (R/W) bit to open communication with another device and then waits for an acknowledge condition. The TAS5705 holds SDA low during the acknowledge clock period to indicate an acknowledgment. When this occurs, the master transmits the next byte of the sequence. Each device is addressed by a unique 7-bit slave address plus R/W bit (1 byte). All compatible devices share the same signals via a bidirectional bus using a wired-AND connection. External pullup resistors must be used to set the high level for the SDA and SCL signals. SDA R/ A W 7-Bit Slave Address 7 6 5 4 3 2 1 0 8-Bit Register Address (N) 7 6 5 4 3 2 1 0 8-Bit Register Data For Address (N) A 7 6 5 4 3 2 1 8-Bit Register Data For Address (N) A 0 7 6 5 4 3 2 1 A 0 SCL Start Stop T0035-01 2 Figure 37. Typical I C Sequence There is no limit on the number of bytes that can be transmitted between start and stop conditions. When the last word transfers, the master generates a stop condition to release the bus. A generic data transfer sequence is shown in Figure 37. The 7-bit address for TAS5705 is 0011 011 (0x36). Single- and Multiple-Byte Transfers The serial control interface supports both single-byte and multiple-byte read/write operations for status registers and the general control registers associated with the PWM. However, for the DAP data processing registers, the serial control interface supports only multiple-byte (4-byte) read/write operations. During multiple-byte read operations, the DAP responds with data, a byte at a time, starting at the subaddress assigned, as long as the master device continues to respond with acknowledges. If a particular subaddress does not contain 32 bits, the unused bits are read as logic 0. During multiple-byte write operations, the DAP compares the number of bytes transmitted to the number of bytes that are required for each specific subaddress. If a write command is received for a biquad subaddress, the DAP expects to receive five 32-bit words. If fewer than five 32-bit data words have been received when a stop command (or another start command) is received, the data received is discarded. Similarly, if a write command is received for a mixer coefficient, the DAP expects to receive one 32-bit word. 32 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 Supplying a subaddress for each subaddress transaction is referred to as random I2C addressing. The TAS5705 also supports sequential I2C addressing. For write transactions, if a subaddress is issued followed by data for that subaddress and the 15 subaddresses that follow, a sequential I2C write transaction has taken place, and the data for all 16 subaddresses is successfully received by the TAS5705. For sequential I2C write transactions, the subaddress then serves as the start address, and the amount of data subsequently transmitted, before a stop or start is transmitted, determines how many subaddresses are written. As was true for random addressing, sequential addressing requires that a complete set of data be transmitted. If only a partial set of data is written to the last subaddress, the data for the last subaddress is discarded. However, all other data written is accepted; only the incomplete data is discarded. Single-Byte Write As shown in Figure 38, a single-byte data write transfer begins with the master device transmitting a start condition followed by the I2C device address and the read/write bit. The read/write bit determines the direction of the data transfer. For a write data transfer, the read/write bit is a 0. After receiving the correct I2C device address and the read/write bit, the DAP responds with an acknowledge bit. Next, the master transmits the address byte or bytes corresponding to the TAS5705 internal memory address being accessed. After receiving the address byte, the TAS5705 again responds with an acknowledge bit. Next, the master device transmits to the memory address being accessed the data byte to be written. After receiving the data byte, the TAS5705 again responds with an acknowledge bit. Finally, the master device transmits a stop condition to complete the single-byte data write transfer. Start Condition Acknowledge A6 A5 A4 A3 A2 A1 A0 Acknowledge R/W ACK A7 A6 A5 2 A4 A3 A2 A1 Acknowledge A0 ACK D7 D6 Subaddress I C Device Address and Read/Write Bit D5 D4 D3 D2 D1 D0 ACK Stop Condition Data Byte T0036-01 Figure 38. Single-Byte Write Transfer Multiple-Byte Write A multiple-byte data write transfer is identical to a single-byte data write transfer except that multiple data bytes are transmitted by the master device to the DAP as shown in Figure 39. After receiving each data byte, the TAS5705 responds with an acknowledge bit. Start Condition Acknowledge A6 A5 A1 A0 R/W ACK A7 A6 A5 2 A4 A3 Subaddress I C Device Address and Read/Write Bit A1 Acknowledge Acknowledge Acknowledge Acknowledge A0 ACK D7 D0 ACK D7 D0 ACK D7 D0 ACK First Data Byte Other Data Bytes Last Data Byte Stop Condition T0036-02 Figure 39. Multiple-Byte Write Transfer Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 33 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com Single-Byte Read As shown in Figure 40, a single-byte data-read transfer begins with the master device transmitting a start condition followed by the I2C device address and the read/write bit. For the data-read transfer, both a write followed by a read are actually done. Initially, a write is done to transfer the address byte or bytes of the internal memory address to be read. As a result, the read/write bit becomes a 0. After receiving the TAS5705 address and the read/write bit, TAS5705 responds with an acknowledge bit. In addition, after sending the internal memory address byte or bytes, the master device transmits another start condition followed by the TAS5705 address and the read/write bit again. This time the read/write bit becomes a 1, indicating a read transfer. After receiving the address and the read/write bit, the TAS5705 again responds with an acknowledge bit. Next, the TAS5705 transmits the data byte from the memory address being read. After receiving the data byte, the master device transmits a not-acknowledge followed by a stop condition to complete the single-byte data-read transfer. Repeat Start Condition Start Condition Acknowledge A6 A5 A1 A0 R/W ACK A7 Acknowledge A6 2 A5 A4 A0 ACK A6 A5 A1 A0 R/W ACK D7 D6 2 I C Device Address and Read/Write Bit Subaddress I C Device Address and Read/Write Bit Not Acknowledge Acknowledge D1 D0 ACK Stop Condition Data Byte T0036-03 Figure 40. Single-Byte Read Transfer Multiple-Byte Read A multiple-byte data-read transfer is identical to a single-byte data read transfer except that multiple data bytes are transmitted by the TAS5705 to the master device as shown in Figure 41. Except for the last data byte, the master device responds with an acknowledge bit after receiving each data byte. Repeat Start Condition Start Condition Acknowledge A6 2 A0 R/W ACK A7 I C Device Address and Read/Write Bit Acknowledge A6 A6 A0 ACK A5 Subaddress 2 Acknowledge Acknowledge Acknowledge Not Acknowledge A0 R/W ACK D7 D0 ACK D7 D0 ACK D7 D0 ACK I C Device Address and Read/Write Bit First Data Byte Other Data Bytes Last Data Byte Stop Condition T0036-04 Figure 41. Multiple-Byte Read Transfer 34 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 Dynamic Range Control (DRC) DRC-Compensated Output The DRC input/output diagram is shown in Figure 42. k 1:1 Transfer Function Implemented Transfer Function T DRC Input Level M0091-01 Figure 42. Dynamic Range Control The TAS5705 has single-threshold dynamic range compressors (one for all satellites and one for the subwoofer). There are two distinct DRC blocks. DRC1 controls the satellite channels. DRC2 controls the subwoofer channel. The DRC provides compression capabilities above the threshold region of audio signal levels. A programmable threshold level sets the boundaries of the two regions. The offset (boost or cut) can be defined by a programmable offset coefficient. The DRC implements the composite transfer function by computing a 3.23-format gain coefficient from each sample output of an RMS estimator. This gain coefficient is then applied to a mixer element, whose other input is the audio data channel. The mixer output is the DRC-adjusted audio data. The audio is the signal level following the volume control, as specified by the user. The estimates are then compared on a sample-by-sample basis, and the largest is used to compute the compression gain coefficient. The gain coefficient is then applied to the audio of the satellite group. The control parameters for the dynamic range controls are programmable via the I2C interface. The DRC control for each channel is performed by two control bits. The encoding is shown in Table 2. Table 2. DRC Control Inputs 0x46 Bit 1 0x46 Bit 0 Description X 0 Disable DRC1 X 1 Enable DRC1 0 X Disable DRC2 1 X Enable DRC2 The DRC scheme has a single threshold, offset, and slope (all programmable). There is one ganged DRC for the left/right channels and one DRC for the subwoofer channel. • • • Thresholds T1 and T2 define the thresholds for DRC1 and DRC2, respectively. Offsets O1 and O2 define the gain coefficients for DRC1 and DRC2, respectively. The magnitudes of slopes k1 and k2 define the degree of compression to be performed above the threshold for DRC1 and DRC2, respectively. The three sets of parameters are all defined in logarithmic space, and adhere to the following rules. • The maximum input sample into the DRC is referenced at 0 dB. All values below this maximum value then have negative values in logarithmic (dB) space. • Thresholds T1 and T2 define, in dB, the boundaries of the regions of the DRC, as referenced to the RMS value of the data into the DRC. 0-dB threshold settings reference the maximum-valued RMS input into the DRC, and negative-valued thresholds reference all other RMS input levels. Positive-valued thresholds have no physical meaning and are not allowed. In addition, zero-valued threshold settings are not allowed. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 35 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com The threshold settings must be programmed as 32-bit (9.23 format) numbers. Zero-valued and positive-valued threshold settings are not allowed, and cause unpredictable behavior if used. • • Offsets O1 and O2 define, in dB, the attenuation (cut) or gain (boost) applied by the DRC-derived gain coefficient at the threshold points T1 and T2, respectively. Positive offsets are defined as cuts, and thus boost or gain selections are negative numbers. Slopes k1 and k2 define the compression is to be performed within a given region, and the degree of compression to be applied. Slopes are programmed as 26-bit (3.23 format) numbers. DRC Implementation Figure 4.13.1-1 shows the three elements comprising the DRC: (1) an RMS estimator, (2) a compression coefficient computation engine, and (3) an attack/decay controller. • RMS Estimator—This DRC element derives an estimate of the rms value of the audio data stream into the DRC. For the DRC block shared by Ch1 though Ch4 , the individual channel estimates are computed. The outputs of the estimators are then compared, sample-by-sample, and the largest-valued sample is forwarded to the compression/expansion coefficient-computation engine. Two programmable parameters, ae and (1 – ae), set the effective time window over which the RMS estimate is made. For the DRC block shared by Ch1 though Ch4, the programmable parameters apply to both RMS estimators. The time window over which the RMS estimation is computed can be determined by 1 t window = fS ln (1 - ae ) • • Compression Coefficient Computation—This DRC element converts the output of the rms estimator to a logarithmic number, determines the region where the input resides, and then computes and outputs the appropriate coefficient to the attack/decay element. The programmable parameters, T1, T2, O1, O2, K1, and K2, define the compression regions for both DRCs implemented by this element. Attack/Decay Control—This DRC element controls the transition time of changes in the coefficient computed in the compression/expansion coefficient computation element. Four programmable parameters define the operation of this element. Parameters ad and (1 – ad) set the decay or release time constant to be used for signal amplitude boost (expansion). Parameters aa and (1 – aa) set the attack time constant to be used for signal amplitude cuts. The transition-time constants can be determined by 1 ta = fS ln (1 - aa ) ta = Audio Input CH 1 1 fS ln (1 - aa ) 32 RMS Voltage Estimator Audio Input CH 3 Audio Input CH 4 32 32 32 RMS Voltage Estimator RMS Voltage Estimator Comparator Compression/Offset Audio Input CH 2 Cut Attack/Decay Control K1 O1{ DRC-Derived Gain Coefficient Audio Out Volume td T1 ta Audio In RMS Voltage Estimator B0309-01 Figure 43. DRC Block Diagram 36 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 Threshold Parameter Computation For thresholds, Tdb = –6.0206 TINPUT = –6.0206 TSUB_ADDRESS_ENTRY If, for example, it is desired to set T1 = –64 dB, then the subaddress entry required to set T1 to –64 dB is -64 Τ1SUB_ADDRESS_ENTRY = = 10.63 -6.0206 T1 is entered as a 32-bit number in 9.23 format. Therefore, T1 = 10.63 = 0 1010.1010 0001 0100 0111 1010 111 = 0x0550 A3D7 in 9.23 format Slope Parameter Computation In developing the equations used to determine the subaddress input value required to realize a given compression or expansion within a given region of the DRC, the following convention has been adopted. DRC Transfer = Input Increase : Output Increase If the DRC realizes an output increase of n dB for every dB increase in the rms value of the audio into the DRC, a 1:n expansion is being performed. If the DRC realizes a 1-dB increase in output level for every n dB increase in the rms value of the audio into the DRC, an n:1 compression is being performed. For a 1:n expansion, the slope k can be found by k=n–1 For an n:1 compression, the slope k can be found by 1 k= -1 n (1) In compression (n:1), n is implied to be greater than 1. For compression, Equation 1 means –1 < k < 0 for n > 1. Thus k must always lie in the range k > –1. 1 1 Compression equation: k = - 4 = - 1 ® n = - ® -0.3333:1 compression n 3 With k = –4 then, the output decreases 3 dB for every 1-dB increase in the rms value of the audio into the DRC. As the input increases in signal amplitude, the output decreases in signal amplitude. DRC Offset Calculation The DRC offset is calculated by Goffset = 10(gd /20) 15.5 where gd = desired gain (in dB) and 15.5 is the the fixed antilog normalization factor. A value of gd = 0 indicates no offset. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 37 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com Energy Filter Compression Control Attack and Decay Filters a, w T, K, O aa, wa / ad, wd DRC1 0x3A 0x40, 0x41, 0x42 0x3B / 0x3C DRC2 0x3D 0x43, 0x44, 0x45 0x3E / 0x3F Audio Input DRC Coefficient Alpha Filter Structure S a w –1 Z NOTE: a=a w=1–a B0265-01 Figure 44. DRC Structure AM Tuner Interference Management Digital amplifiers produce AM interference by radio energy emissions near the digital amplifier switching rate and the harmonics of that switching rate. The digital amplifier emits an interference spectrum in the AM band that is centered on the second though sixth harmonics of the digital amplifier switching frequency. Because the digital amplifier switching rate is a multiple of the input data sample rate, the interference frequencies can be changed by changing the sample rate. Anatomy of a Receiver AM receivers are composed of six sections as shown in Figure The radio-frequency (RF) section has a variable tuner that preselects the frequencies to be received. The RF section provides only enough filtering to significantly attenuate signals that are significantly above or below the desired tuned frequency. The RF-section gain is controlled by the AGC to compensate for variations in the signal strength. The mixer, variable-frequency oscillator (VFO), and intermediate frequency (IF) sections perform the bulk of the receiver tuning. In home receivers, the variable oscillator is adjusted so that it is a constant 455 kHz higher than the desired tuned frequency. The output of the mixer consists of four frequencies, RF, VFO, RF + VFO and RF – VFO. These signals are then passed into the IF section, where sharp discriminating filters to accept only the constant 455-kHz (RF – VFO) signal. The resulting signal is amplified and then passed to the detector section, where it is transformed into an audio signal. 38 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 AGC Mixer RF IF Detector AUDIO VFO B0310-01 Figure 45. AM Receiver Architecture Radio-frequency interference at either the tuned frequency or the 455-kHz IF frequency adversely affects the AM radio reception. However, there is another frequency that this receiver architecture also receives. This is a signal at the VFO + tuned frequency (RF + 2 × IF). For example, to tune a receiver at 540 kHz, an oscillator of 995 kHz is used to produce a difference frequency of 455 kHz. However, the receiver can also receive a frequency at the oscillator frequency 995 kHz plus the IF frequency of 455 kHz (= 1450 kHz). This frequency is called the IF image frequency. This is because the 1450 – 955 produces a difference frequency of 455 kHz. It is the role of the RF section to provide sufficient selectivity to attenuate frequencies that are several hundred kHz from the tuned frequency. However, this is often a weakness of low-cost receivers. Therefore, the AM interference avoidance approach includes this frequency in its interference avoidance algorithms. AM Interference Avoidance As a result, during AM interference avoidance, a the system select a switching rate such that the radiated emissions avoid • The IF (455 kHz) • The tuned frequency • IF image frequency (tuned frequency + 2 × 455 kHz) During AM interference avoidance, the TAS5705 receives the sample rate (38, 44.1, or 48 kHz) and the tuned frequency (typically 540 kHz to 1840 kHz) from the system controller. The TAS5705 uses these two values to determine what switching rate to use. The TAS5705 has a sample-rate converter (SRC) that permits the PWM switching rate to be increased or decreased by a fractional amount. The SRC produces a PWM switching rate that is 6, 7, or 8 times the data sample rate. This is done by specifying the order in which the switching rates are tested. The TAS5705 provides four selectable sequences. The evaluation selects the first rate from the sequence and applies the three tests. If the switching rate is found to be GOOD in all three tests, then that rate is used. If that switching rate is found to be BAD in any of the tests, then the next rate in the sequence is taken for evaluation. The sequences are as follows: (see Register 0x22, bits 19–18) 1. 8 × sample rate, 7 × sample rate, 6 × sample rate 2. 8 × sample rate, 6 × sample rate, 7 × sample rate 3. 7 × sample rate, 8 × sample rate, 6 × sample rate 4. 7 × sample rate, 6 × sample rate, 8 × sample rate Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 39 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com AM Controls There are three controls for the AM section. • AM Mode Enable—This control enables and disables sample rate conversion for 38, 44.1 and 48 kHz. • AM Search Sequence—The sequence the device will search for switching frequency that avoids interference • AM Tuned Frequency—The AM tuned frequency is encoded as four binary-encoded decimal digits, held in two registers, representing the tuned frequency in kHz. The range of valid values is from 1999 kHz to 0500 KHz. When the TAS5705 receives a change to any of these inputs, it 1. Performs a fast (128-step) mute 2. Performs the requested AM interference avoidance operation (a) If requested, enables/disables the AM mode (b) If requested, selects the requested AM search sequence (c) Selects and sets the appropriate SRC rate 3. Performs a fast (128 step) unmute Loudness Function The TAS5705 provides a direct form I biquad for loudness on the subwoofer channel. The first biquad is contained in a gain-compensation circuit that maintains the overall system gain at 1 or less to prevent clipping at loud volume settings. This gain compensation is shown in Figure 46. 1 if Vol £ 1/G 0 if Vol ³ 1/G + 1/Scale 1 - Scale (Vol - 1/G) otherwise From Input Mux To Output Mux Loudness Biquad (0x23) Gain = G Volume Scale = 1/(1 - 1/G) Biquad (0x24) 0 if Vol £ 1/G 1 if Vol ³ 1/G + 1/Scale Scale (Vol - 1/G) otherwise B0273-01 Figure 46. Biquad Gain Control Structure Table 3. Loudness Table Example for Gain = 4, 1/G = 0.25, Scale = 1.33 Volume 0.125 0.25 0.375 0.5 0.625 0.75 0.875 1 1.125 1.25 1.375 1.5 1.625 1.75 1.875 2 Biquad path 1 1 0.833 0.666 0.5 0.333 0.166 0 0 0 0 0 0 0 0 0 Direct path 0 0 0.166 0.333 0.5 0.666 0.833 1 1 1 1 1 1 1 1 1 Total gain 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 40 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 The biquads are implemented in a direct form-I architecture. The direct form-I structure provides a separate delay element and mixer (gain coefficient) for each node in the biquad filter. The five 26-bit (3.23) coefficients for the biquad are programmable via the I2C interface. The following steps are invovled in using a loudness biquad with the volume comprensation feature: 1. Program the biquad with a loudness filter. 2. Program 0x26 (1/G) and 0x28 (scale). 3. Enable volume compensation in register 0x0E. b0 x(n) S b1 z a1 –1 z b2 z y(n) Magnitude Truncation –1 a2 –1 z –1 M0012-02 Figure 47. Biquad Filter Subchannel Preprocessing A subchannel has three input multiplexers that can select from the bass management output, the downmix output, or the channel-6 input multiplexer output. Register 0x21, bits (9:8) determine the submultiplexer selection, defined in Table 4. Table 4. Submultiplexer Selection Bits Submultiplexer 00 Pass through channel-6 input multiplexer output 01 Select bass management block output for submultiplexer 10 Select downmix ouput for submultiplexer Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 41 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com The Bass Management function is explained in Figure 48. Lf (Ch 1) Rf (Ch 2) Ls (Ch 3) Rs (Ch 4) Sub (Ch 6) A B C D F 10 dB Bass Management Output + Bass Management Output = BS_Out (linear) = Ch 6 = F ´ 3.121 + (A + B + C + D) BS_Out (log) = 20 ´ log (BS_Out) B0291-01 NOTE: Selection of A, B, C, D, or F is determined by the input multiplexer selection register (0x20). Figure 48. Bass Management Block Diagram Downmix is defined by I2C register 0x21, bits (3:0), as listed in Table 5. Table 5. Downmix Definitions Bits 3:0 Definition X0X0 L' = (0.000 × Ls + 0.000 × L) / 1.000 X0X1 L' = (0.000 × Ls + 1.000 × L) / 1.000 X1X0 L' = (1.000 × Ls + 0.000 × L) / 1.000 X1X1 L' = (0.707 × Ls + 1.000 × L) / 1.707 0X0X R' = (0.000 × Rs + 0.000 × R) / 1.000 0X1X R' = (0.000 × Rs + 1.000 × R) / 1.000 1X0X R' = (1.000 × Rs + 0.000 × R) / 1.000 1X1X R' = (0.707 × Rs + 1.000 × R) / 1.707 BANK SWITCHING The TAS5705 uses an approach called bank switching together with automatic sample-rate detection. All processing features that must be changed for different sample rates are stored internally in the TAS5705. The TAS5705 has three full banks storing information, one for 32 kHz, one for 44.1/48 kHz, and one for all other data rates. Combined with the clock-rate autodetection feature, bank switching allows the TAS5705 to detect automatically a change in the input sample rate and switch to the appropriate bank without any MCU intervention. The TAS5705 supports three banks of coefficients to be updated during the initialization. One bank is for 32 kHz, a second bank is for 44.1/48 kHz, and a third bank is for all other sample rates. An external controller updates the three banks (see the I2C register mapping table for bankable locations) during the initialization sequence. If the autobank switch is enabled (register 0x50, bits 2:0) , then the TAS5705 automatically swaps the coefficients for subsequent sample rate changes, avoiding the need for any external controller intervention for a sample rate change. 42 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 By default, bits 2:0 have the value 000; that means the bank switch is disabled. In that state, any update to locations 0x29–0x3F go into the DAP. A write to register 0x50 with bits 2:0 being 001, 010, or 011 brings the system into the coefficient-bank-update state update bank1, update bank2, or update bank3, respectively. Any subsequent write to locations 0x29–0x3F updates the coefficient banks stored outside the DAP. After updating all the three banks, the system controller should issue a write to register 0x50 with bits 2:0 being 100; this changes the system state to automatic bank update. In automatic bank update, the TAS5705 automatically swaps banks based on the sample rate. In the headphone mode, speaker equalization and DRC are disabled, and they are restored on returning to the speaker mode. Command sequences for initialization can be summarized as follows: 1. Enable factory trim for internal oscillator: Write to register 0x1B with a value 0x00. 2. Update coefficients: Coefficients can be loaded into DAP RAM using the manual bank mode. OR Use automatic bank mode. (a) Enable bank-1 mode: Write to register 0x50 with 0x01. Load the 32-kHz coefficients. TI ALE can generate coefficients. (b) Enable bank-2 mode: Write to register 0x50 with 0x02. Load the 48-kHz coefficients. (c) Enable bank-3 mode: Write to register 0x50 with 0x03. Load the other coefficients. (d) Enable automatic bank switching by writing to register 0x50 with 0x04. 3. Bring the system out of all-channel shutdown: Write 0 to bit 6 of register 0x05. 4. Issue master volume: Write to register 0x07 with the volume value (0 db = 0x30). Interchannel Delay (ICD) Settings Table 6. Recommended ICD Settings Mode Description BD 2 BTL channels, internal power stage only, BD mode A(L+) = –18 (0xB8) ICD1 C(R+) = 24 = (0x60) ICD2 B(L–) = –24 = (0xA0) ICD3 D(R–) = 18 = (0x48) ICD4 SM(S–) = –3 = SP(S+) = 3 = (0xF4) (0x0C) ICD5 ICD6 AD 2 internal BTL channels, 1 external BTL channel using PBTL TAS5102, AD mode A(L+) = –21 = (0xAC) C(R+) = 21 (0x54) B(L–) = –21 = (0xAC) D(R–) = 21 = (0x54) SM(S–) = 0 = (0x00) SP(S+) = 0 = (0x00) Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 43 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com I2C SERIAL CONTROL COMMAND CHARACTERISTICS The DAP has two groups of I2C commands. One set is commands that are designed specifically to be operated while audio is streaming and that have built-in mechanisms to prevent noise, clicks, and pops. The other set does not have this built-in protection. Commands that are designed to be adjusted while audio is streaming: • Master volume • Master mute • Individual channel volume • Individual channel mute Commands that are normally issued as part of initialization: • Serial data interface format • De-emphasis • Sample-rate conversion • Input multiplexer • Output multiplexer • Biquads • Down mix • Channel delay • Enable/disable dc blocking • Hard/soft unmute from clock error • Enable/disable headphone outputs Start-up sequence for correct device operation This sequence must be followed to ensure proper operation. 1. Hold ALL logic inputs low. Power up AVDD/DVDD and wait for the inputs to settle in the allowed range. 2. Drive PDN = 1, MUTE = 1, and drive other logic inputs to the desired state. 3. Provide a stable MCLK, LRCLK, and SCLK (clock errors must be avoided during the initialization sequence) . 4. After completing step 3, wait 100 μs, then drive RESET = 1, and wait 13.5 ms after RESET goes high. 5. Trim the internal oscillator (write 0x00 to register 0x1B). 6. Wait 50 ms while the part acquires lock. 7. Configure the DAP via I2C, e.g.: – Downmix control (0x21) – Biquads (0x23–0x24 and 0x29–0x38) – DRC parameters and controls (0x3A–0x46) – Bank select (0x50) NOTE: User may not issue any I2C reads or writes to the above registers after this step is complete. 8. Configure remaining I2C registers, e.g.: – Shutdown group – De-emphasis – Input multiplexers – Output multiplexers – Channel delays – DC blocking – Hard/soft unmute from clock error – Serial data interface format – Clock register (manual clock mode only) NOTE: The BKND_ERR register (0x1C) can only be written once with a value that is not reserved (00 and 01 are reserved values). 9. Exit all-channel shutdown (write 0 to bit 6 of register 0x05). 44 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 10. This completes the initialization sequence. From this step on, no further constraints are imposed on PDN, MUTE, and clocks. 11. During normal operation the user may do the following: (a) Write to the master or individual-channel volume registers. (b) Write to the soft-mute register. (c) Write to the clock and serial data interface format registers (in manual clock mode only). (d) Write to bit 6 of register 0x05 to enter/exit all-channel shutdown. No other bits of register 0x05 may be altered. After issuing the all-channel shutdown command, no further I2C transactions that address this device are allowed for a period of at least: 1 ms + 1.3 × (period specified in start/stop register 0x1A) . (e) PDN may be asserted (low) at any time. Once PDN is asserted, no I2C transactions that address this device may be issued until PDN has been deasserted and the part has returned to active mode. NOTE: When the device is in a powered down state (initiated via PDN), the part is not reset if RESET is asserted. NOTE: Once RESET is asserted, and as long as the part is in a reset state, the part does not power down if PDN is asserted. For powering the part down, a negative edge on PDN must be issued when RESET is high and the part is not in a reset state. NOTE: No registers besides those explicitly listed in Steps a.–d. should be altered during normal operation (i.e., after exiting all-channel shutdown). NOTE: No registers should be read during normal operation (i.e., after exiting all-channel shutdown) . 12. To reconfigure registers: (a) Return to all-channel shutdown (observe the shutdown wait time as specified in Step 11.d.). (b) Drive PDN = 1, and hold MUTE stable. (c) Provide a stable MCLK, LRCLK, and SCLK. (d) Repeat configuration starting from step (6). Table 7. Serial Control Interface Register Summary SUBADDRESS REGISTER NAME NO. OF BYTES (1) INITIALIZATION VALUE CONTENTS A u indicates unused bits. 0x00 Clock control register 1 Description shown in subsequent section 0x6C 0x01 Device ID register 1 Description shown in subsequent section 0x23 0x02 Error status register 1 Description shown in subsequent section 0x00 0x03 System control register 1 1 Description shown in subsequent section 0xA0 0x04 Serial data interface register 1 Description shown in subsequent section 0x05 0x05 System control register 2 1 Description shown in subsequent section 0x40 0x06 Soft mute register 1 Description shown in subsequent section 0x00 0x07 Master volume 1 Description shown in subsequent section 0xFF (mute) 0x08 Channel 1 vol 1 Description shown in subsequent section 0x30 (0 dB) 0x09 Channel 2 vol 1 Description shown in subsequent section 0x30 (0 dB) 0x0A Channel 3 vol 1 Description shown in subsequent section 0x30 (0 dB) 0x0B Channel 4 vol 1 Description shown in subsequent section 0x30 (0 dB) 0x0C HP volume 1 Description shown in subsequent section 0x30 (0 dB) 0x0D Channel 6 vol 1 Description shown in subsequent section 0x30 (0 dB) 0x0E Volume configuration register 1 Description shown in subsequent section 0x91 1 Reserved (2) 0x0F (1) (2) 0x10 Modulation limit register 1 Description shown in subsequent section 0x02 0x11 IC delay channel 1 1 Description shown in subsequent section 0xB8 Biquad definition is given in Figure 47 . Reserved registers should not be accessed. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 45 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com Table 7. Serial Control Interface Register Summary SUBADDRESS REGISTER NAME NO. OF BYTES CONTENTS INITIALIZATION VALUE IC delay channel 2 1 Description shown in subsequent section 0x60 0x13 IC delay channel 3 1 Description shown in subsequent section 0xA0 0x14 IC delay channel 4 1 Description shown in subsequent section 0x48 0x15 IC delay channel 5 1 Description shown in subsequent section 0xF4 0x16 IC delay channel 6 1 Description shown in subsequent section 0x0C 0x17 Offset register 1 Reserved 0x00 1 Reserved (2) 0x19 PWM shutdown group register 1 0x30 0x1A Start/stop period register 1 0x0A 0x1B Oscillator trim register 1 0x82 0x1C BKND_ERR register 1 0x1D–0x1F 0x02 Reserved (2) 0x20 Input Mux register 4 Description shown in subsequent section 0x0089 777A 0x21 Downmix input Mux register 4 Description shown in subsequent section 0x0000 4203 0x22 AM tuned frequency 4 Description shown in subsequent section 0x0000 0000 0x23 ch6_bq[2] (Loudness BQ) 20 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 0x24 ch6_bq[3] (post volume BQ) 0x25 PWM Mux register 0x26 1/G register 0x27 20 Description shown in subsequent section 0x0102 1345 4 u[31:26], x[25:0] 0x0080 0000 1 Reserved (3) 0x28 Scale register 4 u[31:26], x[25:0] 0x0080 0000 0x29 ch1_bq[0] 20 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 0x2A 0x2B 46 (continued) 0x12 0x18 (3) (1) ch1_bq[1] ch1_bq[2] 20 20 Reserved registers should not be accessed. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 Table 7. Serial Control Interface Register Summary SUBADDRESS 0x2C 0x2D 0x2E 0x2F 0x30 0x31 0x32 0x33 0x34 REGISTER NAME ch1_bq[3] ch1_bq[4] ch1_bq[5] ch1_bq[6] ch2_bq[0] ch2_bq[1] ch2_bq[2] ch2_bq[3] ch2_bq[4] NO. OF BYTES 20 20 20 20 20 20 20 20 20 CONTENTS (1) (continued) INITIALIZATION VALUE u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 47 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com Table 7. Serial Control Interface Register Summary SUBADDRESS 0x35 0x36 0x37 0x38 REGISTER NAME ch2_bq[5] ch2_bq[6] ch6_bq[0] ch6_bq[1] 0x39 0x3A DRC1 ae NO. OF BYTES 20 20 20 20 DRC1 aa DRC1 ad DRC2 ae DRC2 aa DRC2 ad 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 0x0000 0000 u[31:26], aa[25:0] 0x0080 0000 u[31:26], (1 – aa)[25:0] 0x0000 0000 u[31:26], ad[25:0] 0x0080 0000 u[31:26], (1 – ad)[25:0] 0x0000 0000 u[31:26], ae[25:0] 0x0080 0000 u[31:26], (1 – ae)[25:0] 0x0000 0000 u[31:26], aa[25:0] 0x0080 0000 u[31:26], (1 – aa)[25:0] 0x0000 0000 u[31:26], ad[25:0] 0x0080 0000 8 8 8 8 u[31:26], (1 – ad)[25:0] 0x0000 0000 0x40 DRC1-T 4 T1[31:0] 0xFDA2 1490 0x41 DRC1-K 4 u[31:26], k1[25:0] 0x0384 2109 0x42 DRC1-O 4 u[31:26], O1[25:0] 0x0008 4210 0x43 DRC2-T 4 T2[31:0] 0xFDA2 1490 0x44 DRC2-K 4 u[31:26], k2[25:0] 0x0384 2109 0x45 DRC2-O 4 u[31:26], O2[25:0] 0x0008 4210 0x46 DRC control 4 u[31:2], ch6_enable, ch1_5_enable 0x0000 0000 0x47–0x49 4 Reserved (4) 0x0000 0000 0x50 4 Bank update command register 0x0000 0000 0x51–0xFF 48 u[31:26], b2[25:0] u[31:26], (1 – ae)[25:0] 8 DRC2 (1 – ad) (4) 0x0000 0000 0x0080 0000 DRC2 (1 – aa) 0x3F 0x0080 0000 u[31:26], b1[25:0] u[31:26], ae[25:0] DRC 2 (1 – ae) 0x3E u[31:26], b0[25:0] 8 DRC1 (1 – ad) 0x3D INITIALIZATION VALUE Reserved (4) DRC1 (1 – aa) 0x3C (continued) 4 DRC1 (1 – ae) 0x3B CONTENTS (1) 4 Reserved (4) 0x0000 0000 Reserved registers should not be accessed. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 TAS5705 www.ti.com ................................................................................................................................................ SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 CLOCK CONTROL REGISTER (0x00) In the manual mode, the clock control register provides a way for the system microprocessor to update the data and clock rates based on the sample rate and associated clock frequencies. In the autodetect mode, the clocks are automatically determined by the TAS5705. In this case, the clock control register contains the autodetected FS and MCLK status as automatically detected (D7–D2). Bits D7–D5 select the sample rate. Bits D4–D2 select the MCLK frequency. Bit D0 is used in manual mode only. In this mode, when the clocks are updated a 1 must be written to D0 to inform the DAP that the written clocks are valid. Table 8. Clock Control Register (0x00) D7 D6 D5 D4 D3 D2 D1 D0 0 0 0 – – – – – fS = 32-kHz sample rate FUNCTION 0 0 1 – – – – – fS = 38-kHz sample rate 0 1 0 – – – – – fS = 44.1-kHz sample rate 0 1 1 – – – – – fS = 48-kHz sample rate 1 0 0 – – – – – fS = 88.2-kHz sample rate 1 0 1 – – – – – fS = 96-kHz sample rate 1 1 0 – – – – – fS = 176.4-kHz sample rate 1 1 1 – – – – – fS = 192-kHz sample rate – – – 0 0 0 – – MCLK frequency = 64 × fS – – – 0 0 1 – – MCLK frequency = 128 × fS – – – 0 1 0 – – MCLK frequency = 192 × fS – – – 0 1 1 – – MCLK frequency = 256 × fS – – – 1 0 0 – – MCLK frequency = 384 × fS – – – 1 0 1 – – MCLK frequency = 512 × fS – – – 1 1 X – – Reserved – – – – – – 0 – Bit clock (SCLK) frequency = 64 × fS or 32 × fS (selected in register 0x04) (5) (1) (2) (3) (1) (4) – – – – – – 1 – Bit clock (SCLK) frequency = 48 × fS – – – – – – – 0 Clock not valid (in manual mode only) – – – – 1 Clock valid (in manual mode only) (1) (2) (3) (4) (5) (1) (1) Default values are in bold. Rate not available for 32-, 44.1-, and 48-kHz data rates Rate not available for 32-kHz data rate Rate not available for 176.4-kHz and 192-kHz data rates Rate only available for 192-fS and 384-fS MCLK frequencies DEVICE ID REGISTER (0x01) The device ID register contains the ID code for the firmware revision. Table 9. Device ID Register (0x01) D7 D6 D5 D4 D3 D2 D1 D0 0 – – – – – – – Default – 0 1 0 0 0 1 1 Identification code (1) FUNCTION (1) Default values are in bold. Submit Documentation Feedback Copyright © 2008–2009, Texas Instruments Incorporated Product Folder Link(s): TAS5705 49 TAS5705 SLOS549A – JUNE 2008 – REVISED SEPTEMBER 2009 ................................................................................................................................................ www.ti.com ERROR STATUS REGISTER (0x02) Note that the error bits are sticky bits that are not cleared by the hardware. This means that the software must clear the register (write zeroes) and then read them to determine if there are any persistent errors. Table 10. Error Status Register (0x02) D7 D6 D5 D4 D3 D2 D1 D0 – 1 – – – – – – PLL autolock error – – 1 – – – – – SCLK error – – – 1 – – – – LRCLK error – – – – 1 – – – Frame slip 0 0 0 0 0 0 0 0 No errors (1) FUNCTION (1) Default values are in bold. SYSTEM CONTROL REGISTER 1 (0x03) System control register 1 has several functions: Bit D7: If 0, the dc-blocking filter for each channel is disabled. If 1, the dc-blocking filter (–3 dB cutoff
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