TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
ETHERNET TRANSCEIVERS
Check for Samples: TLK1211RCP
•
•
2
•
•
•
•
•
•
•
•
•
•
Advanced 0.25-μm CMOS Technology
No External Filter Capacitors Required
Comprehensive Suite of Built-In Testability
IEEE 1149.1 JTAG Support
2.5-V Supply Voltage for Lowest Power
Operation
3.3-V Tolerant on LVTTL Inputs
Hot Plug Protection
64-Pin VQFP With Thermally Enhanced
Package ( PowerPAD™)
CPRI Data Rate Compatible (614 Mbps,
1.22 Gbps)
Industrial Temperature Range
Supported: –40°C to 85°C
GNDPLL
VDD
TXP
TXN
VDDA
VDDA
GNDA
VDDA
JTRSTN
JTMS
RXP
VDDA
RXN
GNDA
•
•
0.6-Gbps to 1.3-Gbps Serializer/Deserializer
Low Power Consumption 150 mV, then LOS = 1 which is a valid input signal.
If the magnitude of RXP-RXN > 50 mV and < 150 mV, then LOS is undefined.
If the magnitude of RXP-RXN < 50 mV, then LOS = 0 which is a loss of signal.
Note: Above LOS conditions are specified only for Input Common Mode Voltage (RXP+RXN)/2 ≥
1.25V
(1)
P/D = Internal pulldown
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
3
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
Terminal Functions (continued)
TERMINAL
NAME
NO.
I/O
DESCRIPTION
RBCMODE
32
I
P/D (1)
Receive clock mode select. When RBCMODE and MODESEL are low, half-rate clocks are output
on RBC0 and RBC1. When MODESEL is low and RBCMODE is high, a full baud-rate clock is
output on RBC0 and RBC1 is held low. When MODESEL is high, RBCMODE is ignored and a full
baud-rate clock is output on RBC0 and RBC1 is held low.
RBC0
RBC1
31
30
O
Receive byte clock. RBC0 and RBC1 are recovered clocks used for synchronizing the 10-bit
output data on RD0–RD9. The operation of these clocks is dependent upon the receive clock
mode selected.
In the half-rate mode, the 10-bit output data words are valid on the rising edges of RBC0 and
RBC1. These clocks are adjusted to half-word boundaries in conjunction with synchronous
detect. The clocks are always expanded during data realignment and never slivered or truncated.
RBC0 registers bytes 1 and 3 of received data. RBC1 registers bytes 0 and 2 of received data.
In the normal rate mode, only RBC0 is valid and operates at 1/10th the serial data rate. Data is
aligned to the rising edge.
In the DDR mode, only RBC0 is valid and operates at 1/10th the serial data rate. Data is aligned
on both the rising and falling edges.
45, 44,
43, 41,
40, 39,
38, 36,
35, 34
O
Receive data. When in TBI mode (MODESEL = low), these outputs carry 10-bit parallel data
output from the transceiver to the protocol layer. The data is referenced to terminals RBC0 and
RBC1, depending on the receive clock mode selected. RD0 is the first bit received. When in the
DDR mode (MODESEL = high), only RD0–RD4 are valid. RD5–RD9 are held low. The 5-bit
parallel data is clocked out of the transceiver on the rising edge of RBC0.
REFCLK
22
I
Reference clock. REFCLK is an external input clock that synchronizes the receiver and
transmitter interface (60 MHz to 130 MHz). The transmitter uses this clock to register the input
data (TD0–TD9) for serialization. In the TBI mode that data is registered on the rising edge of
REFCLK.
In the DDR mode, the data is registered on both the rising and falling edges of REFCLK with the
most significant bits aligned on the rising edge of REFCLK.
RXP
RXN
54
52
PECL I
Differential input receive. RXP and RXN together are the differential serial input interface from a
copper or an optical I/F module.
SYNCEN
24
I
P/U (2)
Synchronous function enable. When SYNCEN is high, the internal synchronization function is
activated. When this function is activated, the transceiver detects the K28.5 comma character
(0011111 negative beginning disparity) in the serial data stream and realigns data on byte
boundaries if required. When SYNCEN is low, serial input data is unframed in RD0–RD9.
SYNC/PASS
47
O
Synchronous detect. The SYNC output is asserted high upon detection of the comma pattern in
the serial data path. SYNC pulses are output only when SYNCEN is activated (asserted high). In
PRBS test mode (PRBSEN = high), SYNC/PASS outputs the status of the PRBS test results
(high = pass).
2-4, 6-9,
11-13
I
Transmit data. When in the TBI mode (MODESEL = low) these inputs carry 10-bit parallel data
output from a protocol device to the transceiver for serialization and transmission. This 10-bit
parallel data is clocked into the transceiver on the rising edge of REFCLK and transmitted as a
serial stream with TD0 sent as the first bit.
When in the DDR mode (MODESEL = high) only TD0–TD4 are valid. The 5-bit parallel data is
clocked into the transceiver on the rising and falling edge of REFCLK and transmitted as a serial
stream with TD0 sent as the first bit.
62
61
PECL
O
Differential output transmit. TXP and TXN are differential serial outputs that interface to a copper
or an optical I/F module. TXP and TXN are put in a high-impedance state when LOOPEN is high
and are active when LOOPEN is low.
ENABLE
28
I
P/U (2)
When this terminal is low, the device is disabled for Iddq testing. RD0–RD9, RBCn, TXP, and
TXN are high impedance. The pullup and pulldown resistors on any input are disabled. When
ENABLE is high, the device operates normally.
JTDI
48
I
P/U (2)
Test data input. IEEE1149.1 (JTAG)
JTDO
27
O
Test data output. IEEE1149.1 (JTAG)
JTMS
55
I
P/U (2)
Test mode select. IEEE1149.1 (JTAG)
JTRSTN
56
I
P/U (2)
Reset signal. IEEE1149.1 (JTAG)
RD0–RD9
TD0–TD9
TXP
TXN
TEST
(2)
4
P/U = Internal pullup
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
Terminal Functions (continued)
TERMINAL
NAME
I/O
NO.
DESCRIPTION
LOOPEN
19
I
P/D (3)
Loop enable. When LOOPEN is high (active), the internal loop-back path is activated. The
transmitted serial data is directly routed to the inputs of the receiver. This provides a self-test
capability in conjunction with the protocol device. The TXP and TXN outputs are held in a
high-impedance state during the loop-back test. LOOPEN is held low during standard operational
state with external serial outputs and inputs active.
PRBSEN
16
I
P/D (3)
PRBS enable. When PRBSEN is high, the PRBS generation circuitry is enabled. The PRBS
verification circuit in the receive side is also enabled. A PRBS signal can be fed to the receive
inputs and checked for errors, that are reported by the SYNC/PASS terminal indicating low.
TCK
49
I
TESTEN
17
I
P/D (3)
Manufacturing test terminal
VDD
5, 10,
20, 23,
29, 37,
42, 50,
63
Supply
Digital logic power. Provides power for all digital circuitry and digital I/O buffers.
VDDA
53, 57,
59, 60
Supply
Analog power. VDDA provides power for the high-speed analog circuits, receiver, and transmitter
18
Supply
PLL power. Provides power for the PLL circuitry. This terminal requires additional filtering.
GND
1, 14,
21,25,
33, 46
Ground
Digital logic ground. Provides a ground for the logic circuits and digital I/O buffers.
GNDA
51, 58
Ground
Analog ground. GNDA provides a ground for the high-speed analog circuits RX and TX.
64
Ground
PLL ground. Provides a ground for the PLL circuitry.
Test clock. IEEE1149.1 (JTAG)
POWER
VDDPLL
GROUND
GNDPLL
(3)
P/D = Internal pulldown
DETAILED DESCRIPTION
Data Transmission
This device supports both the defined 10-bit interface (TBI) and a reduced 5-bit interface utilizing DDR clocking.
When MODESEL is low, the TBI mode is selected. When MODESEL is high, the DDR mode is selected.
In the TBI mode, the transmitter portion registers incoming 10-bit wide data words (8b/10b encoded data,
TD0–TD9) on the rising edge of REFCLK. The REFCLK is also used by the serializer, which multiplies the clock
by a factor of 10, providing a signal that is fed to the shift register. The 8b/10b encoded data is transmitted
sequentially bits 0 through 9 over the differential high-speed I/O channel.
In the DDR mode, the transmitter accepts 5-bit wide 8b/10b encoded data on pins TD0–TD4. In this mode, data
is aligned to both the rising and falling edges of REFCLK. The data is then formed into a 10-bit wide word and
sent to the serializer. The rising edge REFCLK clocks in bits 0–4, and the falling edge of REFCLK clocks in bits
5–9. Bit 0 is the first bit transmitted.
Transmission Latency
Data transmission latency is defined as the delay from the initial 10-bit word load to the serial transmission of bit
9. The minimum latency in TBI mode is 20 bit times. The maximum latency in TBI mode is 22 bit times. The
minimum latency in DDR mode is 30 bit times, and maximum latency in DDR mode is 32 bit times.
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
5
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
Measured 10-Bits
TXP, TXN
Next 10-Bit Code
b7 b8 b9 b0 b1 b2 b3
td(Tx latency)
10-Bit Code
TD(0−9)
REFCLK
Figure 1. Transmitter Latency Full Rate Mode
Data Reception
The receiver portion deserializes the differential serial data. The serial data is retimed based on an interpolated
clock generated from the reference clock. The serial data is then aligned to the 10-bit word boundaries and
presented to the protocol controller along with receive byte clocks (RBC0 and RBC1).
Receiver Clock Select Mode
There are two modes of operation for the parallel bus: 1) the 10-bit (TBI) mode and 2) 5-bit (DDR) mode. When
in TBI mode, there are two user-selectable clock modes that are controlled by the RBCMODE terminal: 1)
full-rate clock on RBC0 and 2) half-rate clocks on RBC0 and RBC1. When in the DDR mode, only a full-rate
clock is available on RBC0; see Table 2.
Table 2. Mode Selection
RECEIVE BYTE
CLOCK
MODESEL
RBCMODE
MODE
0
0
TBI half-rate
30–65 MHz
0
1
TBI full-rate
60–130 MHz
1
0
DDR
60–130 MHz
1
1
DDR
60–130 MHz
In the half-rate mode, two receive byte clocks (RBC0 and RBC1) are 180 degrees out of phase and operate at
one-half the data rate. The clocks are generated by dividing down the recovered clock. The received data is
output with respect to the two receive byte clocks (RBC0 and RBC1) allowing a protocol device to clock the
parallel bytes using the RBC0 and RBC1 rising edges. The outputs to the protocol device, byte 0 of the received
data is valid on the rising edge of RBC1. See the timing diagram shown in Figure 2.
td(S)
RBC0
td(S)
RBC1
td(H)
SYNC
td(H)
RD(0-9)
K28.5
DXX.X
DXX.X
DXX.X
K28.5
DXX.X
Figure 2. Synchronous Timing Characteristics Waveforms (TBI Half-Rate Mode)
In the normal-rate mode, only RBC0 is used and operates at full data rate (that is, 1.25-Gbps data rate produces
a 125-MHz clock). The received data is output with respect to the rising edge of RBC0. RBC1 is low in this
mode. See the timing diagram shown in Figure 3.
6
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
RBC0
td(S)
td(H)
SYNC
RD(0-9)
K28.5
DXX.X
DXX.X
DXX.X
K28.5
DXX.X
Figure 3. Synchronous Timing Characteristics Waveforms (TBI Full-Rate Mode)
In the double data rate mode, the receiver presents the data on both the rising and falling edges of RBC0. RBC1
is low impedance. The data is clocked bit 0 first, and aligned to the rising edge of RBC0. See the timing diagram
shown in Figure 4.
td(S)
RBC0
td(S)
td(H)
td(H)
SYNC
RD(0-4)
K28.5
K28.5
DXX.X
DXX.X
DXX.X
DXX.X
DXX.X
DXX.X
K28.5
K28.5
DXX.X
Bits 0-4 Bits 5-9
Figure 4. Synchronous Timing Characteristics Waveforms (DDR Mode)
The receiver clock interpolator can lock to the incoming data without the need for a lock-to-reference preset. The
received serial data rate (RXP and RXN) is at the same baud rate as the transmitted data stream, ±0.02% (200
PPM) for proper operation (see the recommended operating tables).
Receiver Word Alignment
This device uses the IEEE 802.3 gigabit ethernet defined 10-bit K28.5 character (comma character) word
alignment scheme. The following sections explain how this scheme works and how it realigns itself.
Comma Character on Expected Boundary
This device provides 10-bit K28.5 character recognition and word alignment. The 10-bit word alignment is
enabled by forcing the SYNCEN terminal high. This enables the function that examines and compares serial
input data to the 7-bit synchronization pattern. The K28.5 character is defined by 8-bit/10-bit coding scheme as a
pattern consisting of 0011111010 (a negative number beginning with disparity) with the 7 MSBs (0011111),
referred to as the comma character. The K28.5 character was implemented specifically for aligning data words.
As long as the K28.5 character falls within the expected 10-bit boundary, the received 10-bit data is properly
aligned and data realignment is not required. Figure 2 shows the timing characteristics of RBC0, RBC1, SYNC,
and RD0–RD9 while synchronized. (Note: the K28.5 character is valid on the rising edge of RBC1.)
Comma Character Not on Expected Boundary
If synchronization is enabled and a K28.5 character straddles the expected 10-bit word boundary, then word
realignment is necessary. Realignment or shifting the 10-bit word boundary truncates the character following the
misaligned K28.5, but the following K28.5 and all subsequent data is aligned properly as shown in Figure 5. The
RBC0 and RBC1 pulse widths are stretched or stalled in their current state during realignment. With this design,
the maximum stretch that occurs is 20 bit times. This occurs during a worst case scenario when the K28.5 is
aligned to the falling edge of RBC1 instead of the rising edge. Figure 5 shows the timing characteristics of the
data realignment.
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
7
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
31 Bit
Times
Max Receive
Path Latency
INPUT DATA
K28.5
DXX.X
www.ti.com
30 Bit
Times (Max)
K28.5
DXX.X
DXX.X
DXX.X
DXX.X
K28.5
RBC0
RBC1
Worst Case
Misaligned K28.5
RD(0-9)
DXX.X
DXX.X
Corrupt Data
K28.5
DXX.X
DXX.X
Misalignment Corrected
K28.5
DXX.X
DXX.X
DXX.X
K28.5
SYNC
Figure 5. Word Realignment Timing Characteristics Waveforms
Systems that do not require framed data may disable byte alignment by tying SYNCEN low.
When a SYNC character is detected, the SYNC signal is brought high and is aligned with the K28.5 character.
The duration of the SYNC pulse is equal to the duration of the data when in TBI mode. When in DDR mode the
SYNC pulse is present for the entire RBC0 period.
Data Reception Latency
The serial-to-parallel data latency is the time from when the first bit arrives at the receiver until it is output in the
aligned parallel word with RD0 received as first bit. The minimum latency in TBI mode is 18 bit times, and the
maximum latency is 24 bit times. The minimum latency in DDR mode is 17 bit times and maximum latency is 23
bit times.
10-Bit Code
RXP, RXN
b0 b1 b2 b3 b4 b5 b6 b7 b8 b9
td(Rx latency)
RD(0−9)
10-Bit Code
RBC0
Figure 6. Receiver Latency - TBI Normal Mode Shown
Loss of Signal Detection
This device has a loss-of-signal (LOS) detection circuit for conditions where the incoming signal no longer has
sufficient voltage level to keep the clock recovery circuit in lock. The LOS is intended to be an indication of gross
signal error conditions, such as a detached cable or no signal being transmitted, and not an indication of signal
coding health. Under a PRBS serial input pattern, LOS is high for signal amplitudes greater than 150 mV. The
LOS is low for all amplitudes below 50 mV. Between 50 mV and 150 mV, LOS is undetermined.
8
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
Testability
The loopback function provides for at-speed testing of the transmit/receive portions of the circuitry. The enable
function allows for all circuitry to be disabled so that an Iddq test can be performed. The PRBS function also
allows for a BIST (built-in self test). The terminal setting, TESTEN high, enables the test mode. The terminal
TESTEN has an internal pulldown resistor, so it defaults to normal operation. The TESTEN is only used for
factory testing, and is not intended for end-user control.
Loopback Testing
The transceiver can provide a self-test function by enabling (setting LOOPEN to high level) the internal loopback
path. Enabling this function causes serial transmitted data to be routed internally to the receiver. The parallel
data output can be compared to the parallel input data for functional verification. The external differential output
is held in a high-impedance state during the loopback testing.
Enable Function
When held low, ENABLE disables all quiescent power in both the analog and digital circuitry. This allows an
ultralow-power idle state when the link is not active.
PRBS Function
This device has a built-in 27–1 PRBS function. When the PRBSEN control bit is set high, the PRBS test is
enabled. A PRBS is generated and fed into the 10-bit parallel transmitter input bus. Data from the normal parallel
input source is ignored during PRBS test mode. The PRBS pattern is then fed through the transmit circuitry as if
it were normal data and sent out to the transmitter. The output can be sent to a bit error rate tester (BERT) or to
the receiver of another TLK1211RCP. Since the PRBS is not really random and is really a predetermined
sequence of 1s and 0s, the data can be captured and checked for errors by a BERT. This device also has a
built-in BERT function on the receiver side that is enabled by PRBSEN. It can receive a PRBS pattern and check
for errors, and then reports the errors by forcing the SYNC/PASS terminal low. When PRBS is enabled,
RBCMODE is ignored. MODESEL must be low for the PRBS verifier to function correctly. The PRBS testing
supports two modes (normal and latched), which are controlled by the SYNCEN input. When SYNCEN is low,
the result of the PRBS bit error rate test is passed to the SYNC/PASS terminal. When SYNCEN is high the result
of the PRBS verification is latched on the SYNC/PASS output (that is, a single failure forces SYNC/PASS to
remain low).
JTAG
The TLK1211 supports an IEEE1149.1 JTAG function while maintaining compatibility with the industry standard
64 pin QFP package footprint. In this way, the TLK1211 installed on a board layout that was designed for the
industry standard footprint such as for the TNETE2201B. (Provided the supply voltage can be programmed from
the older 3.3 V to 2.5 V.) The JTAG pins on the TLK1211 are chosen to either be on the ‘vender-unique’ pins of
the industry standard footprint, or are on pins that were previously power or ground. The TRSTN pin has been
placed on pin 56, which is a ground on the industry standard footprint. In this way, a TLK1211 installed onto the
older footprint has the JTAG tap controller held in reset, and thus disabled. If the JTAG function is desired, then
the 5 JTAG pins TRSTN, TMS, TCK, TDI, and TDO can be used in the usual manner for a JTAG function. If the
JTAG function is not desired, then connecting TRSTN to ground is recommended. TMS and TDI have internal
pullup resistors, and can thus be left unconnected if not used. TDO is an output and should be left unconnected
if JTAG is not used. TCK does not have an internal pullup, and can be tied to GND or PWR if not used, but with
TRSTN low, this input is not used, and thus can be left unconnected.
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
9
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
ABSOLUTE MAXIMUM RATINGS (1)
over operating free-air temperature range (unless otherwise noted)
TLK1211RCP
Supply voltage, VDD (see
(2)
–0.3 V to 3 V
)
–0.5 V to 4 V
Input voltage range at TTL terminals, VI
–0.3 V to VDD +0.3 V
Input voltage range at any other terminal
–65°C to 150°C
Storage temperature, Tstg
Electrostatic discharge
CDM: 1 kV, HBM:4 kV
Characterized free-air operating temperature range
(1)
(2)
–40°C to 85°C
TLK1211RCP
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
DISSIPATION RATING TABLE
(1)
(2)
(3)
(4)
PACKAGE
TA ≤25°C
POWER RATING
OPERATING FACTOR (1)
ABOVE TA = 25°C
TA = 70°C
POWER RATING
RCP64 (2)
5.25 W
46.58 mW/°C
2.89 W
RCP64 (3)
3.17 W
23.70 mW/°C
1.74 W
RCP64 (4)
2.01 W
13.19 mW/°C
1.11 W
This is the inverse of the traditional junction-to-ambient thermal resistance (RθJA).
2 oz. Trace and copper pad with solder
2 oz. Trace and copper pad without solder
Standard JEDEC high-K board
Table 3. Thermal Characteristics
PARAMETER
TEST CONDITION
MIN
Board-mounted, no air flow, high conductivity TI
recommended test board, chip soldered or greased to
thermal land
RθJA
Junction-to-free-air thermal
resistance
Board-mounted, no air flow, high conductivity TI
recommended test board with thermal land but no solder or
grease thermal connection to thermal land
Board-mounted, no air flow, JEDEC test board
RθJC
Junction-to-case-thermal
resistance
UNIT
°C/W
42.2
75.83
0.38
Board-mounted, no air flow, high conductivity TI
recommended test board with thermal land but no solder or
grease thermal connection to thermal land
0.38
Submit Documentation Feedback
MAX
21.47
Board-mounted, no air flow, high conductivity TI
recommended test board, chip soldered or greased to
thermal land
Board-mounted, no air flow, JEDEC test board
10
TYP
°C/W
7.8
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
RECOMMENDED OPERATING CONDITIONS
Supply voltage, VDD, VDD(A)
MIN
NOM
MAX
2.3
2.5
2.7
UNIT
V
Total supply current, IDD, IDD(A)
Frequency = 1.25 Gbps, PRBS pattern
95
113
mA
Total power dissipation, PD
Frequency = 1.25 Gbps, PRBS pattern
238
305
mW
Total shutdown current, IDD, IDD(A)
Enable = 0, VDD(A), VDD = 2.7 V
1
mA
Startup lock time, PLL
VDD, VDD(A) = 2.5 V, EN↑ to PLL acquire
Operating free-air temperature, TA
TLK1211RCP
-40
500
μs
85
°C
REFERENCE CLOCK (REFCLK) TIMING REQUIREMENTS
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
Frequency
Minimum data rate
Frequency
Maximum data rate
TLK1211RCP
MIN
TYP
MAX
TYP–0.01%
60
TYP+0.01%
TYP–0.01%
130
TYP+0.01%
50%
60%
Accuracy
100
Duty cycle
40%
Jitter
100
Random plus deterministic
40
UNIT
MHz
ppm
ps
TTL ELECTRICAL CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VOH
High-level output voltage
IOH= –400 μA
VOL
Low-level output voltage
IOL= 1 mA
VIH
High-level input voltage
VIL
Low-level input voltage
IIH
High-level Input current
VDD= 2.3 V, VIN = 2 V
IIL
Low-level Input current
VDD= 2.3 V, VIN = 0.4 V
CIN
Input capacitance
MIN
TYP
VDD–0.2
2.3
GND
0.25
1.7
MAX
V
0.5
V
3.6
V
0.8
V
40
μA
–40
μA
4
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
UNIT
pF
11
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
TRANSMITTER/RECEIVER CHARACTERISTICS
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT (1)
VOD
VOD = |TxD-TxN|
Rt = 50Ω
600
800
1100
mV
V(cm)
Transmit common mode voltage range
Rt = 50Ω
1000
1250
1400
mV
1600
mV
2250
mV
350
μA
Receiver input voltage requirement,
VID = |RxP - RxN|
200
Receiver common mode voltage range, (RxP
+ RxN)/2
1000
Ilkg(R)
Receiver input leakage current
-350
CI
Receiver input capacitance
t(TJ)
1250
2
Serial data total jitter (peak-to-peak)
pF
Differential output jitter, Random +
deterministic, PRBS pattern,
Rω = 125 MHz
0.24
UI
Differential output jitter, Random +
deterministic, PRBS pattern,
Rω = 106.25 MHz
0.2
UI
0.10
UI
250
ps
t(DJ)
Serial data deterministic jitter (peak-to-peak)
Differential output jitter, PRBS pattern,
Rω = 125 MHz
tr, tf
Differential signal rise, fall time (20% to 80%)
RL = 50 Ω, CL = 5 pF, See Figure 8
and Figure 7
100
Differential input jitter, Random +
deterministic, Rω = 125 MHz
0.25
UI
Differential input jitter, Random + .4 UI
deterministic, Rω = 61.44MHz
0.34
UI
Serial data jitter tolerance minimum required
eye opening, (per IEEE-802.3 specification at
1.25Gbps and per CPRI 2.0 specification at
614.4Mbps)
Receiver data acquisition lock time from
powerup
Data re-lock time from application of valid
input data stream
td(Tx
latency)
Tx latency
TBI modes
500
μs
.75 UI jitter closure with random data
@ 1.25 Gbps
256
ns
.20 UI jitter closure with 01010.. data
@ 1.25Gbps
128
ns
See Figure 1
DDR mode
TBI modes
See Figure 6
DDR mode
td(Rx latency)
(1)
Rx latency
20
22
30
32
18
24
17
23
TBI mode
600–620 Mbps
18
21
DDR mode
600–620 Mbps
17
22
TBI mode
1228.8 Mbps
19
23
DDR mode
1228.8 Mbps
18
23
UI
UI
UI = serial bit time
80%
50%
20%
TX+
∼V
tf
tr
80%
50%
20%
TX−
tf
∼V
∼V
tr
∼ 1V
80%
VOD
∼V
20%
0V
∼ −1V
Figure 7. Differential and Common-Mode Output Voltage Definitions
12
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
CL
5 pF
50 Ω
50 Ω
CL
5 pF
Figure 8. Transmitter Test Setup
LVTTL OUTPUT SWITCHING CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
Clock rise time
tf(RBC)
Clock fall time
tr
Data rise time
tf
Data fall time
tsu(D1)
Data setup time (RD0–RD9), Data
valid prior to RBC0 rising
TBI normal mode, (see Figure 3)
2.5
ns
th(D1)
Data hold time (RD0–RD9), Data valid
after RBC0 rising
TBI normal mode, (see Figure 3)
2
ns
tsu(D2)
Data setup time (RD0–RD4)
DDR mode, Rω = 125 MHz, (see Figure 4)
2
ns
th(D2)
Data hold time (RD0–RD4)
DDR mode, Rω = 125 MHz, (see Figure 4)
0.8
ns
tsu(D3)
Data setup time (RD0–RD9)
TBI half-rate mode, Rω = 125 MHz, (see Figure 2)
2.5
ns
th(D3)
Data hold time (RD0–RD9)
TBI half-rate mode, Rω = 125 MHz, (see Figure 2)
1.5
ns
80% to 20% output voltage, C = 5 pF (see
Figure 9)
0.3
1.5
0.3
1.5
0.3
1.5
0.3
1.5
UNIT
tr(RBC)
ns
ns
1.4 V
CLOCK
tf
tr
80%
50%
20%
DATA
2V
0.8 V
tf
tr
Figure 9. TTL Data I/O Valid Levels for AC Measurement
TRANSMITTER TIMING REQUIREMENTS
over recommended operating conditions (unless otherwise noted)
PARAMETER
tsu(D4)
Data setup time (TD0–TD9)
th(D4)
Data hold time (TD0–TD9)
tsu(D5)
Data setup time (TD0–TD9)
th(D5)
Data hold time (TD0–TD9)
tr, tf
TD[0,9] data rise and fall time
TEST CONDITIONS
TBI modes
DDR modes
See Figure 9
MIN
TYP
MAX
1.6
ns
0.8
0.7
ns
0.5
2
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
UNIT
ns
13
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
APPLICATION INFORMATION
8B/10B TRANSMISSION CODE
The PCS maps GMII signals into 10-bit code groups and vice versa, using an 8b/10b block coding scheme. The
PCS uses the transmission code to improve the transmission characteristics of information to be transferred
across the link. The encoding defined by the transmission code ensures that sufficient transitions are present in
the PHY bit stream to make clock recovery possible in the receiver. Such encoding also greatly increases the
likelihood of detecting any single or multiple bit errors that may occur during transmission and reception of
information. The 8b/10b transmission code specified for use has a high-transition density, is run length limited,
and is dc-balanced. The transition density of the 8b/10b symbols range from 3 to 8 transitions per symbol. The
definition of the 8b/10b transmission code is specified in IEEE 802.3 gigabit ethernet and ANSI X3.230-1994
(FC-PH), clause 11.
The 8b/10b transmission code uses letter notation describing the bits of an unencoded information octet. The bit
notation of A,B,C,D,E,F,G,H for an unencoded information octet is used in the description of the 8b/10b
transmission code-groups, where A is the LSB. Each valid code group has been given a name using the
following convention: /Dx.y/ for the 256 valid data code-groups and /Kx.y/ for the special control code-groups,
where y is the decimal value of bits EDCBA and x is the decimal value of bits HGF (noted as K).
Thus, an octet value of FE representing a code-group value of K30.7 would be represented in bit notation as 111
11110.
VDD
TXP
5 kΩ
RXP
ZO
7.5 kΩ
ZO
GND
+
_
VDD
ZO
5 kΩ
ZO
TXN
RXN
7.5 kΩ
GND
Transmitter
Media
Receiver
Figure 10. High-Speed I/O Directly-Coupled Mode
VDD
TXP
5 kΩ
RXP
ZO
7.5 kΩ
ZO
GND
+
_
VDD
ZO
5 kΩ
TXN
ZO
RXN
7.5 kΩ
GND
Transmitter
Media
Receiver
Figure 11. High-Speed I/O AC-Coupled Mode
14
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
5 Ω at 100 MHz
2.5 V
2.5 V
18
VDD VDDA
0.01 µF
VDDPLL
GND
GNDPLL
64
GNDA
TLK1211
17
TESTEN
10
TD0-TD9
22
16
TXP
62
Controlled Impedance
Transmission Line
61
Controlled Impedance
Transmission Line
54
Controlled Impedance
Transmission Line
REFCLK
PRBSEN
19
LOOPEN
24
Host
Protocol
Device
47
10
SYNCEN
TXN
SYNC/PASS
RD0-RD9
2
RBC0-RBC1
28
26
ENABLE
RXP
LOS
32
Rt
50 Ω
Rt
50 Ω
RBCMODE
15
MODESEL
49
55
48
JTAG
Controller
56
27
TCK
JTMS
RXN
52
Controlled Impedance
Transmission Line
JTDI
JTRSTN
JTDO
Figure 12. Typical Application Circuit (AC mode)
DESIGNING WITH PowerPAD
The TLK1211RCP is housed in a high-performance, thermally enhanced, 64-pin VQFP (RCP64) PowerPAD
package. Use of the PowerPAD package does not require any special considerations except to note that the
PowerPAD, which is an exposed die pad on the bottom of the device, is a metallic thermal and electrical
conductor. Therefore, if not implementing PowerPAD PCB features, the use of solder masks (or other assembly
techniques) may be required to prevent any inadvertent shorting by the exposed PowerPAD of connection etches
or vias under the package. It is strongly recommended that the PowerPAD be soldered to the thermal land. The
recommended convention, however, is to not run any etches or signal vias under the device, but to have only a
grounded thermal land as explained below. Although the actual size of the exposed die pad may vary, the
minimum size required for the keepout area for the 64-pin PFP PowerPAD package is 8 mm × 8 mm.
It is recommended that there be a thermal land, which is an area of solder-tinned-copper, underneath the
PowerPAD package. The thermal land varies in size depending on the PowerPAD package being used, the PCB
construction, and the amount of heat that needs to be removed. In addition, the thermal land may or may not
contain numerous thermal vias depending on PCB construction.
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
15
TLK1211RCP
SLLS658D – SEPTEMBER 2006 – REVISED APRIL 2011
www.ti.com
Other requirements for thermal lands and thermal vias are detailed in the TI application note PowerPAD
Thermally Enhanced Package Application Report, TI literature number SLMA002, available via the TI Web pages
beginning at URL: http://www.ti.com.
Figure 13. Example of a Thermal Land
For the TLK1211RCP, this thermal land must be grounded to the low-impedance ground plane of the device.
This improves not only thermal performance but also the electrical grounding of the device. It is also
recommended that the device ground terminal landing pads be connected directly to the grounded thermal land.
The land size must be as large as possible without shorting device signal terminals. The thermal land may be
soldered to the exposed PowerPAD using standard reflow soldering techniques.
While the thermal land may be electrically floated and configured to remove heat to an external heat sink, it is
recommended that the thermal land be connected to the low-impedance ground plane for the device. More
information may be obtained from the TI application note PHY Layout, TI literature number SLLA020.
16
Submit Documentation Feedback
Copyright © 2006–2011, Texas Instruments Incorporated
Product Folder Link(s): TLK1211RCP
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
(3)
Device Marking
(4/5)
(6)
TLK1211RCP
ACTIVE
HVQFP
RCP
64
160
RoHS & Green
NIPDAU
Level-3-260C-168 HR
-40 to 85
TLK1211RCP
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of
工商网监
湘ICP备2023018690号
