TLV9001, TLV9002, TLV9004
SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
TLV900x Low-Power, RRIO, 1-MHz Operational Amplifier for Cost-Sensitive Systems
1 Features
•
•
•
•
•
•
•
•
•
•
•
•
Scalable CMOS amplifier for low-cost applications
Rail-to-rail input and output
Low input offset voltage: ±0.4 mV
Unity-gain bandwidth: 1 MHz
Low broadband noise: 27 nV/√Hz
Low input bias current: 5 pA
Low quiescent current: 60 µA/Ch
Unity-gain stable
Internal RFI and EMI filter
Operational at supply voltages as low as 1.8 V
Easier to stabilize with higher capacitive load due
to resistive open-loop output impedance
Extended temperature range: –40°C to 125°C
The TLV900x devices include a shutdown mode
(TLV9001S, TLV9002S, and TLV9004S) that allow the
amplifiers to switch off into standby mode with typical
current consumption less than 1 µA.
Micro-size packages, such as SOT-553 and WSON,
are offered for all channel variants (single, dual, and
quad), along with industry-standard packages such as
SOIC, MSOP, SOT-23, and TSSOP packages.
Device Information
PART
NUMBER(1)
TLV9001
2 Applications
•
•
•
•
•
•
•
•
•
•
•
•
•
Sensor signal conditioning
Power modules
Active filters
Low-side current sensing
Smoke detectors
Motion detectors
Wearable devices
Large and small appliances
EPOS
Barcode scanners
Personal electronics
HVAC: heating, ventilating, and air conditioning
Motor control: AC induction
3 Description
The TLV900x family includes single (TLV9001), dual
(TLV9002), and quad-channel (TLV9004) low-voltage
(1.8 V to 5.5 V) operational amplifiers (op amps)
with rail-to-rail input and output swing capabilities.
These op amps provide a cost-effective solution
for space-constrained applications such as smoke
detectors, wearable electronics, and small appliances
where low-voltage operation and high capacitive-load
drive are required. The capacitive-load drive of the
TLV900x family is 500 pF, and the resistive openloop output impedance makes stabilization easier with
much higher capacitive loads. These op amps are
designed specifically for low-voltage operation (1.8 V
to 5.5 V) with performance specifications similar to the
TLV600x devices.
The robust design of the TLV900x family simplifies
circuit design. The op amps feature unity-gain
stability, an integrated RFI and EMI rejection filter, and
no-phase reversal in overdrive conditions.
TLV9001S
TLV9002
TLV9002S
TLV9004
TLV9004S
(1)
(2)
PACKAGE
BODY SIZE (NOM)
SOT-23 (5)
1.60 mm × 2.90 mm
SC70 (5)
1.25 mm × 2.00 mm
SOT-553 (5)(2)
1.65 mm × 1.20 mm
X2SON (5)
0.80 mm × 0.80 mm
SOT-23 (6)
1.60 mm × 2.90 mm
SC70 (6)
1.25 mm × 2.00 mm
SOIC (8)
3.91 mm × 4.90 mm
WSON (8)
2.00 mm × 2.00 mm
VSSOP (8)
3.00 mm × 3.00 mm
SOT-23 (8)
1.60 mm × 2.90 mm
TSSOP (8)
3.00 mm × 4.40 mm
VSSOP (10)
3.00 mm × 3.00 mm
X2QFN (10)
1.50 mm × 2.00 mm
DSBGA (9)
1.00 mm × 1.00 mm
SOIC (14)
8.65 mm × 3.91 mm
SOT-23 (14)
4.20 mm × 2.00 mm
TSSOP (14)
4.40 mm × 5.00 mm
WQFN (16)
3.00 mm × 3.00 mm
X2QFN (14)
2.00 mm × 2.00 mm
WQFN (16)
3.00 mm × 3.00 mm
For all available packages, see the orderable addendum at
the end of the data sheet.
Package is for preview only.
Single-Pole, Low-Pass Filter
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TLV9001, TLV9002, TLV9004
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
Table of Contents
1 Features............................................................................1
2 Applications..................................................................... 1
3 Description.......................................................................1
4 Revision History.............................................................. 2
5 Device Comparison Table...............................................6
6 Pin Configuration and Functions...................................7
7 Specifications................................................................ 14
7.1 Absolute Maximum Ratings...................................... 14
7.2 ESD Ratings............................................................. 14
7.3 Recommended Operating Conditions.......................14
7.4 Thermal Information: TLV9001................................. 15
7.5 Thermal Information: TLV9001S............................... 15
7.6 Thermal Information: TLV9002................................. 15
7.7 Thermal Information: TLV9002S............................... 16
7.8 Thermal Information: TLV9004................................. 16
7.9 Thermal Information: TLV9004S............................... 16
7.10 Electrical Characteristics.........................................17
7.11 Typical Characteristics............................................ 19
8 Detailed Description......................................................25
8.1 Overview................................................................... 25
8.2 Functional Block Diagram......................................... 25
8.3 Feature Description...................................................26
8.4 Overload Recovery................................................... 27
8.5 Shutdown.................................................................. 27
8.6 Device Functional Modes..........................................27
9 Application and Implementation.................................. 28
9.1 Application Information............................................. 28
9.2 Typical Application.................................................... 28
10 Power Supply Recommendations..............................34
10.1 Input and ESD Protection....................................... 34
11 Layout........................................................................... 35
11.1 Layout Guidelines................................................... 35
11.2 Layout Example...................................................... 35
12 Device and Documentation Support..........................36
12.1 Documentation Support.......................................... 36
12.2 Receiving Notification of Documentation Updates..36
12.3 Support Resources................................................. 36
12.4 Trademarks............................................................. 36
12.5 Electrostatic Discharge Caution..............................36
12.6 Glossary..................................................................36
13 Mechanical, Packaging, and Orderable
Information.................................................................... 37
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision Q (June 2021) to Revision R (November 2021)
Page
• Added SOT-23 (14) package to Device Information table.................................................................................. 1
• Added SOT-23 DYY package to Device Comparison Table .............................................................................. 6
• Added SOT-23 (14) package to Pin Configuration and Functions section ........................................................ 7
• Added DYY (SOT-23) package thermal information to the Thermal Information: TLV9004 table.................... 16
Changes from Revision P (April 2021) to Revision Q (June 2021)
Page
• Changed supply voltage (V+) – (V–) MAX from 6 V to 7 V in the Absolute Maximum Ratings table............... 14
Changes from Revision O (April 2020) to Revision P (April 2021)
Page
• Updated the numbering format for tables, figures, and cross-references throughout the document..................1
• Added 9-pin DSBGA package to Device Information table................................................................................ 1
• Added 9-pin DSBGA package to Device Comparison Table ............................................................................. 6
• Added TLV9002S 9-pin DSBGA package to Pin Configuration and Functions section......................................7
• Added TLV9002S 9-pin DSBGA package to Thermal Information: TLV9002S ............................................... 16
• Deleted the Related Links section from the Device and Documentation Support section................................36
Changes from Revision N (January 2020) to Revision O (April 2020)
Page
• Deleted PREVIEW designation on TLV9001S ...................................................................................................1
• Deleted TLV9001SIDCK (6-pin SC70) package preview note ...........................................................................7
• Added DCK (SC70) data to the Thermal Information: TLV9001S table ...........................................................15
2
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
Changes from Revision M (September 2019) to Revision N (January 2020)
Page
• Added 6-pin SC70 package to Device Information table.................................................................................... 1
• Added 6-pin SC70 package to Device Comparison Table .................................................................................6
• Added TLV9001SIDCK (6-Pin SC70) package pinout........................................................................................7
• Added TLV9001S 6-pin SC70 package to Pin Configuration and Functions section......................................... 7
• Added 6-pin SC70 pinout to Pin Functions: TLV9001S ..................................................................................... 7
• Added TLV9001S 6-pin SC70 package to Thermal Information: TLV9001S table........................................... 15
Changes from Revision L (May 2019) to Revision M (September 2019)
Page
• Deleted preview notations for SOT-23-8 (DDF) package................................................................................... 6
• Added link to Shutdown section in all SHDN pin function rows.......................................................................... 7
• Added EMI Rejection section to the Feature Description section.....................................................................26
• Changed the Shutdown section to add more clarity regarding internal pull-up resistor....................................27
Changes from Revision K (March 2019) to Revision L (May 2019)
Page
• Added SOT-23 (8) information to Device Information table................................................................................ 1
• Added SOT-23 DDF package to Device Comparison Table .............................................................................. 6
• Added SOT-23 (DDF) to Pin Configuration and Functions section.....................................................................7
• Added DDF (SOT-23) Thermal Information: TLV9002 table.............................................................................15
Changes from Revision J (January 2019) to Revision K (March 2019)
Page
• Changed TLV9002S ESD Ratings heading to include all TLV9002S packages............................................... 14
• Deleted preview notation from TLV9002SIRUG in Thermal Information table................................................. 16
Changes from Revision I (November 2018) to Revision J (January 2019)
Page
• Deleted preview notation for TLV9002SIRUGR..................................................................................................1
• Changed TLV9004 WQFN(14) package designator to X2QFN(14) package designator................................... 1
• Added RUG package to Device Comparison Table ...........................................................................................6
• Added DGS package to Device Comparison Table ........................................................................................... 6
• Added shutdown devices to Device Comparison Table .....................................................................................6
• Changed TLV9001 DRL package pinout drawing...............................................................................................7
• Changed TLV9001 DRL package pin functions..................................................................................................7
• Deleted package preview note from TLV9002SIRUGR (X2QFN) pinout drawing.............................................. 7
• Added TLV9004IRUC Thermal Information...................................................................................................... 16
• Changed legend of Closed-Loop Gain vs Frequency plot................................................................................ 19
Changes from Revision H (October 2018) to Revision I (November 2018)
Page
• Added TLV9002SIDGS to ESD Ratings table...................................................................................................14
Changes from Revision G (September 2018) to Revision H (October 2018)
Page
• Changed From: TLV9001 DCK Package To: TLV9001T DCK Package............................................................. 7
Changes from Revision F (August 2018) to Revision G (September 2018)
Page
• Added Device Comparison Table ...................................................................................................................... 6
• Changed pin names for all devices and all packages.........................................................................................7
• Changed pin names and I/O designation on some TLV9001 pins .....................................................................7
• Changed the pin number for V+ in the SOIC, TSSOP column of the Pin Functions: TLV9004 table................. 7
Changes from Revision E (July 2018) to Revision F (August 2018)
Page
• Added Scalabe CMOS Amplifier for Low-Cost Applications feature...................................................................1
• Deleted PREVIEW designation on TLV9002 and TLV9004 devices with the TSSOP package. ....................... 1
• Added TLV9001U DBV (SOT-23) pinout drawing to Pin Configuration and Functions section ......................... 7
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
•
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Added SOT-23 U Pinout to Pin Functions section ............................................................................................. 7
Changes from Revision D (June 2018) to Revision E (July 2018)
Page
• Corrected typo in Description section ................................................................................................................ 1
• Added TLV9001 5-pin X2SON package to Device Information table ................................................................ 1
• Added TLV9001S 6-pin SOT-23 package to Device Information table...............................................................1
• Added TLV9004 14-pin and 16-pin WQFN packages to Device Information table ............................................1
• Added TLV9001 DPW (X2SON) pinout drawing to Pin Configuration and Functions section............................ 7
• Added TLV9001S 6-pin SOT-23 package to Pin Configuration and Functions section...................................... 7
• Added TLV9004 RTE pinout information to Pin Configuration and Functions section .......................................7
• Added DPW (X2SON) and DRL (SOT-553) packages to Thermal Information: TLV9001 table.......................15
• Added Thermal Information: TLV9001S table to Specifications section........................................................... 15
• Added RUG (X2QFN) package to Thermal Information: TLV9002 table.......................................................... 15
• Added RTE (WQFN) and RUC (WQFN) packages to Thermal Information: TLV9004 table............................ 16
Changes from Revision C (May 2018) to Revision D (June 2018)
Page
• Added shutdown text to Description section.......................................................................................................1
• Added TLV9002S and TLV9004S devices to Device Information table.............................................................. 1
• Added TLV9002S 10-pin X2QFN package to Device Information table............................................................. 1
• Added TLV9002S DGS package pinout information to Pin Configurations and Functions section.................... 7
• Added Thermal Information: TLV9001 table to Specifications section............................................................. 15
• Added Thermal Information: TLV9004 table to Specifications section............................................................. 16
• Added shutdown section to Electrical Characteristics: VS (Total Supply Voltage) = (V+) – (V–) = 1.8 V to 5.5 V
table.................................................................................................................................................................. 17
• Added Shutdown section.................................................................................................................................. 27
Changes from Revision B (March 2018) to Revision C (May 2018)
Page
• Added TLV9002 16-pin TSSOP package to Device Information table............................................................... 1
• Added TLV9002 10-pin X2QFN package to Device Information table................................................................1
• Added TLV9002S DGS package pinout drawing in Pin Configurations and Functions section..........................7
• Added TLV9004 pinout diagram and pin configuration table to Pin Configuration and Functions section ........ 7
• Added TLV9004S pinout diagram and pin configuration table to Pin Configuration and Functions section ...... 7
• Changed TLV9002 D (SOIC) junction-to-ambient thermal resistance value from 147.4°C/W to 207.9°C/W... 15
• Changed TLV9002 D (SOIC) junction-to-case (top) thermal resistance from 94.3°C/W to 92.8°C/W..............15
• Changed TLV9002 D (SOIC) junction-to-board thermal resistance from 89.5°C/W to 129.7°C/W...................15
• Changed TLV9002 D (SOIC) junction-to-top characterization parameter from 47.3°C/W to 26°C/W.............. 15
• Changed TLV9002 D (SOIC) junction-to-board characterization parameter from 89°C/W to 127.9°C/W........ 15
• Added DGK (VSSOP) thermal information to Thermal Information: TLV9002 table ........................................15
• Added TLV9002 PW (TSSOP) thermal information to Thermal Information: TLV9002 table........................... 15
• Added PW (TSSOP) thermal information to Thermal Information: TLV9002 table ..........................................16
Changes from Revision A (December 2017) to Revision B (March 2018)
Page
• Added package preview notes to TLV9001 packages, TLV9004 packages, and TLV9002 8-pin VSSOP
package in Device Information table ..................................................................................................................1
• Added package preview notes to TLV9001, TLV9004 and TLV9002 VSSOP package pinout drawings in Pin
Configuration and Functions section ................................................................................................................. 7
• Deleted package preview note from TLV9002 DSG (WSON) pinout drawing in Pin Configurations and
Functions section................................................................................................................................................7
• Deleted package preview note from TLV9002 RUG (X2QFN) pinout drawing in Pin Configurations and
Functions section................................................................................................................................................7
• Added DSG (WSON) package thermal information to the Thermal Information: TLV9002 table..................... 15
• Deleted package preview note from DSG (WSON) package in Thermal Information: TLV9002 table............. 15
• Added D (SOIC) package thermal information to the Thermal Information: TLV9004 table.............................16
4
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
Changes from Revision * (October 2017) to Revision A (December 2017)
Page
• Changed device status from Advance Information to Production Data/Mixed Status........................................ 1
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
5 Device Comparison Table
DEVICE
TLV9001
TLV9001S
TLV9002
TLV9002S
TLV9004
TLV9004S
6
NO.
OF
CH.
1
2
4
PACKAGE LEADS
SC70
DCK
SOIC
D
SOT-23
DBV
SOT-23
DYY
SOT-553
DRL
TSSOP
PW
VSSOP
DGK
SOT-23
DDF
WQFN
RTE
WSON
DSG
X2QFN
RUC
5
—
5
6
—
6
—
8
—
X2SON
DPW
X2QFN
RUG
VSSOP
DGS
DSBGA
YCK
—
5
—
—
—
—
—
—
—
—
—
—
—
—
—
5
—
—
—
—
—
—
—
—
—
—
8
8
8
—
—
8
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
—
10
10
—
14
—
14
—
14
—
9
—
16
—
14
—
—
—
—
—
—
—
—
—
—
—
—
16
—
—
—
—
—
—
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
6 Pin Configuration and Functions
OUT
1
V±
2
IN+
3
5
V+
4
IN±
IN+
1
V±
2
IN±
3
Not to scale
5
V+
4
OUT
Not to scale
Figure 6-1. TLV9001 DBV, TLV9001T DCK Package
5-Pin SOT-23, SC70
Top View
OUT
Figure 6-2. TLV9001 DCK Package, TLV9001 DRL
Package, TLV9001U DBV Package
5-Pin SC70, SOT-553, SOT-23
Top View
1
5
V+
4
IN+
3
V±
IN±
2
Not to scale
Figure 6-3. TLV9001 DPW Package
5-Pin X2SON
Top View
Table 6-1. Pin Functions: TLV9001
PIN
SOT-23,
SC70(T)
SC70,
SOT-23(U),
SOT-553
X2SON
IN–
4
3
2
IN+
3
1
OUT
1
4
V–
2
2
3
V+
5
5
5
NAME
I/O
DESCRIPTION
I
Inverting input
4
I
Noninverting input
1
O
Output
I or — Negative (low) supply or ground (for single-supply operation)
I
Positive (high) supply
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
OUT
1
6
V+
V±
2
5
SHDN
IN+
3
4
IN±
IN+
1
6
V+
V±
2
5
SHDN
IN±
3
4
OUT
Not to scale
Not to scale
Figure 6-5. TLV9001S DCK Package
6-Pin SC70
Top View
Figure 6-4. TLV9001S DBV Package
6-Pin SOT-23
Top View
Table 6-2. Pin Functions: TLV9001S
PIN
NAME
SOT-23
SC70
IN–
4
3
IN+
3
OUT
1
SHDN
I/O
DESCRIPTION
I
Inverting input
1
I
Noninverting input
4
O
Output
5
5
I
Shutdown: low = amp disabled, high = amp enabled. See Section 8.5 for more
information.
V–
2
2
I or —
V+
6
6
I
OUT1
1
8
V+
IN1±
2
7
OUT2
IN1+
3
6
IN2±
V±
4
5
IN2+
Negative (low) supply or ground (for single-supply operation)
Positive (high) supply
OUT1
1
IN1±
2
IN1+
3
V±
4
Thermal
Pad
8
V+
7
OUT2
6
IN2±
5
IN2+
Not to scale
Figure 6-6. TLV9002 D, DGK, PW, DDF Package
8-Pin SOIC, VSSOP, TSSOP, SOT-23
Top View
Not to scale
A.
Connect thermal pad to V–.
Figure 6-7. TLV9002 DSG Package
8-Pin WSON With Exposed Thermal Pad
Top View
Table 6-3. Pin Functions: TLV9002
PIN
NAME
8
NO.
I/O
DESCRIPTION
IN1–
2
I
Inverting input, channel 1
IN1+
3
I
Noninverting input, channel 1
IN2–
6
I
Inverting input, channel 2
IN2+
5
I
Noninverting input, channel 2
OUT1
1
O
Output, channel 1
OUT2
7
O
Output, channel 2
V–
4
I or —
V+
8
I
Negative (low) supply or ground (for single-supply operation)
Positive (high) supply
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IN1+
SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
1
10
V+
IN1±
2
9
OUT2
IN1+
3
8
IN2±
V±
4
7
IN2+
SHDN1
5
6
SHDN2
V±
1
9
IN1±
SHDN1
2
8
OUT1
SHDN2
3
7
V+
IN2+
4
6
OUT2
10
OUT1
Not to scale
5
Figure 6-8. TLV9002S DGS Package
10-Pin VSSOP
Top View
IN2±
Not to scale
Figure 6-9. TLV9002S RUG Package
10-Pin X2QFN
Top View
1
2
3
C
OUT1
V+
OUT2
B
IN1–
SHDN
IN2–
A
IN1+
V–
IN2+
Not to scale
Figure 6-10. TLV9002S YCK Package
9-Pin DSBGA (WCSP)
Bottom View
Table 6-4. Pin Functions: TLV9002S
PIN
NAME
VSSOP
X2QFN
DSBGA
(WCSP)
I/O
DESCRIPTION
IN1–
2
9
B1
I
Inverting input, channel 1
IN1+
3
10
A1
I
Noninverting input, channel 1
IN2–
8
5
B3
I
Inverting input, channel 2
IN2+
7
4
A3
I
Noninverting input, channel 2
OUT1
1
8
C1
O
Output, channel 1
OUT2
9
6
C3
O
Output, channel 2
SHDN1
5
2
—
I
Shutdown: low = amp disabled, high = amp enabled, channel 1. See
Section 8.5 for more information.
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
Table 6-4. Pin Functions: TLV9002S (continued)
PIN
VSSOP
X2QFN
DSBGA
(WCSP)
I/O
SHDN2
6
3
—
I
SHDN
—
—
B2
V–
4
1
A2
I or —
V+
10
7
C2
I
NAME
10
DESCRIPTION
Shutdown: low = amp disabled, high = amp enabled, channel 1. See
Section 8.5 for more information.
Shutdown: low = both amplifiers disabled, high = both amplifiers enabled
Negative (low) supply or ground (for single-supply operation)
Positive (high) supply
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2
13
IN4±
IN1+
3
12
IN4+
V+
4
11
V±
IN2+
5
10
IN3+
IN2±
6
9
IN3±
OUT2
7
8
OUT3
IN1±
1
IN1+
2
V+
OUT4
IN1±
12
IN4±
11
IN4+
3
10
V±
IN2+
4
9
IN3+
IN2±
5
8
IN3±
13
OUT4
7
14
14
1
6
OUT1
OUT1
SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
OUT2
OUT3
Not to scale
Figure 6-11. TLV9004 D, DYY, PW Package
14-Pin SOIC, SOT-23 (14), TSSOP
Top View
Not to scale
IN1+
1
V+
2
IN1±
OUT1
OUT4
IN4±
16
15
14
13
Figure 6-12. TLV9004 RUC Package
14-Pin X2QFN
Top View
12
IN4+
11
V±
10
IN3+
9
IN3±
Thermal
A.
6
7
8
NC
OUT3
4
NC
IN2±
Pad
5
3
OUT2
IN2+
Not to scale
Connect thermal pad to V–.
Figure 6-13. TLV9004 RTE Package
16-Pin WQFN With Exposed Thermal Pad
Top View
Table 6-5. Pin Functions: TLV9004
PIN
SOIC,
SOT-23 (14),
TSSOP
WQFN
X2QFN
IN1–
2
16
1
I
Inverting input, channel 1
IN1+
3
1
2
I
Noninverting input, channel 1
IN2–
6
4
5
I
Inverting input, channel 2
IN2+
5
3
4
I
Noninverting input, channel 2
NAME
I/O
DESCRIPTION
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
Table 6-5. Pin Functions: TLV9004 (continued)
PIN
NAME
SOIC,
SOT-23 (14),
TSSOP
WQFN
X2QFN
I/O
DESCRIPTION
IN3–
9
9
8
I
Inverting input, channel 3
IN3+
10
10
9
I
Noninverting input, channel 3
IN4–
13
13
12
I
Inverting input, channel 4
IN4+
12
12
11
I
Noninverting input, channel 4
NC
—
6, 7
—
—
No internal connection
OUT1
1
15
14
O
Output, channel 1
OUT2
7
5
6
O
Output, channel 2
OUT3
8
8
7
O
Output, channel 3
OUT4
14
14
13
O
Output, channel 4
V–
11
11
10
V+
4
2
3
12
I or — Negative (low) supply or ground (for single-supply operation)
I
Positive (high) supply
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IN1+
1
V+
2
IN1±
OUT1
OUT4
IN4±
16
15
14
13
SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
12
IN4+
11
V±
10
IN3+
9
IN3±
Thermal
A.
6
7
8
SHDN34
OUT3
4
SHDN12
IN2±
Pad
5
3
OUT2
IN2+
Not to scale
Connect thermal pad to V–.
Figure 6-14. TLV9004S RTE Package
16-Pin WQFN With Exposed Thermal Pad
Top View
Table 6-6. Pin Functions: TLV9004S
PIN
NAME
NO.
I/O
DESCRIPTION
IN1+
1
I
Noninverting input
IN1–
16
I
Inverting input
IN2+
3
I
Noninverting input
IN2–
4
I
Inverting input
IN3+
10
I
Noninverting input
IN3–
9
I
Inverting input
IN4+
12
I
Noninverting input
IN4–
13
I
Inverting input
SHDN12
6
I
Shutdown: low = amp disabled, high = amp enabled, channel 1 and 2. See Section 8.5 for
more information.
SHDN34
7
I
Shutdown: low = amp disabled, high = amp enabled, channel 3 and 4. See Section 8.5 for
more information.
OUT1
15
O
Output
OUT2
5
O
Output
OUT3
8
O
Output
OUT4
14
O
Output
V–
11
I or —
V+
2
I
Negative (low) supply or ground (for single-supply operation)
Positive (high) supply
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
7 Specifications
7.1 Absolute Maximum Ratings
over operating temperature range (unless otherwise noted)(1)
MIN
MAX
Supply voltage (V+) – (V–)
Voltage(2)
Signal input pins
Common-mode
V
(V+) + 0.5
V
(V+) – (V–) + 0.2
V
(V–) – 0.5
Differential
Current(2)
–10
Output short-circuit(3)
–55
Junction, TJ
Storage, Tstg
(2)
(3)
10
mA
150
°C
150
°C
150
°C
Continuous
Operating, TA
(1)
UNIT
7
–65
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress
ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
Input pins are diode-clamped to the power-supply rails. Input signals that may swing more than 0.5 V beyond the supply rails must be
current limited to 10 mA or less.
Short-circuit to ground, one amplifier per package.
7.2 ESD Ratings
TLV9002S PACKAGE
V(ESD)
Electrostatic discharge
VALUE
Human-body model (HBM), per ANSI/ESDA/JEDEC
JS-001(1)
±1500
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)
±1500
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±2000
UNIT
V
ALL OTHER PACKAGES
V(ESD)
(1)
(2)
Electrostatic discharge
Charged-device model (CDM), per JEDEC specification
JESD22-C101(2)
±1000
V
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
over operating temperature range (unless otherwise noted)
MIN
MAX
UNIT
VS
Supply voltage
1.8
5.5
V
TA
Specified temperature
–40
125
°C
14
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
7.4 Thermal Information: TLV9001
TLV9001
THERMAL
RθJA
METRIC(1)
DBV (SOT-23)
DCK (SC70)
DPW (X2SON)
DRL (SOT-553)(2)
5 PINS
5 PINS
5 PINS
5 PINS
232.9
239.6
470.0
TBD
°C/W
RθJC(top) Junction-to-case (top) thermal resistance
153.8
148.5
211.9
TBD
°C/W
RθJB
Junction-to-board thermal resistance
100.9
82.3
334.8
TBD
°C/W
ψJT
Junction-to-top characterization parameter
77.2
54.5
29.8
TBD
°C/W
ψJB
Junction-to-board characterization parameter
100.4
81.8
333.2
TBD
°C/W
(1)
(2)
Junction-to-ambient thermal resistance
UNIT
For more information about traditional and new thermal metrics, see Semiconductor and IC Package Thermal Metrics.
This package option for TLV9001 is preview only.
7.5 Thermal Information: TLV9001S
TLV9001S
THERMAL METRIC(1)
DBV (SOT-23)
DCK (SC70)
UNIT
6 PINS
6 PINS
RθJA
Junction-to-ambient thermal resistance
232.9
215.6
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
153.8
146.4
°C/W
RθJB
Junction-to-board thermal resistance
100.9
72.0
°C/W
ψJT
Junction-to-top characterization parameter
77.2
55.0
°C/W
ψJB
Junction-to-board characterization parameter
100.4
71.7
°C/W
(1)
For more information about traditional and new thermal metrics, see Semiconductor and IC Package Thermal Metrics.
7.6 Thermal Information: TLV9002
TLV9002
THERMAL METRIC(1)
D
(SOIC)
DGK
(VSSOP)
DGS
(VSSOP)
DSG
(WSON)
PW
(TSSOP)
DDF
(SOT-23)
UNIT
8 PINS
8 PINS
10 PINS
8 PINS
8 PINS
8 PINS
RθJA
Junction-to-ambient
thermal resistance
207.9
201.2
169.5
103.2
200.7
183.7
°C/W
RθJC(top)
Junction-to-case (top)
thermal resistance
92.8
85.7
84.1
120.1
95.4
112.5
°C/W
RθJB
Junction-to-board thermal
resistance
129.7
122.9
113
68.8
128.6
98.2
°C/W
ψJT
Junction-to-top
characterization parameter
26
21.2
15.8
14.7
27.2
18.8
°C/W
ψJB
Junction-to-board
characterization parameter
127.9
121.4
111.6
68.5
127.2
97.6
°C/W
(1)
For more information about traditional and new thermal metrics, see Semiconductor and IC Package Thermal Metrics.
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7.7 Thermal Information: TLV9002S
TLV9002S
THERMAL
METRIC(1)
DGS (VSSOP)
RUG (X2QFN)
YCK (DSBGA)
10 PINS
10 PINS
9 PINS
UNIT
RθJA
Junction-to-ambient thermal resistance
169.5
194.2
101.2
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
84.1
90.3
0.9
°C/W
RθJB
Junction-to-board thermal resistance
113
122.2
33.8
°C/W
ψJT
Junction-to-top characterization parameter
15.8
3.5
0.5
°C/W
ψJB
Junction-to-board characterization parameter
111.6
118.8
33.8
°C/W
(1)
For more information about traditional and new thermal metrics, see Semiconductor and IC Package Thermal Metrics.
7.8 Thermal Information: TLV9004
TLV9004
THERMAL
METRIC(1)
D (SOIC)
DYY (SOT-23)
PW (TSSOP)
RTE (WQFN)
RUC (X2QFN)
14 PINS
14 PINS
14 PINS
16 PINS
14 PINS
UNIT
RθJA
Junction-to-ambient thermal
resistance
102.1
154.3
148.3
66.4
205.5
°C/W
RθJC(top)
Junction-to-case (top) thermal
resistance
56.8
86.8
68.1
69.3
72.5
°C/W
RθJB
Junction-to-board thermal
resistance
58.5
67.9
92.7
41.7
150.2
°C/W
ψJT
Junction-to-top characterization
parameter
20.5
10.1
16.9
5.7
3.0
°C/W
ψJB
Junction-to-board
characterization parameter
58.1
67.5
91.8
41.5
149.6
°C/W
(1)
For more information about traditional and new thermal metrics, see Semiconductor and IC Package Thermal Metrics.
7.9 Thermal Information: TLV9004S
TLV9004S
THERMAL
METRIC(1)
RTE (WQFN)
UNIT
16 PINS
RθJA
Junction-to-ambient thermal resistance
66.4
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
69.3
°C/W
RθJB
Junction-to-board thermal resistance
41.7
°C/W
ψJT
Junction-to-top characterization parameter
5.7
°C/W
ψJB
Junction-to-board characterization parameter
41.5
°C/W
(1)
16
For more information about traditional and new thermal metrics, see Semiconductor and IC Package Thermal Metrics.
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
7.10 Electrical Characteristics
For VS = (V+) – (V–) = 1.8 V to 5.5 V (±0.9 V to ±2.75 V), TA = 25°C, RL = 10 kΩ connected to VS / 2, and VCM = VOUT =
VS / 2 (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
±0.4
±1.6
UNIT
OFFSET VOLTAGE
VOS
Input offset voltage
VS = 5 V
VS = 5 V, TA = –40°C to 125°C
dVOS/dT VOS vs temperature
TA = –40°C to 125°C
PSRR
VS = 1.8 to 5.5 V, VCM = (V–)
Power-supply rejection ratio
±2
80
mV
±0.6
µV/°C
105
dB
INPUT VOLTAGE RANGE
VCM
CMRR
Common-mode voltage range
Common-mode rejection ratio
No phase reversal, rail-to-rail input
(V–) – 0.1
(V+) + 0.1
VS = 1.8 V, (V–) – 0.1 V < VCM < (V+) – 1.4 V,
TA = –40°C to 125°C
86
VS = 5.5 V, (V–) – 0.1 V < VCM < (V+) – 1.4 V,
TA = –40°C to 125°C
95
VS = 5.5 V, (V–) – 0.1 V < VCM < (V+) + 0.1 V,
TA = –40°C to 125°C
V
dB
63
77
VS = 1.8 V, (V–) – 0.1 V < VCM < (V+) + 0.1 V,
TA = –40°C to 125°C
68
VS = 5 V
±5
pA
±2
pA
ƒ = 0.1 Hz to 10 Hz, VS = 5 V
4.7
µVPP
ƒ = 1 kHz, VS = 5 V
30
ƒ = 10 kHz, VS = 5 V
27
ƒ = 1 kHz, VS = 5 V
23
fA/√ Hz
1.5
pF
5
pF
INPUT BIAS CURRENT
IB
Input bias current
IOS
Input offset current
NOISE
En
Input voltage noise (peak-topeak)
en
Input voltage noise density
in
Input current noise density
nV/√ Hz
INPUT CAPACITANCE
CID
Differential
CIC
Common-mode
OPEN-LOOP GAIN
VS = 5.5 V, (V–) + 0.05 V < VO < (V+) – 0.05 V,
RL = 10 kΩ
AOL
Open-loop voltage gain
104
117
VS = 1.8 V, (V–) + 0.04 V < VO < (V+) – 0.04 V,
RL = 10 kΩ
100
VS = 1.8 V, (V–) + 0.1 V < VO < (V+) – 0.1 V,
RL = 2 kΩ
115
VS = 5.5 V, (V–) + 0.15 V < VO < (V+) – 0.15 V,
RL = 2 kΩ
130
dB
FREQUENCY RESPONSE
GBW
Gain-bandwidth product
VS = 5 V
φm
Phase margin
VS = 5.5 V, G = 1
SR
Slew rate
VS = 5 V
tS
Settling time
tOR
Overload recovery time
VS = 5 V, VIN × gain > VS
THD+N
Total harmonic distortion +
noise
VS = 5.5 V, VCM = 2.5 V, VO = 1 VRMS, G = +1,
ƒ = 1 kHz, 80-kHz measurement BW
VO
Voltage output swing from
supply rails
VS = 5.5 V, RL = 10 kΩ
10
20
VS = 5.5 V, RL = 2 kΩ
35
55
ISC
Short-circuit current
VS = 5.5 V
ZO
Open-loop output impedance
VS = 5 V, ƒ = 1 MHz
To 0.1%, VS = 5 V, 2-V step, G = +1, CL = 100 pF
To 0.01%, VS = 5 V, 2-V step, G = +1, CL = 100 pF
1
MHz
78
°
2
V/µs
2.5
µs
3
0.85
µs
0.004%
OUTPUT
mV
±40
mA
1200
Ω
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
7.10 Electrical Characteristics (continued)
For VS = (V+) – (V–) = 1.8 V to 5.5 V (±0.9 V to ±2.75 V), TA = 25°C, RL = 10 kΩ connected to VS / 2, and VCM = VOUT =
VS / 2 (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
POWER SUPPLY
VS
Specified voltage range
IQ
Quiescent current per amplifier
1.8 (±0.9)
5.5 (±2.75)
TLV9002, TLV9002S TLV9004,
TLV9004S
IO = 0 mA, VS = 5.5 V
60
75
TLV9001, TLV9001S
IO = 0 mA, VS = 5.5 V
60
77
IO = 0 mA, VS = 5.5 V, TA = –40°C to 125°C
V
µA
85
SHUTDOWN(1)
IQSD
Quiescent current per amplifier
VS = 1.8 V to 5.5 V, all amplifiers disabled, SHDN = VS–
ZSHDN
Output impedance during
shutdown
VS = 1.8 V to 5.5 V, amplifier disabled
High level voltage shutdown
threshold (amplifier enabled)
VS = 1.8 V to 5.5 V
Low level voltage shutdown
threshold (amplifier disabled)
VS = 1.8 V to 5.5 V
Amplifier enable time (full
shutdown)
VS = 1.8 V to 5.5 V, full shutdown; G = 1,
VOUT = 0.9 × VS / 2, RL connected to V–
70
Amplifier enable time (partial
shutdown)
VS = 1.8 V to 5.5 V, partial shutdown; G = 1,
VOUT = 0.9 × VS / 2, RL connected to V–
50
Amplifier disable time
VS = 1.8 V to 5.5 V, G = 1, VOUT = 0.1 × VS / 2,
RL connected to V–
tON
tOFF
SHDN pin input bias current
(per pin)
(1)
18
0.5
1.5
10 || 2
(V–) + 0.9
(V–) + 0.2 V
VS = 1.8 V to 5.5 V, V+ ≥ SHDN ≥ (V+) – 0.8 V
VS = 1.8 V to 5.5 V, V– ≤ SHDN ≤ V– + 0.8 V
(V–) + 0.7 V
µA
GΩ || pF
(V–) + 1.1
V
V
µs
4
40
150
µs
nA
Specified by design and characterization; not production tested.
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
7.11 Typical Characteristics
at TA = 25°C, V+ = 2.75 V, V– = –2.75 V, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and VOUT = VS / 2 (unless otherwise
noted)
25
40
35
20
Population (%)
Population (%)
30
25
20
15
10
15
10
5
5
0
0
-1200 -900 -600 -300
0
300
0
900 1200 1500 1800
600
0.2
0.6
0.8
1
1.2
1.4
1.6
1.8
D002
VS = 5 V, TA = –40°C to 125°C
VS = 5 V
Figure 7-2. Offset Voltage Drift Distribution Histogram
1000
2000
800
1500
600
1000
Offset Voltage (μV)
400
200
0
-200
-400
500
0
-500
-1000
-600
-1500
-800
-1000
-40
-20
0
20
40
60
80
Temperature (°C)
100
120
-2000
-4
140
-3
-2
D003
Figure 7-3. Input Offset Voltage vs Temperature
-1
0
1
2
Common-Mode Voltage (V)
3
4
D004
Figure 7-4. Offset Voltage vs Common-Mode
6
1000
800
IB
I B+
IOS
4
600
2
400
IB and IOS (pA)
Offset Voltage (PV)
2
Offset Voltage Drift (μV/°C)
Figure 7-1. Offset Voltage Distribution Histogram
Input Offset Voltage (µV)
0.4
D001
Offset Voltage (μV)
200
0
-200
-400
0
-2
-4
-6
-600
-8
-800
-1000
1.5
2
2.5
3
3.5
4
4.5
Supply Voltage (V)
5
5.5
Figure 7-5. Offset Voltage vs Supply Voltage
6
-10
-40
-20
0
D005
20
40
60
80
Temperature (qC)
100
120
140
D006
Figure 7-6. IB and IOS vs Temperature
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
7.11 Typical Characteristics (continued)
at TA = 25°C, V+ = 2.75 V, V– = –2.75 V, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and VOUT = VS / 2 (unless otherwise
noted)
160
3.5
IB
3
IB+
IOS
140
2.5
120
Gain (dB)
IB and IOS (pA)
2
1.5
1
0.5
0
-0.5
-1
100
80
60
40
-1.5
20
-2
-2.5
-3
-2
-1
0
1
Common-Mode Voltage (V)
2
0
-40
3
0
20
120
100
120
140
D008
80
100
60
80
40
60
20
40
0
20
160
Phase (q)
100
Gain
Phase
40
60
80
Temperature (qC)
Figure 7-8. Open-Loop Gain vs Temperature
Open-Loop Voltage Gain (dB)
Gain (dB)
-20
D007
Figure 7-7. IB and IOS vs Common-Mode Voltage
-20
1k
VS = 5.5 V
VS = 1.8 V
140
120
100
80
60
40
20
0
10k
100k
Frequency (Hz)
0
-3
1M
-2
-1
0
1
Output Voltage (V)
D009
2
3
D010
CL = 10 pF
Figure 7-9. Open-Loop Gain and Phase vs Frequency
Figure 7-10. Open-Loop Gain vs Output Voltage
80
3
Gain = 1
Gain = 1
Gain = 100
Gain = 1000
Gain = 10
70
60
2
1.5
Output Voltage (V)
Gain (dB)
50
2.5
40
30
20
10
0
125°C
1
85°C
25°C
-40°C
0.5
0
-0.5
-1
85°C
-1.5
25°C
-40°C
125°C
-2
-10
-2.5
-20
100
-3
1k
10k
100k
Frequency (Hz)
1M
0
5
10
D011
15
20
25
30
35
Output Current (mA)
40
45
50
D012
CL = 10 pF
Figure 7-11. Closed-Loop Gain vs Frequency
20
Figure 7-12. Output Voltage vs Output Current (Claw)
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SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
7.11 Typical Characteristics (continued)
at TA = 25°C, V+ = 2.75 V, V– = –2.75 V, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and VOUT = VS / 2 (unless otherwise
noted)
120
PSRR+
PSRR
100
Power Supply Rejection Ratio (dB)
Power Supply Rejection Ratio (dB)
120
80
60
40
20
0
100
1k
10k
Frequency (Hz)
100k
100
80
60
40
20
0
-40
1M
-20
0
20
D013
40
60
80
Temperature (qC)
100
120
140
D014
VS = 1.8 V to 5.5 V
Figure 7-14. DC PSRR vs Temperature
Figure 7-13. PSRR vs Frequency
160
Common-Mode Rejection Ratio (dB)
Common-Mode Rejection Ratio (dB)
120
100
80
60
40
20
0
100
1k
10k
Frequency (Hz)
100k
140
120
100
80
60
40
20
0
-40
1M
VS = 1.8 V
VS = 5.5 V
-20
0
D015
20
40
60
80
Temperature (qC)
100
120
140
D016
VCM = (V–) – 0.1 V to (V+) – 1.4 V
Figure 7-16. DC CMRR vs Temperature
Amplitude (1 PV/div)
Input Voltage Noise Spectral Density (nV/—Hz)
Figure 7-15. CMRR vs Frequency
Time (1 s/div)
120
100
80
60
40
20
0
10
100
D017
Figure 7-17. 0.1-Hz to 10-Hz Integrated Voltage Noise
1k
Frequency (Hz)
10k
100k
D018
Figure 7-18. Input Voltage Noise Spectral Density
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7.11 Typical Characteristics (continued)
at TA = 25°C, V+ = 2.75 V, V– = –2.75 V, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and VOUT = VS / 2 (unless otherwise
noted)
0
-50
G = +1, RL = 2 k:
G = +1, RL = 10 k:
-20
THD + N (dB)
-60
THD + N (dB)
G = 1, RL = 2 k:
G = 1, RL = 10 k:
-70
-80
-40
-60
-80
-90
RL = 2K
RL = 10K
-100
100
1k
Frequency (Hz)
VS = 5.5 V
BW = 80 kHz
-100
0.001
10k
VCM = 2.5 V
VOUT = 0.5 VRMS
G=1
VS = 5.5 V
G=1
70
70
60
60
50
40
30
20
1
2
D020
VCM = 2.5 V
BW = 80 kHz
ƒ = 1 kHz
50
40
30
20
10
10
0
1.5
2
2.5
3
3.5
4
Voltage Supply (V)
4.5
5
0
-40
5.5
1800
45
1600
40
1400
35
Overshoot (%)
50
1200
1000
800
100
120
140
D022
20
15
10
200
5
1M
40
60
80
Temperature (qC)
25
400
100k
Frequency (Hz)
20
30
600
10k
0
Figure 7-22. Quiescent Current vs Temperature
2000
0
1k
-20
D021
Figure 7-21. Quiescent Current vs Supply Voltage
10M
Overshoot (+)
Overshoot (–)
0
0
200
D023
G=1
Figure 7-23. Open-Loop Output Impedance vs Frequency
22
0.1
Amplitude (V RMS)
Figure 7-20. THD + N vs Amplitude
Quiescent Current (PA)
Quiescent Current (PA)
Figure 7-19. THD + N vs Frequency
Open-Loop Output Impedance (:)
0.01
D019
400
600
Capacitance Load (pF)
800
1000
D024
VIN = 100 mVpp
Figure 7-24. Small Signal Overshoot vs Capacitive Load
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7.11 Typical Characteristics (continued)
at TA = 25°C, V+ = 2.75 V, V– = –2.75 V, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and VOUT = VS / 2 (unless otherwise
noted)
50
90
45
80
40
70
Phase Margin (q)
Overshoot (%)
35
30
25
20
15
60
50
40
30
20
10
Overshoot (+)
Overshoot (–)
5
10
0
0
0
200
G = –1
400
600
Capacitance Load (pF)
800
0
1000
200
D025
400
600
Capacitance Load (pF)
800
1000
D026
VIN = 100 mVpp
Figure 7-26. Phase Margin vs Capacitive Load
Figure 7-25. Small Signal Overshoot vs Capacitive Load
Amplitude (1 V/div)
VOUT
VIN
Amplitude (1 V/div)
VOUT
VIN
Time (100 Ps/div)
Time (20 Ps/div)
D027
G=1
D028
VIN = 6.5 VPP
G = –10
Figure 7-27. No Phase Reversal
VIN = 600 mVPP
Figure 7-28. Overload Recovery
VOUT
VIN
Voltage (1 V/div)
Voltage (20 mV/div)
VOUT
VIN
Time (10 Ps/div)
Time (10 Ps/div)
D029
G=1
VIN = 100 mVPP
CL = 10 pF
Figure 7-29. Small-Signal Step Response
D030
G=1
VIN = 4 VPP
CL = 10 pF
Figure 7-30. Large-Signal Step Response
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7.11 Typical Characteristics (continued)
Output Voltage (1 mV/div)
Output Voltage (1 mV/div)
at TA = 25°C, V+ = 2.75 V, V– = –2.75 V, RL = 10 kΩ connected to VS / 2, VCM = VS / 2, and VOUT = VS / 2 (unless otherwise
noted)
Time (1 Ps/div)
Time (1 μs/div)
D032
D031
G=1
CL = 100 pF
G=1
2-V step
Figure 7-32. Large-Signal Settling Time (Positive)
80
6
Maximum Output Voltage (V)
Short Circuit Current (mA)
40
20
0
-20
-40
-60
-80
-40
VS = 5.5 V
VS = 1.8 V
5
4
3
2
1
Sinking
Sourcing
0
-20
0
20
40
60
Temperature (qC)
80
100
1
120
100
1k
10k
100k
Frequency (Hz)
1M
10M
100M
D034
Figure 7-34. Maximum Output Voltage vs Frequency
0
120
-20
Channel Separation (dB)
140
100
80
60
40
-40
-60
-80
-100
-120
20
0
10M
10
D033
Figure 7-33. Short-Circuit Current vs Temperature
EMIRR (dB)
2-V step
Figure 7-31. Large-Signal Settling Time (Negative)
60
100M
1G
Frequency (Hz)
10G
-140
1k
10k
D035
Figure 7-35. Electromagnetic Interference Rejection Ratio
Referred to Noninverting Input (EMIRR+) vs Frequency
24
CL = 100 pF
100k
Frequency (Hz)
1M
10M
D036
Figure 7-36. Channel Separation
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8 Detailed Description
8.1 Overview
The TLV900x is a family of low-power, rail-to-rail input and output op amps. These devices operate from 1.8 V
to 5.5 V, are unity-gain stable, and are designed for a wide range of general-purpose applications. The input
common-mode voltage range includes both rails and allows the TLV900x family to be used in virtually any
single-supply application. Rail-to-rail input and output swing significantly increases dynamic range, especially in
low-supply applications, and makes them suitable for driving sampling analog-to-digital converters (ADCs).
8.2 Functional Block Diagram
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8.3 Feature Description
8.3.1 Operating Voltage
The TLV900x family of op amps are for operation from 1.8 V to 5.5 V. In addition, many specifications such
as input offset voltage, quiescent current, offset current, and short circuit current apply from –40°C to 125°C.
Parameters that vary significantly with operating voltages or temperature are shown in Section 7.11.
8.3.2 Rail-to-Rail Input
The input common-mode voltage range of the TLV900x family extends 100 mV beyond the supply rails for the
full supply voltage range of 1.8 V to 5.5 V. This performance is achieved with a complementary input stage:
an N-channel input differential pair in parallel with a P-channel differential pair, as shown in Section 8.2. The
N-channel pair is active for input voltages close to the positive rail, typically (V+) – 1.4 V to 100 mV above
the positive supply, whereas the P-channel pair is active for inputs from 100 mV below the negative supply to
approximately (V+) – 1.4 V. There is a small transition region, typically (V+) – 1.2 V to (V+) – 1 V, in which both
pairs are on. This 100-mV transition region can vary up to 100 mV with process variation. Thus, the transition
region (with both stages on) can range from (V+) – 1.4 V to (V+) – 1.2 V on the low end, and up to (V+) – 1 V to
(V+) – 0.8 V on the high end. Within this transition region, PSRR, CMRR, offset voltage, offset drift, and THD can
degrade compared to device operation outside this region.
8.3.3 Rail-to-Rail Output
Designed as a low-power, low-voltage operational amplifier, the TLV900x family delivers a robust output
drive capability. A class-AB output stage with common-source transistors achieves full rail-to-rail output swing
capability. For resistive loads of 10 kΩ, the output swings to within 20 mV of either supply rail, regardless of the
applied power-supply voltage. Different load conditions change the ability of the amplifier to swing close to the
rails.
8.3.4 EMI Rejection
The TLV900x uses integrated electromagnetic interference (EMI) filtering to reduce the effects of EMI from
sources such as wireless communications and densely-populated boards with a mix of analog signal chain and
digital components. EMI immunity can be improved with circuit design techniques; the TLV900x benefits from
these design improvements. Texas Instruments has developed the ability to accurately measure and quantify the
immunity of an operational amplifier over a broad frequency spectrum extending from 10 MHz to 6 GHz. Figure
8-1 shows the results of this testing on the TLV900x. Table 8-1 shows the EMIRR IN+ values for the TLV900x at
particular frequencies commonly encountered in real-world applications. The EMI Rejection Ratio of Operational
Amplifiers application report contains detailed information on the topic of EMIRR performance as it relates to op
amps and is available for download from www.ti.com.
140
120
EMIRR (dB)
100
80
60
40
20
0
10M
100M
1G
Frequency (Hz)
10G
D035
Figure 8-1. EMIRR Testing
26
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Table 8-1. TLV900x EMIRR IN+ For Frequencies of Interest
FREQUENCY
APPLICATION OR ALLOCATION
EMIRR IN+
400 MHz
Mobile radio, mobile satellite, space operation, weather, radar, ultra-high frequency (UHF)
applications
59.5 dB
900 MHz
Global system for mobile communications (GSM) applications, radio communication, navigation,
GPS (to 1.6 GHz), GSM, aeronautical mobile, UHF applications
68.9 dB
1.8 GHz
GSM applications, mobile personal communications, broadband, satellite, L-band (1 GHz to 2 GHz)
77.8 dB
Bluetooth®,
2.4 GHz
802.11b, 802.11g, 802.11n,
mobile personal communications, industrial, scientific and
medical (ISM) radio band, amateur radio and satellite, S-band (2 GHz to 4 GHz)
78.0 dB
3.6 GHz
Radiolocation, aero communication and navigation, satellite, mobile, S-band
88.8 dB
8.4 Overload Recovery
Overload recovery is defined as the time required for the operational amplifier output to recover from a saturated
state to a linear state. The output devices of the operational amplifier enter a saturation region when the output
voltage exceeds the rated operating voltage, because of the high input voltage or the high gain. After the device
enters the saturation region, the charge carriers in the output devices require time to return to the linear state.
After the charge carriers return to the linear state, the device begins to slew at the specified slew rate. Therefore,
the propagation delay (in case of an overload condition) is the sum of the overload recovery time and the slew
time. The overload recovery time for the TLV900x family is approximately 850 ns.
8.5 Shutdown
The TLV9001S, TLV9002S, and TLV9004S devices feature SHDN pins that disable the op amp, placing it into
a low-power standby mode. In this mode, the op amp typically consumes less than 1 µA. The SHDN pins are
active low, meaning that shutdown mode is enabled when the input to the SHDN pin is a valid logic low.
The SHDN pins are referenced to the negative supply voltage of the op amp. The threshold of the shutdown
feature lies around 620 mV (typical) and does not change with respect to the supply voltage. Hysteresis has
been included in the switching threshold to ensure smooth switching characteristics. To ensure optimal shutdown
behavior, the SHDN pins should be driven with valid logic signals. A valid logic low is defined as a voltage
between V– and V– + 0.2 V. A valid logic high is defined as a voltage between V– + 1.2 V and V+. The shutdown
pin circuitry includes a pull-up resistor, which will inherently pull the voltage of the pin to the positive supply rail
if not driven. Thus, to enable the amplifier, the SHDN pins should either be left floating or driven to a valid logic
high. To disable the amplifier, the SHDN pins must be driven to a valid logic low. While we highly recommend
that the shutdown pin be connected to a valid high or a low voltage or driven, we have included a pull-up resistor
connected to VCC. The maximum voltage allowed at the SHDN pins is (V+) + 0.5 V. Exceeding this voltage level
will damage the device.
The SHDN pins are high-impedance CMOS inputs. Dual op amp versions are independently controlled and quad
op amp versions are controlled in pairs with logic inputs. For battery-operated applications, this feature may be
used to greatly reduce the average current and extend battery life. The enable time is 70 µs for full shutdown of
all channels; disable time is 4 µs. When disabled, the output assumes a high-impedance state. This architecture
allows the TLV9002S and TLV9004S to operate as a gated amplifier (or to have the device output multiplexed
onto a common analog output bus). Shutdown time (tOFF) depends on loading conditions and increases as load
resistance increases. To ensure shutdown (disable) within a specific shutdown time, the specified 10-kΩ load
to midsupply (VS / 2) is required. If using the TLV9001S, TLV9002S, or TLV9004S without a load, the resulting
turnoff time significantly increases.
8.6 Device Functional Modes
The TLV900x family has a single functional mode. The devices are powered on as long as the power-supply
voltage is between 1.8 V (±0.9 V) and 5.5 V (±2.75 V).
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9 Application and Implementation
Note
Information in the following applications sections is not part of the TI component specification, and
TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining
suitability of components for their purposes. Customers should validate and test their design
implementation to confirm system functionality.
9.1 Application Information
The TLV900x family of low-power, rail-to-rail input and output operational amplifiers is specifically designed for
portable applications. The devices operate from 1.8 V to 5.5 V, are unity-gain stable, and are suitable for a wide
range of general-purpose applications. The class AB output stage is capable of driving less than or equal to
10‑kΩ loads connected to any point between V+ and V–. The input common-mode voltage range includes both
rails, and allows the TLV900x devices to be used in any single-supply application.
9.2 Typical Application
9.2.1 TLV900x Low-Side, Current Sensing Application
Figure 9-1 shows the TLV900x configured in a low-side current sensing application.
VBUS
ILOAD
ZLOAD
5V
+
TLV9002
RSHUNT
0.1 Ÿ
VSHUNT
í
VOUT
í
+
RF
57.6 NŸ
RG
1.2 NŸ
Figure 9-1. TLV900x in a Low-Side, Current-Sensing Application
28
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9.2.1.1 Design Requirements
The design requirements for this design are:
• Load current: 0 A to 1 A
• Output voltage: 4.9 V
• Maximum shunt voltage: 100 mV
9.2.1.2 Detailed Design Procedure
The transfer function of the circuit in Figure 9-1 is given in Equation 1.
VOUT
ILOAD u RSHUNT u Gain
(1)
The load current (ILOAD) produces a voltage drop across the shunt resistor (RSHUNT). The load current is set
from 0 A to 1 A. To keep the shunt voltage below 100 mV at maximum load current, the largest shunt resistor is
shown using Equation 2.
RSHUNT
VSHUNT _ MAX
ILOAD _ MAX
100mV
1A
100m:
(2)
Using Equation 2, RSHUNT is calculated to be 100 mΩ. The voltage drop produced by ILOAD and RSHUNT is
amplified by the TLV900x to produce an output voltage of approximately 0 V to 4.9 V. The gain needed by the
TLV900x to produce the necessary output voltage is calculated using Equation 3.
Gain
VOUT _ MAX
VIN _ MAX
VOUT _ MIN
VIN _ MIN
(3)
Using Equation 3, the required gain is calculated to be 49 V/V, which is set with resistors RF and RG. Equation 4
sizes the resistors RF and RG, to set the gain of the TLV900x to 49 V/V.
Gain 1
RF
RG
(4)
Selecting RF as 57.6 kΩ and RG as 1.2 kΩ provides a combination that equals 49 V/V. Figure 9-2 shows the
measured transfer function of the circuit shown in Figure 9-1. Notice that the gain is only a function of the
feedback and gain resistors. This gain is adjusted by varying the ratio of the resistors and the actual resistors
values are determined by the impedance levels that the designer wants to establish. The impedance level
determines the current drain, the effect that stray capacitance has, and a few other behaviors. There is no
optimal impedance selection that works for every system, you must choose an impedance that is ideal for your
system parameters.
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9.2.1.3 Application Curve
5
Output (V)
4
3
2
1
0
0
0.2
0.4
0.6
0.8
ILOAD (A)
1
C219
Figure 9-2. Low-Side, Current-Sense Transfer Function
30
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9.2.2 Single-Supply Photodiode Amplifier
Photodiodes are used in many applications to convert light signals to electrical signals. The current through
the photodiode is proportional to the photon energy absorbed, and is commonly in the range of a few hundred
picoamps to a few tens of microamps. An amplifier in a transimpedance configuration is typically used to convert
the low-level photodiode current to a voltage signal for processing in an MCU. The circuit shown in Figure 9-3 is
an example of a single-supply photodiode amplifier circuit using the TLV9002.
+3.3V
R1
11.5 NŸ
CF
10 pF
R2
357 Ÿ
RF
309 NŸ
VREF
3.3 V
±
VOUT
TLV9002
VREF
IIN
0-10 µA
+
CPD
47 pF
RL
10 k
Figure 9-3. Single-Supply Photodiode Amplifier Circuit
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9.2.2.1 Design Requirements
The design requirements for this design are:
•
•
•
•
Supply voltage: 3.3 V
Input: 0 µA to 10 µA
Output: 0.1 V to 3.2 V
Bandwidth: 50 kHz
9.2.2.2 Detailed Design Procedure
The transfer function between the output voltage (VOUT), the input current, (IIN) and the reference voltage (VREF)
is defined in Equation 5.
VOUT
IIN u RF
VREF
(5)
§ R u R2 ·
V u¨ 1
¸
© R1 R2 ¹
(6)
Where:
VREF
Set VREF to 100 mV to meet the minimum output voltage level by setting R1 and R2 to meet the required ratio
calculated in Equation 7.
VREF
V
0.1 V
3.3 V
0.0303
(7)
The closest resistor ratio to meet this ratio sets R1 to 11.5 kΩ and R2 to 357 Ω.
The required feedback resistance can be calculated based on the input current and desired output voltage.
RF
VOUT VREF
IIN
3.2 V 0.1 V
10 PA
310
kV
| 309 k:
A
(8)
Calculate the value for the feedback capacitor based on RF and the desired –3-dB bandwidth, (f–3dB) using
Equation 9.
CF
1
2 u S u RF u f
3dB
1
2 u S u 309 k: u 50 kHz
10.3 pF | 10 pF
(9)
The minimum op amp bandwidth required for this application is based on the value of RF, CF, and the
capacitance on the INx– pin of the TLV9002 which is equal to the sum of the photodiode shunt capacitance,
(CPD) the common-mode input capacitance, (CCM) and the differential input capacitance (CD) as Equation 10
shows.
CIN
CPD
CCM CD
47 pF 5 pF 1 pF
53 pF
(10)
The minimum op amp bandwidth is calculated in Equation 11.
f
BGW
t
CIN
CF
2 u S u RF u CF2
t 324 kHz
(11)
The 1-MHz bandwidth of the TLV900x meets the minimum bandwidth requirement and remains stable in this
application configuration.
32
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9.2.2.3 Application Curves
The measured current-to-voltage transfer function for the photodiode amplifier circuit is shown in Figure 9-4. The
measured performance of the photodiode amplifier circuit is shown in Figure 9-5.
3
120
2.5
Output Voltage (V)
Gain (dB)
100
80
2
1.5
1
60
0.5
40
10
0
100
1k
10k
Frequency (Hz)
100k
1M
0
2E-6
D001
Figure 9-4. Photodiode Amplifier Circuit AC Gain
Results
4E-6
6E-6
Input Current (A)
8E-6
1E-5
D002
Figure 9-5. Photodiode Amplifier Circuit DC
Results
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10 Power Supply Recommendations
The TLV900x family is specified for operation from 1.8 V to 5.5 V (±0.9 V to ±2.75 V); many specifications
apply from –40°C to 125°C. Section 7.11 presents parameters that may exhibit significant variance with regard to
operating voltage or temperature.
CAUTION
Supply voltages larger than 6 V may permanently damage the device; see Section 7.1.
Place 0.1-µF bypass capacitors close to the power-supply pins to reduce coupling errors from noisy or highimpedance power supplies. For more detailed information on bypass capacitor placement, see Section 11.1.
10.1 Input and ESD Protection
The TLV900x family incorporates internal ESD protection circuits on all pins. For input and output pins, this
protection primarily consists of current-steering diodes connected between the input and power-supply pins.
These ESD protection diodes provide in-circuit, input overdrive protection, as long as the current is limited to
10 mA. Figure 10-1 shows how a series input resistor can be added to the driven input to limit the input current.
The added resistor contributes thermal noise at the amplifier input and the value must be kept to a minimum in
noise-sensitive applications.
V+
IOVERLOAD
10-mA maximum
Device
VOUT
VIN
5 kW
Figure 10-1. Input Current Protection
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11 Layout
11.1 Layout Guidelines
For best operational performance of the device, use good printed circuit board (PCB) layout practices, including:
•
•
•
•
•
•
•
•
Noise can propagate into analog circuitry through the power connections of the board and propagate to the
power pins of the op amp itself. Bypass capacitors are used to reduce the coupled noise by providing a
low-impedance path to ground.
– Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as
close to the device as possible. A single bypass capacitor from V+ to ground is adequate for single-supply
applications.
Separate grounding for analog and digital portions of circuitry is one of the simplest and most effective
methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to ground planes.
A ground plane helps distribute heat and reduces electromagnetic interference (EMI) noise pickup. Take care
to physically separate digital and analog grounds, paying attention to the flow of the ground current.
To reduce parasitic coupling, run the input traces as far away from the supply or output traces as possible.
If these traces cannot be kept separate, crossing the sensitive trace at a 90 degree angle is much better as
opposed to running the traces in parallel with the noisy trace.
Place the external components as close to the device as possible, as shown in Figure 11-2. Keeping RF and
RG close to the inverting input minimizes parasitic capacitance.
Keep the length of input traces as short as possible. Remember that the input traces are the most sensitive
part of the circuit.
Consider a driven, low-impedance guard ring around the critical traces. A guard ring may significantly reduce
leakage currents from nearby traces that are at different potentials.
Cleaning the PCB following board assembly is recommended for best performance.
Any precision integrated circuit can experience performance shifts resulting from moisture ingress into the
plastic package. Following any aqueous PCB cleaning process, baking the PCB assembly is recommended
to remove moisture introduced into the device packaging during the cleaning process. A low-temperature,
post-cleaning bake at 85°C for 30 minutes is sufficient for most circumstances.
11.2 Layout Example
+
VIN 1
+
VIN 2
VOUT 1
RG
VOUT 2
RG
RF
RF
Figure 11-1. Schematic Representation
Place components
close to device and to
each other to reduce
parasitic errors .
OUT 1
VS+
OUT1
Use low-ESR,
ceramic bypass
capacitor . Place as
close to the device
as possible .
GND
V+
RF
OUT 2
GND
IN1 ±
OUT2
IN1 +
IN2 ±
RF
RG
VIN 1
GND
RG
V±
Use low-ESR,
ceramic bypass
capacitor . Place as
close to the device
as possible .
GND
VS±
IN2 +
Ground (GND) plane on another layer
VIN 2
Keep input traces short
and run the input traces
as far away from
the supply lines
as possible .
Figure 11-2. Layout Example
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Product Folder Links: TLV9001 TLV9002 TLV9004
35
TLV9001, TLV9002, TLV9004
www.ti.com
SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
12 Device and Documentation Support
12.1 Documentation Support
12.1.1 Related Documentation
For related documentation, see the following:
•
Texas Instruments, EMI Rejection Ratio of Operational Amplifiers
12.2 Receiving Notification of Documentation Updates
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
12.3 Support Resources
TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight
from the experts. Search existing answers or ask your own question to get the quick design help you need.
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do
not necessarily reflect TI's views; see TI's Terms of Use.
12.4 Trademarks
TI E2E™ is a trademark of Texas Instruments.
Bluetooth® is a registered trademark of Bluetooth SIG, Inc.
All trademarks are the property of their respective owners.
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
12.6 Glossary
TI Glossary
36
This glossary lists and explains terms, acronyms, and definitions.
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Product Folder Links: TLV9001 TLV9002 TLV9004
TLV9001, TLV9002, TLV9004
www.ti.com
SBOS833R – OCTOBER 2017 – REVISED NOVEMBER 2021
13 Mechanical, Packaging, and Orderable Information
The following pages include mechanical, packaging, and orderable information. This information is the mostcurrent data available for the designated devices. This data is subject to change without notice and without
revision of this document. For browser-based versions of this data sheet, see the left-hand navigation pane.
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Product Folder Links: TLV9001 TLV9002 TLV9004
37
PACKAGE OPTION ADDENDUM
www.ti.com
18-Nov-2021
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
TLV9001IDBVR
ACTIVE
SOT-23
DBV
5
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1OGF
TLV9001IDCKR
ACTIVE
SC70
DCK
5
3000
RoHS & Green
SN
Level-2-260C-1 YEAR
-40 to 125
1BZ
TLV9001IDPWR
ACTIVE
X2SON
DPW
5
3000
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
DF
TLV9001SIDBVR
ACTIVE
SOT-23
DBV
6
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1OJF
TLV9001SIDCKR
ACTIVE
SC70
DCK
6
3000
RoHS & Green
SN
Level-2-260C-1 YEAR
-40 to 125
1F8
TLV9001TIDCKR
ACTIVE
SC70
DCK
5
3000
RoHS & Green
SN
Level-2-260C-1 YEAR
-40 to 125
1D6
TLV9001UIDBVR
ACTIVE
SOT-23
DBV
5
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1ODF
TLV9002IDDFR
ACTIVE
SOT-23-THIN
DDF
8
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
T902
TLV9002IDGKR
ACTIVE
VSSOP
DGK
8
2500
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
1GNX
TLV9002IDGKT
ACTIVE
VSSOP
DGK
8
250
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
1GNX
TLV9002IDR
ACTIVE
SOIC
D
8
2500
RoHS & Green
SN
Level-2-260C-1 YEAR
-40 to 125
TL9002
TLV9002IDSGR
ACTIVE
WSON
DSG
8
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1GMH
TLV9002IDSGT
ACTIVE
WSON
DSG
8
250
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
1GMH
TLV9002IPWR
ACTIVE
TSSOP
PW
8
2000
RoHS & Green
NIPDAU | SN
Level-2-260C-1 YEAR
-40 to 125
9002
TLV9002SIDGSR
ACTIVE
VSSOP
DGS
10
2500
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
1GDX
TLV9002SIRUGR
ACTIVE
X2QFN
RUG
10
3000
RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
-40 to 125
ENF
TLV9002SIYCKR
ACTIVE
DSBGA
YCK
9
3000
RoHS & Green
SNAGCU
Level-1-260C-UNLIM
-40 to 125
JK
TLV9004IDR
ACTIVE
SOIC
D
14
2500
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
TLV9004
TLV9004IDYYR
ACTIVE
SOT-23-THIN
DYY
14
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
TLV9004I
TLV9004IPWR
ACTIVE
TSSOP
PW
14
2000
RoHS & Green
SN
Level-2-260C-1 YEAR
-40 to 125
TLV9004
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
Orderable Device
18-Nov-2021
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
(2)
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
(6)
TLV9004IRTER
ACTIVE
WQFN
RTE
16
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
T9004
TLV9004IRUCR
ACTIVE
QFN
RUC
14
3000
RoHS & Green
NIPDAU
Level-2-260C-1 YEAR
-40 to 125
1DC
TLV9004SIRTER
ACTIVE
WQFN
RTE
16
3000
RoHS & Green
NIPDAU
Level-1-260C-UNLIM
-40 to 125
T9004S
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of