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UCC27321-Q1, UCC27322-Q1
SLUSA13D – FEBRUARY 2010 – REVISED SEPTEMBER 2016
UCC2732x-Q1 Single 9-A High-Speed Low-Side MOSFET Driver With Enable
1 Features
3 Description
•
•
The UCC2732x-Q1 family of high-speed drivers
delivers 9 A of peak drive current in an industrystandard pinout. These drivers can drive large
MOSFETs for systems requiring extreme Miller
current due to high dV/dt transitions. This eliminates
additional external circuits and can replace multiple
components to reduce space, design complexity, and
assembly cost. Two standard logic options are
offered, inverting (UCC27321-Q1) and noninverting
(UCC27322-Q1).
1
•
•
•
•
•
•
•
•
•
Qualified for Automotive Applications
AEC-Q100 Qualified With the Following Results:
– Device Temperature Grade 1: –40°C to 125°C
Ambient Operating Temperature Range
– Device HBM ESD Classification Level 2
– Device CDM ESD Classification Level C6
Industry-Standard Pinout With Addition of Enable
Function
High Peak-Current Drive Capability of ±9 A at the
Miller Plateau Region Using TrueDrive™
Technology
Efficient Constant-Current Sourcing Using a
Unique Bipolar and CMOS Output Stage
TTL and CMOS-Compatible Inputs Independent of
Supply Voltage
20-ns Typical Rise and 15-ns Typical Fall Times
With 10-nF Load
Typical Propagation Delay Times of 25 ns With
Input Falling and 35 ns With Input Rising
4-V to 15-V Supply Voltage
Available in Thermally Enhanced MSOP
PowerPAD™ Package
TrueDrive Output Architecture Using Bipolar and
CMOS Transistors in Parallel
Device Information(1)
PART NUMBER
2 Applications
•
•
•
•
•
•
Using a design that minimizes shoot-through current,
the outputs of these devices can provide high gate
drive current where it is most needed at the Miller
plateau region during the MOSFET switching
transition. A unique hybrid-output stage paralleling
bipolar and MOSFET transistors (TrueDrive) allows
efficient current delivery at low supply voltages. With
this drive architecture, UCC2732x-Q1 can be used in
industry standard 6-A, 9-A, and many 12-A driver
applications. Latch-up and ESD protection circuits are
also included. Finally, the UCC2732x-Q1 provides an
enable (ENBL) function to better control the operation
of the driver applications. ENBL is implemented on
pin 3, which was previously left unused in the
industry-standard pinout. It is internally pulled up to
VDD for active-high logic and can be left open for
standard operation.
Switch-Mode Power Supplies
DC-DC Converters
Motor Controllers
Line Drivers
Class-D Switching Amplifiers
Pulse Transformer Driver
PACKAGE
BODY SIZE (NOM)
UCC27321-Q1,
UCC27322-Q1
SOIC (8)
UCC27322-Q1
MSOP-PowerPAD (8) 4.90 mm × 3.00 mm
6.00 mm × 4.90 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
Functional Block Diagram
INPUT/OUTPUT TABLE
VDD
1
8
VDD
INVERTING
7
OUT
VDD
IN
2
NON
INVERTING
6
AGND
IN
OUT
0
0
0
0
1
0
1
0
1
1
1
0
0
0
0
0
1
0
1
0
0
1
1
1
OUT
R ENBL
ENBL
INVERTING
UCC27321-Q1
ENBL
NON
INVERTING
UCC27322-Q1
3
4
5
PGND
Copyright © 2016, Texas Instruments Incorporated
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
UCC27321-Q1, UCC27322-Q1
SLUSA13D – FEBRUARY 2010 – REVISED SEPTEMBER 2016
www.ti.com
Table of Contents
1
2
3
4
5
6
7
8
9
Features ..................................................................
Applications ...........................................................
Description .............................................................
Revision History.....................................................
Description (Continued) ........................................
Device Comparison Table.....................................
Pin Configuration and Functions .........................
Specifications.........................................................
1
1
1
2
3
3
3
4
8.1
8.2
8.3
8.4
8.5
8.6
8.7
4
4
4
4
5
5
7
Absolute Maximum Ratings ......................................
ESD Ratings..............................................................
Recommended Operating Conditions.......................
Thermal Information ..................................................
Electrical Characteristics...........................................
Switching Characteristics ..........................................
Typical Characteristics ..............................................
Detailed Description ............................................ 11
9.1 Overview ................................................................. 11
9.2 Functional Block Diagram ....................................... 11
9.3 Feature Description................................................. 11
9.4 Device Functional Modes........................................ 15
10 Application and Implementation........................ 16
10.1 Application Information.......................................... 16
10.2 Typical Application ................................................ 16
11 Power Supply Recommendations ..................... 19
12 Layout................................................................... 19
12.1
12.2
12.3
12.4
Layout Guidelines .................................................
Layout Example ....................................................
Thermal Considerations ........................................
Power Dissipation .................................................
19
20
20
21
13 Device and Documentation Support ................. 22
13.1
13.2
13.3
13.4
13.5
13.6
13.7
Documentation Support ........................................
Related Links ........................................................
Receiving Notification of Documentation Updates
Community Resources..........................................
Trademarks ...........................................................
Electrostatic Discharge Caution ............................
Glossary ................................................................
22
22
22
22
22
22
22
14 Mechanical, Packaging, and Orderable
Information ........................................................... 23
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision C (January 2012) to Revision D
Page
•
Added Device Information table, ESD Ratings table, Feature Description section, Device Functional Modes,
Application and Implementation section, Power Supply Recommendations section, Layout section, Device and
Documentation Support section, and Mechanical, Packaging, and Orderable Information section....................................... 1
•
Changed UCC3732x to UCC2732x-Q1 throughout document............................................................................................... 1
•
Deleted Ordering Information table; see POA added at the end of the data sheet ............................................................... 1
•
Changed table descriptions for AGND and PGND................................................................................................................. 3
•
Updated values in the Thermal Information table to align with JEDEC standards................................................................. 4
•
Changed x-axis values from 1, 10, 100 to 0.1, 1, 10 in Rise Time vs Load Capacitance graph ........................................... 7
•
Deleted note reference [1] .................................................................................................................................................... 12
Changes from Revision B (January 2011) to Revision C
•
2
Page
Changed enable impedance maximum from 135 kΩ to 145 kΩ ............................................................................................ 5
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SLUSA13D – FEBRUARY 2010 – REVISED SEPTEMBER 2016
5 Description (Continued)
In addition to 8-pin SOIC (D) package offerings, the UCC2732x-Q1 also comes in the thermally enhanced but
tiny 8-pin MSOP-PowerPAD (DGN) package. The PowerPAD package drastically lowers the thermal resistance
to extend the temperature operation range and improve long-term reliability.
6 Device Comparison Table
Table 1. Related Products
PRODUCT
DESCRIPTION
PACKAGE
UCC2742x-Q1
Dual 4-A low-side drivers with enable
MSOP-8 PowerPAD, SOIC-8, PDIP-8
TPS2811-Q1
Dual 2-A low-side drivers with internal regulator
TSSOP-8, SOIC-8, PDIP-8
TPS2819-Q1
Single 2-A low-side driver with internal regulator
5-pin SOT-23
TPS2829-Q1
Single 2-A low-side driver
5-pin SOT-23
7 Pin Configuration and Functions
D Package
8-Pin SOIC
Top View
DGN Package
8-Pin MSOP with PowerPAD
Top View
VDD
1
8
VDD
IN
2
7
OUT
ENBL
3
6
OUT
AGND
4
5
PGND
VDD
1
IN
2
8
VDD
7
OUT
PowerPAD
ENBL
3
6
OUT
AGND
4
5
PGND
Not to scale
Not to scale
Pin Functions
PIN
NAME
NO.
TYPE
DESCRIPTION
The AGND and the PGND must be connected by a single thick trace directly under the device. There
must be a low ESR, low ESL capacitor of 0.1 µF between VDD (pin 1) and AGND. The power MOSFETs
must be placed on the PGND side of the device while the control circuit must be on the AGND side of the
device. The control circuit ground must be common with the AGND while the PGND must be common
with the source of the power FETs.
AGND
4
GND
ENBL
3
I
Enable input for the driver with logic-compatible threshold and hysteresis. The driver output can be
enabled and disabled with this pin. It is internally pulled up to VDD with a pullup resistor for active-high
operation. The output state when the device is disabled is low, regardless of the input state.
IN
2
I
Input signal of the driver, which has logic-compatible threshold and hysteresis. For UCC27321-Q1, IN is
inverting, and for UCC37322-Q1, IN is noninverting.
6, 7
O
Driver outputs that must be connected together externally. The output stage is capable of providing 9-A
peak drive current to the gate of a power MOSFET.
5
GND
Common ground for output stage. This ground must be connected very close to the source of the power
MOSFET which the driver is driving. Grounds are separated to minimize ringing effects due to output
switching di/dt, which can affect the input threshold. There must be a low ESR, low ESL capacitor of 0.1
µF between VDD (pin 8) and PGND.
VDD
1, 8
PWR
Supply voltage and the power input connections for this device. These pins must be connected together
externally.
PowerPAD
Pad
GND
PowerPAD on DGN package only. The PowerPAD thermal pad is not directly connected to any leads of
the package. However, it is electrically and thermally connected to the substrate, which is the ground of
the device.
OUT
PGND
Copyright © 2010–2016, Texas Instruments Incorporated
Product Folder Links: UCC27321-Q1 UCC27322-Q1
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UCC27321-Q1, UCC27322-Q1
SLUSA13D – FEBRUARY 2010 – REVISED SEPTEMBER 2016
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8 Specifications
8.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1) (2)
Supply voltage
Output current
MIN
MAX
UNIT
–0.3
16
V
0.6
A
–5
6 or
VDD + 0.3
V
650
mW
OUT
Input voltage
IN, ENBL
D package
Power dissipation at TA = 25°C
DGN package
3
W
Operating junction temperature, TJ
–55
150
°C
Storage temperature, Tstg
–65
150
°C
(1)
(2)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltages are with respect to GND. Currents are positive into and negative out of the specified terminal.
8.2 ESD Ratings
VALUE
V(ESD)
(1)
Electrostatic discharge
Human-body model (HBM), per AEC Q100-002
(1)
2000
Charged-device model (CDM), per AEC Q100-011
1000
UNIT
V
AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
8.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
VDD
Supply voltage
VDD
MIN
MAX
4.5
15
UNIT
V
8.4 Thermal Information
THERMAL METRIC (1) (2) (3)
UCC2732x-Q1
UCC27322-Q1
D (SOIC)
DGN (MSOPPowerPAD)
UNIT
8 PINS
8 PINS
RθJA
Junction-to-ambient thermal resistance
113
58.6
°C/W
RθJC(top)
Junction-to-case (top) thermal resistance
61.7
45.3
°C/W
RθJB
Junction-to-board thermal resistance
53.2
34.3
°C/W
ψJT
Junction-to-top characterization parameter
16
1.7
°C/W
ψJB
Junction-to-board characterization parameter
52.7
34
°C/W
RθJC(bot)
Junction-to-case (bottom) thermal resistance
—
11.9
°C/W
(1)
(2)
(3)
4
For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
In general, the system designer must attempt to use larger traces on the PCB where possible to spread the heat away from the device
more effectively. For information on the PowerPAD package, see PowerPad™ Thermally Enhanced Package and PowerPad™ Made
Easy.
The PowerPAD thermal pad is not directly connected to any leads of the package. However, it is electrically and thermally connected to
the substrate, which is the ground of the device.
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SLUSA13D – FEBRUARY 2010 – REVISED SEPTEMBER 2016
8.5 Electrical Characteristics
VDD = 4.5 V to 15 V, TJ = TA = –40°C to 125°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
IN = Low, ENBL = Low, VDD = 15 V
UCC27321-Q1
IN = High, ENBL = Low, VDD = 15 V
IDD
Static operating current
IN = Low, ENBL = High, VDD = 15 V
UCC27322-Q1
IN = High, ENBL = High, VDD = 15 V
TYP
MAX
150
225
440
650
370
550
370
550
150
225
450
650
75
125
675
1000
UNIT
µA
INPUT (IN)
VIH
Logic 1 input threshold
VIL
Logic 0 input threshold
2
0 V ≤ VIN ≤ VDD
Input current
V
–10
Latch-up protection (1)
0
1
V
10
µA
500
mA
OUTPUT (OUT)
Peak output current (1) (2)
VDD = 14 V
VOH
High-level output voltage
VOH = VDD – VOUT, IOUT = –10 mA
VOL
Low-level output voltage
IOUT = 10 mA
Output resistance high
(3)
Output resistance low (3)
9
A
150
300
mV
11
25
mV
Ω
IOUT = –10 mA, VDD = 14 V
15
25
IOUT = 10 mA, VDD = 14 V
1.1
2.5
Latch-up protection (1)
500
Ω
mA
ENABLE (ENBL)
VEN_H
Enable rising threshold voltage
Low-to-high transitions
1.5
2.2
2.7
V
VEN_L
Enable falling threshold voltage
High-to-low transition
1.1
1.65
2
V
0.18
0.55
0.9
V
75
Hysteresis
R(ENBL)
Enable impedance
VDD = 14 V, ENBL = Low
100
145
kΩ
tD3
Propagation delay time
CLOAD = 10 nF (see Figure 2)
60
95
ns
tD4
Propagation delay time
CLOAD = 10 nF (see Figure 2)
60
95
ns
(1)
(2)
(3)
Specified by design
The pullup and pulldown circuits of the driver are bipolar and MOSFET transistors in parallel. The pulsed output current rating is the
combined current from the bipolar and MOSFET transistors.
The pullup and pulldown circuits of the driver are bipolar and MOSFET transistors in parallel. The output resistance is the RDS(ON) of the
MOSFET transistor when the voltage on the driver output is less than the saturation voltage of the bipolar transistor.
8.6 Switching Characteristics
VDD = 4.5 V to 15 V, TJ = TA = –40°C to 125°C (unless otherwise noted) (see Figure 1)
TYP
MAX
tR
Rise time (OUT)
PARAMETER
CLOAD = 10 nF
TEST CONDITIONS
20
75
ns
tF
Fall time (OUT)
CLOAD = 10 nF
20
35
ns
tD1
Delay time, IN rising (IN to OUT)
CLOAD = 10 nF
25
75
ns
tD2
Delay time, IN falling (IN to OUT)
CLOAD = 10 nF
35
75
ns
Copyright © 2010–2016, Texas Instruments Incorporated
Product Folder Links: UCC27321-Q1 UCC27322-Q1
MIN
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UNIT
5
UCC27321-Q1, UCC27322-Q1
SLUSA13D – FEBRUARY 2010 – REVISED SEPTEMBER 2016
www.ti.com
(a)
(b)
5V
IN
VTH
0V
tD1
VTH
IN
VTH
tD2
VTH
tD1
tD2
tF
VDD
80%
80%
80%
tR
OUT
80%
tR
OUT
20%
tF
20%
0V
The 20% and 80% thresholds depict the dynamics of the bipolar output devices that dominate the power MOSFET
transition through the Miller regions of operation.
Figure 1. Switching Waveforms for Inverting Driver (a) and Noninverting Driver (b)
5V
ENBL
VIN_L
VIN_H
0V
tD3
tD4
VDD
80%
80%
tF
tR
OUT
20%
0V
The 20% and 80% thresholds depict the dynamics of the bipolar output devices that dominate the power MOSFET
transition through the Miller regions of operation.
Figure 2. Switching Waveforms for Enable to Output
6
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SLUSA13D – FEBRUARY 2010 – REVISED SEPTEMBER 2016
8.7 Typical Characteristics
700
700
600
ENBL = 0V
IN = 5V
500
400
IDD – InputCurrentIdle – μA
IDD – InputCurrentIdle – μA
600
ENBL = VDD
IN = 5V
300
ENBL = 0V
IN = 0V
200
ENBL = 0V
IN = 5V
500
400
ENBL = 0V
IN = 0V
300
ENBL = VDD
IN = 5V
200
ENBL = VDD , IN = 0V
100
100
ENBL = VDD , IN = 0V
0
0
2
0
4
6
8
10
12
VDD – Supply Voltage – V
14
16
0
700
700
IDD – InputCurrentIdle – μA
IDD – InputCurrentIdle – μA
800
ENBL = HI
IN = LO
ENBL = HI
IN = HI
500
400
ENBL = LO
IN = LO
300
6
8
10
12
14
16
Figure 4. Input Current Idle vs
Supply Voltage (UCC27322-Q1)
800
ENBL = LO
IN = HI
4
VDD – Supply Voltage – V
Figure 3. Input Current Idle vs
Supply Voltage (UCC27321-Q1)
600
2
200
ENBL = HIIGH
IN =HIIGH
600
ENBL = LOW
500
IN = HIIGH
400
ENBL = LOW
IN = LOW
300
ENBL = HIIGH
IN = LOW
200
100
100
0
-- 50
-- 25
0
25
50
75
100
125
0
-- 50
-- 25
TJ – Temperature – °C
0
25
50
100
75
125
TJ – Temperature – °C
Figure 5. Input Current Idle vs Temperature (UCC27321-Q1)
Figure 6. Input Current Idle vs Temperature (UCC27322-Q1)
70
CLOAD = 10 n F
CLOAD = 10 nF
60
tA = – 40°C
tR – Rise Time – ns
50
40
tA = 105°C
tA = 25°C
30
20
tA = 0°C
10
0
4
6
8
10
12
14
16
VDD – Supply Voltage – V
Figure 7. Rise Time vs Supply Voltage
Figure 8. Fall Time vs Supply Voltage
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Typical Characteristics (continued)
40
200
VDD = 5 V
VDD = 5 V
160
VDD = 10 V
VDD = 10 V
VDD = 15 V
tR – Fall Time – ns
tR – Rise Time – ns
30
VDD = 15 V
20
120
80
10
40
0
0.1
1
0
10
0.1
1
CLOAD – Load Capacitance – nF
CLOAD –- Load Capacitance – nF
10
Figure 10. Fall Time vs Output Capacitance
Figure 9. Rise Time vs Load Capacitance
70
70
CLOAD = 10 n F
CLOAD = 10 n F
tA = 105°C
60
60
tA = 25°C
50
tD2 – Delay Time -- ns
tD1 -– Delay Time -- ns
tA = 105°C
50
tA = 25°C
40
30
20
40
30
tA = 0°C
20
tA = –40°C
tA = –40°C
10
10
tA = 0°C
0
0
4
6
8
10
12
14
16
4
6
VDD – Supply Voltage – V
10
12
14
16
Figure 12. tD2 Delay Time vs Supply Voltage
70
70
60
60
VDD = 5 V
50
VDD = 5 V
tD2 – Delay Time – ns
tD1 – Delay Time –- ns
Figure 11. tD1 Delay Time vs Supply Voltage
VDD = 10 V
40
30
20
50
40
30
VDD = 15 V
VDD = 10 V
20
VDD = 15 V
10
10
0
1
10
100
CLOAD – Load Capacitance – nF
Figure 13. tD1 Delay Time vs Load Capacitance
8
8
VDD – Supply Voltage – V
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0
1
10
CLOAD – Load Capacitance – nF
100
Figure 14. tD2 Delay Time vs Load Capacitance
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SLUSA13D – FEBRUARY 2010 – REVISED SEPTEMBER 2016
Typical Characteristics (continued)
2.0
50
45
VDD = 15 V
CLOAD = 10 n F
TA = 25°C
tD2
Propagation Time -- ns
tRISE
35
30
25
20
15
10
tFALL
tD1
1.9
VON – Input Threshold Voltage – V
40
1.8
1.7
1.6
1.5
VDD = 10 V
VDD = 4. 5 V
1.4
1.3
5
0
0
5
10
VIN(peak) – Peak Input Voltage – V
1.2
--50
15
-- 25
0
25
50
75
100
125
TJ – Temperature – °C
Figure 15. Propagation Times vs Peak Input Voltage
Figure 16. Input Threshold vs Temperature
150
3.0
140
ENBL -- ON
2.5
130
RENBL – Enable Resistance – Ω
Enable thresholdand hysteresis – V
VDD = 15 V
2.0
1.5
1.0
ENBL -- OFF
120
110
100
90
80
70
0.5
60
ENBL -- HYSTERESIS
0
-- 50
-- 25
0
25
50
75
TJ – Temperature –°C
100
50
-- 50
125
--25
0
25
50
75
Figure 17. Enable Threshold and Hysteresis vs Temperature
125
Figure 18. Enable Resistance vs Temperature
IN = GND
ENBL = VDD
VDD – Input Voltage – V
1 V/div
IN = GND
ENBL = V DD
VDD – Input Voltage – V
1 V/div
100
TJ – Temperature – °C
VDD
OUT
OUT
0V
0V
10 nF Between Output and GND
50 μs/div
Figure 19. Output Behavior vs VDD (UCC27321-Q1)
VDD
10 nF Between Output and GND
50 μs/div
Figure 20. Output Behavior vs VDD (UCC27321-Q1)
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Typical Characteristics (continued)
IN = VDD
ENBL = VDD
VDD – Supply Voltage – V
1 V/div
VDD – Supply Voltage – V
1 V/div
IN = VDD
ENBL = VDD
VDD
OUT
VDD
OUT
0V
0V
10 nF Between Output and GND
50 μs/div
Figure 21. Output Behavior vs VDD (Inverting)
10 nF Between Output and GND
50 μs/div
Figure 22. Output Behavior vs VDD (Inverting)
IN = GND
ENBL = VDD
VDD
OUT
0V
10
VDD – Supply Voltage – V
1 V/div
VDD – Supply Voltage – V
1 V/div
IN = GND
ENBL = VDD
VDD
OUT
0V
10 nF Between Output and GND
50 μs/div
10 nF Between Output and GND
50 μs/div
Figure 23. Output Behavior vs VDD (Noninverting)
Figure 24. Output Behavior vs VDD (Noninverting)
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Product Folder Links: UCC27321-Q1 UCC27322-Q1
UCC27321-Q1, UCC27322-Q1
www.ti.com
SLUSA13D – FEBRUARY 2010 – REVISED SEPTEMBER 2016
9 Detailed Description
9.1 Overview
The UCC27321-Q1 and UCC27322-Q1 drivers serve as an interface between low-power controllers (discrete
controllers, DSPs, MCUs, or microprocessors) and power MOSFETs. High-frequency power supplies often
require high-speed, high-current drivers such as the UCC2732x-Q1 family. A leading application provides a highpower buffer stage between the PWM output of the control device and the gates of the primary power MOSFET
or IGBT switching devices. In other cases, the device drives the power device gates through a drive transformer.
Synchronous rectification supplies also have the need to drive multiple devices simultaneously, which can
present an extremely large load to the control circuitry.
The inverting driver (UCC27321-Q1) is useful for generating inverted gate-drive signals from controllers that have
outputs of the opposite polarity. For example, this driver can provide a gate signal for ground-referenced, Nchannel synchronous rectifier MOSFETs in buck derived converters. This driver can also be used for generating
a gate-drive signal for a P-channel MOSFET from a controller that is designed for N-channel applications.
MOSFET gate drivers are generally used when it is not feasible to have the primary PWM regulator device
directly drive the switching devices for one or more reasons. The PWM device may not have the brute drive
capability required for the intended switching MOSFET, limiting the switching performance in the application. In
other cases, there may be a desire to minimize the effect of high-frequency switching noise by placing the highcurrent driver physically close to the load. Also, newer devices that target the highest operating frequencies may
not incorporate onboard gate drivers at all. Their PWM outputs are only intended to drive the high-impedance
input to a driver such as the UCC2732x-Q1. Finally, the control device may be under thermal stress due to power
dissipation and an external driver can help by moving the heat from the controller to an external package.
9.2 Functional Block Diagram
INPUT/OUTPUT TABLE
VDD
1
8
VDD
INVERTING
7
OUT
VDD
IN
2
NON
INVERTING
6
AGND
IN
OUT
0
0
0
0
1
0
1
0
1
1
1
0
0
0
0
0
1
0
1
0
0
1
1
1
OUT
R ENBL
ENBL
INVERTING
UCC27321-Q1
ENBL
NON
INVERTING
UCC27322-Q1
3
4
5
PGND
Copyright © 2016, Texas Instruments Incorporated
9.3 Feature Description
9.3.1 Input Stage
The IN threshold has a 3.3-V logic sensitivity over the full range of VDD voltage; yet, it is equally compatible with
0-V to VDD signals. The inputs of UCC2732x-Q1 family of drivers are designed to withstand 500-mA reverse
current without either damage to the device or logic upset. In addition, the input threshold turnoff of the
UCC2732x-Q1 is slightly raised for improved noise immunity. The input stage of each driver must be driven by a
signal with a short rise or fall time. This condition is satisfied in typical power-supply applications, where the input
signals are provided by a PWM controller or logic gates with fast transition times (