5962-9459901MXA

STK12C68-5 (SMD5962-94599) 64 Kbit (8 K x 8) AutoStore nvSRAM Features Functional Description ■ 35 ns and 55 ns access times ■ Hands off automatic STORE on power down with external 68 µF capacitor ■ STORE to QuantumTrap™ nonvolatile elements is initiated by software, hardware, or AutoStore™ on power down ■ RECALL to SRAM initiated by software or power up ■ Unlimited Read, Write, and Recall cycles ■ 1,000,000 STORE cycles to QuantumTrap ■ 100 year data retention to QuantumTrap The Cypress STK12C68-5 is a fast static RAM with a nonvolatile element in each memory cell. The embedded nonvolatile elements incorporate QuantumTrap technology producing the world’s most reliable nonvolatile memory. The SRAM provides unlimited read and write cycles, while independent nonvolatile data resides in the highly reliable QuantumTrap cell. Data transfers from the SRAM to the nonvolatile elements (the STORE operation) takes place automatically at power down. On power up, data is restored to the SRAM (the RECALL operation) from the nonvolatile memory. Both the STORE and RECALL operations are also available under software control. A hardware STORE is initiated with the HSB pin. ■ Single 5 V + 10% operation For a complete list of related documentation, click here. ■ Military temperature ■ 28-pin (300mil) CDIP and 28-pad LCC packages Logic Block Diagram Quantum Trap 128 X 512 A5 STORE ROW DECODER A6 A7 A8 A9 A 11 STATIC RAM ARRAY 128 X 512 RECALL VCC VCAP POWER CONTROL STORE/ RECALL CONTROL HSB SOFTWARE DETECT A 12 DQ 0 - A12 A0 COLUMN I/O INPUT BUFFERS DQ 1 DQ 2 DQ 3 DQ 4 DQ 5 DQ 6 COLUMN DEC A 0 A 1 A 2 A 3 A 4 A 10 DQ 7 OE CE WE Cypress Semiconductor Corporation Document Number: 001-51026 Rev. *C • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised April 2, 2015 STK12C68-5 (SMD5962-94599) Contents Pinouts .............................................................................. Pin Definitions .................................................................. Device Operation .............................................................. SRAM Read ....................................................................... SRAM Write ....................................................................... AutoStore Operation ........................................................ AutoStore Inhibit Mode .................................................... Hardware STORE (HSB) Operation................................. Hardware RECALL (Power Up)........................................ Software STORE ............................................................... Software RECALL............................................................. Data Protection ................................................................. Noise Considerations....................................................... Hardware Protect.............................................................. Low Average Active Power.............................................. Preventing Store............................................................... Best Practices................................................................... Maximum Ratings............................................................. Operating Range .............................................................. DC Electrical Characteristics .......................................... Document Number: 001-51026 Rev. *C 3 3 4 4 4 4 5 5 5 5 5 6 6 6 6 6 7 8 8 8 Data Retention and Endurance ....................................... 9 Capacitance ...................................................................... 9 Thermal Resistance.......................................................... 9 AC Test Conditions .......................................................... 9 SRAM Read Cycle .................................................... 10 SRAM Write Cycle..................................................... 11 AutoStore or Power Up RECALL .................................. 12 Software Controlled STORE/RECALL Cycle................ 13 Switching Waveform ...................................................... 14 Part Numbering Nomenclature...................................... 15 Ordering Information...................................................... 16 Acronyms ........................................................................ 17 Document Conventions ................................................. 17 Units of Measure ....................................................... 17 Document History Page ................................................ 18 Sales, Solutions, and Legal Information ...................... 18 Worldwide Sales and Design Support....................... 18 Products .................................................................... 18 PSoC Solutions ......................................................... 18 Page 2 of 18 STK12C68-5 (SMD5962-94599) Pinouts Figure 1. Pin Diagram - 28-Pin CDIP VCAP 1 28 VCC A12 2 27 A7 3 26 WE HSB A6 4 25 A8 A5 5 24 A9 A4 6 23 A11 A3 7 22 OE A2 8 21 A10 A1 9 20 A0 10 19 CE DQ7 DQ0 11 18 DQ6 DQ1 12 17 DQ5 DQ2 13 16 DQ4 VSS 14 15 DQ3 (TOP) Figure 2. Pin Diagram - 28-Pin LCC Pin Definitions Pin Name Alt A0–A12 IO Type Input DQ0-DQ7 Description Address Inputs. Used to select one of the 8,192 bytes of the nvSRAM. Input or Output Bidirectional Data IO Lines. Used as input or output lines depending on operation. WE W Input Write Enable Input, Active LOW. When the chip is enabled and WE is LOW, data on the I/O pins is written to the specific address location. CE E Input Chip Enable Input, Active LOW. When LOW, selects the chip. When HIGH, deselects the chip. OE G Input Output Enable, Active LOW. The active LOW OE input enables the data output buffers during read cycles. Deasserting OE HIGH causes the I/O pins to tristate. VSS Ground Ground for the Device. The device is connected to ground of the system. VCC Power Supply Power Supply Inputs to the Device. HSB Input or Output Hardware Store Busy (HSB). When LOW, this output indicates a Hardware Store is in progress. When pulled low external to the chip, it initiates a nonvolatile STORE operation. A weak internal pull up resistor keeps this pin high if not connected (connection optional). VCAP Power Supply AutoStore Capacitor. Supplies power to nvSRAM during power loss to store data from SRAM to nonvolatile elements. Document Number: 001-51026 Rev. *C Page 3 of 18 STK12C68-5 (SMD5962-94599) Device Operation The STK12C68-5 nvSRAM is made up of two functional components paired in the same physical cell. These are an SRAM memory cell and a nonvolatile QuantumTrap cell. The SRAM memory cell operates as a standard fast static RAM. Data in the SRAM is transferred to the nonvolatile cell (the STORE operation) or from the nonvolatile cell to SRAM (the RECALL operation). This unique architecture enables the storage and recall of all cells in parallel. During the STORE and RECALL operations, SRAM Read and Write operations are inhibited. The STK12C68-5 supports unlimited reads and writes similar to a typical SRAM. In addition, it provides unlimited RECALL operations from the nonvolatile cells and up to one million STORE operations. During normal operation, the device draws current from VCC to charge a capacitor connected to the VCAP pin. This stored charge is used by the chip to perform a single STORE operation. If the voltage on the VCC pin drops below VSWITCH, the part automatically disconnects the VCAP pin from VCC. A STORE operation is initiated with power provided by the VCAP capacitor. Figure 3 shows the proper connection of the storage capacitor (VCAP) for automatic store operation. A charge storage capacitor between 68 µF and 220 µF (+20%) rated at 6 V must be provided. The voltage on the VCAP pin is driven to 5 V by a charge pump internal to the chip. A pull-up is placed on WE to hold it inactive during power up. Figure 3. AutoStore Mode A Write cycle is performed whenever CE and WE are LOW and HSB is HIGH. The address inputs must be stable prior to entering the Write cycle and must remain stable until either CE or WE goes HIGH at the end of the cycle. The data on the common I/O pins DQ0–7 are written into the memory if it has valid tSD, before the end of a WE controlled Write or before the end of an CE controlled Write. Keep OE HIGH during the entire Write cycle to avoid data bus contention on common I/O lines. If OE is left LOW, internal circuitry turns off the output buffers tHZWE after WE goes LOW. AutoStore Operation The STK12C68-5 stores data to nvSRAM using one of three storage operations: 1. Hardware store activated by HSB 2. Software store activated by an address sequence 3. AutoStore on device power down AutoStore operation is a unique feature of QuantumTrap technology and is enabled by default on the STK12C68-5. Document Number: 001-51026 Rev. *C WE 10k Ohm Vcc HSB 0.15 F Bypass SRAM Write VCAP 68 5F 6v, +20% The STK12C68-5 performs a Read cycle whenever CE and OE are LOW while WE and HSB are HIGH. The address specified on pins A0–12 determines the 8,192 data bytes accessed. When the Read is initiated by an address transition, the outputs are valid after a delay of tAA (Read cycle 1). If the Read is initiated by CE or OE, the outputs are valid at tACE or at tDOE, whichever is later (Read cycle 2). The data outputs repeatedly respond to address changes within the tAA access time without the need for transitions on any control input pins, and remains valid until another address change or until CE or OE is brought HIGH, or WE or HSB is brought LOW. 10k Ohm SRAM Read Vss In system power mode, both VCC and VCAP are connected to the +5 V power supply without the 68 F capacitor. In this mode, the AutoStore function of the STK12C68-5 operates on the stored system charge as power goes down. The user must, however, guarantee that VCC does not drop below 3.6 V during the 10 ms STORE cycle. To reduce unnecessary nonvolatile stores, AutoStore, and Hardware Store operations are ignored, unless at least one Write operation has taken place since the most recent STORE or RECALL cycle. Software initiated STORE cycles are performed regardless of whether a Write operation has taken place. An optional pull-up resistor is shown connected to HSB. The HSB signal is monitored by the system to detect if an AutoStore cycle is in progress. Page 4 of 18 STK12C68-5 (SMD5962-94599) Vcc WE 10k Ohm VCAP 10k Ohm 0.15 F Bypass Figure 4. AutoStore Inhibit Mode HSB During any STORE operation, regardless of how it is initiated, the STK12C68-5 continues to drive the HSB pin LOW, releasing it only when the STORE is complete. After completing the STORE operation, the STK12C68-5 remains disabled until the HSB pin returns HIGH. If HSB is not used, it is left unconnected. Hardware RECALL (Power Up) During power-up or after any low-power condition (VCC < VRESET), an internal RECALL request is latched. When VCC once again exceeds the sense voltage of VSWITCH, a RECALL cycle is automatically initiated and takes tHRECALL to complete. If the STK12C68-5 is in a Write state at the end of power-up RECALL, the SRAM data is corrupted. To help avoid this situation, a 10 K resistor is connected either between WE and system VCC or between CE and system VCC. Software STORE Vss If the power supply drops faster than 20 s/volt before VCC reaches VSWITCH, then a 2.2  resistor must be connected between VCC and the system supply to avoid momentary excess of current between VCC and VCAP. AutoStore Inhibit Mode If an automatic STORE on power loss is not required, then VCC is tied to ground and +5 V is applied to VCAP (Figure 4). This is the AutoStore Inhibit mode, where the AutoStore function is disabled. If the STK12C68-5 is operated in this configuration, references to VCC are changed to VCAP throughout this data sheet. In this mode, STORE operations are triggered through software control or the HSB pin. To enable or disable Autostore using an I/O port pin see Preventing Store on page 6. It is not permissible to change between these three options “on the fly”. Hardware STORE (HSB) Operation The STK12C68-5 provides the HSB pin for controlling and acknowledging the STORE operations. The HSB pin is used to request a hardware STORE cycle. When the HSB pin is driven LOW, the STK12C68-5 conditionally initiates a STORE operation after tDELAY. An actual STORE cycle only begins if a Write to the SRAM takes place since the last STORE or RECALL cycle. The HSB pin also acts as an open drain driver that is internally driven LOW to indicate a busy condition, while the STORE (initiated by any means) is in progress. SRAM Read and Write operations, that are in progress when HSB is driven LOW by any means, are given time to complete before the STORE operation is initiated. After HSB goes LOW, the STK12C68-5 continues SRAM operations for tDELAY. During tDELAY, multiple SRAM Read operations take place. If a Write is in progress when HSB is pulled LOW, it allows a time, tDELAY to complete. However, any SRAM Write cycles requested after HSB goes LOW are inhibited until HSB returns HIGH. Document Number: 001-51026 Rev. *C Data is transferred from the SRAM to the nonvolatile memory by a software address sequence. The STK12C68-5 software STORE cycle is initiated by executing sequential CE controlled Read cycles from six specific address locations in exact order. During the STORE cycle, an erase of the previous nonvolatile data is first performed followed by a program of the nonvolatile elements. When a STORE cycle is initiated, input and output are disabled until the cycle is completed. Because a sequence of Reads from specific addresses is used for STORE initiation, it is important that no other Read or Write accesses intervene in the sequence. If they intervene, the sequence is aborted and no STORE or RECALL takes place. To initiate the software STORE cycle, the following Read sequence is performed: 1. Read address 0x0000, Valid READ 2. Read address 0x1555, Valid READ 3. Read address 0x0AAA, Valid READ 4. Read address 0x1FFF, Valid READ 5. Read address 0x10F0, Valid READ 6. Read address 0x0F0F, Initiate STORE cycle The software sequence is clocked with CE controlled Reads or OE controlled Reads. When the sixth address in the sequence is entered, the STORE cycle commences and the chip is disabled. It is important that Read cycles and not Write cycles are used in the sequence. It is not necessary that OE is LOW for a valid sequence. After the tSTORE cycle time is fulfilled, the SRAM is again activated for Read and Write operation. Software RECALL Data is transferred from the nonvolatile memory to the SRAM by a software address sequence. A software RECALL cycle is initiated with a sequence of Read operations in a manner similar to the software STORE initiation. To initiate the RECALL cycle, the following sequence of CE controlled Read operations is performed: 1. Read address 0x0000, Valid READ 2. Read address 0x1555, Valid READ Page 5 of 18 STK12C68-5 (SMD5962-94599) 3. Read address 0x0AAA, Valid READ 4. Read address 0x1FFF, Valid READ 5. Read address 0x10F0, Valid READ 6. Read address 0x0F0E, Initiate RECALL cycle ■ The VCC level I/O loading Figure 5. Current Versus Cycle Time (Read) ■ Internally, RECALL is a two step procedure. First, the SRAM data is cleared; then, the nonvolatile information is transferred into the SRAM cells. After the tRECALL cycle time, the SRAM is again ready for Read and Write operations. The RECALL operation does not alter the data in the nonvolatile elements. The nonvolatile data can be recalled an unlimited number of times. Data Protection The STK12C68-5 protects data from corruption during low-voltage conditions by inhibiting all externally initiated STORE and Write operations. The low-voltage condition is detected when VCC is less than VSWITCH. If the STK12C68-5 is in a Write mode (both CE and WE are low) at power up after a RECALL or after a STORE, the Write is inhibited until a negative transition on CE or WE is detected. This protects against inadvertent writes during power up or brown out conditions. Figure 6. Current Versus Cycle Time (Write) Noise Considerations The STK12C68-5 is a high-speed memory. It must have a high frequency bypass capacitor of approximately 0.1 µF connected between VCC and VSS, using leads and traces that are as short as possible. As with all high-speed CMOS ICs, careful routing of power, ground, and signals reduce circuit noise. Hardware Protect The STK12C68-5 offers hardware protection against inadvertent STORE operation and SRAM Writes during low-voltage conditions. When VCAP (VCC – 0.2 V). All other inputs cycling. tRC= 200 ns, 5 V, 25 °C Dependent on output loading and cycle rate. Values obtained without output loads. Typical – 10 mA ICC4 Average VCAP Current All Inputs Do Not Care, VCC = Max during AutoStore Cycle Average current for duration tSTORE – 2 mA ISB1[5] VCC standby current tRC = 35 ns, CE > VIH (Standby, Cycling TTL tRC = 55 ns, CE > VIH Input Levels) – 24 19 mA mA ISB2 [5] VCC standby current CE > (VCC – 0.2 V). All others VIN < 0.2 V or > (VCC – 0.2 V). Standby current level after nonvolatile cycle is complete. Inputs are static. f = 0 MHz. – 2.5 mA IIX Input leakage current VCC = Max, VSS < VIN < VCC –1 +1 A IOZ Off state output leakage current VCC = Max, VSS < VIN < VCC, CE or OE > VIH or WE < VIL –5 +5 A VIH Input HIGH voltage 2.2 VCC + 0.5 V VIL Input LOW voltage VSS – 0.5 0.8 V VOH Output HIGH voltage IOUT = –4 mA 2.4 – V VOL Output LOW voltage IOUT = 8 mA – 0.4 V VBL Logic ‘0’ voltage on HSB output IOUT = 3 mA – 0.4 V VCAP Storage capacitor Between VCAP pin and VSS, 6 V rated. 68 µF +20% nominal 54 260 µF Notes 4. VCC reference levels throughout this data sheet refer to VCC if that is where the power supply connection is made, or VCAP if VCC is connected to ground. 5. CE > VIH does not produce standby current levels until any nonvolatile cycle in progress has timed out. Document Number: 001-51026 Rev. *C Page 8 of 18 STK12C68-5 (SMD5962-94599) Data Retention and Endurance Parameter Description DATAR Data retention NVC Nonvolatile STORE operations Min Unit 100 Years 1,000 K Capacitance In the following table, the capacitance parameters are listed.[6] Parameter Description CIN Input capacitance COUT Output capacitance Test Conditions Max TA = 25 C, f = 1 MHz, VCC = 0 to 3.0 V Unit 8 pF 7 pF Thermal Resistance In the following table, the thermal resistance parameters are listed.[6] Parameter Description JA Thermal resistance (junction to ambient) JC Thermal resistance (junction to case) Test Conditions 28-CDIP 28-LCC Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA / JESD51. Unit TBD TBD C/W TBD TBD C/W Figure 7. AC Test Loads R1 963  For Tristate Specs R1 963  5.0 V 5.0 V Output Output 30 pF R2 512  5 pF R2 512  AC Test Conditions Input Pulse Levels .................................................. 0 V to 3 V Input Rise and Fall Times (10% to 90%) ......................