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B58033I9505M001

B58033I9505M001

  • 厂商:

    TDK(东电化)

  • 封装:

    DIP6

  • 描述:

    贴片电容(MLCC) DIP6 5µF ±20% 1KV

  • 数据手册
  • 价格&库存
B58033I9505M001 数据手册
CeraLink Capacitors for fast-switching semiconductors Series/Type: Ordering code: Solder pin (SP) series B58033* Date: Version: 2019-07-09 6.2 ontent of header bars 1 and 2 of data sheet will be automatically entered in headers and footers! Please fill in the table and then change the color to "white". This ensures that the table disappears (invisible) for the customer PDF. Don't change formatting when entering or pasting text in the table and don't add any cell or line in and to it! Identification/Classification 1 CeraLink (header 1 + top left bar): Identification/Classification 2 Capacitors for fast-switching semiconductors (header 2 + bottom left header bar): Ordering code: (top right header bar) B58033* Series/Type: (bottom right header bar) Solder pin (SP) series Preliminary data (optional): Department: PPD PI AE/IE PD Date: 2019-07-09 Version: 6.2 Prepared by : Dr. Hopfer Signed by: Dr. Hopfer, Dr. Paulitsch, Mr. Kastl Modifications: p3 - tolerance range added for Ceff  TDK Electronics AG 2019. Reproduction, publication and dissemination of this publication, enclosures hereto and the information contained therein without TDK Electronics' prior express consent is prohibited. CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Applications   Power converters and inverters DC link/snubber capacitor for power converters and inverters Features            High ripple current capability High temperature robustness Low equivalent serial inductance (ESL) Low equivalent serial resistance (ESR) Low power loss Low dielectric absorption Optimized for high frequencies up to several 100 kHz Increasing capacitance with DC bias up to operating voltage High capacitance density Minimized dielectric loss at high temperatures Qualification based on AEC-Q200 rev. D Construction       RoHS-compatible PLZT ceramic (lead lanthanum zirconium titanate) Copper inner electrodes Silver outer electrodes Silver coated copper pins Silicone based casting compound according to UL 94 V-0 Plastic housing according to UL 94 V-0 General technical data Dissipation factor Insulation resistance Operating device temperature Weight of device 1) tan 𝛿 Rins, typ1) Tdevice < 0.02 >1 -40 … +150 approx. 31 GΩ °C g Typical insulation resistance, measured at operating voltage Vop and measurement time > 240 s, +25 °C PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 2 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Electrical specifications and ordering codes Type SP500 SP700 SP900 Vpk, max V 650 1000 1300 VR V 500 700 900 Vop V 400 600 800 Cnom, typ µF 20 10 5 Ceff µF 12 ± 20% 5 ± 20% 3 ± 20% C0 µF 6.5 ± 20% 2.8 ± 20% 1.5 ± 20% Ordering code B58033I5206M001 B58033I7106M001 B58033I9505M001 Typical values as a design reference for CeraLink® applications VR ESR 0 VDC, 0.5 VRMS, 25 °C, 1 kHz ESR 0 VDC, 0.5 VRMS, 25 °C, 100 kHz ESL Iop 1) 100 kHz Tamb = 85 °C Iop 1) 100 kHz Tamb = 105 °C V mΩ mΩ nH ARMS ARMS 500 275 4 4 41 32 700 550 11 4 33 27 900 1000 18 4 26 24 1) Normal operating current without forced cooling at Tdevice = +150 °C. Higher values permissible at reduced lifetime. Dimensional drawings Dimensions in mm PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 3 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Polarity Note that polarity is only for incoming inspection purposes and it does not affect operation. If put under reverse rated voltage VR, CeraLink is repoled and works identically. Equivalent circuit diagram Marking of components Manufacturer’s logo CeraLink type Nominal capacitance Rated voltage PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 4 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Typical characteristics as a function of temperature and voltage VR = 500 V (VAC = 0.5 VRMS, frequency = 1 kHz) All given temperatures are device temperatures. The curves show the relative changes of the capacitance, dissipation factor and ESR. The 100% values correspond to Ceff and tan δ which are given on page 2 and 3 of this data sheet. 120 Temperature [°C ] -25 25 85 125 110 110 100 Capacitance [%] Capacitance [%] 100 90 80 70 Voltage [VDC ] 0 400 500 120 90 80 70 60 60 50 50 40 100 200 300 Voltage [VDC] 400 500 Temperature [°C ] -25 25 85 125 500 Dissipation Factor [%] -50 400 300 200 0 50 Temperature [°C] 100 150 Voltage [VDC ] 0 400 500 500 Dissipation Factor [%] 0 400 300 200 100 100 0 0 0 100 200 300 Voltage [VDC] 400 500 500 -50 50 Temperature [°C] 100 150 600 Temperature [°C ] -25 25 85 125 400 0 Voltage [VDC ] 0 400 500 500 ESR [%] ESR [%] 400 300 200 300 200 100 100 0 0 0 100 200 300 Voltage [VDC] 400 500 -50 PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 0 50 Temperature [°C] 100 150 2019-07-09 Page 5 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Application Notes Further typical electrical characteristics as a design reference for CeraLink applications. Typical capacitance values as a function of voltage VR = 500 V 225 Variable large signal small signal 200 Capacitance [%] 175 150 Large signal capacitance: Quasistatic (slow variation of the voltage), +25 °C The nominal capacitance is defined as the large signal capacitance at Vop. See glossary for further information. 125 Small signal capacitance: 0.5 VRMS, 1 kHz, +25 °C 100 75 50 0 100 200 300 400 The effective capacitance is defined as the small signal capacitance at Vop. 500 Voltage [VDC] Typical impedance and ESR as a function of frequency VR = 500 V 1000 Variable |Z| ESR |Z|, ESR [Ohm] 100 VDC = 0 V, VAC = 0.5 VRMS, Tdevice = +25 °C 10 1 0.1 0.01 0.001 1000 10000 100000 Frequency [Hz] 1000000 Typical permissible current as a function of frequency VR = 500 V normal operation current [Arms] 45 Tamb [°C] 85 105 40 35 30 Measurement performed at Vop. The values correspond to a device temperature of +150 °C. No active cooling was used. Note hat with additional cooling the typical permissible current can be significantly higher. 25 20 15 0 20 40 60 Frequency [Hz] 80 100 Aging The capacitance has an aging behavior which shows a decrease of capacitance with time. The typical aging rate is about 2.5% per logarithmic decade in hours. PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 6 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Typical characteristics as a function of temperature and voltage VR = 700 V (VAC = 0.5 VRMS, frequency = 1 kHz) All given temperatures are device temperatures. The curves show the relative changes of the capacitance, dissipation factor and ESR. The 100% values correspond to Ceff and tan δ which are given on page 2 and 3 of this data sheet. 130 110 100 90 80 70 Bias [VDC ] 0 600 700 120 Capacitance [%] Capacitance [%] 140 T/°C -25 25 75 125 120 100 80 60 60 40 50 40 20 0 100 200 300 400 Voltage [VDC] 500 600 700 T/°C -25 25 75 125 600 400 300 200 0 50 Temperature [°C] 100 150 Bias [VDC ] 0 600 700 600 500 Dissipation factor [%] 500 Dissipation factor [%] -50 100 400 300 200 100 0 0 0 100 200 300 400 Voltage [VDC] 500 600 700 500 -50 50 Temperature [°C] 100 150 600 T/°C -25 25 75 125 400 0 Bias [VDC ] 0 600 700 500 ESR [%] ESR [%] 400 300 200 300 200 100 100 0 0 0 100 200 300 400 Voltage [VDC] 500 600 700 -50 PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 0 50 Temperature [°C] 100 150 2019-07-09 Page 7 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Application Notes Further typical electrical characteristics as a design reference for CeraLink applications. Typical capacitance values as a function of voltage VR = 700 V Large signal capacitance: Quasistatic (slow variation of the voltage), +25 °C The nominal capacitance is defined as the large signal capacitance at Vop. See glossary for further information. Variable large signal * V small signal * Bias [V] 200 Capacitance [%] 175 150 125 100 Small signal capacitance: 0.5 VRMS, 1 kHz, +25 °C 75 50 0 100 200 300 400 500 Voltage [VDC] 600 700 The effective capacitance is defined as the small signal capacitance at Vop. Typical impedance and ESR as a function of frequency VR = 700 V 100 Variable |Z| ESR VDC = 0 V, VAC = 0.5 VRMS, Tdevice = +25 °C |Z|, ESR [Ohm] 10 1 0.1 0.01 0.001 1000 10000 100000 Frequency [Hz] 1000000 Typical permissible current as a function of frequency VR = 700 V normal operation current [Arms] 35 Tamb [°C ] 85 grag 105 grad Measurement performed at Vop. The values correspond to a device temperature of +150 °C. No active cooling was used. Note hat with additional cooling the typical permissible current can be significantly higher. 30 25 20 15 10 0 20 40 60 Frequency [Hz] 80 100 Aging The capacitance has an aging behavior which shows a decrease of capacitance with time. The typical aging rate is about 2.5% per logarithmic decade in hours. PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 8 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Typical characteristics as a function of temperature and voltage VR = 900 V (VAC = 0.5 VRMS, frequency = 1 kHz) All given temperatures are device temperatures. The curves show the relative changes of the capacitance, dissipation factor and ESR. The 100% values correspond to Ceff and tan δ which are given on page 2 and 3 of this data sheet. 140 100 80 Bias [V] 0 800 900 120 110 Capacitance [%] 120 Capacitance [%] 130 T/°C -25 25 75 125 100 90 80 70 60 60 50 0 100 200 300 400 500 Voltage [VDC] 600 700 800 T/°C -25 25 75 125 600 500 400 300 200 50 Temperature [°C] 100 150 Bias [V] 0 800 900 600 500 400 300 200 100 100 0 0 700 700 Dissipation Factor [%] 40 -50 900 Dissipation Factor [%] 40 0 100 200 300 400 500 Voltage [VDC] 600 700 800 0 -50 900 500 50 Temperature [°C] 100 150 600 T/°C -25 25 75 125 400 0 Bias [V] 0 800 900 500 ESR [%] ESR [%] 400 300 200 300 200 100 100 0 0 100 200 300 400 500 Voltage [VDC] 600 700 800 0 -50 900 PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 0 50 Temperature [°C] 100 150 2019-07-09 Page 9 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Application Notes Further typical electrical characteristics as a design reference for CeraLink applications. Typical capacitance values as a function of voltage VR = 900 V Variable large signal small signal 200 Capacitance [%] 175 150 Large signal capacitance: Quasistatic (slow variation of the voltage), +25 °C The nominal capacitance is defined as the large signal capacitance at Vop. See glossary for further information. 125 Small signal capacitance: 0.5 VRMS, 1 kHz, +25 °C 100 75 50 0 100 200 300 400 500 600 Voltage [VDC] 700 800 The effective capacitance is defined as the small signal capacitance at Vop. 900 Typical impedance and ESR as a function of frequency VR = 900 V Variable Z [Ohm] ESR [Ohm] 100 VDC = 0 V, VAC = 0.5 VRMS, Tdevice = +25 °C |Z|, ESR [Ohm] 10 1 0.1 0.01 0.001 1000 10000 100000 Frequency [Hz] 1000000 10000000 Typical permissible current as a function of frequency Normal Operation Current [Arms] 26 Tamb [°C] 85.0 24 105 22 20 18 16 Measurement performed at Vop. The values correspond to a device temperature of +150 °C. No forced cooling was used. Note hat with additional cooling the typical permissible current can be significantly higher. 14 12 10 0 20 40 60 Frequency [kHz] 80 100 Aging The capacitance has an aging behavior which shows a decrease of capacitance with time. The typical aging rate is about 2.5% per logarithmic decade in hours. PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 10 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Reliability A. Preconditioning:    Solder the capacitor on a PCB using the recommended soldering profile Check of external appearance Measurement of electrical parameters Rins, C0, tan δ o Apply Vpk,max for 60 seconds and measure Rins at room temperature: Isolation resistance (@Vpk,max, 60 s, 25 °C) Rins > 100 MΩ o Measure C0 and tan δ within 10 minutes to 1 hour afterwards: Initial capacitance (@ 0 VDC, 0.5 VRMS, 1 kHz, 25 °C) Dissipation factor (@ 0 VDC, 0.5 VRMS, 1 kHz, 25 °C) tan δ < 0.02 B. Performance of a specific reliability test. C. After performing a specific test:   Check the external appearance again Repeat the measurement of the electrical parameters o Apply Vpk,max for 60 seconds and measure Rins at room temperature: Isolation resistance (@Vpk,max, 60 s, 25 °C) Rins > 10 MΩ o Measure C0 and tan δ: Change of initial capacitance (@ 0 VDC, 0.5 VRMS, 1 kHz, 25 °C) |ΔC0 / C0| < 15% o Dissipation factor (@ 0 VDC, 0.5 VRMS, 1 kHz, 25 °C) tan δ < 0.05 Test Standard External appearance Test conditions Criteria Visual inspection with magnifying glass No defects that might affect performance High temperature operating life MIL-STD-202, method 108 +150 °C, VR, 1000 hours No mechanical damage |ΔC0 / C0|, tan δ and Rins within defined limits High temperature exposure MIL-STD-202, method 108 +150 °C, unpowered, 1000 hours No mechanical damage |ΔC0 / C0|, tan δ and Rins within defined limits Biased humidity MIL-STD-202, method 103 +85 °C, 85% rel. hum., VR, 1000 hours No mechanical damage |ΔC0 / C0|, tan δ and Rins within defined limits Moisture resistance MIL-STD-202, method 106 +25 °C to +65 °C 90% rel. hum. to 100% rel. hum. 10 cycles, unpowered No mechanical damage |ΔC0 / C0|, tan δ and Rins within defined limits Temperature shock MIL-STD-202, method 107 -55 °C to +150 °C, 20 seconds transfer time , 15 minutes dwell time, 1000 cycles No mechanical damage |ΔC0 / C0|, tan δ and Rins within defined limits Vibration MIL-STD-202, method 204 5 g/ 20 min, 12 cycles, 3 axis 10 Hz to 2000 Hz No mechanical damage |ΔC0 / C0|, tan δ and Rins within defined limits PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 11 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Test Standard Test conditions Criteria Mechanical shock MIL-STD-202, method 213 Acceleration 400 m/s² Half sine pulse duration 6 milliseconds 4000 bumps No mechanical damage |ΔC0 / C0|, tan δ and Rins within defined limits Resistance to MIL-STD-202, soldering method 210, heat condition B Dip test of contact areas in solder bath (+260 °C for 10 seconds) No damage of pin silver coating, |ΔC0 / C0|, tan δ and Rins within defined limits Solderability Dip test of contact areas in solder bath (+235 °C for 5 seconds) Dipped surface is covered with solder coating Resistance to solvent Dipping and cleaning with isopropanol Marking must be legible |ΔC0 / C0|, tan δ and Rins within defined limits Geometry Using a caliper and a gauge Within specified values in the chapter dimensional drawing J-STD-002, method A Packaging The CeraLink SP type will be delivered in a tube and will be packed in a cardboard box. The packaging unit is 20 pieces per tube. The tube is terminated with one pin and two plugs. Dimensions in mm PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 12 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Recommended wave soldering profile Temperature characteristic at component terminal with dual-wave soldering Notes: The use of mild, non-activated fluxes for soldering is recommended, as well as proper cleaning of the PCB. After the soldering process, the capacitance is lowered. Applying VR to the device will re-establish the capacitance. PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 13 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series General technical information Storage  Only store CeraLink capacitors in their original packaging. Do not open the package prior to processing.  Storage conditions in original packaging: temperature −25 °C to +45 °C, relative humidity ≤ 75% annual average, maximum 95%, dew precipitation is inadmissible.  Do not store CeraLink capacitors where they are exposed to heat or direct sunlight. Otherwise the packaging material may be deformed or CeraLink may stick together, causing problems during mounting.  Avoid contamination of the CeraLink surface during storage, handling and processing.  Avoid storing CeraLink devices in harmful environments where they are exposed to corrosive gases (e.g. SOx, Cl).  Use CeraLink as soon as possible after opening factory seals such as polyvinyl-sealed packages.  Solder CeraLink components within 6 months after shipment. Handling  Do not drop CeraLink components or allow them to be chipped.  Do not touch CeraLink with your bare hands - gloves are recommended.  Avoid contamination of the CeraLink surface during handling. Mounting  Do not scratch the external electrodes before, during or after the mounting process.  Make sure contacts and housings used for assembly with CeraLink components are clean before mounting.  The surface temperature of an operating CeraLink can be higher than the ambient temperature. Ensure that adjacent components are placed at a sufficient distance from a CeraLink to allow proper cooling.  Avoid contamination of the CeraLink surface during processing. Soldering guidelines  The use of mild, non-activated fluxes for soldering is recommended, as well as proper cleaning of the PCB.  Complete removal of flux is recommended to avoid surface contamination that can result in an instable and/or high leakage current.  Use resin-type or non-activated flux.  Bear in mind that insufficient preheating may cause ceramic cracks.  Rapid cooling by dipping in solvent is not recommended, otherwise a component may crack.  If an unsuitable cleaning fluid is used, flux residue or foreign particles may stick to the CeraLink surface and deteriorate its insulation resistance. Insufficient or improper cleaning of the CeraLink may cause damage to the component. PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 14 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Glossary Initial capacitance C0: Effective capacitance Ceff: Nominal capacitance Cnom: Is the value at the origin of the hysteresis without any applied direct voltage. Occurs at Vop and is measured with an applied ripple voltage of 0.5 VRMS and 1 kHz. The CeraLink is designed to have its highest capacitance value at the operating voltage Vop. Is the value derived by the tangent of the mean hysteresis as the derivative of the mean hysteresis is dQ/dV ~ C. PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 15 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Symbols and terms AC C0 Ceff, Cnom,typ DC ESL ESR Iop PCB PLZT Rins Rins, typ Tamb tan δ Tdevice Vop VR VRMS Vpk,max ΔT Alternating current Initial capacitance @ 0 VDC, 0.5 VRMS, 1 kHz, +25 °C Effective capacitance @ Vop, 0.5 VRMS, 1 kHz, +25 °C Typical nominal capacitance @ Vop, quasistatic, +25 °C. See glossary (page 17) for definition of the nominal capacitance Direct current Equivalent serial inductance Equivalent serial resistance Operating ripple current, root mean square value of sinusoidal AC current Printed circuit board Lead lanthanum zirconium titanate Insulation resistance @ Vpk,max, measurement time t = 60 s, +25 °C Insulation resistance @ Vop, measurement time t > 240 s, +25 °C Ambient temperature Dissipation factor @ 0 VDC, 0.5 VRMS,1 kHz, +25°C Device temperature. Tdevice = Tamb + ΔT (ΔT defines the self-heating of the device due to applied current). Operating voltage at maximum attenuation capability Rated voltage. Reference DC voltage for reliability tests. Root mean square value of sinusoidal AC voltage Maximum peak operating voltage Increase of temperature during operation PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 16 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Cautions and warnings General Not for use in resonant circuits, where a voltage of alternating polarity occurs. Not for AC applications. Consult our sales representative for further details. If used in snubber circuits, ensure that the sum of all voltages remains at the same polarity. Some parts of this publication contain statements about the suitability of our CeraLink components for certain areas of application, including recommendations about incorporation/design-in of these products into customer applications. The statements are based on our knowledge of typical requirements often made of our CeraLink devices in the particular areas. We nevertheless expressly point out that such statements cannot be regarded as binding statements about the suitability of our CeraLink components for a particular customer application. As a rule, TDK is either unfamiliar with individual customer applications or less familiar with them than the customers themselves. For these reasons, it is always incumbent on the customer to check and decide whether the CeraLink devices with the properties described in the product specification are suitable for use in a particular customer application.  Do not use CeraLink components for purposes not identified in our specifications.  Ensure the suitability of a CeraLink in particular by testing it for reliability during design-in. Always evaluate a CeraLink component under worst-case conditions.  Pay special attention to the reliability of CeraLink devices intended for use in safety-critical applications (e.g. medical equipment, automotive, spacecraft, nuclear power plant). Design notes  Consider derating at higher operating temperatures. As a rule, lower temperatures and voltages increase the life time of CeraLink devices.  If steep surge current edges are to be expected, make sure your design is as low-inductive as possible.  In some cases the malfunctioning of passive electronic components or failure before the end of their service life cannot be completely ruled out in the current state of the art, even if they are operated as specified. In applications requiring a very high level of operational safety and especially when the malfunction or failure of a passive electronic component could endanger human life or health (e.g. in accident prevention, life-saving systems, or automotive battery line applications such as clamp 30), ensure by suitable design of the application or other measures (e.g. installation of protective circuitry, fuse or redundancy) that no injury or damage is sustained by third parties in the event of such a malfunction or failure.  Specified values only apply to CeraLink components that have not been subject to prior electrical, mechanical or thermal damage. The use of CeraLink devices in line-to-ground applications is therefore not advisable, and it is only allowed together with safety countermeasures such as thermal fuses. PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 17 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series Operation  Use CeraLink only within the specified operating temperature range.  Use CeraLink only within specified voltage and current ranges.  The CeraLink has to be operated in a dry atmosphere, which must not contain any additional chemical vapors or substances.  Environmental conditions must not harm the CeraLink. Use the capacitors under normal atmospheric conditions only. A reduction of the oxygen partial pressure to below 1 mbar is not permissible.  Prevent a CeraLink from contacting liquids and solvents.  Avoid dewing and condensation.  During operation, the CeraLink can produce audible noise due to its piezoelectric characteristic.  CeraLink components are mainly designed for encased applications. Under all circumstances avoid exposure to: o o o o o direct sunlight rain or condensation steam, saline spray corrosive gases atmosphere with reduced oxygen content This listing does not claim to be complete, but merely reflects the experience of the manufacturer. Display of ordering codes for TDK Electronics products The ordering code for one and the same product can be represented differently in data sheets, data books, other publications, on the company website, or in order-related documents such as shipping notes, order confirmations and product labels. The varying representations of the ordering codes are due to different processes employed and do not affect the specifications of the respective products. Detailed information can be found on the Internet under www.tdk-electronics.tdk.com/orderingcodes. . PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 18 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series The following applies to all products named in this publication: 1. Some parts of this publication contain statements about the suitability of our products for certain areas of application. These statements are based on our knowledge of typical requirements that are often placed on our products in the areas of application concerned. We nevertheless expressly point out that such statements cannot be regarded as binding statements about the suitability of our products for a particular customer application. As a rule we are either unfamiliar with individual customer applications or less familiar with them than the customers themselves. For these reasons, it is always ultimately incumbent on the customer to check and decide whether a product with the properties described in the product specification is suitable for use in a particular customer application. 2. We also point out that in individual cases, a malfunction of electronic components or failure before the end of their usual service life cannot be completely ruled out in the current state of the art, even if they are operated as specified. In customer applications requiring a very high level of operational safety and especially in customer applications in which the malfunction or failure of an electronic component could endanger human life or health (e.g. in accident prevention or life-saving systems), it must therefore be ensured by means of suitable design of the customer application or other action taken by the customer (e.g. installation of protective circuitry or redundancy) that no injury or damage is sustained by third parties in the event of malfunction or failure of an electronic component. 3. The warnings, cautions and product-specific notes must be observed. 4. In order to satisfy certain technical requirements, some of the products described in this publication may contain substances subject to restrictions in certain jurisdictions (e.g. because they are classed as hazardous). Useful information on this will be found in our Material Data Sheets on the Internet (www.tdk-electronics.tdk.com/material). Should you have any more detailed questions, please contact our sales offices. 5. We constantly strive to improve our products. Consequently, the products described in this publication may change from time to time. The same is true of the corresponding product specifications. Please check therefore to what extent product descriptions and specifications contained in this publication are still applicable before or when you place an order. We also reserve the right to discontinue production and delivery of products. Consequently, we cannot guarantee that all products named in this publication will always be available. The aforementioned does not apply in the case of individual agreements deviating from the foregoing for customer-specific products. 1. Unless otherwise agreed in individual contracts, all orders are subject to our General Terms and Conditions of Supply. 2. Our manufacturing sites serving the automotive business apply the IATF 16949 standard. The IATF certifications confirm our compliance with requirements regarding the quality management system in the automotive industry. Referring to customer requirements and customer specific requirements (“CSR”) TDK always has and will continue to have the policy of respecting individual agreements. Even if IATF 16949 may appear to support the acceptance of unilateral requirements, we hereby like to emphasize that only requirements mutually agreed upon can and will be implemented in our Quality Management System. For clarification purposes we like to point out that obligations from IATF 16949 shall only become legally binding if individually agreed upon. PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 19 of 20 CeraLink Capacitors for fast-switching semiconductors B58033* Solder pin (SP) series 3. The trade names EPCOS, CeraCharge, CeraDiode, CeraLink, CeraPad, CeraPlas, CSMP, CTVS, DeltaCap, DigiSiMic, ExoCore, FilterCap, FormFit, LeaXield, MiniBlue, MiniCell, MKD, MKK, MotorCap, PCC, PhaseCap, PhaseCube, PhaseMod, PhiCap, PowerHap, PQSine, PQvar, SIFERRIT, SIFI, SIKOREL, SilverCap, SIMDAD, SiMic, SIMID, SineFormer, SIOV, ThermoFuse, WindCap are trademarks registered or pending in Europe and in other countries. Further information will be found on the Internet at www.tdk-electronics.tdk.com/trademarks. Release 2018-10 PPD PI AE/IE PD Please read Cautions and warnings and Important notes at the end of this document. 2019-07-09 Page 20 of 20
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B58033I9505M001

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    B58033I9505M001

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