NIKO-SEM
N-Channel Logic Level Enhancement Mode Field Effect Transistor
D
P50N02LS
TO-263 (D2PAK)
PRODUCT SUMMARY V(BR)DSS 25 RDS(ON) 12mΩ ID 55A
G S
1. GATE 2. DRAIN 3. SOURCE
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C Unless Otherwise Noted) PARAMETERS/TEST CONDITIONS Gate-Source Voltage Continuous Drain Current Pulsed Drain Current Avalanche Current Avalanche Energy Repetitive Avalanche Energy Power Dissipation
2 1
SYMBOL VGS
LIMITS ±20 55 38 150 36 250 8.6 85 46 -55 to 150 275
UNITS V
TC = 25 °C TC = 100 °C
ID IDM IAR
A
L = 0.1mH L = 0.05mH TC = 25 °C TC = 100 °C
EAS EAR PD Tj, Tstg TL
mJ
W
Operating Junction & Storage Temperature Range Lead Temperature ( /16” from case for 10 sec.) THERMAL RESISTANCE RATINGS THERMAL RESISTANCE Junction-to-Case Junction-to-Ambient Case-to-Heatsink
1 2 1
°C
SYMBOL RθJC RθJA RθCS
TYPICAL
MAXIMUM 2.3 62.5
UNITS
°C / W
0.6
Pulse width limited by maximum junction temperature. Duty cycle ≤ 1%
ELECTRICAL CHARACTERISTICS (TC = 25 °C, Unless Otherwise Noted) PARAMETER SYMBOL TEST CONDITIONS STATIC Drain-Source Breakdown Voltage Gate Threshold Voltage Gate-Body Leakage Zero Gate Voltage Drain Current V(BR)DSS VGS(th) IGSS IDSS VGS = 0V, ID = 250µA VDS = VGS, ID = 250µA VDS = 0V, VGS = ±20V VDS = 20V, VGS = 0V VDS = 20V, VGS = 0V, TC = 125 °C 25 0.8 1.2 2.5 ±250 25 250 nA µA V LIMITS UNIT MIN TYP MAX
1
MAY-24-2001
NIKO-SEM
1
N-Channel Logic Level Enhancement Mode Field Effect Transistor
ID(ON) RDS(ON)
1
P50N02LS
TO-263 (D2PAK)
On-State Drain Current Drain-Source On-State 1 Resistance
VDS = 10V, VGS = 10V VGS = 7V, ID = 20A VGS = 10V, ID = 30A VDS = 15V, ID = 40A DYNAMIC
55 13 12 16 16 15
A mΩ S
Forward Transconductance
gfs
Input Capacitance Output Capacitance Reverse Transfer Capacitance Total Gate Charge
2 2
Ciss Coss Crss Qg Qgs Qgd
2
1400 VGS = 0V, VDS = 15V, f = 1MHz 380 200 40 VDS = 0.5V(BR)DSS, VGS = 10V, ID = 30A 12 25 9 VDS = 15V, RL = 1Ω ID ≅ 35A, VGS = 10V, RGS = 2.5Ω 150 20 30 nS nC pF
Gate-Source Charge Gate-Drain Charge
2 2
Turn-On Delay Time Rise Time
td(on) tr
Turn-Off Delay Time Fall Time
2
2
td(off) tf
SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS (TC = 25 °C) Continuous Current Pulsed Current
3 1
IS ISM VSD trr IRM(REC) Qrr IF = IS, dlF/dt = 100A / µS IF = IS, VGS = 0V 70 200 0.043
55 170 1.3
A V nS A µC
Forward Voltage
Reverse Recovery Time Peak Reverse Recovery Current Reverse Recovery Charge
1 2
Pulse test : Pulse Width ≤ 300 µsec, Duty Cycle ≤ 2%. Independent of operating temperature. 3 Pulse width limited by maximum junction temperature. REMARK: THE PRODUCT MARKED WITH “P50N02LS”, DATE CODE or LOT #
2
MAY-24-2001
NIKO-SEM
N-Channel Logic Level Enhancement Mode Field Effect Transistor
P50N02LS
TO-263 (D2PAK)
TO-263 (D2PAK) MECHANICAL DATA
mm Dimension Min. A B C D E F G 0.3 -0.102 8.5 9 14.5 4.2 1.20 2.8 0.4 0.5 0.203 9.5 Typ. 15 Max. 15.8 4.7 1.35 H I J K L M N 0.7 4.83 5.08 Dimension Min. 1.0 9.8 6.5 1.5 1.4 5.33 Typ. 1.5 Max. 1.8 10.3 mm
3
MAY-24-2001
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