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EM636165

EM636165

  • 厂商:

    ETRON(钰创)

  • 封装:

  • 描述:

    EM636165 - 1Mega x 16 Synchronous DRAM (SDRAM) - Etron Technology, Inc.

  • 数据手册
  • 价格&库存
EM636165 数据手册
EtronTech Features Fast access time: 4.5/5/5/5.5/6.5/7.5 ns Fast clock rate: 200/183/166/143/125/100 MHz Self refresh mode: standard and low power Internal pipelined architecture 512K word x 16-bit x 2-bank Programmable Mode registers - CAS# Latency: 1, 2, or 3 - Burst Length: 1, 2, 4, 8, or full page - Burst Type: interleaved or linear burst - Burst stop function • Individual byte controlled by LDQM and UDQM • Auto Refresh and Self Refresh • 4096 refresh cycles/64ms • CKE power down mode • JEDEC standard +3.3V±0.3V power supply • Interface: LVTTL • 50-pin 400 mil plastic TSOP II package • 60-ball, 6.4x10.1mm VFBGA package • Lead Free Package available for both TSOP II and VFBGA • • • • • • EM636165 Preliminary (Rev.2.7, Mar./2006) Ordering Information Part Number EM636165TS/VE-5 EM636165TS/BE-5G EM636165TS/VE-55 EM636165TS/BE-55G EM636165TS/VE-6 EM636165TS/BE-6G EM636165TS/VE-7 EM636165TS/BE-7G EM636165TS/VE-7L EM636165TS/BE-7LG EM636165TS/VE-8 EM636165TS/BE-8G EM636165TS/VE-10 EM636165TS/BE-10G G : indicates Lead Free Package Frequency 200MHz 200MHz 183MHz 183MHz 166MHz 166MHz 143MHz 143MHz 143MHz 143MHz 125MHz 125MHz 100MHz 100MHz Package TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA TSOP II, VFBGA 1Mega x 16 Synchronous DRAM (SDRAM) Key Specifications EM636165 tCK3 tRAS tAC3 tRC Clock Cycle time(min.) Row Active time(max.) Access time from CLK(max.) Row Cycle time(min.) -5/55/6/7/7L/8/10 5/5.5/6/7/7/8/10ns 30/32/36/42/42/48/60 ns 4.5/5/5/5.5/5.5/6.5/7.5 ns 48/48/54/63/63/72/90 ns Etron Technology, Inc. No. 6, Technology Road V, Science-Based Industrial Park, Hsinchu, Taiwan 30077, R.O.C TEL: (886)-3-5782345 FAX: (886)-3-5778671 Etron Technology, Inc., reserves the right to make changes to its products and specifications without notice. EtronTech Ball Assignment (Top View) 1 2 3 4 5 6 7 EM636165 Pin Assignment (Top View) VDD DQ0 DQ1 VSSQ DQ2 DQ3 VDDQ DQ4 DQ5 VSSQ DQ6 DQ7 VDDQ LDQM WE# CAS# RAS# CS# A11 A10 A0 A1 A2 A3 VDD 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 Vss DQ15 DQ14 VSSQ DQ13 DQ12 VDDQ DQ11 DQ10 VSSQ DQ9 DQ8 VDDQ NC UDQM CLK CKE NC A9 A8 A7 A6 A5 A4 Vss A VSS DQ15 DQ0 VDD B DQ14 VSSQ VDDQ DQ1 C DQ13 VDDQ VSSQ DQ2 D DQ12 DQ11 DQ4 DQ3 E DQ10 VSSQ VDDQ DQ5 F DQ9 VDDQ VSSQ DQ6 G DQ8 NC NC DQ7 H NC NC NC NC J NC UDQM LDQM WE# K NC CLK RAS# CAS# L CKE NC NC CS# M A11 A9 NC NC N A8 A7 A0 A10 P A6 A5 A2 A1 R VSS A4 A3 VDD Overview The EM636165 SDRAM is a high-speed CMOS synchronous DRAM containing 16 Mbits. It is internally configured as a dual 512K word x 16 DRAM with a synchronous interface (all signals are registered on the positive edge of the clock signal, CLK). Each of the 512K x 16 bit banks is organized as 2048 rows by 256 columns by 16 bits. Read and write accesses to the SDRAM are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of a BankActivate command which is then followed by a Read or Write command. The EM636165 provides for programmable Read or Write burst lengths of 1, 2, 4, 8, or full page, with a burst termination option. An auto precharge function may be enabled to provide a self-timed row precharge that is initiated at the end of the burst sequence. The refresh functions, either Auto or Self Refresh are easy to use. By having a programmable mode register, the system can choose the most suitable modes to maximize its performance. These devices are well suited for applications requiring high memory bandwidth and particularly well suited to high performance PC applications Preliminary 2 Rev. 2.7 Mar. 2006 EtronTech Block Diagram EM636165 CLK CLOCK BUFFER Row Decoder Column Decoder 2048 X 256 X 16 CELL ARRAY (BANK #0) Sense Amplifier CKE CS# RAS# CAS# WE# LDQM UDQM COMMAND DECODER CONTROL SIGNAL GENERATOR COLUMN COUNTER DQs Buffer DQ0 │ DQ15 A0 A11 ADDRESS BUFFER MODE REGISTER Sense Amplifier REFRESH COUNTER Row Decoder 2048 X 256 X 16 CELL ARRAY (BANK #1) Column Decoder Preliminary 3 Rev. 2.7 Mar. 2006 EtronTech Pin Descriptions Symbol CLK Type Input 1M x 16 SDRAM EM636165 T able 1. Pin Details of EM636165 Description Clock: CLK is driven by the system clock. All SDRAM input signals are sampled on the positive edge of CLK. CLK also increments the internal burst counter and controls the output registers. Clock Enable: CKE activates(HIGH) and deactivates(LOW) the CLK signal. If CKE goes low synchronously with clock(set-up and hold time same as other inputs), the internal clock is suspended from the next clock cycle and the state of output and burst address is frozen as long as the CKE remains low. When both banks are in the idle state, deactivating the clock controls the entry to the Power Down and Self Refresh modes. CKE is synchronous except after the device enters Power Down and Self Refresh modes, where CKE becomes asynchronous until exiting the same mode. The input buffers, including CLK, are disabled during Power Down and Self Refresh modes, providing low standby power. Bank Select: A11(BS) defines to which bank the BankActivate, Read, Write, or BankPrecharge command is being applied. Address Inputs: A0-A10 are sampled during the BankActivate command (row address A0-A10) and Read/Write command (column address A0-A7 with A10 defining Auto Precharge) to select one location out of the 256K available in the respective bank. During a Precharge command, A10 is sampled to determine if both banks are to be precharged (A10 = HIGH). The address inputs also provide the op-code during a Mode Register Set command. Chip Select: CS# enables (sampled LOW) and disables (sampled HIGH) the command decoder. All commands are masked when CS# is sampled HIGH. CS# provides for external bank selection on systems with multiple banks. It is considered part of the command code. Row Address Strobe: The RAS# signal defines the operation commands in conjunction with the CAS# and WE# signals and is latched at the positive edges of CLK. When RAS# and CS# are asserted "LOW" and CAS# is asserted "HIGH," either the BankActivate command or the Precharge command is selected by the WE# signal. When the WE# is asserted "HIGH," the BankActivate command is selected and the bank designated by BS is turned on to the active state. When the WE# is asserted "LOW," the Precharge command is selected and the bank designated by BS is switched to the idle state after the precharge operation. Column Address Strobe: The CAS# signal defines the operation commands in conjunction with the RAS# and WE# signals and is latched at the positive edges of CLK. When RAS# is held "HIGH" and CS# is asserted "LOW," the column access is started by asserting CAS# "LOW." Then, the Read or Write command is selected by asserting WE# "LOW" or "HIGH." Write Enable: The WE# signal defines the operation commands in conjunction with the RAS# and CAS# signals and is latched at the positive edges of CLK. The WE# input is used to select the BankActivate or Precharge command and Read or Write command. CKE Input A11 A0-A10 Input Input CS# Input RAS# Input CAS# Input W E# Input Preliminary 4 Rev. 2.7 Mar. 2006 EtronTech LDQM, UDQM Input 1M x 16 SDRAM EM636165 Data Input/Output Mask: LDQM and UDQM are byte specific, nonpersistent I/O buffer controls. The I/O buffers are placed in a high-z state when LDQM/UDQM is sampled HIGH. Input data is masked when LDQM/UDQM is sampled HIGH during a write cycle. Output data is masked (two-clock latency) when LDQM/UDQM is sampled HIGH during a read cycle. UDQM masks DQ15DQ8, and LDQM masks DQ7-DQ0. DQ0-DQ15 Input/Output Data I/O: The DQ0-15 input and output data are synchronized with the positive edges of CLK. The I/Os are byte-maskable during Reads and Writes. NC VDDQ Supply No Connect: These pins should be left unconnected. DQ Power: Provide isolated power to DQs for improved noise immunity. ( 3.3V± 0.3V ) VSSQ Supply DQ Ground: Provide isolated ground to DQs for improved noise immunity. (0V) VDD VSS Supply Supply Power Supply: +3.3V ± 0.3V Ground Preliminary 5 Rev. 2.7 Mar. 2006 EtronTech Operation Mode 1M x 16 SDRAM EM636165 Fully synchronous operations are performed to latch the commands at the positive edges of CLK. Table 2 shows the truth table for the operation commands. T able 2. Truth Table (Note (1), (2) ) Command BankActivate BankPrecharge PrechargeAll W rite W rite and AutoPrecharge Read Read and Autoprecharge Mode Register Set No-Operation Burst Stop Device Deselect AutoRefresh SelfRefresh Entry SelfRefresh Exit State Idle(3) Any Any Active(3) Active(3) Active(3) Active(3) Idle Any Active(4) Any Idle Idle Idle (SelfRefresh) CKEn-1 CKEn DQM(6) A11 A10 A0-9 CS# RAS# CAS# WE# H H H H H H H H H H H H H L H H L L H X X X X X X X X X X X H L H L L H H X X X X X X X X X X X X X X X X X X X L V V X V V V V V X X X X X X X X X X X V L H L H L H V X X X X X X X X X X X V X X V V V V V X X X X X X X X X X X L L L L L L L L L L H L L H L X H L X H L X L L L H H H H L H H X L L X H X X H X X H X H H H L L L L L H H X L L X H X X H X X H X H L L L L H H L H L X H H X H X X H X X H X X Clock Suspend Mode Entry Power Down Mode Entry Active Any(5) Active Any (PowerDown) Clock Suspend Mode Exit Power Down Mode Exit Data Write/Output Enable Data Mask/Output Disable Active H X H X X X X X X Active Note: 1. V=Valid X=Don't Care L=Low level H=High level 2. CKEn signal is input level when commands are provided. CKEn-1 signal is input level one clock cycle before the commands are provided. 3. These are states of bank designated by BS signal. 4. Device state is 1, 2, 4, 8, and full page burst operation. 5. Power Down Mode can not enter in the burst operation. When this command is asserted in the burst cycle, device state is clock suspend mode. 6. LDQM and UDQM Preliminary 6 Rev. 2.7 Mar. 2006 EtronTech Commands 1 1M x 16 SDRAM EM636165 BankPrecharge command (RAS# = "L", CAS# = "H", WE# = "L", A11 = “V”, A10 = "L", A0-A9 = Don't care) The BankPrecharge command precharges the bank disignated by A11 signal. The precharged bank is switched from the active state to the idle state. This command can be asserted anytime after tRAS(min.) is satisfied from the BankActivate command in the desired bank. The maximum time any bank can be active is specified by tRAS(max.). Therefore, the precharge function must be performed in any active bank within tRAS(max.). At the end of precharge, the precharged bank is still in the idle state and is ready to be activated again. PrechargeAll command (RAS# = "L", CAS# = "H", WE# = "L", A11 = Don't care, A10 = "H", A0-A9 = Don't care) The PrechargeAll command precharges both banks simultaneously and can be issued even if both banks are not in the active state. Both banks are then switched to the idle state. Read command (RAS# = "H", CAS# = "L", WE# = "H", A11= “V”, A9 = "L", A0-A7 = Column Address) The Read command is used to read a burst of data on consecutive clock cycles from an active row in an active bank. The bank must be active for at least tRCD(min.) before the Read command is issued. During read bursts, the valid data-out element from the starting column address will be available following the CAS# latency after the issue of the Read command. Each subsequent dataout element will be valid by the next positive clock edge (refer to the following figure). The DQs go into high-impedance at the end of the burst unless other command is initiated. The burst length, burst sequence, and CAS# latency are determined by the mode register, which is already programmed. A full-page burst will continue until terminated (at the end of the page it will wrap to column 0 and continue). T0 T1 T2 T3 T4 T5 T6 T7 T8 2 3 CLK COM MAND READ A NOP NOP NOP NOP NOP NOP NOP NOP CAS# latency=1 tCK1, DQ's CAS# latency=2 tCK2, DQ's CAS# latency=3 tCK3, DQ's DOUT A0 DOUT A1 DOUT A2 DOUT A3 DOUT A0 DOUT A1 DOUT A2 DOUT A3 DOUT A0 DOUT A1 DOUT A2 DOUT A3 Burst Read Operation(Burst Length = 4, CAS# Latency = 1, 2, 3) Preliminary 7 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 The read data appears on the DQs subject to the values on the LDQM/UDQM inputs two clocks earlier (i.e. LDQM/UDQM latency is two clocks for output buffers). A read burst without the auto precharge function may be interrupted by a subsequent Read or Write command to the same bank or the other active bank before the end of the burst length. It may be interrupted by a BankPrecharge/ PrechargeAll command to the same bank too. The interrupt coming from the Read command can occur on any clock cycle following a previous Read command (refer to the following figure). T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK COM MAND READ A READ B NOP NOP NOP NOP NOP NOP NOP CAS# latency=1 tCK1, DQ's CAS# latency=2 tCK2, DQ's CAS# latency=3 tCK3, DQ's DOUT A0 DOUT B0 DOUT B1 DOUT B2 DOUT B3 DOUT A0 DOUT B0 DOUT B1 DOUT B2 DOUT B3 DOUT A0 DOUT B0 DOUT B1 DOUT B2 DOUT B3 Read Interrupted by a Read (Burst Length = 4, CAS# Latency = 1, 2, 3) The LDQM/UDQM inputs are used to avoid I/O contention on the DQ pins when the interrupt comes from a Write command. The LDQM/UDQM must be asserted (HIGH) at least two clocks prior to the Write command to suppress data-out on the DQ pins. To guarantee the DQ pins against I/O contention, a single cycle with high-impedance on the DQ pins must occur between the last read data and the Write command (refer to the following three figures). If the data output of the burst read occurs at the second clock of the burst write, the LDQM/UDQM must be asserted (HIGH) at least one clock prior to the Write command to avoid internal bus contention. T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK DQM COM MAND NOP READ A NOP NOP NOP NOP WRITE B NOP NOP DQ's DOUT A0 Must be Hi-Z before the Write Command DI NB 0 DINB1 DINB 2 : "H" or "L" Read to Write Interval (Burst Length ≥ 4, CAS# Latency = 3) Preliminary 8 Rev. 2.7 Mar. 2006 EtronTech T0 CLK T1 T2 DQM 1M x 16 SDRAM T3 T4 T5 T6 EM636165 T7 T8 1 Clk Interval COM MAND NOP NOP BANKA ACTIVATE NOP READ A WRITE A NOP NOP NOP CAS# latency=1 tCK1, DQ's CAS# latency=2 tCK2, DQ's DIN A0 Must be Hi-Z before the Write Command DIN A0 DIN A1 DIN A2 DIN A3 DIN A1 DIN A2 DIN A3 : "H" or "L" Read to Write Interval (Burst Length ≥ 4, CAS# Latency = 1, 2) T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK DQM COM MAND NOP NOP READ A NOP NOP WRITE B NOP NOP NOP CAS# latency=1 tCK1, DQ's CAS# latency=2 tCK2, DQ's DOUT A0 DIN B0 Must be Hi-Z before the Write Command DIN B0 DIN B 1 DIN B2 DIN B3 DIN B 1 DIN B2 DIN B3 : "H" or "L" Read to Write Interval (Burst Length ≥ 4, CAS# Latency = 1, 2) A read burst without the auto precharge function may be interrupted by a BankPrecharge/ PrechargeAll command to the same bank. The following figure shows the optimum time that BankPrecharge/ PrechargeAll command is issued in different CAS# latency. T0 CLK Bank, Col A Bank, Row T1 T2 T3 T4 T5 T6 T7 T8 ADDRESS Bank(s) tRP COMM AND READ A NOP NOP NOP Precharge NOP NOP Activate NOP CAS# latency=1 tCK1, DQ's CAS# latency=2 tCK2 , DQ's CAS# latency=3 tCK3 , DQ's DOUT A0 DOUT A1 DOUT A2 DOUT A3 DOUT A0 DOUT A1 DOUT A2 DOUT A3 DOUT A0 DOUT A1 DOUT A2 DOUT A3 Read to Precharge (CAS# Latency = 1, 2, 3) Preliminary 9 Rev. 2.7 Mar. 2006 EtronTech 4 1M x 16 SDRAM EM636165 Read and AutoPrecharge command (RAS# = "H", CAS# = "L", WE# = "H", A11 = “V”, A10 = "H", A0-A7 = Column Address) The Read and AutoPrecharge command automatically performs the precharge operation after the read operation. Once this command is given, any subsequent command cannot occur within a time delay of {tRP(min.) + burst length}. At full-page burst, only the read operation is performed in this command and the auto precharge function is ignored. Write command (RAS# = "H", CAS# = "L", WE# = "L", A11 = “V”, A10 = "L", A0-A7 = Column Address) The Write command is used to write a burst of data on consecutive clock cycles from an active row in an active bank. The bank must be active for at least tRCD(min.) before the Write command is issued. During write bursts, the first valid data-in element will be registered coincident with the Write command. Subsequent data elements will be registered on each successive positive clock edge (refer to the following figure). The DQs remain with high-impedance at the end of the burst unless another command is initiated. The burst length and burst sequence are determined by the mode register, which is already programmed. A full-page burst will continue until terminated (at the end of the page it will wrap to column 0 and continue). T0 T1 T2 T3 T4 T5 T6 T7 T8 5 CLK COM MAND NOP WRITE A NOP NOP NOP NOP NOP NOP NOP DQ0 - DQ3 DIN A0 DIN A1 DIN A2 DIN A3 don't care The first data element and the write are registered on the same clock edge. Extra data is masked. Burst Write Operation (Burst Length = 4, CAS# Latency = 1, 2, 3) A write burst without the auto precharge function may be interrupted by a subsequent Write, BankPrecharge/PrechargeAll, or Read command before the end of the burst length. An interrupt coming from Write command can occur on any clock cycle following the previous Write command (refer to the following figure). T0 CLK T1 T2 T3 T4 T5 T6 T7 T8 COMM AND NOP WRITE A WRITE B NOP NOP NOP NOP NOP NOP 1 Clk Interval DQ's DIN A0 DIN B0 DIN B1 DIN B2 DIN B3 Write Interrupted by a Write (Burst Length = 4, CAS# Latency = 1, 2, 3) Preliminary 10 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 The Read command that interrupts a write burst without auto precharge function should be issued one cycle after the clock edge in which the last data-in element is registered. In order to avoid data contention, input data must be removed from the DQs at least one clock cycle before the first read data appears on the outputs (refer to the following figure). Once the Read command is registered, the data inputs will be ignored and writes will not be executed. T0 CLK T1 T2 T3 T4 T5 T6 T7 T8 COM MAND NOP WRITE A READ B NOP NOP NOP NOP NOP NOP CAS# latency=1 tCK1, DQ's CAS# latency=2 tCK2, DQ's CAS# latency=3 tCK3, DQ's DIN A0 DOUT B0 DOUT B1 DOUT B2 DOUT B3 DIN A0 don't care DOUT B0 DOUT B1 DOUT B2 DOUT B3 DIN A0 don't care don't care DOUT B0 DOUT B1 DOUT B2 DOUT B3 Input data for the write is masked. Input data must be removed from the DQ's at least one clock cycle before the Read data appears on the outputs to avoid data contention. Write Interrupted by a Read (Burst Length = 4, CAS# Latency = 1, 2, 3) The BankPrecharge/PrechargeAll command that interrupts a write burst without the auto precharge function should be issued m cycles after the clock edge in which the last data-in element is registered, where m equals tWR/tCK rounded up to the next whole number. In addition, the LDQM/UDQM signals must be used to mask input data, starting with the clock edge following the last data-in element and ending with the clock edge on which the BankPrecharge/PrechargeAll command is entered (refer to the following figure). T0 CLK T1 T2 T3 T4 T5 T6 DQM tRP COM MAND WRITE NOP Precharge NOP NOP Activate NOP ADDRESS BANK COL n DIN n DIN n+1 BANK (S) tWR ROW DQ : don't care Note: The LDQM/UDQM can remain low in this example if the length of the write burst is 1 or 2. Write to Precharge Preliminary 11 Rev. 2.7 Mar. 2006 EtronTech 6 1M x 16 SDRAM EM636165 W rite and AutoPrecharge command (refer to the following figure) (RAS# = "H", CAS# = "L", WE# = "L", A11 = “V”, A10 = "H", A0-A7 = Column Address) The Write and AutoPrecharge command performs the precharge operation automatically after the write operation. Once this command is given, any subsequent command can not occur within a time delay of {(burst length -1) + tWR + tRP(min.)}. At full-page burst, only the write operation is performed in this command and the auto precharge function is ignored. T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK Bank A Activate Write A AutoPrecharge COM MAND NOP NOP NOP NOP NOP NOP NOP tDAL CAS# latency=1 tCK1, DQ's CAS# latency=2 tCK2, DQ's CAS# latency=3 tCK3, DQ's DIN A0 DIN A1 * tDAL DIN A0 DIN A1 * tDAL DIN A0 DIN A1 tDAL= tWR + tRP * * Begin AutoPrecharge Bank can be reactivated at completion of tDAL Burst Write with Auto-Precharge (Burst Length = 2, CAS# Latency = 1, 2, 3) 7 Mode Register Set command (RAS# = "L", CAS# = "L", WE# = "L", A11 = “V”, A10 = “V”, A0-A9 = Register Data) The mode register stores the data for controlling the various operating modes of SDRAM. The Mode Register Set command programs the values of CAS# latency, Addressing Mode and Burst Length in the Mode register to make SDRAM useful for a variety of different applications. The default values of the Mode Register after power-up are undefined; therefore this command must be issued at the power-up sequence. The state of pins A0~A9 and A11 in the same cycle is the data written to the mode register. One clock cycle is required to complete the write in the mode register (refer to the following figure). The contents of the mode register can be changed using the same command and the clock cycle requirements during operation as long as both banks are in the idle state. Preliminary 12 Rev. 2.7 Mar. 2006 EtronTech T0 CLK tCK2 CKE T1 T2 1M x 16 SDRAM EM636165 T7 T8 T9 T10 T3 T4 T5 T6 Clock min. CS# RAS# CAS# WE# A11 A10 Address Key A0-A9 DQM tRP DQ Hi-Z PrechargeAll Mode Register Set Command Any Command Mode Register Set Cycle (CAS# Latency = 1, 2, 3) The mode register is divided into various fields depending on functionality. Burst Length Field (A2~A0) • This field specifies the data length of column access using the A2~A0 pins and selects the Burst Length to be 1, 2, 4, 8, or full page. A2 0 0 0 0 1 1 1 1 A1 0 0 1 1 0 0 1 1 A0 0 1 0 1 0 1 0 1 Burst Length 1 2 4 8 Reserved Reserved Reserved Full Page Preliminary 13 Rev. 2.7 Mar. 2006 EtronTech • 1M x 16 SDRAM EM636165 Addressing Mode Select Field (A3) The Addressing Mode can be one of two modes, Interleave Mode or Sequential Mode. Sequential Mode supports burst length of 1, 2, 4, 8, or full page, but Interleave Mode only supports burst length of 4 and 8. A3 0 1 Addressing Mode Sequential Interleave --- Addressing Sequence of Sequential Mode An internal column address is performed by increasing the address from the column address which is input to the device. The internal column address is varied by the Burst Length as shown in the following table. When the value of column address, (n + m), in the table is larger than 255, only the least significant 8 bits are effective. Data n Column Address 0 n 1 n+1 2 n+2 3 n+3 4 n+4 5 n+5 6 n+6 7 n+7 - 255 n+255 256 n 257 n+1 - 2 words: Burst Length 4 words: 8 words: Full Page: Column address is repeated until terminated. --- Addressing Sequence of Interleave Mode A column access is started in the input column address and is performed by inverting the address bits in the sequence shown in the following table. Data n Data 0 Data 1 Data 2 Data 3 Data 4 Data 5 Data 6 Data 7 • A7 A7 A7 A7 A7 A7 A7 A7 A6 A6 A6 A6 A6 A6 A6 A6 A5 A5 A5 A5 A5 A5 A5 A5 Column Address A4 A4 A4 A4 A4 A4 A4 A4 A3 A3 A3 A3 A3 A3 A3 A3 A2 A2 A2 A2 A1 A1 A0 A0# 4 words 8 words Burst Length A1# A0 A1# A0# A0 A0# A2# A1 A2# A1 A2# A1# A0 A2# A1# A0# CAS# Latency Field (A6~A4) This field specifies the number of clock cycles from the assertion of the Read command to the first read data. The minimum whole value of CAS# Latency depends on the frequency of CLK. The minimum whole value satisfying the following formula must be programmed into this field. tCAC(min) ≤ CAS# Latency X tCK A6 0 0 0 0 1 A5 0 0 1 1 X A4 0 1 0 1 X CAS# Latency Reserved 1 clock 2 clocks 3 clocks Reserved Preliminary 14 Rev. 2.7 Mar. 2006 EtronTech • A8 0 0 1 • A7 0 1 X 1M x 16 SDRAM EM636165 Test Mode field (A8~A7) These two bits are used to enter the test mode and must be programmed to "00" in normal operation. Test Mode normal mode Vendor Use Only Vendor Use Only Single Write Mode (A9) This bit is used to select the write mode. When the BS bit is "0", the Burst-Read-BurstWrite mode is selected. When the BS bit is "1", the Burst-Read-Single-Write mode is selected. A9 0 1 Single Write Mode Burst-Read-Burst-Write Burst-Read-Single-Write Note: A10 and A11 should stay “L” during mode set cycle. 8 No-Operation command (RAS# = "H", CAS# = "H", WE# = "H") The No-Operation command is used to perform a NOP to the SDRAM which is selected (CS# is Low). This prevents unwanted commands from being registered during idle or wait states. 9 Burst Stop command (RAS# = "H", CAS# = "H", WE# = "L") The Burst Stop command is used to terminate either fixed-length or full-page bursts. This command is only effective in a read/write burst without the auto precharge function. The terminated read burst ends after a delay equal to the CAS# latency (refer to the following figure). The termination of a write burst is shown in the following figure. T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK COMMAND READ A NOP NOP NOP Burst Stop NOP NOP NOP NOP CAS# latency=1 tCK1, DQ's CAS# latency=2 tCK2, DQ's CAS# latency=3 tCK3, DQ's DOUT A0 DOUT A1 DOUT A2 DOUT A3 The burst ends after a delay equal to the CAS# latency. DOUT A0 DOUT A1 DOUT A2 DOUT A3 DOUT A0 DOUT A1 DOUT A2 DOUT A3 Termination of a Burst Read Operation (Burst Length > 4, CAS# Latency = 1, 2, 3) Preliminary 15 Rev. 2.7 Mar. 2006 EtronTech T0 CLK T1 T2 COM MAND NOP WRITE A NOP 1M x 16 SDRAM T3 T4 T5 T6 EM636165 T7 T8 NOP Burst Stop NOP NOP NOP NOP CAS# latency=1, 2, 3 DQ's DIN A0 DIN A1 DIN A2 don't care Input data for the Write is masked. Termination of a Burst Write Operation (Burst Length = X, CAS# Latency = 1, 2, 3) 10 Device Deselect command (CS# = "H") The Device Deselect command disables the command decoder so that the RAS#, CAS#, WE# and Address inputs are ignored, regardless of whether the CLK is enabled. This command is similar to the No Operation command. AutoRefresh command (refer to Figures 3 & 4 in Timing Waveforms) (RAS# = "L", CAS# = "L", WE# = "H",CKE = "H", A11 = “Don‘t care, A0-A9 = Don't care) The AutoRefresh command is used during normal operation of the SDRAM and is analogous to CAS#-before-RAS# (CBR) Refresh in conventional DRAMs. This command is non-persistent, so it must be issued each time a refresh is required. The addressing is generated by the internal refresh controller. This makes the address bits a "don't care" during an AutoRefresh command. The internal refresh counter increments automatically on every auto refresh cycle to all of the rows. The refresh operation must be performed 2048 times within 32ms. The time required to complete the auto refresh operation is specified by tRC(min.). To provide the AutoRefresh command, both banks need to be in the idle state and the device must not be in power down mode (CKE is high in the previous cycle). This command must be followed by NOPs until the auto refresh operation is completed. The precharge time requirement, tRP(min), must be met before successive auto refresh operations are performed. SelfRefresh Entry command (refer to Figure 5 in Timing Waveforms) (RAS# = "L", CAS# = "L", WE# = "H", CKE = "L", A0-A9 = Don't care) The SelfRefresh is another refresh mode available in the SDRAM. It is the preferred refresh mode for data retention and low power operation. Once the SelfRefresh command is registered, all the inputs to the SDRAM become "don't care" with the exception of CKE, which must remain LOW. The refresh addressing and timing is internally generated to reduce power consumption. The SDRAM may remain in SelfRefresh mode for an indefinite period. The SelfRefresh mode is exited by restarting the external clock and then asserting HIGH on CKE (SelfRefresh Exit command). SelfRefresh Exit command (refer to Figure 5 in Timing Waveforms) (CKE = "H", CS# = "H" or CKE = "H", RAS# = "H", CAS# = "H", WE# = "H") This command is used to exit from the SelfRefresh mode. Once this command is registered, NOP or Device Deselect commands must be issued for tRC(min.) because time is required for the completion of any bank currently being internally refreshed. If auto refresh cycles in bursts are performed during normal operation, a burst of 4096 auto refresh cycles should be completed just prior to entering and just after exiting the SelfRefresh mode. 11 12 13 Preliminary 16 Rev. 2.7 Mar. 2006 EtronTech 14 1M x 16 SDRAM EM636165 Clock Suspend Mode Entry / PowerDown Mode Entry command (refer to Figures 6, 7, and 8 in Timing Waveforms) (CKE = "L") When the SDRAM is operating the burst cycle, the internal CLK is suspended(masked) from the subsequent cycle by issuing this command (asserting CKE "LOW"). The device operation is held intact while CLK is suspended. On the other hand, when both banks are in the idle state, this command performs entry into the PowerDown mode. All input and output buffers (except the CKE buffer) are turned off in the PowerDown mode. The device may not remain in the Clock Suspend or PowerDown state longer than the refresh period (64ms) since the command does not perform any refresh operations. Clock Suspend Mode Exit / PowerDown Mode Exit command (refer to Figures 6, 7, and 8 in Timing Waveforms, CKE= "H") When the internal CLK has been suspended, the operation of the internal CLK is reinitiated from the subsequent cycle by providing this command (asserting CKE "HIGH"). When the device is in the PowerDown mode, the device exits this mode and all disabled buffers are turned on to the active state. tPDE(min.) is required when the device exits from the PowerDown mode. Any subsequent commands can be issued after one clock cycle from the end of this command. Data Write / Output Enable, Data Mask / Output Disable command (LDQM/UDQM = "L", "H") During a write cycle, the LDQM/UDQM signal functions as a Data Mask and can control every word of the input data. During a read cycle, the LDQM/UDQM functions as the controller of output buffers. LDQM/UDQM is also used for device selection, byte selection and bus control in a memory system. LDQM controls DQ0 to DQ7, UDQM controls DQ8 to DQ15. 15 16 Preliminary 17 Rev. 2.7 Mar. 2006 EtronTech Absolute Maximum Rating Symbol VIN, VOUT VDD, VDDQ TOPR TSTG PD IOUT Item Input, Output Voltage Power Supply Voltage Operating Temperature Storage Temperature Power Dissipation Short Circuit Output Current 1M x 16 SDRAM EM636165 Unit V V °C °C W mA Note 1 1 1 1 1 1 Rating -5/55/6/7/7L/8/10 - 1.0 ~ 4.6 -1.0 ~ 4.6 0 ~ 70 - 55 ~ 125 1 50 Recommended D.C. Operating Conditions (Ta = -0~70°C) Symbol VDD VDDQ VIH VIL Parameter Power Supply Voltage Power Supply Voltage(for I/O Buffer) LVTTL Input High Voltage LVTTL Input Low Voltage Min. 3.0 3.0 2.0 - 0.3 Typ. 3.3 3.3 - - Max. 3.6 3.6 VDDQ+0.3 0.8 Unit V V V V Note 2 2 2 2 Capacitance (VDD = 3.3V, f = 1MHz, Ta = 25°C) Symbol CI CI/O Parameter Input Capacitance Input/Output Capacitance Min. 2 4 Max. 5 7 Unit pF pF Note: These parameters are periodically sampled and are not 100% tested. Preliminary 18 Rev. 2.7 Mar. 2006 EtronTech Description/Test condition 1M x 16 SDRAM EM636165 Recommended D.C. Operating Conditions (VDD = 3.3V ± 0.3V, Ta = 0~70°C) Symbol IDD1 - 5/55/6/7/8/10 M ax. - 7L Unit Note Operating Current 1 bank tRC ≥ tRC(min), Outputs Open, Input operation signal one transition per one cycle Precharge Standby Current in non-power down mode tCK = tCK(min), CS# ≥ VIH, CKE = VIH Input signals are changed once during 30ns. Precharge Standby Current in power down mode tCK = tCK(min), CKE ≤ VIL(max) Precharge Standby Current in power down mode tCK = ∞,CKE ≤ VIL(max) Active Standby Current in power down mode CKE ≤ VIL(max), tCK = tCK(min) Active Standby Current in non-power down mode CKE ≥ VIL(max), tCK = tCK(min) Operating Current (Burst mode) tCK=tCK(min), Outputs Open, Multi-bank interleave,gapless data 130/125/115/100/95/85 40 3 IDD2N IDD2P IDD2PS IDD3P IDD3N IDD4 IDD5 IDD6 115/110/90/85/75/60 2 2 2 105/100/90/80/70/55 165/160/150/140/130/115 115/110/100/90/90 /80 2 15 0.8 0.8 1.5 20 40 40 0.6 3 3 mA 3 3, 4 3 Refresh Current tRC ≥ tRC(min) Self Refresh Current VIH ≥ VDD - 0.2, 0V ≤ VIL ≤ 0.2V Parameter IIL IOL VOH VOL Description Input Leakage Current ( 0V ≤ VIN ≤ VDD, All other pins not under test = 0V ) Output Leakage Current Output disable, 0V ≤ VOUT ≤ VDDQ) LVTTL Output "H" Level Voltage ( IOUT = -2mA ) LVTTL Output "L" Level Voltage ( IOUT = 2mA ) Min. - 10 - 10 2.4 - Max. 10 10 - 0.4 Unit Note µA µA V V Preliminary 19 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Electrical Characteristics and Recommended A.C. Operating Conditions (VDD = 3.3V±0.3V, Ta = -0~70°C) (Note: 5, 6, 7, 8) Symbol A.C. Parameter - 5/55/6/7/7L/8/10 Min. Max. Unit Note tRC tRCD tRP tRRD tRAS tWR tCK1 tCK2 tCK3 tCH tCL tAC1 tAC2 tAC3 tCCD tOH tLZ tHZ tIS tIH tPDE tREF Row cycle time (same bank) RAS# to CAS# delay (same bank) Precharge to refresh/row activate command (same bank) Row activate to row activate delay (different banks) Row activate to precharge time (same bank) W rite recovery time CL* = 1 Clock cycle time Clock high time Clock low time Access time from CLK (positive edge) CAS# to CAS# Delay time Data output hold time Data output low impedance Data output high impedance Data/Address/Control Input set-up time Data/Address/Control Input hold time PowerDown Exit set-up time Refresh time CL* = 1 CL* = 2 CL* = 3 CL* = 2 CL* = 3 48/48/54/63/63/72/90 15/16/16/16/16/16/30 15/16/16/1616//16/30 10/11/12/14/14/16/20 30/32/36/42/42/48/60 1 -/19/20/20/20/20/30 -/7/7.5/8/8/8/15 5/5.5/6/7/7/8/10 2/2/2/2.5/2.5/3/3.5 2/2/2/2.5/2.5/3/3.5 -/7/8/13/13/18/27 -/5.5/6/6.5/6.5/7/12 4.5/5/5/5.5/5.5/6.5/7.5 1 1.8/2/2/2/2/2/3 1/1/1/1/1/2/2 3/3.5/4/5/5/6/8 2/2/2/2/2/2.5/3 1 2/2/2/2/2/2.5/3 64 ms ns Cycle ns 100,000 Cycle ns 9 9 9 9 10 11 11 11 10 8 11 11 * CL is CAS# Latency. Note: 1. Stress greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. 2. All voltages are referenced to VSS. VIH(Max)=4.6 for pulse width≤5ns.VIL(Min)=-1.5Vfor pulse width≤5ns. 3. These parameters depend on the cycle rate and these values are measured by the cycle rate under the minimum value of tCK and tRC. Input signals are changed one time during tCK. 4. These parameters depend on the output loading. Specified values are obtained with the output open. 5. Power-up sequence is described in Note 12. Preliminary 20 Rev. 2.7 Mar. 2006 EtronTech 6. A.C. Test Conditions 1M x 16 SDRAM EM636165 LVTTL Interface Reference Level of Output Signals Output Load Input Signal Levels Transition Time (Rise and Fall) of Input Signals Reference Level of Input Signals 3 .3V 1.2k Ω 1.4V / 1.4V Reference to the Under Output Load (B) 2.4V / 0.4V 1ns 1.4V 1 .4V 50Ω Z0= 50 Ω Output 30pF 87 0 Ω Output 30pF LVTTL D.C. Test Load (A) LVTTL A.C. Test Load (B) 7. Transition times are measured between VIH and VIL. Transition(rise and fall) of input signals are in a fixed slope (1 ns). 8. tHZ defines the time in which the outputs achieve the open circuit condition and are not at reference levels. 9. These parameters account for the number of clock cycle and depend on the operating frequency of the clock as follows: the number of clock cycles = specified value of timing/Clock cycle time (count fractions as a whole number) 10.If clock rising time is longer than 1 ns, ( tR / 2 -0.5) ns should be added to the parameter. 11.Assumed input rise and fall time tT ( tR & tF ) = 1 ns If tR or tF is longer than 1 ns, transient time compensation should be considered, i.e., [(tr + tf)/2 - 1] ns should be added to the parameter. 12. Power up Sequence Power up must be performed in the following sequence. 1) Power must be applied to VDD and VDDQ(simultaneously) when all input signals are held "NOP" state and both CKE = "H" and LDQM/UDQM = "H." The CLK signals must be started at the same time. 2) After power-up, a pause of 200µseconds minimum is required. Then, it is recommended that LDQM/UDQM is held "HIGH" (VDD levels) to ensure DQ output is in high impedance. 3) Both banks must be precharged. 4) Mode Register Set command must be asserted to initialize the Mode register. 5) A minimum of 2 Auto-Refresh dummy cycles must be required before or after the Mode Register Set command in step 4 to stabilize the internal circuitry of the device. Preliminary 21 Rev. 2.7 Mar. 2006 EtronTech Timing Waveforms 1M x 16 SDRAM EM636165 Figure 1. AC Parameters for Write Timing (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCH CKE tCL t IS t IS tIH tCK2 Begin AutoPrecharge Bank A Begin AutoPrecharge Bank B t IS CS# RAS# CAS# WE# A11 tIH A10 RAx RBx RAy RAz RBy t IS A0-A9 RBx CAx RBx CBx RAy CAy RAz RBy DQM tRCD Hi-Z tRC Ax0 Ax1 Ax2 Ax3 tDAL Bx0 Bx1 Bx2 t IS Bx3 Ay0 tIH Ay1 Ay2 t WR Ay3 tRP tRRD DQ Activate Write with Activate Write with Activate Command AutoPrecharge Command AutoPrecharge Command Bank A Command Bank B Command Bank A Bank A Bank B Write Command Bank A Precharge Command Bank A Activate Command Bank A Activate Command Bank B Preliminary 22 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 2. AC Parameters for Read Timing (Burst Length=2, CAS# Latency=2) T0 CLK T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 tCH tCL CKE tCK2 t IS Begin AutoPrecharge Bank B t IS CS# RAS# tIH t IH CAS# WE# A11 tIH A10 RAx RBx RAy t IS A0-A9 RAx CAx RBx CBx RAy tRRD tRAS DQM Hi-Z DQ tRC tRCD tAC2 tLZ tAC2 Ax0 tHZ Ax1 Bx0 tRP Bx1 tOH Activate Command Bank A Read Command Bank A Activate Command Bank B Read with Auto Precharge Command Bank B Precharge Command Bank A tHZ Activate Command Bank A Preliminary 23 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 3. Auto Refresh (CBR) (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE CS# RAS# CAS# WE# A11 A10 RAx A0-A9 RAx CAx DQM tRP tRC tRC DQ Ax0 Ax1 Ax2 Ax3 PrechargeAll Command AutoRefresh Command AutoRefresh Command Activate Command Bank A Read Command Bank A Preliminary 24 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 4. Power on Sequene and Auto Refresh (CBR) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE High level is reauired Minimum of 2 Refresh Cycles are required CS# RAS# CAS# WE# A11 A10 Address Key A0-A9 DQM tRP DQ Hi-Z tRC PrechargeALL Command Inputs must be stable for 200 µs 1st AutoRefresh Command Mode Register Set Command (*) 2nd Auto Refresh Command (*) Any Command Note (*) : The Auto Refresh command can be issued before or after Mode Register Set command Preliminary 25 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 5. Self Refresh Entry & Exit Cycle T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 CLK *Note 2 *Note 1 *Note 4 *Note 3 tRC(min) tSRX *Note 7 CKE tPDE *Note 5 *Note 6 t IS CS# RAS# *Note 8 *Note 8 CAS# A11 A0-A9 WE # DQM DQ Hi-Z Hi-Z Self Refresh Enter SelfRefresh Exit AutoRefresh Note: To Enter SelfRefresh Mode 1. CS#, RAS# & CAS# with CKE should be low at the same clock cycle. 2. After 1 clock cycle, all the inputs including the system clock can be don't care except for CKE. 3. The device remains in SelfRefresh mode as long as CKE stays "low". Once the device enters SelfRefresh mode, minimum tRAS is required before exit from SelfRefresh. T o Exit SelfRefresh Mode 1. System clock restart and be stable before returning CKE high. 2. Enable CKE and CKE should be set high for minimum time of tSRX. 3. CS# starts from high. 4. Minimum tRC is required after CKE going high to complete SelfRefresh exit. 5. 2048 cycles of burst AutoRefresh is required before SelfRefresh entry and after SelfRefresh exit if the system uses burst refresh. Preliminary 26 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 6.1. Clock Suspension During Burst Read (Using CKE) (Burst Length=4, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T 7 T8 T9 T10 T 11 T1 T13 T14 T15 T16 T17 T1 T19 T20 T21 T22 tCK1 CKE CS# RAS# CAS# WE# A11 A10 RAx A0-A9 RAx CAx DQM tHZ DQ Hi-Z Ax0 Ax1 Ax3 Ax2 Activate Command Bank A Read Command Bank A Clock Suspend Clock Suspend 2 Cycles 1 Cycle Clock Suspend 3 Cycles Note: CKE to CLK disable/enable = 1 clock Preliminary 27 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 6.2. Clock Suspension During Burst Read (Using CKE) (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE CS# RAS# CAS# WE# A11 A10 RAx A0-A9 RAx CAx DQM tHZ DQ Hi-Z Ax0 Ax1 Ax2 Ax3 Activate Command Bank A Read Command Bank A Clock Suspend 1 Cycle Clock Suspend 2 Cycles Clock Suspend 3 Cycles Note: CKE to CLK disable/enable = 1 clock Preliminary 28 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 6.3. Clock Suspension During Burst Read (Using CKE) (Burst Length=4, CAS# Latency=3) T0 CLK T 1 T 2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE CS# RAS# CAS# WE# A11 A10 RAx A0-A9 RAx CAx DQM tHZ DQ Hi-Z Ax0 Ax1 Ax2 Ax3 Activate Command Bank A Read Command Bank A Clock Suspend 1 Cycle Clock Suspend 2 Cycles Clock Suspend 3 Cycles Note: CKE to CLK disable/enable = 1 clock Preliminary 29 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 7.1. Clock Suspension During Burst Write (Using CKE) (Burst Length = 4, CAS# Latency = 1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE CS# RAS# CAS# WE# A11 A10 RAx A0-A9 RAx CAx DQM DQ Hi-Z DAx0 DAx1 DAx2 DAx3 Activate Clock Suspend Clock Suspend Command 1 Cycle 2 Cycles Bank A Write Command Bank A Clock Suspend 3 Cycles Note: CKE to CLK disable/enable = 1 clock Preliminary 30 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 7.2. Clock Suspension During Burst Write (Using CKE) (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T2 2 tCK2 CKE CS# RAS# CAS# WE# A11 A10 RAx A0-A9 RAx CAx DQM DQ Hi-Z DAx0 DAx1 DAx2 DAx3 Activate Command Bank A Clock Suspend Clock Suspend 1 Cycle 2 Cycles Write Command Bank A Clock Suspend 3 Cycles Note: CKE to CLK disable/enable = 1 clock Preliminary 31 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 7.3. Clock Suspension During Burst Write (Using CKE) (Burst Length=4, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE CS# RAS# CAS# WE# A11 A10 RAx A0-A9 RAx CAx DQM DQ Hi-Z DAx0 DAx1 DAx2 DAx3 Activate Command Bank A Clock Suspend Clock Suspend 1 Cycle 2 Cycles Write Command Bank A Clock Suspend 3 Cycles Note: CKE to CLK disable/enable = 1 clock Preliminary 32 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 8. Power Down Mode and Clock Mask (Burst Lenght=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE t IS tPDE Valid CS# RAS# CAS# WE# A11 A10 RAx A0~A9 RAx CAx DQM tHZ Hi-Z DQ ACTIVE STANDBY Activate Read Command Command Bank A Bank A Power Down Power Down Mode Entry Mode Exit Ax0 Ax1 Ax2 Ax3 PRECHARGE STANDBY Clock Mask Start Clock Mask End Precharge Command Bank A Power Down Mode Entry Power Down Mode Exit Any Command Preliminary 33 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 9.1. Random Column Read (Page within same Bank) (Burst Length=4, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE CS# RAS# CAS# WE# A11 A10 RAw RAz A0~A9 RAw CAw CAx CAy RAz CAz DQM DQ Hi-Z Aw0 Aw1 Aw2 Aw3 Ax0 Ax1 Ay0 Ay1 Ay2 Ay3 Az0 Az1 Az2 Az3 Activate Command Bank A Read Command Bank A Read Command Bank A Read Command Bank A Precharge Read Command Command Bank A Bank A Activate Command Bank A Preliminary 34 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 9.2. Random Column Read (Page within same Bank) (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE CS# RAS# CAS# WE# A11 A10 RAw RAz A0~A9 RAw CAw CAx CAy RAz CAz DQM DQ Hi-Z Aw0 Aw1 Aw2 Aw3 Ax0 Ax1 Ay0 Ay1 Ay2 Ay3 Az0 Az1 Az2 Az3 Activate Command Bank A Read Command Bank A Read Command Bank A Read Command Bank A Precharge Command Bank A Activate Command Bank A Read Command Bank A Preliminary 35 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 9.3. Random Column Read (Page within same Bank) (Burst Length=4, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE CS# RAS# CAS# WE# A11 A10 RAw RAz A0~A9 RAw CAw CAx CAy RAz CAz DQM DQ Hi-Z Aw0 Aw1 Aw2 Aw3 Ax0 Ax1 Ay0 Ay1 Ay2 Ay3 Az0 Activate Command Bank A Read Command Bank A Read Command Bank A Read Command Bank A Precharge Command Bank A Activate Command Bank A Read Command Bank A Preliminary 36 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 10.1. Random Column Write (Page within same Bank) (Burst Length=4, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE CS# RAS# CAS# WE# A11 A10 RBw RBz A0~A9 RBw CBw CBx CBy RBz CBz DQM Hi-Z DQ DBw0 DBw1DBw2 DBw3 DBx0 DBx1 DBy0 DBy1 DBy2 DBy3 DBz0 DBz1 DBz2 DBz3 Activate Command Bank A Write Command Bank B Write Command Bank A Write Command Bank B Precharge Command Bank B Activate Command Bank B Write Command Bank B Preliminary 37 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 10.2. Random Column Write (Page within same Bank) (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE CS# RAS# CAS# WE# A11 A10 RBw RBz A0~A9 RBw CBw CBx CBy RBz CBz DQM DQ Hi-Z DBw0 DBw1DBw2 DBw3 DBx0 DBx1 DBy0 DBy1 DBy2 DBy3 DBz0 DBz1 DBz2 DBz3 Activate Command Bank A Write Command Bank B Write Command Bank B Write Command Bank B Precharge Command Bank B Activate Command Bank B Write Command Bank B Preliminary 38 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 10.3. Random Column Write (Page within same Bank) (Burst Length=4, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE CS# RAS# CAS# WE# A11 A10 RBw RBz A0~A9 RBw CBw CBx CBy RBz CBz DQM DQ Hi-Z DBw0 DBw1 DBw2 DBw3 DBx0 DBx1 DBy0 DBy1 DBy2 DBy3 DBz0 DBz1 DBz2 Activate Command Bank A Write Command Bank B Write Command Bank B Write Command Bank B Precharge Command Bank B Activate Command Bank B Write Command Bank B Preliminary 39 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 11.1. Random Row Read (Interleaving Banks) (Burst Length=8, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE High CS# RAS# CAS# WE# A11 A10 RBx RAx RBy A0~A9 RBx CBx RAx CAx RBy CBy tRCD DQM Hi-Z DQ Bx0 Bx1 Bx2 Bx3 Bx4 Bx5 Bx6 Bx7 Ax0 Ax1 Ax2 Ax3 Ax4 Ax5 Ax6 Ax7 By0 By1 By2 tAC1 tRP Activate Command Bank B Read Command Bank B Activate Command Bank A Precharge Command Bank B Activate Read Command Command Bank B Bank A Read Command Bank B Precharge Command Bank A Preliminary 40 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 11.2. Random Row Read (Interleaving Banks) (Burst Length=8, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE High CS# RAS# CAS# WE# A11 A10 RBx RAx RBy A0~A9 RBx CBx RAx CAx RBy CBy tRCD DQM tAC2 tRP Hi-Z DQ Bx0 Bx1 Bx2 Bx3 Bx4 Bx5 Bx6 Bx7 Ax0 Ax1 Ax2 Ax3 Ax4 Ax5 Ax6 Ax7 By0 By1 Activate Command Bank B Read Command Bank B Activate Command Bank A Precharge Command Bank B Read Command Bank A Activate Command Bank B Read Command Bank B Preliminary 41 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 11.3. Random Row Read (Interleaving Banks) (Burst Length=8, CAS# Latency=3) T0 T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK tCK3 CKE High CS# RAS# CAS# WE# A11 A10 RBx RAx RBy A0~A9 RBx CBx RAx CAx RBy CBy tRCD DQM tAC3 tRP Hi-Z DQ Bx0 Bx1 Bx2 Bx3 Bx4 Bx5 Bx6 Bx7 Ax0 Ax1 Ax2 Ax3 Ax4 Ax5 Ax6 Ax7 By0 Activate Command Bank B Read Command Bank B Activate Command Bank A Read Command Bank A Precharge Command Bank B Activate Command Bank B Read Command Bank B Precharge Command Bank A Preliminary 42 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 12.1. Random Row Write (Interleaving Banks) (Burst Length=8, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKEHigh CS# RAS# CAS# WE# A11 A10 RAx RBx RAy A0~A9 RAx CAx RBx CBx RAy CAy tRCD DQM tRP tWR Hi-Z DQ DAx0 DAx1 DAx2DAx3 DAx4 DAx5 DAx6 DAx7 DBx0 DBx1 DBx2 DBx3DBx4 DBx5 DBx6 DBx7 DAy0 DAy1 DAy2 DAy3 Activate Command Bank A Write Command Bank A Activate Command Bank B Write Command Bank B Precharge Command Bank A Activate Command Bank A Precharge Command Bank B Write Command Bank A Preliminary 43 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 12.2. Random Row Write (Interleaving Banks) (Burst Length=8, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RAy A0~A9 RAx CAx RBx CBx RAy CAy DQM tRCD tWR* tRP tWR* DQHi-Z DAx0 DAx1 DAx2 DAx3 DAx4 DAx5 DAx6 DAx7 DBx0 DBx1 DBx2 DBx3 DBx4 DBx5 DBx6 DBx7 DAy0 DAy1DAy2 DAy3 DAy4 Activate Command Bank A Write Command Bank A Activate Command Bank B Write Command Bank B Precharge Command Bank A Activate Command Bank A Write Command Bank A Precharge Command Bank B * tWR > tWR(min.) Preliminary 44 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 12.3. Random Row Write (Interleaving Banks) (Burst Length=8, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RAy A0~A9 RAx CAx RBx CBx RAy CAy tRCD DQM tWR* tRP tWR* DQHi-Z DAx0 DAx1 DAx2 DAx3 DAx4 DAx5 DAx6 DAx7 DBx0 DBx1 DBx2 DBx3 DBx4 DBx5 DBx6 DBx7 DAy0 DAy1 DAy2 DAy3 Activate Command Bank A Write Command Bank A Activate Command Bank B Write Command Bank B Precharge Command Bank A Activate Command Bank A Write Command Bank A Precharge Command Bank B * tWR > tWR(min.) Preliminary 45 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 13.1. Read and Write Cycle (Burst Length=4, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE CS# RAS# CAS# WE# A11 A10 RAx A0~A9 RAx CAx CAy CAz DQM DQ Hi-Z Ax0 Ax1 Ax2 Ax3 DAy0 DAy1 DAy3 Az0 Az1 Az3 Activate Command Bank A Read Command Bank A Read Write The Write Data Command is Masked with a Command Bank A Bank A Zero Clock Latency The Read Data is Masked with a Two Clock Latency Precharge Command Bank B Preliminary 46 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 13.2. Read and Write Cycle (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE CS# RAS# CAS# WE# A11 A10 RAx A0~A9 RAx CAx CAy CAz DQM DQ Hi-Z Ax0 Ax1 Ax2 Ax3 DAy0 DAy1 DAy3 Az0 Az1 Az3 Activate Command Bank A Read Command Bank A Write The Write Data Command is Masked with a Bank A Zero Clock Latency Read Command Bank A The Read Data is Masked with a Two Clock Latency Preliminary 47 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 13.3. Read and Write Cycle (Burst Length=4, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE CS# RAS# CAS# WE# A11 A10 RAx A0~A9 RAx CAx CAy CAz DQM DQ Hi-Z Ax0 Ax1 Ax2 Ax3 DAy0 DAy1 DAy3 Az0 Az1 Az3 Activate Command Bank A Read Command Bank A Write The Write Data Read Command is Masked with a Command Bank A Zero Clock Bank A Latency The Read Data is Masked with a Two Clock Latency Preliminary 48 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 14.1. Interleaving Column Read Cycle (Burst Length=4, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE CS# RAS# CAS# WE# A11 A10 RAx RBw A0~A9 RAx RAx RBw CBw CBx CBy CAy CBz DQM DQ Hi-Z tRCD tAC1 Ax0 Ax1 Ax2 Ax3 Bw0 Bw1 Bx0 Bx1 By0 By1 Ay0 Ay1 Bz0 Bz1 Bz2 Bz3 Activate Command Bank A Read Command Bank A Activate Command Bank B Read Command Bank B Read Command Bank B Read Command Bank B Read Command Bank A Read Command Bank B Precharge Command Bank A Precharge Command Bank B Preliminary 49 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 14.2. Interleaving Column Read Cycle (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE CS# RAS# CAS# WE# A11 A10 RAx RAx A0~A9 RAx CAy RAx CBw CBx CBy CAy CBz DQM tRCD tAC2 DQ Hi-Z Ax0 Ax1 Ax2 Ax3 Bw0 Bw1 Bx0 Bx1 By0 By1 Ay0 Ay1 Bz0 Bz1 Bz2 Bz3 Activate Command Bank A Read Command Bank A Activate Command Bank B Read Command Bank B Read Command Bank B Read Command Bank B Read Command Bank A Read Command Bank B Precharge Command Bank A Precharge Command Bank B Preliminary 50 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 14.3. Interleaved Column Read Cycle (Burst Length=4, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE CS# RAS# CAS# WE# A11 A10 RAx RBx A0~A9 RAx CAx RBx CBx CBy CBz CAy DQM tRCD tAC3 DQ Hi-Z Ax0 Ax1 Ax2 Ax3 Bx0 Bx1 By0 By1 Bz0 Bz1 Ay0 Ay1 Ay2 Ay3 Activate Command Bank A Read Command Bank A Activate Command Bank B Read Command Bank B Read Command Bank B Read Command Bank B Read Prechaerge Command Command Bank B Bank A Precharge Command Bank A Preliminary 51 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 15.1. Interleaved Column Write Cycle (Burst Length=4, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE CS# RAS# CAS# WE# A11 A10 RAx RBw A0~A9 RAx CAx RBw CBw CBx CBy CAy CBz tRP DQM tRCD tRRD tWR tRP DQ Hi-Z DAx0 DAx1 DAx2 DAx3 DBw0 DBw1 DBx0 DBx1 DBy0 DBy1 DAy0 DAy1 DBz0 DBz1 DBz2 DBz3 Activate Command Bank A Activate Command Bank B Write Command Bank B Write Command Bank B Write Command Bank B Write Command Bank A Write Command Bank A Write Command Bank B Precharge Command Bank A Precharge Command Bank B Preliminary 52 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 15.2. Interleaved Column Write Cycle (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE CS# RAS# CAS# WE# A11 A10 RAx RBw A0~A9 RAx CAx RBw CBw CBx CBy CAy CBz DQM tRCD tRRD tRP tWR tRP DQ Hi-Z DAx0 DAx1 DAx2 DAx3 DBw0 DBw1 DBx0 DBx1 DBy0 DBy1 DAy0 DAy1 DBz0 DBz1 DBz2 DBz3 Activate Command Bank A Write Command Bank A Activate Command Bank B Write Command Bank B Write Command Bank B Write Command Bank B Write Command Bank A Write Command Bank B Precharge Command Bank A Precharge Command Bank B Preliminary 53 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 15.3. Interleaved Column Write Cycle (Burst Length=4, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE CS# RAS# CAS# WE# A11 A10 RAx RBw A0~A9 RAx CAx RBw CBw CBx CBy CAy CBz DQM tRCD tRRD > tRRD(min) tWR tRP tWR(min) DQ Hi-Z DAx0 DAx1 DAx2 DAx3 DBw0 DBw1 DBx0 DBx1 DBy0 DBy1 DAy0 DAy1 DBz0 DBz1 DBz2 DBz3 Activate Command Bank A Activate Command Bank B Write Command Bank A Write Command Bank B Write Command Bank B Write Command Bank B Write Command Bank A Write Command Bank B Precharge Command Bank A Precharge Command Bank B Preliminary 54 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 16.1. Auto Precharge after Read Burst (Burst Length=4, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RBy RBz A0~A9 RAx CAx RBx CBx CAy RBy CBy RBz CBz DQM Hi-Z Ax0 DQ Ax1 Ax2 Ax3 Bx0 Bx1 Bx2 Bx3 Ay0 Ay1 Ay2 Ay3 By0 By1 By2 By3 Bz0 Bz1 Bz2 Bz3 Activate Command Bank A Read Command Bank A Activate Command Bank B Read with Auto Precharge Command Bank B Activate Command Bank B Read with Auto Precharge Command Bank A Read with Auto Precharge Command Bank B Activate Command Bank B Read with Auto Precharge Command Bank B Preliminary 55 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 16.2. Auto Precharge after Read Burst (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE High CS# RAS# CAS# WE # A11 A10 RAx RBx RBy RAz A0~A9 RAx CAx RBx CBx RAy RBy CBy RAz CAz DQM DQ Hi-Z Ax0 Ax1 Ax2 Ax3 Bx0 Bx1 Bx2 Bx3 Ay0 Ay1 Ay2 Ay3 By0 By1 By2 By3 Az0 Az1 Az2 Activate Command Bank A Read Command Bank A Activate Read with Command Auto Precharge Bank B Command Bank B Read with Activate Read with Activate Read with Auto Precharge Command Auto Precharge Command Auto Precharge Command Bank B Command Bank A Command Bank A Bank B Bank A Preliminary 56 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 16.3. Auto Precharge after Read Burst (Burst Length=4, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RBy A0~A9 RAx CAx RBx CBx CAy RBy CBy DQM DQ Hi-Z Ax0 Ax1 Ax2 Ax3 Bx0 Bx1 Bx2 Bx3 Ay0 Ay1 Ay2 Ay3 By0 By1 By2 By3 Activate Command Bank A Activate Command Bank B Read Command Bank A Read with Auto Precharge Command Bank B Read with Auto Precharge Command Bank A Activate Command Bank B Read with Auto Precharge Command Bank B Preliminary 57 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 17.1. Auto Precharge after Write Burst (Burst Length=4, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RBy RAz A0~A9 RAx CAx RBx CBx CAy RBy CBy RAz CAz DQM DQ Hi-Z DAx0 DAx1 DAx2 DAx3 DBx0 DBx1 DBx2 DBx3 DAy0 DAy1 DAy2 DAy3 DBy0 DBy1 DBy2 DBy3 DAz0 DAz0 DAz0 DAz0 Activate Command Bank A Write Command Bank A Write with Activate Command Auto Precharge Command Bank B Bank B Write with Auto Precharge Command Bank A Write with Activate Command Auto Precharge Command Bank B Bank B Activate Command Bank A Write with Auto Precharge Command Bank A Preliminary 58 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 17.2. Auto Precharge after Write Burst (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RBy RAz A0~A9 RAx CAx RBx CBx CAy RBy CBy RAz CAz DQM DQ Hi-Z DAx0 DAx1 DAx2 DAx3 DBx0 DBx1 DBx2 DBx3 DAy0 DAy1 DAy2 DAy3 DBy0 DBy1 DBy2 DBy3 DAz0 DAz1 DAz2 DAz3 Activate Command Bank A Write Command Bank A Write with Activate Command Auto Precharge Command Bank B Bank B Write with Auto Precharge Command Bank A Write with Activate Write with Activate Command Auto Precharge Command Auto Precharge Command Bank A Command Bank B Bank B Bank A Preliminary 59 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 17.3. Auto Precharge after Write Burst (Burst Length=4, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE High CS# RAS# CAS# WE# A11 ` A10 RAx RBx RBy A0~A9 RAx CAx RBx CBx CAy RBy CBy DQM Hi-Z DQ DAx0 DAx1 DAx2 DAx3 DBx0 DBx1 DBx2 DBx3 DAy0 DAy1 DAy2 DAy3 DBy0 DBy1 DBy2 DBy3 Activate Command Bank A Activate Command Bank B Write Command Bank A Write with Auto Precharge Command Bank B Write with Auto Precharge Command Bank A Activate Command Bank B Write with Auto Precharge Command Bank B Preliminary 60 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 18.1. Full Page Read Cycle (Burst Length=Full Page, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RBy A0~A9 RAx CAx RBx CBx RBy DQM tRRD tRP DQ Hi-Z Ax Ax+1 Ax+2 Ax-2 Ax-1 Ax Ax+1 Bx Bx+1 Bx+2 Bx+3 Bx+4 Bx+5 Bx+6 Bx+7 Activate Command Bank A Activate Command Bank B The burst counter wraps from the highest order Read page address back to zero Command during this time interval Bank A Read Command Bank B Full Page burst operation does not terminate when the burst length is satisfied; the burst counter increments and continues bursting beginning w ith the starting address. Precharge Command Bank B Activate Burst Stop Command Command Bank B Preliminary 61 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 18.2. Full Page Read Cycle (Burst Length=Full Page, CAS# Latency=2) T0 CL K T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE High CS# RAS# CAS# WE # A11 A10 RAx RBx RBy A0~A9 RAx CAx RBx CBx RBy tRP DQM DQ Hi-Z Ax Ax+1 Ax+2 Ax-2 Ax-1 Ax Ax+1 Bx Bx+1 Bx+2 Bx+3 Bx+4 Bx+5 Bx+6 Activate Command Bank A Read Command Bank A Activate Read Precharge Full Command Command Page burst operation does not Command Bank B Bank B terminate when the burst length is satisfied; Bank B The burst counter wraps the burst counter increments and continues from the highest order bursting beginning with the starting address. page address back to zero Burst Stop during this time interval Command Activate Command Bank B Preliminary 62 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 18.3. Full Page Read Cycle (Burst Length=Full Page, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RBy A0~A9 RAx CAx RBx CBx RBy DQM tRP DQ Hi-Z Ax Ax+1 Ax+2 Ax-2 Ax-1 Ax Ax+1 Bx Bx+1 Bx+2 Bx+3 Bx+4 Bx+5 Activate Command Bank A Read Command Bank A Activate Command Bank B Read Command Bank B The burst counter wraps from the highest order page address back to zero during this time interval Full Page burst operation does not Precharge Command terminate when the burst length is Bank B satisfied; the burst counter increments and continues bursting beginning with the Burst Stop starting address. Command Activate Command Bank B Preliminary 63 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 19.1. Full Page Write Cycle (Burst Length=Full Page, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RBy A0~A9 DQM RAx CAx RBx CBx RBy DQ Hi-Z DBx DAx DAx+ 1 DAx+ 2 DAx+ 3 DAx- 1 DAx DAx+ 1 DBx+1 DBx+ 2 DBx+ 3 DBx+4 DBx+5 DBx+6 DBx+7 Activate Command Bank A Activate Command Bank B The burst counter wraps from the highest order Write page address back to zero Command during this time interval Bank A Write Command Bank B Full Page burst operation does not terminate when the burst length is satisfied; the burst counter increments and continues bursting beginning w ith the starting address. Data is ignored Precharge Command Bank B Burst Stop Activate Command Command Bank B Preliminary 64 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 19.2. Full Page Write Cycle (Burst Length=Full Page, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RBy A0~A9 RAx CAx RBx CBx RBy DQM DQ Hi-Z DAx DAx+ 1 DAx+ 2 DAx+ 3 DAx- 1 DAx DAx+ 1 DBx DBx+1 DBx+ 2 DBx+ 3 DBx+4 DBx+ 5 DBx+ 6 Activate Command Bank A Write Command Bank A Activate Command Bank B The burst counter wraps from the highest order page address back to zero during this time interval Write Command Bank B Full Page burst operation does not terminate when the burst length is satisfied; the burst counter increments and continues bursting beginning w ith the starting address. Data is ignored Precharge Command Bank B Burst Stop Command Activate Command Bank B Preliminary 65 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 19.3. Full Page Write Cycle (Burst Length=Full Page, CAS# Latency=3) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK3 CKE High CS# RAS# CAS# WE# A11 A10 RAx RBx RBy A0~A9 RAx CAx RBx CBx RBy DQM Data is ignored DQ Hi-Z DAx DAx+ 1 DAx+ 2 DAx+ 3 DAx- 1 DAx DAx+ 1 DBx DBx+ 1 DBx+ 2 DBx+ 3 DBx+ 4 DBx+ 5 Activate Command Bank A Write Command Bank A Activate Command Bank B The burst counter wraps from the highest order page address back to zero during this time interval Write Command Bank B Full Page burst operation does not terminate when the burst length is satisfied; the burst counter increments and continues bursting beginning w ith the starting address. Precharge Command Bank B Burst Stop Command Activate Command Bank B Preliminary 66 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 20. Byte Write Operation (Burst Length=4, CAS# Latency=2) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK2 CKE High CS# RAS# CAS# WE# A11 A10 RAx A0~A9 RAx CAx CAy CAz LDQM UDQM DQ0 - DQ7 Ax0 Ax1 Ax2 DAy1 DAy2 Az1 Az2 DQ8 - DQ15 Ax1 Ax2 Ax3 DAy0 DAy1 DAy3 Az0 Az1 Az2 Az3 Activate Command Bank A Read Upper 3 Bytes Command are masked Bank A Lower Byte is masked Write Upper 3 Bytes Read Command are masked Command Bank A Bank A Lower Byte is masked Lower Byte is masked Preliminary 67 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 21. Random Row Read (Interleaving Banks) (Burst Length=2, CAS# Latency=1) T0 CLK T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCK1 CKE High Begin Auto Precharge Bank B Begin Auto Precharge Bank A Begin Auto Precharge Bank B Begin Auto Precharge Bank A Begin Auto Precharge Bank B Begin Auto Precharge Bank A Begin Auto Precharge Bank B Begin Auto Precharge Bank A Begin Auto Precharge Bank B Begin Auto Precharge Bank A CS# RAS# CAS# WE# A11 A10 RBu RAu RBv RAv RBw RAw RBx RAx RBy RAy RBz RAz A0~A9 RBu CBu RAu CAu RBv CBv RAv CAv RBw CBw RAw CAw RBx CBx RAx CAx RBy CBy RAy CAy RBz CBz RAz DQM tRP tRP tRP t RP tRP t RP tRP tRP tRP t RP DQ Bu0 Bu1 Au0 Au1 Bv0 Bv1 Av0 Av1 Bw0 Bw1 Aw0 Aw1 Bx0 Bx1 Ax0 Ax1 By0 By1 Ay0 Ay1 Bz0 Activate Command Bank B Activate Activate Activate Activate Activate Activate Activate Activate Activate Activate Activate Command Command Command Command Command Command Command Command Command Command Command Bank A Bank B Bank A Bank B Bank A Bank B Bank A Bank B Bank A Bank B Bank A Read Read Read Read Read Read Read Read Read Read Read Bank B Bank A Bank B Bank A Bank B Bank A Bank B Bank A Bank B Bank A Bank B with Auto with Auto with Auto with Auto with Auto with Auto with Auto with Auto with Auto with Auto with Auto Precharge Precharge Precharge Precharge Precharge Precharge Precharge Precharge Precharge Precharge Precharge Preliminary 68 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 22. Full Page Random Column Read (Burst Length=Full Page, CAS# Latency=2) T0 T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CL K tCK2 CKE CS# RAS# CAS# WE # A11 A10 RAx RBx RBw A0~A9 RAx RBx CAx CBx CAy CBy CAz CBz RBw tRP DQM tRRD DQ tRCD Ax0 Bx0 Ay0 Ay1 By0 By1 Az0 Az1 Az2 Bz0 Bz1 Bz2 Activate Command Bank A Activate Command Bank B Read Command Bank B Read Read Command Command Bank A Bank A Read Command Bank B Read Command Bank A Read Command Bank B Precharge Command Bank B (Precharge Temination) Activate Command Bank B Preliminary 69 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 23. Full Page Random Column Write (Burst Length=Full Page, CAS# Latency=2) T0 T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK tCK2 CKE CS# RAS# CAS# WE# A11 A10 RAx RBx RBw A0~A9 RAx RBx CAx CBx CAy CBy CAz CBz RBw t WR DQM tRP tRRD DQ tRCD DAx0 DBx0 DAy0 DAy1 DBy0 DBy1 DAz0 DAz1 DAz2 DBz0 DBz1 DBz2 Activate Command Bank A Activate Command Bank B Write Command Bank B Write Write Command Command Bank A Bank A Write Command Bank B Write Command Bank A Write Command Bank B Precharge Command Bank B (Precharge Temination) Activate Write Data Command Bank B is m asked Preliminary 70 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 24.1. Precharge Termination of a Burst (Burst Length=Full Page, CAS# Latency=1) T0 T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK tCK1 CKE CS# RAS# CAS# WE# A11 A10 RAx RAy RAz A0~A9 RAx CAx RAy CAy RAz CAz tWR tRP DQM tRP Precharge Termination of a Read Burst. DQ DAx0 DAx1 DAx2 DAx3 DAx4 Ay0 Ay1 Ay2 DAz0 DAz1 DAz2 DAz3 DAz4 DAz5 DAz6 DAz7 Read Activate Precharge Termination Precharge Command Command Command of a Write Burst. Bank A Bank A Bank A Write data is masked. Write Activate Command Command Bank A Bank A Precharge Command Bank A Write Command Bank A Activate Command Bank A Preliminary 71 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 24.2. Precharge Termination of a Burst (Burst Length=8 or Full Page, CAS# Latency=2) T0 T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK tCK2 CKE High CS# RAS# CAS# WE# A11 A10 RAx RAy RAz A0~A9 RAx CAx RAy CAy RAz CAz tWR DQM tRP tRP tRP DQ DAx0 DAx1DAx2 DAx3 Ay0 Ay1 Ay2 Az0 Az1 Az2 Activate Command Bank A Write Command Bank A Precharge Command Bank A Activate Command Bank A Read Command Bank A Precharge Command Bank A Activate Command Bank A Precharge Termination of a Write Burst. Write data is masked. Precharge Read Command Command Bank A Bank A Precharge Termination of a Read Burst Preliminary 72 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 Figure 24.3. Precharge Termination of a Burst (Burst Length=4, 8 or Full Page, CAS# Latency=3) T0 T 1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T 11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK tCK3 CKE CS# High RAS# CAS# WE# A11 A10 RAx RAy RAz A0~A9 RAx CAx RAy CAy RAz t WR DQM tRP tRP DQ DAx0 DAx1 Ay0 Ay1 Ay2 Activate Command Bank A Write Command Bank A Write Data is masked Precharge Command Bank A Activate Command Bank A Read Command Bank A Precharge Command Bank A Activate Precharge Termination Command of a Read Burst Bank A Precharge Termination of a Write Burst Preliminary 73 Rev. 2.7 Mar. 2006 EtronTech 1M x 16 SDRAM EM636165 50 Pin TSOP II Package Outline Drawing Information 50 26 HE E 0. 254 θ° L L1 1 D 25 A1 A2 A S B e L y L1 Symbol A A1 A2 B c D E e HE L L1 S y θ Notes : 1. Dimension D&E do not include interiead flash. 2. Dimension B does not include dambar protrusion/intrusion. 3. Dimension S includes end flash. 4. Controlling dimension : mm Dimension in inch Min Normal Max 0.047 - - 0.002 0.005 0.008 0.039 - - 0.012 0.015 0.018 0.006 - - 0.82 0.825 0.83 0.398 0.400 0.402 0.031 - - 0.459 0.463 0.467 0.016 0.020 0.024 0.0315 - - 0.035 - - 0.004 - - - 0° 5° Min - 0.05 - 0.3 - 20.82 10.11 - 11.66 0.40 - - - 0° Dimension in mm Normal - 0.125 - 0.375 0.155 20.95 10.16 0.80 11.76 0.50 0.80 0.88 - - Max 1.20 0.20 1 0.45 - 21.08 10.21 - 11.86 0.60 - - 0.10 5° Preliminary 74 Rev. 2.7 Mar. 2006 C EtronTech 1Mx16 SDRAM Package Diagrams 60-Ball (6.4mm x 10.1mm)VFBGA Units in mm 1M x 16 SDRAM EM636165 BOTTOM VIEW TOP VIEW A1 CORNER ⊕ 4 5 6 7 7 6 ∅ 0.08 M ∅ 0.16 M C A1 CORNER C A B ∅=0.30 1 2 3 5 4 3 2 1 A B C D E F G 10.10± 0.10 9.10 A B C D E F G H J K L M 0.65 H J K L M N P R N P R A 3.90 0.65 B D 0.10(4X) C 6.40±0.10 EM636165VE : 1.00 MAX EM636165BE : 1.20 MAX D 0.10(4X) C SEATING PLANE Preliminary 75 Rev. 2.7 Mar. 2006
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