74ABT541

74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs March 2007 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs Features ■ Non-inverting buffers ■ Output sink capability of 64mA, source capability of tm General Description The ABT541 is an octal buffer and line driver with 3-STATE outputs designed to be employed as a memory and address driver, clock driver, or bus-oriented transmitter/receiver. The ABT541 is similar to the ABT244 with broadside pinout. 32mA ■ Guaranteed output skew ■ Guaranteed multiple output switching specifications ■ Output switching specified for both 50pF and 250pF loads ■ Guaranteed simultaneous switching, noise level and ■ ■ ■ ■ ■ dynamic threshold performance Guaranteed latchup protection High-impedance, glitch-free bus loading during entire power up and power down cycle Nondestructive, hot-insertion capability Flow-through pinout for ease of PC board layout Disable time less than enable time to avoid bus contention Ordering Information Order Number 74ABT541CSC 74ABT541CSJ 74ABT541CMSA 74ABT541CMTC Package Number M20B M20D MSA20 MTC20 Package Description 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 20-Lead Shrink Small Outline Package (SSOP), JEDEC MO-150, 5.3mm Wide 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Devices also available in Tape and Reel. Specify by appending suffix “X” to the ordering number. Pb-Free package per JEDEC J-STD-020B. Connection Diagram Pin Descriptions Pin Names OE1, OE2 I0–I7 O0–O7 Inputs Outputs Description Output Enable Input (Active LOW) ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs Truth Table Inputs OE1 L H X L OE2 L X H L I H X X L Outputs H Z Z L H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance Absolute Maximum Ratings Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. Symbol TSTG TA TJ VCC VIN IIN VO Storage Temperature Parameter Ambient Temperature Under Bias Junction Temperature Under Bias VCC Pin Potential to Ground Pin Input Voltage(1) Input Current(1) Voltage Applied to Any Output Disabled or Power-Off State HIGH State Current Applied to Output in LOW State (Max.) DC Latchup Source Current Over Voltage Latchup (I/O) Rating –65°C to +150°C –55°C to +125°C –55°C to +150°C –0.5V to +7.0V –0.5V to +7.0V –30mA to +5.0mA –0.5V to 5.5V –0.5V to VCC twice the rated IOL (mA) –500mA 10V Note: 1. Either voltage limit or current limit is sufficient to protect inputs. Recommended Operating Conditions The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to absolute maximum ratings. Symbol TA VCC ∆V / ∆t Supply Voltage Minimum Input Edge Rate Data Input Enable Input Parameter Free Air Ambient Temperature Rating –40°C to +85°C +4.5V to +5.5V 50mV/ns 20mV/ns ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 2 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs DC Electrical Characteristics Symbol VIH VIL VCD VOH VOL IIH IBVI IIL VID IOZH IOZL IOS ICEX IZZ ICCH ICCL ICCZ ICCT Parameter Input HIGH Voltage Input LOW Voltage Input Clamp Diode Voltage Output HIGH Voltage Output LOW Voltage Input HIGH Current Input HIGH Current Breakdown Test Input LOW Current Input Leakage Test Output Leakage Current Output Leakage Current Output Short-Circuit Current Output HIGH Leakage Current Bus Drainage Test Power Supply Current Power Supply Current Power Supply Current Additional Outputs Enabled ICC/Input Outputs 3-STATE Outputs 3-STATE VCC Conditions Recognized HIGH Signal Recognized LOW Signal Min. 2.0 Typ. Max. Units V 0.8 –1.2 V V V V 0.55 1 1 7 –1 –1 µA µA V 10 –10 µA µA mA µA µA µA mA µA mA mA µA mA/ MHz V µA Min. Min. Min. Max. Max. Max. 0.0 IIN = –18mA IOH = –3mA IOH = –32mA IOL = 64mA VIN = 2.7V(3) VIN = VCC VIN = 7.0V VIN = 0.5V(3) VIN = 0.0V IID = 1.9µA, All Other Pins Grounded 4.75 2.5 2.0 0–5.5V VOUT = 2.7V, OEn = 2.0V 0–5.5V VOUT = 0.5V, OEn = 2.0V Max. Max. 0.0 Max. Max. Max. VOUT = 0.0V VOUT = VCC VOUT = 5.5V, All Others GND All Outputs HIGH All Outputs LOW OEn = VCC, All Others at VCC or Ground VI = VCC – 2.1V Max. Enable Input VI = VCC – 2.1V Data Input VI = VCC – 2.1V, All Others at VCC or Ground Max Outputs Open, OEn = GND, One-Bit Toggling(2), 50% Duty Cycle –100 –275 50 100 50 30 50 2.5 2.5 50 0.1 ICCD Dynamic ICC No Load(3) Notes: 2. For 8-bit toggling, ICCD < 0.8mA/MHz. 3. Guaranteed, but not tested. ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 3 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs DC Electrical Characteristics SOIC package. Symbol VOLP VOLV VOHV VIHD VILD Parameter Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Minimum HIGH Level Dynamic Output Voltage Minimum HIGH Level Dynamic Input Voltage Maximum LOW Level Dynamic Input Voltage VCC 5.0 5.0 5.0 5.0 5.0 Conditions CL = 50pF, RL = 500Ω TA = TA = TA = 25°C(4) 25°C(4) 25°C(5) Min. –1.3 2.7 2.0 Typ. 0.7 –0.8 3.1 1.4 1.1 Max. 1.0 Units V V V V TA = 25°C(6) TA = 25°C(6) 0.6 V Notes: 4. Max number of outputs defined as (n). n – 1 data inputs are driven 0V to 3V. One output at LOW. Guaranteed, but not tested. 5. Max number of outputs defined as (n). n – 1 data inputs are driven 0V to 3V. One output HIGH. Guaranteed, but not tested. 6. Max number of data inputs (n) switching. n – 1 inputs switching 0V to 3V. Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD). Guaranteed, but not tested. AC Electrical Characteristics SOIC and SSOP package. TA = +25°C, VCC = +5V, CL = 50pF Symbol tPLH tPHL tPZH tPZL tPHZ tPLZ Output Disable Time TA = –40°C to +85°C, VCC = 4.5V–5.5V, CL = 50pF Min. 1.0 1.0 1.5 1.5 1.7 1.7 Parameter Propagation Delay, Data to Outputs Output Enable Time Min. 1.0 1.0 1.5 1.5 1.7 1.7 Typ. 2.0 2.4 3.1 3.7 3.5 3.1 Max. 3.6 3.6 6.0 6.0 6.1 5.6 Max. 3.6 3.6 6.0 6.0 6.1 5.6 Units ns ns ns ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 4 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs Extended AC Electrical Characteristics SOIC package. –40°C to +85°C, VCC = 4.5V to 5.5V, CL = 50pF, 8 Outputs Switching(7) Symbol fTOGGLE tPLH tPHL tPZH tPZL tPHZ tPLZ Output Disable Time TA = –40°C to +85°C, TA = –40°C to +85°C, VCC = 4.5V to 5.5V, VCC = 4.5V to 5.5V, CL = 250pF, CL = 250pF, 1 Output 8 Outputs Switching(8) Switching(9) Min. Max. Mi.n Max. Units MHz Parameter Max Toggle Frequency Propagation Delay, Data to Outputs Output Enable Time Min. Typ. 100 Max. 1.5 1.5 1.5 1.5 1.0 1.0 5.0 5.0 6.5 6.5 6.1 5.6 1.5 1.5 2.5 2.5 (10) 6.0 6.0 7.5 7.5 2.5 2.5 2.5 2.5 8.5 8.5 9.5 10.5 ns ns ns Notes: 7. This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase (i.e., all LOW-to-HIGH, HIGH-to-LOW, etc.). 8. This specification is guaranteed but not tested. The limits represent propagation delay with 250pF load capacitors in place of the 50pF load capacitors in the standard AC load. This specification pertains to single output switching only. 9. This specification is guaranteed but not tested. The limits represent propagation delays for all paths described switching in phase (i.e., all LOW-to-HIGH, HIGH-to-LOW, etc.) with 250pF load capacitors in place of the 50pF load capacitors in the standard AC load. 10. The 3-STATE delays are dominated by the RC network (500Ω, 250pF) on the output and have been excluded from the datasheet. ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 5 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs Skew SOIC package. TA = –40°C to +85°C, VCC = 4.5V to 5.5V, CL = 50pF, 8 Outputs Switching(11) Symbol tOSHL tOSLH tPS tPV (13) (13) TA = –40°C to +85°C, VCC = 4.5V to 5.5V, CL = 250pF, 8 Outputs Switching(12) Max. 2.3 1.8 3.5 3.5 3.5 Parameter Pin to Pin Skew, HL Transitions Pin to Pin Skew, LH Transitions Duty Cycle, LH/HL Skew Pin to Pin Skew, LH/HL Transitions Device to Device Skew, LH/HL Transitions Max. 1.3 1.0 2.0 2.0 2.0 Units ns ns ns ns ns (14) tOST(13) (15) Notes: 11. This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase (i.e., all LOW-to-HIGH, HIGH-to-LOW, etc.) 12. These specifications guaranteed but not tested. The limits represent propagation delays with 250pF load capacitors in place of the 50pF load capacitors in the standard AC load. 13. Skew is defined as the absolute value of the difference between the actual propagation delays for any two separate outputs of the same device. The specification applies to any outputs switching HIGH-to-LOW (tOSHL), LOW-to-HIGH (tOSLH), or any combination switching LOW-to-HIGH and/or HIGH-to-LOW (tOST). The specification is guaranteed but not tested. 14. This describes the difference between the delay of the LOW-to-HIGH and the HIGH-to-LOW transition on the same pin. It is measured across all the outputs (drivers) on the same chip, the worst (largest delta) number is the guaranteed specification. This specification is guaranteed but not tested. 15. Propagation delay variation for a given set of conditions (i.e., temperature and VCC) from device to device. This specification is guaranteed but not tested. Capacitance Symbol CIN COUT (16) Parameter Input Capacitance Output Capacitance Conditions TA = 25°C VCC = 0.0V VCC = 5.0V Typ. 5.0 9.0 Units pF pF Note: 16. COUT is measured at frequency of f = 1 MHz, per MIL-STD-883, Method 3012. ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 6 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs AC Loading *Includes jig and probe capacitance Figure 1. Standard AC Test Load Figure 2. Test Input Signal Levels Amplitude 3.0V Rep. Rate 1 MHz tW 500 ns tr 2.5 ns tf 2.5 ns Figure 3. Test Input Signal Requirements AC Waveforms Figure 4. Propagation Delay Waveforms for Inverting and Non-Inverting Functions Figure 6. 3-STATE Output HIGH and LOW Enable and Disable Time Figure 5. Propagation Delay, Pulse Width Waveforms Figure 7. Setup Time, Hold Time and Recovery Time Waveforms www.fairchildsemi.com 7 ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs Physical Dimensions Dimensions are in inches (millimeters) unless otherwise noted. Figure 8. 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide Package Number M20B ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 8 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs Physical Dimensions (Continued) Dimensions are in millimeters unless otherwise noted. Figure 9. 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M20D ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 9 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs Physical Dimensions (Continued) Dimensions are in millimeters unless otherwise noted. Figure 10. 20-Lead Shrink Small Outline Package (SSOP), JEDEC MO-150, 5.3mm Wide Package Number MSA20 ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 10 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs Physical Dimensions (Continued) Dimensions are in millimeters unless otherwise noted. Figure 11. 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Package Number MTC20 ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 11 74ABT541 Octal Buffer/Line Driver with 3-STATE Outputs TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx Across the board. Around the world. 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FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Preliminary Product Status Formative or In Design First Production Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains specifications on a product that has been discontinued by Fairchild Semiconductor. The datasheet is printed for reference information only. Rev. I24 2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. No Identification Needed Full Production Obsolete Not In Production ©1992 Fairchild Semiconductor Corporation 74ABT541 Rev. 1.4 www.fairchildsemi.com 12