74ACTQ533MTC

74ACTQ533 Quiet Series Octal Transparent Latch with 3-STATE Outputs January 1990 Revised November 1999 74ACTQ533 Quiet Series Octal Transparent Latch with 3-STATE Outputs General Description The ACTQ533 consists of eight latches with 3-STATE outputs for bus organized system applications. The flip-flops appear transparent to the data when Latch Enable (LE) is HIGH. When LE is LOW, the data satisfying the input timing requirements is latched. Data appears on the bus when the Output Enable (OE) is LOW. When OE is HIGH, the bus output is in the high impedance state. The ACTQ533 utilizes Fairchild Quiet Series technology to guarantee quiet output switching and improve dynamic threshold performance. FACT Quiet Series features GTO output control and undershoot corrector in addition to a split ground bus for superior performance. Features s ICC and IOZ reduced by 50% s Guaranteed simultaneous switching noise level and dynamic threshold performance s Guaranteed pin-to-pin skew AC performance s Improved latch up immunity s Eight latches in a single package s 3-STATE outputs drive bus lines or buffer memory address registers s Outputs source/sink 24 mA s Inverted version of the ACTQ373 s 4 kV minimum ESD immunity Ordering Code: Order Number 74ACTQ533SC 74ACTQ533MTC 74ACTQ533PC Package Number M20B MTC20 N20A Package Description 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code Logic Symbols IEEE/IEC Connection Diagram Pin Descriptions Pin Names D0–D7 LE OE O0–O7 FACT, FACT Quiet Series, and GTO are trademarks of Fairchild Semiconductor Corporation. Description Data Inputs Latch Enable Input Output Enable Input 3-STATE Latch Outputs © 1999 Fairchild Semiconductor Corporation DS010630 www.fairchildsemi.com 74ACTQ533 Truth Table Inputs LE X H H L H = HIGH Voltage Level L = LOW Voltage Level Z = High Impedance X = Immaterial O0 = Previous O0 before HIGH-to-LOW transition of Latch Enable Outputs Dn X L H X On Z H L O0 OE H L L L Functional Description The ACTQ533 contains eight D-type latches with 3-STATE standard outputs. When the Latch Enable (LE) input is HIGH, data on the Dn inputs enters the latches. In this condition the latches are transparent, i.e., a latch output will change state each time its D input changes. When LE is LOW, the latches store the information that was present on the D inputs at setup time preceding the HIGH-to-LOW transition of LE. The 3-STATE standard outputs are controlled by the Output Enable (OE) input. When OE is LOW, the standard outputs are in the 2-state mode. When OE is HIGH, the standard outputs are in the high impedance mode but this does not interfere with entering new data into the latches. Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 74ACTQ533 Absolute Maximum Ratings(Note 1) Supply Voltage (VCC) DC Input Diode Current (IIK) VI = − 0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = − 0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) DC Latchup Source or Sink Current Junction Temperature (TJ) PDIP 140°C ± 300 mA ± 50 mA − 65°C to + 150°C ± 50 mA − 20 mA + 20 mA − 0.5V to VCC + 0.5V − 20 mA + 20 mA −0.5V to VCC + 0.5V − 0.5V to + 7.0V Recommended Operating Conditions Supply Voltage (VCC) Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) Minimum Input Edge Rate ∆V/∆t VIN from 0.8V to 2.0V VCC @ 4.5V, 5.5V 4.5V to 5.5V 0V to VCC 0V to VCC −40°C to +85°C 125 mV/ns Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specifications. DC Electrical Characteristics Symbol VIH VIL VOH Parameter Minimum HIGH Level Input Voltage Maximum LOW Level Input Voltage Minimum HIGH Level Output Voltage VCC (V) 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 VOL Maximum LOW Level Output Voltage 4.5 5.5 4.5 5.5 IIN IOZ ICCT IOLD IOHD ICC VOLP VOLV VIHD Maximum Input Leakage Current Maximum 3-STATE Leakage Current Maximum ICC/Input Minimum Dynamic Output Current (Note 3) Maximum Quiescent Supply Current Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Minimum HIGH Level Dynamic Input Voltage 5.5 5.5 5.5 5.5 5.5 5.5 5.0 5.0 5.0 1.1 −0.6 1.9 4.0 1.5 −1.2 2.2 0.6 0.001 0.001 TA = +25°C Typ 1.5 1.5 1.5 1.5 4.49 5.49 2.0 2.0 0.8 0.8 4.4 5.4 3.86 4.86 0.1 0.1 0.36 0.36 ±0.1 ±0.25 TA = −40°C to +85°C Guaranteed Limits 2.0 2.0 0.8 0.8 4.4 5.4 3.76 4.76 0.1 0.1 0.44 0.44 ±1.0 ±2.5 1.5 75 −75 40.0 µA µA mA mA mA µA V V V V Units V V V Conditions VOUT = 0.1V or VCC − 0.1V VOUT = 0.1V or VCC − 0.1V IOUT = −50 µA VIN = VIL or VIH V IOH = −24 mA IOH = −24 mA (Note 2) IOUT = 50 µA VIN = VIL or VIH V IOL = 24 mA IOL = 24 mA (Note 2) VI = VCC, GND VI = VIL, VIH VO = VCC, GND VI = VCC − 2.1V VOLD = 1.65V Max VOHD = 3.85V Min VIN = VCC or GND Figures 1, 2 (Note 4)(Note 5) Figures 1, 2 (Note 4)(Note 5) (Note 4)(Note 6) 3 www.fairchildsemi.com 74ACTQ533 DC Electrical Characteristics Symbol VILD Parameter Maximum LOW Level Dynamic Input Voltage VCC (V) 5.0 (Continued) TA = +25°C Typ 1.2 0.8 TA = −40°C to +85°C Guaranteed Limits V (Note 4)(Note 6) Units Conditions Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: Maximum test duration 2.0 ms, one output loaded at a time. Note 4: DIP package. Note 5: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND. Note 6: Max number of data inputs (n) switching. (n−1) inputs switching 0V to 3V Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz. AC Electrical Characteristics VCC Symbol Parameter (V) (Note 7) tPHL tPLH tPHL tPLH tPZL, tPZH tPHZ, tPLZ tOSHL tOSLH Propagation Delay Dn to On Propagation Delay LE to On Output Enable Time Output Disable Time Output to Output Skew Dn to On(Note 8) 5.0 5.0 5.0 5.0 5.0 Min 2.0 2.5 2.0 1.0 TA = + 25°C CL = 50 pF Typ 6.0 7.0 7.0 8.0 0.5 Max 8.0 9.0 9.0 10.0 1.0 TA = − 40°C to + 85°C CL = 50 pF Min 2.0 2.5 2.0 1.0 Max 8.5 9.5 9.5 10.5 1.0 ns ns ns ns ns Units Note 7: Voltage Range 5.0 is 5.0V ± 0.5V. Note 8: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. AC Operating Requirements V CC Symbol Parameter (V) (Note 9) tS tH tW Setup Time, HIGH or LOW Dn to LE Hold Time, HIGH or LOW Dn to LE LE Pulse Width, HIGH Note 9: Voltage Range 5.0 is 5.0V ± 0.5V. TA = + 25°C CL = 50 pF Typ 0 0 2.0 3.0 1.5 4.0 TA = − 40°C to + 85°C CL = 50 pF Guaranteed Minimum 3.0 1.5 4.0 ns ns ns Units 5.0 5.0 5.0 Capacitance Symbol CIN CPD Parameter Input Capacitance Power Dissipation Capacitance Typ 4.5 40 Units pF pF VCC = OPEN VCC = 5.0V Conditions www.fairchildsemi.com 4 74ACTQ533 FACT Noise Characteristics The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT. Equipment: Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture scope Procedure: 1. Verify Test Fixture Loading: Standard Load 50 pF, 500Ω. 2. Deskew the HFS generator so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously. 3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the correct voltage. 4. Set the HFS generator to toggle all but one output at a frequency of 1 MHz. Greater frequencies will increase DUT heating and effect the results of the measurement. 5. Set the HFS generator input levels at 0V LOW and 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with a digital volt meter. Tektronics Model 7854 OscilloVOLP/VOLV and VOHP/V OHV: • Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output voltages using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. • Measure VOLP and VOLV on the quiet output during the worst case transition for active and enable. Measure VOHP and VOHV on the quiet output during the worst case active and enable transition. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. VILD and VIHD: • Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. • First increase the input LOW voltage level, VIL, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as VILD. • Next decrease the input HIGH voltage level on the VIH until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as VIHD. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. FIGURE 1. Quiet Output Noise Voltage Waveforms Note 10: VOHV and VOLP are measured with respect to ground reference. Note 11: Input pulses have the following characteristics: f = 1 MHz, t r = 3 ns, tf = 3 ns, skew < 150 ps. FIGURE 2. Simultaneous Switching Test Circuit 5 www.fairchildsemi.com 74ACTQ533 Physical Dimensions inches (millimeters) unless otherwise noted 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body Package Number M20B www.fairchildsemi.com 6 74ACTQ533 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Package Number MTC20 7 www.fairchildsemi.com 74ACTQ533 Quiet Series Octal Transparent Latch with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide Package Number N20A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 8 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com