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74F543MSA

74F543MSA

  • 厂商:

    FAIRCHILD(仙童半导体)

  • 封装:

  • 描述:

    74F543MSA - Octal Registered Transceiver - Fairchild Semiconductor

  • 数据手册
  • 价格&库存
74F543MSA 数据手册
74F543 Octal Registered Transceiver April 1988 Revised October 2000 74F543 Octal Registered Transceiver General Description The F543 octal transceiver contains two sets of D-type latches for temporary storage of data flowing in either direction. Separate Latch Enable and Output Enable inputs are provided for each register to permit independent control of inputting and outputting in either direction of data flow. The A outputs are guaranteed to sink 24 mA while the B outputs are rated for 64 mA. Features s 8-bit octal transceiver s Back-to-back registers for storage s Separate controls for data flow in each direction s A outputs sink 24 mA s B outputs sink 64 mA Ordering Code: Order Number 74F543SC 74F543MSA 74F543PC 74F543SPC Package Number M24B MSA24 N24A N24C Package Description 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 24-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-011, 0.600 Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbols Connection Diagram IEEE/IEC © 2000 Fairchild Semiconductor Corporation DS009554 www.fairchildsemi.com 74F543 Unit Loading/Fan Out U.L. Pin Names OEAB OEBA CEAB CEBA LEAB LEBA A0–A7 Description HIGH/LOW A-to-B Output Enable Input (Active LOW) B-to-A Output Enable Input (Active LOW) A-to-B Enable Input (Active LOW) B-to-A Enable Input (Active LOW) A-to-B Latch Enable Input (Active LOW) B-to-A Latch Enable Input (Active LOW) A-to-B Data Inputs or B-to-A 3-STATE Outputs B0–B7 B-to-A Data Inputs or A-to-B 3-STATE Outputs 1.0/1.0 1.0/1.0 1.0/2.0 1.0/2.0 1.0/1.0 1.0/1.0 3.5/1.083 150/40 (33.8) 3.5/1.083 600/106.6 (80) Input IIH/IIL Output IOH/IOL 20 µA/−0.6 mA 20 µA/−0.6 mA 20 µA/−1.2 mA 20 µA/−1.2 mA 20 µA/−0.6 mA 20 µA/−0.6 mA 70 µA/−650 µA −3 mA/24 mA (20 mA) 70 µA/−650 µA −12 mA/64 mA (48 mA) Functional Description The F543 contains two sets of eight D-type latches, with separate input and output controls for each set. For data flow from A to B, for example, the A-to-B Enable (CEAB) input must be LOW in order to enter data from A0–A7 or take data from B0–B7, as indicated in the Data I/O Control Table. With CEAB LOW, a LOW signal on the A-to-B Latch Enable (LEAB) input makes the A-to-B latches transparent; a subsequent LOW-to-HIGH transition of the LEAB signal puts the A latches in the storage mode and their outputs no longer change with the A inputs. With CEAB and OEAB both LOW, the 3-STATE B output buffers are active and reflect the data present at the output of the A latches. Control of data flow from B to A is similar, but using the CEBA, LEBA and OEBA inputs. Data I/O Control Table Inputs CEAB H X L X L LEAB X H L X X OEAB X X X H L Latch Status Latched Latched Transparent — — Output Buffers High Z — — High Z Driving H = H IGH Voltage Level L = LOW Voltage Level X = Immaterial A-to-B data flow shown; B-to-A flow control is the same, except using CEBA, LEBA and OEBA Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 74F543 Absolute Maximum Ratings(Note 1) Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias VCC Pin Potential to Ground Pin Input Voltage (Note 2) Input Current (Note 2) Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output 3-STATE Output Current Applied to Output in LOW State (Max) twice the rated IOL (mA) −65°C to +150°C −55°C to +125°C −55°C to +150°C −0.5V to +7.0V −0.5V to +7.0V −30 mA to +5.0 mA Recommended Operating Conditions Free Air Ambient Temperature Supply Voltage 0°C to +70°C +4.5V to +5.5V −0.5V to VCC −0.5V to +5.5V Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. DC Electrical Characteristics Symbol VIH VIL VCD VOH Parameter Input HIGH Voltage Input LOW Voltage Input Clamp Diode Voltage Output HIGH Voltage 10% VCC 10% VCC 5% VCC 5% VCC 10% VCC VOL IIH IBVI IBVIT ICEX VID IOD Output LOW Voltage Input HIGH Current Input HIGH Current Breakdown Test Input HIGH Current Breakdown (I/O) Output HIGH Leakage Current Input Leakage Test Output Leakage Circuit Current IIL IIH + IOZH IIL + IOZL IOS IZZ ICCH ICCL ICCZ Input LOW Current Output Leakage Current Output Leakage Current Output Short-Circuit Current Bus Drainage Test Power Supply Current Power Supply Current Power Supply Current 67 83 83 −60 −100 4.75 3.75 −0.6 −1.2 70 −650 −150 −225 500 100 125 125 10% VCC 10% VCC 2.5 2.4 2.7 2.7 2.0 0.5 0.55 5.0 7.0 0.5 50 µA µA mA µA V µA Max Max Max Max 0.0 0.0 V Min V Min Min 2.0 0.8 −1.2 Typ Max Units V V V Min VCC Conditions Recognized as a HIGH Signal Recognized as a LOW Signal IIN = −18 mA IOH = −1 mA (An) IOH = −3 mA (An, Bn) IOH = −1 mA (An) IOH = −3 mA (An, Bn) IOH = −15 mA (Bn) IOL = 24 mA (A n) IOL = 64 mA (B n) VIN = 2.7V (OEAB, OEBA, LEAB, LEBA, CEAB, CEBA) VIN = 5.5V (An, Bn) VOUT = VCC IID = 1.9 µA All Other Pins Grounded VIOD = 150 mV All Other Pins Grounded VIN = 0.5V (OEAB, OEBA) VIN = 0.5V (CEAB, CEBA) VOUT = 2.7V (An, Bn) VOUT = 0.5V (An, Bn) VOUT = 0V (An) VOUT = 0V (Bn) VOUT = 5.25V (An, B n) VO = HIGH VO = LOW VO = HIGH Z mA µA µA mA µA mA mA mA Max Max Max Max 0.0V Max Max Max 3 www.fairchildsemi.com 74F543 AC Electrical Characteristics TA = +25°C Symbol Parameter Min tPLH tPHL tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ Propagation Delay Transparent Mode An to Bn or Bn to An Propagation Delay LEBA to An Propagation Delay LEAB to Bn Output Enable Time OEBA or OEAB to An or Bn CEBA or CEAB to An or Bn Output Disable Time OEBA or OEAB to An or Bn CEBA or CEAB to An or Bn 1.0 2.5 6.0 5.5 8.0 10.5 1.0 2.5 9.0 11.5 3.0 4.0 7.0 7.5 9.0 10.5 3.0 4.0 10.0 12.0 ns 4.5 4.5 4.5 4.5 8.5 8.5 8.5 8.5 11.0 11.0 11.0 11.0 4.5 4.5 4.5 4.5 12.5 12.5 12.5 12.5 ns ns 3.0 3.0 VCC = +5.0V CL = 50 pF Typ 5.5 5.0 Max 7.5 6.5 3.0 3.0 TA = 0°C to +70°C CL = 50 pF Min Max 8.5 7.5 ns Units AC Operating Requirements TA = +25°C Symbol Parameter Min tS(H) tS(L) tH(H) tH(L) tW(L) Setup Time, HIGH or LOW An or Bn to LEBA or LEAB Hold Time, HIGH or LOW An or Bn to LEBA or LEAB Latch Enable, B to A or B to A Pulse Width, LOW 3.0 3.0 3.0 3.0 8.0 VCC = +5.0V Max TA = 0°C to +70°C Min 3.5 3.5 3.5 3.5 9.0 ns ns Max Units www.fairchildsemi.com 4 74F543 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M24B 24-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide Package Number MSA24 5 www.fairchildsemi.com 74F543 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-011, 0.600 Wide Package Number N24A www.fairchildsemi.com 6 74F543 Octal Registered Transceiver Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N24C Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 7 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com www.fairchildsemi.com
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