HMS1M32Z8L-70

HANBit HMS1M32M8L SRAM MODULE 4Mbyte(1Mx32Bit) ,LOW POWER,72Pin SIMM,5V Part No. HMS1M32M8L, HMS1M32Z8L GENERAL DESCRIPTION The HMS1M32M8L is a static random access memory (SRAM) module containing 1,048,576 bits organized in a x32-bit configuration. The module consists of eight 512K x 8 SRAMs mounted on a 72-pin, double-sided, FR4-printed circuit board. The HMS1M32M8L also support low data retention voltage for battery back-up operations with low data retention current. Eight chip enable inputs, (/CE_UU1, /CE_UM1, /CE_LM1, /CE_LL1, /CE_UU2, /CE_UM2, /CE_LM2, /CE_LL2) are used to enable the module’s 4M bytes independently. Output enable(/OE) and write enable(/WE) can set the memory input and output. Data is written into the SRAM memory when write enable (/WE) and chip enable (/CE) inputs are both LOW. accomplished when /WE remains HIGH and /CE and output enable (/OE) are LOW. For reliability, this SRAM module is designed as multiple power and ground pin. All module components may be powered from a single +5V DC power supply and all inputs and outputs are fully TTL-compatible. Reading is FEATURES w Part identification - HMS1M32M8L : SIMM design - HMS1M32Z8L : ZIP design The both are Pin to Pin Compatible w Access times : 55ns, 70ns w High-density 4MByte design w High-reliability, low-power design w Single + 5V ±0.5V power supply w Low data retention voltage : 2V(min) w Three state output and TTL-compatible w FR4-PCB design w Low profile 72-Pin SIMM PIN 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 PIN ASSIGNMENT SYMBOL Vss A3 A2 A1 A0 Vcc A11 /OE A10 Vcc /CE_LL2 /CE_LL1 DQ7 DQ0 DQ1 DQ2 DQ6 DQ5 DQ4 DQ3 A15 A17 /WE A13 PIN 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 SYMBOL Vcc DQ8 DQ9 DQ10 /CE_LM2 Vcc /CE_LM1 DQ15 DQ14 DQ13 DQ12 DQ11 A18 A16 Vss A6 Vcc A5 A4 Vcc /CE_UM2 /CE_UM1 DQ23 DQ16 PIN 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 SYMBOL DQ17 DQ18 DQ22 DQ21 DQ20 DQ19 Vcc A14 A12 A7 Vcc A8 A9 DQ24 DQ25 DQ26 /CE_UU2 /CE_UU1 DQ31 DQ30 DQ29 DQ28 DQ27 Vss OPTIONS w Timing 55ns access 70ns access w Packages 72-pin SIMM 72-pin ZIP MARKING -55 -70 M Z SIMM TOP VIEW URL: www.hbe.co.kr Rev. 1.0 (September / 2002) 1 HANBit Electronics Co.,Ltd. HANBit FUNCTIONAL BLOCK DIAGRAM DQ 0-DQ31 A0-A18 32 19 HMS1M32M8L A0-18 /WE /OE /CE /CE-UU1 A0-18 /WE /OE /CE /CE-UM1 A0-18 /WE /OE /CE-LM1 /CE DQ 8-15 /CE-UM2 DQ16-23 /CE-UU2 DQ24-31 A0-18 /WE /OE /CE DQ24-31 U4 U8 A0-18 /WE /OE /CE DQ16-23 U3 U7 A0-18 /WE /OE /CE /CE-LM2 DQ 8-15 U2 U6 A0-18 /WE /OE /OE DQ 0-7 /WE /OE A0-18 /WE /OE /CE /CE-LL2 DQ 0-7 U1 /CE U5 /CE-LL1 URL: www.hbe.co.kr Rev. 1.0 (September / 2002) 2 HANBit Electronics Co.,Ltd. HANBit TRUTH TABLE MODE STANDBY NOT SELECTED READ WRITE or ERASE NOTE: X means don’t care /OE X H L X /CE H L L L /WE X H H L DQ HIGH-Z HIGH-Z Q D HMS1M32M8L POWER STANDBY ACTIVE ACTIVE ACTIVE ABSOLUTE MAXIMUM RATINGS PARAMETER Voltage on Any Pin Relative to Vss Voltage on Vcc Supply Relative to Vss Power Dissipation Storage Temperature Operating Temperature SYMBOL VIN,OUT VCC PD TSTG TA RATING -0.5V to +7.0V -0.5V to +7.0V 8W oC to +150oC -65 0oC to +70oC w Stresses greater than those listed under " Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operating section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. RECOMMENDED DC OPERATING CONDITIONS ( TA=0 to 70 o C ) PARAMETER Supply Voltage Ground Input High Voltage Input Low Voltage * SYMBOL VCC VSS VIH VIL MIN 4.5V 0 2.2 -0.5* TYP. 5.0V 0 MAX 5.5V 0 Vcc+0.5V** 0.8V VIL(Min.) = -2.0V (Pulse Width ≤ 10ns) for I ≤ 20 mA ** VIH(Min.) = Vcc+2.0V (Pulse Width ≤ 10ns) for I ≤ 20 mA DC AND OPERATING CHARACTERISTICS (1) (0oC ≤ TA ≤ 70 oC ; Vcc = 5V ± 0.5V ) PARAMETER Input Leakage Current Output Leakage Current Output High Voltage Output Low Voltage * Vcc=5.0V, Temp=25 oC URL: www.hbe.co.kr Rev. 1.0 (September / 2002) 3 HANBit Electronics Co.,Ltd. TEST CONDITIONS VIN = Vss to Vcc /CE=VIH or /OE =VIH or /WE=VIL VOUT=Vss to VCC IOH = -4.0mA IOL = 8.0mA SYMBOL ILI IL0 VOH VOL MIN -32 -32 2.4 MAX 32 32 UNITS µA µA V 0.4 V HANBit DC AND OPERATING CHARACTERISTICS (2) DESCRIPTION Power Supply Current:Operating Power Supply Current:Standby TEST CONDITIONS IIO=0mA,/CE=VIL, VIN=VIL or VIH, Read /CE=VIH, Other inputs=VIL or VIH /CE≥Vcc-0.2V, Other inputs=0~Vcc SYMBOL MAX -55 480 96 400 HMS1M32M8L -70 480 96 400 UNIT lCC lSB lSB1 mA mA µA CAPACITANCE DESCRIPTION Input /Output Capacitance Input Capacitance TEST CONDITIONS VI/O=0V VIN=0V SYMBOL CI/O CIN MAX 248 320 UNIT pF pF * NOTE : Capacitance is sampled and not 100% tested AC CHARACTERISTICS (0oC ≤ TA ≤ 70 oC ; Vcc = 5V ± 0.5V, unless otherwise specified) Test conditions PARAMETER Input Pulse Level Input Rise and Fall Time Input and Output Timing Reference Levels Output Load * See test condition of DC and Operating characteristics Output Load (B) for tHZ, tLZ, tWHZ, tOW, tOLZ & tOHZ VALUE 0.8 to 2.4V 5ns 1.5V CL=100pF + 1TTL Output Load (A) VL=1.5V 50Ω DOUT Z0=50Ω 30pF DOUT 353Ω +3.3V 319Ω 5pF* URL: www.hbe.co.kr Rev. 1.0 (September / 2002) 4 HANBit Electronics Co.,Ltd. HANBit READ CYCLE -55 PARAMETER Read Cycle Time Address Access Time Chip Select to Output Output Enable to Output Output Enable to Low-Z Output Chip Enable to Low-Z Output Output Disable to High-Z Output Chip Disable to High-Z Output Output Hold from Address Change SYMBOL MIN tRC tAA tCO tOE tOLZ tLZ tOHZ tHZ tOH 5 10 0 0 10 20 20 55 55 55 25 5 10 0 0 10 MAX MIN 70 -70 HMS1M32M8L UNIT MAX ns 70 70 35 ns ns ns ns ns 25 25 ns ns ns WRITE CYCLE PARAMETER Write Cycle Time Chip Select to End of Write Address Set-up Time Address Valid to End of Write Write Pulse Width Write Recovery Time Write to Output High-Z Data to Write Time Overlap Data Hold from Write Time End of Write to Output Low-Z SYMBOL tWC tCW tAS tAW tWP tWR tWHZ tDW tDH tOW -55 MIN 55 45 0 45 40 0 0 25 0 5 20 MAX MIN 70 60 0 60 50 0 0 30 0 5 25 -70 MAX UNIT ns ns ns ns ns ns ns ns ns ns TIMING DIAGRAMS Please refer to timing diagram chart(II) URL: www.hbe.co.kr Rev. 1.0 (September / 2002) 5 HANBit Electronics Co.,Ltd. HANBit FUNCTIONAL DESCRIPTION /CE H L L L /WE X* H H L /OE X H L X MODE Not Select Output Disable Read Write I/O PIN High-Z High-Z DOUT DIN HMS1M32M8L SUPPLY CURRENT l SB, l SB1 lCC lCC lCC Note: X means Don't Care DATA RETENTION CHARACTERISTICS* (TA = 0 to 70 ℃ ) PARAMETER VCC for Data Retention Data Retention Current Data Retention Set-up Time Recovery Time * L-Version Only SYMBOL VDR IDR tSDR tRDR TEST CONDITION /CE≥ VCC-0.2V VCC=3.0V, /CE≥ VCC-0.2V VIN≥ VCC-0.2V or VIN≤ 0.2V See Data Retention Wave forms(below) 0 5 ns ns MIN 2 MAX 5.5 400 UNIT V µA DATA RETENTION WAVEFORM 1 (/CE Controlled) tSDR Vcc 4.5V Data Retention Mode tRDR 2.2V VDR /CE Vss /CE≥ Vcc- 0.2V URL: www.hbe.co.kr Rev. 1.0 (September / 2002) 6 HANBit Electronics Co.,Ltd. HANBit PACKAGING DIMENSIONS SIMM Design HMS1M32M8L 2.54 mm 0.25 mm MAX MIN Gold : 1.04±0.10 mm 1.27 Solder : 0.914±0.10 mm 1.29±0.08 mm (Solder & Gold Plating Lead) ORDERING INFORMATION Part Number Density Org. 1M×32bit 1M×32bit 1M×32bit 1M×32bit Package Component Number 8EA 8EA 8EA 8EA Vcc SPEED HMS1M32M8L-55 HMS1M32M8L-70 HMS1M32Z8L-55 HMS1M32Z8L-70 4MByte 4MByte 4MByte 4MByte 72Pin-SIMM 72Pin--SIMM 72Pin-ZIP 72Pin-ZIP 5.0V 5.0V 5.0V 5.0V 55ns 70ns 55ns 70ns URL: www.hbe.co.kr Rev. 1.0 (September / 2002) 7 HANBit Electronics Co.,Ltd.