IRHQ7214

PD - 93828A IRHQ7214 RADIATION HARDENED POWER MOSFET SURFACE MOUNT (LCC-28) Product Summary Part Number Radiation Level IRHQ7214 100K Rads (Si) IRHQ3214 300K Rads (Si) IRHQ4214 IRHQ8214 600K Rads (Si) 1000K Rads (Si) TM 250V, QUAD N-CHANNEL RAD-Hard HEXFET ™ ® MOSFET TECHNOLOGY RDS(on) 2.25Ω 2.25Ω 2.25Ω 2.25Ω ID 1.6A 1.6A 1.6A 1.6A LCC-28 International Rectifier’s RAD-Hard MOSFET technology provides high performance power MOSFETs for space applications. This technology has over a decade of proven performance and reliability in satellite applications. These devices have been characterized for both Total Dose and Single Event Effects (SEE). The combination of low RDS(on) and low gate charge reduces the power losses in switching applications such as DC to DC converters and motor control. These devices retain all of the well established advantages of MOSFETs such as voltage control, fast switching, ease of paralleling and temperature stability of electrical parameters. HEXFET® Features: n n n n n n n n n n Single Event Effect (SEE) Hardened Low RDS(on) Low Total Gate Charge Proton Tolerant Simple Drive Requirements Ease of Paralleling Hermetically Sealed Ceramic Package Surface Mount Light Weight Absolute Maximum Ratings ( Per Die) Parameter ID @ VGS = 12V, TC = 25°C ID @ VGS = 12V, TC = 100°C IDM PD @ TC = 25°C VGS EAS IAR EAR dv/dt TJ T STG Continuous Drain Current Continuous Drain Current Pulsed Drain Current ➀ Max. Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy ➁ Avalanche Current ➀ Repetitive Avalanche Energy ➀ Peak Diode Recovery dv/dt ➂ Operating Junction Storage Temperature Range Pckg. Mounting Surface Temp. Weight For footnotes refer to the last page 1.6 1.0 6.4 12 0.1 ±20 62 1.6 1.2 3.5 -55 to 150 300 (for 5s) 0.89 (Typical) Pre-Irradiation Units A W W/°C V mJ A mJ V/ns o C g www.irf.com 1 04/22/03 IRHQ7214 Pre-Irradiation Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified) (Per Die) Parameter BVDSS Drain-to-Source Breakdown Voltage ∆BVDSS /∆T J Temperature Coefficient of Breakdown Voltage RDS(on) Static Drain-to-Source On-State Resistance VGS(th) Gate Threshold Voltage g fs Forward Transconductance IDSS Zero Gate Voltage Drain Current Min 250 — — — 2.0 0.9 — — — — — — — — — — — — Typ Max Units — 0.3 — — — — — — — — — — — — — — — 6.1 — — 2.25 4.0 — 25 250 100 -100 19 3.4 7.0 15 7.0 39 42 — V V/°C Ω V S( ) µA Ω Test Conditions VGS = 0V, ID = 1.0mA Reference to 25°C, ID = 1.0mA VGS = 12V, ID = 1.0A ➃ VDS = VGS, ID = 1.0mA VDS > 15V, I DS = 1.0A ➃ VDS= 200V, VGS=0V VDS = 200V, VGS = 0V, TJ = 125°C VGS = 20V VGS = -20V VGS = 12V, ID = 1.6A, VDS = 125V VDD = 125V, ID = 1.6A, VGS = 12V, RG = 7.5Ω IGSS IGSS Qg Q gs Q gd td(on) tr td(off) tf LS + LD Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Total Gate Charge Gate-to-Source Charge Gate-to-Drain (‘Miller’) Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Inductance nA nC ns nH Measured from the center of drain pad to center of source pad VGS = 0V, VDS = 25V f = 1.0MHz Ciss C oss C rss Input Capacitance Output Capacitance Reverse Transfer Capacitance — — — 280 70 18 — — — pF Source-Drain Diode Ratings and Characteristics (Per Die) Parameter IS ISM VSD trr Q RR ton Continuous Source Current (Body Diode) Pulse Source Current (Body Diode) ➀ Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time Min Typ Max Unit — — — — — — — — — — 1.6 6.4 1.5 226 900 Test Conditions A V nS nC Tj = 25°C, IS = 1.6A, VGS = 0V ➃ Tj = 25°C, IF = 1.6A, di/dt ≤ 100A/µs VDD ≤ 25V ➃ Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD. Thermal Resistance (Per Die) Parameter RthJC Junction-to-Case Min Typ Max Units — — 10.4 °C/W Test Conditions For footnotes refer to the last page 2 www.irf.com Pre-Irradiation Radiation Characteristics IRHQ7214 International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability. The hardness assurance program at International Rectifier is comprised of two radiation environments. Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both pre- and post-irradiation performance are tested and specified using the same drive circuitry and test conditions in order to provide a direct comparison. Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation ➄➅ (Per Die) Parameter BVDSS VGS(th) IGSS IGSS IDSS RDS(on) RDS(on) VSD Drain-to-Source Breakdown Voltage Gate Threshold Voltage Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Zero Gate Voltage Drain Current Static Drain-to-Source ➃ On-State Resistance (TO-39) Static Drain-to-Source ➃ On-State Resistance (LCC-28) Diode Forward Voltage ➃ 100K Rads(Si)1 300K to 1000K Rads (Si)2 Units V nA µA Ω Ω V Test Conditions VGS = 0V, ID = 1.0mA VGS = VDS, ID = 1.0mA VGS = 20V VGS = -20 V VDS = 200V, VGS =0V VGS = 12V, ID = 1.0A VGS = 12V, ID = 1.0A VGS = 0V, I S = 1.6A Min 250 2.0 — — — — — — Max — 4.0 100 -100 25 2.205 2.25 1.5 Min 250 1.25 — — — — — — Max — 4.5 100 -100 25 2.205 2.25 1.5 1. Part numbers IRHQ7214, IRHQ3214 and IRHQ4214 2. Part number IRHQ8214 International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2. Table 2. Single Event Effect Safe Operating Area (Per Die) Ion Cu Br LET MeV/(mg/cm2)) 28.0 36.8 Energy (MeV) 285 305 VDS (V) Range (µm) @VGS=0V @VGS=-5V @VGS=-10V @VGS=-15V @VGS=-20V 43.0 250 250 250 250 250 39.0 250 250 250 225 210 300 250 200 VDS 150 100 50 0 0 -5 -10 VGS -15 -20 Cu Br Fig a. Single Event Effect, Safe Operating Area For footnotes refer to the last page www.irf.com 3 IRHQ7214 Pre-Irradiation 100 10 I D , Drain-to-Source Current (A) I D , Drain-to-Source Current (A)  VGS 15V 12V 10V 9.0V 8.0V 7.0V 6.0V BOTTOM 5.0V TOP 10 1  VGS 15V 12V 10V 9.0V 8.0V 7.0V 6.0V BOTTOM 5.0V TOP 5.0V 1 5.0V 0.1 0.1 0.01 0.1 20µs PULSE WIDTH  T = 25 C J ° 1 10 100 VDS , Drain-to-Source Voltage (V) 0.01 0.1 20µs PULSE WIDTH  T = 150 C J ° 1 10 100 VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 100 2.5 R DS(on) , Drain-to-Source On Resistance (Normalized) ID  = 1.6A I D , Drain-to-Source Current (A) TJ = 25 ° C  10 2.0 TJ = 150 ° C  1.5 1.0 1 0.5 0.1 5 7 9  V DS = 50V 20µs PULSE WIDTH 11 13 0.0 -60 -40 -20 VGS = 12V  0 20 40 60 80 100 120 140 160 VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature ( ° C) Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance Vs. Temperature 4 www.irf.com Pre-Irradiation IRHQ7214 600 500 VGS , Gate-to-Source Voltage (V)  VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd 20 ID = 1.6A  16  VDS = 200V VDS = 125V VDS = 50V C, Capacitance (pF) 400 12 300 8 200 100 4 0 1 10 100 0 0 4 8 FOR TEST CIRCUIT  SEE FIGURE 13 12 16 20 VDS , Drain-to-Source Voltage (V) QG , Total Gate Charge (nC) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 100 100 ISD , Reverse Drain Current (A) OPERATION IN THIS AREA LIMITED BY R  DS(on) 10 I D , Drain Current (A) 10  10us TJ = 150 ° C   100us 1 1 TJ = 25 ° C  V GS = 0 V  0.6 0.8 1.0 1.2 1.4  1ms 0.1 0.4 0.1  TC = 25 ° C TJ = 150 ° C Single Pulse 10 100  10ms 1000 VSD ,Source-to-Drain Voltage (V) VDS , Drain-to-Source Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating Area www.irf.com 5 IRHQ7214 Pre-Irradiation 1.6 VDS VGS RD D.U.T. + 1.2 RG I D , Drain Current (A) -V DD VGS 0.8 Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % Fig 10a. Switching Time Test Circuit 0.4 VDS 90% 0.0 25 50 75 100 125 150 TC , Case Temperature ( °C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms 100 Thermal Response (Z thJC ) 10 D = 0.50 0.20 1 0.10 0.05 0.02 0.01 0.1  SINGLE PULSE (THERMAL RESPONSE) 0.01 0.00001  Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x Z thJC + TC 0.1 1 0.0001 0.001 0.01  P DM t1 t2 10 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 6 www.irf.com Pre-Irradiation IRHQ7214 150 EAS , Single Pulse Avalanche Energy (mJ) 15V 120  TOP BOTTOM ID 0.7A 1.0A 1.6A VD S L DR IV E R 90 RG 2VV 0 GS tp D.U .T. IA S + V - DD A 60 0.01 Ω 30 Fig 12a. Unclamped Inductive Test Circuit 0 25 50 75 100 125 150 V (B R )D SS tp Starting TJ , Junction Temperature ( ° C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current IAS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ QG 12V .2µF .3µF 12 V QGS VG QGD VGS 3mA D.U.T. + V - DS Charge IG ID Current Sampling Resistors Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit www.irf.com 7 IRHQ7214 Pre-Irradiation Footnotes: ➀ Repetitive Rating; Pulse width limited by maximum junction temperature. ➁ VDD = 50V, starting TJ = 25°C, L= 48mH, Peak IL = 1.6A, VGS = 12V ➂ I SD ≤ 1.6A, di/dt ≤ 336A/µs, VDD ≤ 250V, TJ ≤ 150°C ➃ Pulse width ≤ 300 µs; Duty Cycle ≤ 2% ➄ Total Dose Irradiation with VGS Bias. 12 volt VGS applied and V DS = 0 during irradiation per MIL-STD-750, method 1019, condition A ➅ Total Dose Irradiation with VDS Bias. 200 volt V DS applied and VGS = 0 during irradiation per MlL-STD-750, method 1019, condition A Case Outline and Dimensions — LCC-28 Q2 Q1 Q3 Q4 IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. Data and specifications subject to change without notice. 04/03 8 www.irf.com