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to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
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Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s
technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA
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is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
FDP7N60NZ / FDPF7N60NZ
N-Channel UniFETTM II MOSFET
600 V, 6.5 A, 1.25 Ω
Features
Description
• RDS(on) = 1.05 Ω (Typ.) @ VGS = 10 V, ID = 3.25 A
UniFETTM II MOSFET is Fairchild Semiconductor’s high voltage
MOSFET family based on advanced planar stripe and DMOS
technology. This advanced MOSFET family has the smallest
on-state resistance among the planar MOSFET, and also provides superior switching performance and higher avalanche
energy strength. In addition, internal gate-source ESD diode
allows UniFET II MOSFET to withstand over 2kV HBM surge
stress. This device family is suitable for switching power converter applications such as power factor correction (PFC), flat
panel display (FPD) TV power, ATX and electronic lamp ballasts.
• Low Gate Charge (Typ. 13 nC)
• Low Crss (Typ. 7 pF)
• 100% Avalanche Tested
• Improved dv/dt Capability
• ESD Improved Capability
• RoHS Compliant
Applications
• LCD/ LED/ PDP TV
• Lighting
• Uninterruptible Power Supply
• AC-DC Power Supply
D
GD
S
G
G
D
S
TO-220
TO-220F
S
MOSFET Maximum Ratings TC = 25oC unless otherwise noted.
Symbol
Parameter
FDP7N60NZ
FDPF7N60NZ /
FDPF7N60NZT
Unit
VDSS
Drain to Source Voltage
600
V
VGSS
Gate to Source Voltage
±30
V
ID
Drain Current
IDM
Drain Current
EAS
Single Pulsed Avalanche Energy
IAR
Avalanche Current
(Note 1)
6.5
A
EAR
Repetitive Avalanche Energy
(Note 1)
14.7
mJ
dv/dt
Peak Diode Recovery dv/dt
- Continuous (TC = 25oC)
- Continuous (TC = 100oC)
- Pulsed
(Note 1)
6.5*
3.9*
26
Power Dissipation
TJ, TSTG
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering, 1/8” from Case for 5 Seconds
- Derate Above 25oC
A
275
(Note 3)
(TC = 25oC)
A
26*
(Note 2)
PD
TL
6.5
3.9
mJ
10
V/ns
147
33
W
1.2
0.26
W/oC
-55 to +150
oC
300
oC
*Drain current limited by maximum junction temperature.
Thermal Characteristics
Symbol
Parameter
FDP7N60NZ
FDPF7N60NZ /
FDPF7N60NZT
RθJC
Thermal Resistance, Junction to Case, Max.
0.85
3.8
RθJA
Thermal Resistance, Junction to Ambient, Max.
62.5
62.5
©2010 Fairchild Semiconductor Corporation
FDP7N60NZ / FDPF7N60NZ Rev. C2
1
Unit
oC/W
www.fairchildsemi.com
FDP7N60NZ / FDPF7N60NZ — N-Channel UniFETTM II MOSFET
December 2013
Part Number
Top Mark
FDP7N60NZ
FDP7N60NZ
Package
TO-220
Packing Method
Tube
Reel Size
N/A
Tape Width
N/A
Quantity
50 units
FDPF7N60NZ
FDPF7N60NZ
TO-220F
Tube
N/A
N/A
50 units
FDPF7N60NZT
FDPF7N60NZ
TO-220F
Tube
N/A
N/A
50 units
Electrical Characteristics
Symbol
TC = 25oC unless otherwise noted.
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
600
-
-
V
-
0.6
-
V/oC
Off Characteristics
BVDSS
ΔBVDSS
/ ΔTJ
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate to Body Leakage Current
ID = 250 μA, VGS = 0 V, TJ = 25oC
ID = 250 μA, Referenced to
25oC
VDS = 600 V, VGS = 0 V
-
-
1
VDS = 480 V, TC = 125oC
-
-
10
VGS = ±25 V, VDS = 0 V
-
-
±10
μA
μA
On Characteristics
VGS(th)
RDS(on)
Gate Threshold Voltage
VGS = VDS, ID = 250 μA
3
-
5
V
Static Drain to Source On Resistance
VGS = 10 V, ID = 3.25 A
-
1.05
1.25
Ω
gFS
Forward Transconductance
VDS = 20 V, ID = 3.25 A
-
7.3
-
S
VDS = 25 V, VGS = 0 V,
f = 1 MHz
-
550
730
pF
-
70
90
pF
-
7
10
pF
-
13
17
nC
-
3
-
nC
-
5.6
-
nC
-
17.5
45
ns
-
30
70
ns
-
40
90
ns
-
25
60
ns
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Qg(tot)
Total Gate Charge at 10V
Qgs
Gate to Source Gate Charge
Qgd
Gate to Drain “Miller” Charge
VDS = 480 V, ID = 6.5 A,
VGS = 10 V
(Note 4)
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
VDD = 300 V, ID = 6.5 A,
VGS = 10 V, RG = 25 Ω
(Note 4)
Drain-Source Diode Characteristics
IS
Maximum Continuous Drain to Source Diode Forward Current
-
-
6.5
A
ISM
Maximum Pulsed Drain to Source Diode Forward Current
-
-
26
A
VSD
Drain to Source Diode Forward Voltage
VGS = 0 V, ISD = 6.5 A
-
-
1.4
V
trr
Reverse Recovery Time
250
-
ns
Qrr
Reverse Recovery Charge
VGS = 0 V, ISD = 6.5 A,
dIF/dt = 100 A/μs
-
1.4
-
μC
Notes:
1: Repetitive rating: pulse-width limited by maximum junction temperature.
2: L = 13 mH, IAS = 6.5 A, VDD = 50 V, RG = 25 Ω, starting TJ = 25°C.
3: ISD ≤ 6.5 A, di/dt ≤ 200 A/μs, VDD ≤ BVDSS, starting TJ = 25°C.
4: Essentially independent of operating temperature typical characteristics.
©2010 Fairchild Semiconductor Corporation
FDP7N60NZ / FDPF7N60NZ Rev. C2
2
www.fairchildsemi.com
FDP7N60NZ / FDPF7N60NZ — N-Channel UniFETTM II MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
100
20
ID, Drain Current[A]
10
ID, Drain Current[A]
VGS = 15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
1
10
o
150 C
o
25 C
1
o
-55 C
*Notes:
1. 250μs Pulse Test
* Notes :
1. VDS = 20V
2. 250μs Pulse Test
o
2. TC = 25 C
0.1
0.1
0.1
1
VDS, Drain-Source Voltage[V]
10
20
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
5
6
7
VGS, Gate-Source Voltage[V]
100
IS, Reverse Drain Current [A]
1.8
1.6
1.4
VGS = 10V
1.2
VGS = 20V
1.0
o
150 C
10
o
25 C
Notes:
1. VGS = 0V
2. 250μs Pulse Test
o
0.8
* Note : TJ = 25 C
0
2
4
6
8
10
ID, Drain Current [A]
12
1
0.4
14
Figure 5. Capacitance Characteristics
VGS, Gate-Source Voltage [V]
Ciss
Coss
100
1
0.1
1.4
10
1000
10
0.6
0.8
1.0
1.2
VSD, Body Diode Forward Voltage [V]
Figure 6. Gate Charge Characteristics
5000
Capacitances [pF]
8
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
2.0
RDS(on) [Ω],
Drain-Source On-Resistance
4
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
Crss
* Note:
1. VGS = 0V
2. f = 1MHz
1
10
VDS, Drain-Source Voltage [V]
©2010 Fairchild Semiconductor Corporation
FDP7N60NZ / FDPF7N60NZ Rev. C2
VDS = 120V
VDS = 300V
VDS = 480V
8
6
4
2
* Note : ID = 6.5A
0
30
3
0
2
4
6
8
10
Qg, Total Gate Charge [nC]
12
14
www.fairchildsemi.com
FDP7N60NZ / FDPF7N60NZ — N-Channel UniFETTM II MOSFET
Typical Performance Characteristics
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs Temperature
3.0
RDS(on), [Normalized]
Drain-Source On-Resistance
BVDSS, [Normalized]
Drain-Source Breakdown Voltage
1.2
1.1
1.0
0.9
* Notes :
1. VGS = 0V
2. ID = 250uA
0.8
-100
-50
0
50
100
o
TJ, Junction Temperature [ C]
2.5
2.0
1.5
1.0
* Notes :
1. VGS = 10V
2. ID = 3.25A
0.5
0
-100
150
Figure 9. Maximum Safe Operating Area
- FDPF7N60NZ / FDPF7N60NZT
-50
0
50
100
o
TJ, Junction Temperature [ C]
Figure 10. Maximum Safe Operating Area
- FDP7N60NZ
100
100
30μs
ID, Drain Current [A]
ID, Drain Current [A]
10μs
100μs
10
1ms
10ms
1
Operation in This Area
is Limited by R DS(on)
DC
* Notes :
0.1
10
100μs
1ms
10ms
1
Operation in This Area
is Limited by R DS(on)
o
1. TC = 25 C
o
o
2. TJ = 150 C
3. Single Pulse
1
10
100
VDS, Drain-Source Voltage [V]
DC
* Notes :
0.1
o
1. TC = 25 C
0.01
150
0.01
1000
2. TJ = 150 C
3. Single Pulse
1
10
100
VDS, Drain-Source Voltage [V]
1000
Figure 11. Maximum Drain Current vs. Case Temperature
ID, Drain Current [A]
8
6
4
2
0
25
50
75
100
125
o
TC, Case Temperature [ C]
©2010 Fairchild Semiconductor Corporation
FDP7N60NZ / FDPF7N60NZ Rev. C2
150
4
www.fairchildsemi.com
FDP7N60NZ / FDPF7N60NZ — N-Channel UniFETTM II MOSFET
Typical Performance Characteristics (Continued)
FDP7N60NZ / FDPF7N60NZ — N-Channel UniFETTM II MOSFET
Typical Performance Characteristics (Continued)
Figure 12. Transient Thermal Response Curve
- FDPF7N60NZ / FDPF7N60NZT
ZThermal
Response
[oC/W]
θJC(t), Thermal
Response
[ZθJC
]
ZθJC(t), Thermal Response [oC/W]
5
0.5
1
0.2
0.1
PDM
0.05
0.1
t1
0.02
0.01
o
1. ZθJC(t) = 3.8 C/W Max.
2. Duty Factor, D=t1/t2
3. TJM - TC = PDM * ZθJC(t)
Single pulse
0.01
-5
10
t2
* Notes :
-4
10
-3
10
-2
-1
0
1
2
10
10
10
10
Pulse
tRectangular
PulseDuration
Duration [sec]
[sec]
1, Rectangular
10
3
10
o
ZThermal
Response
Response
[ZθJC[]C/W]
θJC(t), Thermal
Figure 13. Transient Thermal Response Curve
- FDP7N60NZ
5
1
0.5
0.2
0.1
0.1
PDM
0.05
t1
0.02
0.01
0.01
0.001
-5
10
t2
* Notes :
Single pulse
o
1. ZθJC(t) = 0.85 C/W Max.
2. Duty Factor, D=t1/t2
3. TJM - TC = PDM * ZθJC(t)
-4
10
-3
10
-2
-1
10
10
1
10
[sec]
tRectangular
, RectangularPulse
Pulse Duration
Duration [sec]
2
10
3
10
1
©2010 Fairchild Semiconductor Corporation
FDP7N60NZ / FDPF7N60NZ Rev. C2
5
www.fairchildsemi.com
FDP7N60NZ / FDPF7N60NZ — N-Channel UniFETTM II MOSFET
IG = const.
Figure 14. Gate Charge Test Circuit & Waveform
VDS
RG
RL
VDS
VDD
VGS
VGS
DUT
V
10V
GS
90%
10%
td(on)
tr
t on
td(off)
tf
t off
Figure 15. Resistive Switching Test Circuit & Waveforms
VGS
Figure 16. Unclamped Inductive Switching Test Circuit & Waveforms
©2010 Fairchild Semiconductor Corporation
FDP7N60NZ / FDPF7N60NZ Rev. C2
6
www.fairchildsemi.com
FDP7N60NZ / FDPF7N60NZ — N-Channel UniFETTM II MOSFET
DUT
+
VDS
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
Same Type
as DUT
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
I SD
( DUT )
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
VSD
VDD
Body Diode
Forward Voltage Drop
Figure 17. Peak Diode Recovery dv/dt Test Circuit & Waveforms
©2010 Fairchild Semiconductor Corporation
FDP7N60NZ / FDPF7N60NZ Rev. C2
7
www.fairchildsemi.com
SUPPLIER "B" PACKAGE
SHAPE
3.50
10.67
9.65 E
SUPPLIER "A" PACKAGE
SHAPE
3.40
2.50
16.30
13.90
IF PRESENT, SEE NOTE "D"
16.51
15.42
E
9.40
8.13 E
1
[2.46]
2
3
C
4.10
2.70
14.04
12.70
2.13
2.06
FRONT VIEWS
4.70
4.00
1.62 H
1.42
"A1"
8.65
7.59
SEE NOTE "F"
1.62
1.10
2.67
2.40
1.00
0.55
6.69
6.06
OPTIONAL
CHAMFER
E
14.30
11.50
NOTE "I"
BOTTOM VIEW
3
0.60
0.36
SIDE VIEW
2.85
2.10
2
1
BACK VIEW
NOTES:
A) REFERENCE JEDEC, TO-220, VARIATION AB
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C) DIMENSIONS COMMON TO ALL PACKAGE
SUPPLIERS EXCEPT WHERE NOTED [ ].
D) LOCATION OF MOLDED FEATURE MAY VARY
(LOWER LEFT CORNER, LOWER CENTER
AND CENTER OF THE PACKAGE)
E DOES NOT COMPLY JEDEC STANDARD VALUE.
F) "A1" DIMENSIONS AS BELOW:
SINGLE GAUGE = 0.51 - 0.61
DUAL GAUGE = 1.10 - 1.45
G) DRAWING FILE NAME: TO220B03REV9
H PRESENCE IS SUPPLIER DEPENDENT
I) SUPPLIER DEPENDENT MOLD LOCKING HOLES
IN HEATSINK.
B
A
10.36
9.96
B
3.28
3.08
7.00
3.40
3.20
2.66
2.42
0.70
SEE NOTE "F"
SEE NOTE "F"
6.88
6.48
1 X 45°
B
16.00
15.60
16.07
15.67
(3.23) B
1
2.14
3
1.47
1.24
2.96
2.56
0.90
0.70
10.05
9.45
0.50 M
A
30°
0.45
0.25
2.54
B
2.54
B
4.90
4.50
NOTES:
A. EXCEPT WHERE NOTED CONFORMS TO
EIAJ SC91A.
B DOES NOT COMPLY EIAJ STD. VALUE.
C. ALL DIMENSIONS ARE IN MILLIMETERS.
D. DIMENSIONS ARE EXCLUSIVE OF BURRS,
MOLD FLASH AND TIE BAR PROTRUSIONS.
E. DIMENSION AND TOLERANCE AS PER ASME
Y14.5-1994.
F. OPTION 1 - WITH SUPPORT PIN HOLE.
OPTION 2 - NO SUPPORT PIN HOLE.
G. DRAWING FILE NAME: TO220M03REV5
0.60
0.45
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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