Doc No. TT4-EA-12408
Revision. 2
Product Standards
MOS FET
MTM78E2B0LBF
MTM78E2B0LBF
Gate Resistor installed Dual N-Channel MOS Type
Unit: mm
2.0
For lithium-ion secondary battery protection circuit
0.2
8
7
6
5
1
2
3
4
1.7
2.1
Features
0.13
Low drain-source On-state Resistance
RDS(on) typ. = 21.5 m (VGS =4.0 V)
Halogen-free / RoHS compliant
(EU RoHS / UL-94 V-0 / MSL:Level 1 compliant)
0.7
0.5
Marking Symbol: 5A
1.
2.
3.
4.
Source 1
Gate 1
Source 2
Gate 2
5.
6.
7.
8.
Drain
Drain
Drain
Drain
Packaging
Embossed type (Thermo-compression sealing) :
3 000 pcs / reel (standard)
Absolute Maximum Ratings Ta = 25 C
Parameter
Symbol
Drain-source Voltage
FET1 Gate-source Voltage
FET2 Drain current
*1
Peak drain current
Total power dissipation
Overall Channel temperature
Operating ambient temperature
Storage temperature
Note)
*1 t = 10 μs, Duty Cycle < 1 %
Ceramic substrate (70 70 t 1.0 mm)
*2 Dual operating
*3 Stand-alone (without the substrate)
VDS
VGS
ID
IDp
PD1*2
PD2*3
Tch
Topr
Tstg
Panasonic
JEITA
Code
WSMini8-F1-B
SC-113E
―
Internal Connection
Rating
Unit
20
12
4.0
40
700
150
150
-40 to +85
-55 to +150
V
V
A
A
(D)
8
(D)
7
mW
(D)
6
(D)
5
Rg =
1 kΩ
Rg =
1 kΩ
°C
°C
°C
1
2
3
4
(S1) (G1) (S2) (G2)
Pin Name
1.
2.
3.
4.
Source 1
Gate 1
Source 2
Gate 2
5.
6.
7.
8.
Drain
Drain
Drain
Drain
Page 1 of 6
Established : 2010-03-03
Revised
: 2013-10-15
Doc No. TT4-EA-12408
Revision. 2
Product Standards
MOS FET
MTM78E2B0LBF
Electrical Characteristics Ta = 25C 3C
Parameter
Drain-source surrender voltage
Drain-source cutoff current
Gate-source cutoff current
Gate threshold voltage
Symbol
Conditions
ID = 1.0 mA, VGS = 0
VDS = 20 V, VGS = 0
VGS = 12 V, VDS = 0
ID = 1.0 mA, VDS = 10 V
RDS(ON)1 ID = 2.0 A, VGS = 4.0 V
Drain-source ON resistance
RDS(ON)2 ID = 1.5 A, VGS = 3.0 V
RDS(ON)3 ID = 1.0 A, VGS = 2.5 V
Forward transfer admittance
ID = 1.0 A, VDS = 10 V
|Yfs|
Short-circuit input capacitance (Common source)
Ciss
Short-circuit output capacitance (Common source)
VDS = 10 V, VGS = 0, f = 1 MHz
Coss
Reverse transfer capacitance (Common source)
Crss
td(on)
Turn-on delay time *1, *2
VDD = 10 V, VGS = 4 V,
tr
Rise time *1, *2
*1, *2
ID = 1.0 A, RL = 10
td(off)
Turn-off delay time
*1, *2
tf
Fall time
Note)
VDSS
IDSS
IGSS
Vth
Min
Typ
Max
0.85
21.5
26.0
30.0
1.0
10
1.30
25.0
30.0
36.0
20
0.40
1.0
1100
75
70
0.2
0.5
2.0
1.5
Unit
V
μA
μA
V
m
m
m
S
pF
pF
pF
μs
μs
μs
μs
1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 Measuring methods for transistors.
2. *1 t = 10 μs, Duty Cycle < 1 %
*2 Measurement circuit for Turn-on Delay Time/Rise Time/Turn-off Delay Time/Fall Time
Page 2 of 6
Established : 2010-03-03
Revised
: 2013-10-15
Doc No. TT4-EA-12408
Revision. 2
Product Standards
MOS FET
MTM78E2B0LBF
*2 Measurement circuit for Turn-on Delay Time/Rise Time/Turn-off Delay Time/Fall Time
ID
4V
PW = 10μs
D.C. 1 %
0V
D
RL
G
Pulse
Generator
RG
VDD
50
S
90 %
VGS
VGS
10 %
0
90 %
VDD
VDS
10 %
0
td(on)
tr
td(off)
tf
Page 3 of 6
Established : 2010-03-03
Revised
: 2013-10-15
Doc No. TT4-EA-12408
Revision. 2
Product Standards
MOS FET
MTM78E2B0LBF
Technical Data ( reference )
ID - VDS
ID - VGS
0.1
4
VGS = 4.0 V
3
Drain current ID (A)
Drain Current ID (A)
2.5 V
3.0 V
2.0 V
2
1.5 V
1
0.075
Ta = 85 ℃
0.05
25 ℃
0.025
- 40 ℃
0
0
0
0.1
0.2
0
0.3
0.5
1.5
2
Gate-source voltage VGS (V)
Drain-source Voltage VDS (V)
VDS - VGS
RDS(on) - ID
100
Drain-source On-state Resistance
RDS(on) (m)
0.3
Drain-source Voltage VDS (V)
1
0.25
0.2
2.0 A
0.15
ID = 4.0 A
0.1
0.05
1.0 A
0
0
1
2
3
4
5
6
2.5 V
3.0 V
VGS = 4.0 V
10
0.1
1
Gate-source Voltage VGS (V)
10
Drain Current ID (A)
Dynamic Input/Output Characteristics
Gate-source Voltage VGS (V)
5
4
VDD = 10V
3
2
1
0
0
2
4
6
8
10
Total Gate Charge Qg (nC)
Page 4 of 6
Established : 2010-03-03
Revised
: 2013-10-15
Doc No. TT4-EA-12408
Revision. 2
Product Standards
MOS FET
MTM78E2B0LBF
Technical Data ( reference )
Vth - Ta
RDS(on) - Ta
50
Drain-source On-resistance
RDS(on) (m)
Gate-source Threshold Voltage
Vth (V)
1.5
1
0.5
VGS = 2.5 V
40
3.0 V
30
4.0 V
20
10
0
0
-50
0
50
100
150
-50
0
Temperature (℃)
50
100
150
Temperature (℃)
PD - Ta
Total Power Dissipation PD (W)
1
Ceramic substrate (70 70 t 1.0 mm),
Dual operating
0.8
0.6
0.4
Non-heat sink
0.2
0
0
50
100
150
Temperature Ta (C)
Rth - tsw
Safe Operating Area
100
IDp = 40 A
Drain Current ID (A)
Thermal resistance Rth (C/W)
1000
100
10
1
0.01
0.1
1
10
Pulse Width tsw (s)
100
1000
10
Operation in this area
is limited by RDS(on)
1
0.1
0.01
0.01
1 ms
10 ms
Ta = 25 C,
Glass epoxy board
(25.4 × 25.4 × t0.8 mm)
coated with copper foil,
which has more than
100 ms
1s
DC
300 mm2.
0.1
1
10
100
Drain-source Voltage VDS (V)
Page 5 of 6
Established : 2010-03-03
Revised
: 2013-10-15
Doc No. TT4-EA-12408
Revision. 2
Product Standards
MOS FET
MTM78E2B0LBF
WSMini8-F1-B
Unit : mm
2.0±0.1
+0.05
0.13-0.03
7
6
5
1
2
3
4
(0.2)
(7°)
1.7±0.1
8
2.1±0.1
+0.05
0.20-0.02
0 to 0.1
(7°)
(0.15)
0.70±0.05
0.5
Land Pattern (Reference) (Unit : mm)
0.7
1.8
0.5 0.5 0.5
0.3
Page 6 of 6
Established : 2010-03-03
Revised
: 2013-10-15
Request for your special attention and precautions
in using the technical information and semiconductors described in this book
(1) If any of the products or technical information described in this book is to be exported or provided to non-residents, the
laws and regulations of the exporting country, especially, those with regard to security export control, must be observed.
(2) The technical information described in this book is intended only to show the main characteristics and application circuit
examples of the products. No license is granted in and to any intellectual property right or other right owned by
Panasonic Corporation or any other company. Therefore, no responsibility is assumed by our company as to the
infringement upon any such right owned by any other company which may arise as a result of the use of technical
information de-scribed in this book.
(3) The products described in this book are intended to be used for general applications (such as office equipment,
communications equipment, measuring instruments and household appliances), or for specific applications as expressly
stated in this book.
Please consult with our sales staff in advance for information on the following applications, moreover please exchange
documents separately on terms of use etc.: Special applications (such as for in-vehicle equipment, airplanes, aerospace,
automotive equipment, traffic signaling equipment, combustion equipment, medical equipment and safety devices) in
which exceptional quality and reliability are required, or if the failure or malfunction of the products may directly
jeopardize life or harm the human body.
Unless exchanging documents on terms of use etc. in advance, it is to be understood that our company shall not be held
responsible for any damage incurred as a result of or in connection with your using the products described in this book
for any special application.
(4) The products and product specifications described in this book are subject to change without notice for modification
and/or improvement. At the final stage of your design, purchasing, or use of the products, therefore, ask for the most upto-date Product Standards in advance to make sure that the latest specifications satisfy your requirements.
(5) When designing your equipment, comply with the range of absolute maximum rating and the guaranteed operating
conditions (operating power supply voltage and operating environment etc.). Especially, please be careful not to exceed
the range of absolute maximum rating on the transient state, such as power-on, power-off and mode-switching. Otherwise, we will not be liable for any defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of incidence of break down
and failure mode, possible to occur to semiconductor products. Measures on the systems such as redundant design,
arresting the spread of fire or preventing glitch are recommended in order to prevent physical injury, fire, social damages,
for example, by using the products.
(6) Comply with the instructions for use in order to prevent breakdown and characteristics change due to external factors
(ESD, EOS, thermal stress and mechanical stress) at the time of handling, mounting or at customer's process. We do
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No.010618