1N5223B thru 1N5271B
Zener Diode, 1/2 Watt
5% Tolerance
Features:
D Zener Voltage 2.7 to 100V
D DO35 Package
Absolute Maximum Ratings: (TA = +25C unless otherwise specified)
Operating Junction Temperature Range, Topr . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65 to +200C
Storage Temperature Range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65 to +200C
DC Power Dissipation, PD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500mW
Derate Above 75C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.0mW/C
Forward Voltage (IF = 200mA), VF . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.1V
Electrical Characteristics: (TC = +25C, unless otherwise specified)
Maximum Dynamic
Impedance (Note 3)
Zener
Test
Current
(Izt)
Zzt @ Izt
Zzk @
0.25mA (Izk)
Volts
mA
Ohms
Ohms
A
Volts
1N5223B
2.7
20
30
1300
75
1.0
−0.080
1N5225B
3.0
20
29
1600
50
1.0
−0.075
1N5226B
3.3
20
28
1600
25
1.0
−0.070
1N5227B
3.6
20
24
1700
15
1.0
−0.065
1N5228B
3.9
20
23
1900
10
1.0
−0.060
1N5229B
4.3
20
22
2000
5
1.0
0.055
1N5230B
4.7
20
19
1900
5
2.0
0.030
Device
Number
Maximum
Leakage
Current
IR @ VR
Typical
Temperature
Coefficient
(Note 2)
vz
Nominal
Zener Voltage
Vz @ Izt
(Note 1)
%/C
Note 1. Nominal zener voltage is measured with the device junction in thermal equilibrium at the lead
temperature of 30C +1C and 3/8” lead length.
Note 2. Test conditions for temperature coefficient are as follows:
a.Izt = 7.5mA, T1 = +25C, T2 = +125C (1N5223B thru 1N5242B)
b.Izt = Rated Izt, T1 = +25C, T2 = +125C (1N5243B thru 1N5271B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage
at the specified ambient temperature.
Note 3. ZZT an ZZK are measured by dividing the AC voltage drop across the device by the AC current
applied. The specific limits are for IZ(AC) = 0.1 IZ(DC) with the AC frequency = 60Hz.
Electrical Characteristics (Cont’d): (TC = +25C, unless otherwise specified)
Maximum Dynamic
Impedance (Note 3)
Zener
Test
Current
(Izt)
Zzt @ Izt
Zzk @
0.25mA (Izk)
Volts
mA
Ohms
Ohms
A
1N5231B
5.1
20
17
1600
5
2.0
0.030
1N5232B
5.6
20
11
1600
5
3.0
+0.038
1N5233B
6.0
20
7
1600
5
3.5
+0.038
1N5234B
6.2
20
7
1000
5
4.0
0.045
1N5235B
6.8
20
5
750
3
5.0
0.050
1N5236B
7.5
20
6
500
3
6.0
0.058
1N5237B
8.2
20
8
500
3
6.5
0.062
1B5238B
8.7
20
8
600
3
6.5
0.065
1N5239B
9.1
20
10
600
3
7.0
0.068
Device
Numbe
Maximum
Leakage
Current
IR @ VR
Typical
Temperature
Coefficient
(Note 2)
vz
Nominal
Zener Voltage
Vz @ Izt
(Note 1)
Volts
%/C
1N5240B
10
20
17
600
3
8.0
0.075
1N5241B
11
20
22
600
2
8.4
0.076
1N5242B
12
20
30
600
1
9.1
0.077
1N5243B
13
9.5
13
600
0.5
9.9
0.079
1N5244B
14
9.0
15
600
0.1
10
0.082
1N5245B
15
8.5
16
600
0.1
11
0.082
1N5246B
16
7.8
17
600
0.1
12
0.083
1N5247B
17
7.4
19
600
0.1
13
0.084
1N5248B
18
7.0
21
600
0.1
14
0.085
1N5249B
19
6.6
23
600
0.1
14
0.086
1N5250B
20
6.2
25
600
0.1
15
0.086
1N5251B
22
5.6
29
600
0.1
17
0.087
1N5252B
24
5.2
33
600
0.1
18
0.088
1N5253B
25
5.0
35
600
0.1
19
0.089
Note 1. Nominal zener voltage is measured with the device junction in thermal equilibrium at the lead
temperature of 30C +1C and 3/8” lead length.
Note 2. Test conditions for temperature coefficient are as follows:
a.Izt = 7.5mA, T1 = +25C, T2 = +125C (1N5223B thru 1N5242B)
b.Izt = Rated Izt, T1 = +25C, T2 = +125C (1N5243B thru 1N5271B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage
at the specified ambient temperature.
Note 3. ZZT an ZZK are measured by dividing the AC voltage drop across the device by the AC current
applied. The specific limits are for IZ(AC) = 0.1 IZ(DC) with the AC frequency = 60Hz.
Electrical Characteristics (Cont’d): (TC = +25C, unless otherwise specified)
Maximum Dynamic
Impedance (Note 3)
Zener
Test
Current
(Izt)
Zzt @ Izt
Zzk @
0.25mA (Izk)
Volts
mA
Ohms
Ohms
A
Volts
1N5254B
27
4.6
41
600
0.1
21
0.090
1N5255B
28
4.5
44
600
0.1
21
0.091
1N5256B
30
4.2
49
600
0.1
23
0.091
1N5257B
33
3.8
58
700
0.1
25
0.092
1N5258B
36
3.4
70
700
0.1
27
0.093
1N5259B
39
3.2
80
800
0.1
30
0.094
1N5260B
43
3.0
93
900
0.1
33
0.095
1N5261B
47
2.7
105
1000
0.1
36
0.095
1N5262B
51
2.5
125
1100
0.1
39
0.096
1N5263B
56
2.2
150
1300
0.1
43
0.096
1N5266B
68
1.8
230
1600
0.1
52
0.097
1N5267B
75
1.7
270
1700
0.1
56
0.098
1N5270B
91
1.4
400
2300
0.1
69
0.099
1N5271B
100
1.3
500
2600
0.1
76
0.110
Device
Numbe
Maximum
Leakage
Current
IR @ VR
Typical
Temperature
Coefficient
(Note 2)
vz
Nominal
Zener Voltage
Vz @ Izt
(Note 1)
%/C
Note 1. Nominal zener voltage is measured with the device junction in thermal equilibrium at the lead
temperature of 30C +1C and 3/8” lead length.
Note 2. Test conditions for temperature coefficient are as follows:
a.Izt = 7.5mA, T1 = +25C, T2 = +125C (1N5223B thru 1N5242B)
b.Izt = Rated Izt, T1 = +25C, T2 = +125C (1N5243B thru 1N5271B)
Device to be temperature stabilized with current applied prior to reading breakdown voltage
at the specified ambient temperature.
Note 3. ZZT an ZZK are measured by dividing the AC voltage drop across the device by the AC current
applied. The specific limits are for IZ(AC) = 0.1 IZ(DC) with the AC frequency = 60Hz.
1.000
(25.4)
Min
.200
(5.08)
Max
.022 (.509) Dia Max
Color Band Denotes Cathode
.090 (2.28)
Dia Max
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