MC33879
Configurable Octal Serial Switch with Open Load Detect
Current Disable
Rev. 12.0 — 10 May 2022
1
Product data sheet
General description
The 33879 device is an 8-output hardware configurable, high-side/low-side switch
with 16-bit serial input control using the Serial Peripheral Interface (SPI). Two of the
outputs may be controlled directly via a microcontroller for pulse-width modulation
(PWM) applications. The 33879 incorporates SMARTMOS technology, with CMOS logic,
bipolar/MOS analog circuitry, and DMOS power MOSFETs. The 33879 controls various
inductive, incandescent, or LED loads by directly interfacing with a microcontroller. The
circuit’s innovative monitoring and protection features include very low standby currents,
cascade fault reporting, internal +45 V clamp voltage for low-side configuration, –20 V
high-side configuration, output specific diagnostics, and independent overtemperature
protection.
2
Features and benefits
•
•
•
•
•
•
•
•
•
•
•
3
Designed to operate at 5.5 V < VPWR < 27.5 V
16-bit SPI for control and fault reporting, 3.3 V / 5.0 V compatible
Outputs are current limited (0.6 A to 1.2 A) to drive incandescent lamps
Output voltage clamp, + 45 V (low side) and –20 V (high side) during inductive
switching
On/Off control of open load detect current (LED application)
Internal reverse battery protection on VPWR
Loss of ground or supply will not energize loads or damage IC
Maximum 5.0 µA IPWR standby current at 13 V VPWR
RDS(ON) of 0.75 Ω at 25 °C typical
Short-circuit detect and current limit with automatic retry
Independent overtemperature protection
Ordering information
Table 1. Orderable Part Variations
Type number
[1]
Package
Name
Description
Version
HSOP32
EK suffix (PB-free)
HSOP32, plastic, thermal enhanced small outline package; 32
terminals; 0.65 mm pitch; 7.5 mm x 11 mm x 2.22 mm body
–40 to 125 °C
SOT1746-1
MC33879PEK
MC33879APEK
MC33879BPEK
[1]
To order parts in tape & reel, add R2 to the end of the part number.
MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
Table 2. Device variations
Symbol
Characteristic
VPWR
VPWR Supply Voltage
IOUT(FLT-TH)
IOCO
IOCO
IEN
VOUT(FLT-TH)
IOUT(FLT-TH)
Min
Typ
Max
V
33879
–16
—
40
33879A and 33879B
–16
—
45
Output Fault Detection Current @ Threshold, High-side Configuration Outputs
Programmed OFF
µA
33879
35
55
90
33879A and 33879B
35
55
150
Output OFF Open Load Detection Current, High-side Configuration VDRAIN = 16 V,
VSOURCE = 0 V, Outputs Programmed OFF, VPWR = 16 V
µA
33879
65
100
160
33879A and 33879B
60
100
190
Output OFF Open Load Detection Current, Low-side Configuration VDRAIN = 16 V,
VSOURCE = 0 V, Outputs Programmed OFF, VPWR =16 V
µA
33879
40
75
135
33879A and 33879B
40
75
150
EN Pull-down Current
EN = 5.0 V
µA
33879
20
45
100
33879A and 33879B
20
45
110
Output Fault Detection Voltage Threshold
Outputs Programmed OFF
V
33879
2.5
4.0
4.5
33879A and 33879B
2.5
4.0
5.0
Output Fault Detection Current @ Threshold, Low-side Configuration
Outputs Programmed OFF
µA
33879
20
30
60
33879A and 33879B
20
30
115
MC33879
Product data sheet
Unit
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MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
4
Internal block diagram
VDD
VPWR
~50 A
CS
Internal bias
power supply
SCLK
Charge pump
DI
Overvoltage
shutdown/POR
sleep state
DO
GND
OV, POR, SLEEP
SPI and
interface logic
EN
Typical of all 8 output drivers
~110 k
TLIM
IN5
~50 A
IN6
SPI bit 0
Enable
Gate drive
control
SPI bit 4
IN5
Current
limit
~50 A
Open/short
comparator
Open
load
detect
current
~80 A
~4.0 V open/short
threshold
Exposed pad
Gate drive
control
Current
limit
S1
S2
S3 Source
S4 outputs
S7
S8
D5 Drain
D6 outputs
TLIM
EP
D1
D2
D3 Drain
D4 outputs
D7
D8
Open
load
detect
current
~80 A
S5 Source
S6 outputs
Open/short
comparator
~4.0 V open/short
threshold
aaa-046069
Figure 1. 33879 Simplified Internal Block Diagram
MC33879
Product data sheet
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MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
5
Applications
•
•
•
•
•
•
6
Solenoids
Relays
Actuators
Stepper motors
Brush DC motors
Incandescent lamps
Simplified application diagram
VPWR
VBAT
VPWR
5.0 V
D1
D2
D3
D4
S1
S2
S3
S4
VDD
A0
MCU
EN
MOSI
DI
SCLK
SCLK
CS
33879
CS
MISO
D0
PWM1
IN5
PWM2
IN6
GND
High-side drive
M
D5
D6
D7
D8
S5
S6
S7
S8
H-bridge configuration
VBAT
VBAT
Low-side drive
aaa-046257
Figure 2. 33879 Simplified application diagram
MC33879
Product data sheet
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MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
7
Pin connections
7.1 Pin diagram
Figure 3. Pin diagram
7.2 Pin definitions
Table 3. Pin definitions
Number
Name
Function
Formal name
Definition
1
GND
Ground
Ground
Digital ground.
2
VDD
Input
Logic Supply Voltage
Logic supply for SPI interface. With VDD low the device is in Sleep mode.
3
S8
Output
Source Output 8
Output 8 MOSFET source pin.
4, 8, 9, 24, NC
25, 30
No
Not Connected
Connection
No internal connection to this pin.
5
D8
Output
Drain Output 8
Output 8 MOSFET drain pin.
6
S2
Output
Source Output 2
Output 2 MOSFET source pin.
7
D2
Output
Drain Output 2
Output 2 MOSFET drain pin.
10
S1
Output
Source Output 1
Output 1 MOSFET source pin.
11
D1
Output
Drain Output 1
Output 1 MOSFET drain pin.
12
D6
Output
Drain Output 6
Output 6 MOSFET drain pin.
13
S6
Output
Source Output 6
Output 6 MOSFET source pin.
14
IN6
Input
Command Input 6
PWM direct control input pin for output 6. IN6 is “OR” with SPI bit.
15
EN
Input
Enable Input
IC Enable. Active high. With EN low, the device is in Sleep mode.
16
SCLK
Clock
SPI Clock
SPI control clock input pin.
17
DI
Input
Serial Data Input
SPI control data input pin from MCU to the 33879. Logic [1] activates
output.
18
CS
Input
SPI Chip Select
SPI control chip select input pin from MCU to the 33879. Logic [0] allows
data to be transferred in.
19
IN5
Input
Command Input 5
PWM direct control input pin for output 5. IN5 is “OR” with SPI bit.
MC33879
Product data sheet
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Rev. 12.0 — 10 May 2022
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MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
Table 3. Pin definitions...continued
Number
Name
Function
Formal name
Definition
20
S5
Output
Source Output 5
Output 5 MOSFET source pin.
21
D5
Output
Drain Output 5
Output 5 MOSFET drain pin.
22
D3
Output
Drain Output 3
Output 3 MOSFET drain pin.
23
S3
Output
Source Output 3
Output 3 MOSFET source pin.
26
D4
Output
Drain Output 4
Output 4 MOSFET drain pin.
27
S4
Output
Source Output 4
Output 4 MOSFET source pin.
28
D7
Output
Drain Output 7
Output 7 MOSFET drain pin.
29
S7
Output
Source Output 7
Output 7 MOSFET source pin.
31
VPWR
Input
Battery Input
Power supply pin to the 33879. VPWR has internal reverse battery
protection.
32
DO
Output
Serial Data Output
SPI control data output pin from the 33879 to the MCU. DO=0 no fault,
DO=1 specific output has fault.
33
EP
Ground
Exposed Pad
Device performs as specified with the Exposed Pad un-terminated
(floating) however, it is recommended the exposed pad be terminated to
pin 1 (GND) and system ground.
8
Electrical characteristics
8.1 Maximum ratings
Table 4. Maximum ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Symbol
Description (rating)
Min
Max
Unit
Electrical ratings
VDD
—
VPWR
VDD Supply Voltage
[1]
−0.3
7.0
VDC
CS, DI, DO, SCLK, IN5, IN6, and EN
[1]
−0.3
7.0
VDC
VPWR Supply Voltage
[1]
33879
33879A and 33879B
ECLAMP
Output Clamp Energy
[2]
ESD Voltage
[3]
VDC
−16
40
−16
45
50
50
mJ
V
VESD1
Human Body Model 33879
–450
+450
V
VESD2
Machine Model 33879
–100
+100
V
VESD1
Human Body Model 33879A and 33879B
–2000
+2000
V
VESD2
Machine Model 33879A and 33879B
–200
+200
V
Thermal ratings
Operating Temperature
TA
Ambient
−40
125
°C
TJ
Junction
–40
150
°C
TC
Case
−40
125
°C
MC33879
Product data sheet
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MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
Table 4. Maximum ratings...continued
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Symbol
Description (rating)
TSTG
Storage Temperature
PD
[4]
Power Dissipation
Min
Max
Unit
–55
150
°C
—
1.7
W
—
71
°C/W
—
1.2
°C/W
—
—
°C
Thermal Resistance
RθJA
Junction to Ambient
RθJC
Between the Die and the Exposed Die Pad
TPPRT
[1]
[2]
[3]
[4]
[5]
[6]
Peak Package Reflow Temperature During Reflow
[5] [6]
Exceeding these limits may cause malfunction or permanent damage to the device.
Maximum output clamp energy capability at 150°C junction temperature using single non-repetitive pulse method with I = 350 mA.
ESD1 testing is performed in accordance with the Human Body Model (CZAP = 100 pF, RZAP = 1500 Ω), ESD2 testing is performed in accordance with
the Machine Model (CZAP = 200 pF, RZAP = 0 Ω).
Maximum power dissipation at TA = 25 °C with no heatsink used.
Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause malfunction
or permanent damage to the device.
NXP’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow Temperature and Moisture
Sensitivity Levels (MSL), Go to www.nxp.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e.
MC33xxxD enter 33xxx), and review parametrics.
8.2 Static electrical characteristics
Table 5. Static electrical characteristics
Characteristics noted under conditions 3.1 V ≤ VDD ≤ 5.5 V, 5.5 V ≤ VPWR ≤ 18 V, -40 °C ≤ TC ≤ 125 °C, unless otherwise noted. Where
applicable, typical values reflect the parameter’s approximate average value with VPWR = 13 V, TA = 25 °C.
Symbol
Description (rating)
Min
Typ
Max
Unit
Fully Operational 33879
5.5
—
26.5
V
33879A and 33879B
5.5
—
27.5
IPWR(ON)
Supply current
—
14
24
IPWR(SS)
Sleep State Supply Current
—
2.0
5.0
—
2.0
5.0
33879
27
28.5
32
33879A and 33879B
28
30
33
VPWR(OV-HYS)
VPWR Overvoltage Shutdown Hysteresis Voltage
0.2
1.5
2.5
V
VPWR(UV)
VPWR Undervoltage Shutdown Threshold Voltage
3.0
4.0
5.0
V
VPWR(UV-HYS)
VPWR Undervoltage Shutdown Hysteresis Voltage
300
500
700
mV
VDD
Logic Supply Voltage
3.1
—
5.5
V
IDD
Logic Supply Current
250
400
700
µA
VDD(SS)
Logic Supply Sleep State Threshold Voltage
0.8
2.5
3.0
V
Power input
VPWR(FO)
Supply Voltage Range
VDD or EN ≤ 0.8 V, VPWR = 13 V
IVDD(SS)
Sleep State Supply Current
EN ≤ 0.8 V, VDD = 5.5 V
VPWR(OV)
mA
µA
µA
VPWR Overvoltage Shutdown Threshold Voltage
V
Power output
RDS(on)
Drain-to-Source ON Resistance (IOUT = 0.350 A, VPWR = 13 V)
MC33879
Product data sheet
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Rev. 12.0 — 10 May 2022
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MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
Table 5. Static electrical characteristics...continued
Characteristics noted under conditions 3.1 V ≤ VDD ≤ 5.5 V, 5.5 V ≤ VPWR ≤ 18 V, -40 °C ≤ TC ≤ 125 °C, unless otherwise noted. Where
applicable, typical values reflect the parameter’s approximate average value with VPWR = 13 V, TA = 25 °C.
Symbol
IOUT(LIM)
VOUT(FLT-TH)
IOUT(FLT-TH)
IOUT(FLT-TH)
IOCO
Description (rating)
Min
Typ
Max
TJ = 125°C
—
—
1.4
TJ = 25°C
—
0.75
—
TJ = -40°C
—
—
—
0.6
—
1.2
A
33879
2.5
4.0
4.5
V
33879A and 33879B
2.5
4.0
5.0
33879
35
55
90
33879A and 33879B
35
55
150
33879
20
30
60
33879A and 33879B
20
30
115
33879
65
100
160
33879A and 33879B
60
100
190
33879
40
75
135
33879A and 33879B
40
75
150
Output Self Limiting Current High-side and Low-side Configurations
Output Fault Detection Voltage Threshold Outputs Programmed OFF
[1]
Output Fault Detection Current @ Threshold, High-side Configuration
Outputs Programmed OFF
Output Fault Detection Current @ Threshold, Low-side Configuration
Outputs Programmed OFF
Output OFF Open Load Detection Current, Low-side Configuration
Output Clamp Voltage Low-side Drive
40
–15
TLIM(HYS)
–25
µA
—
—
5.0
Output Leakage Current Low-side Configuration
µA
—
—
5.0
Output Leakage Current High-side Configuration
µA
VDD = 5.0 V, VDRAIN = 16 V, VSOURCE = 0 V, Open Load Detection
Current Disabled
TLIM
–20
Output Leakage Current High-side and Low-side Configurations
VDD = 5.0 V, VDRAIN = 16 V, VSOURCE = 0 V, Open Load Detection
Current Disabled
IOUT(LKG)
55
V
VDD = 0 V, VDRAIN = 16 V, VSOURCE = 0 V
IOUT(LKG)
45
Output Clamp Voltage High-side Drive
IS = -10 mA
IOUT(LKG)
µA
V
ID = 10 mA
VOC(HSD)
µA
µA
VDRAIN = 16 V, VSOURCE = 0 V, Outputs Programmed OFF, VPWR =16 V
VOC(LSD)
µA
Output OFF Open Load Detection Current, High-side Configuration
VDRAIN = 16 V, VSOURCE = 0 V, Outputs Programmed OFF, VPWR = 16
V
IOCO
Unit
—
—
20
Overtemperature Shutdown
[2]
155
—
185
°C
Overtemperature Shutdown Hysteresis
[2]
5.0
10
15
°C
Input Logic High-voltage Thresholds
[3]
0.7 VDD
—
VDD + 0.3
V
Input Logic Low-voltage Thresholds
[3]
GND – 0.3 —
0.2 VDD
V
Digital interface
VIH
VIL
MC33879
Product data sheet
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MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
Table 5. Static electrical characteristics...continued
Characteristics noted under conditions 3.1 V ≤ VDD ≤ 5.5 V, 5.5 V ≤ VPWR ≤ 18 V, -40 °C ≤ TC ≤ 125 °C, unless otherwise noted. Where
applicable, typical values reflect the parameter’s approximate average value with VPWR = 13 V, TA = 25 °C.
Symbol
Description (rating)
IIN5, IIN6, IEN
IN5, IN6, EN Input Logic Current
Max
–10
—
10
IN5, IN6 Pull-down Current
30
45
100
EN Pull-down Current, EN = 5.0 V
IEN
ISCK, IDI, ITRI-DO
µA
33879
20
45
100
33879A and 33879B
20
45
110
SCLK, DI Input, Tri-state DO Output
µA
0 to 5.0 V
–10
—
10
CS Input Current
ICS
µA
CS = VDD
–10
—
10
CS Pull-up Current
ICS
µA
CS = 0 V
ICS(LKG)
–30
—
—
10
VDD - 0.4
—
VDD
DO High State Output Voltage
V
DO Low State Output Voltage
V
IDO-LOW = 1.6 mA
CIN
–100
µA
IDO-HIGH = –1.6 mA
VDOLOW
—
CS Leakage Current to VDD
CS = 5.0 V, VDD = 0 V
VDOHIGH
Unit
µA
0.8 to 5.0 V
[1]
[2]
[3]
Typ
µA
IN5, IN6, EN = 0 V
IIN5, IIN6
Min
Input Capacitance on SCLK, DI, Tri-state DO, IN5, IN6, EN
[2]
—
—
0.4
—
—
20
pF
Output fault detection thresholds with outputs programmed OFF. Output fault detect thresholds are the same for output open and shorts
This parameter is guaranteed by design; however, it is not production tested.
Upper and lower logic threshold voltage levels apply to DI, CS, SCLK, IN5, IN6, and EN.
MC33879
Product data sheet
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MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
8.3 Dynamic electrical characteristics
Table 6. Dynamic electrical characteristics
Characteristics noted under conditions 3.1 V ≤ VDD ≤ 5.5 V, 5.5 V ≤ VPWR ≤ 18 V, -40 °C ≤ TC ≤ 125 °C, unless otherwise noted. Where
applicable, typical values reflect the parameter’s approximate average value with VPWR = 13 V, TA = 25 °C.
Symbol
Description (rating)
Min
Typ
Max
0.1
0.5
1.0
0.1
0.5
1.0
0.1
0.3
1.0
0.1
0.3
1.0
Unit
Power output timing
tSR(RISE)
Output Slew Rate Low-side Configuration
[1]
RLOAD = 620 Ω, CL = 200 pF
tSR(FALL)
Output Slew Rate Low-side Configuration
[1]
RLOAD = 620 Ω, CL = 200 pF
tSR(RISE)
Output Rise Time High-side Configuration
Output Fall Time High-side Configuration
V/μs
[1]
RLOAD = 620 Ω, CL = 200 pF
tSR(FALL)
V/μs
V/μs
[1]
RLOAD = 620 Ω, CL = 200 pF
V/μs
Output Turn ON Delay Time, High-side and Low-side Configuration
[2]
1.0
15
50
μs
Output Turn OFF Delay Time, High-side and Low-side Configuration
[2]
1.0
30
100
μs
tFAULT
Output Fault Delay Time
[3]
100
—
300
μs
tPOR
Power-ON Reset Delay
100
—
—
100
—
—
tDLY(ON)
tDLY(OFF)
Delay Time Required from Rising Edge of EN and VDD to SPI Active
tRESET
Low-State Duration on VDD or EN for Reset
VDD or EN ≤ 0.2 V
μs
μs
Digital interface timing
[4]
fSPI
Recommended Frequency of SPI Operation
—
4.0
—
MHz
tLEAD
Falling Edge of CS to Rising Edge of SCLK (Required Setup Time)
100
—
—
ns
tLAG
Falling Edge of SCLK to Rising Edge of CS (Required Setup Time)
50
—
—
ns
tDI(SU)
DI to Falling Edge of SCLK (Required Setup Time)
16
—
—
ns
tDI(HOLD)
Falling Edge of SCLK to DI (Required Hold Time)
20
—
—
ns
tR(DI)
DI, CS, SCLK Signal Rise Time
[5]
—
5.0
—
ns
tF(DI)
DI, CS, SCLK Signal Fall Time
[5]
—
5.0
—
ns
Time from Falling Edge of CS to DO Low-impedance
[6]
—
—
55
ns
Time from Rising Edge of CS to DO High-impedance
[7]
—
—
55
ns
Time from Rising Edge of SCLK to DO Data Valid
[8]
—
25
55
ns
tDO(EN)
tDO(DIS)
tVALID
[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
Output slew rate respectively measured across a 620 Ω resistive load at 10 to 90 percent and 90 to 10 percent voltage points. CL capacitor is connected
from Drain or Source output to Ground.
Output turn ON and OFF delay time measured from 50 percent rising edge of CS to the beginning of the 10 and 90 percent transition points.
Duration of fault before fault bit is set. Duration between access times must be greater than 300 μs to read faults.
This parameter is guaranteed by design. Production test equipment uses 4.16 MHz, 5.5 V/3.1 V SPI interface.
Rise and Fall time of incoming DI, CS, and SCLK signals suggested for design consideration to prevent the occurrence of double pulsing.
Time required for output status data to be available for use at DO pin.
Time required for output status data to be terminated at DO pin.
Time required to obtain valid data out from DO following the rise of SCLK.
MC33879
Product data sheet
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MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
8.4 Timing diagrams
CS
0.2 VDD
tLEAD
SCLK
tLAG
0.7 VDD
0.2 VDD
tDI(SU)
DI
0.7 VDD
0.2 VDD
tDI(HOLD)
MSB in
tDO(EN)
DO
0.7 VDD
tDO(DIS)
tVALID
MSB out
0.2 VDD
LSB out
aaa-046125
Figure 4. SPI timing diagram
VDD = 5.0 V
33879
UNDER
TEST
SCLK
DO
CL = 200 pF
aaa-046126
Figure 5. Valid Data Delay Time and Valid Time Test Circuit
Note: CL represents the total capacitance of the test fixture and probe
tR(DI)
0.7 VDD
SCLK
< 50 ns
tF(DI)
3.3/5.0 V
50 %
0.2 VDD
0.7 VDD
0.2 VDD
DO
tR(DO)
(Low-to-High)
t VALID
DO
(High-to-Low)
< 50 ns
0.7 VDD
0.2 VDD
0V
VOH
VOL
VOH
VOL
aaa-046127
Figure 6. Valid data delay time and valid time waveforms
MC33879
Product data sheet
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MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
tF(CS)
tR(CS)
< 50 ns
3.3/5.0 V
90 %
CS
< 50 ns
0.7 VDD
10 %
0.2 VDD
tDO(EN)
DO
tDO(DIS)
VTri-State
90 %
(Tri-State to Low)
10 %
tDO(EN)
VOH
VTri-State
10 %
(Tri-State to High)
VOL
tDO(DIS)
90 %
DO
0V
aaa-046128
Figure 7. Enable and disable time waveforms
8.5 Typical electrical characteristics
aaa-046245
I PWR Current into VPWR Pin (mA)
20
VPWR @ 18 V
19
33879
18
17
16
33879A/B
15
14
13
-40
-25
0
25
50
75
100
125
TA, Ambient temperature (°C)
Figure 8. IPWR vs. Temperature
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Configurable Octal Serial Switch with Open Load Detect Current Disable
aaa-046246
I PWR Current into VPWR Pin (mA)
7
VPWR @ 13 V
6
5
4
3
2
1
0
-40
-25
0
25
50
75
100
125
TA, Ambient temperature (°C)
Figure 9. Sleep State IPWR vs. Temperature
aaa-046247
140
I PWR Current into VPWR Pin (mA)
TA @ 25 °C
120
33879
100
80
60
40
20
0
33879A
0
5
10
15
20
VPWR
25
Figure 10. Sleep State IPWR vs. VPWR
R DS(ON) (Ω)
1.4
1.2
aaa-046248
VPWR @ 13 V
High-side drive
1.0
0.8
0.6
0.4
0.2
0
-40
-25
0
25
50
75
100
125
TA, Ambient temperature (°C)
Figure 11. RDS(ON) vs. Temperature at 350 mA
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NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
aaa-046249
RDS(ON) (Ω)
1.4
TA @ 25 °C
High-side drive
1.2
1.0
0.8
0.6
0.4
0.2
0
0
5
10
15
20
VPWR (V)
25
Figure 12. RDS(ON) vs. VPWR at 350 mA
aaa-046250
I OCO Open load (mA)
140
VPWR @ 13 V
120
100
80
High-side
60
40
Low-side
20
0
-40
-25
0
25
50
75
100
125
TA, Ambient temperature (°C)
Figure 13. Open Load Detection Current at Threshold
VOUT(flt-th), Open load threshold (mA)
5.5
5.0
aaa-046251
VPWR @ 13 V
High-side and Low-side
4.5
4.0
3.5
3.0
2.5
2.0
-40
-25
0
25
50
75
100
125
TA, Ambient temperature (°C)
Figure 14. Open Load Detection Threshold vs. Temperature
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Configurable Octal Serial Switch with Open Load Detect Current Disable
9
Functional description
9.1 Functional pin description
9.1.1 CS Pin
The system MCU selects the 33879 with which to communicate through the use of the
chip select CS pin. Logic low on CS enables the data output (DO) driver and allows data
to be transferred from the MCU to the 33879 and vice versa. Data clocked into the 33879
is acted upon on the rising edge of CS. To avoid any spurious data, it is essential the
high-to-low transition of the CS signal occur only when the SPI clock (SCLK) is in a logic
low state.
9.1.2 SCLK Pin
The SCLK pin clocks the internal shift registers of the 33879. The serial data input (DI)
pin is latched into the input shift register on the falling edge of the SCLK. The serial
data output (DO) pin shifts data out of the shift register on the rising edge of the SCLK
signal. False clocking of the shift register must be avoided to ensure validity of data. It
is essential the SCLK pin be in a logic low state when the CS pin makes any transition.
For this reason, it is recommended the SCLK pin is commanded to a logic low state when
the device is not accessed (CS in logic high state). With CS in a logic high state, signals
present on SCLK and DI are ignored and the DO output is in tri-state.
9.1.3 DI Pin
The DI pin is used for serial instruction data input. DI information is latched into the
input register on the falling edge of SCLK. A logic high state present on DI programs
a specific output on. The specific output turns on with the rising edge of the CS signal.
Conversely, a logic low state present on the DI pin programs the output off. The specific
output turns off with the rising edge of the CS signal. To program the eight outputs and
open load detection current on or off, send the DI data beginning with the open load
detection current bits, followed by output eight, output seven, and so on to output one.
For each falling edge of the SCLK while CS is logic low, a data bit instruction (on or off) is
loaded into the shift register per the data bit DI state. Sixteen bits of entered information
is required to fill the input shift register.
9.1.4 DO Pin
The DO pin is the output from the shift register. The DO pin remains tri-state until the CS
pin is in a logic low state. All faults on the 33879 device are reported as logic [1] through
the DO data pin. Regardless of the configuration of the driver, open loads and shorted
loads are reported as logic [1]. Conversely, normal operating outputs with non-faulted
loads are reported as logic [0]. Outputs programmed with open load detection current
disabled report logic [0] in the off state. The first eight positive transitions of SCLK report
logic [0] followed by the status of the eight output drivers. The DI/DO shifting of data
follows a first-in, first-out protocol with both input and output words transferring the most
significant bit (MSB) first.
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Configurable Octal Serial Switch with Open Load Detect Current Disable
9.1.5 EN Pin
The EN pin on the 33879 enables the device. With the EN pin high, output drivers may
be activated and open/short fault detection performed and reported. With the EN pin
low, all outputs become inactive, open load detection current is disabled, and the device
enters Sleep mode. The 33879 performs Power-ON Reset on the rising edge of the
enable signal.
9.1.6 IN5 and IN6 Pins
The IN5 and IN6 command inputs allow outputs five and six to be used in PWM
applications. The IN5 and IN6 pins are OR-ed with the serial peripheral interface (SPI)
command input bits. For SPI control of outputs five and six, the IN5 and IN6 pins should
be grounded or held low by the microprocessor. When using IN5 or IN6 to PWM the
output, the control SPI bit must be logic [0]. Maximum PWM frequency for each output is
2.0 kHz.
9.1.7 VDD Pin
The VDD input pin is used to determine logic levels on the microprocessor interface (SPI)
pins. Current from VDD is used to drive the DO output and the pull-up current for CS.
VDD must be applied for normal mode operation. The 33879 device performs Power-ON
Reset with the application of VDD.
9.1.8 VPWR Pin
The VPWR pin is the battery input and Power-ON Reset to the 33879 IC. The VPWR
pin has internal reverse battery protection. All internal logic current is provided from the
VPWR pin. The 33879 performs Power-ON Reset with the application of VPWR.
9.1.9 D1–D8 Pins
The D1 to D8 pins are the open-drain outputs of the 33879. For high-side drive
configurations, the drain pins are connected to battery supply. In low-side drive
configurations, the drain pins are connected to the low-side of the load. All outputs may
be configured individually as desired. When configured as low-side drive, the 33879 limits
the positive inductive transient to 45 V.
9.1.10 S1–S8 Pins
The S1 to S8 pins are the source outputs of the 33879. The source pins are connected
directly to the load for high-side drive configurations. In low-side drive configurations, the
source is connected to ground. All outputs may be configured individually as desired.
When high-side drive is used, the 33879 will limit the negative inductive transient to
negative 20 V.
9.1.11 Exposed Pad Pin
Device performs as specified with the Exposed Pad un-terminated (floating) however, it is
recommended the Exposed Pad be terminated to pin 1 (GND) and system ground.
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Configurable Octal Serial Switch with Open Load Detect Current Disable
9.2 MCU Interface description
9.2.1 Introduction
The 33879 is an eight output hardware-configurable power switch with 16-bit serial
control. A simplified internal block diagram of the 33879 is shown in Figure 2. The 33879
device uses high-efficiency up-drain power DMOS output transistors exhibiting low drainto-source ON resistance (RDS(on) = 0.75 Ω at 25 °C typical) and dense CMOS control
logic. All outputs have independent voltage clamps to provide fast inductive turn-off and
transient protection.
In operation, the 33879 functions as an eight output serial switch, serving as an MCU bus
expander and buffer with fault management and fault reporting features. In doing so, the
device directly relieves the MCU of the fault management functions. This device directly
interfaces to an MCU using a SPI for control and diagnostic readout. Figure 15 illustrates
the basic SPI configuration between an MCU and one 33879.
MC68HCxx
33879
Microcontroller
Shift register
16 Bits
MOSI
DI
MISO
DO
Receive
buffer
SCLK
Parallel
ports
CS
Shift register
16 Bits
To logic
aaa-046252
Figure 15. SPI Interface with microcontroller
All inputs are compatible with 5.0 V and 3.3 V CMOS logic levels and incorporate positive
logic. When a SPI bit is programmed to a logic [0], the corresponding output is OFF.
Conversely, when a SPI bit is programmed to logic [1] the output being controlled is ON.
Diagnostics are treated in a similar manner. Outputs with a fault feed back (via DO) a
logic [1] to the microcontroller, while normal operating outputs provide a logic [0].
Figure 16 illustrates the daisy chain configuration using the 33879. Data from the MCU
is clocked daisy chain through each device while the CS bit is commanded low by the
MCU. During each clock cycle, output status from the daisy chain is transferred to the
MCU via the Master In Slave Out (MISO) line. On rising edge of CS, command data
stored in the input register is then transferred to the output driver.
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Configurable Octal Serial Switch with Open Load Detect Current Disable
SCLK
Parallel port
CS
MC68HCxx
Microcontroller
with
SPI interface
MISO
DO
33879
CS
DI
DO
8 Outputs
MOSI
SCLK
33879
8 Outputs
DI
CS
DO
SCLK
33879
DI
8 Outputs
aaa-046253
Figure 16. 33879 SPI System Daisy Chain
Multiple 33879 devices can be controlled in a parallel input fashion using the SPI. Figure
17 illustrates the control of 24 loads using three dedicated parallel MCU ports for chip
select.
MOSI
DI
SCLK
SCLK
MISO
DO
33879
8 Outputs
33879
8 Outputs
33879
8 Outputs
CS
MC68HCxx
Microcontroller
with
SPI interface
DI
SCLK
DO
CS
DI
Parallel
ports
A
B
C
SCLK
DO
CS
aaa-046254
Figure 17. Parallel Input SPI Control
9.3 SPI Definition
A 16-bit command word is sent to the 33879 on each SPI communication and a 16-bit
status word is received from the 33879. The MSB is sent and received first. As Table 7
shows, the Command Register defines the position and operation the 33879 performs on
the rising edge of CS. The Fault Register, shown in Table 8, defines the previous state
status of the output driver. Table 9 identifies the type of fault and the method by which the
fault is communicated to the microprocessor.
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Configurable Octal Serial Switch with Open Load Detect Current Disable
Table 7. Command register definition
MSB
LSB
Bit 15
Bit 14
Bit 13
Bit 12
Bit 11
Bit 10
Bit 9
Bit 8
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
ON/
OFF
Open
Load
Detect
8
ON/
OFF
Open
Load
Detect
7
ON/
OFF
Open
Load
Detect
6
ON/
OFF
Open
Load
Detect
5
ON/
OFF
Open
Load
Detect
4
ON/
OFF
Open
Load
Detect
3
ON/
OFF
Open
Load
Detect
2
ON/
ON/
ON/
ON/
ON/
ON/
ON/
ON/
ON/
OFF
OFF
OFF
OFF
OFF
OFF
OFF
OFF
OFF
Open OUT 8 OUT 7 OUT 6 OUT 5 OUT 4 OUT 3 OUT 2 OUT 1
Load
Detect
1
0 = Bits 0 to 7, Output commanded OFF.
0 = Bits 8 to 15, Open Load Detection Current OFF.
1 = Bits 0 to 7, Output commanded ON.
1 = Bits 8 to 15 Open Load Detection Current ON.
Table 8. Command register definition
MSB
LSB
Bit 15
Bit 14
Bit 13
Bit 12
Bit 11
Bit 10
Bit 9
Bit 8
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
0
0
0
0
0
0
0
0
OUT 8 OUT 7 OUT 6 OUT 5 OUT 4 OUT 3 OUT 2 OUT 1
Status Status Status Status Status Status Status Status
0 = Bits 0 to 7, No Fault at Output.
1 = Bits 0 to 7, Output Short-to-Battery, Short-to-GND, Open Load, or TLIM.
Bits 8 to 15 will always return “0”.
Table 9. Fault operation
Serial Output (DO) Pin Reports
Overtemperature
Fault reported by serial output (DO) pin.
Overcurrent
DO pin reports short to battery/supply or overcurrent condition.
Output ON Open Load
Fault
Not reported.
Output OFF Open Load
Fault
DO pin reports output OFF open load condition only with Open Load Detection Current
enabled.DO pin will report “0” for Output OFF Open Load Fault with Open Load Detection
Current disabled.
Device Shutdowns
Overvoltage
Total device shutdown at VPWR = VPWR(OV) V. Resumes normal operation with proper voltage.
All outputs assuming the previous state upon recovery from overvoltage.
Overtemperature
Only the output experiencing an overtemperature shuts down. Output assumes previous state
upon recovery from overtemperature.
9.4 Device operation
9.4.1 Power supply
The 33879 device has been designed with ultra-low Sleep mode currents. The device
may enter Sleep mode via the EN pin or the VDD pin. In the Sleep mode (EN or VDD ≤
0.8 V), the current consumed by the VPWR pin is less than 5.0 μA. Placing the 33879 in
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Configurable Octal Serial Switch with Open Load Detect Current Disable
Sleep mode resets the internal registers to the Power-ON Reset state. The reset state is
defined as all outputs off and open load detection current disabled. To place the 33879
in the Sleep mode, either command all outputs off and apply logic low to the EN input pin
or remove power from the VDD supply pin. Prior to removing VDD from the device, it is
recommended that all control inputs from the MCU be low.
9.4.2 Paralleling of outputs
Using MOSFETs as an output switch conveniently allows the paralleling of outputs for
increased current capability. RDS(on) of MOSFETs have an inherent positive temperature
coefficient providing balanced current sharing between outputs without destructive
operation. This mode of operation may be desirable in the event the application
requires lower power dissipation or the added capability of switching higher currents.
Performance of parallel operation results in a corresponding decrease in RDS(on), while
the output OFF open load detection currents and the output current limits increase
correspondingly. Paralleling outputs from two or more different IC devices is possible, but
not recommended.
9.4.3 Fault Logic Operation
Fault logic of the 33879 device has been greatly simplified over other devices using SPI
communications. As command word one is being written into the shift register, a fault
status word is being simultaneously written out and received by the MCU. Regardless
of the configuration, with no outputs faulted and open load detection current enabled,
all status bits being received by the MCU are zero. When outputs are faulted (off state
open circuit or on state short-circuit/overtemperature), the status bits being received by
the MCU are one. The distinction between open circuit fault and short/overtemperature
is completed via the command word. For example, when a zero command bit is sent and
a one fault is received in the following word, the fault is open/short-to-battery for highside drive or open/short-to-ground for low-side drive. In the same manner, when a one
command bit is sent and a one fault is received in the following word, the fault is a shortto-ground/overtemperature for high-side drive or short-to-battery/overtemperature for
low-side drive. The timing between two write words must be greater than 300 μs to allow
adequate time to sense and report the proper fault status.
9.4.4 SPI Integrity Check
Checking the integrity of the SPI communication with the initial power-up of the VDD
and EN pins is recommended. After initial system start-up or reset, the MCU writes one
32-bit pattern to the 33879. The first 16 bits read by the MCU are 8 logic [0]s followed
by the fault status of the outputs. The second 16 bits are the same bit pattern sent by
the MCU. By the MCU receiving the same bit pattern it sent, bus integrity is confirmed.
Note the second 16-bit pattern the MCU sends to the device is the command word
and is transferred to the outputs with rising edge of CS. Important: A SCLK pulse
count strategy has been implemented to ensure integrity of SPI communications. SPI
messages consisting of 16 SCLK pulses and multiples of 8 clock pulses thereafter are
acknowledged. SPI messages consisting of other than 16 + multiples of 8 SCLK pulses
are ignored by the device.
9.4.5 Overtemperature Fault
Overtemperature detection and shutdown circuits are specifically incorporated for each
individual output. The shutdown following an overtemperature condition is independent of
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Configurable Octal Serial Switch with Open Load Detect Current Disable
the system clock or any other logic signal. Each independent output shuts down at 155 to
185 °C. When an output shuts down owing to an overtemperature fault, no other outputs
are affected. The MCU recognizes the fault by a one in the fault status register. After the
33879 device has cooled below the switch point temperature and 15 °C hysteresis, the
output activates unless otherwise told to shut down by the MCU via the SPI.
9.4.6 Overvoltage Fault
An overvoltage condition on the VPWR pin causes the device to shut down all outputs
until the overvoltage condition is removed. When the overvoltage condition is removed,
the outputs resume their previous state. This device does not detect an overvoltage on
the VDD pin. The overvoltage threshold on the VPWR pin is specified as VPWR(OV) V, with
1.0 V typical hysteresis. A VPWR overvoltage detection is global, causing all outputs to be
turned OFF.
9.4.7 Output OFF Open Load Fault
An output OFF open load fault is the detection and reporting of an open load when the
corresponding output is disabled (input bit programmed to a logic low state). The Output
OFF Open Load fault is detected by comparing the drain-to-source voltage of the specific
MOSFET output to an internally generated reference. Each output has one dedicated
comparator for this purpose. An output OFF open load fault is indicated when the drainto-source voltage is less than the output threshold voltage (VOUT(FLT-TH)) of 2.5 to 4.0
V. Hence, the 33879 declares the load open in the OFF state when the output drain-tosource voltage is less than VOUT(FLT-TH).
This device has an internal 80 μA current source connected from drain to source of the
output MOSFET. The current source may be programmed on or off via the SPI. The
Power-ON Reset state for the current source is “off” and must be enabled via the SPI. To
achieve low Sleep mode quiescent currents, the open load detection current source of
each driver is switched off when VDD or EN is removed.
During output switching, especially with capacitive loads, a false output OFF open load
fault may be triggered. To prevent this false fault from being reported, an internal fault
filter of 100 μs to 300 μs is incorporated. A false fault reporting is a function of the load
impedance, RDS(on), COUT of the MOSFET, as well as the supply voltage, VPWR. The
rising edge of CS triggers the built-in fault delay timer. The timer times out before the
fault comparator is enabled and the fault is detected. Once the condition causing the
open load fault is removed, the device resumes normal operation. The open load fault,
however, is latched in the output DO register for the MCU to read.
9.4.8 Shorted load fault
A shorted load (overcurrent) fault can be caused by any output being shorted directly to
supply, or an output experiencing a current greater than the current limit. There are two
safety circuits progressively in operation during load short conditions providing system
protection:
• The device’s output current is monitored in an analog fashion using SENSEFET
approach and current limited.
• The device’s output thermal limit is sensed and when attained causes only the specific
faulted output to shutdown. The output remains off until cooled. The device then
reasserts the output automatically. The cycle continues until fault is removed or the
command bit instructs the output off. Shorted load faults are reported properly through
the SPI regardless of open load detection current enable bits.
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Configurable Octal Serial Switch with Open Load Detect Current Disable
9.4.9 Undervoltage Shutdown
An undervoltage condition on VDD or VPWR results in the shutdown of all outputs. The
VDD undervoltage threshold is between 0.8 and 3.0 V. VPWR undervoltage threshold
is between 3.0 and 5.0 V. When the supplies fall below their respective thresholds, all
outputs are turned OFF. As both supplies returns to normal levels, internal logic is reset
and the device resumes normal operation.
9.4.10 Output voltage clamp
Each output of the 33879 incorporates an internal voltage clamp to provide fast turn-off
and transient protection of each output. Each clamp independently limits the drain-tosource voltage to 45 V for low-side drive configurations and –20 V for high-side drive
configurations. The total energy clamped (EJ) can be calculated by multiplying the
current area under the current curve (IA) times the clamp voltage (VCL). See Figure 18.
Characterization of the output clamps, using a single pulse non-repetitive method at 0.35
A, indicates the maximum energy per output to be 50 mJ at 150°C junction temperature.
Drain-to-source clamp
Voltage (VCL = 45 V)
Drain voltage
Drain current
(ID = 0.3 A)
Drain-to-source ON
Voltage (VDS(ON))
GND
Clamp energy
(EJ = IA x VCL)
Current
area (l A)
Drain-to-source ON
Voltage (VDS(ON))
Time
BAT
VS
GND
Time
Current
area (l A)
Source current
(IS = 0.3 A)
Source clamp voltage
(VCL = -15 V)
Clamp energy
(EJ = IA x VCL)
Source voltage
aaa-046255
Figure 18. Output voltage clamping
9.4.11 SPI configurations
The SPI configuration on the 33879 device is consistent with other devices in the Octal
Serial Switch (OSS) family. This device may be used in serial SPI or parallel SPI with the
33298 and 33291. Different SPI configurations may be provided. For more information,
contact NXP Analog Products Division or the local NXP representative.
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MC33879
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Configurable Octal Serial Switch with Open Load Detect Current Disable
9.4.12 Reverse battery
The 33879 has been designed with reverse battery protection on the VPWR pin. All
outputs consist of a power MOSFET with an integral substrate diode. During the reverse
battery condition, current flows through the load via the substrate diode. Under this
circumstance, relays may energize and lamps turn on. Where load reverse battery
protection is desired, a reverse battery blocking diode must be placed in series with the
load.
10 Package Dimensions
Important: For the most current revision of the package, visit www.nxp.com and perform
a keyword search using the “98ARL10543D” drawing number listed below. Dimensions
shown are provided for reference ONLY.
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Configurable Octal Serial Switch with Open Load Detect Current Disable
MC33879
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MC33879
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Configurable Octal Serial Switch with Open Load Detect Current Disable
MC33879
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Configurable Octal Serial Switch with Open Load Detect Current Disable
Figure 19. Package outline
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Configurable Octal Serial Switch with Open Load Detect Current Disable
11 Revision history
Table 10. Revision history
Document ID
Release date
Data sheet status
Change notice
Supersedes
MC33879 v.12.0
20220510
Product data sheet
202203027I
MC33879 v.11.0
Modifications
• Updated data sheet status from Technical Data to Product
• Added part 33879B
MC33879 v.11.0
11/2015
Technical data sheet
-
MC33879 v.10.0
MC33879 v.10.0
6/2012
Technical data sheet
-
MC33879 v.9.0
MC33879 v.9.0
5/2012
Technical data sheet
-
MC33879 v.8.0
MC33879 v.8.0
10/2009
Technical data sheet
-
MC33879 v.7.0
MC33879 v.7.0
8/2008
Advance Information
data sheet
-
MC33879 v.6.0
MC33879 v.6.0
6/2007
Advance Information
data sheet
-
MC33879 v.5.0
MC33879 v.5.0
2/2006
Advance Information
sheet
-
MC33879 v.4.0
MC33879
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Configurable Octal Serial Switch with Open Load Detect Current Disable
12 Legal information
12.1 Data sheet status
Document status
[1][2]
Product status
[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product
development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
[2]
[3]
Please consult the most recently issued document before initiating or completing a design.
The term 'short data sheet' is explained in section "Definitions".
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple
devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
12.2 Definitions
Draft — A draft status on a document indicates that the content is still
under internal review and subject to formal approval, which may result
in modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included in a draft version of a document and shall have no
liability for the consequences of use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is
intended for quick reference only and should not be relied upon to contain
detailed and full information. For detailed and full information see the
relevant full data sheet, which is available on request via the local NXP
Semiconductors sales office. In case of any inconsistency or conflict with the
short data sheet, the full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product
is deemed to offer functions and qualities beyond those described in the
Product data sheet.
12.3 Disclaimers
Limited warranty and liability — Information in this document is believed
to be accurate and reliable. However, NXP Semiconductors does not give
any representations or warranties, expressed or implied, as to the accuracy
or completeness of such information and shall have no liability for the
consequences of use of such information. NXP Semiconductors takes no
responsibility for the content in this document if provided by an information
source outside of NXP Semiconductors.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation lost profits, lost savings, business interruption, costs related to the removal
or replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability
towards customer for the products described herein shall be limited in
accordance with the Terms and conditions of commercial sale of NXP
Semiconductors.
Applications — Applications that are described herein for any of these
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representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their
applications and products using NXP Semiconductors products, and NXP
Semiconductors accepts no liability for any assistance with applications or
customer product design. It is customer’s sole responsibility to determine
whether the NXP Semiconductors product is suitable and fit for the
customer’s applications and products planned, as well as for the planned
application and use of customer’s third party customer(s). Customers should
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associated with their applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default
in the customer’s applications or products, or the application or use by
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necessary testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications
and the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those
given in the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
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applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
No offer to sell or license — Nothing in this document may be interpreted
or construed as an offer to sell products that is open for acceptance or
the grant, conveyance or implication of any license under any copyrights,
patents or other industrial or intellectual property rights.
Right to make changes — NXP Semiconductors reserves the right to
make changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
MC33879
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 12.0 — 10 May 2022
© 2022 NXP B.V. All rights reserved.
28 / 31
MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
Suitability for use in automotive applications — This NXP product has
been qualified for use in automotive applications. If this product is used
by customer in the development of, or for incorporation into, products or
services (a) used in safety critical applications or (b) in which failure could
lead to death, personal injury, or severe physical or environmental damage
(such products and services hereinafter referred to as “Critical Applications”),
then customer makes the ultimate design decisions regarding its products
and is solely responsible for compliance with all legal, regulatory, safety,
and security related requirements concerning its products, regardless of
any information or support that may be provided by NXP. As such, customer
assumes all risk related to use of any products in Critical Applications and
NXP and its suppliers shall not be liable for any such use by customer.
Accordingly, customer will indemnify and hold NXP harmless from any
claims, liabilities, damages and associated costs and expenses (including
attorneys’ fees) that NXP may incur related to customer’s incorporation of
any product in a Critical Application.
Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
Translations — A non-English (translated) version of a document, including
the legal information in that document, is for reference only. The English
version shall prevail in case of any discrepancy between the translated and
English versions.
MC33879
Product data sheet
Security — Customer understands that all NXP products may be subject to
unidentified vulnerabilities or may support established security standards or
specifications with known limitations. Customer is responsible for the design
and operation of its applications and products throughout their lifecycles
to reduce the effect of these vulnerabilities on customer’s applications
and products. Customer’s responsibility also extends to other open and/or
proprietary technologies supported by NXP products for use in customer’s
applications. NXP accepts no liability for any vulnerability. Customer should
regularly check security updates from NXP and follow up appropriately.
Customer shall select products with security features that best meet rules,
regulations, and standards of the intended application and make the
ultimate design decisions regarding its products and is solely responsible
for compliance with all legal, regulatory, and security related requirements
concerning its products, regardless of any information or support that may be
provided by NXP.
NXP has a Product Security Incident Response Team (PSIRT) (reachable
at PSIRT@nxp.com) that manages the investigation, reporting, and solution
release to security vulnerabilities of NXP products.
12.4 Trademarks
Notice: All referenced brands, product names, service names, and
trademarks are the property of their respective owners.
NXP — wordmark and logo are trademarks of NXP B.V.
All information provided in this document is subject to legal disclaimers.
Rev. 12.0 — 10 May 2022
© 2022 NXP B.V. All rights reserved.
29 / 31
MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
Tables
Tab. 1.
Tab. 2.
Tab. 3.
Tab. 4.
Tab. 5.
Orderable Part Variations .................................. 1
Device variations ...............................................2
Pin definitions ....................................................5
Maximum ratings ...............................................6
Static electrical characteristics .......................... 7
Tab. 6.
Tab. 7.
Tab. 8.
Tab. 9.
Tab. 10.
Dynamic electrical characteristics ................... 10
Command register definition ........................... 19
Command register definition ........................... 19
Fault operation ................................................ 19
Revision history ...............................................27
Fig. 10.
Fig. 11.
Fig. 12.
Fig. 13.
Fig. 14.
Sleep State IPWR vs. VPWR ..........................13
RDS(ON) vs. Temperature at 350 mA .............13
RDS(ON) vs. VPWR at 350 mA ...................... 14
Open Load Detection Current at Threshold .....14
Open Load Detection Threshold vs.
Temperature .................................................... 14
SPI Interface with microcontroller ....................17
33879 SPI System Daisy Chain ...................... 18
Parallel Input SPI Control ................................18
Output voltage clamping ................................. 22
Package outline ...............................................24
Figures
Fig. 1.
Fig. 2.
Fig. 3.
Fig. 4.
Fig. 5.
Fig. 6.
Fig. 7.
Fig. 8.
Fig. 9.
33879 Simplified Internal Block Diagram ...........3
33879 Simplified application diagram ................4
Pin diagram ....................................................... 5
SPI timing diagram ..........................................11
Valid Data Delay Time and Valid Time Test
Circuit .............................................................. 11
Valid data delay time and valid time
waveforms ....................................................... 11
Enable and disable time waveforms ................12
IPWR vs. Temperature .................................... 12
Sleep State IPWR vs. Temperature .................13
MC33879
Product data sheet
Fig. 15.
Fig. 16.
Fig. 17.
Fig. 18.
Fig. 19.
All information provided in this document is subject to legal disclaimers.
Rev. 12.0 — 10 May 2022
© 2022 NXP B.V. All rights reserved.
30 / 31
MC33879
NXP Semiconductors
Configurable Octal Serial Switch with Open Load Detect Current Disable
Contents
1
2
3
4
5
6
7
7.1
7.2
8
8.1
8.2
8.3
8.4
8.5
9
9.1
9.1.1
9.1.2
9.1.3
9.1.4
9.1.5
9.1.6
9.1.7
9.1.8
9.1.9
9.1.10
9.1.11
9.2
9.2.1
9.3
9.4
9.4.1
9.4.2
9.4.3
9.4.4
9.4.5
9.4.6
9.4.7
9.4.8
9.4.9
9.4.10
9.4.11
9.4.12
10
11
12
General description ............................................ 1
Features and benefits .........................................1
Ordering information .......................................... 1
Internal block diagram ........................................3
Applications .........................................................4
Simplified application diagram .......................... 4
Pin connections .................................................. 5
Pin diagram ....................................................... 5
Pin definitions .................................................... 5
Electrical characteristics ....................................6
Maximum ratings ............................................... 6
Static electrical characteristics ...........................7
Dynamic electrical characteristics ....................10
Timing diagrams .............................................. 11
Typical electrical characteristics ...................... 12
Functional description ......................................15
Functional pin description ................................15
CS Pin ............................................................. 15
SCLK Pin ......................................................... 15
DI Pin ...............................................................15
DO Pin ............................................................. 15
EN Pin ............................................................. 16
IN5 and IN6 Pins ............................................. 16
VDD Pin ...........................................................16
VPWR Pin ........................................................16
D1–D8 Pins ..................................................... 16
S1–S8 Pins ......................................................16
Exposed Pad Pin .............................................16
MCU Interface description ............................... 17
Introduction ...................................................... 17
SPI Definition ...................................................18
Device operation ..............................................19
Power supply ................................................... 19
Paralleling of outputs ....................................... 20
Fault Logic Operation ...................................... 20
SPI Integrity Check ..........................................20
Overtemperature Fault .....................................20
Overvoltage Fault ............................................ 21
Output OFF Open Load Fault ..........................21
Shorted load fault ............................................ 21
Undervoltage Shutdown .................................. 22
Output voltage clamp .......................................22
SPI configurations ............................................22
Reverse battery ............................................... 23
Package Dimensions ........................................ 23
Revision history ................................................ 27
Legal information .............................................. 28
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section 'Legal information'.
© 2022 NXP B.V.
All rights reserved.
For more information, please visit: http://www.nxp.com
Date of release: 10 May 2022
Document number: