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MW7IC2750GNR1

MW7IC2750GNR1

  • 厂商:

    NXP(恩智浦)

  • 封装:

    TO-270-14

  • 描述:

    IC PWR AMP RF 2700MHZ TO-270-14

  • 数据手册
  • 价格&库存
MW7IC2750GNR1 数据手册
Freescale Semiconductor Technical Data Document Number: MW7IC2750N Rev. 4, 10/2011 RF LDMOS Wideband Integrated Power Amplifiers The MW7IC2750N wideband integrated circuit is designed with on--chip matching that makes it usable from 2300 -- 2700 MHz. This multi -- stage structure is rated for 26 to 32 Volt operation and covers all typical cellular base station modulation formats. • Typical WiMAX Performance: VDD = 28 Volts, IDQ1 = 160 mA, IDQ2 = 550 mA, Pout = 8 Watts Avg., f = 2700 MHz, OFDM 802.16d, 64 QAM 3/4, 4 Bursts, 10 MHz Channel Bandwidth, Input Signal PAR = 9.5 dB @ 0.01% Probability on CCDF. Power Gain — 26 dB Power Added Efficiency — 17% Device Output Signal PAR — 8.6 dB @ 0.01% Probability on CCDF ACPR @ 8.5 MHz Offset — --49 dBc in 1 MHz Channel Bandwidth • Capable of Handling 10:1 VSWR, @ 32 Vdc, 2600 MHz, 80 Watts CW Output Power (3 dB Input Overdrive from Rated Pout) • Stable into a 3:1 VSWR. All Spurs Below --60 dBc @ 1 mW to 80 W CW Pout • Typical Pout @ 1 dB Compression Point ≃ 50 Watts CW Driver Applications • Typical WiMAX Performance: VDD = 28 Volts, IDQ1 = 160 mA, IDQ2 = 550 mA, Pout = 4 Watts Avg., f = 2700 MHz, OFDM 802.16d, 64 QAM 3/4, 4 Bursts, 10 MHz Channel Bandwidth, Input Signal PAR = 9.5 dB @ 0.01% Probability on CCDF. Power Gain — 26 dB Power Added Efficiency — 11% Device Output Signal PAR — 9.2 dB @ 0.01% Probability on CCDF ACPR @ 8.5 MHz Offset — --57 dBc in 1 MHz Channel Bandwidth Features • 100% PAR Tested for Guaranteed Output Power Capability • Characterized with Series Equivalent Large--Signal Impedance Parameters and Common Source S--Parameters • On--Chip Matching (50 Ohm Input, DC Blocked) • Integrated Quiescent Current Temperature Compensation with Enable/Disable Function (1) • Integrated ESD Protection • Greater Negative Gate--Source Voltage Range for Improved Class C Operation • 225°C Capable Plastic Package • In Tape and Reel. R1 Suffix = 500 Units, 44 mm Tape Width, 13 inch Reel. VDS1 RFin VGS1 VGS2 RFout/VDS2 Quiescent Current Temperature Compensation (1) MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 2500--2700 MHz, 8 W AVG., 28 V WiMAX RF LDMOS WIDEBAND INTEGRATED POWER AMPLIFIERS CASE 1618--02 TO--270 WB--14 PLASTIC MW7IC2750NR1 CASE 1621--02 TO--270 WB--14 GULL PLASTIC MW7IC2750GNR1 CASE 1617--02 TO--272 WB--14 PLASTIC MW7IC2750NBR1 VDS1 VGS2 VGS1 NC NC RFin RFin NC NC VGS1 VGS2 VDS1 1 2 3 4 5 6 7 8 9 10 11 12 14 RFout /VDS2 13 RFout /VDS2 (Top View) Note: Exposed backside of the package is the source terminal for the transistors. Figure 1. Functional Block Diagram Figure 2. Pin Connections 1. Refer to AN1977, Quiescent Current Thermal Tracking Circuit in the RF Integrated Circuit Family and to AN1987, Quiescent Current Control for the RF Integrated Circuit Device Family. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1977 or AN1987. © Freescale Semiconductor, Inc., 2008, 2010--2011. All rights reserved. RF Device Data Freescale Semiconductor, Inc. MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 1 Table 1. Maximum Ratings Symbol Value Unit Drain--Source Voltage Rating VDS --0.5, +65 Vdc Gate--Source Voltage VGS --6.0, +10 Vdc Operating Voltage VDD 32, +0 Vdc Storage Temperature Range Tstg -- 65 to +150 °C TC 150 °C Case Operating Temperature Operating Junction Temperature (1,2) Input Power TJ 225 °C Pin 30 dBm Symbol Value (2,3) Unit Table 2. Thermal Characteristics Characteristic Thermal Resistance, Junction to Case CW Application (Case Temperature 80°C, Pout = 50 W CW) Stage 1, 28 Vdc, IDQ1 = 160 mA Stage 2, 28 Vdc, IDQ2 = 550 mA RθJC Final Application (Case Temperature 70°C, Pout = 8 W CW) Stage 1, 28 Vdc, IDQ1 = 160 mA Stage 2, 28 Vdc, IDQ2 = 550 mA 2.9 0.7 Driver Application (Case Temperature 65°C, Pout = 4 W CW) Stage 1, 28 Vdc, IDQ1 = 160 mA Stage 2, 28 Vdc, IDQ2 = 550 mA 2.8 0.7 °C/W 3.0 0.7 Table 3. ESD Protection Characteristics Test Methodology Class Human Body Model (per JESD22--A114) 1C Machine Model (per EIA/JESD22--A115) A Charge Device Model (per JESD22--C101) III Table 4. Moisture Sensitivity Level Test Methodology Per JESD22--A113, IPC/JEDEC J--STD--020 Rating Package Peak Temperature Unit 3 260 °C Table 5. Electrical Characteristics (TA = 25°C unless otherwise noted) Symbol Min Typ Max Unit Zero Gate Voltage Drain Leakage Current (VDS = 65 Vdc, VGS = 0 Vdc) IDSS — — 10 μAdc Zero Gate Voltage Drain Leakage Current (VDS = 28 Vdc, VGS = 0 Vdc) IDSS — — 1 μAdc Gate--Source Leakage Current (VGS = 5 Vdc, VDS = 0 Vdc) IGSS — — 1 μAdc Gate Threshold Voltage (VDS = 10 Vdc, ID = 46 μAdc) VGS(th) 1 2 3 Vdc Gate Quiescent Voltage (VDD = 28 Vdc, IDQ1 = 160 mA, Measured in Functional Test) VGS(Q) 3 3.8 4.5 Vdc Ciss — 550 — pF Characteristic Stage 1 — Off Characteristics Stage 1 — On Characteristics Stage 1 — Dynamic Characteristics (4) Input Capacitance (VDS = 28 Vdc, VGS = 0 Vdc ± 30 mV(rms)ac @ 1 MHz) 1. Continuous use at maximum temperature will affect MTTF. 2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1955. 4. Part internally matched both on input and output. (continued) MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 2 RF Device Data Freescale Semiconductor, Inc. Table 5. Electrical Characteristics (TA = 25°C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Zero Gate Voltage Drain Leakage Current (VDS = 65 Vdc, VGS = 0 Vdc) IDSS — — 10 μAdc Zero Gate Voltage Drain Leakage Current (VDS = 28 Vdc, VGS = 0 Vdc) IDSS — — 1 μAdc Gate--Source Leakage Current (VGS = 5 Vdc, VDS = 0 Vdc) IGSS — — 1 μAdc Gate Threshold Voltage (VDS = 10 Vdc, ID = 185 μAdc) VGS(th) 1 2 3 Vdc Gate Quiescent Voltage (VDD = 28 Vdc, IDQ2 = 550 mA, Measured in Functional Test) VGS(Q) 2.8 3.6 4.3 Vdc Drain--Source On--Voltage (VGS = 10 Vdc, ID = 1 Adc) VDS(on) 0.1 0.12 0.8 Vdc Reverse Transfer Capacitance (VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc) Crss — 0.68 — pF Output Capacitance (VDS = 28 Vdc ± 30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc) Coss — 220 — pF Stage 2 — Off Characteristics Stage 2 — On Characteristics Stage 2 — Dynamic Characteristics (1) Functional Tests (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ1 = 160 mA, IDQ2 = 550 mA, Pout = 8 W Avg., f = 2700 MHz, WiMAX, OFDM 802.16d, 64 QAM 3/4, 4 Bursts, 10 MHz Channel Bandwidth, Input Signal PAR = 9.5 dB @ 0.01% Probability on CCDF. ACPR measured in 1 MHz Channel Bandwidth @ ±8.5 MHz Offset. Power Gain Gps 24 26 31 dB Power Added Efficiency PAE 15 17 — % Output Peak--to--Average Ratio @ 0.01% Probability on CCDF PAR 7.8 8.6 — dB ACPR — --49 --45 dBc IRL — --12 --10 dB Adjacent Channel Power Ratio Input Return Loss Typical Performances OFDM Signal — 10 MHz Channel Bandwidth (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ1 = 160 mA, IDQ2 = 550 mA, Pout = 8 W Avg., f = 2700 MHz, WiMAX, OFDM 802.16d, 64 QAM 3/4, 4 Bursts, 10 MHz Channel Bandwidth, Input Signal PAR = 9.5 dB @ 0.01% Probability on CCDF. Relative Constellation Error (2) Error Vector Magnitude (2) RCE — --33 — dB EVM — 2.3 — % rms Typical Performances OFDM Signal — 7 MHz Channel Bandwidth (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ1 = 160 mA, IDQ2 = 550 mA, Pout = 8 W Avg., f = 2700 MHz, WiMAX, OFDM 802.16d, 64 QAM 3/4, 4 Bursts, 7 MHz Channel Bandwidth, Input Signal PAR = 9.5 dB @ 0.01% Probability on CCDF. Mask System Type G Mask Point B at 3.5 MHz Offset Point C at 5 MHz Offset Point D at 7.4 MHz Offset Point E at 14 MHz Offset Point F at 17.5 MHz Offset dBc — — — — — --27 --40 --43 --58 --63 — — — — — Relative Constellation Error (2) RCE — --33 — dB Error Vector Magnitude (2) EVM — 2.3 — % rms 1. Part internally matched both on input and output. 2. RCE = 20Log(EVM/100) (continued) MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 3 Table 5. Electrical Characteristics (TA = 25°C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Typical Performances (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ1 = 160 mA, IDQ2 = 550 mA, 2700 MHz Bandwidth Pout @ 1 dB Compression Point, CW P1dB — 55 — — 60 — W IMD Symmetry @ 50 W PEP, Pout where IMD Third Order Intermodulation  30 dBc (Delta IMD Third Order Intermodulation between Upper and Lower Sidebands > 2 dB) IMDsym VBW Resonance Point (IMD Third Order Intermodulation Inflection Point) VBWres — 50 — MHz Gain Flatness in 200 MHz Bandwidth @ Pout = 8 W Avg. GF — 0.5 — dB Average Deviation from Linear Phase in 200 MHz Bandwidth @ Pout = 50 W CW Φ — 1.1 — ° Delay — 2.3 — ns Part--to--Part Insertion Phase Variation @ Pout = 50 W CW, f = 2600 MHz, Six Sigma Window ∆Φ — 38.7 — ° Gain Variation over Temperature (--30°C to +85°C) ∆G — 0.037 — dB/°C ∆P1dB — 0.005 — dB/°C Average Group Delay @ Pout = 50 W CW, f = 2600 MHz Output Power Variation over Temperature (--30°C to +85°C) MHz Typical Driver Performances (In Freescale Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQ1 = 160 mA, IDQ2 = 550 mA, Pout = 4 W Avg., f = 2700 MHz, WiMAX, OFDM 802.16d, 64 QAM 3/4, 4 Bursts, 10 MHz Channel Bandwidth, Input Signal PAR = 9.5 dB @ 0.01% Probability on CCDF. ACPR measured in 1 MHz Channel Bandwidth @ ±8.5 MHz Offset. Power Gain Gps — 26 — dB Power Added Efficiency PAE — 11 — % Output Peak--to--Average Ratio @ 0.01% Probability on CCDF Adjacent Channel Power Ratio Input Return Loss Relative Constellation Error @ Pout = 2.5 W Avg. (1) PAR — 9.2 — dB ACPR — --57 — dBc IRL — --13 — dB RCE — --39 — dB 1. RCE = 20Log(EVM/100) MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 4 RF Device Data Freescale Semiconductor, Inc. VDD2 VDD1 Z5 C2 RF INPUT 1 C4 Z1 NC 4 NC 5 Z3 Z2 R1 C13 Z12 3 NC 8 NC 9 10 11 12 Z4 C3 C8 14 C10 Z6 6 R2 VGG2 DUT Z7 C12 Z8 Z9 7 C1 VGG1 C6 2 C5 RF OUTPUT C15 13 C11 Quiescent Current Temperature Compensation Z11 C9 C7 Z1 Z2 Z3 Z4, Z5 Z6 Z7 Z10 0.662″ x 0.064″ Microstrip 1.530″ x 0.064″ Microstrip 0.126″ x 0.060″ Microstrip 0.771″ x 0.046″ Microstrip 0.192″ x 0.860″ Microstrip 0.280″ x 0.719″ Microstrip Z8 Z9 Z10 Z11, Z12 PCB C14 0.417″ x 0.064″ Microstrip 1.137″ x 0.064″ Microstrip 0.293″ x 0.064″ Microstrip 0.615″ x 0.095″ Microstrip Rogers RO4350B, 0.030″, εr = 3.5 Figure 3. MW7IC2750NR1(GNR1)(NBR1) Test Circuit Schematic Table 6. MW7IC2750NR1(GNR1)(NBR1) Test Circuit Component Designations and Values Part Description Part Number Manufacturer C1 0.8 pF Chip Capacitor ATC100B0R8BT500XT ATC C2, C3, C13, C14 10 μF, 50 V Chip Capacitors GRM55DR61H106KA88B Murata C4, C5, C8, C9, C15 5.1 pF Chip Capacitors ATC100B5R1CT500XT ATC C6, C7 1 μF, 100 V Chip Capacitors GRM32ER72A105KA01L Murata C10, C11 0.2 pF Chip Capacitors ATC100B0R2BT500XT ATC C12 0.5 pF Chip Capacitor ATC100B0R5BT500XT ATC R1, R2 1 kΩ, 1/4 W Chip Resistors CRCW12061001FKEA Vishay MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 5 C2 VG2 C13 VD1 C4 C8 VG1 C10 CUT OUT AREA C6 C1 MW7IC2750N Rev. 6 VG1 VG2 C7 R1 R2 C5 C15 C12 C11 C14 C9 VD1 C3 Figure 4. MW7IC2750NR1(GNR1)(NBR1) Test Circuit Component Layout MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 6 RF Device Data Freescale Semiconductor, Inc. 17 Gps, POWER GAIN (dB) 26.6 26.4 26.2 26 25.8 25.6 16 VDD = 28 Vdc, Pout = 8 W (Avg.), IDQ1 = 160 mA IDQ2 = 550 mA, OFDM 802.16d, 64 QAM 3/4, 4 Bursts, 10 MHz Channel Bandwidth, Input Signal PAR = 9.5 dB @ 0.01% Probability on CCDF 15 PARC IRL --50 --14 --51 --16 --52 25.4 --53 25.2 ACPR --54 25 2500 2525 2550 2575 2600 2625 2650 2675 --55 2700 --18 --20 --22 --24 --0.6 --0.8 --1 --1.2 --1.4 PARC (dB) 18 IRL, INPUT RETURN LOSS (dB) 26.8 19 Gps PAE ACPR (dBc) 27 PAE, POWER ADDED EFFICIENCY (%) TYPICAL CHARACTERISTICS --1.6 f, FREQUENCY (MHz) 10.5 26.4 V = 28 Vdc, P = 4 W (Avg.), I DD out DQ1 = 160 mA 3 26.2 IDQ2 = 550 mA, OFDM 802.16d, 64 QAM /4, 4 Bursts 10 MHz Channel Bandwidth, Input Signal PAR = 9.5 dB 26 @ 0.01% Probability on CCDF 9.5 --56 --13 25.8 --57 --15 25.6 25.4 25.2 8.5 PARC --58 IRL --59 --60 ACPR 25 2500 2525 2550 2575 2600 2625 2650 2675 --61 2700 --17 --19 --21 --23 0 --0.2 --0.4 --0.6 --0.8 PARC (dB) 11.5 26.6 ACPR (dBc) Gps, POWER GAIN (dB) 26.8 12.5 Gps PAE IRL, INPUT RETURN LOSS (dB) 27 PAE, POWER ADDED EFFICIENCY (%) Figure 5. WiMAX Broadband Performance @ Pout = 8 Watts Avg. --1 f, FREQUENCY (MHz) Figure 6. WiMAX Broadband Performance @ Pout = 4 Watts Avg. 29 688 mA 26 25 550 mA 412 mA 24 23 22 0.1 VDD = 28 Vdc IDQ1 = 160 mA f = 2600 MHz 275 mA 1 IDQ1 = 240 mA 28 Gps, POWER GAIN (dB) Gps, POWER GAIN (dB) 28 27 29 IDQ2 = 826 mA 10 200 mA 27 26 160 mA 25 24 23 100 120 mA 22 0.1 VDD = 28 Vdc IDQ2 = 550 mA f = 2600 MHz 80 mA 1 10 Pout, OUTPUT POWER (WATTS) CW Pout, OUTPUT POWER (WATTS) CW Figure 7. Power Gain versus Output Power @ IDQ1 = 160 mA Figure 8. Power Gain versus Output Power @ IDQ2 = 550 mA 100 MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 7 IMD, INTERMODULATION DISTORTION (dBc) TYPICAL CHARACTERISTICS 0 VDD = 28 Vdc, Pout = 53 W (PEP), IDQ1 = 160 mA IDQ2 = 550 mA, Two--Tone Measurements (f1 + f2)/2 = Center Frequency of 2600 MHz --10 --20 IM3--U --30 IM3--L --50 --60 IM5--U IM5--L --40 IM7--U IM7--L 100 10 1 TWO--TONE SPACING (MHz) 27 0 26.5 26 25.5 25 24.5 35 ACPR Gps --1 30 PAE --1 dB = 8.41 W --2 25 --2 dB = 13.08 W --3 dB = 18.16 W --3 20 PARC VDD = 28 Vdc, IDQ1 = 160 mA IDQ2 = 550 mA, f = 2600 MHz, OFDM 802.16d 64 QAM 3/4, 4 Bursts, 10 MHz Channel Bandwidth Input Signal PAR = 9.5 dB @ 0.01% Probability on CCDF --4 --5 --30 40 5 15 10 20 15 --35 --40 --45 --50 --55 --60 10 25 ACPR (dBc) 1 PAE, POWER ADDED EFICIENCY (%) 27.5 OUTPUT COMPRESSION AT 0.01% PROBABILITY ON CCDF (dB) Gps, POWER GAIN (dB) Figure 9. Intermodulation Distortion Products versus Tone Spacing 30 Pout, OUTPUT POWER (WATTS) Figure 10. Output Peak--to--Average Ratio Compression (PARC) versus Output Power VDD = 28 Vdc, IDQ1 = 160 mA, IDQ2 = 550 mA f = 2600 MHz, OFDM 802.16d, 64 QAM 3/4, 4 Bursts, 10 MHz Channel Bandwidth, Input Signal PAR = 9.5 dB @ 0.01% Probability on CCDF 40 35 30 25 TC = --40_C 20 85_C 25_C 25_C --20 85_C --25 --30 --35 Gps 25_C --40 --40_C 15 PAE 10 --15 --40_C --45 --50 ACPR --55 5 0 ACPR (dBc) PAE, POWER ADDED EFFICIENCY (%), Gps, POWER GAIN (dB) 45 1 10 70 --60 Pout, OUTPUT POWER (WATTS) AVG. WiMAX Figure 11. WiMAX, ACPR, Power Gain and Power Added Efficiency versus Output Power MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 8 RF Device Data Freescale Semiconductor, Inc. TYPICAL CHARACTERISTICS 30 10 0 10 --10 0 --20 S11 --10 --30 VDD = 28 Vdc IDQ1 = 160 mA, IDQ2 = 550 mA --20 1800 2000 2200 2400 2600 S11 (dB) S21 (dB) S21 20 2800 3000 --40 3400 3200 f, FREQUENCY (MHz) Figure 12. Broadband Frequency Response WIMAX TEST SIGNAL 100 --10 10 --20 --30 1 --40 0.1 (dB) PROBABILITY (%) Input Signal 0.01 OFDM 802.16d, 64 QAM 3/4, 4 Bursts 10 MHz Channel Bandwidth, Input Signal PAR = 9.5 dB @ 0.01% Probability on CCDF 0.001 0.0001 10 MHz Channel BW 0 2 4 6 --50 --60 --70 8 PEAK--TO--AVERAGE (dB) Figure 13. OFDM 802.16d Test Signal 10 --80 --90 --20 ACPR in 1 MHz Integrated BW --15 --10 ACPR in 1 MHz Integrated BW --5 0 5 10 15 20 f, FREQUENCY (MHz) Figure 14. WiMAX Spectrum Mask Specifications MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 9 Zo = 50 Ω f = 2500 MHz f = 2700 MHz Zin f = 2700 MHz f = 2500 MHz Zload VDD = 28 Vdc, IDQ1 = 160 mA, IDQ2 = 550 mA, Pout = 8 W Avg. f MHz Zin Ω Zload Ω 2500 49.58 + j35.82 3.52 -- j1.79 2525 50.78 + j36.71 3.46 -- j1.82 2550 52.04 + j37.58 3.37 -- j1.86 2575 53.39 + j38.45 3.24 -- j1.88 2600 54.82 + j39.30 3.09 -- j1.87 2625 56.35 + j40.14 2.94 -- j1.84 2650 57.96 + j40.95 2.77 -- j1.77 2675 59.68 + j41.74 2.60 -- j1.66 61.50 + j42.49 2.44 -- j1.56 2700 Zin = Device input impedance as measured from gate to ground. Zload = Test circuit impedance as measured from drain to ground. Output Matching Network Device Under Test Z in Z load Figure 15. Series Equivalent Source and Load Impedance MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 10 RF Device Data Freescale Semiconductor, Inc. Table 7. Common Source S--Parameters (VDD = 28 V, IDQ1 = 160 mA, IDQ2 = 550 mA, TA = 25°C, 50 Ohm System) S11 S21 S12 S22 f MHz |S11| ∠φ |S21| ∠φ |S12| ∠φ |S22| ∠φ 1500 0.754 78.5 0.001 --17.9 0.000774 17.4 0.994 174.5 1550 0.734 70.1 0.001 --118.8 0.000326 85.4 0.993 175.3 1600 0.716 61.7 0.003 --116.5 0.000392 58.7 0.998 174.6 1650 0.697 53.4 0.009 --135.3 0.000268 27.8 0.997 173.9 1700 0.677 45.1 0.024 --152.3 0.000211 --33.8 0.996 172.9 1750 0.651 36.6 0.064 --179.9 0.000309 148.0 0.991 171.7 1800 0.619 27.6 0.141 146.0 0.000599 148.7 0.981 170.3 1850 0.578 17.7 0.255 113.0 0.000732 142.6 0.970 169.0 1900 0.527 5.6 0.425 84.8 0.000734 149.1 0.957 167.3 1950 0.462 --9.3 0.701 61.4 0.000911 144.7 0.941 165.6 2000 0.392 --27.8 1.237 39.8 0.00154 174.4 0.924 163.6 2050 0.312 --51.0 2.342 15.9 0.00286 159.0 0.895 160.9 2100 0.218 --74.1 4.772 --11.8 0.00377 142.2 0.843 156.6 2150 0.139 --77.4 11.680 --51.5 0.00588 128.7 0.691 149.4 2200 0.426 --69.8 27.658 --129.7 0.00919 73.9 0.342 --169.4 2250 0.490 --123.5 21.740 150.4 0.00545 38.1 0.800 --166.9 2300 0.416 --146.4 16.087 106.5 0.00314 33.9 0.864 --174.9 2350 0.352 --160.1 13.279 71.6 0.00239 24.9 0.879 --177.0 2400 0.321 --166.6 11.654 41.9 0.00175 33.1 0.891 --177.5 2450 0.274 --173.2 10.543 13.4 0.00197 27.7 0.908 --177.4 2500 0.233 --177.6 9.748 --13.4 0.00181 34.5 0.924 --177.5 2550 0.178 179.0 8.983 --40.5 0.00204 31.5 0.943 --177.7 2600 0.123 --167.7 8.199 --65.8 0.00218 35.6 0.957 --178.0 2650 0.108 --148.8 7.452 --89.9 0.00208 33.2 0.970 --178.7 2700 0.121 --132.6 6.730 --113.1 0.00198 23.8 0.978 --179.6 2750 0.146 --119.9 6.008 --135.3 0.00191 31.0 0.985 179.4 2800 0.184 --119.9 5.323 --156.1 0.00211 23.7 0.987 178.3 2850 0.214 --121.0 4.700 --175.6 0.00159 15.5 0.987 177.3 2900 0.261 --127.6 4.109 166.0 0.00205 14.6 0.985 176.3 2950 0.316 --134.0 3.591 149.0 0.00171 19.2 0.984 175.4 3000 0.372 --141.4 3.130 133.3 0.00103 16.7 0.984 174.5 3050 0.430 --150.2 2.733 118.1 0.00095 26.4 0.984 173.8 3100 0.485 --158.9 2.388 103.6 0.00103 36.9 0.984 173.2 3150 0.534 --166.3 2.091 90.1 0.00108 24.1 0.985 172.7 3200 0.585 --172.7 1.846 77.3 0.00127 47.6 0.984 172.4 3250 0.625 --178.0 1.635 65.2 0.00119 57.1 0.986 172.1 3300 0.657 177.3 1.472 52.9 0.00132 53.2 0.985 171.9 3350 0.686 173.2 1.342 40.8 0.00200 53.8 0.985 171.7 (continued) MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 11 Table 7. Common Source S--Parameters (VDD = 28 V, IDQ1 = 160 mA, IDQ2 = 550 mA, TA = 25°C, 50 Ohm System) (continued) S11 S21 S12 S22 f MHz |S11| ∠φ |S21| ∠φ |S12| ∠φ |S22| ∠φ 3400 0.702 169.7 1.243 28.4 0.00230 54.4 0.982 171.3 3450 0.718 166.7 1.193 10.8 0.00211 62.5 0.947 170.1 3500 0.721 164.7 0.937 3.1 0.00233 24.3 0.976 173.0 3550 0.746 162.0 0.914 --7.9 0.00213 51.7 0.981 171.9 3600 0.758 158.9 0.857 --21.4 0.00236 55.6 0.978 171.1 MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 12 RF Device Data Freescale Semiconductor, Inc. 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 Ideal P3dB = 49.27 dBm (85 W) P1dB = 48.21 dBm (66 W) Actual VDD = 28 Vdc, IDQ1 = 160 mA, IDQ2 = 550 mA Pulsed CW, 10 μsec(on), 10% Duty Cycle, f = 2500 MHz 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 Pout, OUTPUT POWER (dBm) Pout, OUTPUT POWER (dBm) ALTERNATIVE PEAK TUNE LOAD PULL CHARACTERISTICS 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 P3dB = 48.62 dBm (73 W) P1dB = 47.59 dBm (57 W) Actual VDD = 28 Vdc, IDQ1 = 160 mA, IDQ2 = 550 mA Pulsed CW, 10 μsec(on), 10% Duty Cycle, f = 2700 MHz 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 Pin, INPUT POWER (dBm) Pin, INPUT POWER (dBm) NOTE: Load Pull Test Fixture Tuned for Peak P1dB Output Power @ 28 V NOTE: Load Pull Test Fixture Tuned for Peak P1dB Output Power @ 28 V Test Impedances per Compression Level P1dB Ideal Zsource Ω Zload Ω 28.46 + j5.15 1.67 -- j1.53 Figure 16. Pulsed CW Output Power versus Input Power @ 28 V @ 2500 MHz Test Impedances per Compression Level P1dB Zsource Ω Zload Ω 36.24 + j1.75 1.19 -- j1.29 Figure 17. Pulsed CW Output Power versus Input Power @ 28 V @ 2700 MHz MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 13 PACKAGE DIMENSIONS MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 14 RF Device Data Freescale Semiconductor, Inc. MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 15 MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 16 RF Device Data Freescale Semiconductor, Inc. MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 17 MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 18 RF Device Data Freescale Semiconductor, Inc. MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 19 MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 20 RF Device Data Freescale Semiconductor, Inc. MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 21 MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 22 RF Device Data Freescale Semiconductor, Inc. PRODUCT DOCUMENTATION, SOFTWARE AND TOOLS Refer to the following documents, software and tools to aid your design process. Application Notes • AN1907: Solder Reflow Attach Method for High Power RF Devices in Over--Molded Plastic Packages • AN1955: Thermal Measurement Methodology of RF Power Amplifiers • AN1977: Quiescent Current Thermal Tracking Circuit in the RF Integrated Circuit Family • AN1987: Quiescent Current Control for the RF Integrated Circuit Device Family • AN3263: Bolt Down Mounting Method for High Power RF Transistors and RFICs in Over--Molded Plastic Packages • AN3789: Clamping of High Power RF Transistors and RFICs in Over--Molded Plastic Packages Engineering Bulletins • EB212: Using Data Sheet Impedances for RF LDMOS Devices Software • Electromigration MTTF Calculator • RF High Power Model For Software and Tools, do a Part Number search at http://www.freescale.com, and select the “Part Number” link. Go to the Software & Tools tab on the part’s Product Summary page to download the respective tool. REVISION HISTORY The following table summarizes revisions to this document. Revision Date Description 0 May 2008 • Initial Release of Data Sheet 1 Oct. 2008 • Corrected footnote reference in Typical Performances OFDM Signal -- 10 MHz Bandwidth table, p. 3 • Updated Fig. 13, MTTF versus Junction Temperature, to correct a calculation error, p. 9 2 Feb. 2010 • Modified VSWR rating to show the 3 dB overdrive capability, p. 1 • Corrected maximum input power level to the tested value, from 13 dBm to 25 dBm in Maximum Ratings table, p. 2 • Fig. 3, Test Circuit Schematic, corrected Rogers RO4350B dielectric constant from 3.66 εr to 3.5 εr, p. 5 • Added AN3789, Clamping of High Power RF Transistors and RFICs in Over--Molded Plastic Packages to Product Documentation, Application Notes, p. 24 3 Mar. 2011 • Table 1, Maximum Ratings, increased Input Power from 25 dBm to 30 dBm to reflect the true capability of the device, p. 2 4 Oct. 2011 • Table 3, ESD Protection Characterization, removed the word “Minimum” after the ESD class rating. ESD ratings are characterized during new product development but are not 100% tested during production. ESD ratings provided in the data sheet are intended to be used as a guideline when handling ESD sensitive devices, p. 2 • Fig. 5, Test Circuit Schematic, corrected pin connections for pin numbers 2, 3, 10 and 11 to reflect actual pin functionality, p. 5 • Fig. 13, MTTF versus Junction Temperature removed, p. 9. Refer to the device’s MTTF Calculator available at freescale.com/RFpower. Go to Design Resources > Software and Tools. MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 RF Device Data Freescale Semiconductor, Inc. 23 How to Reach Us: Home Page: www.freescale.com Web Support: http://www.freescale.com/support USA/Europe or Locations Not Listed: Freescale Semiconductor, Inc. Technical Information Center, EL516 2100 East Elliot Road Tempe, Arizona 85284 1--800--521--6274 or +1--480--768--2130 www.freescale.com/support Europe, Middle East, and Africa: Freescale Halbleiter Deutschland GmbH Technical Information Center Schatzbogen 7 81829 Muenchen, Germany +44 1296 380 456 (English) +46 8 52200080 (English) +49 89 92103 559 (German) +33 1 69 35 48 48 (French) www.freescale.com/support Japan: Freescale Semiconductor Japan Ltd. Headquarters ARCO Tower 15F 1--8--1, Shimo--Meguro, Meguro--ku, Tokyo 153--0064 Japan 0120 191014 or +81 3 5437 9125 support.japan@freescale.com Asia/Pacific: Freescale Semiconductor China Ltd. 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Freescale Semiconductor products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the Freescale Semiconductor product could create a situation where personal injury or death may occur. Should Buyer purchase or use Freescale Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold Freescale Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that Freescale Semiconductor was negligent regarding the design or manufacture of the part. Freescalet and the Freescale logo are trademarks of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © Freescale Semiconductor, Inc. 2008, 2010--2011. All rights reserved. MW7IC2750NR1 MW7IC2750GNR1 MW7IC2750NBR1 Document Number: MW7IC2750N Rev. 4, 10/2011 24 RF Device Data Freescale Semiconductor, Inc.
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