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74LVQ74SCX

74LVQ74SCX

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    SOIC14

  • 描述:

    IC FF D-TYPE DUAL 1BIT 14SOIC

  • 数据手册
  • 价格&库存
74LVQ74SCX 数据手册
Revised June 2001 74LVQ74 Low Voltage Dual D-Type Positive Edge-Triggered Flip-Flop General Description Features The LVQ74 is a dual D-type flip-flop with Asynchronous Clear and Set inputs and complementary (Q, Q) outputs. Information at the input is transferred to the outputs on the positive edge of the clock pulse. Clock triggering occurs at a voltage level of the clock pulse and is not directly related to the transition time of the positive-going pulse. After the Clock Pulse input threshold voltage has been passed, the Data input is locked out and information present will not be transferred to the outputs until the next rising edge of the Clock Pulse input. ■ Ideal for low power/low noise 3.3V applications ■ Guaranteed simultaneous switching noise level and dynamic threshold performance ■ Guaranteed pin-to-pin skew AC performance ■ Guaranteed incident wave switching into 75Ω Asynchronous Inputs: LOW input to SD (Set) sets Q to HIGH level LOW input to CD (Clear) sets Q to LOW level Clear and Set are independent of clock Simultaneous LOW on CD and SD makes both Q and Q HIGH Ordering Code: Order Number Package Number Package Description 74LVQ74SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow 74LVQ74SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbols Connection Diagram IEEE/IEC Pin Descriptions Pin Names © 2001 Fairchild Semiconductor Corporation DS011347 Description D1 , D2 Data Inputs CP1, CP2 Clock Pulse Inputs CD1, CD2 Direct Clear Inputs SD1, SD2 Direct Set Inputs Q1, Q1, Q2, Q2 Outputs www.fairchildsemi.com 74LVQ74 Low Voltage Dual D-Type Positive Edge-Triggered Flip-Flop February 1992 74LVQ74 Truth Table Inputs Outputs SD CD CP D Q L H X X H L H L X X L H   X H H H H L L L H X Q0 Q0 L L H H H H H H X L Q H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial = LOW-to-HIGH Clock Transition Q0(Q0) = Previous Q(Q) before LOW-to-HIGH Transition of Clock  Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 Recommended Operating Conditions (Note 2) −0.5V to +7.0V Supply Voltage (VCC) DC Input Diode Current (IIK) Supply Voltage (VCC) VI = −0.5V −20 mA Input Voltage (VI) VI = VCC + 0.5V +20 mA Output Voltage (VO) DC Input Voltage (VI) −0.5V to VCC + 0.5V 0V to VCC −40°C to +85°C Minimum Input Edge Rate (∆V/∆t) VO = −0.5V −20 mA VIN from 0.8V to 2.0V VO = VCC + 0.5V +20 mA VCC @ 3.0V 125 mV/ns −0.5V to VCC + 0.5V DC Output Source Note 1: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum ratings. The “Recommended Operating Conditions” table will define the conditions for actual device operation. ±50 mA or Sink Current (IO) DC VCC or Ground Current ±200 mA (ICC or IGND) Storage Temperature (TSTG) 0V to VCC Operating Temperature (TA) DC Output Diode Current (IOK) DC Output Voltage (VO) 2.0V to 3.6V −65°C to +150°C Note 2: Unused inputs must be held HIGH or LOW. They may not float. DC Latch-Up Source or ±100 mA Sink Current DC Electrical Characteristics Symbol Parameter VIH Minimum High Level VIL Maximum Low Level VCC TA = +25°C (V) Typ 3.0 1.5 TA = −40°C to +85°C Units Conditions Guaranteed Limits 2.0 2.0 V VOUT = 0.1V or VCC − 0.1V Input Voltage VOH Minimum High Level Output Voltage VOL Maximum Low Level Output Voltage IIN Maximum Input Leakage Current 3.0 1.5 0.8 0.8 V 3.0 2.99 2.9 2.9 V 3.0 3.0 0.002 3.0 2.58 2.48 V 0.1 0.1 V 0.36 0.44 V ±0.1 3.6 ±1.0 µA IOLD Minimum Dynamic 3.6 36 mA IOHD Output Current (Note 4) 3.6 −25 mA ICC Maximum Quiescent Supply Current 3.6 2.0 20.0 µA VOUT = 0.1V or VCC − 0.1V IOUT = −50 µA VIN = VIL or VIH (Note 3) IOH = −12 mA IOUT = 50 µA VIN = VIL or VIH (Note 3) IOL = 12 mA VI = VCC, GND VOLD = 0.8V Max (Note 5) VOHD = 2.0V Min (Note 5) VIN = VCC or GND VOLP Quiet Output Maximum Dynamic VOL 3.3 0.2 0.8 V (Note 6)(Note 7) VOLV Quiet Output Minimum Dynamic VOL 3.3 −0.2 −0.8 V (Note 6)(Note 7) VIHD Maximum High Level Dynamic Input Voltage 3.3 1.7 2.0 V (Note 6)(Note 8) VILD Maximum Low Level Dynamic Input Voltage 3.3 1.6 0.8 V (Note 6)(Note 8) Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: Incident wave switching on transmission lines with impedances as low as 75Ω for commercial temperature range is guaranteed for 74LVQ. Note 6: Worst case package. Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND. Note 8: Max number of Data Inputs (n) switching. (n − 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz. 3 www.fairchildsemi.com 74LVQ74 Absolute Maximum Ratings(Note 1) 74LVQ74 AC Electrical Characteristics TA = +25°C Symbol (V) fMAX Maximum Clock Frequency tPLH tPHL tPLH tPHL tOSHL Output to Output Skew (Note 9) tOSLH Data to Output Min 50 100 40 125 95 Units Max MHz 2.7 3.5 9.6 16.9 3.5 19.0 3.3 ± 0.3 3.5 8.0 12.0 2.5 13.0 2.7 4.0 12.6 16.9 3.5 19.0 3.3 ± 0.3 4.0 10.5 12.0 3.5 13.5 2.7 4.5 9.6 19.0 4.0 23.0 3.3 ± 0.3 4.5 8.0 13.5 4.0 16.0 2.7 3.5 9.6 19.7 3.5 21.0 3.3 ± 0.3 3.5 8.0 14.0 3.5 14.5 2.7 1.0 1.5 1.5 3.3 ± 0.3 1.0 1.5 1.5 Propagation Delay CPn to Qn or Qn CL = 50 pF Max 100 Propagation Delay CPn to Qn or Qn Typ 2.7 Propagation Delay CDn or SDn to Qn Min 3.3 ± 0.3 Propagation Delay CDn or SDn to Qn TA = −40°C to +85°C CL = 50 pF VCC Parameter ns ns ns ns ns Note 9: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. AC Operating Requirements TA = +25°C Symbol tS Parameter Set-up Time, HIGH or LOW Hold Time, HIGH or LOW tH Dn to CPn tW Pulse Width tREC Recovery Time TA = −40°C to +85°C CL = 50 pF VCC (V) Typ CL = 50 pF 2.7 1.8 5.0 6.5 3.3 ± 0.3 1.5 4.0 4.5 2.7 −2.4 0.5 0.5 3.3 ± 0.3 −2.0 0.5 0.5 2.7 3.6 7.0 10.0 3.3 ± 0.3 3.0 5.5 7.0 2.7 −3.0 0 0 3.3 ± 0.3 −2.5 0 0 Capacitance Symbol Parameter Typ Units CIN Input Capacitance 4.5 pF VCC = Open CPD (Note 10) Power Dissipation Capacitance 25 pF VCC = 3.3V Note 10: CPD is measured at 10 MHz. www.fairchildsemi.com 4 Units Guaranteed Minimum Conditions ns ns ns ns 74LVQ74 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow Package Number M14A 5 www.fairchildsemi.com 74LVQ74 Low Voltage Dual D-Type Positive Edge-Triggered Flip-Flop Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com www.fairchildsemi.com 6
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