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AR0135CS2M25SUEA0-DRBR

AR0135CS2M25SUEA0-DRBR

  • 厂商:

    ONSEMI(安森美)

  • 封装:

    LBGA63

  • 描述:

    CMOS SENSOR, 1280 HORIZ PIXELS,

  • 数据手册
  • 价格&库存
AR0135CS2M25SUEA0-DRBR 数据手册
AR0135CS 1/3‐inch 1.2 Mp CMOS Digital Image Sensor with Global Shutter Description The AR0135CS from ON Semiconductor is a 1/3-inch 1.2 Mp CMOS digital image sensor with an active-pixel array of 1280 (H) × 960 (V). It is designed for low light performance and features a global shutter for accurate capture of moving scenes and synchronization with pulsed light sources. It includes sophisticated camera functions such as auto exposure control, windowing, scaling, row skip mode, and both video and single frame modes. It is programmable through a simple two-wire serial interface. The AR0135CS produces extraordinarily clear, sharp images, and its ability to capture both continuous video and single frames makes it the perfect choice for a wide range of applications, including scanning and machine vision. IBGA63 9 y 9 CASE 503AZ ORDERING INFORMATION See detailed ordering and shipping information on page 2 of this data sheet. Table 1. KEY PERFORMANCE PARAMETERS Parameter www.onsemi.com Typical Value Optical Format 1/3-inch (6 mm) Active Pixels 1280 (H) × 960 (V) = 1.2 Mp Pixel Size 3.75 mm Color Filter Array RGB Bayer, Monochrome CRA 0°, 25° Shutter Type Global Shutter Input Clock Range 6–50 MHz Output Pixel Clock (Maximum) 74.25 MHz Output Serial Parallel HiSPi 12-bit Frame Rate Full Resolution 720p 54 fps 60 fps Responsivity (Under D65 with 670 nm IRCF) RGB Bayer Monochrome 34 ke−/lux*sec 85 ke−/lux*sec SNRMAX 40.7 dB Dynamic Range 71.1 dB Supply Voltage I/O Digital Analog HiSPi 1.8 or 2.8 V 1.8 V 2.8 V 0.4 V Power Consumption < 400 mW Operating Temperature –30°C to + 70°C (Ambient) –30°C to + 80°C (Junction) Package Options 9 × 9 mm 63-pin IBGA Features • ON Semiconductor’s Next Generation • • • • • • • • • Global Shutter Technology Superior Low-light Performance HD Video (720p60) Video/Single Frame Mode Flexible Row-skip Modes On-chip AE and Statistics Engine Parallel and Serial Output Support for External LED or Flash Auto Black Level Calibration Context Switching Applications • • • • • • • • • Barcode Scanner 3D Scanning Positional Tracking Iris Scanning Augmented Reality Virtual Reality Biometrics Machine Vision Gesture Control Bare Die © Semiconductor Components Industries, LLC, 2016 July, 2016 − Rev. 4 1 Publication Order Number: AR0135CS/D AR0135CS ORDERING INFORMATION Table 2. ORDERABLE PART NUMBERS Part Number Description Orderable Product Attribute Description AR0135CS2M00SUD20 Mono, 0° CRA, Bare Die AR0135CS2M00SUEA0−DPBR Mono, 0° CRA, IBGA Dry Pack with Protective Film, Double Side BBAR Glass AR0135CS2M00SUEA0−DPBR1 Mono, 0° CRA, IBGA Dry Pack with Protective Film, Double Side BBAR Glass, MPQ = 260 AR0135CS2M00SUEA0−DRBR Mono, 0° CRA, IBGA Dry Pack without Protective Film, Double Side BBAR Glass AR0135CS2M00SUEA0−DRBR1 Mono, 0° CRA, IBGA Dry Pack without Protective Film, Double Side BBAR Glass, MPQ = 260 AR0135CS2M00SUEA0−TPBR Mono, 0° CRA, IBGA Tape & Reel with Protective Film, Double Side BBAR Glass AR0135CS2M00SUEA0−TRBR Mono, 0° CRA, IBGA Tape & Reel without Protective Film, Double Side BBAR Glass AR0135CS2M00SUEAH3−GEVB Mono, 0° CRA, Head Board AR0135CS2M25SUD20 Mono, 25° CRA, Die AR0135CS2M25SUEA0−DPBR Mono, 25° CRA, IBGA Dry Pack with Protective Film, Double Side BBAR Glass AR0135CS2M25SUEA0−DPBR1 Mono, 25° CRA, IBGA Dry Pack with Protective Film, Double Side BBAR Glass, MPQ = 260 AR0135CS2M25SUEA0−DRBR Mono, 25° CRA, IBGA Dry Pack without Protective Film, Double Side BBAR Glass AR0135CS2M25SUEA0−DRBR1 Mono, 25° CRA, IBGA Dry Pack without Protective Film, Double Side BBAR Glass, MPQ = 260 AR0135CS2M25SUEA0−TPBR Mono, 25° CRA, IBGA Tape & Reel with Protective Film, Double Side BBAR Glass AR0135CS2M25SUEA0−TRBR Mono, 25° CRA, IBGA Tape & Reel without Protective Film, Double Side BBAR Glass AR0135CS2M25SUEAH3−GEVB Mono, 25° CRA, Head Board AR0135CS2C00SUD20 Color, 0° CRA, Die AR0135CS2C00SUEA0−DPBR Color, 0° CRA, IBGA Dry Pack with Protective Film, Double Side BBAR Glass AR0135CS2C00SUEA0−DPBR1 Color, 0° CRA, IBGA Dry Pack with Protective Film, Double Side BBAR Glass, MPQ = 260 AR0135CS2C00SUEA0−DRBR Color, 0° CRA, IBGA Dry Pack without Protective Film, Double Side BBAR Glass AR0135CS2C00SUEA0−DRBR1 Color, 0° CRA, IBGA Dry Pack without Protective Film, Double Side BBAR Glass, MPQ = 260 AR0135CS2C00SUEA0−TPBR Color, 0° CRA, IBGA Tape and Reel with Protective Film, Double Side BBAR Glass AR0135CS2C00SUEA0−TRBR Color, 0° CRA, IBGA Tape and Reel without Protective Film, Double Side BBAR Glass AR0135CS2C00SUEAH3−GEVB Color, 0° CRA, Head Board GENERAL DESCRIPTION The AR0135CS from ON Semiconductor can be operated in its default mode or programmed for frame size, exposure, gain, and other parameters. The default mode output is a full-resolution image at 54 frames per second (fps). It outputs 12-bit raw data, using either the parallel or serial (HiSPi) output ports. The device may be operated in video (master) mode or in frame trigger mode. FRAME_VALID and LINE_VALID signals are output on dedicated pins, along with a synchronized pixel clock. A dedicated FLASH pin can be programmed to control external LED or flash exposure illumination. The AR0135CS includes additional features to allow application-specific tuning: windowing, adjustable autoexposure control, auto black level correction, on-board temperature sensor, and row skip and digital binning modes. The sensor is designed to operate in a wide temperature range (–30°C to +80°C). www.onsemi.com 2 AR0135CS FUNCTIONAL OVERVIEW The AR0135CS is a progressive-scan sensor that generates a stream of pixel data at a constant frame rate. It uses an on-chip, phase-locked loop (PLL) that can be optionally enabled to generate all internal clocks from a single master input clock running between 6 and 50 MHz. The maximum output pixel rate is 74.25 Mp/s, corresponding to a clock rate of 74.25 MHz. Figure 1 shows a block diagram of the sensor. Temperature Sensor Power Active Pixel Sensor (APS) Array OTPM Timing and Control (Sequencer) Memory PLL External Clock Auto Exposure and Stats Engine Signal Output Trigger Two-wire Serial Interface Pixel Data Path (Signal Processing) Analog Processing and A/D Conversion Parallel Output Flash Control Registers Figure 1. Block Diagram User interaction with the sensor is through the two-wire serial bus, which communicates with the array control, analog signal chain, and digital signal chain. The core of the sensor is a 1.2 Mp Active-Pixel Sensor array. The AR0135CS features global shutter technology for accurate capture of moving images. The exposure of the entire array is controlled by programming the integration time by register setting. All rows simultaneously integrate light prior to readout. Once a row has been read, the data from the columns is sequenced through an analog signal chain (providing offset correction and gain), and then through an analog-to-digital converter (ADC). The output from the ADC is a 12-bit value for each pixel in the array. The ADC output passes through a digital processing signal chain (which provides further data path corrections and applies digital gain). The pixel data are output at a rate of up to 74.25 Mp/s, in parallel to frame and line synchronization signals. • • • • FEATURES OVERVIEW The AR0135CS Global Sensor shutter has a wide array of features to enhance functionality and to increase versatility. A summary of features follows. Please refer to the AR0135CS Developer Guide for detailed feature descriptions, register settings, and tuning guidelines and recommendations. • Operating Modes The AR0135CS works in master (video), trigger (single frame), or Auto Trigger modes. In master mode, the sensor generates the integration and readout timing. In trigger mode, it accepts an external trigger to start exposure, then generates the exposure and readout • • timing. The exposure time is programmed through the two-wire serial interface for both modes. Trigger mode is not compatible with the HiSPi interface. Window Control Configurable window size and blanking times allow a wide range of resolutions and frame rates. Digital binning and skipping modes are supported, as are vertical and horizontal mirror operations. Context Switching Context switching may be used to rapidly switch between two sets of register values. Refer to the AR0135CS Developer Guide for a complete set of context switchable registers. Gain The AR0135CS Global Shutter sensor can be configured for analog gain of up to 8x, and digital gain of up to 8x. Automatic Exposure Control The integrated automatic exposure control may be used to ensure optimal settings of exposure and gain are computed and updated every other frame. Refer to the AR0135CS Developer Guide for more details. HiSPi The AR0135CS Global Shutter image sensor supports two or three lanes of Packetized-SP protocols of ON Semiconductor’s High-Speed Serial Pixel Interface. PLL An on chip PLL provides reference clock flexibility and supports spread spectrum sources for improved EMI performance. www.onsemi.com 3 AR0135CS • Reset • • • • • Pixel Array Structure The AR0135CS pixel array is configured as 1412 columns by 1028 rows, (see Figure 2). The dark pixels are optically black and are used internally to monitor black level. Of the right 108 columns, 64 are dark pixels used for row noise correction. Of the top 24 rows of pixels, 12 of the dark rows are used for black level correction. There are 1288 columns by 972 rows of optically active pixels that can be readable. While the sensor’s format is 1280 × 960, the additional active columns and active rows are included for use when horizontal or vertical mirrored readout is enabled, to allow readout to start on the same pixel. The active area is surrounded with optically transparent dummy pixels to improve image uniformity within the active area. Not all dummy pixels or barrier pixels can be read out. The optical center of the readable active pixels can be found between X_ADDR 643 and 644, and between Y_ADDR 485 and 486. 1412 2 Extra Active + 2 Light Dummy + 4 Barrier + 100 Dark + 4 Barrier 4 Extra Active + 2 Light Dummy + 4 Barrier + 24 Dark + 10 Barrier 1028 • PIXEL DATA FORMAT The AR0135CS may be reset by a register write, or by a dedicated input pin. Output Enable The AR0135CS output pins may be tri-stated using a dedicated output enable pin. Temperature Sensor The temperature sensor is only guaranteed to be functional when the AR0135CS is initially powered-up or is reset at temperatures at or above 0°C. Black Level Correction Row Noise Correction Column Correction Test Patterns Several test patterns may be enabled for debug purposes. These include a solid color, color bar, fade to grey, and a walking 1s test pattern. 1288 × 972 (Readable Active Pixel) 4.83 × 3.645 mm2 6 Extra Active + 2 Light Dummy + 4 Barrier Dark Pixel 2 Light Dummy + 10 Barrier Barrier Pixel Light Dummy Pixel Figure 2. Pixel Array Description www.onsemi.com 4 Extra Active Pixel Readable Active Pixel AR0135CS … Column Readout Direction Row Readout Direction Active Pixel (0, 0) Array Pixel (112, 44) C C C C C C C C C C C C C C C C … C C C C C C C C C C C C C C C C C C C C C C C C C C C C C C C C Figure 3. Pixel Mono Pattern Detail (Top Right Corner) … Column Readout Direction Row Readout Direction Active Pixel (0, 0) Array Pixel (112, 44) … R G R G R G R G G B G B G B G B R G R G R G R G G B G B G B G B R G R G R G R G G B G B G B G B Figure 4. Pixel Color Pattern Detail (Top Right Corner) Default Readout Order By convention, the sensor core pixel array is shown with the first addressable (logical) pixel (0,0) in the top right corner (see Figure 3). This reflects the actual layout of the array on the die. Also, the physical location of the first pixel data read out of the sensor in default condition is that of pixel (112, 44). www.onsemi.com 5 AR0135CS 1.5 kW2, 3 1.5 kW2 CONFIGURATION AND PINOUT The figures and tables below show a typical configuration for the AR0135CS image sensor and show the package pinouts. Digital I/O Power1 Digital Core Power1 HiSPi Power1 PLL Power1 Analog Power1 Analog Power1 VDD_IO VDD VDD_SLVS VDD_PLL VAA VAA_PIX SLVS0_P SLVS0_N SLVS1_P Master Clock (6−50 MHz) EXTCLK SLVS1_N SLVS2_P SLVS2_N SDATA SCLK From Controller To Controller SLVS3_P SLVS3_N OE_BAR STANDBY RESET_BAR SLVSC_P SLVSC_N FLASH TEST VDD_IO VDD DGND AGND Digital Ground Analog Ground VDD_SLVS VDD_PLL VAA VAA_PIX Notes: 1. All power supplies must be adequately decoupled. 2. ON Semiconductor recommends a resistor value of 1.5 kW, but a greater value may be used for slower two-wire speed. 3. This pull-up resistor is not required if the controller drives a valid logic level on SCLK at all times. 4. The parallel interface output pads can be left unconnected if the serial output interface is used. 5. ON Semiconductor recommends that 0.1 mF and 10 mF decoupling capacitors for each power supply are mounted as close as possible to the pad. Actual values and results may vary depending on the layout and design considerations. Refer to the AR0135CS demo headboard schematics for circuit recommendations. 6. ON Semiconductor recommends that analog power planes are placed in a manner such that coupling with the digital power planes is minimized. 7. Although 4 serial lanes are shown, the AR0135CS supports only 2- or 3-lane HiSPi. Figure 5. Serial 4-lane HiSPi Interface www.onsemi.com 6 1.5 kW2, 3 1.5 kW2 AR0135CS Master Clock (6−50 MHz) Digital I/O Power1 Digital Core Power1 PLL Power1 Analog Power1 Analog Power1 VDD_IO VDD VDD_PLL VAA VAA_PIX DOUT[11:0] EXTCLK PIXCLK SDATA SCLK From Controller LINE_VALID To Controller FRAME_VALID TRIGGER OE_BAR STANDBY FLASH RESET_BAR TEST VDD_IO VDD DGND AGND Digital Ground Analog Ground VDD_PLL VAA VAA_PIX Notes: 1. All power supplies must be adequately decoupled. 2. ON Semiconductor recommends a resistor value of 1.5 kW, but a greater value may be used for slower two-wire speed. 3. This pull-up resistor is not required if the controller drives a valid logic level on SCLK at all times. 4. The serial interface output pads can be left unconnected if the parallel output interface is used. 5. ON Semiconductor recommends that 0.1 mF and 10 mF decoupling capacitors for each power supply are mounted as close as possible to the pad. Actual values and results may vary depending on the layout and design considerations. Refer to the AR0135CS demo headboard schematics for circuit recommendations. 6. ON Semiconductor recommends that analog power planes are placed in a manner such that coupling with the digital power planes is minimized. Figure 6. Parallel Pixel Data Interface www.onsemi.com 7 AR0135CS 1 A 2 3 4 5 6 7 8 SLVS0N SLVS0P SLVS1N SLVS1P VDD VDD STANDBY B VDD_PLL SLVSCN SLVSCP SLVS2N SLVS2P VDD VAA VAA C EXTCLK VDD_SLVS (SLVS3N) (SLVS3P) DGND VDD AGND AGND D SADDR SCLK SDATA DGND DGND VDD VAA_PIX VAA_PIX E LINE_ VALID FRAME_ VALID PIXCLK FLASH DGND VDD_IO RESERVED RESERVED F DOUT8 DOUT9 DOUT10 DOUT11 DGND VDD_IO TEST RESERVED G DOUT4 DOUT5 DOUT6 DOUT7 DGND VDD_IO TRIGGER OE_BAR H DOUT0 DOUT1 DOUT2 DOUT3 DGND VDD_IO VDD_IO RESET_ BAR Top View (Ball Down) Figure 7. 9 y 9 mm 60-ball IBGA Package Table 3. PIN DESCRIPTIONS − 63-BALL IBGA PACKAGE Name IBGA Pin Type Description SLVS0_N A2 Output HiSPi serial data, lane 0, differential N SLVS0_P A3 Output HiSPi serial data, lane 0, differential P SLVS1_N A4 Output HiSPi serial data, lane 1, differential N SLVS1_P A5 Output HiSPi serial data, lane 1, differential P STANDBY A8 Input VDD_PLL B1 Power PLL power SLVSC_N B2 Output HiSPi serial DDR clock differential N Standby-mode enable pin (active HIGH) www.onsemi.com 8 AR0135CS Table 3. PIN DESCRIPTIONS − 63-BALL IBGA PACKAGE (continued) Name IBGA Pin Type Description SLVSC_P B3 Output HiSPi serial DDR clock differential P SLVS2_N B4 Output HiSPi serial data, lane 2, differential N SLVS2_P B5 Output HiSPi serial data, lane 2, differential P VAA B7, B8 Power Analog power EXTCLK C1 Input VDD_SLVS C2 Power HiSPi power (may leave unconnected if parallel interface is used) SLVS3_N C3 Output (Unsupported) HiSPi serial data, lane 3, differential N SLVS3_P C4 Output (Unsupported) HiSPi serial data, lane 3, differential P DGND C5, D4, D5, E5, F5, G5, H5 Power Digital GND VDD A6, A7, B6, C6, D6 Power Digital power AGND C7, C8 Power Analog GND SADDR D1 Input Two-wire serial address select SCLK D2 Input Two-wire serial clock input External input clock SDATA D3 I/O VAA_PIX D7, D8 Power Two-wire serial data I/O Pixel power LINE_VALID E1 Output Asserted when DOUT line data is valid FRAME_VALID E2 Output Asserted when DOUT frame data is valid PIXCLK E3 Output Pixel clock out. DOUT is valid on rising edge of this clock FLASH E4 Output Control signal to drive external light sources VDD_IO E6, F6, G6, H6, H7 Power I/O supply power DOUT8 F1 Output Parallel pixel data output DOUT9 F2 Output Parallel pixel data output DOUT10 F3 Output Parallel pixel data output DOUT11 F4 Output Parallel pixel data output (MSB) TEST F7 Input DOUT4 G1 Output Parallel pixel data output DOUT5 G2 Output Parallel pixel data output DOUT6 G3 Output Parallel pixel data output DOUT7 G4 Output Parallel pixel data output TRIGGER G7 Input Exposure synchronization input. (Connect to DGND if HiSPi interface is used) OE_BAR G8 Input Output enable (active LOW) DOUT0 H1 Output Parallel pixel data output (LSB) DOUT1 H2 Output Parallel pixel data output DOUT2 H3 Output Parallel pixel data output Parallel pixel data output Manufacturing test enable pin (connect to DGND) DOUT3 H4 Output RESET_BAR H8 Input Asynchronous reset (active LOW). All settings are restored to factory default Reserved E7, E8, F8 N/A Reserved (do not connect) www.onsemi.com 9 AR0135CS TWO-WIRE SERIAL REGISTER INTERFACE The two-wire serial interface bus enables read/write access to control and status registers within the AR0135CS. The interface protocol uses a master/slave model in which a master controls one or more slave devices. The sensor acts as a slave device. The master generates a clock (SCLK) that is an input to the sensor and is used to synchronize transfers. Data is transferred between the master and the slave on a bidirectional signal (SDATA). SDATA is pulled up to VDD_IO off-chip by a 1.5 kW resistor. Either the slave or master device can drive SDATA LOW − the interface protocol determines which device is allowed to drive SDATA at any given time. The protocols described in the two-wire serial interface specification allow the slave device to drive SCLK LOW; the AR0135CS uses SCLK as an input only and therefore never drives it LOW. default slave addresses used by the AR0135CS are 0x20 (write address) and 0x21 (read address) in accordance with the specification. Alternate slave addresses of 0x30 (write address) and 0x31 (read address) can be selected by enabling and asserting the SADDR input. An alternate slave address can also be programmed through R0x31FC. Message Byte Message bytes are used for sending register addresses and register write data to the slave device and for retrieving register read data. Acknowledge Bit Each 8-bit data transfer is followed by an acknowledge bit or a no-acknowledge bit in the SCLK clock period following the data transfer. The transmitter (which is the master when writing, or the slave when reading) releases SDATA. The receiver indicates an acknowledge bit by driving SDATA LOW. As for data transfers, SDATA can change when SCLK is LOW and must be stable while SCLK is HIGH. Protocol Data transfers on the two-wire serial interface bus are performed by a sequence of low-level protocol elements: 1. a (repeated) start condition 2. a slave address/data direction byte 3. an (a no) acknowledge bit 4. a message byte 5. a stop condition No-Acknowledge Bit The no-acknowledge bit is generated when the receiver does not drive SDATA LOW during the SCLK clock period following a data transfer. A no-acknowledge bit is used to terminate a read sequence. The bus is idle when both SCLK and SDATA are HIGH. Control of the bus is initiated with a start condition, and the bus is released with a stop condition. Only the master can generate the start and stop conditions. Typical Sequence A typical READ or WRITE sequence begins by the master generating a start condition on the bus. After the start condition, the master sends the 8-bit slave address/data direction byte. The last bit indicates whether the request is for a read or a write, where a “0” indicates a write and a “1” indicates a read. If the address matches the address of the slave device, the slave device acknowledges receipt of the address by generating an acknowledge bit on the bus. If the request was a WRITE, the master then transfers the 16-bit register address to which the WRITE should take place. This transfer takes place as two 8-bit sequences and the slave sends an acknowledge bit after each sequence to indicate that the byte has been received. The master then transfers the data as an 8-bit sequence; the slave sends an acknowledge bit at the end of the sequence. The master stops writing by generating a (re)start or stop condition. If the request was a READ, the master sends the 8-bit write slave address/data direction byte and 16-bit register address, the same way as with a WRITE request. The master then generates a (re)start condition and the 8-bit read slave address/data direction byte, and clocks out the register data, eight bits at a time. The master generates an acknowledge bit after each 8-bit transfer. The slave’s internal register address is automatically incremented after every 8 bits are transferred. The data transfer is stopped when the master sends a no-acknowledge bit. Start Condition A start condition is defined as a HIGH-to-LOW transition on SDATA while SCLK is HIGH. At the end of a transfer, the master can generate a start condition without previously generating a stop condition; this is known as a “repeated start” or “restart” condition. Stop Condition A stop condition is defined as a LOW-to-HIGH transition on SDATA while SCLK is HIGH. Data Transfer Data is transferred serially, 8 bits at a time, with the MSB transmitted first. Each byte of data is followed by an acknowledge bit or a no-acknowledge bit. This data transfer mechanism is used for the slave address/data direction byte and for message bytes. One data bit is transferred during each SCLK clock period. SDATA can change when SCLK is LOW and must be stable while SCLK is HIGH. Slave Address/Data Direction Byte Bits [7:1] of this byte represent the device slave address and bit [0] indicates the data transfer direction. A “0” in bit [0] indicates a WRITE, and a “1” indicates a READ. The www.onsemi.com 10 AR0135CS Single READ from Random Location This sequence (Figure 8) starts with a dummy WRITE to the 16-bit address that is to be used for the READ. The master terminates the WRITE by generating a restart condition. The master then sends the 8-bit read slave address/data direction byte and clocks out one byte of register data. The master terminates the READ by generating a no-acknowledge bit followed by a stop condition. Figure 8 shows how the internal register address maintained by the AR0135CS is loaded and incremented as the sequence proceeds. Previous Reg Address, N S Slave Address 0 A S = Start Condition P = Stop Condition Sr = Restart Condition A = Acknowledge A = No-acknowledge Reg Address[15:8] Reg Address, M Reg Address[7:0] A A Sr Slave Address 1 A M+1 Read Data A P Slave to Master Master to Slave Figure 8. Single READ from Random Location Single READ from Current Location The master terminates the READ by generating a no-acknowledge bit followed by a stop condition. The figure shows two independent READ sequences. This sequence (Figure 9) performs a read using the current value of the AR0135CS internal register address. Previous Reg Address, N S Slave Address 1 A Reg Address, N+1 A P Read Data S Slave Address N+2 1 A Read Data A P Figure 9. Single READ from Current Location Sequential READ, Start from Random Location This sequence (Figure 10) starts in the same way as the single READ from random location (Figure 8). Instead of generating a no-acknowledge bit after the first byte of data has been transferred, the master generates an acknowledge bit and continues to perform byte READs until “L” bytes have been read. Previous Reg Address, N S Slave Address 0 A Reg Address[15:8] M+1 Read Data A Reg Address[7:0] M+2 A Read Data Reg Address, M M+3 A Sr Slave Address M+L−2 A Read Data 1 A M+L−1 A Read Data Figure 10. Sequential READ, Start from Random Location www.onsemi.com 11 M+1 Read Data M+L A P A AR0135CS Sequential READ, Start from Current Location This sequence (Figure 11) starts in the same way as the single READ from current location (Figure 9). Instead of generating a no-acknowledge bit after the first byte of data Previous Reg Address, N S Slave Address 1 A has been transferred, the master generates an acknowledge bit and continues to perform byte READs until “L” bytes have been read. N+1 Read Data A N+2 Read Data A N+L−1 Read Data A N+L Read Data A P Figure 11. Sequential READ, Start from Current Location Single WRITE to Random Location then LOW bytes of the register address that is to be written. The master follows this with the byte of write data. The WRITE is terminated by the master generating a stop condition. This sequence (Figure 12) begins with the master generating a start condition. The slave address/data direction byte signals a WRITE and is followed by the HIGH Previous Reg Address, N S Slave Address 0 A Reg Address[15:8] Reg Address, M A A Reg Address[7:0] M+1 A A Write Data P Figure 12. Single WRITE to Random Location Sequential WRITE, Start at Random Location has been transferred, the master generates an acknowledge bit and continues to perform byte WRITEs until “L” bytes have been written. The WRITE is terminated by the master generating a stop condition. This sequence (Figure 13) starts in the same way as the single WRITE to random location (Figure 12). Instead of generating a no-acknowledge bit after the first byte of data Previous Reg Address, N S Slave Address 0 A M+1 Write Data Reg Address[15:8] A M+2 A Write Data Reg Address, M Reg Address[7:0] M+3 A Write Data M+L−2 A Write Data 12 A M+L−1 A Figure 13. Sequential WRITE, Start at Random Location www.onsemi.com M+1 Write Data M+L A A P AR0135CS ELECTRICAL SPECIFICATIONS Two-Wire Serial Register Interface Unless otherwise stated, the following specifications apply to the following conditions: VDD = 1.8 V –0.10/+0.15; VDD_IO = VDD_PLL = VAA = VAA_PIX = 2.8 V ±0.30; VDD_SLVS = 0.4 V –0.1/+0.2; TA = −30°C to +70°C; output load = 10 pF; PIXCLK frequency = 74.25 MHz; HiSPi off. The electrical characteristics of the two-wire serial register interface (SCLK, SDATA) are shown in Figure 14 and Table 4. SDATA tLOW tf tSU;DAT tr tf tHD;STA tBUF tr SCLK tSU;STA tHD;STA tHD;DAT S NOTE: tHIGH tSU;STO Sr P S Read sequence: For an 8-bit READ, read waveforms start after WRITE command and register address are issued. Figure 14. Two-Wire Serial Bus Timing Parameters Table 4. TWO-WIRE SERIAL BUS CHARACTERISTICS (fEXTCLK = 27 MHz; VDD = 1.8 V; VDD_IO = 2.8 V; VAA = 2.8 V; VAA_PIX = 2.8 V; VDD_PLL = 2.8 V; VDD_DAC = 2.8 V; TA = 25°C) Standard Mode Fast-Mode Symbol Min Max Min Max Unit tSCL 0 100 0 400 kHz After this Period, the First Clock Pulse is Generated tHD;STA 4.0 − 0.6 − ms LOW Period of the SCLK Clock tLOW 4.7 − 1.3 − ms HIGH Period of the SCLK Clock tHIGH 4.0 − 0.6 − ms Set-up Time for a Repeated START Condition tSU;STA 4.7 − 0.6 − ms Data Hold Time tHD;DAT 0 (Note 4) 3.45 (Note 5) 0 (Note 6) 0.9 (Note 5) ms Data Set-up Time tSU;DAT 250 − 100 (Note 6) − ns Rise Time of both SDATA and SCLK Signals tr − 1000 20 + 0.1Cb (Note 7) 300 ns Fall Time of both SDATA and SCLK Signals tf − 300 20 + 0.1Cb (Note 7) 300 ns Set-up Time for STOP Condition tSU;STO 4.0 − 0.6 − ms Bus Free Time between a STOP and START Condition tBUF 4.7 − 1.3 − ms Cb − 400 − 400 pF CIN_SI − 3.3 − 3.3 pF Parameter SCLK Clock Frequency Hold Time (Repeated) START Condition Capacitive Load for each Bus Line Serial Interface Input Pin Capacitance www.onsemi.com 13 AR0135CS Table 4. TWO-WIRE SERIAL BUS CHARACTERISTICS (continued) (fEXTCLK = 27 MHz; VDD = 1.8 V; VDD_IO = 2.8 V; VAA = 2.8 V; VAA_PIX = 2.8 V; VDD_PLL = 2.8 V; VDD_DAC = 2.8 V; TA = 25°C) Standard Mode Parameter SDATA Max Load Capacitance Fast-Mode Symbol Min Max Min Max Unit CLOAD_SD − 30 − 30 pF RSD 1.5 4.7 1.5 4.7 kW SDATA Pull-up Resistor I2C 1. 2. 3. 4. 5. 6. This table is based on standard (v2.1 January 2000). Philips Semiconductor. Two-wire control is I2C-compatible. All values referred to VIHmin = 0.9 VDD_IO and VILmax = 0.1 VDD_IO levels. Sensor EXCLK = 27 MHz. A device must internally provide a hold time of at least 300 ns for the SDATA signal to bridge the undefined region of the falling edge of SCLK. The maximum tHD;DAT has only to be met if the device does not stretch the LOW period (tLOW) of the SCLK signal. A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system, but the requirement tSU;DAT 250 ns must then be met. This will automatically be the case if the device does not stretch the LOW period of the SCLK signal. If such a device does stretch the LOW period of the SCLK signal, it must output the next data bit to the SDATA line tr max + tSU;DAT = 1000 + 250 = 1250 ns (according to the Standard-mode I2C-bus specification) before the SCLK line is released. 7. Cb = total capacitance of one bus line in pF. I/O Timing By default, the AR0135CS launches pixel data, FV and LV with the falling edge of PIXCLK. The expectation is that the user captures DOUT[11:0], FV and LV using the rising tR edge of PIXCLK. The launch edge of PIXCLK can be configured in register R0x3028. See Figure 15 and Table 5 for I/O timing (AC) characteristics. tF 90% tRP tFP 90% 10% 90% 10% 10% 90% 10% tEXTCLK EXTCLK PIXCLK tPD Data[11:0] Pxl_0 Pxl_1 Pxl_2 Pxl_n tPFL tPLL tPLH tPFH LINE_VALID/ FRAME_VALID FRAME_VALID Leads LINE_VALID by 6 PIXCLKs FRAME_VALID Trails LINE_VALID by 6 PIXCLKs Figure 15. I/O Timing Diagram Table 5. I/O TIMING CHARACTERISTICS, PARALLEL OUTPUT (1.8 V VDD_IO) (Note 1) Symbol Definition Condition Min Typ Max Unit fEXTCLK Input Clock Frequency 6 − 50 MHz tEXTCLK Input Clock Period 20 − 166 ns − ns tR Input Clock Rise Time PLL Enabled − 3 tF Input Clock Fall Time PLL Enabled − 3 − ns − − 600 ns tjJITTER Input Clock Jitter tcp EXTCLK to PIXCLK Propagation Delay Nominal Voltages, PLL Disabled, PIXCLK Slew Rate = 4 5.7 − 14.3 ns tRP PIXCLK Rise Time PCLK Slew Rate = 6 1.3 − 4.0 ns tFP PIXCLK Fall Time PCLK Slew Rate = 6 1.3 − 3.9 ns 40 50 60 % PIXCLK Duty Cycle fPIXCLK tPD PIXCLK Frequency PIXCLK Slew Rate = 6, Data Slew Rate = 7 6 − 74.25 MHz PIXCLK to Data Valid PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 − 2 ns www.onsemi.com 14 AR0135CS Table 5. I/O TIMING CHARACTERISTICS, PARALLEL OUTPUT (1.8 V VDD_IO) (Note 1) (continued) Symbol Definition Condition Min Typ Max Unit tPFH PIXCLK to FV HIGH PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 − 2 ns tPLH PIXCLK to LV HIGH PIXCLK Slew Rate = 6, Data Slew Rate = 7 −3 − 1.5 ns tPFL PIXCLK to FV LOW PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 − 2 ns tPLL PIXCLK to LV LOW PIXCLK Slew Rate = 6, Data Slew Rate = 7 −3 − 1.5 ns CIN Input Pin Capacitance − 2.5 − pF 1. Minimum and maximum values are taken at 70°C, 1.7 V and −30°C, 1.95 V. All values are taken at the 50% transition point. The loading used is 10 pF. 2. Jitter from PIXCLK is already taken into account in the data for all of the output parameters. Table 6. I/O TIMING CHARACTERISTICS, PARALLEL OUTPUT (2.8 V VDD_IO) (Note 1) Symbol Min Typ Max Unit fEXTCLK Input Clock Frequency Definition Condition 6 − 50 MHz tEXTCLK Input Clock Period 20 − 166 ns − ns tR Input Clock Rise Time PLL Enabled − 3 tF Input Clock Fall Time PLL Enabled − 3 − ns − − 600 ns tjJITTER Input Clock Jitter tcp EXTCLK to PIXCLK Propagation Delay Nominal Voltages, PLL Disabled, PIXCLK Slew Rate = 4 5.3 − 13.4 ns tRP PIXCLK Rise Time PCLK Slew Rate = 6 1.3 − 4.0 ns tFP PIXCLK Fall Time PCLK Slew Rate = 6 1.3 − 3.9 ns PIXCLK Duty Cycle 40 50 60 % PIXCLK Frequency PIXCLK Slew Rate = 6, Data Slew Rate = 7 6 − 74.25 MHz tPD PIXCLK to Data Valid PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 − 2 ns tPFH PIXCLK to FV HIGH PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 − 2 ns tPLH PIXCLK to LV HIGH PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 − 2 ns tPFL PIXCLK to FV LOW PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 − 2 ns tPLL PIXCLK to LV LOW PIXCLK Slew Rate = 6, Data Slew Rate = 7 −2.5 − 2 ns CIN Input Pin Capacitance − 2.5 − pF fPIXCLK 1. Minimum and maximum values are taken at 70°C, 2.5 V and −30°C, 3.1 V. All values are taken at the 50% transition point. The loading used is 10 pF. 2. Jitter from PIXCLK is already taken into account in the data for all of the output parameters. Table 7. I/O RISE SLEW RATE (2.8 V VDD_IO) (Note 1) Parallel Slew (R0x306E[15:13]) Condition Min Typ Max Unit 7 Default 1.50 2.50 3.90 V/ns 6 Default 0.98 1.62 2.52 V/ns 5 Default 0.71 1.12 1.79 V/ns 4 Default 0.52 0.82 1.26 V/ns 3 Default 0.37 0.58 0.88 V/ns 2 Default 0.26 0.40 0.61 V/ns 1 Default 0.17 0.27 0.40 V/ns 0 Default 0.10 0.16 0.23 V/ns 1. Minimum and maximum values are taken at 70°C, 2.5 V and −30°C, 3.1 V. The loading used is 10 pF. www.onsemi.com 15 AR0135CS Table 8. I/O FALL SLEW RATE (2.8 V VDD_IO) (Note 1) Parallel Slew (R0x306E[15:13]) Condition Min Typ Max Unit 7 Default 1.40 2.30 3.50 V/ns 6 Default 0.97 1.61 2.48 V/ns 5 Default 0.73 1.21 1.86 V/ns 4 Default 0.54 0.88 1.36 V/ns 3 Default 0.39 0.63 0.88 V/ns 2 Default 0.27 0.43 0.66 V/ns 1 Default 0.18 0.29 0.44 V/ns 0 Default 0.11 0.17 0.25 V/ns 1. Minimum and maximum values are taken at 70°C, 2.5 V and −30°C, 3.1 V. The loading used is 10 pF. Table 9. I/O RISE SLEW RATE (1.8 V VDD_IO) (Note 1) Parallel Slew (R0x306E[15:13]) Condition Min Typ Max Unit 7 Default 0.57 0.91 1.55 V/ns 6 Default 0.39 0.61 1.02 V/ns 5 Default 0.29 0.46 0.75 V/ns 4 Default 0.22 0.34 0.54 V/ns 3 Default 0.16 0.24 0.39 V/ns 2 Default 0.12 0.17 0.27 V/ns 1 Default 0.08 0.11 0.18 V/ns 0 Default 0.05 0.07 0.10 V/ns 1. Minimum and maximum values are taken at 70°C, 1.7 V and −30°C, 1.95 V. The loading used is 10 pF. Table 10. I/O FALL SLEW RATE (1.8 V VDD_IO) (Note 1) Parallel Slew (R0x306E[15:13]) Condition Min Typ Max Unit 7 Default 0.57 0.92 1.55 V/ns 6 Default 0.40 0.64 1.08 V/ns 5 Default 0.31 0.50 0.82 V/ns 4 Default 0.24 0.38 0.61 V/ns 3 Default 0.18 0.27 0.44 V/ns 2 Default 0.13 0.19 0.31 V/ns 1 Default 0.09 0.13 0.20 V/ns 0 Default 0.05 0.08 0.12 V/ns 1. Minimum and maximum values are taken at 70°C, 1.7 V and −30°C, 1.95 V. The loading used is 10 pF. www.onsemi.com 16 AR0135CS DC Electrical Characteristics The DC electrical characteristics are shown in Table 11, Table 12, Table 13, Table 14, and Table 15. Table 11. DC ELECTRICAL CHARACTERISTICS Symbol Definition Min Typ Max Unit 1.7 1.8 1.95 V 1.7/2.5 1.8/2.8 1.9/3.1 V Analog Voltage 2.5 2.8 3.1 V VAA_PIX Pixel Supply Voltage 2.5 2.8 3.1 V VDD_PLL PLL Supply Voltage 2.5 2.8 3.1 V HiSPi Supply Voltage 0.3 0.4 0.6 V VDD Condition Core Digital Voltage VDD_IO I/O Digital Voltage VAA VDD_SLVS VIH Input HIGH Voltage VDD_IO × 0.7 – – V VIL Input LOW Voltage – – VDD_IO × 0.3 V IIN Input Leakage Current 20 – – mA VOH Output HIGH Voltage VDD_IO – 0.3 – – V VOL Output LOW Voltage VDD_IO = 2.8 V – – 0.4 V IOH Output HIGH Current At Specified VOH –22 – – mA IOL Output LOW Current At Specified VOL – – 22 mA CAUTION: No Pull-up Resistor; VIN = VDD_IO or DGND Stresses greater than those listed in Table 12 may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Table 12. ABSOLUTE MAXIMUM RATINGS Parameter Minimum Maximum Unit –0.3 4.5 V Total Power Supply Current – 200 mA IGND Total Ground Current – 200 mA VIN DC Input Voltage –0.3 VDD_IO + 0.3 V DC Output Voltage –0.3 VDD_IO + 0.3 V Storage Temperature –40 +85 °C Symbol VSUPPLY Power Supply Voltage (All Supplies) ISUPPLY VOUT TSTG (Note 1) Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Table 13. OPERATING CURRENT CONSUMPTION FOR PARALLEL OUTPUT (VAA = VAA_PIX = VDD_IO = VDD_PLL = 2.8 V; VDD = 1.8 V; PLL Enabled and PIXCLK = 74.25 MHz; TA = 25°C; CLOAD = 10 pF) Condition Min Typ Max Unit Digital Operating Current Parallel, Streaming, Full Resolution 54 fps − 46 60 mA I/O Digital Operating Current Parallel, Streaming, Full Resolution 54 fps − 52 – mA Analog Operating Current Parallel, Streaming, Full Resolution 54 fps − 46 55 mA IAA_PIX Pixel Supply Current Parallel, Streaming, Full Resolution 54 fps − 7 9 mA IDD_PLL PLL Supply Current Parallel, Streaming, Full Resolution 54 fps − 8 10 mA Symbol IDD IDD_IO IAA Parameter www.onsemi.com 17 AR0135CS Table 14. OPERATING CURRENT CONSUMPTION FOR HiSPi OUTPUT (VAA = VAA_PIX = VDD_IO = VDD_PLL = 2.8 V; VDD = 1.8 V; PLL Enabled and PIXCLK = 74.25 MHz; TA = 25°C; CLOAD = 10 pF) Symbol IDD Parameter Condition Min Typ Max Unit Digital Operating Current HiSPi, Streaming, Full Resolution 54 fps − 70 90 mA I/O Digital Operating Current HiSPi, Streaming, Full Resolution 54 fps − 0.2 1 mA Analog Operating Current HiSPi, Streaming, Full Resolution 54 fps − 40 55 mA IAA_PIX Pixel Supply Current HiSPi, Streaming, Full Resolution 54 fps − 7 9 mA IDD_PLL PLL Supply Current HiSPi, Streaming, Full Resolution 54 fps − 11 14 mA HiSPi Supply Current HiSPi, Streaming, Full Resolution 54 fps − 9 12 mA IDD_IO IAA IDD_SLVS Table 15. STANDBY CURRENT CONSUMPTION (Analog − VAA + VAA_PIX + VDD_PLL; Digital − VDD + VDD_IO; TA = 25°C) Condition Min Typ Max Unit Hard Standby (Clock OFF, Driven Low) Analog, 2.8 V – 3 15 mA Digital, 1.8 V – 25 125 mA Hard Standby (Clock ON, EXTCLK = 20 MHz) Analog, 2.8 V – 12 25 mA Digital, 1.8 V – 1.1 1.7 mA Analog, 2.8 V – 3 15 mA Digital, 1.8 V – 25 125 mA Analog, 2.8 V – 12 25 mA Digital, 1.8 V – 1.1 1.7 mA Definition Soft Standby (Clock OFF, Driven Low) Soft Standby (Clock ON, EXTCLK = 20 MHz) HiSPi Electrical Specifications The ON Semiconductor AR0135CS sensor supports SLVS mode only, and does not have a DLL for timing adjustments. Refer to the High-Speed Serial Pixel (HiSPi) Interface Physical Layer Specification v2.00.00 for electrical definitions, specifications, and timing information. The VDD_SLVS supply in this data sheet corresponds to VDD_TX in the HiSPi Physical Layer Specification. Similarly, VDD is equivalent to VDD_HiSPi as referenced in the specification. The HiSPi transmitter electrical specifications are listed at 700 MHz. Table 16. INPUT VOLTAGE AND CURRENT (HiSPi POWER SUPPLY 0.4 V) (Measurement Conditions: Max Freq. 700 MHz) Symbol IDD_SLVS Parameter Supply Current (PWRHiSPi) (Driving 100 W Load) Min Typ Max Unit – 10 15 mA VCMD HiSPi Common Mode Voltage (Driving 100 W Load) VDD_SLVS × 0.45 VDD_SLVS/2 VDD_SLVS × 0.55 V |VOD| HiSPi Differential Output Voltage (Driving 100 W Load) VDD_SLVS × 0.36 VDD_SLVS/2 VDD_SLVS × 0.64 V DVCM Change in VCM between Logic 1 and 0 − − 25 mV |VOD| Change in |VOD| between Logic 1 and 0 − − 25 mV VOD Noise Margin – − 30 % |DVCM| NM Difference in VCM between any Two Channels − − 50 mV |DVOD| Difference in VOD between any Two Channels − − 100 mV DVCM_ac Common-mode AC Voltage (pk) without VCM Cap Termination − − 50 mV DVCM_ac Common-mode AC Voltage (pk) with VCM Cap Termination − − 30 mV Max Overshoot Peak |VOD| − − 1.3 × |VOD| V V VOD_ac Vdiff_pkpk − − 2.6 × |VOD| 1.4 × VOD − − Single-ended Output Impedance 35 50 70 W Output Impedance Mismatch − − 20 % Max Overshoot Vdiff pk-pk Veye Eye Height RO DRO www.onsemi.com 18 AR0135CS VDIFFmax VDIFFmin 0 V (Diff) Output Signal is ‘Cp − Cn’ or ‘Dp − Dn’ Figure 16. Differential Output Voltage for Clock and Data Pairs Table 17. RISE AND FALL TIMES (Measurement Conditions: HiSPi Power Supply 0.4 V, Max Freq. 700 MHz) Parameter Min Typ Max Unit Data Rate 280 – 700 Mb/s TxPRE Max Setup Time from Transmitter 0.3 – – UI (Note 1) TxPost Max Hold Time from Transmitter UI Symbol 1/UI 0.3 – – RISE Rise Time (20%−80%) – 0.25 UI – FALL Fall Time (20%−80%) 150ps 0.25 UI – PLL_DUTY 45 50 55 % tpw Bitrate Period 1.43 − 3.57 ns (Note 1) teye Eye Width 0.3 − − UI (Notes 1, 2) Data Total Jitter (pk pk)@1e−9 − − 0.2 UI (Notes 1, 2) tckjit Clock Period Jitter (RMS) − − 50 ps (Note 2) tcyjit Clock Cycle-to-Cycle jitter (RMS) − − 100 ps (Note 2) −0.1 − 0.1 UI (Notes 1, 2) − − 2.1 UI (Notes 1, 5) –100 − 100 ps (Note 6) ttotaljit Clock Duty tchskew Clock to Data Skew t|PHYskew| PHY-to-PHY Skew tDIFFskew Mean Differential skew 1. One UI is defined as the normalized mean time between one edge and the following edge of the clock. 2. Taken from 0 V crossing point. 3. Also defined with a maximum loading capacitance of 10 pF on any pin. The loading capacitance may also need to be less for higher bitrates so the rise and fall times do not exceed the maximum 0.3 UI. 4. The absolute mean skew between the Clock lane and any Data Lane in the same PHY between any edges. 5. The absolute mean skew between any Clock in one PHY and any Data lane in any other PHY between any edges. 6. Differential skew is defined as the skew between complementary outputs. It is measured as the absolute time between the two complementary edges at mean VCM point. www.onsemi.com 19 AR0135CS RISE VDIFF 80% DATA MASK 20% TxPre TxPost FALL Max VDIFF UI/2 VDIFF UI/2 CLOCK MASK CLKJITTER Trigger/Reference Figure 17. Eye Diagram for Clock and Data Signals VCMD tCMPSKEW tCHSKEW1PHY Figure 18. Skew within the PHY and Output Channels www.onsemi.com 20 AR0135CS POWER-ON RESET AND STANDBY TIMING Power-Up Sequence 5. If RESET_BAR is in a LOW state, hold RESET_BAR LOW for at least 1 ms. If RESET_BAR is in a HIGH state, assert RESET_BAR for at least 1 ms. 6. Wait 160000 EXTCLKs (for internal initialization into software standby). 7. Configure PLL, output, and image settings to desired values. 8. Wait 1 ms for the PLL to lock. 9. Set streaming mode (R0x301A[2] = 1). The recommended power-up sequence for the AR0135CS is shown in Figure 19. The available power supplies (VDD_IO, VDD, VDD_SLVS, VDD_PLL, VAA, VAA_PIX) must have the separation specified below. 1. Turn on VDD_PLL power supply. 2. After 0–10 ms, turn on VAA and VAA_PIX power supply. 3. After 0–10 ms, turn on VDD_IO power supply. 4. After the last power supply is stable, enable EXTCLK. VDD_PLL (2.8) t0 VAA_PIX VAA (2.8) t1 VDD_IO (1.8/2.8) t2 VDD (1.8) t3 VDD_SLVS (0.4) EXTCLK t4 RESET_BAR t5 tX Hard Reset t6 Internal Initialization Software Standby PLL Clock Streaming Figure 19. Power Up Table 18. POWER-UP SEQUENCE Symbol Definition Min Typ Max Unit t0 VDD_PLL to VAA/VAA_PIX 0 10 – ms t1 VAA/VAA_PIX to VDD_IO 0 10 – ms t2 VDD_IO to VDD 0 10 – ms t3 VDD to VDD_SLVS 0 10 – ms tX Xtal Settle Time – 30 (Note 1) – ms t4 Hard Reset 1 (Note 2) – – ms t5 Internal Initialization 160000 – – EXTCLKs t6 PLL Lock Time 1 – – ms 1. Xtal settling time is component-dependent, usually taking about 10–100 ms. 2. Hard reset time is the minimum time required after power rails are settled. In a circuit where hard reset is held down by RC circuit, then the RC time must include the all power rail settle time and Xtal settle time. 3. It is critical that VDD_PLL is not powered up after the other power supplies. It must be powered before or at least at the same time as the others. If the case happens that VDD_PLL is powered after other supplies then the sensor may have functionality issues and will experience high current draw on this supply. www.onsemi.com 21 AR0135CS Power-Down Sequence 3. Turn off VDD_SLVS. 4. Turn off VDD. 5. Turn off VDD_IO 6. Turn off VAA/VAA_PIX. 7. Turn off VDD_PLL. The recommended power-down sequence for the AR0135CS is shown in Figure 20. The available power supplies (VDD_IO, VDD, VDD_SLVS, VDD_PLL, VAA, VAA_PIX) must have the separation specified below. 1. Disable streaming if output is active by setting standby R0x301A[2] = 0 2. The soft standby state is reached after the current row or frame, depending on configuration, has ended. VDD_SLVS (0.4) t0 VDD (1.8) t1 VDD_IO (1.8/2.8) t2 VAA_PIX VAA (2.8) t3 VDD_PLL (2.8) EXTCLK t4 Power Down until Next Power Up Cycle Figure 20. Power Down Table 19. POWER-DOWN SEQUENCE Symbol Parameter Min Typ Max Unit t0 VDD_SLVS to VDD 0 – – ms t1 VDD to VDD_IO 0 – – ms t2 VDD_IO to VAA/VAA_PIX 0 – – ms t3 VAA/VAA_PIX to VDD_PLL 0 – – ms t4 PwrDn until Next PwrUp Time 100 – – ms 1. t4 is required between power down and next power up time; all decoupling caps from regulators must be completely discharged. www.onsemi.com 22 AR0135CS Standby Sequence the last valid register write prior to entering standby as well as the first valid write upon exiting standby. Also shown is timing if the EXTCLK is to be disabled during standby. Figure 21 and Figure 22 show timing diagrams for entering and exiting standby. Delays are shown indicating FV EXTCLK 50 EXTCLKs SDATA Register Writes Valid Register Writes Not Valid 750 EXTCLKs STANDBY Figure 21. Enter Standby Timing 28 Rows + CIT FV EXTCLK SDATA Register Writes Not Valid Register Writes Valid 10 EXTCLKs STANDBY 1 ms TRIGGER Figure 22. Exit Standby Timing www.onsemi.com 23 AR0135CS 80 70 Quantum Efficiency (%) 60 50 40 30 20 10 0 350 400 450 500 550 600 650 700 750 800 850 900 950 1000 1050 Wavelength (nm) Figure 23. Quantum Efficiency − Monochrome Sensor (Typical) 70 Red Green Blue 60 Quantum Efficiency (%) 50 40 30 20 10 0 350 450 550 650 750 850 950 Wavelength (nm) Figure 24. Quantum Efficiency − Color Sensor (Typical) www.onsemi.com 24 1050 1100 AR0135CS CRA vs. Image Height Plot CRA (mm) (deg) 0 0 0 5 0.150 1.35 30 10 0.300 2.70 28 15 0.450 4.04 26 20 0.600 5.39 24 25 0.750 6.73 22 30 0.900 8.06 20 35 1.050 9.39 18 40 1.200 10.71 16 45 1.350 12.02 14 50 1.500 13.33 12 55 1.650 14.62 60 1.800 15.90 65 1.950 17.16 70 2.100 18.41 75 2.250 19.64 80 2.400 20.85 85 2.550 22.05 90 2.700 23.22 95 2.850 24.38 100 3.000 25.51 AR1335CS CRA Characteristic Chief Ray Angle (Degrees) Image Height (%) 10 8 6 4 2 0 0 10 20 30 40 50 60 70 80 90 100 Image Height (%) Figure 25. Chief Ray Angle − 255 www.onsemi.com 25 110 AR0135CS PACKAGE DIMENSIONS IBGA63 9x9 CASE 503AZ ISSUE O Notes: 1. Lid material: Borosilicate glass 0.4 ± 0.04 thickness. Refractive index at 20°C = 1.5255 @ 546 nm and 1.5231 @ 588 nm. Double side AR Coating: 530−570 nm R < 1%; 420−700 nm R < 2%. 2. Solder ball material: SAC305 (95% Sn, 3% Ag, 0.5% Cu). Dimensions apply to solder balls post reflow. Pre-flow ball is 0.5 on a ∅0.4 SMD ball pad. www.onsemi.com 26 AR0135CS ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor 19521 E. 32nd Pkwy, Aurora, Colorado 80011 USA Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada Email: orderlit@onsemi.com N. American Technical Support: 800−282−9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 421 33 790 2910 Japan Customer Focus Center Phone: 81−3−5817−1050 www.onsemi.com 27 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative AR0135CS/D
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