Is Now Part of
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ON Semiconductor and the ON Semiconductor logo are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number
of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right
to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON
Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON
Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s
technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA
Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended
or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out
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is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
FDS8960C
Dual N & P-Channel PowerTrench® MOSFET
General Description
Features
These dual N- and P-Channel enhancement mode
power field effect transistors are produced using
Fairchild Semiconductor’s advanced PowerTrench
process that has been especially tailored to minimize
on-state ressitance and yet maintain superior switching
performance.
•
Q1:
•
Q2:
P-Channel
–5A, –35V
RDS(on) = 0.053Ω @ VGS = –10V
RDS(on) = 0.087Ω @ VGS = –4.5V
•
Fast switching speed
•
RoHS compliant
Q2
DD2
DD2
5
DD1
4
6
3
Q1
G2
S2 G
SO-8
Pin 1 SO-8
G1
S1 S
Symbol
S
7
2
8
1
S
Absolute Maximum Ratings
TA = 25°C unless otherwise noted
Parameter
VDSS
VDS(Avalanche)
VGSS
Drain-Source Voltage
Drain-Source Avalanche Voltage (maximum)
Gate-Source Voltage
ID
Drain Current
PD
- Pulsed
Power Dissipation for Dual Operation
Power Dissipation for Single Operation
- Continuous
Q1
Q2
Units
(Note 3)
35
40
–35
–40
(Note 1a)
±20
7
±25
–5
V
V
V
20
–20
A
2
1.6
1
0.9
–55 to +150
°C
(Note 1a)
78
°C/W
(Note 1)
40
°C/W
(Note 1a)
(Note 1b)
(Note 1c)
TJ, TSTG
RDS(on) = 0.024Ω @ VGS = 10V
RDS(on) = 0.032Ω @ VGS = 4.5V
These devices are well suited for low voltage and
battery powered applications where low in-line power
loss and fast switching are required.
D1
D
N-Channel
7.0A, 35V
Operating and Storage Junction Temperature Range
W
Thermal Characteristics
RθJA
Thermal Resistance, Junction-to-Ambient
RθJC
Thermal Resistance, Junction-to-Case
Package Marking and Ordering Information
Device Marking
Device
Reel Size
Tape width
Quantity
FDS8960C
FDS8960C
13”
12mm
2500 units
©2005 Fairchild Semiconductor Corporation
FDS8960C Rev C1(W)
www.fairchildsemi.com
FDS8960C Dual N & P-Channel PowerTrench® MOSFET
November 2005
Symbol
TA = 25°C unless otherwise noted
Parameter
Test Conditions
Type Min Typ
Max Units
Q1
24.5
mJ
Q2
Q1
Q2
12.5
mJ
A
Drain-Source Avalanche Ratings
EAS
IAS
Drain-Source Avalanche
Energy (Single Pulse)
VDD = 35 V,
ID = 7 A, L = 1 mH
VDD = –35 V, ID =–5 A, L = 1 mH
Drain-Source Avalanche
Current
7
–5
Off Characteristics
BVDSS
ID = 250 μA
VGS = 0 V,
ID = –250 μA
VGS = 0 V,
ID = 250 μA, Referenced to 25°C
ID = –250 µA, Referenced to 25°C
VDS = 28 V,
VGS = 0 V
VGS = 0 V
VDS = –28 V,
VGS = 20 V,
VDS = 0 V
IGSSF
Drain-Source Breakdown
Voltage
Breakdown Voltage
Temperature Coefficient
Zero Gate Voltage Drain
Current
Gate-Body Leakage, Forward
IGSSR
Gate-Body Leakage, Reverse VGS = –20 V,
VDS = 0 V
IGSSR
Gate-Body Leakage, Forward VGS = 25 V,
VDS = 0 V
IGSSF
Gate-Body Leakage, Reverse VGS = –25 V,
VDS = 0 V
ΔBVDSS
ΔTJ
IDSS
On Characteristics
35
–35
V
31
–40
Q2
mV/°C
1
–1
100
μA
–100
nA
100
nA
–100
nA
3
–3
V
nA
(Note 2)
VGS(th)
Gate Threshold Voltage
ΔVGS(th)
ΔTJ
RDS(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain-Source
On-Resistance
gFS
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Forward Transconductance
ID = 250 μA
VDS = VGS,
ID = –250 µA
VDS = VGS,
ID = 250 μA, Referenced to 25°C
ID = –250 µA, Referenced to 25°C
VGS = 10 V,
ID = 7 A
ID = 6 A
VGS = 4.5 V,
VGS = 10 V, ID = 7 A, TJ = 125°C
ID = –5 A
VGS = –10 V,
ID = –4 A
VGS = –4.5 V,
VGS = –10 V, ID = –5 A, TJ = 125°C
VDS = 5 V,
ID = 7 A
ID =–5 A
VDS = –5 V,
Q1
Q2
Q1
Q2
Q1
Q2
1
–1
2
–1.8
–5
4
20
25
29
Q1
Q2
44
70
61
23
9
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Q2
570
540
126
113
52
60
2
6
mV/°C
24
32
37
mΩ
53
87
79
S
Dynamic Characteristics
Q1
VDS = 15 V, VGS = 0 V, f = 1.0 MHz
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Q2
Reverse Transfer Capacitance VDS = –15 V, VGS = 0 V, f = 1.0 MHz
RG
Gate Resistance
FDS8960C Rev C1(W)
f = 1.0 MHz
pF
pF
pF
Ω
www.fairchildsemi.com
FDS8960C Dual N & P-Channel PowerTrench® MOSFET
Electrical Characteristics
Symbol
Parameter
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
(continued)
TA = 25°C unless otherwise noted
Test Conditions
Type Min
Typ
Max Units
(Note 2)
Gate-Drain Charge
Q1
VDD = 15 V, ID = 1 A,
VGS = 10V, RGEN = 6 Ω
Q2
VDD = –15 V, ID = -1 A,
VGS = –10V, RGEN = 6 Ω
Q1
VDS = 15 V, ID = 7 A, VGS = 5 V
Q2
VDS = –15 V, ID = –5 A,VGS = –5 V
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Q2
8
12
5
16
23
20
3
5
5.5
5.7
1.8
1.8
1.8
2
16
22
10
29
37
32
6
10
7.7
8
ns
ns
ns
ns
nC
nC
nC
Drain–Source Diode Characteristics
IS
Maximum Continuous Drain-Source Diode Forward Current
VSD
Drain-Source Diode Forward
Voltage
Diode Reverse Recovery
Time
Diode Reverse Recovery
Charge
trr
Qrr
VGS = 0 V, IS = 1.3 A
VGS = 0 V, IS = –1.3 A
Q1
IF = 7 A, diF/dt = 100 A/µs
Q2
IF = -5 A, diF/dt = 100 A/µs
(Note 2)
(Note 2)
Q1
Q2
Q1
Q2
Q1
Q2
Q1
Q2
0.8
–0.8
20
17
10
5
1.3
–1.3
1.2
–1.2
A
V
nS
nC
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.
a) 78°C/W when
mounted on a
0.5 in2 pad of 2 oz
copper
b) 125°C/W when
mounted on a .02 in2
pad of 2 oz copper
c) 135°C/W when mounted on a
minimum pad.
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300μs, Duty Cycle < 2.0%
3. BV(avalanche) Single-Pulse rating is guaranteed by design if device is operated within the UIS SOA boundary of the device.
FDS8960C Rev C1(W)
www.fairchildsemi.com
FDS8960C Dual N & P-Channel PowerTrench® MOSFET
Electrical Characteristics
2.6
20
6.0V
4.5V
3.5V
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
VGS = 10V
ID, DRAIN CURRENT (A)
16
12
8
3.0V
4
0
0.5
1
1.5
VDS, DRAIN TO SOURCE VOLTAGE (V)
2
VGS = 3.5V
1.8
1.6
4.0V
1.4
4.5V
5.0V
1.2
6.0V
10V
1
2
0
Figure 1. On-Region Characteristics.
8
12
ID, DRAIN CURRENT (A)
16
20
0.065
ID = 7A
VGS = 10V
ID = 3.5A
RDS(ON), ON-RESISTANCE (OHM)
1.6
4
Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
1.8
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
2.2
0.8
0
1.4
1.2
1
0.8
0.6
0.055
0.045
TA = 125oC
0.035
0.025
TA = 25oC
0.015
-50
-25
0
25
50
75
100
o
TJ, JUNCTION TEMPERATURE ( C)
125
150
2
Figure 3. On-Resistance Variation with
Temperature.
3
4
5
6
7
8
VGS, GATE TO SOURCE VOLTAGE (V)
9
10
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
100
30
TA = -55oC
25oC
IS, REVERSE DRAIN CURRENT (A)
VDS = 5V
25
ID, DRAIN CURRENT (A)
2.4
125oC
20
15
10
5
VGS = 0V
10
TA = 125oC
1
25oC
0.1
-55oC
0.01
0.001
0.0001
0
1.5
2.5
3.5
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics.
FDS8960C Rev C1(W)
4.5
0
0.2
0.4
0.6
0.8
1
VSD, BODY DIODE FORWARD VOLTAGE (V)
1.2
Figure 6. Body Diode Forward Voltage Variation
with Source Current and Temperature.
www.fairchildsemi.com
FDS8960C Dual N & P-Channel PowerTrench® MOSFET
Typical Characteristics: Q1 (N-Channel)
800
10
VGS, GATE-SOURCE VOLTAGE (V)
ID = 7A
VDS = 10V
15V
f = 1 MHz
VGS = 0 V
700
8
Ciss
600
CAPACITANCE (pF)
20V
6
4
500
400
300
Coss
200
2
100
0
0
2
4
6
8
10
Crss
0
12
0
5
Qg, GATE CHARGE (nC)
Figure 7. Gate Charge Characteristics.
35
50
P(pk), PEAK TRANSIENT POWER (W)
RDS(ON) LIMIT
100μs
ID, DRAIN CURRENT (A)
30
Figure 8. Capacitance Characteristics.
100
10
1ms
10ms
100ms
1
1s
10s
DC
VGS = 10V
SINGLE PULSE
RθJA = 135oC/W
0.1
TA = 25oC
0.1
1
10
VDS, DRAIN-SOURCE VOLTAGE (V)
SINGLE PULSE
RθJA = 135°C/W
TA = 25°C
40
30
20
10
0
0.001
0.01
100
Figure 9. Maximum Safe Operating Area.
0.01
0.1
1
t1, TIME (sec)
10
100
1000
Figure 10. Single Pulse Maximum
Power Dissipation.
40
100
SINGLE PULSE
RθJA = 135°C/W
TA = 25°C
30
I(AS), AVALANCHE CURRENT(A)
I(pk), PEAK TRANSIENT CURRENT (A)
10
15
20
25
VDS, DRAIN TO SOURCE VOLTAGE (V)
o
TJ = 25 C
10
20
10
0
0.001
0.01
0.1
1
10
100
t1, TIME (sec)
Figure 11. Single Pulse Maximum Peak
Current
FDS8960C Rev C1(W)
1000
1
0.01
0.1
1
10
tAV, TIME IN AVANCHE(ms)
Figure 12. Unclamped Inductive Switching
Capability
www.fairchildsemi.com
FDS8960C Dual N & P-Channel PowerTrench® MOSFET
Typical Characteristics: Q1 (N-Channel)
3.4
20
VGS = -10V
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
-6.0V
-ID, DRAIN CURRENT (A)
-4.5V
16
12
8
-3.5V
4
-3.0V
3.2
3
VGS = - 3.5V
2.8
2.6
2.4
2.2
-4.0V
2
1.8
-4.5V
-5.0V
1.6
-6.0V
1.4
1.2
-10V
1
0
0.8
0
0.5
1
1.5
2
2.5
3
3.5
4
0
5
-VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 13. On-Region Characteristics.
20
0.2
ID = -2.5A
ID = -5A
VGS = - 10V
1.5
RDS(ON), ON-RESISTANCE (OHM)
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
15
Figure 14. On-Resistance Variation with
Drain Current and Gate Voltage.
1.6
1.4
1.3
1.2
1.1
1
0.9
0.8
0.18
0.16
0.14
0.12
TA = 125oC
0.1
0.08
0.06
TA = 25oC
0.04
0.7
0.6
0.02
-50
-25
0
25
50
75
100
125
150
2
4
o
6
8
10
-VGS, GATE TO SOURCE VOLTAGE (V)
TJ, JUNCTION TEMPERATURE ( C)
Figure 15. On-Resistance Variation with
Temperature.
Figure 16. On-Resistance Variation with
Gate-to-Source Voltage.
20
-IS, REVERSE DRAIN CURRENT (A)
100
VDS = -5V
-ID, DRAIN CURRENT (A)
10
-ID, DRAIN CURRENT (A)
16
o
25 C
TA = -55oC
12
125oC
8
4
0
VGS = 0V
10
TA = 125oC
1
25oC
0.1
-55oC
0.01
0.001
0.0001
1.5
2
2.5
3
3.5
4
4.5
-VGS, GATE TO SOURCE VOLTAGE (V)
Figure 17. Transfer Characteristics.
FDS8960C Rev C1(W)
5
0
0.2
0.4
0.6
0.8
1
1.2
-VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 18. Body Diode Forward Voltage Variation
with Source Current and Temperature.
www.fairchildsemi.com
FDS8960C Dual N & P-Channel PowerTrench® MOSFET
Typical Characteristics: Q2 (P-Channel)
800
10
-VGS, GATE-SOURCE VOLTAGE (V)
ID = -5A
VDS = -10V
f = 1 MHz
VGS = 0 V
700
-15V
CISS
CAPACITANCE (pF)
8
-20V
6
4
2
600
500
400
300
COSS
200
100
CRSS
0
0
0
2
4
6
8
10
12
0
5
10
Qg, GATE CHARGE (nC)
Figure 19. Gate Charge Characteristics.
25
30
35
50
P(pk), PEAK TRANSIENT POWER (W)
100μs
RDS(ON) LIMIT
10
1ms
10ms
100ms
1s
10s
1
DC
VGS = -10V
SINGLE PULSE
RθJA = 135oC/W
0.1
TA = 25oC
0.01
0.1
1
10
SINGLE PULSE
RθJA = 135°C/W
TA = 25°C
40
30
20
10
0
0.001
100
0.01
0.1
Figure 21. Maximum Safe Operating Area.
10
100
1000
Figure 22. Single Pulse Maximum
Power Dissipation.
10
SINGLE PULSE
RθJA = 135°C/W
TA = 25°C
20
10
0.01
0.1
1
10
100
t1, TIME (sec)
Figure 23. Single Pulse Maximum Peak
Current
FDS8960C Rev C1(W)
1000
I(AS), AVALANCHE CURRENT(A)
30
0
0.001
1
t1, TIME (sec)
-VDS, DRAIN-SOURCE VOLTAGE (V)
I(pk), PEAK TRANSIENT CURRENT(A)
20
Figure 20. Capacitance Characteristics.
100
-ID, DRAIN CURRENT (A)
15
-VDS, DRAIN TO SOURCE VOLTAGE (V)
o
TJ = 25 C
1
0.01
0.1
1
10
tAV, TIME IN AVANCHE(ms)
Figure 24. Unclamped Inductive Switching
Capability
www.fairchildsemi.com
FDS8960C Dual N & P-Channel PowerTrench® MOSFET
Typical Characteristics: Q2 (P-Channel)
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE
1
D = 0.5
RθJA(t) = r(t) * RθJA
0.2
0.1
o
RθJA = 135 C/W
0.1
0.05
P(pk)
0.02
0.01
t1
0.01
t2
TJ - TA = P * RθJA(t)
Duty Cycle, D = t1 / t2
SINGLE PULSE
0.001
0.0001
0.001
0.01
0.1
1
10
100
1000
t1, TIME (sec)
Figure 25. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
FDS8960C Rev C1(W)
www.fairchildsemi.com
FDS8960C Dual N & P-Channel PowerTrench® MOSFET
Typical Characteristics
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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