MTB23P06VT4

MTB23P06V Preferred Device Power MOSFET 23 Amps, 60 Volts P–Channel D2PAK This Power MOSFET is designed to withstand high energy in the avalanche and commutation modes. Designed for low voltage, high speed switching applications in power supplies, converters and power motor controls, these devices are particularly well suited for bridge circuits where diode speed and commutating safe operating areas are critical and offer additional safety margin against unexpected voltage transients. • Avalanche Energy Specified • IDSS and VDS(on) Specified at Elevated Temperature http://onsemi.com 23 AMPERES 60 VOLTS RDS(on) = 120 mΩ P–Channel D MAXIMUM RATINGS (TC = 25°C unless otherwise noted) Symbol Value Unit 60 Vdc Drain–to–Gate Voltage (RGS = 1.0 MΩ) VDSS VDGR 60 Vdc Gate–to–Source Voltage – Continuous – Non–repetitive (tp ≤ 10 ms) VGS VGSM ± 15 ± 25 Vdc Vpk Drain Current – Continuous @ 25°C Drain Current – Continuous @ 100°C Drain Current – Single Pulse (tp ≤ 10 µs) ID ID IDM 23 15 81 Adc Total Power Dissipation @ 25°C Derate above 25°C Total Power Dissipation @ TA = 25°C (Note 1.) PD 90 0.60 3.0 Watts W/°C TJ, Tstg –55 to 175 °C MARKING DIAGRAM & PIN ASSIGNMENT EAS 794 mJ 4 Drain RθJC RθJA RθJA TL 1.67 62.5 50 Rating Drain–to–Source Voltage Operating and Storage Temperature Range Single Pulse Drain–to–Source Avalanche Energy – Starting TJ = 25°C (VDD = 25 Vdc, VGS = 10 Vdc, Peak IL = 23 Apk, L = 3.0 mH, RG = 25 Ω) Thermal Resistance – Junction to Case – Junction to Ambient – Junction to Ambient (Note 1.) Maximum Lead Temperature for Soldering Purposes, 1/8″ from Case for 10 seconds G S 4 Apk D2PAK CASE 418B STYLE 2 2 1 3 °C/W MTB23P06V YWW °C 260 1. When surface mounted to an FR4 board using the minimum recommended pad size. 2 Drain 1 Gate MTB23P06V Y WW 3 Source = Device Code = Year = Work Week ORDERING INFORMATION Device Package Shipping MTB23P06V D2PAK 50 Units/Rail MTB23P06VT4 D2PAK 800/Tape & Reel Preferred devices are recommended choices for future use and best overall value.  Semiconductor Components Industries, LLC, 2000 November, 2000 – Rev.2 1 Publication Order Number: MTB23P06V/D MTB23P06V ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Characteristic Symbol Min Typ Max Unit 60 – – 60.5 – – Vdc mV/°C – – – – 10 100 – – 100 nAdc 2.0 – 2.8 5.3 4.0 – Vdc mV/°C – 0.093 0.12 Ohm – – 2.1 – 3.3 3.2 5.0 11.5 – Ciss – 1160 1620 Coss – 380 530 Crss – 105 210 td(on) – 13.8 30 tr – 98.3 200 td(off) – 41 80 OFF CHARACTERISTICS Drain–Source Breakdown Voltage (VGS = 0 Vdc, ID = 0.25 mAdc) Temperature Coefficient (Positive) V(BR)DSS Zero Gate Voltage Drain Current (VDS = 60 Vdc, VGS = 0 Vdc) (VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150°C) IDSS Gate–Body Leakage Current (VGS = ± 15 Vdc, VDS = 0 Vdc) IGSS µAdc ON CHARACTERISTICS (Note 2.) Gate Threshold Voltage (VDS = VGS, ID = 250 µAdc) Threshold Temperature Coefficient (Negative) VGS(th) Static Drain–Source On–Resistance (VGS = 10 Vdc, ID = 11.5 Adc) RDS(on) Drain–Source On–Voltage (VGS = 10 Vdc, ID = 23 Adc) (VGS = 10 Vdc, ID = 11.5 Adc, TJ = 150°C) VDS(on) Forward Transconductance (VDS = 10.9 Vdc, ID = 11.5 Adc) Vdc gFS Mhos DYNAMIC CHARACTERISTICS Input Capacitance (VDS = 25 Vd Vdc, VGS = 0 Vdc, Vd f = 1.0 MHz) Output Capacitance Transfer Capacitance pF SWITCHING CHARACTERISTICS (Note 3.) Turn–On Delay Time (VDD = 30 Vdc, ID = 23 Adc, VGS = 10 Vdc, Vdc RG = 9.1 Ω) Rise Time Turn–Off Delay Time Fall Time Gate Charge (S Figure (See Fi 8) (VDS = 48 Vdc, ID = 23 Adc, VGS = 10 Vdc) tf – 62 120 QT – 38 50 Q1 – 7.0 – Q2 – 18 – Q3 – 14 – – – 2.2 1.8 3.5 – trr – 142 – ta – 100 – tb – 41 – QRR – 0.804 – – 3.5 4.5 – – 7.5 – ns nC SOURCE–DRAIN DIODE CHARACTERISTICS Forward On–Voltage (IS = 23 Adc, VGS = 0 Vdc) (IS = 23 Adc, VGS = 0 Vdc, TJ = 150°C) Reverse Recovery Time (IS = 23 Adc, Adc VGS = 0 Vdc, Vdc dIS/dt = 100 A/µs) Reverse Recovery Stored Charge VSD Vdc ns µC INTERNAL PACKAGE INDUCTANCE Internal Drain Inductance (Measured from contact screw on tab to center of die) (Measured from the drain lead 0.25″ from package to center of die) LD Internal Source Inductance (Measured from the source lead 0.25″ from package to source bond pad) LS 2. Pulse Test: Pulse Width ≤ 300 µs, Duty Cycle ≤ 2%. 3. Switching characteristics are independent of operating junction temperature. http://onsemi.com 2 nH nH MTB23P06V TYPICAL ELECTRICAL CHARACTERISTICS 40 8V 9V 7V 30 20 6V 10 5V 0 2 0.16 4 8 100°C 25 20 15 10 2 TJ = 100°C -55°C 0.06 0.04 5 10 15 20 25 30 ID, DRAIN CURRENT (AMPS) 35 40 45 0.12 6 7 8 TJ = 25°C 0.115 0.11 0.105 VGS = 10 V 0.1 0.095 15 V 0.09 0.085 0.08 0 Figure 3. On–Resistance versus Drain Current and Temperature 5 10 15 20 30 25 35 ID, DRAIN CURRENT (AMPS) 40 45 50 Figure 4. On–Resistance versus Drain Current and Gate Voltage 1.8 100 VGS = 0 V VGS = 10 V ID = 11.5 A I DSS , LEAKAGE (nA) R DS(on) , DRAIN-TO-SOURCE RESISTANCE (NORMALIZED) 5 Figure 2. Transfer Characteristics 0.08 1.4 4 Figure 1. On–Region Characteristics 25°C 1.6 3 VGS, GATE-TO-SOURCE VOLTAGE (VOLTS) 0.1 0 25°C 30 0 10 0.12 0.02 TJ = -55°C VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS) VGS = 10 V 0.14 6 VDS ≥ 10 V 35 5 4V RDS(on) , DRAIN-TO-SOURCE RESISTANCE (OHMS) 0 RDS(on) , DRAIN-TO-SOURCE RESISTANCE (OHMS) 40 VGS = 10V TJ = 25°C I D , DRAIN CURRENT (AMPS) I D , DRAIN CURRENT (AMPS) 50 1.2 1 0.8 0.6 0.4 TJ = 125°C 10 0.2 0 -50 -25 0 25 50 75 100 125 TJ, JUNCTION TEMPERATURE (°C) 150 1 175 0 Figure 5. On–Resistance Variation with Temperature 50 10 20 30 40 VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS) Figure 6. Drain–To–Source Leakage Current versus Voltage http://onsemi.com 3 60 MTB23P06V POWER MOSFET SWITCHING The capacitance (Ciss) is read from the capacitance curve at a voltage corresponding to the off–state condition when calculating td(on) and is read at a voltage corresponding to the on–state when calculating td(off). At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified. The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses. Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (∆t) are determined by how fast the FET input capacitance can be charged by current from the generator. The published capacitance data is difficult to use for calculating rise and fall because drain–gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (IG(AV)) can be made from a rudimentary analysis of the drive circuit so that t = Q/IG(AV) During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, VSGP. Therefore, rise and fall times may be approximated by the following: tr = Q2 x RG/(VGG – VGSP) tf = Q2 x RG/VGSP where VGG = the gate drive voltage, which varies from zero to VGG RG = the gate drive resistance and Q2 and VGSP are read from the gate charge curve. During the turn–on and turn–off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are: td(on) = RG Ciss In [VGG/(VGG – VGSP)] td(off) = RG Ciss In (VGG/VGSP) 4000 C, CAPACITANCE (pF) Ciss 3000 VGS = 0 V VDS = 0 V TJ = 25°C Crss 2000 Ciss 1000 0 Coss 10 0 5 VGS Crss 5 10 15 20 25 VDS GATE-TO-SOURCE OR DRAIN-TO-SOURCE VOLTAGE (VOLTS) Figure 7. Capacitance Variation http://onsemi.com 4 30 QT 9 8 Q2 Q1 7 27 24 VGS 21 6 18 5 15 4 12 3 9 2 Q3 1 0 0 5 TJ = 25°C ID = 23 A VDS 10 15 20 25 30 35 6 3 0 40 1000 t, TIME (ns) 10 VDS , DRAIN-TO-SOURCE VOLTAGE (VOLTS) VGS, GATE-TO-SOURCE VOLTAGE (VOLTS) MTB23P06V TJ = 25°C ID = 23 A VDD = 30 V VGS = 10 V 100 tr tf td(off) td(on) 10 1 1 10 Qg, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (OHMS) Figure 8. Gate–To–Source and Drain–To–Source Voltage versus Total Charge Figure 9. Resistive Switching Time Variation versus Gate Resistance 100 DRAIN–TO–SOURCE DIODE CHARACTERISTICS I S , SOURCE CURRENT (AMPS) 25 TJ = 25°C VGS = 0 V 20 15 10 5 0 0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 2.25 2.5 VSD, SOURCE-TO-DRAIN VOLTAGE (VOLTS) Figure 10. Diode Forward Voltage versus Current SAFE OPERATING AREA reliable operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases non–linearly with an increase of peak current in avalanche and peak junction temperature. Although many E–FETs can withstand the stress of drain–to–source avalanche at currents up to rated pulsed current (IDM), the energy rating is specified at rated continuous current (ID), in accordance with industry custom. The energy rating must be derated for temperature as shown in the accompanying graph (Figure 12). Maximum energy at currents below rated continuous ID can safely be assumed to equal the values indicated. The Forward Biased Safe Operating Area curves define the maximum simultaneous drain–to–source voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25°C. Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, “Transient Thermal Resistance–General Data and Its Use.” Switching between the off–state and the on–state may traverse any load line provided neither rated peak current (IDM) nor rated voltage (VDSS) is exceeded and the transition time (tr,tf) do not exceed 10 µs. In addition the total power averaged over a complete switching cycle must not exceed (TJ(MAX) – TC)/(RθJC). A Power MOSFET designated E–FET can be safely used in switching circuits with unclamped inductive loads. For http://onsemi.com 5 MTB23P06V SAFE OPERATING AREA 800 VGS = 20 V SINGLE PULSE TC = 25°C EAS, SINGLE PULSE DRAIN-TO-SOURCE AVALANCHE ENERGY (mJ) I D , DRAIN CURRENT (AMPS) 100 100 µs 10 1 ms 10 ms dc 1 0.1 RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 1 10 VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS) ID = 23 A 700 600 500 400 300 200 100 0 100 25 50 75 100 125 150 175 TJ, STARTING JUNCTION TEMPERATURE (°C) Figure 11. Maximum Rated Forward Biased Safe Operating Area Figure 12. Maximum Avalanche Energy versus Starting Junction Temperature D = 0.5 0.2 0.1 P(pk) 0.10 0.05 0.02 t1 0.01 t2 DUTY CYCLE, D = t1/t2 SINGLE PULSE 0.01 1.0E-05 1.0E-04 1.0E-03 1.0E-02 RθJC(t) = r(t) RθJC D CURVES APPLY FOR POWER PULSE TRAIN SHOWN READ TIME AT t1 TJ(pk) - TC = P(pk) RθJC(t) 1.0E-01 1.0E+00 1.0E+01 t, TIME (s) Figure 13. Thermal Response 3 PD, POWER DISSIPATION (WATTS) r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE 1.00 di/dt IS trr ta tb TIME 0.25 IS tp 2.5 2.0 1.5 1 0.5 0 IS RθJA = 50°C/W Board material = 0.065 mil FR–4 Mounted on the minimum recommended footprint Collector/Drain Pad Size ≈ 450 mils x 350 mils 25 50 75 100 125 150 TA, AMBIENT TEMPERATURE (°C) Figure 15. D2PAK Power Derating Curve Figure 14. Diode Reverse Recovery Waveform http://onsemi.com 6 175 MTB23P06V INFORMATION FOR USING THE D2PAK SURFACE MOUNT PACKAGE RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS Surface mount board layout is a critical portion of the total design. The footprint for the semiconductor packages must be the correct size to ensure proper solder connection interface between the board and the package. With the correct pad geometry, the packages will self align when subjected to a solder reflow process. 0.33 8.38 0.08 2.032 0.42 10.66 0.24 6.096 0.04 1.016 0.12 3.05 0.63 17.02 inches mm POWER DISSIPATION FOR A SURFACE MOUNT DEVICE PD = 175°C – 25°C = 3.0 Watts 50°C/W The power dissipation for a surface mount device is a function of the drain pad size. These can vary from the minimum pad size for soldering to a pad size given for maximum power dissipation. Power dissipation for a surface mount device is determined by TJ(max), the maximum rated junction temperature of the die, RθJA, the thermal resistance from the device junction to ambient, and the operating temperature, TA. Using the values provided on the data sheet, PD can be calculated as follows: PD = The 50°C/W for the D2PAK package assumes the use of the recommended footprint on a glass epoxy printed circuit board to achieve a power dissipation of 3.0 Watts. There are other alternatives to achieving higher power dissipation from the surface mount packages. One is to increase the area of the drain pad. By increasing the area of the drain pad, the power dissipation can be increased. Although one can almost double the power dissipation with this method, one will be giving up area on the printed circuit board which can defeat the purpose of using surface mount technology. For example, a graph of RθJA versus drain pad area is shown in Figure 16. TJ(max) – TA RθJA RθJA , THERMAL RESISTANCE, JUNCTION TO AMBIENT (°C/W) The values for the equation are found in the maximum ratings table on the data sheet. Substituting these values into the equation for an ambient temperature TA of 25°C, one can calculate the power dissipation of the device. For a D2PAK device, PD is calculated as follows. 70 Board Material = 0.0625″ G-10/FR-4, 2 oz Copper 60 TA = 25°C 2.5 Watts 50 3.5 Watts 40 5 Watts 30 20 0 2 4 6 8 10 A, AREA (SQUARE INCHES) 12 14 16 Figure 16. Thermal Resistance versus Drain Pad Area for the D2PAK Package (Typical) http://onsemi.com 7 MTB23P06V Another alternative would be to use a ceramic substrate or an aluminum core board such as Thermal Clad
. Using a board material such as Thermal Clad, an aluminum core board, the power dissipation can be doubled using the same footprint. SOLDER STENCIL GUIDELINES pattern of the opening in the stencil for the drain pad is not critical as long as it allows approximately 50% of the pad to be covered with paste. Prior to placing surface mount components onto a printed circuit board, solder paste must be applied to the pads. Solder stencils are used to screen the optimum amount. These stencils are typically 0.008 inches thick and may be made of brass or stainless steel. For packages such as the SC–59, SC–70/SOT–323, SOD–123, SOT–23, SOT–143, SOT–223, SO–8, SO–14, SO–16, and SMB/SMC diode packages, the stencil opening should be the same as the pad size or a 1:1 registration. This is not the case with the DPAK and D2PAK packages. If one uses a 1:1 opening to screen solder onto the drain pad, misalignment and/or “tombstoning” may occur due to an excess of solder. For these two packages, the opening in the stencil for the paste should be approximately 50% of the tab area. The opening for the leads is still a 1:1 registration. Figure 17 shows a typical stencil for the DPAK and D2PAK packages. The ÇÇ ÇÇ ÇÇ ÇÇ ÇÇ ÇÇÇ ÇÇÇ ÇÇ ÇÇÇ ÇÇÇ ÇÇ ÇÇÇ ÇÇÇ ÇÇÇ ÇÇÇ SOLDER PASTE OPENINGS STENCIL Figure 17. Typical Stencil for DPAK and D2PAK Packages SOLDERING PRECAUTIONS • When shifting from preheating to soldering, the maximum temperature gradient shall be 5°C or less. • After soldering has been completed, the device should be allowed to cool naturally for at least three minutes. Gradual cooling should be used as the use of forced cooling will increase the temperature gradient and result in latent failure due to mechanical stress. • Mechanical stress or shock should not be applied during cooling. The melting temperature of solder is higher than the rated temperature of the device. When the entire device is heated to a high temperature, failure to complete soldering within a short time could result in device failure. Therefore, the following items should always be observed in order to minimize the thermal stress to which the devices are subjected. • Always preheat the device. • The delta temperature between the preheat and soldering should be 100°C or less.* • When preheating and soldering, the temperature of the leads and the case must not exceed the maximum temperature ratings as shown on the data sheet. When using infrared heating with the reflow soldering method, the difference shall be a maximum of 10°C. • The soldering temperature and time shall not exceed 260°C for more than 10 seconds. * Soldering a device without preheating can cause excessive thermal shock and stress which can result in damage to the device. * Due to shadowing and the inability to set the wave height to incorporate other surface mount components, the D2PAK is not recommended for wave soldering. http://onsemi.com 8 MTB23P06V TYPICAL SOLDER HEATING PROFILE The line on the graph shows the actual temperature that might be experienced on the surface of a test board at or near a central solder joint. The two profiles are based on a high density and a low density board. The Vitronics SMD310 convection/infrared reflow soldering system was used to generate this profile. The type of solder used was 62/36/2 Tin Lead Silver with a melting point between 177–189°C. When this type of furnace is used for solder reflow work, the circuit boards and solder joints tend to heat first. The components on the board are then heated by conduction. The circuit board, because it has a large surface area, absorbs the thermal energy more efficiently, then distributes this energy to the components. Because of this effect, the main body of a component may be up to 30 degrees cooler than the adjacent solder joints. For any given circuit board, there will be a group of control settings that will give the desired heat pattern. The operator must set temperatures for several heating zones, and a figure for belt speed. Taken together, these control settings make up a heating “profile” for that particular circuit board. On machines controlled by a computer, the computer remembers these profiles from one operating session to the next. Figure 18 shows a typical heating profile for use when soldering a surface mount device to a printed circuit board. This profile will vary among soldering systems but it is a good starting point. Factors that can affect the profile include the type of soldering system in use, density and types of components on the board, type of solder used, and the type of board or substrate material being used. This profile shows temperature versus time. STEP 1 PREHEAT ZONE 1 “RAMP” 200°C STEP 2 STEP 3 VENT HEATING “SOAK” ZONES 2 & 5 “RAMP” DESIRED CURVE FOR HIGH MASS ASSEMBLIES STEP 4 HEATING ZONES 3 & 6 “SOAK” 160°C STEP 5 STEP 6 STEP 7 HEATING VENT COOLING ZONES 4 & 7 205° TO 219°C “SPIKE” PEAK AT 170°C SOLDER JOINT 150°C 150°C 100°C 140°C 100°C SOLDER IS LIQUID FOR 40 TO 80 SECONDS (DEPENDING ON MASS OF ASSEMBLY) DESIRED CURVE FOR LOW MASS ASSEMBLIES 5°C TIME (3 TO 7 MINUTES TOTAL) TMAX Figure 18. Typical Solder Heating Profile http://onsemi.com 9 MTB23P06V PACKAGE DIMENSIONS D2PAK CASE 418B–03 ISSUE D C E V –B– 4 A 1 2 3 S –T– SEATING PLANE K J G D 3 PL 0.13 (0.005) H M T B M NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. DIM A B C D E G H J K S V INCHES MIN MAX 0.340 0.380 0.380 0.405 0.160 0.190 0.020 0.035 0.045 0.055 0.100 BSC 0.080 0.110 0.018 0.025 0.090 0.110 0.575 0.625 0.045 0.055 STYLE 2: PIN 1. 2. 3. 4. http://onsemi.com 10 GATE DRAIN SOURCE DRAIN MILLIMETERS MIN MAX 8.64 9.65 9.65 10.29 4.06 4.83 0.51 0.89 1.14 1.40 2.54 BSC 2.03 2.79 0.46 0.64 2.29 2.79 14.60 15.88 1.14 1.40 MTB23P06V Notes http://onsemi.com 11 MTB23P06V Thermal Clad is a registered trademark of the Bergquist Company. ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. 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