8752CYILFT

ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER GENERAL DESCRIPTION FEATURES The ICS8752I is a low voltage, low skew LVCMOS clock generator. With output up to 240MHz, the ICS8752I is targeted for high performance clock applications. Along with a fully integrated PLL, the ICS8752I contains frequency configurable outputs and an external feedback input for regenerating clocks with “zero delay”. • Fully integrated PLL • 8 LVCMOS outputs, 7Ω typical output impedance • Selectable LVCMOS CLK0 or CLK1 inputs for redundant clock applications • Input/Output frequency range: 18.33MHz to 240MHz at VCC = 3.3V ± 5% Dual clock inputs, CLK0 and CLK1, support redundant clock applications. The CLK_SEL input determines which reference clock is used. The output divider values of Bank A and B are controlled by the DIV_SELA0:1, and DIV_SELB0:1, respectively. • VCO range: 220MHz to 480MHz • External feedback for “zero delay” clock regeneration • Cycle-to-cycle jitter: 75ps (maximum), (all outputs are the same frequency) For test and system debug purposes, the PLL_SEL input allows the PLL to be bypassed. When HIGH, the MR/nOE input resets the internal dividers and forces the outputs to the high impedance state. • Output skew: 100ps (maximum) • Bank skew: 55ps (maximum) The low impedance LVCMOS outputs of the ICS8752I are designed to drive terminated transmission lines. The effective fanout of each output can be doubled by utilizing the ability of each output to drive two series terminated transmission lines. • Full 3.3V or 2.5V supply voltage • -40°C to 85°C ambient operating temperature • Lead-Free package fully RoHS compliant BLOCK DIAGRAM PIN ASSIGNMENT VDDO 00 01 10 11 QB2 ÷2 ÷4 ÷6 ÷8 ÷12 QB3 1 GND VCO GND CLK0 0 CLK1 1 PHASE DETECTOR nc VDD PLL FB_IN PLL_SEL PLL_SEL 32 31 30 29 28 27 26 25 QA0 DIV_SELB0 1 24 GND QA1 DIV_SELB1 2 23 QB1 DIV_SELA1 QA2 DIV_SELA0 3 22 QB0 DIV_SELA0 QA3 DIV_SELA1 4 21 VDDO MR/nOE 5 20 VDDO CLK0 6 19 QA3 GND 7 18 QA2 FB_IN 8 17 GND CLK_SEL 0 00 01 10 11 QB0 QB1 DIV_SELB1 QB2 DIV_SELB0 QB3 ICS8752I 9 10 11 12 13 14 15 16 VDDO QA1 QA0 GND CLK1 VDD VDDA CLK_SEL 32-Lead LQFP 7mm x 7mm x 1.4mm package body Y package Top View MR/nOE 8752CYI REV. C JULY 30, 2010 1 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER TABLE 1. PIN DESCRIPTIONS Number 1, 2 3, 4 Name DIV_SELB0, DIV_SELB1 DIV_SELA0, DIV_SELA1 Type Input Input 5 MR/nOE Input Description Determines output divider values for Bank B as described in Table 3. Pulldown LVCMOS / LVTTL interface levels. Determines output divider values for Bank A as described in Table 3. Pulldown LVCMOS / LVTTL interface levels. When logic HIGH, the internal dividers are reset and the outputs are Pulldown disabled. When logic LOW, the master reset is disabled and the outputs are enabled. LVCMOS / LVTTL interface levels. 6 CLK0 Input 7, 13, 17, 24, 28, 29 Pulldown Clock input. LVCMOS / LVTTL interface levels. GND Power 8 FB_IN Input 9 CLK_SEL Input 10 VDDA Power Analog supply pin. 1 1, 32 VDD Power Core supply pins. Power supply ground. Feedback input to phase detector for generating clocks with "zero delay". LVCMOS / LVTTL interface levels. Clock select input. Selects between CLK0 or CLK1 as phase detector Pulldown reference. When LOW, selects CLK0. When HIGH, selects CLK1. LVCMOS / LVTTL interface levels. Pulldown 12 CLK1 Input 14, 15, 18, 19 16, 20, 21, 25 22, 23, 26, 27 QA0, QA1, QA2, QA3 Pulldown Clock input. LVCMOS / LVTTL interface levels. Output Bank A clock outputs. 7Ω typical output impedance. LVCMOS / LVTTL interface levels. VDDO Power Output supply pins. QB0, QB1, QB2, QB3 Output Bank B clock outputs. 7Ω typical output impedance. LVCMOS / LVTTL interface levels. 30 nc Unused No connect. 31 PLL_SEL Input Pullup Selects between the PLL and CLK0 or CLK1 as the input to the dividers. When HIGH selects PLL. When LOW selects CLK0 or CLK1. LVCMOS / LVTTL interface levels. NOTE: Pullup and Pulldown refer to internal input resistors. See Table 2, Pin Characteristics, for typical values. TABLE 2. PIN CHARACTERISTICS Symbol Parameter CIN Input Capacitance 4 pF RPULLUP Input Pullup Resistor 51 kΩ RPULLDOWN Input Pulldown Resistor Power Dissipation Capacitance (per output) Output Impedance 51 kΩ 23 pF 7 Ω CPD ROUT Test Conditions VDDA, VDD, VDDO = 3.465V 8752CYI Minimum Typical Maximum Units REV. C JULY 30, 2010 2 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER TABLE 3. CONTROL INPUT FUNCTION TABLE MR/nOE PLL_SEL Inputs DIV_ SELA1 X CLK_SEL Outputs DIV_ SELA0 X DIV_ SELB1 X DIV_ SELB0 X QAx QB x 1 X X Hi-Z Hi-Z 0 1 X 0 0 0 0 fVCO/2 fVCO/4 0 1 X 0 1 0 1 fVCO/4 fVCO/6 0 1 X 1 0 1 0 fVCO/6 fVCO/8 0 1 X 1 1 1 1 fVCO/8 fVCO/12 0 0 0 0 0 0 0 fCLK0/2 fCLK0/4 0 0 0 0 1 0 1 fCLK0/4 fCLK0/6 0 0 0 1 0 1 0 fCLK0/6 fCLK0/8 0 0 0 1 1 1 1 fCLK0/8 fCLK0/12 0 0 1 0 0 0 0 fCLK1/2 fCLK1/4 0 0 1 0 1 0 1 fCLK1/4 fCLK1/6 0 0 1 1 0 1 0 fCLK1/6 fCLK1/8 0 0 1 1 1 1 1 fCLK1/8 fCLK1/12 NOTE: For normal operation, MR/nOE is LOW. When MR/nOE is HIGH, all ouputs are disabled. TABLE 4A. QA OUTPUT FREQUENCY W/FB_IN = QB Inputs FB_IN QB QB QB QB DIV_ DIV_ SELB1 SELB0 0 0 1 1 0 1 0 1 QB Output Divider Mode (NOTE 2) ÷4 ÷6 ÷8 ÷12 Outputs CLK0, CLK1 (MHz) (NOTE 1) Minimum Maximum 55 36.66 27.5 18.33 120 80 60 40 DIV_ SELA1 DIV_ SELA0 QA Output Divider Mode QA Multiplier (NOTE 2) 0 0 ÷2 2 0 1 ÷4 1 1 0 ÷6 0.667 1 1 ÷8 0.5 0 0 ÷2 3 0 1 ÷4 1.5 1 0 ÷6 1 1 1 ÷8 0.75 0 0 ÷2 4 0 1 ÷4 2 1 0 ÷6 1.33 1 1 ÷8 1 0 1 ÷2 6 0 1 ÷4 3 1 0 ÷6 2 1 1 ÷8 1.5 NOTE 1: VCO frequency range is 220MHz to 480MHz. NOTE 2: QA output frequency equal to CLKx frequency times the multiplier ; QB output frequency equal to CLKx. 8752CYI REV. C JULY 30, 2010 3 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER TABLE 4B. QB OUTPUT FREQUENCY W/FB_IN = QA FB_IN QA QA QA DIV_ SELA1 0 0 1 DIV_ SELA0 0 1 0 QA Output Divider Mode (NOTE 2) ÷2 ÷4 ÷6 Inputs CLK0, CLK1 (MHz) (NOTE 1) Minimum Maximum 110 55 36.66 240 (NOTE 3) 120 80 Outputs DIV_ SELB1 DIV_ SELB0 QB Output Divider Mode QB Multiplier (NOTE 2) 0 0 ÷4 0.5 0 1 ÷6 0.333 1 0 ÷8 0.25 1 1 ÷12 0.167 0 0 ÷4 1 0 1 ÷6 0.667 1 0 ÷8 0.5 1 1 ÷12 0.333 0 0 ÷4 1.5 0 1 ÷6 1 1 0 ÷8 0.75 1 1 ÷12 0.5 0 1 ÷4 2 0 1 ÷6 1.333 1 0 ÷8 1 1 NOTE 1: VCO frequency range is 220MHz to 480MHz. NOTE 2: QB output frequency equal to CLKx frequency times the multiplier ; QA output frequency equal to CLKx. NOTE 3: Maximum frequency of 240MHz valid for VCC = 3.3V ± 5% only. 1 ÷12 0.667 QA 1 1 ÷8 27.5 60 8752CYI REV. C JULY 30, 2010 4 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER ABSOLUTE MAXIMUM RATINGS Supply Voltage, VDD 4.6V Inputs, VI -0.5V to VDD + 0.5V Outputs, VO -0.5V to VDDO + 0.5V Package Thermal Impedance, θJA 47.9°C/W (0 lfpm) Storage Temperature, TSTG -65°C to 150°C NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability. TABLE 5A. POWER SUPPLY DC CHARACTERISTICS, VDD = VDDA = VDDO = 3.3V±5%, TA = -40°C TO 85°C Symbol Parameter Test Conditions Minimum Typical Maximum Units VDD Core Supply Voltage 3.135 3.3 3.465 V VDDA Analog Supply Voltage 3.135 3.3 3.465 V 3.135 3.3 VDDO Output Supply Voltage 3.465 V IDD Power Supply Current 105 mA IDDA Analog Supply Current 15 mA IDDO Output Supply Current 20 mA Maximum Units TABLE 5B. POWER SUPPLY DC CHARACTERISTICS, VDD = VDDA = VDDO = 2.5V±5%, TA = -40°C TO 85°C Symbol Parameter Test Conditions Minimum Typical VDD Core Supply Voltage 2.375 2.5 2.625 V VDDA Analog Supply Voltage 2.375 2.5 2.625 V VDDO Output Supply Voltage 2.375 2.5 2.625 V IDD Power Supply Current 100 mA IDDA Analog Supply Current 15 mA IDDO Output Supply Current 20 mA 8752CYI REV. C JULY 30, 2010 5 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER TABLE 5B. LVCMOS/LVTTL DC CHARACTERISTICS, VDD = VDDA = VDDO = 3.3V±5% OR 2.5V±5%, TA = -40°C TO 85°C Symbol Parameter Test Conditions V IH Input High Voltage VIL Input Low Voltage IIH DIV_ SELx0, DIV_SELx1, CLK0, CLK1, FB_IN, CLK_SEL, Input High Current MR/nOE IIL Input Low Current PLL_SEL VOH Typical Maximum Units VDD = 3.3V 2 VDD + 0.3 V VDD = 2.5V 1.7 VDD + 0.3 V VDD = 3.3V -0.3 0.8 V VDD = 2.5V -0.3 0.7 V 150 µA 5 µA VDD = VIN = 3.465V or 2.625V VDD = VIN = 3.465V or 2.625V PLL_SEL DIV_ SELx0, DIV_SELx1, CLK0, CLK1, FB_IN, CLK_SEL, MR/nOE Minimum VDD = 3.465V or 2.625V, -5 µA VDD = 3.465V or 2.625V, VIN = 0V -150 µA VDDO = VIN = 3.465V 2.6 V VDDO = VIN = 2.625V 1.8 V VIN = 0V Output High Voltage; NOTE 1 Output Low Voltage; NOTE 1 VOL NOTE 1: Outputs terminated with 50Ω to VDDO/2. See Parameter Measurement Information section, "Output Load Test Circuit" diagrams. 0.5 V Maximum Units 240 MHz Maximum Units 120 MHz TABLE 6A. PLL INPUT REFERENCE CHARACTERISTICS, VDD = VDDA = VDDO = 3.3V±5%, TA = -40°C TO 85°C Symbol Parameter Input Reference Frequency NOTE: Input reference frequency is limited by fREF the divider selection and the VCO lock range. Test Conditions Minimum Typical 20 TABLE 6B. PLL INPUT REFERENCE CHARACTERISTICS, VDD = VDDA = VDDO = 2.5V±5%, TA = -40°C TO 85°C Symbol Parameter Input Reference Frequency NOTE: Input reference frequency is limited by fREF the divider selection and the VCO lock range. Test Conditions Minimum 20 8752CYI Typical REV. C JULY 30, 2010 6 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER TABLE 7A. AC CHARACTERISTICS, VDD = VDDA = VDDO = 3.3V±5%, TA = -40°C TO 85°C Symbol fOUT fVCO Parameter Test Conditions Minimum Maximum Units ÷2 110 240 MHz ÷4 55 120 MHz ÷6 36.67 80 MHz ÷8 27.5 60 MHz ÷12 18.33 40 MHz 220 480 MHz 170 ps 55 ps 100 ps 400 ps 75 ps Output Frequency (PLL Mode) PLL VCO Lock Range t(Ø) Static Phase Offset; NOTE 1 tsk(b) Bank Skew; NOTE 2, 4 tsk(o) Output Skew; NOTE 3, 4 tjit(cc) Cycle-to-Cycle Jitter ; NOTE 4 fVCO = 400MHz, Feedback ÷ 8 Measured on rising edge at VDDO/2 -30 Measured on rising edge at VDDO/2 Different Frequencies on Different Banks All Outputs at Same Frequency tL PLL Lock Time tR / tF Output Rise/Fall Time Typical 70 1 mS 950 ps odc Output Duty Cycle 47 50 53 All parameters measured at fMAX unless noted otherwise. NOTE 1: Defined as the time difference between the input clock and the average feedback input signal, when the PLL is locked and the input reference frequency is stable. NOTE 2: Defined as skew within a bank of outputs at the same supply voltages and with equal load conditions. NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDO/2. NOTE 4: This parameter is defined in accordance with JEDEC Standard 65. % 20% to 80% 8752CYI 400 REV. C JULY 30, 2010 7 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER TABLE 7B. AC CHARACTERISTICS, VDD = VDDA = VDDO = 2.5V±5%, TA = -40°C TO 85°C Symbol fOUT Parameter Test Conditions Minimum ÷2 Output Frequency (PLL Mode) Typical Maximum Units 110 240 MHz ÷4 55 120 MHz ÷6 36.67 80 MHz ÷8 27.5 60 MHz ÷12 18.33 40 MHz 220 480 MHz 190 ps 55 ps 90 ps 400 ps 75 ps 1 mS 950 ps odc Output Duty Cycle 45 50 55 All parameters measured at fMAX unless noted otherwise. NOTE 1: Defined as the time difference between the input clock and the average feedback input signal, when the PLL is locked and the input reference frequency is stable. NOTE 2: Defined as skew within a bank of outputs at the same supply voltages and with equal load conditions. NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDO/2. NOTE 4: This parameter is defined in accordance with JEDEC Standard 65. % fVCO PLL VCO Lock Range t(Ø) Static Phase Offset; NOTE 1 tsk(b) Bank Skew; NOTE 2, 4 tsk(o) Output Skew; NOTE 3, 4 tjit(cc) Cycle-to-Cycle Jitter ; NOTE 4 fVCO = 400MHz Feedback ÷ 8 Measured on rising edge at VDDO/2 Measured on rising edge at VDDO/2 -90 Different Frequencies on Different Banks All Outputs at Same Frequency tL PLL Lock Time tR / tF Output Rise/Fall Time 20% to 80% 8752CYI 400 50 REV. C JULY 30, 2010 8 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER PARAMETER MEASUREMENT INFORMATION 1.25V±5% 1.65V±5% SCOPE VDD, VDDA,VDDO Qx LVCMOS SCOPE VDD, VDDA,V DDO Qx LVCMOS GND GND -1.65V±5% -1.25V±5% 3.3V OUTPUT LOAD AC TEST CIRCUIT 2.5V OUTPUT LOAD AC TEST CIRCUIT (Where X denotes outputs in the same Bank) VDDO 2 V DDO Qx QX0:QX3 2 VDDO 2 V DDO QX0:QX3 2 tsk(o) Qy tsk(b) OUTPUT SKEW BANK SKEW DDO 2 DDO 2 ➤ tcycle 2 CLK0, CLK1 2 tcycle n+1 ➤ n VDD V V DDO ➤ VDD 2 FB_IN ➤ t jit(cc) = tcycle n –tcycle n+1 ➤ t(Ø) ➤ V QA0:QA3, QB0:QB3 1000 Cycles STATIC PHASE OFFSET CYCLE-TO-CYCLE JITTER V DDO QA0:QA3, QB0:QB3 80% 2 Pulse Width t odc = Clock Outputs PERIOD 80% 20% 20% tR tF t PW t PERIOD OUTPUT DUTY CYLCLE/PULSE WIDTH/PERIOD OUTPUT RISE/FALL TIME 8752CYI REV. C JULY 30, 2010 9 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER RELIABILITY INFORMATION TABLE 7. θJAVS. AIR FLOW TABLE FOR 32 LEAD LQFP θJA by Velocity (Linear Feet per Minute) 0 Single-Layer PCB, JEDEC Standard Test Boards Multi-Layer PCB, JEDEC Standard Test Boards 67.8°C/W 47.9°C/W 200 500 55.9°C/W 42.1°C/W 50.1°C/W 39.4°C/W NOTE: Most modern PCB designs use multi-layered boards. The data in the second row pertains to most designs. TRANSISTOR COUNT The transistor count for ICS8752I is: 1546 8752CYI REV. C JULY 30, 2010 10 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER PACKAGE OUTLINE - Y SUFFIX FOR 32 LEAD LQFP TABLE 8. PACKAGE DIMENSIONS JEDEC VARIATION ALL DIMENSIONS IN MILLIMETERS BBA SYMBOL MINIMUM NOMINAL MAXIMUM 32 N A -- -- 1.60 A1 0.05 -- 0.15 A2 1.35 1.40 1.45 b 0.30 0.37 0.45 c 0.09 -- 0.20 D 9.00 BASIC D1 7.00 BASIC D2 5.60 Ref. E 9.00 BASIC E1 7.00 BASIC E2 5.60 Ref. 0.80 BASIC e L 0.45 0.60 0.75 θ 0° -- 7° ccc -- -- 0.10 Reference Document: JEDEC Publication 95, MS-026 8752CYI REV. C JULY 30, 2010 11 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER TABLE 9. ORDERING INFORMATION Part/Order Number Marking Package Shipping Packaging Temperature 8752CYI ICS8752CYI 32 Lead LQFP tray -40°C to 85°C 8752CYIT ICS8752CYI 32 Lead LQFP 1000 tape & reel -40°C to 85°C 8752CYILF ICS8752CYILF 32 Lead "Lead-Free" LQFP tray -40°C to 85°C 8752CYILFT ICS8752CYILF 32 Lead "Lead-Free" LQFP 1000 tape & reel -40°C to 85°C NOTE: Par ts that are ordered with an "LF" suffix to the par t number are the Pb-Free configuration and are RoHS compliant. 8752CYI REV. C JULY 30, 2010 12 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER Rev Table 7A & 7B Page 6&8 7B 1 8 2 1 2 2 12 A A B T1 T2 T9 C T9 12 14 REVISION HISTORY SHEET Description of Change AC Characterisitics tables, Static Phase Offset/Test Conditions changed Feedback ÷ 4 to Feedback ÷ 8. Bank Skew should read 55ps Max. from 40ps Max. Pin Description Table - revised MR/nOE description. Features Section - added Lead-Free Bullet Pin Description Table - correct Pin 5, MR/nOE. Pin Characteristics Table - changed CIN from 4pF max. to 4pF typical. Added Lead-Free par t number. Updated datasheet format. Updated datasheet's header/footer with IDT from ICS. Removed ICS prefix from Par t/Order Number column. Added LF marking. Added Contact Page. 8752CYI Date 6/17/02 8/19/02 5/2/05 7/30/10 REV. C JULY 30, 2010 13 ICS8752I LOW SKEW, 1-TO-8 LVCMOS CLOCK MULTIPLIER/ZERO DELAY BUFFER 8752CYI REV. C JULY 30, 2010 14 IMPORTANT NOTICE AND DISCLAIMER RENESAS ELECTRONICS CORPORATION AND ITS SUBSIDIARIES (“RENESAS”) PROVIDES TECHNICAL SPECIFICATIONS AND RELIABILITY DATA (INCLUDING DATASHEETS), DESIGN RESOURCES (INCLUDING REFERENCE DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS” AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS OR IMPLIED, INCLUDING, WITHOUT LIMITATION, ANY IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, OR NON-INFRINGEMENT OF THIRD PARTY INTELLECTUAL PROPERTY RIGHTS. These resources are intended for developers skilled in the art designing with Renesas products. You are solely responsible for (1) selecting the appropriate products for your application, (2) designing, validating, and testing your application, and (3) ensuring your application meets applicable standards, and any other safety, security, or other requirements. These resources are subject to change without notice. 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