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SFS4410

SFS4410

  • 厂商:

    SEMIWELL

  • 封装:

  • 描述:

    SFS4410 - Logic N-Channel MOSFET - SemiWell Semiconductor

  • 数据手册
  • 价格&库存
SFS4410 数据手册
PRELIMINARY SemiWell Semiconductor SFS4410 Logic N-Channel MOSFET Features ■ RDS(on) (Max 0.0135Ω )@VGS=10V RDS(on) (Max 0.020Ω )@VGS=4.5V Gate Charge (Typical 33nC) Maximum Junction Temperature Range (150°C) Available in Tape and Reel Symbol D D D D 5 6 7 8 4 3 2 1 G S S S ■ ■ ■ General Description This Power MOSFET is produced using Semiwell’s advanced planar stripe, DMOS technology. This latest technology has been especially designed to minimize on-state resistance, have a low gate charge with superior switching performance, and rugged avalanche characteristics.This Power MOSFET is well suited for power management circuit or DC-DC converter. 8-SOIC D D D D S S S G Absolute Maximum Ratings Symbol VDSS ID IDM VGS PD TSTG, TJ TL Drain to Source Voltage Continuous Drain Current(@TA = 25°C) Drain Current Pulsed Gate to Source Voltage Total Power Dissipation Single Operation (TA=25°C) Total Power Dissipation Single Operation (TA=70°C) Operating Junction Temperature & Storage Temperature Maximum Lead Temperature for soldering purpose, 1/8 from Case for 5 seconds. (Note 1) Parameter Value 30 10 50 Units V A A V W W °C °C ±20 2.5 1.6 - 55 ~ 150 300 Thermal Characteristics Symbol RθJA Parameter Thermal Resistance, Junction-to-Ambient (Note 4) Value Min. - Typ. - Max. 50 Units °C/W January, 2003. Rev. 0. Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved. 1/6 SFS4410 Electrical Characteristics Symbol Off Characteristics BVDSS Δ BVDSS/ Δ TJ IDSS IGSS Drain-Source Breakdown Voltage Breakdown Voltage Temperature coefficient Drain-Source Leakage Current Gate-Source Leakage, Forward Gate-Source Leakage, Reverse VGS = 0V, ID = 250uA ID = 250uA, referenced to 25 °C VDS = 24V, VGS = 0V VDS = 24V, VGS = 0V, TJ = 55 °C VGS = 20V, VDS = 0V VGS = -20V, VDS = 0V VDS = VGS, ID = 250uA VGS = 10 V, ID = 10A VGS = 4.5 V, ID = 9A 30 12 1 10 100 -100 V mV/°C uA nA nA ( TJ = 25 °C unless otherwise noted ) Parameter Test Conditions Min Typ Max Units On Characteristics VGS(th) RDS(ON) Gate Threshold Voltage Static Drain-Source On-state Resistance 1.0 0.011 0.016 0.0135 0.020 V Ω Dynamic Characteristics Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd Input Capacitance Output Capacitance Reverse Transfer Capacitance VGS =0 V, VDS =15V, f = 1MHz 1100 550 150 pF Dynamic Characteristics Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge(Miller Charge) VDS = 15V, VGS = 10V, ID = 10A (Note 2,3) VDD = 25V, ID = 1A, RG = 50Ω VGS = 10 V (Note 2,3) 13 30 165 65 33 5.2 8 25 60 260 120 43 nC ns - Source-Drain Diode Ratings and Characteristics Symbol IS VSD Parameter Continuous Source Diode Forward Current Diode Forward Voltage Test Conditions IS = 2.1A, VGS =0V (Note 2) Min. - Typ. - Max. 2.1 1.2 Unit. A V ※ NOTES 1. Repeativity rating : pulse width limited by junction temperature 2. Pulse Test : Pulse Width ≤ 300us, Duty Cycle ≤ 2% 3. Essentially independent of operating temperature. 4. Surface mounted on 1 inch2 Cu board. 2/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved. SFS4410 Fig 1. On-State Characteristics VGS 10.0 V 8.0 V 6.0 V 5.0 V 4.5 V 4.0 V 3.5 V Bottom : 3.0 V Top : Fig 2. Transfer Characteristics 10 1 ID, Drain Current [A] 10 1 ID, Drain Current [A] 150 C 10 0 o 25 C -55 C o o ※ Notes : 1. 250µ s Pulse Test 2. TC = 25℃ ※ Notes : 1. VDS = 15V 2. 250µ s Pulse Test 10 -1 10 0 10 0 10 -1 0 2 4 6 VDS, Drain-Source Voltage [V] VGS, Gate-Source Voltage [V] Fig 3. On Resistance Variation vs. Drain Current and Gate Voltage 30 Fig 4. On State Current vs. Allowable Case Temperature RDS(ON), Drain-Source On-Resistance [Ω ] IDR, Reverse Drain Current [A] 20 VGS = 4.5V 10 1 VGS = 10V 10 10 0 150℃ 25℃ ※ Notes : 1. VGS = 0V 2. 250µ s Pulse Test ※ Note : TJ = 25℃ 0 0 10 20 30 40 50 10 -1 0.2 0.4 0.6 0.8 1.0 1.2 1.4 ID, Drain Current [A] VSD, Source-Drain voltage [V] Fig 5. Capacitance Characteristics 2500 Ciss=Cgs+Cgd(Cds=shorted) Coss=Cds+Cgd Crss=Cgd Fig 6. Gate Charge Characteristics 12 VGS, Gate-Source Voltage [V] 2000 10 Capacitance [pF] 1500 Ciss Coss ※ Notes : 1. VGS = 0V 2. f=1MHz 8 VDS = 15V VDS = 24V 6 1000 4 500 Crss 0 0 5 10 15 20 25 2 ※ Note : ID = 10 A 0 0 5 10 15 20 25 30 35 40 VDS, Drain-Source Voltage [V] QG, Total Gate Charge [nC] 3/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved. SFS4410 Fig 7. Breakdown Voltage Variation vs. Junction Temperature 1.2 2.0 Fig 8. On-Resistance Variation vs. Junction Temperature BVDSS, (Normalized) Drain-Source Breakdown Voltage 1.1 RDS(ON), (Normalized) Drain-Source On-Resistance 1.5 1.0 1.0 0.9 ※ Notes : 1. VGS = 0 V 2. ID = 250 µ A 0.5 ※ Notes : 1. VGS = 10 V 2. ID = 10 A 0.8 -100 -50 0 50 100 o 150 200 0.0 -100 -50 0 50 100 o 150 200 TJ, Junction Temperature [ C] TJ, Junction Temperature [ C] Fig 9. Normalized Transient Thermal Response Curve 10 0 Zθ JC(t), Thermal Response D = 0 .5 0 .2 10 -1 0 .1 0 .0 5 0 .0 2 0 .0 1 s in g le p u ls e ※ N o te s : 1 . Z θ J C = 1 .0 ℃ /W M a x . (t) 2 . D u ty F a c to r, D = t 1 /t 2 3 . T J M - T C = P D M * Z θ J C t) ( 10 -2 10 -3 10 -4 10 -3 10 -2 10 -1 10 0 10 1 10 2 t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ] 4/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved. SFS4410 Fig. 10. Gate Charge Test Circuit & Waveforms 50KΩ 12V 200nF 300nF Same Type as DUT VDS VGS 10V Qgs Qg VGS Qgd DUT 1mA Charge Fig 11. Switching Time Test Circuit & Waveforms VDS RL VDD VDS 90% 10V V Pulse Generator RG DUT Vin 10% td(on) tr t on td(off) t off tf 5/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved. SFS4410 8-SOIC Package Dimension Dim. A B C D E F G H I J K mm Min. 1.35 0.1 0.38 0.19 4.8 3.8 5.8 0.5 0’ 0.250 Typ. 1.55 0.175 0.445 0.22 4.9 3.9 6 0.715 4’ 0.375 Max. 1.75 0.25 0.510 0.25 5 4 6.2 0.93 8’ 0.05 Min. 0.053 0.004 0.015 0.007 0.189 0.150 1.27 BSC 0.228 0.020 0’ 0.010 Inch Typ. 0.061 0.007 0.018 0.009 0.193 0.154 0.236 0.028 4’ 0.015 Max. 0.069 0.010 0.020 0.010 0.197 0.157 0.244 0.037 8’ 0.020 F 0.254(Gap plane) H E K × 45 ° A D J I G C B 0.1 6/6 Copyright@SemiWell Semiconductor Co., Ltd., All rights reserved.
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