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M95020-MN6

M95020-MN6

  • 厂商:

    STMICROELECTRONICS(意法半导体)

  • 封装:

    SO-8_4.9X3.9MM

  • 描述:

    IC EEPROM 2KBIT SPI 10MHZ 8SO

  • 数据手册
  • 价格&库存
M95020-MN6 数据手册
M95040 M95020 M95010 4 Kbit, 2 Kbit and 1 Kbit serial SPI bus EEPROM with high-speed clock Features ■ Compatible with SPI bus serial interface (Positive clock SPI modes) ■ Single supply voltage: – 4.5 V to 5.5 V for M950x0 – 2.5 V to 5.5 V for M950x0-W – 1.8 V to 5.5 V for M950x0-R ■ High speed – 10 MHz Clock rate, 5 ms write time ■ Status Register ■ Byte and Page Write (up to 16 bytes) ■ Self-timed programming cycle ■ Adjustable size read-only EEPROM area ■ Enhanced ESD protection ■ More than 1 Million write cycles ■ More than 40-year data retention ■ Packages – ECOPACK® (RoHS compliant) Table 1. SO8 (MN) 150 mil width TSSOP8 (DW) 169 mil width UFDFPN8 (MB) 2 × 3 mm Device summary Reference Part number M95040 M95040 M95040-W M95040-R M95020 M95020 M95020-W M95020-R M95010 M95010 M95010-W M95010-R March 2008 Rev 8 1/42 www.st.com 1 Contents M95040, M95020, M95010 Contents 1 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 2 Signal description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.1 Serial Data output (Q) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.2 Serial Data input (D) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.3 Serial Clock (C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.4 Chip Select (S) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.5 Hold (HOLD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 2.6 Write Protect (W) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.7 VSS ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.8 Supply voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.8.1 3 2.8.3 Device reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2.8.4 Power-down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Connecting to the SPI bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 3.1 4 2.8.2 Operating supply voltage VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Power-up conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 SPI modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Operating features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.1 Hold condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.2 Status Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.3 Data protection and protocol control . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 5 Memory organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 6 Instructions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 2/42 6.1 Write Enable (WREN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 6.2 Write Disable (WRDI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 6.3 Read Status Register (RDSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 6.3.1 WIP bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 6.3.2 WEL bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 6.3.3 BP1, BP0 bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 M95040, M95020, M95010 7 Contents 6.4 Write Status Register (WRSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 6.5 Read from Memory Array (READ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 6.6 Write to Memory Array (WRITE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 Power-up and delivery states . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 7.1 Power-up state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 7.2 Initial delivery state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 8 Maximum rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 9 DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 10 Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 11 Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 12 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 3/42 List of tables M95040, M95020, M95010 List of tables Table 1. Table 2. Table 3. Table 4. Table 5. Table 6. Table 7. Table 8. Table 9. Table 10. Table 11. Table 12. Table 13. Table 14. Table 15. Table 16. Table 17. Table 18. Table 19. Table 20. Table 21. Table 22. Table 23. Table 24. Table 25. Table 26. Table 27. Table 28. 4/42 Device summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Write-protected block size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Instruction set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Status Register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Address range bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Operating conditions (M950x0). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Operating conditions (M950x0-W) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Operating conditions (M950x0-R) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 AC test measurement conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 DC characteristics (M950x0, device grade 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 DC characteristics (M950x0-W, device grade 6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 DC characteristics (M950x0-W, device grade 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 DC characteristics (M950x0-R, device grade 6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 AC characteristics (M950x0, device grade 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 AC characteristics (M950x0-W, device grade 6). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 AC characteristics (M950x0-W, Device Grade 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 AC characteristics (M950x0-R, device grade 6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 SO8N — 8-lead plastic small outline, 150 mils body width, package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 TSSOP8 — 8-lead thin shrink small outline, package mechanical data . . . . . . . . . . . . . . . 36 UFDFPN8 (MLP8) — 8-lead ultra thin fine pitch dual flat package no lead 2 × 3mm, package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38 Available M95010 products (package, voltage range, temperature grade) . . . . . . . . . . . . 39 Available M95020 products (package, voltage range, temperature grade) . . . . . . . . . . . . 39 Available M95040 products (package, voltage range, temperature grade) . . . . . . . . . . . . 39 Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 M95040, M95020, M95010 List of figures List of figures Figure 1. Figure 2. Figure 3. Figure 4. Figure 5. Figure 6. Figure 7. Figure 8. Figure 9. Figure 10. Figure 11. Figure 12. Figure 13. Figure 14. Figure 15. Figure 16. Figure 17. Figure 18. Figure 19. Figure 20. Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 8-pin package connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 Bus master and memory devices on the SPI bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 SPI modes supported . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Hold condition activation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Write Enable (WREN) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Write Disable (WRDI) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Read Status Register (RDSR) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Write Status Register (WRSR) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Read from Memory Array (READ) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 Byte Write (WRITE) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 Page Write (WRITE) sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 AC test measurement I/O waveform. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Serial input timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Hold timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Output timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 SO8N — 8-lead plastic small outline 150 mils body width, package outline. . . . . . . . . . . . 35 TSSOP8 — 8-lead thin shrink small outline, package outline. . . . . . . . . . . . . . . . . . . . . . . 36 UFDFPN8 (MLP8) — 8-lead ultra thin fine pitch dual flat package no lead 2 × 3mm, package outline. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 5/42 Description 1 M95040, M95020, M95010 Description The M95040 is a 4 Kbit (512 x 8) electrically erasable programmable memory (EEPROM), accessed by a high speed SPI-compatible bus. The other members of the family (M95020 and M95010) are identical, though proportionally smaller (2 and 1 Kbit, respectively). Each device is accessed by a simple serial interface that is SPI-compatible. The bus signals are C, D and Q, as shown in Table 2 and Figure 1. The device is selected when Chip Select (S) is taken low. Communications with the device can be interrupted using Hold (HOLD). WRITE instructions are disabled by Write Protect (W). Figure 1. Logic diagram VCC D Q C S M95xxx W HOLD VSS AI01789C Figure 2. 8-pin package connections M95xxx S Q W VSS 1 2 3 4 8 7 6 5 VCC HOLD C D AI01790D 1. See Section 10: Package mechanical data for package dimensions, and how to identify pin-1. 6/42 M95040, M95020, M95010 Table 2. Description Signal names Signal name Function C Serial Clock D Serial Data input Q Serial Data output S Chip Select W Write Protect HOLD Hold VCC Supply voltage VSS Ground 7/42 Signal description 2 M95040, M95020, M95010 Signal description During all operations, VCC must be held stable and within the specified valid range: VCC(min) to VCC(max). All of the input and output signals can be held high or low (according to voltages of VIH, VOH, VIL or VOL, as specified in Table 13 to Table 16). These signals are described next. 2.1 Serial Data output (Q) This output signal is used to transfer data serially out of the device. Data is shifted out on the falling edge of Serial Clock (C). 2.2 Serial Data input (D) This input signal is used to transfer data serially into the device. It receives instructions, addresses, and the data to be written. Values are latched on the rising edge of Serial Clock (C). 2.3 Serial Clock (C) This input signal provides the timing of the serial interface. Instructions, addresses, or data present at Serial Data Input (D) are latched on the rising edge of Serial Clock (C). Data on Serial Data Output (Q) changes after the falling edge of Serial Clock (C). 2.4 Chip Select (S) When this input signal is high, the device is deselected and Serial Data Output (Q) is at high impedance. Unless an internal Write cycle is in progress, the device will be in the Standby Power mode. Driving Chip Select (S) low selects the device, placing it in the Active Power mode. After Power-up, a falling edge on Chip Select (S) is required prior to the start of any instruction. 2.5 Hold (HOLD) The Hold (HOLD) signal is used to pause any serial communications with the device without deselecting the device. During the Hold condition, the Serial Data Output (Q) is high impedance, and Serial Data Input (D) and Serial Clock (C) are Don’t Care. To start the Hold condition, the device must be selected, with Chip Select (S) driven low. 8/42 M95040, M95020, M95010 2.6 Signal description Write Protect (W) This input signal is used to control whether the memory is write protected. When Write Protect (W) is held low, writes to the memory are disabled, but other operations remain enabled. Write Protect (W) must either be driven high or low, but must not be left floating. 2.7 VSS ground VSS is the reference for the VCC supply voltage. 2.8 Supply voltage (VCC) 2.8.1 Operating supply voltage VCC Prior to selecting the memory and issuing instructions to it, a valid and stable VCC voltage within the specified [VCC(min), VCC(max)] range must be applied (see Table 8, Table 9 and Table 10). This voltage must remain stable and valid until the end of the transmission of the instruction and, for a Write instruction, until the completion of the internal write cycle (tW). In order to secure a stable DC supply voltage, it is recommended to decouple the VCC line with a suitable capacitor (usually of the order of 10 nF to 100 nF) close to the VCC/VSS package pins. 2.8.2 Power-up conditions When the power supply is turned on, VCC rises continuously from VSS to VCC. During this time, the Chip Select (S) line is not allowed to float but should follow the VCC voltage. It is therefore recommended to connect S line to VCC via a suitable pull-up resistor (see Figure 3). In addition, the Chip Select (S) input offers a built-in safety feature, as it is edge-sensitive as well as level-sensitive: after power-up, the device does not become selected until a falling edge has first been detected on Chip Select (S). This ensures that Chip Select (S) must have been high, prior to going low to start the first operation. The VCC rise time must not vary faster than 1 V/µs. 2.8.3 Device reset In order to prevent inadvertent Write operations during power-up (continuous rise of VCC), a power on reset (POR) circuit is included. At power-up, the device does not respond to any instruction until VCC has reached the power on reset threshold voltage (this threshold is lower than the minimum VCC operating voltage defined in Table 8, Table 9 and Table 10). 9/42 Signal description M95040, M95020, M95010 Once VCC has passed over the POR threshold, the device is reset and in the following state: ● Standby Power mode ● deselected (at next power-up, a falling edge is required on Chip Select (S) before any instructions can be started) ● not in the Hold condition ● Status Register: – the Write Enable Latch (WEL) is reset to 0 – Write In Progress (WIP) is reset to 0. (The SRWD, BP1 and BP0 bits of the Status Register are non-volatile bits and therefore remain unchanged) Note: Once VCC has passed the power on reset threshold voltage, until VCC reaches the minimum VCC operating voltage, the memory must not be selected/accessed. 2.8.4 Power-down At power-down (continuous decrease in VCC below the minimum VCC operating voltage), the device must be: 10/42 ● deselected (Chip Select S should be allowed to follow the voltage applied on VCC) ● in Standby Power mode (that should not be any internal write cycle in progress) M95040, M95020, M95010 3 Connecting to the SPI bus Connecting to the SPI bus These devices are fully compatible with the SPI protocol. All instructions, addresses and input data bytes are shifted in to the device, most significant bit first. The Serial Data Input (D) is sampled on the first rising edge of the Serial Clock (C) after Chip Select (S) goes low. All output data bytes are shifted out of the device, most significant bit first. The Serial Data Output (Q) is latched on the first falling edge of the Serial Clock (C) after the instruction (such as the Read from Memory Array and Read Status Register instructions) have been clocked into the device. Figure 3 shows an example of three memory devices connected to an MCU, on an SPI bus. Only one memory device is selected at a time, so only one memory device drives the Serial Data output (Q) line at a time, the other memory devices are high impedance. The pull-up resistor R (represented in Figure 3) ensures that a device is not selected if the bus master leaves the S line in the high impedance state. In applications where the bus master might enter a state where all SPI bus inputs/outputs would be in high impedance at the same time (for example, if the bus master is reset during the transmission of an Instruction), the clock line (C) must be connected to an external pulldown resistor so that, if all inputs/outputs become high impedance, the C line is pulled low (while the S line is pulled high): this ensures that S and C do not become high at the same time, and so, that the tSHCH requirement is met. The typical value of R is 100 kΩ. Figure 3. Bus master and memory devices on the SPI bus VSS VCC R SDO SPI Interface with (CPOL, CPHA) = (0, 0) or (1, 1) SDI SCK VCC C Q D Bus master SPI mmory device R CS3 VCC C Q D VSS VCC C Q D VSS SPI memory device R VSS SPI memory device R CS2 CS1 S W HOLD S W HOLD S W HOLD AI12304b 1. The Write Protect (W) and Hold (HOLD) signals should be driven, high or low as appropriate. 11/42 Connecting to the SPI bus 3.1 M95040, M95020, M95010 SPI modes These devices can be driven by a microcontroller with its SPI peripheral running in either of the two following modes: ● CPOL=0, CPHA=0 ● CPOL=1, CPHA=1 For these two modes, input data is latched in on the rising edge of Serial Clock (C), and output data is available from the falling edge of Serial Clock (C). The difference between the two modes, as shown in Figure 4, is the clock polarity when the bus master is in Stand-by mode and not transferring data: ● C remains at 0 for (CPOL=0, CPHA=0) ● C remains at 1 for (CPOL=1, CPHA=1) Figure 4. SPI modes supported CPOL CPHA 0 0 C 1 1 C D Q MSB MSB AI01438B 12/42 M95040, M95020, M95010 4 Operating features 4.1 Hold condition Operating features The Hold (HOLD) signal is used to pause any serial communications with the device without resetting the clocking sequence. During the Hold condition, the Serial Data Output (Q) is high impedance, and Serial Data Input (D) and Serial Clock (C) are Don’t Care. To enter the Hold condition, the device must be selected, with Chip Select (S) low. Normally, the device is kept selected, for the whole duration of the Hold condition. Deselecting the device while it is in the Hold condition, has the effect of resetting the state of the device, and this mechanism can be used if it is required to reset any processes that had been in progress. The Hold condition starts when the Hold (HOLD) signal is driven low at the same time as Serial Clock (C) already being low (as shown in Figure 5). The Hold condition ends when the Hold (HOLD) signal is driven high at the same time as Serial Clock (C) already being low. Figure 5 also shows what happens if the rising and falling edges are not timed to coincide with Serial Clock (C) being low. Figure 5. Hold condition activation C HOLD Hold Condition Hold Condition AI02029D 4.2 Status Register Figure 6 shows the position of the Status Register in the control logic of the device. This register contains a number of control bits and status bits, as shown in Table 5. For a detailed description of the Status Register bits, see Section 6.3: Read Status Register (RDSR). 13/42 Operating features 4.3 M95040, M95020, M95010 Data protection and protocol control To help protect the device from data corruption in noisy or poorly controlled environments, a number of safety features have been built in to the device. The main security measures can be summarized as follows: ● The WEL bit is reset at power-up. ● Chip Select (S) must rise after the eighth clock count (or multiple thereof) in order to start a non-volatile Write cycle (in the memory array or in the Status Register). ● Accesses to the memory array are ignored during the non-volatile programming cycle, and the programming cycle continues unaffected. ● Invalid Chip Select (S) and Hold (HOLD) transitions are ignored. For any instruction to be accepted and executed, Chip Select (S) must be driven high after the rising edge of Serial Clock (C) that latches the last bit of the instruction, and before the next rising edge of Serial Clock (C). For this, “the last bit of the instruction” can be the eighth bit of the instruction code, or the eighth bit of a data byte, depending on the instruction (except in the case of RDSR and READ instructions). Moreover, the "next rising edge of CLOCK" might (or might not) be the next bus transaction for some other device on the bus. When a Write cycle is in progress, the device protects it against external interruption by ignoring any subsequent READ, WRITE or WRSR instruction until the present cycle is complete. Table 3. Write-protected block size Status Register bits Protected array addresses Protected block 14/42 BP1 BP0 M95040 M95020 M95010 0 0 none none none none 0 1 Upper quarter 180h - 1FFh C0h - FFh 60h - 7Fh 1 0 Upper half 100h - 1FFh 80h - FFh 40h - 7Fh 1 1 Whole memory 000h - 1FFh 00h - FFh 00h - 7Fh M95040, M95020, M95010 Memory organization The memory is organized as shown in Figure 6. Figure 6. Block diagram HOLD W High Voltage Generator Control Logic S C D I/O Shift Register Q Address Register and Counter Data Register Status Register Size of the Read only EEPROM area Y Decoder 5 Memory organization 1 Page X Decoder AI01272C 15/42 Instructions 6 M95040, M95020, M95010 Instructions Each instruction starts with a single-byte code, as summarized in Table 4. If an invalid instruction is sent (one not contained in Table 4), the device automatically deselects itself. Table 4. Instruction set Instruction Description Instruction Format WREN Write Enable 0000 X110(1) WRDI Write Disable 0000 X100(1) RDSR Read Status Register 0000 X101(1) WRSR Write Status Register 0000 X001(1) READ Read from Memory Array 0000 A8011(2) WRITE Write to Memory Array 0000 A8010(2) 1. X = Don’t Care. 2. A8 = 1 for the upper half of the memory array of the M95040, and 0 for the lower half, and is Don’t Care for other devices. 6.1 Write Enable (WREN) The Write Enable Latch (WEL) bit must be set prior to each WRITE and WRSR instruction. The only way to do this is to send a Write Enable instruction to the device. As shown in Figure 7, to send this instruction to the device, Chip Select (S) is driven low, and the bits of the instruction byte are shifted in, on Serial Data Input (D). The device then enters a wait state. It waits for a the device to be deselected, by Chip Select (S) being driven high. Figure 7. Write Enable (WREN) sequence S 0 1 2 3 4 5 6 7 C Instruction D High Impedance Q AI01441D 16/42 M95040, M95020, M95010 6.2 Instructions Write Disable (WRDI) One way of resetting the Write Enable Latch (WEL) bit is to send a Write Disable instruction to the device. As shown in Figure 8, to send this instruction to the device, Chip Select (S) is driven low, and the bits of the instruction byte are shifted in, on Serial Data Input (D). The device then enters a wait state. It waits for a the device to be deselected, by Chip Select (S) being driven high. The Write Enable Latch (WEL) bit, in fact, becomes reset by any of the following events: ● Power-up ● WRDI instruction execution ● WRSR instruction completion ● WRITE instruction completion ● Write Protect (W) line being held low. Figure 8. Write Disable (WRDI) sequence S 0 1 2 3 4 5 6 7 C Instruction D High Impedance Q AI03790D 17/42 Instructions 6.3 M95040, M95020, M95010 Read Status Register (RDSR) One of the major uses of this instruction is to allow the MCU to poll the state of the Write In Progress (WIP) bit. This is needed because the device will not accept further WRITE or WRSR instructions when the previous Write cycle is not yet finished. As shown in Figure 9, to send this instruction to the device, Chip Select (S) is first driven low. The bits of the instruction byte are then shifted in, on Serial Data Input (D). The current state of the bits in the Status Register is shifted out, on Serial Data Out (Q). The Read Cycle is terminated by driving Chip Select (S) high. The Status Register may be read at any time, even during a Write cycle (whether it be to the memory area or to the Status Register). All bits of the Status Register remain valid, and can be read using the RDSR instruction. However, during the current Write cycle, the values of the non-volatile bits (BP0, BP1) become frozen at a constant value. The updated value of these bits becomes available when a new RDSR instruction is executed, after completion of the Write cycle. On the other hand, the two read-only bits (Write Enable Latch (WEL), Write In Progress (WIP)) are dynamically updated during the on-going Write cycle. Bits b7, b6, b5 and b4 are always read as 1. The status and control bits of the Status Register are as follows: 6.3.1 WIP bit The Write In Progress (WIP) bit indicates whether the memory is busy with a Write or Write Status Register cycle. When set to 1, such a cycle is in progress, when reset to 0 no such cycle is in progress. 6.3.2 WEL bit The Write Enable Latch (WEL) bit indicates the status of the internal Write Enable Latch. When set to 1 the internal Write Enable Latch is set, when set to 0 the internal Write Enable Latch is reset and no Write or Write Status Register instruction is accepted. 6.3.3 BP1, BP0 bits The Block Protect (BP1, BP0) bits are non-volatile. They define the size of the area to be software protected against Write instructions. These bits are written with the Write Status Register (WRSR) instruction. When one or both of the Block Protect (BP1, BP0) bits is set to 1, the relevant memory area (as defined in Table 3) becomes protected against Write (WRITE) instructions. The Block Protect (BP1, BP0) bits can be written provided that the Hardware Protected mode has not been set. Table 5. Status Register format b7 1 b0 1 1 1 BP1 BP0 WEL WIP Block Protect bits Write Enable Latch bit Write In Progress bit 18/42 M95040, M95020, M95010 Figure 9. Instructions Read Status Register (RDSR) sequence S 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 C Instruction D Status Register Out Status Register Out High Impedance Q 7 MSB 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0 7 MSB AI01444D 19/42 Instructions 6.4 M95040, M95020, M95010 Write Status Register (WRSR) This instruction has no effect on bits b7, b6, b5, b4, b1 and b0 of the Status Register. As shown in Figure 10, to send this instruction to the device, Chip Select (S) is first driven low. The bits of the instruction byte and data byte are then shifted in on Serial Data Input (D). The instruction is terminated by driving Chip Select (S) high. Chip Select (S) must be driven high after the rising edge of Serial Clock (C) that latches the eighth bit of the data byte, and before the next rising edge of Serial Clock (C). If this condition is not met, the Write Status Register (WRSR) instruction is not executed. The self-timed Write Cycle starts, and continues for a period tW (as specified in Table 13 to Table 20), at the end of which the Write in Progress (WIP) bit is reset to 0. The instruction is not accepted, and is not executed, under the following conditions: ● if the Write Enable Latch (WEL) bit has not been set to 1 (by executing a Write Enable instruction just before) ● if a Write Cycle is already in progress ● if the device has not been deselected, by Chip Select (S) being driven high, after the eighth bit, b0, of the data byte has been latched in ● if Write Protect (W) is low. Figure 10. Write Status Register (WRSR) sequence S 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 C Instruction Status Register In 7 D High Impedance 6 5 4 3 2 1 0 MSB Q AI01445B 20/42 M95040, M95020, M95010 6.5 Instructions Read from Memory Array (READ) As shown in Figure 11, to send this instruction to the device, Chip Select (S) is first driven low. The bits of the instruction byte and address byte are then shifted in, on Serial Data Input (D). For the M95040, the most significant address bit, A8, is incorporated as bit b3 of the instruction byte, as shown in Table 4. The address is loaded into an internal address register, and the byte of data at that address is shifted out, on Serial Data Output (Q). If Chip Select (S) continues to be driven low, an internal bit-pointer is automatically incremented at each clock cycle, and the corresponding data bit is shifted out. When the highest address is reached, the address counter rolls over to zero, allowing the Read cycle to be continued indefinitely. The whole memory can, therefore, be read with a single READ instruction. The Read cycle is terminated by driving Chip Select (S) high. The rising edge of the Chip Select (S) signal can occur at any time during the cycle. The first byte addressed can be any byte within any page. The instruction is not accepted, and is not executed, if a Write cycle is currently in progress. Table 6. Address range bits Device Address Bits M95040 M95020 M95010 A8-A0 A7-A0 A6-A0 Figure 11. Read from Memory Array (READ) sequence S 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 C Instruction D A8 Byte Address A7 A6 A5 A4 A3 A2 A1 A0 Data Out High Impedance Q 7 6 5 4 3 2 1 0 AI01440E 1. Depending on the memory size, as shown in Table 6, the most significant address bits are Don’t Care. 21/42 Instructions 6.6 M95040, M95020, M95010 Write to Memory Array (WRITE) As shown in Figure 12, to send this instruction to the device, Chip Select (S) is first driven low. The bits of the instruction byte, address byte, and at least one data byte are then shifted in, on Serial Data input (D). The instruction is terminated by driving Chip Select (S) high at a byte boundary of the input data. The self-timed Write cycle, triggered by the rising edge of Chip Select (S), continues for a period tW (as specified in Table 13 to Table 20). After this time, the Write in Progress (WIP) bit is reset to 0. In the case of Figure 12, Chip Select (S) is driven high after the eighth bit of the data byte has been latched in, indicating that the instruction is being used to write a single byte. If, though, Chip Select (S) continues to be driven low, as shown in Figure 13, the next byte of input data is shifted in, so that more than a single byte, starting from the given address towards the end of the same page, can be written in a single internal Write cycle. If Chip Select (S) still continues to be driven low, the next byte of input data is shifted in, and used to overwrite the byte at the start of the current page. The instruction is not accepted, and is not executed, under the following conditions: ● if the Write Enable Latch (WEL) bit has not been set to 1 (by executing a Write Enable instruction just before) ● if a Write cycle is already in progress ● if the device has not been deselected, by Chip Select (S) being driven high, at a byte boundary (after the rising edge of Serial Clock (C) that latches the last data bit, and before the next rising edge of Serial Clock (C) occurs anywhere on the bus) ● if Write Protect (W) is low or if the addressed page is in the region protected by the Block Protect (BP1 and BP0) bits. Figure 12. Byte Write (WRITE) sequence S 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 C Instruction D A8 Byte Address A7 A6 A5 A4 A3 A2 A1 A0 7 Data Byte 6 5 4 3 2 1 0 High Impedance Q AI01442D 1. Depending on the memory size, as shown in Table 6, the most significant address bits are Don’t Care. 22/42 M95040, M95020, M95010 Instructions Figure 13. Page Write (WRITE) sequence S 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 C Instruction Byte Address A8 D Data Byte 1 A7 A6 A5 A4 A3 A2 A1 A0 7 6 5 4 3 2 1 0 7 143 142 141 140 139 138 137 136 15+8N 14+8N 13+8N 12+8N 11+8N 10+8N 9+8N 24 25 26 27 28 29 30 31 8+8N S C Data Byte 2 D 7 6 5 4 3 2 Data Byte N 1 0 7 6 5 4 3 2 Data Byte 16 1 0 7 6 5 4 3 2 1 0 AI01443D 1. Depending on the memory size, as shown in Table 6, the most significant address bits are Don’t Care. 23/42 Power-up and delivery states 7 Power-up and delivery states 7.1 Power-up state M95040, M95020, M95010 After Power-up, the device is in the following state: ● low power Standby Power mode ● deselected (after Power-up, a falling edge is required on Chip Select (S) before any instructions can be started). ● not in the Hold Condition ● the Write Enable Latch (WEL) is reset to 0 ● Write In Progress (WIP) is reset to 0 The BP1 and BP0 bits of the Status Register are unchanged from the previous power-down (they are non-volatile bits). 7.2 Initial delivery state The device is delivered with the memory array set at all 1s (FFh). The Block Protect (BP1 and BP0) bits are initialized to 0. 24/42 M95040, M95020, M95010 8 Maximum rating Maximum rating Stressing the device outside the ratings listed in Table 7 may cause permanent damage to the device. These are stress ratings only, and operation of the device at these, or any other conditions outside those indicated in the operating sections of this specification, is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. Table 7. Absolute maximum ratings Symbol TA TSTG TLEAD Parameter Min. Max. Unit Ambient operating temperature –40 130 °C Storage temperature –65 150 °C (1) °C Lead temperature during soldering see note VO Output voltage –0.50 VCC+0.6 V VI Input voltage –0.50 6.5 V –0.50 6.5 V –4000 4000 V VCC VESD Supply voltage Electrostatic discharge voltage (human body model)(2) 1. Compliant with JEDEC Std J-STD-020C (for small body, Sn-Pb or Pb assembly), the ST ECOPACK® 7191395 specification, and the European directive on Restrictions on Hazardous Substances (RoHS) 2002/95/EU. 2. AEC-Q100-002 (compliant with JEDEC Std JESD22-A114, C1=100pF, R1=1500Ω, R2=500Ω) 25/42 DC and AC parameters 9 M95040, M95020, M95010 DC and AC parameters This section summarizes the operating and measurement conditions, and the DC and AC characteristics of the device. The parameters in the DC and AC characteristic tables that follow are derived from tests performed under the measurement conditions summarized in the relevant tables. Designers should check that the operating conditions in their circuit match the measurement conditions when relying on the quoted parameters. Table 8. Operating conditions (M950x0) Symbol VCC TA Table 9. Parameter Min. Max. Unit Supply voltage 4.5 5.5 V Ambient operating temperature (device grade 3) –40 125 °C Min. Max. Unit Supply voltage 2.5 5.5 V Ambient operating temperature (device grade 6) –40 85 °C Ambient operating temperature (device grade 3) –40 125 °C Operating conditions (M950x0-W) Symbol VCC TA Table 10. Parameter Operating conditions (M950x0-R) Symbol VCC TA Table 11. Parameter Min. Max. Unit Supply voltage 1.8 5.5 V Ambient operating temperature –40 85 °C Min. Max. Unit AC test measurement conditions Symbol CL Parameter Load capacitance 30 Input rise and fall times 50 ns Input pulse voltages 0.2VCC to 0.8VCC V Input and output timing reference voltages 0.3VCC to 0.7VCC V 1. Output Hi-Z is defined as the point where data out is no longer driven. Figure 14. AC test measurement I/O waveform Input Levels 0.8VCC 0.2VCC Input and Output Timing Reference Levels 0.7VCC 0.3VCC AI00825B 26/42 pF M95040, M95020, M95010 Table 12. Symbol COUT CIN DC and AC parameters Capacitance Parameter Test condition Max. Unit VOUT = 0V 8 pF Input Capacitance (D) VIN = 0V 8 pF Input Capacitance (other pins) VIN = 0V 6 pF Max. Unit VIN = VSS or VCC ±2 µA S = VCC, VOUT = VSS or VCC ±2 µA C = 0.1VCC/0.9VCC at 5 MHz, VCC = 5 V, Q = open 3 mA S = VCC, VIN = VSS or VCC VCC = 5 V 5 µA Output Capacitance (Q) Min. 1. Sampled only, not 100% tested, at TA=25°C and a frequency of 5MHz. Table 13. Symbol DC characteristics (M950x0, device grade 3) Parameter Test condition Min. ILI Input leakage current ILO Output leakage current ICC Supply current ICC1 Supply current (Standby Power mode) VIL Input low voltage –0.45 0.3 VCC V VIH Input high voltage 0.7 VCC VCC+1 V VOL Output low voltage IOL = 2 mA, VCC = 5 V 0.4 V VOH Output high voltage IOH = –2 mA, VCC = 5 V Table 14. Symbol 0.8 VCC V DC characteristics (M950x0-W, device grade 6) Parameter Test condition Min. Max. Unit VIN = VSS or VCC ±2 µA S = VCC, VOUT = VSS or VCC ±2 µA C = 0.1VCC/0.9VCC at 5 MHz, VCC = 2.5 V, Q = open 2 mA S = VCC, VIN = VSS or VCC VCC = 2.5 V 1 µA ILI Input leakage current ILO Output leakage current ICC Supply current ICC1 Supply current (Standby Power mode) VIL Input low voltage –0.45 0.3 VCC V VIH Input high voltage 0.7 VCC VCC+1 V VOL Output low voltage IOL = 1.5 mA, VCC = 2.5 V 0.4 V VOH Output high voltage IOH = –0.4 mA, VCC = 2.5 V 0.8 VCC V 27/42 DC and AC parameters Table 15. Symbol DC characteristics (M950x0-W, device grade 3) Parameter Test condition Min. Max. Unit VIN = VSS or VCC ±2 µA ILI Input leakage current ILO Output leakage current S = VCC, VOUT = VSS or VCC ±2 µA ICC Supply current C = 0.1VCC/0.9VCC at 5 MHz, VCC = 2.5 V, Q = open 2 mA ICC1 Supply current (Standby Power mode) S = VCC, VIN = VSS or VCC VCC = 2.5 V 2 µA VIL Input low voltage –0.45 0.3 VCC V VIH Input high voltage 0.7 VCC VCC+1 V VOL Output low voltage IOL = 1.5 mA, VCC = 2.5 V 0.4 V VOH Output high voltage IOH = –0.4 mA, VCC = 2.5 V Table 16. Symbol 0.8 VCC V DC characteristics (M950x0-R, device grade 6) Parameter Test condition Min. Max. Unit ILI Input leakage current VIN = VSS or VCC ±2 µA ILO Output leakage current S = VCC, voltage applied on Q = VSS or VCC ±2 µA mA ICCR VCC = 2.5 V, C = 0.1 VCC or 0.9VCC, fC = 5 MHz, Q = open 3 Supply current (Read) VCC = 1.8 V, C = 0.1VCC or 0.9VCC at max clock frequency, Q = open 2 mA VCC = 5.0 V, S = VCC, VIN = VSS or VCC 2 µA VCC = 2.5 V, S = VCC, VIN = VSS or VCC 1 µA VCC = 1.8 V, S = VCC, VIN = VSS or VCC 1 µA ICC1 Supply current (Standby) VIL Input low voltage VIH Input high voltage VOL Output low voltage VOH 28/42 M95040, M95020, M95010 2.5V < VCC < 5.5V –0.45 0.3VCC V 1.8V < VCC < 2.5V –0.45 0.25VCC V 2.5V < VCC < 5.5V 0.7VCC VCC+1 V 1.8V < VCC < 2.5V 0.75VCC VCC+1 V VCC = 2.5 V, IOL = 1.5 mA, or VCC = 5.5 V, IOL = 2 mA 0.2VCC V VCC = 1.8 V, IOL = 0.15 mA 0.3 V VCC = 2.5 V, IOH = –0.4 mA, Output high voltage or VCC = 5.5 V, IOH = –2 mA, or VCC = 1.8 V, IOH = –0.1 mA 0.8VCC V M95040, M95020, M95010 Table 17. DC and AC parameters AC characteristics (M950x0, device grade 3) Test conditions specified in Table 11 and Table 8 Symbol Alt. fC fSCK Clock frequency tSLCH tCSS1 S active setup time 90 ns tSHCH tCSS2 S not active setup time 90 ns tSHSL tCS S deselect time 100 ns tCHSH tCSH S active hold time 90 ns S not active hold time 90 ns tCHSL Parameter Min. Max. Unit D.C. 5 MHz tCH(1) tCLH Clock high time 90 ns tCL(1) 90 ns tCLL Clock low time tCLCH (2) tRC Clock rise time 1 µs tCHCL (2) tFC Clock fall time 1 µs tDVCH tDSU Data in setup time 20 ns tCHDX tDH Data in hold time 30 ns tHHCH Clock low hold time after HOLD not active 70 ns tHLCH Clock low hold time after HOLD active 40 ns tCLHL Clock low setup time before HOLD active 0 ns tCLHH Clock low setup time before HOLD not active 0 ns tSHQZ (2) tDIS tCLQV tV tCLQX Output disable time 100 ns Clock low to output valid 60 ns tHO Output hold time tQLQH (2) 0 ns tRO Output rise time 50 ns tQHQL (2) tFO Output fall time 50 ns tHHQV tLZ HOLD high to output valid 50 ns tHLQZ(2) tHZ HOLD low to output high-Z 100 ns tW tWC Write time 5 ms 1. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max) 2. Value guaranteed by characterization, not 100% tested in production. 29/42 DC and AC parameters Table 18. M95040, M95020, M95010 AC characteristics (M950x0-W, device grade 6) Test conditions specified in Table 11 and Table 9 Symbol Alt. fC fSCK Clock frequency tSLCH tCSS1 S active setup time 15 ns tSHCH tCSS2 S not active setup time 15 ns tSHSL tCS S deselect time 40 ns tCHSH tCSH S active hold time 25 ns S not active hold time 15 ns tCHSL Parameter Max. Unit D.C. 10 MHz tCH(1) tCLH Clock high time 40 ns tCL(1) 40 ns tCLL Clock low time tCLCH (2) tRC Clock rise time 1 µs tCHCL (2) tFC Clock fall time 1 µs tDVCH tDSU Data in setup time 15 ns tCHDX tDH Data in hold time 15 ns tHHCH Clock low hold time after HOLD not active 15 ns tHLCH Clock low hold time after HOLD active 20 ns tCLHL Clock low setup time before HOLD active 0 ns tCLHH Clock low setup time before HOLD not active 0 ns tSHQZ(2) tDIS tCLQV tV tCLQX tHO Output hold time tQLQH(2) tRO Output rise time 20 ns tQHQL(2) tFO Output fall time 20 ns tHHQV tLZ HOLD high to output valid 25 ns tHLQZ(2) tHZ HOLD low to output high-Z 35 ns tW tWC Write time 5 ms Output disable time 25 ns Clock low to output valid 35 ns 1. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max) 2. Value guaranteed by characterization, not 100% tested in production. 30/42 Min. 0 ns M95040, M95020, M95010 Table 19. DC and AC parameters AC characteristics (M950x0-W, Device Grade 3) Test conditions specified in Table 11 and Table 9 Symbol Alt. fC fSCK Clock frequency tSLCH tCSS1 S active setup time 90 ns tSHCH tCSS2 S not active setup time 90 ns tSHSL tCS S deselect time 100 ns tCHSH tCSH S active hold time 90 ns S not active hold time 90 ns tCHSL Parameter Min. Max. Unit D.C. 5 MHz tCH(1) tCLH Clock high time 90 ns (1) 90 ns tCLL Clock low time tCLCH(2) tRC Clock rise time 1 µs tCHCL(2) tFC Clock fall time 1 µs tDVCH tDSU Data in setup time 20 ns tCHDX tDH Data in hold time 30 ns tHHCH Clock low hold time after HOLD not active 70 ns tHLCH Clock low hold time after HOLD active 40 ns tCLHL Clock low setup time before HOLD active 0 ns tCLHH Clock low setup time before HOLD not active 0 ns tCL tSHQZ(2) tDIS tCLQV tV tCLQX tHO Output hold time tQLQH(2) tRO Output rise time 50 ns (2) tFO Output fall time 50 ns tHHQV tLZ HOLD high to output valid 50 ns tHLQZ(2) tHZ HOLD low to output high-Z 100 ns tW tWC Write time 5 ms tQHQL Output disable time 100 ns Clock low to output valid 60 ns 0 ns 1. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max) 2. Value guaranteed by characterization, not 100% tested in production. 31/42 DC and AC parameters Table 20. M95040, M95020, M95010 AC characteristics (M950x0-R, device grade 6) Test conditions specified in Table 11 and Table 10 Symbol Alt. fC fSCK Clock frequency tSLCH tCSS1 S active setup time 90 ns tSHCH tCSS2 S not active setup time 90 ns tSHSL tCS S deselect time 100 ns tCHSH tCSH S active hold time 90 ns S not active hold time 90 ns tCHSL Parameter Min. Max. Unit D.C. 5 MHz tCH(1) tCLH Clock high time 90 ns tCL(1) 90 ns tCLL Clock low time tCLCH (2) tRC Clock rise time 1 µs tCHCL (2) tFC Clock fall time 1 µs tDVCH tDSU Data in setup time 20 ns tCHDX tDH Data in hold time 30 ns tHHCH Clock low hold time after HOLD not active 70 ns tHLCH Clock low hold time after HOLD active 40 ns tCLHL Clock low setup time before HOLD active 0 ns tCLHH Clock low setup time before HOLD not active 0 ns tSHQZ(2) tDIS tCLQV tV tCLQX tHO Output hold time tQLQH(2) tRO Output rise time 50 ns tQHQL(2) tFO Output fall time 50 ns tHHQV tLZ HOLD high to output valid 50 ns tHLQZ(2) tHZ HOLD low to output high-Z 100 ns tW tWC Write time 5 ms Output disable time 100 ns Clock low to output valid 60 ns 0 1. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max) 2. Value guaranteed by characterization, not 100% tested in production. 32/42 ns M95040, M95020, M95010 DC and AC parameters Figure 15. Serial input timing tSHSL S tCHSL tSLCH tCHSH tSHCH C tDVCH tCHCL tCHDX LSB IN MSB IN D Q tCLCH High Impedance AI01447C Figure 16. Hold timing S tHLCH tCLHL tHHCH C tCLHH tHLQZ tHHQV Q D HOLD AI01448B 33/42 DC and AC parameters M95040, M95020, M95010 Figure 17. Output timing S tCH C tCLQV tCLQX tCLQV tCL tSHQZ tCLQX LSB OUT Q tQLQH tQHQL D ADDR.LSB IN AI01449e 34/42 M95040, M95020, M95010 10 Package mechanical data Package mechanical data In order to meet environmental requirements, ST offers the M95040 in ECOPACK® packages. These packages have a lead-free second level interconnect. The category of second level interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are available at www.st.com. Figure 18. SO8N — 8-lead plastic small outline 150 mils body width, package outline h x 45˚ A2 A c ccc b e 0.25 mm GAUGE PLANE D k 8 E1 E 1 A1 L L1 SO-A 1. Drawing is not to scale. Table 21. SO8N — 8-lead plastic small outline, 150 mils body width, package mechanical data inches(1) millimeters Symbol Typ Min A Max Typ Min 1.75 Max 0.0689 A1 0.1 A2 1.25 b 0.28 0.48 0.011 0.0189 c 0.17 0.23 0.0067 0.0091 ccc 0.25 0.0039 0.0098 0.0492 0.1 0.0039 D 4.9 4.8 5 0.1929 0.189 0.1969 E 6 5.8 6.2 0.2362 0.2283 0.2441 E1 3.9 3.8 4 0.1535 0.1496 0.1575 e 1.27 - - 0.05 - - h 0.25 0.5 0.0098 0.0197 k 0° 8° 0° 8° L 0.4 1.27 0.0157 0.05 L1 1.04 0.0409 1. Values in inches are converted from mm and rounded to 4 decimal digits. 35/42 Package mechanical data M95040, M95020, M95010 Figure 19. TSSOP8 — 8-lead thin shrink small outline, package outline D 8 5 c E1 1 E 4 α A1 A L A2 L1 CP b e TSSOP8AM 1. Drawing is not to scale. Table 22. TSSOP8 — 8-lead thin shrink small outline, package mechanical data inches(1) millimeters Symbol Typ Min A Max 0.05 0.15 0.8 1.05 b 0.19 c 0.09 1 CP Max 0.0472 0.002 0.0059 0.0315 0.0413 0.3 0.0075 0.0118 0.2 0.0035 0.0079 0.0394 0.1 0.0039 D 3 2.9 3.1 0.1181 0.1142 0.122 e 0.65 - - 0.0256 - - E 6.4 6.2 6.6 0.252 0.2441 0.2598 E1 4.4 4.3 4.5 0.1732 0.1693 0.1772 L 0.6 0.45 0.75 0.0236 0.0177 0.0295 L1 1 0° 8° 0.0394 α 0° N (number of leads) 8 8° 1. Values in inches are converted from mm and rounded to 4 decimal digits. 36/42 Min 1.2 A1 A2 Typ 8 M95040, M95020, M95010 Package mechanical data Figure 20. UFDFPN8 (MLP8) — 8-lead ultra thin fine pitch dual flat package no lead 2 × 3mm, package outline e D b L1 L3 E E2 L A D2 ddd A1 UFDFPN-01 1. Drawing is not to scale. Table 23. UFDFPN8 (MLP8) — 8-lead ultra thin fine pitch dual flat package no lead 2 × 3mm, package mechanical data inches(1) millimeters Symbol Typ Min Max Typ Min Max A 0.55 0.45 0.6 0.0217 0.0177 0.0236 A1 0.02 0 0.05 0.0008 0 0.002 b 0.25 0.2 0.3 0.0098 0.0079 0.0118 D 2 1.9 2.1 0.0787 0.0748 0.0827 D2 1.6 1.5 1.7 0.063 0.0591 0.0669 E 3 2.9 3.1 0.1181 0.1142 0.122 E2 0.2 0.1 0.3 0.0079 0.0039 0.0118 e 0.5 - - 0.0197 - - L 0.45 0.4 0.5 0.0177 0.0157 0.0197 L1 0.15 0.0059 L3 0.3 0.0118 ddd(2) 0.08 0.08 1. Values in inches are converted from mm and rounded to 4 decimal digits. 2. Applied for exposed die paddle and terminals. Exclude embedding part of exposed die paddle from measuring. 37/42 Part numbering 11 M95040, M95020, M95010 Part numbering Table 24. Ordering information scheme Example: M95040 – W MN 6 T P /W Device type M95 = SPI serial access EEPROM Device function 040 = 4 Kbit (512 x 8) 020 = 2 Kbit (256 x 8) 010 = 1 Kbit (128 x 8) Operating voltage blank = VCC = 4.5 to 5.5V W = VCC = 2.5 to 5.5V R = VCC = 1.8 to 5.5V Package MN = SO8 (150 mil width) DW = TSSOP8 (169 mil width) MB = UFDFPN8 (MLP8) 2 × 3mm Device grade 6 = Industrial temperature range, –40 to 85 °C. Device tested with standard test flow 3 = Device tested with high reliability certified flow(1). Automotive temperature range (–40 to 125 °C) Option blank = Standard packing T = Tape and reel packing Plating technology P or G = ECOPACK® (RoHS compliant) Process(2) /W, /G or /S = F6SP36% 1. ST strongly recommends the use of the Automotive Grade devices for use in an automotive environment. The high reliability certified flow (HRCF) is described in the quality note QNEE9801. Please ask your nearest ST sales office for a copy. 2. Used only for device grade 3 For a list of available options (speed, package, etc.) or for further information on any aspect of this device, please contact your nearest ST sales office. 38/42 M95040, M95020, M95010 Table 25. Part numbering Available M95010 products (package, voltage range, temperature grade) Package M95010-R 1.8 V to 5.5 V M95010-W 2.5 V to 5.5 V M95010 4.5 V to 5.5 V SO8N (MN) Range6 Range6 Range3 TSSOP8 (DW) Range6 Range6 - MLP8 (MB) - - - Table 26. Available M95020 products (package, voltage range, temperature grade) Package M95020-R 1.8 V to 5.5 V M95020-W 2.5 V to 5.5 V M95020 4.5 V to 5.5 V SO8N (MN) Range6 Range6, Range3 Range3 TSSOP8 (DW) Range6 Range6 - MLP8 (MB) Range6 - - Table 27. Available M95040 products (package, voltage range, temperature grade) Package M95040-R 1.8 V to 5.5 V M95040-W 2.5 V to 5.5 V M95040 4.5 V to 5.5 V SO8N (MN) Range6 Range6, Range3 Range3 TSSOP8 (DW) Range6 Range6, Range3 - MLP8 (MB) Range6 - - 39/42 Revision history 12 M95040, M95020, M95010 Revision history Table 28. Document revision history Date Version 10-May-2000 2.2 s/issuing three bytes/issuing two bytes/ in the 2nd sentence of the Byte Write Operation 16-Mar-2001 2.3 Human Body Model meets JEDEC std (Table 2). Minor adjustments to Figs 7,9,10,11 & Tab 9. Wording changes, according to the standard glossary Illustrations and Package Mechanical data updated 19-Jul-2001 2.4 Temperature range ‘3’ added to the -W supply voltage range in DC and AC characteristics 11-Oct-2001 3.0 Document reformatted using the new template 26-Feb-2002 3.1 Description of chip deselect after 8th clock pulse made more explicit 27-Sep-2002 3.2 Position of A8 in Read Instruction Sequence Figure corrected. Load Capacitance CL changed 24-Oct-2002 3.3 Minimum values for tCHHL and tCHHH changed. 24-Feb-2003 3.4 Description of Read from Memory Array (READ) instruction corrected, and clarified 28-May-2003 3.5 New products, identified by the process letter W, added 25-Jun-2003 3.6 Correction to current products, identified by the process letter K not L. ICC changed in DC characteristics, and tCHHL, tCHHH substituted in AC characteristics Voltage range -S upgraded by removing it, and adding the -R voltage range in its place Temperature range 5 removed. 21-Nov-2003 4.0 Table of contents, and Pb-free options added. VIL(min) improved to -0.45V 02-Feb-2004 4.1 VIL(max) and tCLQV(max) changed 5.0 Absolute Maximum Ratings for VIO(min) and VCC(min) improved. Soldering temperature information clarified for RoHS compliant devices. New 5V and 2.5V devices, with process letter W, promoted from preliminary data to full data. Device Grade 3 clarified, with reference to HRCF and automotive environments 6.0 Product List summary table added. Process identification letter “G” information added. Order information for Tape and Reel changed to T. AEC-Q100-002 compliance. Device Grade information clarified. tHHQX corrected to tHHQV. Signal Description updated. 10MHz, 5ms Write is now the present product. tCH+tCL
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