0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
T14L2M16A-10S

T14L2M16A-10S

  • 厂商:

    TMT

  • 封装:

  • 描述:

    T14L2M16A-10S - 128K X 16 HIGH SPEED CMOS STATIC RA - Taiwan Memory Technology

  • 数据手册
  • 价格&库存
T14L2M16A-10S 数据手册
tm TE CH Preliminary T14L2M16A SRAM FEATURES • Fast access time : 8/10/12/15 ns • Low-power consumption : Stand-by current (CMOS input/output) Max. 300 uA • Single +3.0V to 3.6V Power Supply • TTL compatible , Tri-state output • Common I/O capability • Automatic power-down when deselected • Available in 44-PIN TSOP-II and 48-pin CSP packages 128K X 16 HIGH SPEED CMOS STATIC RAM GENERAL DESCRIPTION The T14L2M16A is a very fast access time CMOS Static RAM, organized as 131,072 words by 16 bits . This device is fabricated by high performance CMOS technology. It can be operated under wide power supply voltage range from +3.0V to +3.6V. The T14L2M16A inputs and three-state outputs are TTL compatible and allow for direct interfacing with common system bus structures. Data retention is guaranteed at a power supply voltage as low as 2V. PART NUMBER EXAMPLES Part Number T14L2M16A-10S T14L2M16A-12C T14L2M16A-10S T14L2M16A-12C Access time 10ns 12ns 10ns 12ns Package TSOP-II CSP TSOP-II CSP BLOCK DIAGRAM Vcc Vss A0 . . . DECODER CORE ARRAY A16 CE WE OE LB UB CONTROL CIRCUIT DATA I/O I/O1 . . . I/O16 TM Technology Inc. reserves the right to change products or specifications without notice. P. 1 Publication Date: AUG. 2002 Revision:0.A tm A4 A3 A2 A1 A0 CE I/O1 I/O2 I/O3 I/O4 VCC VSS I/O5 I/O6 I/O7 I/O8 WE A16 A15 A14 A13 A12 TE CH Preliminary T14L2M16A 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 A5 A6 A7 OE UB LB I/O16 I/O15 I/O14 I/O13 VSS VCC I/O12 I/O11 I/O10 I/O9 NC A8 A9 A10 A11 NC PIN CONFIGURATIONS 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 TSOP-II 1 A B C D E F G H LB 2 OE 3 A0 4 A1 5 A2 6 NC I/O9 UB A3 A4 CE I/O1 I/O10 I/O11 A5 A6 I/O2 I/O3 VSS I/O12 NC A7 I/O4 VCC VCC I/O13 NC A16 I/O5 VSS I/O15 I/O14 A14 A15 I/O6 I/O7 I/O16 NC A12 A13 WE I/O8 NC A8 A9 A10 A11 NC 48-Ball CSP TOP VIEW (Ball Down) PIN DESCRIPTIONS SYMBOL DESCRIPTIONS A0 ~ A16 Address inputs I/O1~I/O16 Data inputs/outputs CE WE OE SYMBOL DESCRIPTIONS Lower byte (I/O 1~8) LB UB Upper byte (I/O 9~16) Power supply Ground No connection Publication Date: AUG. 2002 Revision:0.A Chip enable Write enable input Output enable input VCC VSS NC P. 2 TM Technology Inc. reserves the right to change products or specifications without notice. tm TE CH Preliminary T14L2M16A ABSOLUTE MAXIMUM RATINGS* PARAMETER Voltage on Any Pin Relative to VSS Power Dissipation Storage Temperature Temperature Under Bias SYM VR PD TSTG IBIAS MIN. -0.5 -55 0 MAX. +4.6 V 1.0 +150 +70 UNIT V W °C °C *Note: Stresses greater than those listed above Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and function operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. TRUTH TABLE I/O 1~8 I/O 9~16 MODE LB OE WE UB CE H X* X* X* X* High-Z High-Z Deselected L X* X* H H High-Z High-Z Output Disabled L H H L X* High-Z High-Z Output Disabled L H H X* L High-Z High-Z Output Disabled L L H L H Data Out High-Z Lower Byte Read L L H H L High-Z Data Out Upper Byte Read L L H L L Data Out Data Out Word Read L X* L L H Data In High-Z Lower Byte Write L X* L H L High-Z Data In Upper Byte Write L X* L L L Data In Data In Word Write *Note: X = Don’t Care (Must be low or high state), L = Low, H = High Power Standby Active Active Active Active Active Active Active Active Active TM Technology Inc. reserves the right to change products or specifications without notice. P. 3 Publication Date: AUG. 2002 Revision:0.A tm - TE CH Preliminary T14L2M16A RECOMMENDED OPERATING CONDITIONS (Ta = 0 ~ +70 °C ) PARAMETER Supply Voltage Input Voltage SYM Vcc VSS MIN 3.0 0.0 2.0 -0.2 TYP 3.3 0.0 MAX 3.6 0.0 Vcc+0.3 0.8 UNIT V V V V VIH VIL OPERATING CHARACTERISTICS - (Vcc = 3.0 to 3.6V, VSS = 0V, Ta = 0 ~ +70 °C ) SYM. ILI TEST CONDITIONS Vcc = Max, VIN = VSS to Vcc -8 -10 -12 -15 UNIT PARAMETER Input Leakage Current Output Leakage Current Min Max Min Max Min Max Min Max - 1 - 1 - 1 - 1 uA CE = VIH or OE = VIH ILO or WE = VIL VIO = VSS to Vcc Vcc = Max, CE = VIL , Operating Power ICC VIN = VIH or VIL, Supply Current IOUT=0mA, f=max CE = VIH , Standby Power I SB other input= VIL or VIH Supply Current (TTL Level) CE ≥ Vcc-0.2V or Standby Power I SB1 VIN ≤ 0.2V or Supply Current VIN ≥ Vcc-0.2V (CMOS Level) - 1 - 1 - 1 - 1 uA - 60 - 55 - 50 - 45 mA - 15 - 15 - 15 - 15 mA 2.4 300 0.4 - - 300 - 300 - 300 uA V V VOL Output High Voltage VOH Output Low Voltage I OL = 8.0mA I OH = -4.0 mA - 0.4 2.4 - - 0.4 2.4 - - 0.4 2.4 - TM Technology Inc. reserves the right to change products or specifications without notice. P. 4 Publication Date: AUG. 2002 Revision:0.A tm TE CH Preliminary T14L2M16A CAPACITANCE (f = 1 MHz, Ta = 25°C,) PARAMETER Input Capacitance Input/ Output Capacitance SYMBOL CONDITION VIN = 0V VIN = VOUT = 0V MAX. 6 8 UNIT pF pF C IN C I/O Note: This parameter is guaranteed by device characterization and is not production tested. AC TEST CONDITIONS PARAMETER Input Pulse Levels Input Rise and Fall Times Input and Output Timing Reference Level Output Load CONDITIONS 0.8V to 2.0V 3.0 ns 1.4V C L =30pF+1TTL Load AC TEST LOADS AND WAVEFORM TTL DQ RL 50 ohm C L* Z0 = 50 ohm Vt =1.4V CL 30 pF Fig.A * Including Scope and Jig Capacitance Fig.B Output Load Equivalent TM Technology Inc. reserves the right to change products or specifications without notice. P. 5 Publication Date: AUG. 2002 Revision:0.A tm TE CH Preliminary T14L2M16A AC CHARACTERISTICS( Vcc =3.0 to 3.6V, VSS = 0V, Ta = 0 ~ +70 °C ) (1) READ CYCLE PARAMETER Read Cycle Time Address Access Time Chip Enable Access Time Output Enable Access Time Output Hold from Address Change Chip Enable to Output in Low-Z Chip Disable to Output in High-Z Output Enable to Output in Low-Z Output Disable to Output in High-Z LB , UB Access Time LB , UB Enable to Output in Low-Z LB , UB Disable to Output in High-Z SYM. Min -8 Max -10 Min Max -12 Min Max -15 Min Max UNIT 15 15 6 6 6 6 6 ns ns ns ns ns ns ns ns ns ns ns ns tRC tAA tACE tOE tOH tLZ tHZ tOLZ tOHZ tBA tBLZ tBHZ 8 3 3 0 0 - 8 8 3 3 3 3 3 10 3 3 0 0 - 10 10 4 4 4 4 4 12 3 3 0 0 - 12 12 5 5 5 5 5 15 3 3 0 0 - (2)WRITE CYCLE PARAMETER Write Cycle Time Chip Enable to Write End Address Valid to Write End Address Setup Time Write Pulse Width Write Recovery Time Data Valid to Write End Data Hold Time Write Enable to Output in High-Z Output Active from Write End SYM. Min -8 Max -10 Min Max -12 Min Max -15 Min Max UNIT 6 ns ns ns ns ns ns ns ns ns ns tWC tCW tAW tAS tWP tWR tDW tDH tWHZ tOW 8 7 7 0 6 0 4 0 0 3 - 10 8 8 0 7 0 5 0 0 4 - 12 8 8 0 8 0 6 0 0 5 - 15 10 10 0 10 0 7 0 0 TM Technology Inc. reserves the right to change products or specifications without notice. P. 6 Publication Date: AUG. 2002 Revision:0.A tm Address TE CH Preliminary T14L2M16A TIMING WAVEFORMS READ CYCLE 1 (Address Controlled, CE = OE = VIL , WE = VIH , LB or/and UB = VIL ) tRC t AA t OH DOUT Previous Data Valid Data Valid READ CYCLE 2 ( WE = VIH ) tRC Ad d re s s tA A CE t OH tHZ t ACE t BA UB / LB tOE OE t BHZ tLZ D OUT tBLZ tOLZ t OHZ High-Z D ON'T CARE UNDEFINED Notes (READ CYCLE) : 1. WE are high for read cycle. 2. All read cycle timing is referenced from the last valid address to the first transition address. 3. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit condition referenced to VOH or VOL levels. 4. At any given temperature and voltage condition. tHZ (max.) is less than tLZ (min.) both for a given device and from device to device interconnection. 5. Transition is measured ±200mV from steady state voltage with load. This parameter is sampled and not 100% tested. 6. Device is continuously selected with CE =VIL . TM Technology Inc. reserves the right to change products or specifications without notice. P. 7 Publication Date: AUG. 2002 Revision:0.A tm Ad d res s CE TE CH ( WE Controlled) tWC Preliminary T14L2M16A WRITE CYCLE 1 tAW tCW tWR UB / LB tA S tWP WE tWHZ tOW DOUT High-Z tDW tDH DIN Hi g h - Z WRITE CYCLE 2 Ad d res s ( CE Controlled) tWC tAW tCW tWR CE tAS UB / LB tWP WE DOUT Hig h -Z tDW tDH DIN Hig h -Z Hig h -Z DO N' T CARE UNDE FINE D TM Technology Inc. reserves the right P. 8 to change products or specifications without notice. Publication Date: AUG. 2002 Revision:0.A tm Add res s TE CH ( UB , LB Controlled) tWC Preliminary T14L2M16A WRITE CYCLE 3 tAW tCW tWR UB / LB t AS CE tWP WE DOUT Hig h -Z tDW tDH DIN Hig h -Z Hig h -Z D O N' T CARE UNDE FINE D NOTES ( WRITE CYCLE ) : 1. A write occurs during the overlap of a low CE , a low WE . A write begins at the lateat transition among CE goes low, WE going low. A write end at the earliest transition among CE going high, WE going high. tWP is measured from the beginning of write to the end of write. 2. tCW is measured from the later of CE going low to the end of write. 3. tAS is measured from the address valid to the beginning of write. 4. tWR is measured from the end of write to the address change. TM Technology Inc. reserves the right P. 9 to change products or specifications without notice. Publication Date: AUG. 2002 Revision:0.A tm TE CH Preliminary T14L2M16A DATA RETENTION CHARACTERISTICS PARAMETER VCC for Data Retention Data Retention Current Chip Deselect to Data Retention Time Operation Recovery Time SYM. VDR ICCDR tCDR tR TEST CONDITION CE ≥VCC -0.2V VIN ≥ Vcc -0.2V or VIN ≤ 0.2V MIN. 2.0 0 tRC MAX. 300 UNIT V uA ns ns DATA RETENTION WAVEFORM ( Ta = 0 ~ +70 °C ) Data Retentio n Mo de Vcc_typ tR Vcc Vcc_typ t CDR V DR > 2.0V CE V IH CE > Vcc- 0. 2V V IH TM Technology Inc. reserves the right P. 10 to change products or specifications without notice. Publication Date: AUG. 2002 Revision:0.A tm TE CH Preliminary T14L2M16A PACKAGE DIMENSIONS 44-LEAD TSOP-II D 44 23 E E1 E2 L1 INDEX MARK Mirror finish c e b 22 b1 A £c A3 A2 A1 L c1 SEATING PLANE Symbol A A1 A2 A3 b b1 c c1 D e E E1 E2 L L1 θ Dimension in mm Min Nom Max 1.20 0.05 0.1 0.95 1.00 1.05 0.25 0.35(typ) 0.10 0. 15 0.25 0.805 0.10 18.31 18.41 18.51 0.80(typ) 11.56 11.76 11.96 10.03 10.16 10.29 10.76 0.4 0.5 0.6 0.8(typ) 0 8 Dimension in inch Min Nom Max 0.047 0.002 0.004 0.037 0.039 0.041 0.010 0.014(typ) 0.004 0.006 0.010 0.032 0.004 0.721 0.725 0.729 0.031(typ) 0.455 0.463 0.471 0.394 0.400 0.405 0.458 0.016 0.020 0.024 0.032(typ) 0 8 TM Technology Inc. reserves the right P. 11 to change products or specifications without notice. Publication Date: AUG. 2002 Revision:0.A tm TE CH Preliminary T14L2M16A Units : millimeters PACKAGE DIMENSIONS 48-pin CSP (8 row x 6 column) 48 BALL FINE PITCH BGA (0.75mm ball pitch) To p V ie w B ottom V ie w B B1 A 1 IN DE X MA RK 0 .5 0 0.50 # A1 C C1 C1/2 B /2 A E2 D E Y 0.3 6 E1 Symbol A B B1 C C1 D E E1 E2 Y min 5.95 7.95 0.25 0.20 - typ 0.75 6.00 3.75 8.00 5.25 0.30 1.10 0.95 0.25 - max 6.05 8.05 0.35 1.20 0.30 0.08 Notes : 1. Bump counts : 48 (8 row x 6column) 2. Bump pitch : (x,y)=(0.75 x 0.75) typ. 3. All tolerance are ±0.050 unless otherwise specified. 4. ‘Y’ is coplanarity : 0.08(max) 5. Units : mm TM Technology Inc. reserves the right P. 12 to change products or specifications without notice. Publication Date: AUG. 2002 Revision:0.A
T14L2M16A-10S 价格&库存

很抱歉,暂时无法提供与“T14L2M16A-10S”相匹配的价格&库存,您可以联系我们找货

免费人工找货