6N137_07

6N137 TOSHIBA Photocoupler GaAℓAs Ired & Photo IC 6N137 Degital Logic Isolation Tele-Communication Analog Data Equipment Control The TOSHIBA 6N137 consist of a high emitting diode and a one chip photo IC. This unit is 8-lead DIP package. • • • • • LSTTL / TTL compatible: 5V Supply Ultra high speed: 10MBd Guaranteed performance over temperature: 0°C to 70°C High isolation voltage: 2500Vrms min. UL recognized: UL1577, file no. E67349 Unit in mm Truth Table Input H L H L Enable H H L L Output L H H H TOSHIBA Weight: 0.54g 11−10C4 Pin Configurations (top view) 1 8 7 6 5 IF VF 2 3 7 IE VE ICC IO 8 VCC V 6O 5 GND 2 3 4 1 : N.C. 2 : Anode 3 : Cathode 4 : N.C. 5 : GND 6 : Output(Open collector) 7 : Enable 8 : VCC 1 2007-10-01 6N137 Absolute Maximum Ratings Characteristic Forward current LED Pulse forward current Reverse voltage Output current Output voltage Detector Supply voltage (1 minute maximum) Enable input voltage (not to exceed VCC by more than 500mV) Output collector power dissipation Operating temperature range Storage temperature range Lead solder temperature (10 s) (Note 2) (Note 1) Symbol IF IFP VR IO VO VCC VEH PO Topr Tstg Tsol Rating 20 40 5 50 7 7 5.5 85 0~70 −55~125 260 Unit mA mA V mA V V V mW °C °C °C Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) 50% duty cycle, 1ms pulse width. (Note 2) Soldering portion of lead: Up to 2mm from the body of the device. Recommended Operating Conditions Characteristic Input current, low level each channel Input current, high level each channel High level enable voltage Low level enable voltage (output high) Supply voltage, output* Fan out (TTL load) Operating temperature Symbol IFL IFH VEH VEL VCC N Ta Min. 0 7 2.0 0 4.5 ― 0 Max. 250 20 VCC 0.8 5.5 8 70 Unit μA mA V V V ― °C Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. *This item denotes operating ranges, not meaning of recommended operating conditions. Precaution Please be careful of the followings. A ceramic capacitor(0.1μF)should be connected from pin 8 to pin 5 to stabilize the operation of the high gain linear amplifier. Failure to provide the bypassing may impair the switching property. The total lead length between capacitor and coupler should not exceed 1cm. 2 2007-10-01 6N137 Electrical Characteristics Over Recommended Temperature (Ta = 0~70°C unless otherwise noted) Characteristic High level output current Symbol IOH VOL IEH IEL ICCH ICCL (Note 3) Capacitance (input−output) (Note 3) Input forward voltage Input reverse breakdown voltage Input capacitance Current transfer ratio RI−O CI−O VF BVR CIN CTR Test Condition VCC=5.5V, VO=5.5V IF=250μA, VE = 2.0V VCC=5.5V, IF=5mA VEH=2.0V IOL(sinking)=13mA VCC=5.5V, VE=2.0V VCC=5.5V, VE=0.5V VCC=5.5V, IF=0, VE=0.5V VCC=5.5V, IF=10mA VE=0.5V VI−O=500V, Ta=25°C R.H.≤60% f=1MHz, Ta=25°C IF=10mA, Ta=25°C IR=10μA, Ta=25°C VF=0, f=1MHz IF=5.0mA, RL=100Ω Min. ― (**)Typ. 1 Max. 250 Unit μA Low level output voltage High level enable current Low level enable current High level supply current Low level supply current Resistance (input−output) ― ― ― ― ― ― ― ― 5 ― ― 0.4 −1.0 −1.6 7 12 10 12 0.6 ― −2.0 15 18 ― ― 1.75 ― ― ― V mA mA mA mA Ω pF V V pF % 0.6 1.65 ― 45 1000 (**) All typical values are at VCC=5V, Ta=25°C (Note 3) Pins 1, 2, 3 and 4 shorted together and pins 5, 6, 7 and 8 shorted together. 3 2007-10-01 6N137 Switching Characteristics (Ta = 25°C, VCC = 5V) Characteristic Propagation delay time to high output level Propagation delay time to low output level Output rise−fall time (10−90%) Propagation delay time of enable from VEH to VEL Symbol tpLH tpHL tr, tf Test Circuit 1 1 ― Test Condition RL=350Ω, CL=15pF IF=7.5mA RL=350Ω, CL=15pF IF=7.5mA RL=350Ω, CL=15pF IF=7.5mA RL=350Ω, CL=15pF IF=7.5mA VEH=3.0V VEL=0.5V RL=350Ω, CL=15pF IF=7.5mA VEH=3.0V VEL=0.5V VCM=10V RL=350Ω VO(min.)=2V IF=0mA VCM=10V RL=350Ω VO(max.)=0.8V IF=5mA Min. ― ― ― Typ. 60 60 30 Max. 75 75 ― Unit ns ns ns tELH 2 ― 25 ― ns Propagation delay time of enable from VEL to VEH Common mode transient immunity at logic high output level Common mode transient Immunity at logic low output level tEHL 2 ― 25 ― ns CMH 3 ― 200 ― V / μs CML 3 ― −500 ― V / μs 4 2007-10-01 6N137 Test Circuit 1. 5V tpHL and tpLH Input tpHL tpLH Output VO 1.5V VOH VOL 350mV(IF = 7.5mA) 175mV(IF = 3.75mA) Pulse generator ZO = 50Ω tr = 5ns 1 2 3 47Ω 4 GND VCC 8 7 6 5 0.1μF Bypass CL RL Output VO monitoring node IF Monitoring Node ･ CL is approximately 15pF which includes probe and stray wiring capacitance. Test Circuit 2. tEHL and tELH Pulse generator ZO = 50Ω tr = 5ns 3.0V Input VE tEHL tELH Output VO 1.5V VOH VOL 1.5V 7.5mA dc IF Input VE Monitoring node 5V 1 2 3 4 GND VCC 8 0.1μF 7 6 5 Bypass CL RL VO Output monitoring node ･ CL is approximately 15pF which includes prove and stray wiring capacitance. Test Circuit 3. Transient immunity and typical waveforms 1 90% 10% tr VO Switch at A : IF = 0mA VO Switching at B : IF = 5mA VOL 10% 90% tf 5V VFF 10V 0V B 4 Pulse gen. ZO = 50Ω. VCM GND IF A 2 3 VCC 8 7 6 5 0.1μF Bypass 5V RL VO 5 2007-10-01 6N137 IF – V F 100 ΔVF / ΔTa – IF -2.6 Forward voltage temperature coefficient ΔVF /Δta (mV / °C ) Ta = 25°C (mA) -2.4 10 Forward current IF -2.2 1 -2.0 -1.8 0.1 -1.6 0.01 1.0 1.2 1.4 1.6 1.8 -1.4 0.1 0.3 1 3 10 30 Forward voltage VF (V) Forward current IF (mA) VO – IF 8 VCC = 5V Ta = 25°C IOH - Ta 10 VF = 1V 5 3 VCC = 5.5V VO = 5.5V (V) High level output current IOH (μA) 3 6 6 VO Output voltage 4 RL = 350Ω 1 kΩ 4 kΩ 1 0.5 0.3 2 0 0 0.1 1 2 4 5 0 20 40 60 80 Forward current IF (mA) Ambient temperature Ta (°C) VO – IF 8 VCC = 5V RL = 350Ω RL = 4kΩ 0.5 VO L – Ta IF = 5mA VCC = 5.5V VE = 2V 6 Low level output voltage VOL (V) (V) IOL = 16mA 0.4 12.8mA 9.6mA VO Output voltage Ta = 70°C 4 0°C 0.3 6.4mA 2 0 0.2 0 1 2 3 4 5 6 0 20 40 60 80 Forward current IF (mA) Ambient temperature Ta (°C) 6 2007-10-01 6N137 tpHL, tpLH - IF 120 tpLH 100 RL = 4kΩ 100 120 tpHL, tpLH - Ta tpLH RL = 4kΩ 350Ω 1 kΩ 80 tpLH 350Ω 60 tpHL 40 1 kΩ 4 kΩ VCC = 5V IF = 7.5mA Propagation delay time tpHL, tpLH (ns) 80 tpLH 1 kΩ 350Ω 60 tpHL tpLH 350Ω 1 kΩ 4kΩ Ta = 25°C VCC = 5V 40 Propagation delay time (ns) tpHL, tpLH 20 20 0 0 5 7 9 11 13 15 17 19 0 10 20 30 40 50 60 70 Forward current IF (mA) Ambient temperature Ta (°C) tr, tf – Ta 320 300 VCC = 5V IF = 7.5mA tf 280 RL = 4kΩ 80 70 VCC = 5V VEH = 3V IF = 7.5mA tEHL,tELH - Ta (ns) tELH RL = 4kΩ Enable propagation delay time tEHL, tELH (ns) tr, tf 60 80 60 tf 1 kΩ Rise, fall time 50 40 tf tr 350Ω 40 tELH 30 tELH 1kΩ 350Ω 350Ω tEHL 10 0 0 1 kΩ 4 kΩ 350Ω 1kΩ 4kΩ 20 0 0 20 10 20 30 40 50 60 70 Ambient temperature Ta (°C) 10 20 30 40 50 60 70 Ambient temperature Ta (°C) 7 2007-10-01 6N137 RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01