RN1104F

RN1101F∼RN1106F TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) RN1101F,RN1102F,RN1103F RN1104F,RN1105F,RN1106F Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications Unit in mm With built-in bias resistors Simplify circuit design Reduce a quantity of parts and manufacturing process Complementary to RN2101F~RN2106F Equivalent Circuit And Bias Resister Values Type No. RN1101F RN1102F RN1103F RN1104F RN1105F RN1106F R1 (kΩ) 4.7 10 22 47 2.2 4.7 R2 (kΩ) 4.7 10 22 47 47 47 JEDEC EIAJ TOSHIBA ― ― 2-2H1A Absolute Maximum Ratings (Ta = 25°C) Characteristic Collector-base voltage Collector-emitter voltage Emitter-base voltage Collector current Collector power dissipation Junction temperature Storage temperature range RN1101F~1106F RN1101F~1106F RN1101F~1104F RN1105F, 1106F Symbol VCBO VCEO VEBO IC PC Tj Tstg Rating 50 50 10 5 100 100 150 −55~150 Weight: 2.3 mg Unit V V V mA mW °C °C Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 1 2007-11-01 RN1101F∼RN1106F Electrical Characteristics (Ta = 25°C) Characteristic Collector cut-off current RN1101F ~1106F RN1101F RN1102F Emitter cut-off current RN1103F RN1104F RN1105F RN1106F RN1101F RN1102F DC current gain RN1103F RN1104F RN1105F RN1106F Collector-emitter saturation voltage RN1101F ~1106F RN1101F RN1102F Input voltage (ON) RN1103F RN1104F RN1105F RN1106F RN1101F ~1104F RN1105F, 1106F Transition frequency Collector Output capacitance RN1101F ~1106F RN1101F ~1106F RN1101F RN1102F Input resistor RN1103F RN1104F RN1105F RN1106F RN1101F ~1104F Resistor ratio RN1105F RN1106F R1/R2 ― ― R1 ― ― VI (ON) ― VCE = 0.2V, IC = 5mA VCE (sat) ― IC = 5mA, IB = 0.25mA hFE ― VCE = 5V, IC = 10mA IEBO ― VEB = 10V, IC = 0 Symbol ICBO ICEO Test Circuit ― Test Condition VCB = 50V, IE = 0 VCE = 50V, IB = 0 Min ― ― 0.82 0.38 0.17 0.082 VEB = 5V, IC = 0 0.078 0.074 30 50 70 80 80 80 ― 1.1 1.2 1.3 1.5 0.6 0.7 1.0 VI (OFF) ― VCE = 5V, IC = 0.1mA 0.5 fT Cob ― ― VCE = 10V, IC = 5mA VCB = 10V, IE = 0, f = 1MHz ― ― 3.29 7 15.4 32.9 1.54 3.29 0.9 0.0421 0.09 ― 250 3 4.7 10 22 47 2.2 4.7 1.0 0.0468 0.1 0.8 ― 6 6.11 13 28.6 61.1 2.86 6.11 1.1 0.0515 0.11 kΩ MHz pF Typ. ― ― ― ― ― ― ― ― ― ― ― ― ― ― 0.1 ― ― ― ― ― ― ― Max 100 500 1.52 0.71 0.33 0.15 0.145 0.138 ― ― ― ― ― ― 0.3 2.0 2.4 3.0 5.0 1.1 1.3 1.5 V V V ― mA Unit nA Input voltage (OFF) 2 2007-11-01 RN1101F∼RN1106F 3 2007-11-01 RN1101F∼RN1106F 4 2007-11-01 RN1101F∼RN1106F 5 2007-11-01 RN1101F∼RN1106F 6 2007-11-01 RN1101F∼RN1106F Type Name Marking RN1101F RN1102F RN1103F RN1104F RN1105F RN1106F 7 2007-11-01 RN1101F∼RN1106F RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN GENERAL • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-11-01