0
登录后你可以
  • 下载海量资料
  • 学习在线课程
  • 观看技术视频
  • 写文章/发帖/加入社区
创作中心
发布
  • 发文章

  • 发资料

  • 发帖

  • 提问

  • 发视频

创作活动
TB9081FG

TB9081FG

  • 厂商:

    TOSHIBA(东芝)

  • 封装:

    LQFP64

  • 描述:

    3-PHASE BI-CMOS BRUSHLESS MOTOR

  • 数据手册
  • 价格&库存
TB9081FG 数据手册
TB9081FG TOSHIBA Bi-CMOS Integrated Circuit Silicon Monolithic TB9081FG Automotive GATE-driver for Brushless motor TB9081FG is Pre-driver IC automotive for brushless motor. Fail-safe relay pre-drivers are also built in in addition to 3-phase pre-drivers. The charge pump, the motor current detection circuit, the oscillator, and the SPI communication circuit are built in. The miscellaneous abnormal detections are carried and the operation after failure detection conditions and failure detections can be set up. About each setup, these can set up through a SPI communication. Also, it has built-in ABIST / LBIST functions for diagnosing the normal operation of the miscellaneous abnormal detection function. LQFP64-P-1010-0.50E Weight: 0.35 g (typ.) Features • • • • • • • • • • • 3-phase pre-drivers : PWM control to 20kHz Build-in fail-safe relay pre-drivers Build-in Charge Pump High response Current Detection circuit Miscellaneous-abnormal-detection circuits (Under voltage (VB, VCC) / Over voltage (VCC) / Over temp. / FET short-circuit detection) Build-in ABIST/LBIST functions Operating voltage range : VB=4.5 to 28V, VCC=3.0 to 5.5V Operational temperature range : -40 to 125°C Package : LQFP-64pin (0.5mm pitch) AEC-Q100 Qualified TM-SILTM  Developed according to ISO 26262 ASIL-D  Safety Manual and Safety Analysis Report  Functional redundancy and built-in ABIST and LBIST  SPI interface with CRC check The product(s) is/are compatible with RoHS regulations (EU directive 2011 / 65 / EU) as indicated, if any, on the packaging label ("[[G]]/RoHS COMPATIBLE", "[[G]]/RoHS [[Chemical symbol(s) of controlled substance(s)]]", "RoHS COMPATIBLE" or "RoHS COMPATIBLE, [[Chemical symbol(s) of controlled substance(s)]]>MCV"). ©2015-2019 Toshiba Electronic Devices & Storage Corporation 1 2019-02-27 TB9081FG Table of contents Internal block diagram Package pin layout (top view) Pin description Functional descriptions (1) Charge pump circuit (2) Pre-drivers (3) Current detector (4) Oscillator/divider (5) Abnormal detection circuit (5-1) VB1/VB2 under voltage detection (5-2) VCC1/VCC2 under voltage detection (5-3) VCC1/VCC2 over voltage detection (5-4) Over temperature detection (5-5) Short-circuit detection (5-6) Oscillation frequency monitoring (6) ALARM input circuit (7) EN_CP input circuit (8) ABIST function (9) SPI Communication circuit (9-1) SPI communication operation (9-2) Register map Absolute maximum ratings Electrical characteristics Reference circuit diagram PACKAGE Revision history RESTRICTIONS ON PRODUCT USE ©2015-2019 Toshiba Electronic Devices & Storage Corporation 2 2019-02-27 TB9081FG VCPH VCPL CP2L CP2H Charge pump OSC CLKOUT CP1L VB1 VB2 CP1H Internal block diagram VCC1 VCC2 BR1O BR2O VCC_OP Each voltage detection circuit HS EN_CP ALARM2 ALARM1 EN_CP input circuit HUO ALA RM input circuit HVO HWO BR1I BR2I RUI RVI SHU RWI /CS SDIN SDOUT Pre-Driver RUO 11ch SHV RVO Fo r Motor:6ch Fo r Relay:5ch SPI SHW RWO SCK LUO HUI HVI HWI LUI LVI LWI LVO LWO PGND1 PGND2 PGND3 VRI Current sensor TSD1 TSD2 TSD3 V REF1 VRO AMP1P AMP1O AMP2P A MP1 AMP2N AMP2O AMP3P A MP2 AMP1N A MP3 AMP3N BG1 BG2 AGND1 AGND2 TEST FET short detection Error Logic AMP3O NDIAG Notes 1: Some of the functional blocks, circuit, or constants in the block diagram may be omitted or simplified for explanatory purpose. (including individual block diagram) ©2015-2019 Toshiba Electronic Devices & Storage Corporation 3 2019-02-27 TB9081FG BR2I BR1I HWI HVI HUI LUI LVI LWI /CS SCK VCC1 SDIN SDOUT AGND1 VRO VRI Package pin layout (top view) 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 AMP3O 49 32 EN_CP AMP3N 50 31 PGND3 AMP3P 51 30 BR1O AMP2O 52 29 BR2O AMP2N 53 28 HUO AMP2P 54 27 HVO VCC_OP 55 26 HWO AMP1O 56 25 VB1 AMP1N 57 24 VB2 AMP1P 58 23 CP1H AGND2 59 22 VCPH NDIAG 60 21 CP2H CLKOUT 61 20 SHW ALARM2 62 19 CP1L TEST 63 18 SHV ALARM1 64 17 CP2L RVI VCC2 RWI PGND1 RUO RVO RWO ©2015-2019 Toshiba Electronic Devices & Storage Corporation 4 9 10 11 12 13 14 15 16 VCPL 8 SHU 7 HS 6 PGND2 5 LUO 4 LVO 3 LWO 2 NC 1 RUI TB9081FG 2019-02-27 TB9081FG Pin description Pin No. Symbol Input/output Definition 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 RUI RVI VCC2 RWI PGND1 RUO RVO RWO NC LWO LVO LUO PGND2 HS SHU VCPL CP2L SHV CP1L SHW CP2H VCPH CP1H VB2 VB1 HWO HVO HUO BR2O BR1O PGND3 EN_CP BR2I BR1I HWI HVI HUI LUI LVI LWI /CS SCK VCC1 SDIN SDOUT AGND1 VRO VRI AMP3O AMP3N AMP3P AMP2O AMP2N AMP2P VCC_OP AMP1O AMP1N AMP1P AGND2 NDIAG CLKOUT ALARM2 TEST ALARM1 IN IN Power supply IN GND OUT OUT OUT OUT OUT OUT GND IN IN Power supply OUT IN OUT IN IN/OUT Power supply IN/OUT Power supply Power supply OUT OUT OUT OUT OUT GND IN IN IN IN IN IN IN IN IN IN IN Power supply IN OUT GND OUT IN OUT IN IN OUT IN IN Power supply OUT IN IN GND OUT OUT IN IN IN U-Phase Motor Relay Input V-Phase Motor Relay Input Power supply 2 (3.3V or 5V) W-Phase Motor Relay Input Power GND1 U-Phase Motor Relay Output V-Phase Motor Relay Output W-Phase Motor Relay Output Pre-Driver Output LW Pre-Driver Output LV Pre-Driver Output LU Power GND2 High-side Drain Input Motor Connect PIN U-phase Charge-pump voltage (for low sides) 2nd Charge Pump Drive Output Motor Connect PIN V-phase 1st Charge Pump Drive Output Motor Connect PIN W-phase 2nd Charge Pump Output Charge-pump voltage (for high sides) 1st Charge Pump Output Power Supply2 (Battery 12V) Power Supply1 (Battery 12V) Pre-Driver Output HW Pre-Driver Output HV Pre-Driver Output HU BR2 Power supply relay Output BR1 Power supply relay Output Power GND 3 Charge-pump enable signal BR2 Power supply relay Input BR1 Power supply relay Input Pre-Driver Input HW Pre-Driver Input HV Pre-Driver Input HU Pre-Driver Input LU Pre-Driver Input LV Pre-Driver Input LW SPI chip select SPI clock input Power supply 1 (3.3V or 5V) SPI input SPI Output The GND 1 for analog circuits Reference voltage amplifier Output Reference voltage amplifier input Current-detection amplifier Output 3 Current-detection amplifier input 3 (-) Current-detection amplifier input 3 (+) Current-detection amplifier Output 2 Current-detection amplifier input 2 (-) Current-detection amplifier input 2 (+) The power supply for Current-detection amplifier (5V/3.3V) Current-detection amplifier Output 1 Current-detection amplifier input 1 (-) Current-detection amplifier input 1 (+) The ground 2 for analog circuits Error Output Pin Clock output Pre-driver enable 2 Test terminal Pre-driver enable 1 ©2015-2019 Toshiba Electronic Devices & Storage Corporation 5 Pull-Up/Down Pull-Down Pull-Down Pull-Down Pull-Down Pull-Down Pull-Down Pull-Down Pull-Down Pull-Down Pull-Down Pull-Down Pull-Down Pull-Up Pull-Down Pull-Down Pull-Down Pull-Down Pull-Down 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ 50kΩ Notes push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull push-pull - 2019-02-27 TB9081FG ●Description of an internal signal name Internal signal name abst_pass Normal signal of abst_end End signal of ABIST gate_en_u gate_en_v gate_en_w gate_en_r State Description ABIST H L ABIST normal Enable Enable Enable Enable ABIST abnormal ABIST unfinished Disable Disable Disable Disable Enable Disable Enable Disable Enable Disable Enable Disable Enable Enable Detection Detection Detection Detection Reset release Detection Disable Disable Release Release Release Release Reset Release ABIST end cp_en cp_off vbl1 vbl2 vcl1 vcl2 por_x vch Pre-driver output enabling signal (U phase) Pre-driver output enabling signal (V phase) Pre-driver output enabling signal (W phase) Pre-driver output enabling signal (relay) Error output signal (Pre-driver output enabling, U phase) Error output signal (Pre-driver output enabling, V phase) Error output signal (Pre-driver output enabling, W phase) Error output signal (Pre-driver output enabling, relay) Enabling signal for charge pump circuit Error output signal (charge pump circuit enabling) VB1/VB2 under voltage detection signal 1 VB1/VB2 under voltage detection signal 2 VCC1/VCC2 under voltage detection signal 1 VCC1/VCC2 under voltage detection signal 2 Internal reset signal VCC1/VCC2 over voltage detection signal vphh VCPH clamp voltage detection signal Detection Release tsd1det Over temperature detection signal1 Detection Release tsd2det Over temperature detection signal2 Detection Release tsd3det Over temperature detection signal3 Detection Release shuho shvho shwho shulo shvlo shwlo Short-circuit detection signal (U phase low side) Short-circuit detection signal (V phase low side) Short-circuit detection signal (W phase low side) Short-circuit detection signal (U phase high side) Short-circuit detection signal (V phase high side) Short-circuit detection signal (W phase high side) Detection Detection Detection Detection Detection Detection Release Release Release Release Release Release gate_off_u gate_off_v gate_off_w gate_off_r Symbol Vb Vcc Pin name VB1,VB2 VCC1,VCC2 Vccop VCC_OP Vcph Vcpl AGND PGND VCPH VCPL AGND1,AGND2 PGND1,PGND2,PGND3 Function/Application Battery power supply External 5V/3.3V power supply The power supply for current detection amplifier (5V/3.3V) Charge pump voltage (for high sides) Charge pump voltage (for low sides) GND for analog circuitry Power GND ©2015-2019 Toshiba Electronic Devices & Storage Corporation 6 2019-02-27 TB9081FG Functional descriptions (1) Charge pump circuit TB9081FG build in Charge pump for Pre-Drivers and it can control external Nch MOSFETs directly. Two charge pump voltages the object for the high side drive of a motor and the object for the relay drive of a motor, and for the low side drive of a motor is generated. The charge pump voltage (Vcph) for a high side drive and a relay drive control by an internal circuit, and if Vcph goes up to Vb+12V (Typ.), a charge pump will suspend operation. Furthermore, in consideration of an overvoltage state, if Vcph goes up to 37V (Typ.), a charge pump will stop, and if Vcph is less than 36.5V (Typ.), a charge pump will resume operation. The charge pump voltage (Vcpl) for a low side drive is generated from Vcph. If Vcpl goes up to 16V (Typ.), a clamp will start and it will not become the voltage more than clamp voltage. It is possible to build the switching circuit (CP_SW) in the Vb side of a charge pump circuit, to make a transistor turn off by CP_SW, and to stop the supply to Vcph from Vb. Vcc voltage turns off the transistor of CP_SW on condition of the conditions as for which below Vcc voltage detection voltage becomes, or EN_CP=L. For details, please refer to a (7) EN_CP circuit. Moreover, it is possible to operate or stop a charge pump by terminal EN_CP. The charge pump operates at the time of EN_CP="H", and it stops at the time of EN_CP="L" and also suspends the supply to Vcph from Vb . A Vcph output voltage is set to 0V at the time of the charge-pump stop by EN_CP="L." When the charge pump is stopped by the control in the IC, Vcph output voltage will become the "Vb-3VF". Vcc Vb CP_SW Vcc (por_x) Logic Vcc SR1 Divider Ccp=0.1μF CP1H (por_x) Vcc Vb Vcc 50kΩ (por_x) Control Circuit (cp_off) Error Logic CP1L Charge Pump1 (cp_en) EN_CP Rcp=15Ω Vcc SR2 Ccp=0.1μF CP2H (por_x) Vcc Vb CP2L Charge Pump2 (por_x) (por_x) Rcp=15Ω Vcc SR3 Vcc (por_x) Vb VB+12V detector Pre-drv. (High-side) VCPH Clamp (16V) Vcc (vphh) Fig.1- a Cvcph1=10μF Cvcph2=0.1μF VCPL 36V detector Pre-drv. (Low-side) Cvcpl1=4.7μF Cvcpl2=0.1μF Charge pump circuit Block Diagram ©2015-2019 Toshiba Electronic Devices & Storage Corporation 7 2019-02-27 TB9081FG (2) Pre-drivers TB9081FG has the pre-driver circuit it is for the motor relay drive, for the power relay drive, for the low-side drive of the motor and for the high-side drive of the motor. Each pre-driver circuit has a respective input and output terminals are controlled by a signal inputted to the input terminals. Battery Vcph Vcc BR1O BR1I 1kΩ 50kΩ Vcc 10kΩ BR2O BR2I 50kΩ 1kΩ Vcc Vcc 10kΩ HUO HUI 50kΩ Vcc HVI 50kΩ Vcc HVO Pre-drv. logic HWO HWI 50kΩ Vcc RUO RUI 1kΩ 50kΩ Vcc 10kΩ RVO M RVI 50kΩ 1kΩ Vcc 10kΩ RWO RWI 1kΩ 50kΩ 10kΩ Vcpl Vcc LUO Vcc LVO Vcc LWO LUI 50kΩ LVI 50kΩ LWI 50kΩ Vcc (clk4m) output current switching time control logic (gate_en_w) (gate_en_v) (gate_en_u) (gate_en_r) (por_x) Fig.2- a Pre-driver circuit Block Diagram ©2015-2019 Toshiba Electronic Devices & Storage Corporation 8 2019-02-27 TB9081FG A power supply relay drive circuit is a circuit which controls FET for a relay on the battery power-supply side. A motor relay drive circuit is a circuit which controls FET for a relay on the motor side. A truth table is shown in table 2-a and 2-b. Refer to the (6) ALARM input circuit for the details of the internal signal (gate_en_r) in a truth table. Moreover, resistance 1kΩ is built in the output of a power supply relay drive and a motor relay drive. Furthermore, the diode for prevention of backflow at the time of reverse connection is built in the output of a power supply relay drive circuit. - Table 2- a Input/output truth table 1 (power supply relay drive circuit) - Power supply relay drive circuit 1 Input Internal signal BR1I (gate_en_r) L H H H * L *:Don't care Output BR1O L H L - Power supply relay drive circuit 2 Input Internal signal BR2I (gate_en_r) L H H H * L *:Don't care Output BR2O L H L - Table 2- b Notes - Notes - Input/output truth table 2 (motor relay drive circuit) - Motor relay drive circuit 1 (U phase) Input Internal signal RUI (gate_en_r) L H H H * L *:Don't care Output RUO L H L - Motor relay drive circuit 2 (V phase) Input Internal signal RVI (gate_en_r) L H H H * L *:Don't care Output RVO L H L - Motor relay drive circuit 3 (W phase) Input Internal signal RWI (gate_en_r) L H H H * L *:Don't care Output RWO L H L ©2015-2019 Toshiba Electronic Devices & Storage Corporation 9 Notes - Notes - Notes - 2019-02-27 TB9081FG A high side drive circuit is a circuit which drives FET of the high side of a motor. A low side drive circuit is a circuit which drives FET of the low side of a motor. A high side drive circuit and a low side drive circuit built in each 3ch. An input signal (HUI/HVI/HWI, LUI/LVI/LWI) is changed by a control block, and output (HUO/HVO/HWO, LUO/LVO/LWO) is outputted. A truth table is shown in table 2-c. Refer to the (6) ALARM input circuit for the details of the internal signal (gate_en_u, gate_en_v, gate_en_w) in a truth table. When HUI/LUI, HVI/LVI, and HWI/LWI are H/H, an output will be L/L (prohibition input). The operation at the time of prohibition input detection can be set up through a SPI communication. Moreover, the current at the time of Turn on/Turn off of a high side drive circuit and a low side drive circuit is the current limit after 8 μs (typ.). This current-limiting time can be set up a 3 value or no limit time through a SPI communication. When gate_en_u, gate_en_v, and gate_en_w switch from “H” to “L” by the failure detection and ALARM1 or ALARM2 outputting low, and then, the high side drive circuit and the low side drive circuit output high, it switches to “L”. At this time, it has an output current capability which is decided by the ON resistance and the gate resistance of the output driver during the current limit time. However, only Vcc under voltage detection, the output current capability will be the output limit current Iolmtl even within the current limit time. - Table 2- c Input/output truth table 3 (a high side drive circuit, a low side drive circuit) - FET drive circuit 1 (U phase) Input Internal signal Output Notes HUI LUI (gate_en_u) HUO LUO L L H H * *: Don’t care L H L H * H H H H L L L H L L L H L L L - FET drive circuit 2 (V phase) Input Internal signal Output LVI (gate_en_v) HVO LVO L L H H * *: Don’t care L H L H * H H H H L L L H L L L H L L L Internal signal Output LWI (gate_en_w) HWO LWO L L H H * *: Don’t care L H L H * H H H H L L L H L L L H L L L 10 - - Inhibit input mode - Notes HWI ©2015-2019 Toshiba Electronic Devices & Storage Corporation Inhibit input mode Notes HVI - FET drive circuit 3 (W phase) Input - - Inhibit input mode - 2019-02-27 TB9081FG (3) Current detector TB9081FG are built three amplifiers for motor-current detection and one amplifier for reference voltage generation (Fig3- a). The amplifiers for motor-current detection can amplify the difference voltage which produces according to the current which flows through the shunt resistance connected to the motor actuator. The amplifier for reference voltage generation is used as buffer amplifier for reference voltage generation. As an external configuration of the current detection, it is available in either 1 shunt configuration or 3 shunt configuration. Vccop AMP1P + AMP1N (vbg1) AMP1O Vccop AMP2P + AMP2N - AMP2O (vbg1) Vccop AMP3P + AMP3N - AMP3O (vbg1) Vccop VRI + VRO (vbg1) Fig.3- a Motor-current detection circuit Block Diagram ©2015-2019 Toshiba Electronic Devices & Storage Corporation 11 2019-02-27 TB9081FG (4) Oscillator /divider The oscillator has composition with built-in CR, and an Oscillation frequency is Fc=4MHz (typ.). An oscillator will start operation after internal signal (por_x) release. 4 MHz (clk4m) is used as the system clock of a logic circuit, and an operation clock of the digital filter of the short-circuit detector of external FET. Clock 1MHz (clk1m), it is used as an operation clock of the digital filter of an ALARM detector. Clock 500kHz (clk500k), it is used as an operation clock of a charge pump. Clock 16kHz (clk16k), it is used as an operation clock of ABIST. CLKOUT output (terminal) will output a clock set by the SPI (clk4m, clk500k, clk16k). Vcc (clk500k) Divider Logic Charge Pump (clk1m) ALARM filter (clk16k) ABIST control (clk4m) VCC1 VCC2 output current switching time control FET Short filter Vcc Low voltage monitoring (vcl2) Vcc (clk4m) OSC CLKOUT mux 100Ω SPI communication circuit (vcl1) (por_x) Fig.4- a Oscillator, divider Block Diagram Fig.4-b Timing chart of divider (vcl1) (vcl2) (por_x) (clk4m) (clk1m) (clk500k) (clk16k) ©2015-2019 Toshiba Electronic Devices & Storage Corporation 12 2019-02-27 TB9081FG (5) Abnormal detection circuit TB9081FG is built in miscellaneous abnormal detection circuit, such as the under voltage detection (VB1, VB2, VCC1, VCC2), over voltage detection (VCC1, VCC2), over temperature detection, external FET short-circuit detection and frequency abnormal detection. The contents of a monitoring function list and the internal signal are shown below. The details of operation are indicated in (5-1) and after. When failure detection turns off the pre-driver circuit, the short-circuit detection function becomes invalid. When the operation returns from the abnormalities after that and the operation of a pre-driver circuit returns, a short-circuit detection function becomes effective again. ●Monitoring function list Monitoring function SPI Setup Valid 00 Invalid 01 1* - Valid 00 Valid 01 10 11 00 Valid 01 10 11 000 VB1/VB2 Under voltage VCC1/VCC2 Under voltage Setup bit VCC1/VCC2 Over voltage Over temperature 001 010 011 100 101 External FET Short-circuit 110 Valid 111 000 Valid 001 010 011 1** 0 Abnormalities in frequency Pre-driver prohibition input detection 1 *Note 3 SPI communication error Invalid - NDIAG Initial value ABIST pre-driver circuit OFF - - ○ L hold pre-driver circuit OFF pre-driver circuit OFF Pre-driver / charge pump / dividing circuit OFF Pre-driver / charge pump circuit continued operation Pre-driver circuit OFF Pre-driver / charge pump circuit OFF pre-driver / charge pump circuit OFF-hold Pre-driver / charge pump circuit continued operation pre-driver circuit OFF pre-driver / charge pump circuit OFF pre-driver / charge pump circuit OFF-hold Pre-driver / charge pump circuit continued operation Pre-driver-circuit(only detection phase ) OFF Pre-driver circuit (only detection phase) OFF-hold Pre-driver circuit (all phases) OFF Pre-driver circuit (all phases) OFF-hold Pre-driver (all phases) / charge pump circuit OFF Pre-driver (all phases) / charge pump circuit OFF-hold No detection Pre-driver / charge pump circuit continued operation Pre-driver circuit OFF Pre-driver / charge pump circuit OFF Pre-driver / charge pump OFF-hold No detection Pre-driver OFF, when inputting inhibit signals. charge pump circuit continued operation Pre-driver OFF, when inputting inhibit signals. charge pump circuit continued operation Pre-driver / charge pump circuit continued operation ○ - - ○ ○ - L H L - ○ ○ L hold ○ - ○ ○ L hold ○ - - ○ L hold ○ H L hold - H H ○ L hold ○ L hold Operation in detection *Note 1 *Note 5 Register writing * Note 2 * Note 4 ○ ○ ○ ○ (Low frequency) - - - - *:don't care ©2015-2019 Toshiba Electronic Devices & Storage Corporation 13 2019-02-27 TB9081FG Note 1) It describes about Pre-driver, charge pump and divider. The definition of OFF and OFF-hold is as follows. OFF: the operation after returning from an abnormal state is possible. OFF-hold: Hold OFF even after returning from an abnormal state. Note 2) It describes about NDIAG operation in detection. The `L hold` hold the output NDIAG=L even after releasing from the abnormal detection. Note 3) If register setting=0, there is no register writing and NDIAG becomes H, even in case of the abnormal detection. If register setting=1, it has register writing and NDIAG becomes L, in case of the abnormal detection. Note 4) if set to other than `L hold` in NDIAG, register will be cleared and NDIAG=H by recovering from the abnormal detection, Note 5) Both Pre-driver circuit (all phases) OFF and Pre-driver circuit OFF turn off power relay and motor relay Pre-driver. Pre-driver-circuit(only detection phase) OFF turns off the high side and the low side Pre-driver of detected phase only. ©2015-2019 Toshiba Electronic Devices & Storage Corporation 14 2019-02-27 TB9081FG (5-1) VB1/VB2 under voltage detection Under voltage detection of VB1/VB2 is performed. Two detection comparators and two filters are built in. If at least one filter outputs “H”, under voltage detection is performed. The band gap voltage recognized as the reference of a detection comparator is generated from a separate band gap circuit (BG1 and BG2). VB1 Vcc Vcc vbg2 VB2 - Vcc BG2 Filter SDOUT under voltage monitoring2 SPI communication circuit Vcc vbg1 SDIN SCK /CS + - Vcc Logic (vbl2) + BG1 Filter under voltage monitoring1 (vbl1) (clk4m) (por_x) NDIAG Error Logic (gate_en_u,v,w,r) Pre-Dr. Fig.5-1a VB1/VB2 under voltage detection Block Diagram ©2015-2019 Toshiba Electronic Devices & Storage Corporation 15 2019-02-27 TB9081FG ➣ A-(1) Under voltage of Vb If VB1 voltage and VB2 voltage are less than the threshold value of the under voltage detection voltage (vthbll), L detection comparator of Vb outputs “H”. ➣ A-(2) Under voltage detection of Vb After the detection filter time (Tbl), Vb under voltage detection signal (vbl1 and vbl2) outputs high, the under voltage state is detected, and the pre-driver circuit is turned off. The oscillating circuit and the charge pump circuit are not turned off. The pre-driver circuit holds OFF until the under voltage is released. The NDIAG output state after detection can be chosen among the 3 modes through SPI communication. A setup does not become effective even if the mode is changed in Vb under voltage detection state. The setup becomes effective after Vb under voltage is released and the register (uvb) is cleared. ➣ A-(3) Return of Vb voltage (under voltage release) If VB1 voltage and VB2 voltage exceed vthblh, Vb under voltage detection signal (vbl1 and vbl2) outputs low, the under voltage state is released, and the pre-driver circuit recovers to the normal operation. In case NDIAG outputs low, it outputs high when the register (uvb) is cleared through SPI communication. During under voltage detection, NDIAG outputs low because the register (uvb) is not cleared. register uvb_op = “01” (initial value) register uvb_op = “00” VB1 VB2 under voltage detection under voltage release under voltage detection Vthblh Vthbll register uvb_op = “1*” under voltage release Vthbll Vthblh under voltage detection under voltage release Vthbll Vthblh (1) (2) (3) vbl1 Tbl Tbl Tbl vbl2 Tbl Tbl Tbl NDIAG H*O/ L*O L hold control by input signal Pre-driver OFF control by input signal Pre-driver OFF control by input signal Pre-driver OFF control by input signal VCPL VCPH NDIAG:L hold Pre-driver:OFF Fig.5-1b NDIAG:L output Pre-driver:OFF NDIAG:no L output Pre-driver:OFF Timing chart of VB1/VB2 under voltage detection ©2015-2019 Toshiba Electronic Devices & Storage Corporation 16 2019-02-27 TB9081FG (5-2) VCC1/VCC2 under voltage detection Under voltage detection of VCC1/VCC2 is performed. Two detection comparators are built in. If at least one comparator outputs “H”, under voltage detection is performed. The band gap voltage recognized as the reference of a detection comparator is generated from a separate band gap circuit (BG1 and BG2). VCC2 Vcc Vcc vbg2 VCC1 + (vcl2) Logic SDOUT - Vcc BG2 under voltage monitoring2 SPI communication circuit Vcc vbg1 + SDIN SCK /CS (vcl1) - under voltage monitoring1 + (vch) Filter - Vcc BG1 NDIAG Error Logic Vcc over voltage monitoring (gate_en_u,v,w,r) (cp_en) (clk4m) Pre-Dr. CP1 CP2 (por_x) Fig.5-2a VCC1/VCC2 under voltage detection Block Diagram ©2015-2019 Toshiba Electronic Devices & Storage Corporation 17 2019-02-27 TB9081FG ➣ B-(1) Under voltage of Vcc VCC1 voltage and VCC2 voltage are less than the threshold value of the under voltage detection voltage (vthcll). ➣ B-(2) Under voltage detection of Vcc After the response relaxation time (Tcl), Vcc under voltage detection signal (vcl1 and vcl2) outputs high, the under voltage state is detected, por_x outputs low, and NDIAG outputs low. Then, the pre-driver circuit, the charge pump, and the oscillating circuit are turned off. Each circuit holds OFF until the under voltage is released. ➣ B-(3) Return of Vcc voltage (under voltage release) If VCC1 voltage and VCC2 voltage exceed vthclh, Vcc under voltage detection signal (vcl1 and vcl2) outputs low, and the under voltage state is released. ➣ B-(4) Recover of normal operation After LBIST and ABIST are performed, the normal operation recovers in case the judgment of BIST “OK”. The charge pump circuit starts operation and the pre-driver circuit is turned on. In case the judgment of BIST “NG”, the charge pump circuit and the pre-driver circuit do not operate. NDIAG outputs high in the judgment of “OK”, and low in the judgment of “NG”. (1) VCC1 VCC2 Vthcll vcl1 (3) under voltage detection under voltage release Vthclh Tcl (2) vcl2 Tcl por_x LBIST ABIST (4) NDIAG H*O/ L*O control by BIST result control by input signal Pre-driver OFF control by BIST result and input signal Oscillation start clk4m Oscillator OFF Charge pump OFF VCPL VCPH Fig.5-2b control by BIST result Timing chart of VCC1/VCC2 under voltage detection * When Vcc is lower than the detection voltage of Vcc under voltage further, IC will be the stand-by state. In the stand-by state, functions other than Vcc under voltage detection are turned off. ©2015-2019 Toshiba Electronic Devices & Storage Corporation 18 2019-02-27 TB9081FG (5-3) VCC1/VCC2 over voltage detection Over voltage detection of VCC1/VCC2 is performed. The detection comparator and the filter are built in. If the filter outputs high, over voltage detection is performed. VCC2 Vcc Vcc vbg2 VCC1 + (vcl2) Logic SDOUT - Vcc BG2 under voltage monitoring2 SPI communication circuit Vcc vbg1 + SDIN SCK /CS (vcl1) - under voltage monitoring1 + (vch) Filter - Vcc BG1 NDIAG Error Logic Vcc over voltage monitoring (gate_en_u,v,w,r) (cp_en) (clk4m) Pre-Dr. CP1 CP2 (por_x) Fig.5-3a VCC1/VCC2 over voltage detection Block Diagram ©2015-2019 Toshiba Electronic Devices & Storage Corporation 19 2019-02-27 TB9081FG ➣ C-(1) Vcc voltage rise If VCC1 voltage and VCC2 voltage exceed the threshold value of over voltage detection (vthchh), H detection comparator of Vcc outputs high. ➣ C-(2) Over voltage detection of Vcc After the detection filter time (Tch), Vcc over voltage detection signal (vch) outputs high and NDIAG outputs low. The operation after detection can be chosen among 4 modes through SPI communication. A setup does not become effective even if the mode is changed in Vcc over voltage detection state. The setup becomes effective after Vcc over voltage is released and the register (ovc) is cleared. ➣C-(3) Return of Vcc voltage (over voltage release) If VCC1 voltage and VCC2 voltage are less than vthchl, Vcc over voltage detection signal (vch) outputs low and the over voltage is released. In the case of register ovc_op is 11, even if the over voltage is released, each circuit continues OFF and NDIAG keeps outputting low. When the register (ovc_op) is 00, 01, and 10, each circuit operates normally and NDIAG keeps outputting low. When the register (ovc) is cleared through SPI communication, each circuit operates normally and NDIAG outputs high. During over voltage detection, the register (ovc) is not cleared and NDIAG outputs low. register ovc_op = “01” (initial value) register ovc_op = “00” high voltage detection VCC1 VCC2 (1) vch NDIAG H*O/ L*O high voltage release Vthchh high voltage detection high voltage release Vthchh Vthchl register ovc_op = “10” high voltage detection high voltage release Vthchh Vthchl register ovc_op = “11” high voltage detection high voltage release Vthchh Vthchl Vthchl (3) (2) Tch Tch L hold Tch L hold control by          input signal          Pre-driver OFF Tch L hold control by input signal Pre-driver OFF L hold control by input signal  Charge pump OFF VCPL VCPH NDIAG:L hold Pre-driver:OFF NDIAG:L hold Fig.5-3b NDIAG:L hold Pre-driver:OFF Charge pump:OFF Pre-driver OFF-hold Charge pump OFF-hold NDIAG:L hold Pre-driver:OFF-hold Charge pump:OFF-hold Timing chart of VCC1/VCC2 over voltage detection ©2015-2019 Toshiba Electronic Devices & Storage Corporation 20 2019-02-27 TB9081FG (5-4) Over temperature detection Three over temperature detection comparators are built in. Three detection comparators and three filters are built in. If at least one filter outputs high, the over temperature detection becomes effective. The band gap voltage recognized as the reference of a detection comparator is generated from two band gap circuits (BG1 and BG2). When chip temperature exceeds 170°C, the comparator switches and the over temperature is detected. The operation after detection can be chosen among 4 modes through SPI communication. When IC internal temperature becomes 160°C or less, the over temperature detection is released. Vcc Vcc vbg1 Vcc + Logic - 2VF SDOUT AGND Vcc SPI communication circuit BG1 SDIN SCK /CS Vcc Vcc vbg2 (tsd1det) + Filter Filter AGND 2VF Filter NDIAG Error Logic (tsd3det) Vcc Vcc (por_x) (gate_en_u,v,w,r) (clk4m) + Pre-Dr. - 2VF (tsd2det) (cp_en) CP1 CP2 AGND Vcc BG2 Fig.5-4a Over temperature detection Block Diagram ©2015-2019 Toshiba Electronic Devices & Storage Corporation 21 2019-02-27 TB9081FG ➣ D-(1) Over temperature detection If the temperature exceeds Tsdh, after the detection filter time (Ttsd), the over temperature detection signal (tsd1 to 3det) outputs high, and the over temperature is detected. The operation after detection can be chosen among 4 modes through SPI communication. A setup does not become effective even if the mode is changed during over temperature state. The setup becomes effective when the over temperature state is released and the register (tsd*det) is cleared. ➣ D-(2) Release of over temperature detection If temperature is less than Tsdl, the over temperature detection signal (tsd1 to 3det) outputs low, and the over temperature detection is released. When register (tsd_op) is 11, even if the over temperature detection is released, each circuit continues OFF and NDIAG leeps outputting low. When the register (tsd_op) is 00, 01, and 10, each circuit operates normally. However, NDIAG holds low. When the register (tsd*det ) is cleared through SPI communication, each circuit operates normally and NDIAG outputs high. During over temperature detection, the register (tsd*det) is not cleared and NDIAG outputs low. register tsd_op = “00” over temperature release over temperature detection (1) temp Tsdh tsd*det NDIAG H*O/ L*O Tsdl register tsd_op = “10” (initial value) register tsd_op = “01” (2) Ttsd over temperature detection over temperature release Tsdl Tsdh Ttsd L hold over temperature detection over temperature release over temperature detection over temperature release Tsdh Tsdl Tsdh Tsdl Ttsd L hold Pre-driver OFF control by          input signal          register tsd_op = “11” Ttsd L hold control by input signal Pre-driver OFF L hold control by input signal Charge pump OFF VCPL VCPH NDIAG:L hold Pre-driver:OFF NDIAG:L hold Fig.5-4b NDIAG:L hold Pre-driver:OFF Charge pump:OFF Pre-driver OFF-hold Charge pump OFF-hold NDIAG:L hold Pre-driver:OFF-hold Charge pump:OFF-hold Timing chart of over temperature detection ©2015-2019 Toshiba Electronic Devices & Storage Corporation 22 2019-02-27 TB9081FG (5-5) Short-circuit detection Short-circuit of external MOSFET is detected by monitoring the dorain terminal and the source terminal of the external MOSFET. When short-circuit is detected, the operation after detection can be chosen among 8 modes through SPI communication. Moreover, detection threshold voltage and detection time can be set from four values through SPI communication. At the time of short-circuit detection release, in case that the register (sh_op) is 010, 100, and 110, even if short-circuit detection is released, each circuit continues OFF and NDIAG holds L. When the register (tsd_op) is 000, 001, 011, and 101, each circuit operates normally, but NDIAG holds L. When the register (sc**) is cleared through SPI communication, each circuit operates normally and NDIAG outputs high. Vcc HS Pre-drv. input circuit Threshold setting vthh_sh Vcc HREF HVO Logic Pre-drv. logic SPI communication circuit Filter (shuh) Filter SHU (shvh) + - SHV + - SHW M Vcc (shwho) Error Logic Filter (shwh) Filter (shul) Filter (shvl) Vcc (shulo) + - LUO + - LVO Vcc (shvlo) Vcc (shwlo) Filter (shwl) (por_x) (clk4m) (gate_en_u) + Vcc (shvho) (gate_en_r) HWO Vcc (shuho) NDIAG HUO Pre-Drv. + - LWO LREF vthl_sh (Relay) Threshold setting GND (gate_en_v) (gate_en_w) Fig.5-5a ●Table5-5a Short-circuit detection Block Diagram Short-circuit detection state Comparator input SHU > LREF SHV > LREF SHW > LREF SHU < HREF SHV < HREF SHW < HREF Comparator output shul = H shvl = H shwl = H shuh = H shvh = H shwh = H Input signal LUI = H LVI = H LWI = H HUI = H HVI = H HWI = H Abnormal condition External MOSFET short-circuit of HUO External MOSFET short-circuit of HVO External MOSFET short-circuit of HWO External MOSFET short-circuit of LUO External MOSFET short-circuit of LVO External MOSFET short-circuit of LWO * HREF = HS- Vthh_sh (detection threshold voltage of the High side), LREF = Vthl_sh (detection threshold voltage of the Low side) * The detection threshold voltage of the High side is specified between HS and SH* of the IC terminal. Please set up the threshold value of HREF in consideration of the generating voltage by external resistance of HS terminal and SH* terminal, and the voltage between drain and source of MOSFET of the High side. * The detection threshold voltage of the Low side is specified between SH* and PGND(s) of the IC terminal.Please set up the threshold value of LREF in consideration of the generating voltage by external resistance of SH* terminal, the generating voltage by the shunt resistance for current detection, and the voltage between drain and source of MOSFET of the Low side. ©2015-2019 Toshiba Electronic Devices & Storage Corporation 23 2019-02-27 TB9081FG register sh_op = “000” Lo-side short-circuit detection Lo-side short-circuit occured Hi-side short-circuit detection short-circuit release H*I H*I L*I L*I SH* SH* sh*h sh*h sh*l short-circuit release sh*l Tsf Tsf sh*ho sh*ho Tsf sh*lo Tsf Tsf sh*lo NDIAG NDIAG L hold H*O H*O L*O L*O VCPL VCPH VCPL VCPH L hold NDIAG:L hold Fig.5-5b Timing chart of short-circuit detection (Register (sh_op) = ”000”) ©2015-2019 Toshiba Electronic Devices & Storage Corporation 24 2019-02-27 TB9081FG register sh_op = “001”, ”011” Lo-side short-circuit occured Lo-side short-circuit detection Hi-side short-circuit detection short-circuit release H*I H*I L*I L*I SH* SH* sh*h sh*h sh*l sh*l Tsf Tsf sh*ho sh*ho Tsf NDIAG L hold Pre-drv OFF H*O Tsf Tsf sh*lo sh*lo NDIAG short-circuit release Pre-drv OFF L hold H*O L*O L*O VCPL VCPH VCPL VCPH Pre-drv OFF Pre-drv OFF Pre-drv OFF NDIAG:L hold Pre-driver:OFF Fig.5-5c Timing chart of short-circuit detection (Register ( sh_op) = ”001” and ”011”) * "001" : Pre-driver OFF in only a detection phase. "011": Pre-driver OFF in all phase ©2015-2019 Toshiba Electronic Devices & Storage Corporation 25 2019-02-27 TB9081FG register sh_op = “010”(initial value), ”100” Lo-side short-circuit occured Lo-side short-circuit detection Hi-side short-circuit detection short-circuit release H*I H*I L*I L*I SH* SH* sh*h sh*h sh*l short-circuit release sh*l Tsf Tsf sh*ho sh*ho Tsf sh*lo Tsf Tsf sh*lo NDIAG NDIAG L hold Pre-drv OFF-hold H*O H*O Pre-drv OFF-hold L*O L*O L hold Pre-drv OFF-hold Pre-drv OFF-hold VCPL VCPH VCPL VCPH NDIAG:L hold Pre-driver:OFF-hold Fig.5-5d Timing chart of short-circuit detection (Register (sh_op) = ”010” and ”100”) *”010”: Pre-driver OFF in only a detection phase ”100”: Pre-driver OFF in all phase ©2015-2019 Toshiba Electronic Devices & Storage Corporation 26 2019-02-27 TB9081FG register sh_op = “101” Lo-side short-circuit detection Lo-side short-circuit occured Hi-side short-circuit detection short-circuit release H*I H*I L*I L*I SH* SH* sh*h sh*h sh*l short-circuit release sh*l Tsf Tsf sh*ho sh*ho Tsf sh*lo Tsf Tsf sh*lo NDIAG NDIAG L hold Pre-drv OFF H*O Pre-drv OFF H*O L*O L*O Charge pump OFF VCPL VCPH L hold Pre-drv OFF Pre-drv OFF Charge pump Charge pump OFF OFF Charge pump OFF Pre-drv OFF Charge pump OFF VCPL VCPH NDIAG:L hold Pre-driver:OFF Charge pump:OFF Fig.5-5e Timing chart of short-circuit detection (Register (sh_op) = ”101”) ©2015-2019 Toshiba Electronic Devices & Storage Corporation 27 2019-02-27 TB9081FG register sh_op = “110” Lo-side short-circuit detection Lo-side short-circuit occured Hi-side short-circuit detection short-circuit release H*I H*I L*I L*I SH* SH* sh*h sh*h sh*l sh*l Tsf short-circuit release Tsf sh*ho sh*ho Tsf sh*lo Tsf Tsf sh*lo NDIAG L hold NDIAG Pre-drv OFF-hold H*O H*O Pre-drv OFF-hold L*O L*O Charge pump OFF-hold VCPL VCPH VCPL VCPH L hold Pre-drv OFF-hold Pre-drv OFF-hold Charge pump OFF-hold NDIAG:L hold Pre-driver:OFF-hold Charge pump:OFF-hold Fig.5-5f Timing chart of short-circuit detection (Register (sh_op) = ”110”) ©2015-2019 Toshiba Electronic Devices & Storage Corporation 28 2019-02-27 TB9081FG (5-6) Oscillating frequency monitoring It detects the abnormality in frequency when oscillating frequency is low and high. The low frequency detection circuit of oscillating frequency resets the input of a comparator for every clk1m. If the frequency becomes low and reset is overdue, the output of a comparator is reversed and the abnormality in frequency is detected at the rising edge of the following clk1m. In the high frequency detection circuit of the oscillating frequency, a comparator repeats H/L output for every clk1m. When oscillating frequency becomes high, a detection comparator continues outputting H, and the detection comparator continues outputting H at the falling edge of 1st count of clk1m, the abnormality in high frequency is detected. The operation in failure detection can be chosen among 5 modes through SPI communication. A setup does not become effective even if the mode is changed in the frequency failure detection state. The setup becomes effective after the abnormality in frequency are released and the register (err_of and err_uf) is cleared. Abnormality of frequency is not detected in case that the register (ferr_op) is 1**. When frequency failure detection is released, in case that the register (ferr_op) is 011, even if frequency failure detection is released, each circuit continues OFF and NDIAG holds L. In case that the register (ferr_op) is 000, 001, and 010, each circuit recovers to the normal operation. However, NDIAG holds L. When the register (err_of and err_uf) is cleared through SPI communication, each circuit recovers to the normal operation and NDIAG outputs high. Vcc Logic SDOUT Vcc Low frequency monitoring SPI communication circuit Vcc Vcc (fsin) (clk1m) - (fso_x) + Cwdl Abnormal detection circuit SDIN SCK /CS (clkslow) (vbg2) Vcc (por_x) NDIAG Error Logic Vcc Vcc (ffin) - (ffo_x) + Cwdh Abnormal detection circuit (clkfast) (por_x) (gate_en_u,v,w,r) (vbg2) High frequency (por_x) monitoring Fig.5-6a Pre-Dr. (cp_en) CP1 CP2 Frequency monitoring circuit ©2015-2019 Toshiba Electronic Devices & Storage Corporation 29 2019-02-27 TB9081FG (clk1m) (fsin) (fso_x) detect at the rising edge of 1st count of clk1m (clkslow) NDIAG Fig.5-6b Timing chart of frequency monitoring (Low frequency) (clk1m) (ffin) (ffo_x) detect at the falling edge clk1m:1カウント目の of 1st count of clk 1m 立下りエッジで検出 (clkfast) NDIAG Fig.5-6c Timing chart of frequency monitoring (High frequency) ©2015-2019 Toshiba Electronic Devices & Storage Corporation 30 2019-02-27 TB9081FG (6) ALARM input circuit As an input terminal of an ALARM signal, TB9081FG have two terminals of ALARM1 and ALARM2. An ALARM signal controls Enable/Disable of the Pre-drivers (a FET drive circuit, a motor relay drive circuit, a power supply relay drive circuit). In the case of ALARM1= "L" or ALARM2= "L", the Pre-drivers will be Disable. In the case of ALARM1="H" and ALARM2="H", Enable/Disable is decided by the input and internal signal of each Pre-drivers. Also, the input side of the ALARM1 and ALARM2 terminal has a built-in digital filter (D.F.) for noise removal. Digital filter time can be set through the SPI communication. If ALARM1=“L” or ALARM2=“L” is detected, the short-circuit detection function is enabled. Vcc Vcc Logic (alm1) ALARM1 (gate_en_u) D.F. 50kΩ Pre-Dr. U phase H-side/L-side (gate_off_u) (gate_en_v) Vcc Pre-Dr. V phase H-side/L-side (gate_off_v) ALARM2 (alm2) D.F. 50kΩ (gate_en_w) Pre-Dr. W phase H-side/L-side (gate_off_w) (clk1m) (gate_en_r) Pre-Dr. Relay (gate_off_r) Error Logic (por_x) Fig.6-a Table 6-a FET drive circuit control truth table Input signal ALARM1 ALARM2 FET drive circuit control Block Diagram Internal input signal (por_x) Internal control signal (gate_off_u) (gate_off_v) (gate_off_w) (gate_off_r) (gate_en_u) (gate_en_v) (gate_en_w) (gate_en_r) * * * L * * * - * * * - * * * - L L L L L L L - L L L - L L L - H - - - H - - - - L - - - L - - - H - - - H - - - - L - - - L - - - H - - - H - FETdrive circuit L * * * L * * * L H H H H H H H H H H H H H H H H H H H H L L H H H H H H (Note 1) “*”: Don’t care (Note 2) Although "-":gate_off_* and gate_en_* have logic dependence in phase, the logic dependence to other phase is nothing. ©2015-2019 Toshiba Electronic Devices & Storage Corporation 31 Disable Disable Disable U phase Disable U phase Enable V phase Disable V phase Enable W phase Disable W phase Enable Relay Disable Relay Enable 2019-02-27 TB9081FG (7) EN_CP input circuit EN_CP signal controls Enable/Disable of a charge pump circuit. In the case of input signal EN_CP= "L", the charge pump circuit will be Disable. In the case of EN_CP="H", Enable/Disable of the charge pump circuit is decided by an internal signal. Also, the charge pump SW circuit (CP_SW) will be Disable in case of input signal EN_CP = "L" or the internal signal (por_x) = "L". In the case of EN_CP = (por_x) = "H", it will be Enable. Vcc Vcc Logic Vb CP_SW Divider (por_x) Vcc EN_CP Control Circuit (cp_en) 50kΩ CP1H (cp_off) CP1 CP2 Error Logic CP2H (por_x) VCPH Fig.7-a Table 7-a EN_CP input circuit Block Diagram Charge-pump-circuit control truth table Input signal Internal input signal Internal control signal EN_CP (por_x) (cp_off) (cp_en) L H H H * L H H * * L H L L L H Charge pump circuit Charge pump SW circuit Disable Disable Disable Enable Disable Disable Enable Enable (Note) "*":Don't care ©2015-2019 Toshiba Electronic Devices & Storage Corporation 32 2019-02-27 TB9081FG (8) ABIST function At the time of IC starting, it is diagnosed whether miscellaneous abnormal detection is functioning normally. At the time of IC starting, a divider starts operation after VCC1/VCC2 under voltage release, and it starts diagnosis of ABIST after LBIST completion. Diagnosis of ABIST is performed even when a judgment of LBIST is NG. At the time of ABIST starting, the input voltage of the comparator is changed by the switch for diagnosis, and each detection comparator is reversed. Then, the diagnosis is performed. Diagnosis is performed in order synchronizing with a clock (clk16k), and diagnostic information is input to the ABIST judgment circuit. Also, NDIAG=L is kept during the diagnosis. After completion of all diagnosis, the IC switches to the normal operation. When the abnormal detection is not diagnosed, NDIAG will be H. When the abnormal detection is diagnosed, NDIAG will be L and keep the diagnosis information. A diagnostic part is as follows. VCC1/VCC2 over voltage detection, VCPH clamp voltage detection, over temperature detection, and frequency abnormal detection (low frequency side) Vcc VCC2 SPI communication circuit Logic VCC1 over voltage monitoring Vcc + vbg1 (vch) ABIST Control - (clk16k) (abst_end) Error Logic NDIAG (abst_pass) BG1 Divider Normal operation Diagnosis operation Fig.8-a (por_x) ABIST Block Diagram (VCC1/VCC2 over voltage detection) Table 8-a Circuit operation truth table (CP_SW circuit) Input signal EN_CP Before ABIST CP_SW circuit During ABIST ABIST OK L H Disable Enable Enable Enable Disable Enable ABIST NG Disable Enable Table 8-b Circuit operation truth table (charge pump circuit) Input signal EN_CP Before ABIST Charge pump circuit During ABIST ABIST OK ABIST NG L H Disable Disable Disable Disable Disable Enable Disable Disable Before ABIST Pre-diver circuit During ABIST ABIST OK ABIST NG Disable Disable Disable Disable Disable Disable Disable Disable Disable Table 8-c Circuit operation truth table (pre-driver circuit) Input signal ALARM1 ALARM2 L * * L H H (Note)“*”: Don’t care ©2015-2019 Toshiba Electronic Devices & Storage Corporation Disable Disable Enable 33 2019-02-27 TB9081FG ➣ H-(1) IC startup At the time of IC starting, the divider is started the operation by the release of Vcc under voltage. ➣ H-(2) LBIST running The divider starts the operation and starts the LBIST. ➣ H-(3) ABIST start up The ABIST is started after the LBIST. The detection comparator is changed every 2clk of clk16k, and diagnosed whether the detection comparator is outputting the failure detection signal correctly. The comparator for an over temperature detection is diagnosed to the beginning. ➣ H-(4) Diagnosis Each comparator is diagnosed as follows. VCC1/VCC2 over voltage, VCPH cramp voltage, and a frequency monitoring (low frequency) ➣ H-(5) ABIST completion When all detection comparator diagnosis is completed, the IC switches to the normal operation mode, and the charge pump circuit starts the operation. Then the pre-driver can be ON. Also, the diagnosis result is output to the NDIAG. In the case of the diagnosis NG, the charge pump circuit and the pre-driver circuit are kept OFF. VB1 VB2 VCC1 VCC2 vcl1 vcl2 *2 Vthclh under voltage release (1) clk4m (2) LBIST (3) ABIST clk16k abnormal state diagnosis normal state diagnosis (4) tsd1det (5) tsd2det tsd3det vch vphh clkl NDIAG control by BIST result VCPL VCPH H*O/ L*O control by BIST result and EN_CP *1 control by BIST result and input signal Fig.8-b ABIST timing chart *1 Regardless of EN_CP input signals, Vcph is equal to Vcpl=Vb-3VF (Vcpl
TB9081FG 价格&库存

很抱歉,暂时无法提供与“TB9081FG”相匹配的价格&库存,您可以联系我们找货

免费人工找货