TC74HCT373AP

TC74HCT373AP/AF TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74HCT373AP,TC74HCT373AF Octal D-Type Latch with 3-State Output The TC74HCT373A is a high speed CMOS OCTAL LATCH with 3-STATE OUTPUT fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. Their inputs are compatible with TTL, NMOS, and CMOS output voltage levels. These 8-bit D-type latches are controlled by a latch enable input (LE) and an output enable input ( OE ). When the OE input is high, the eight outputs are in a high impedance state. All inputs are equipped with protection circuits against static discharge or transient excess voltage. TC74HCT373AP TC74HCT373AF Features • • • • • • • • High speed: tpd = 17 ns (typ.) at VCC = 5 V Low power dissipation: ICC = 4 μA (max) at Ta = 25°C Compatible with TTL outputs: VIH = 2 V (min) VIL = 0.8 V (max) Wide interfacing ability: LSTTL, NMOS, CMOS Output drive capability: 15 LSTTL loads Symmetrical output impedance: |IOH| = IOL = 6 mA (min) ∼ Balanced propagation delays: tpLH − tpHL Pin and function compatible with 74LS373 Weight DIP20-P-300-2.54A SOP20-P-300-1.27A : 1.30 g (typ.) : 0.22 g (typ.) Pin Assignment 1 2007-10-01 TC74HCT373AP/AF IEC Logic Symbol Truth Table Inputs OE Output D X X L H Q Z Qn L H LE X L H H H L L L X: Don’t care Z: High impedance Qn: Q outputs are latched at the time when the LE input is taken to a low logic level. System Diagram 2 2007-10-01 TC74HCT373AP/AF Absolute Maximum Ratings (Note 1) Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating −0.5~7 −0.5~VCC + 0.5 −0.5~VCC + 0.5 ±20 ±20 ±35 ±75 500 (DIP) (Note 2)/180 (SOP) −65~150 Unit V V V mA mA mA mA mW °C Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = −40~65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C shall be applied until 300 mW. Operating Ranges (Note) Characteristics Supply voltage Input voltage Output voltage Operating temperature Input rise and fall time Symbol VCC VIN VOUT Topr tr, tf Rating 4.5~5.5 0~VCC 0~VCC −40~85 0~500 Unit V V V °C ns Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. 3 2007-10-01 TC74HCT373AP/AF Electrical Characteristics DC Characteristics Test Condition Characteristics High-level input voltage Low-level input voltage High-level output voltage Low-level output voltage 3-state output off-state current Input leakage current Quiescent supply current Symbol VCC (V) ⎯ ⎯ VIN = VIH VIN = VIL IOH = −20 μA IOH = −6 mA IOL = 20 μA IOL = 6 mA 4.5~ 5.5 4.5~ 5.5 4.5 4.5 4.5 4.5 5.5 5.5 5.5 5.5 Min 2.0 ⎯ 4.4 4.18 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Ta = 25°C Typ. ⎯ ⎯ 4.5 4.31 0.0 0.17 ⎯ ⎯ ⎯ ⎯ Max ⎯ 0.8 ⎯ ⎯ 0.1 0.26 ±0.5 ±0.1 4.0 2.0 Ta = −40~85°C Min 2.0 ⎯ 4.4 4.13 ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Max ⎯ 0.8 ⎯ ⎯ 0.1 0.33 ±5.0 ±1.0 40.0 2.9 Unit VIH VIL VOH V V V VOL V IOZ IIN ICC IC VIN = VIH or VIL VOUT = VCC or GND VIN = VCC or GND VIN = VCC or GND Per input: VIN = 0.5 V or 2.4 V Other input: VCC or GND μA μA μA mA Timing Requirements (input: tr = tf = 6 ns) Characteristics Symbol Test Condition VCC (V) Minimum pulse width (LE) Minimum set-up time (Dn) Minimum hold time (Dn) tW (H) ⎯ 4.5 5.5 4.5 5.5 4.5 5.5 Ta = 25°C Typ. ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Limit 15 14 10 9 5 5 Ta = −40 ~85°C Limit 19 17 13 12 5 5 ns Unit ts ⎯ ns th ⎯ ns 4 2007-10-01 TC74HCT373AP/AF AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns) Test Condition Characteristics Symbol tTLH tTHL CL (pF) ⎯ 50 VCC (V) 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 Min ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Ta = 25°C Typ. 7 6 19 16 24 22 20 18 25 22 19 16 24 22 20 18 5 10 36 Max 12 11 30 27 38 34 30 27 38 34 30 27 38 34 30 27 10 ⎯ ⎯ Ta = −40~85°C Min ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ ⎯ Max 15 14 38 34 48 43 38 34 48 43 38 34 48 43 38 34 10 ⎯ ⎯ ns pF pF pF ns ns ns Unit Output transition time ns Propagation delay time (LE-Q) tpLH tpHL 50 ⎯ 150 Propagation delay time (D-Q) tpLH tpHL 50 ⎯ 150 Output enable time tpZL tpZH 50 RL = 1 kΩ 150 Output disable time Input capacitance Output capacitance Power dissipation capacitance tpLZ tpHZ CIN COUT CPD (Note) RL = 1 kΩ ⎯ ⎯ ⎯ 50 Note: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD･VCC･fIN + ICC/8 (per latch) And the total CPD when n pcs. of flip flop operate can be gained by the following equation: CPD (total) = 19 + 17･n 5 2007-10-01 TC74HCT373AP/AF Package Dimensions Weight: 1.30 g (typ.) 6 2007-10-01 TC74HCT373AP/AF Package Dimensions Weight: 0.22 g (typ.) 7 2007-10-01 TC74HCT373AP/AF RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN GENERAL • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. 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Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01