TLP558

TLP558 TOSHIBA Photocoupler GaAℓAs IRed & Photo IC TLP558 Isolated Bus Driver High Speed Line Receiver Microprocessor System Interfaces MOS FET Gate Driver Transistor Inverter The TOSHIBA TLP558 consists of a GaAℓAs light emitting diode and integrated high gain, high speed photodetector. This unit is 8−lead DIP package. The detector has a three state output stage that provides source drive and sink drive, and built−in schmitt trigger. The detector IC has an internal shield that provides a guaranteed common mode transient immunity of 1000V / μs. TLP558 is inverter logic type. For buffer logic type, TLP555 is in line−up. Unit in mm Input current: IF=1.6mA(max.) Power supply voltage: VCC=4.5~20V Switching speed: tpHL, tpLH=400ns(max.) Common mode transient immunity: ±1000V / μs(min.) Guaranteed performance over temperature: −25~85°C Isolation voltage: 2500Vrms(min.) UL recognized: UL1577, file No. E67349 TOSHIBA Weight: 0.54 g 11−10C4 Pin Configuration(top view) 1 2 3 4 GND Shield VCC 8 1 : NC 2 : Anode 7 3 : Cathode 4 : NC 6 5 : GND 6 : VO(Output) 5 7 : VE(Enable) 8 : VCC Truth Table (positive logic) Input H L H L Enable H H L L Output L H Z Z Schematic IE ICC 7 8 VE VCC A 0.1μF bypass capacitor must be connected between pins 8 and 5 (see Note 9). + VF − 2 3 IF IO 6 VO Shield GND 5 1 2007-10-01 TLP558 Absolute Maximum Ratings (no derating required up to 85°C unless otherwise noted) Charactersitic Forward current LED Symbol IF (Note 1) IFPT VR IO (Note 2) IOP VO VCC VE (Note 3) (Note 4) PO PT Topr Tstg Tsol (Note 5) BVS Rating 10 1 5 40 / −25 80 / −50 −0.5~20 −0.5~20 −0.5~20 Unit mA A V mA mA V V V mW mW °C °C °C Vrms Peak transient forward current Reverse voltage Output current Peak output current Detector Output voltage Supply voltage Three state enabel voltage Output power dissipation Total package power dissipation 100 200 −40~85 −55~125 Operating temperature range Storage temperature range Lead solder temperature(10s)** Isolation voltage(AC, 1min., R.H.≤ 60%, Ta=25°C) 260 2500 Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) Pulse width ≤ 1μs, 300pps. (Note 2) Pulse width ≤ 5μs, duty ratio ≤ 0.025. (Note 3) Derate 1.8mW / °C above 70°C ambient temperature. (Note 4) Derate 3.6mW / °C above 70°C ambient temperature. (Note 5) Device considered a two terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted together. **1.6mm below seating plane. Recommended Operating Conditions Characteristic Input current, on Input voltage, off Supply voltage Enable voltage high Enable voltage low Fan out(TTL load) Operating temperature Symbol IF(ON) VF(OFF) VCC VEH VEL N Topr Min. 2* 0 4.5 2.0 0 ― −25 Typ. ― ― ― ― ― ― ― Max. 5 0.8 20 20 0.8 4 85 Unit mA V V V V ― °C Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. * 2mA condition permits at least 20% CTR degradation guardband. Initial switching threshold is 1.6mA or less. 2 2007-10-01 TLP558 Electrical Characteristics(unless otherwise specified, Ta = −25~85°C, VCC = 4.5~20V) Characteristic Input forward voltage Temperature coefficient of forward voltage Input reverse current Input capacitance Output leakage current (VO > VCC) Logic low output voltage Logic high output voltage Logic low enable current Symbol VF ΔVF / ΔTa IR CT IOHH VOL VOH IEL Test Condition IF=5mA, Ta=25°C IF=5mA VR=5V, Ta=25°C VF=0, f=1MHz, Ta=25°C VF=0, VCC=4.5V VO=VE=5.5V VO=VE=20V Min. ― ― ― ― ― ― ― 2.4 ― ― ― ― ― ― IF=5mA VCC=VE=5.5V VCC=VE=20V VCC=VE=5.5V VCC=VE=20V VO=0.4V VO=2.4V IOZH IF=5mA VE=0.8V VO=5.5V VO=20V Logic low short circuit output current Logic high short circuit output current Input current logic low output Input voltage logic high output (Note 6) IOSL IF=5mA VE=2V VF=0V, VO=GND VE=2V VE=2V, IO=6.4mA VO < 0.4V VE=2V, IO=−2.6mA VO > 2.4V VO=VCC=5.5V VO=VCC=20V VCC=5.5V VCC=20V ― 2.0 ― ― ― ― ― ― ― ― 25 40 −10 −25 Typ.* 1.55 −2.0 Max. 1.7 ― 10 ― 100 500 0.5 ― −0.32 Unit V mV / °C μA pF μA V V mA ― 45 ― 0.01 0.4 3.3 −0.13 IOL=6.4mA, IF=1.6mA VE=2V IOH=−2.6mA, VF=0.8V VE=2V VE=0.4V VE=2.7V ― ― 0.01 ― ― 4.0 4.6 4.2 4.7 ― ― ― 1 55 80 −25 −60 20 100 250 0.8 ― 6.0 7.5 6.0 7.5 −20 Logic high enable current IEH VE=5.5V VE=20V μA Logic low enable voltage Logic high enable voltage Logic low supply current VEL VEH ICCL V V mA Logic high supply current ICCH IOZL VF=0V VF=0V VE=0.8V mA High impedance state output current 20 100 500 ― ― ― ― 1.6 ― μA mA (Note 6) IOSH IFL VFH mA mA V ― 0.8 0.4 ― 3 2007-10-01 TLP558 Electrical Characteristics(unless otherwise specified, Ta = −25~85°C, VCC = 4.5~20V) Characteristic Input current hysteresis Resistance (input−output) Capacitance(input−output) Symbol IHYS RS CS Test Condition VCC=VE=5V VS=500V, R.H. ≤60% Ta=25°C VS=0, f=1MHz, Ta=25°C (Note 5) (Note 5) Min. ― 5×10 ― 10 Typ.* 0.05 10 14 Max. ― ― ― Unit mA Ω pF 1.0 *All typical values are at Ta=25°C, VCC=5V, IF(ON)=3mA unless otherwise specified. Switching Characteristics(unless otherwise specified, VCC = 4.5~20V, Ta = 25°C) Characteristic Propagation delay time to logic high output Propagation delay time to logic low output Output rise time (10−90%) Output fall time (90−10%) Output enable time to logic high Output enable time to logic low Output disable time from logic high Output disable time from logic low Common mode transient immunity at logic high output Common mode transient immunity at logic low output Symbol tpLH tpHL tr tf tpZH tpZL 2 tpHZ tpLZ CMH 3 CML IF=1.6mA, VCM=50V VO(Max.)=0.8V −1000 Test Cir− cuit Test Condition IF=3→ 0mA Min. ― ― ― ― ― ― ― ― Typ.* 250 270 35 20 ― ― ― ― Max. 400 400 75 75 ― ― ― ― Unit ns ns ns ns ns ns ns ns (Note 7) (Note 7) 1 IF=0→ 3mA IF=3→ 0mA, VCC=5V IF=0→ 3mA, VCC=5V VE=0→ 3V VE=0→ 3V VE=3→ 0V VE=3→ 0V IF=0mA, VCM=50V VO(Min.)=2V 1000 ― ― V / μs (Note 8) ― ― V / μs (Note 8) * All typical values are at Ta=25°C, VCC=5V 4 2007-10-01 TLP558 (Note 6) Duration of output short circuit time should not exceed 10ms. (Note 7) The tpLH propagation delay is measured from the 50% point on the trailing edge of the input pulse to the 1.3V point on the leading edge of the output pulse. The tpHL propagation delay is measured from the 50% point on the leading edge of the input pulse to the 1.3V point on the trailing edge of the output pulse. (Note 8) CML is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic low state (VO > 0.8V). CMH is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic state (VO > 2.0). (Note 9) A ceramic capacitor (0.1μF) should be connected from pin 8 to pin 5 to stabilize the operation of the high gain linear amplifier. Failure to provide the bypassing may impair the switching property. The total lead length between capacitor and coupler should not exceed 1cm. Test Circuit 1: tpLH, tpHL, tr And tf Pulse generation tr = tf = 5ns VO = 5V VCC VO Monitor 5V Input IF tpHL 90% 10% tf IF(ON) 50% tpLH 1.3V tr VOH VOL 0mA Output VO 2 IF Monitor 100Ω 3 4 GND 7 6 5 0.1μF IF 1 VCC 8 620Ω D1 5kΩ CL D1～D4 : 1S1588 D2 D3 D4 CL is approximately 15pF which includes probe and stray wiring capacitance. 5 2007-10-01 TLP558 Test Circuit 2: tpHZ, tpZH, tpLZ And tpZL Pulse generator ZO=50Ω tr = tf = 5ns 0V S1 and S2 Closed VOL VOH ～1.5V S1 and S2 Closed 1 IF 2 3 4 GND VCC 8 7 6 5kΩ S2 0.1μF VO Monitor 5 0.1μF VE VCC VO 620Ω D1 D1～D4 : 1S1588 D2 D3 D4 CL VCC IF A VFF 1 2 B VO (MIN.)* Switch at A : IF=0mA VOL Switch at B : IF=1.6mA * Note 8 CMH= 45(V) tf(μs) 45(V) tf(μs) VO(MAX.)* + 3 4 GND VCM − Pulse generator ZO =50Ω , CML= VCC 8 7 6 5 S1 Monitor 5V Input VE tpZL Output VO IF = IF (ON) S1 Closed S2 Open 1.3V tpZH 1.3V 0V tpHZ 3V 1.3V tpLZ 0.5V Output VO IF = 0mA S1 Open S2 Closed 0.5V CL is approximately 15pF which includes probe and stray wiring capacitance. Test Circuit 3: Common Mode Transient Immunity VCM 10% 90% tr tf 50V 0V VOH Output VOH 6 2007-10-01 TLP558 RESTRICTIONS ON PRODUCT USE • The information contained herein is subject to change without notice. 20070701-EN • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 7 2007-10-01