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VG36648041DT

VG36648041DT

  • 厂商:

    VML(世界先进)

  • 封装:

  • 描述:

    VG36648041DT - CMOS Synchronous Dynamic RAM - Vanguard International Semiconductor

  • 数据手册
  • 价格&库存
VG36648041DT 数据手册
VIS Description 4 (word x bit x bank), respectively. VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM The VG36644041D, VG36648041D and VG36641641D are high-speed 67,108,864-bit synchronous dynamic random-access memories, organized as 4,194,304 x 4 x 4, 2,097,152 x 8 x 4 and 1,048,576 x 16 x The synchronous DRAMs achieved high-speed data transfer using the pipeline architecture. All input and outputs are synchronized with the positive edge of the clock.The synchronous DRAMs are compatible with Low Voltage TTL (LVTTL).These products are packaged in 54-pin TSOPII. Features • Single 3.3V ( ± 0.3V ) power supply • High speed clock cycle time -6 : 166MHz, available only on 4MX16 option -7 : 143MHz, 133MHz -7L: 133MHz -8H: 100MHz • Fully synchronous operation referenced to clock rising edge • Possible to assert random column access in every cycle • Quad internal banks controlled by A12 & A13 (Bank Select) • Byte control by LDQM and UDQM for VG36641641D • Programmable Wrap sequence (Sequential / Interleave) • Programmable burst length (1, 2, 4, 8 and full page) • Programmable /CAS latency (2 and 3) • Automatic precharge and controlled precharge • CBR (Auto) refresh and self refresh • X4, X8, X16 organization • LVTTL compatible inputs and outputs • 4,096 refresh cycles / 64ms • Burst termination by Burst stop and Precharge command Document :1G5-0177 Rev.2 Page 1 VIS Pin Configurations VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM VG36644041 ( x4 ) VG36648041 ( x8 ) VG36641641 ( x16 ) VDD NC VDDQ NC DQ0 VSSQ NC NC VDDQ NC DQ1 VSSQ NC VDD NC /WE /CAS /RAS /CS A13/BA0 A12/BA1 A10 A0 A1 A2 A3 VDD VDD DQ0 VDDQ NC DQ1 VSSQ NC DQ2 VDDQ NC DQ3 VSSQ NC VDD NC WE /CAS /RAS /CS A13/BA0 A12/BA1 A10 A0 A1 A2 A3 VDD VDD DQ0 VDDQ DQ1 DQ2 VSSQ DQ3 DQ4 VDDQ DQ5 DQ6 VSSQ DQ7 VDD LDQM WE /CAS /RAS /CS A13/BA0 A12/BA1 A10 A0 A1 A2 A3 VDD 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 VSS DQ15 VSSQ DQ14 DQ13 VDDQ DQ12 DQ11 VSSQ DQ10 DQ9 VDDQ DQ8 VSS NC UDQM CLK CKE NC VSS DQ7 VSSQ NC DQ6 VDDQ NC DQ5 VSSQ NC DQ4 VDDQ NC VSS NC DQM CLK CKE NC VSS NC VSSQ NC DQ3 VDDQ NC NC VSSQ NC DQ2 VDDQ NC VSS NC DQM CLK CKE NC A11 A9 A8 A7 A6 A5 A4 VSS A11 A9 A8 A7 A6 A5 A4 VSS A11 A9 A8 A7 A6 A5 A4 VSS Pin Descriptions Pin Name CLK CKE /CS /RAS /CAS /WE DQ0 ~ DQ15 Function Master Clock Clock Enable Chip Select Row Address Strobe Column Address Strobe Write Enable Data I/O Pin Name DQM A0-11 BA0,1 VDD VDDQ VSS VSSQ Function DQ Mask Enable Address Input Bank Address Power Supply Power Supply for DQ Ground Ground for DQ Document :1G5-0177 Rev.2 Page 2 VIS Block Diagram CLK CKE Clock Generator VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Address Mode Register Row Decoder Row Address Buffer & Refresh Counter Bank D Bank C Bank B Bank A Command Decoder Sense Amplifier Control Logic Column Address Buffer & Burst Counter Column Decoder & Latch Circuit Input & Output Buffer Latch Circuit CS RAS CAS WE DQM Data Control Circuit DQ Document :1G5-0177 Rev.2 Page 3 VIS Pin Function Symbol CLK CKE Input Input Input VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Function Maste Clock: Other inputs signals are referenecd to the CLK rising edge Clock Enable: CKE HIGH activates, and CKE LOW deactivates internal clock signals, device input buffers and output drivers. Deactivating the clock provides PRECHARGE POWER-DOWN and SELF REFRESH operation (all banks idle), or ACTIVE POWERDOWN (row ACTIVE in any bank). Chip Select: CS# enables (registered LOW) and disables (registered HIGH) the command decoder. All commands are masked when CS# is registered HIGH. CS# provides for external bank selection on systems with multiple banks. CS# is considered part of the command code. Command Inputs: RAS#, CAS# and WE# (along with CS#) define the command being entered. Address Inputs: Provide the row address for ACTIVE commands, and the column address and AUTO PRECHARGE bit for READ/WRITE commands, to select one location out of the memory array in the respective bank. The row address is specified by A0-A11. The column address is specified by A0-A9 (X4) / A0-A8 (X8) / A0-A7 (X16) Bank Address Inputs: BA0 and BA1 define to which bank an ACTIVE, READ, WRITE or PRECHARGE command is being applied. Address Inputs: Provide the row address for ACTIVE commands (row address A0A10), and the column address and AUTO PRECHARGE bit for READ/WRITE commands (column address A0-A7 with A10 defining AUTO PRECHARGE), to select one location out of the memory array in the respective bank. Data Input / Output: Data bus /CS Input /RAS, /CAS, /WE A0 - A13 Input Input BA0,BA1 DQM, UDQM , LDQM Input Input DQ0 - DQ15 VDD, VSS VDDQ, VSSQ I/O Supply Power Supply for the memory array and peripheral circuitry Supply Power Supply are supplied to the output buffers only Document :1G5-0177 Rev.2 Page 4 VIS Absolute Maximum Ratings Parameter Supply Voltage Supply Voltage for Output Input Voltage Output Voltage Short circuit output current Power dissipation Operating temperature Storage temperature Symbol VDD VDDQ VI VO IO PD TOPT TSTG VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Conditions with respect to V SS with respect to V SSQ with respect to V SS with respect to V SSQ Ta = 25 °C Value -0.5 to 4.6 -0.5 to 4.6 -0.5 to V DD+0.5 -0.5 to VDDQ+0.5 50 1 0 to 70 -65 to 150 Unit V V V V mA W °C °C Caution Exposing the device to stress above those listed in Absolute Maximum Ratings could cause permanent damage. The device is not meant to be operated under conditions outside the limits described in the operational section of this specification. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Recommended Operating Conditions (Ta = 0 ~ 70 °C, unless otherwise noted) Parameter Supply Voltage Supply Voltage for DQ Ground Ground for DQ High Level Input Voltage (all inputs) Low Level Input Voltage (all inputs) Symbol VDD VDDQ VSS VSSQ VIH VIL Limits Min. 3.0 0 3.0 0 2.0 -0.3 Typ. 3.3 0 3.3 0 Max. 3.6 0 3.6 0 VDD + 0.3 0.8 Unit V V V V V V Pin Capacitance (Ta = 0 ~ 70°C, VDD = VDDQ = 3.3 ± 0.3V , VSS = VSSQ = 0V, unless otherwise noted ) Parameter Input Capacitance, address & control pin Input Capacitance, CLK pin Data input / output capacitance Symbol CIN CCLK CI/O Min 2.5 2.5 4.0 Max 3.8 3.5 6.5 Unit pF pF pF Document :1G5-0177 Rev.2 Page 5 VIS Parameter Operating current Symbol ICC1 Test Conditions VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM DC Characteristics 1 (Ta = 0 ~ 70°C, VDD = VDDQ = 3.3 ± 0.3V, VSS = VSSQ = 0V, Ouput Open, unless otherwise noted) Organization x4 x8 x16 x4/x8/x16 x4/x8/x16 x4/x8/x16 -6 95 Limits (max.) -7 -7L 75 75 75 75 85 85 2 1 20 mA -8H 70 70 80 Unit Notes One bank active tRC = tRC(MIN), tCLK = tCLK(MIN), BL = 1, CL=3 mA 1, 2 Precharge standby ICC2P CKE ≤ VIL(MAX), tCK = 15ns current in power down ICC2PS CKE ≤ VIL(MAX), CLK ≤ VIL(MAX) mode Precharge standby ICC2N CKE ≥ V CC - 0.2V CS current in non power CKE tCK = 15ns, CKE ≥ V IH(MIN) down mode ICC2NS CKE ≥ V CC - 0.2V CS CLK ≤ VIL(MAX), CKE ≥ VIH(MIN) CKE V All input signals are stable. CKE mA 3 x4/x8/x16 x4/x8/x16 x4/x8/x16 x4/x8/x16 15 7 5 30 mA Active standby current ICC3P in power down mode ICC3PS Active standby current ICC3N in Nonpower down mode ICC3NS ≤ VIL(MAX), tCK = 10ns CKE ≤ VIL(MAX), CLK ≤ VIL(MAX) CS CKE ≥ V CC - 0.2V CKE tCK = 15ns, CKE ≥ V IH(MIN) CKE ≥ V CC - 0.2V CS CLK ≤ VIL(MAX), CKE ≥ VIH(MIN) CKE V All input signals are stable. All banks active tCK = tCK(MIN), BL=4, CL=3 All banks active tRC = tRC(MIN) , tCLK = tCLK(MIN) CKE mA mA 3 x4/x8/x16 x4 x8 x16 x4/x8/x16 x4/x8/x16 130 150 90 90 100 130 25 90 90 100 130 1 0.5 70 70 80 110 mA Operating current (Burst mode) Refresh current Self refresh current NOTES ICC4 mA mA mA mA 4 5 ICC5 ICC6 ≤ 0.2V 1. ICC(max) is specified at the output open condition. 2. -6 grade is available only on 4MX16 option. 3. Input signals are changed one time during 30ns. 4. Normal version: VG366440(80/16)41DT 5. Low power version: VG366440(80/16)41DTL DC Characteristics 2 (Ta = 0 ~ 70°C, VDD = VDDQ = 3.3 ± 0.3V , VSS = VSSQ = 0V, unless otherwise noted) Parameter Input leakage current (Inputs) Output leakage current (I/O pins) High level output voltage Low level output voltage Symbol II (L) IO (L) VOH VOL Test Condition 0 ≤ VIN ≤ VDD(MAX) Pins not under test = 0V 0 ≤ VOUT ≤ VDD(MAX) DQ# in H - Z., DOUT is disabled IOH = -2mA IOL = 2mA Min -5 -5 2.4 0.4 Max 5 5 Unit uA uA V V Document :1G5-0177 Rev.2 Page 6 VIS Test Conditions AC input Levels (VIH/VIL) Input rise and fall time 2.0 / 0.8V 1ns VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM AC Characteristics (Ta = 0 ~ 70°C, VDD = VDDQ = 3.3 ± 0.3V , VSS = VSSQ = 0V, unless otherwise noted) Input timing reference level / Output timing reference level Output load condition 1.4V 50pF Note): 1.if clock rising time is longer than 1ns, (tr/2-0.5ns) should be added to the parameter. Output Load Conditions VDDQ VOUT VDDQ Z = 50 Ω 50PF Device Under Test Document :1G5-0177 Rev.2 Page 7 VIS Parameter Symbol Min CLK cycle time CL = 3 CL = 2 CLK to valid output delay CLK high pulse width CLK low pulse width CKE setup time CKE hold time Address setup time Address hold time Command setup time Command hold time Data input setup time Data input hold time Output data hold time CL = 3 CL = 2 CL = 3 CL = 2 tCK3 tCK2 tAC3 tAC2 tCH tCL tCKS tCKH tAS tAH tCMS tCMH tDS tDH tOH3 tOH2 tLZ tHZ tRC tRAS tRCD tRP tRRD tDPL tT tRSC tREF 2.5 2.5 1.5 0.8 1.5 0.8 1.5 0.8 1.5 0.8 2.5 2.5 0 2.5 60 42 18 15 12 12 1 2 64 10 100K 5 6 7.5 5 6 -6 *1 VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM A.C. Characteristics (Ta = 0 ~ 70°C, VDD = VDDQ = 3.3 ± 0.3V , VSS = VSSQ = 0V, unless otherwise noted) Limits -7 Max Min 7 7.5 5.4 6 2.5 2.5 1.5 0.8 1.5 0.8 1.5 0.8 1.5 0.8 2.7 2.7 0 2.7 63 42 20 15 14 14 1 2 64 10 100K 5.4 2.5 2.5 1.5 0.8 1.5 0.8 1.5 0.8 1.5 0.8 2.7 3 0 2.7 67.5 45 20 20 15 15 1 2 64 10 100K 5.4 Max Min 7.5 10 5.4 6 3 3 2 1 2 1 2 1 2 1 3 3 0 3 70 50 20 20 20 20 1 2 64 10 100K 6 -7L Max Min 8 10 6 6 -8H Max ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns tck ms *2 *2 *2 *2 Unit Note CLK to output in low - Z CLK to output in H - Z ROW cycle time ROW active time RAS to CAS delay Row precharge time Row active to active delay Data in to precharge Transition time Mode reg. set cycle Refresh time Notes 1. -6 grade is available only on 4MX16 option. 2. if clock rising time is longer than 1ns, (tr/2-0.5ns) should be added to the parameter. Document :1G5-0177 Rev.2 Page 8 VIS Basic Features and Function Description 1. Simplified State Diagram VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Self Refresh try en it ex LF SE Mode Register Set MRS IDLE LF SE REF AUTO Refresh CK E E CK ROW ACTIVE BS T ACT Power Down CKE CKE T BS Active Power Down ad Re W rit e Au Write to p red with har ge h wit rge ad cha Re Pre to Au re co ve r y Write (Write recovery) Read PRE W rit e WRITE SUSPEND CKE CKE WRITE Read (write recovery) Write READ CKE CKE READ SUSPEND Write with Auto Precharge R Auto ead w Pre ith cha rge rge cha P re E( PR ith e te w arg Wri Prech uto (wri A t e re cov ery) ter min atio n ) Read with Auto Precharge WRITE A SUSPEND CKE CKE WRITE A CKE READ A CKE READA SUSPEND POWER ON Precharge Precharge Automatic sequence Manual input Note: After the AUTO refresh operation, precharge operation is performed automatically and enter the IDLE state Document :1G5-0177 Rev.2 PR E (P r ech arg e m ter tio ina n) Page 9 VIS 2.Truth Table 2.1 Command Truth Table FUNCTION Device deselect No operation Mode register set Bank activate Read Read with auto precharge Write Write with auto precharge Precharge select bank Precharge all banks Burst stop CBR (Auto) refresh Self refresh Symbol DESL NOP MRS ACT READ READA WRIT WRITA PRE PALL BST REF SELF CKE n-1 H H H H H H H H H H H H H n VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM CS H L L L L L L L L L L L L RAS X H L L H H H H L L H L L CAS X H L H L L L L H H H L L WE X H L H H H L L L L L H H BA X X L V V V V V V X X X X A10 X X L V L H L H L H X X X A11 A9 - A0 X X V V V V V V X X X X X X X X X X X X X X X X H L 2.2 DQM Truth Table CKE FUNCTION Data write/output enable Data mask/output disable Symbol ENB MASK n-1 H H n-1 X X L H DQM 2.3 CKE Truth Table CKE Current State Activating Any Clock suspend Idle Idle Self refresh Idle Power down Function Clock suspend mode entry Clock suspend Clock suspend mode exit CBR refresh command Self refresh entry Self refresh exit Power down entry Power down exit REF SELF Symbol n-1 H L L H H L L H L n L L H H L H H L H CS X X X L L L H X X RAS X X X L L H X X X CAS X X X L L H X X X WE X X X H H H X X X Add ress X X X X X X X X X H : High level, L : Low level X : High or Low level (Don’t care), V : Valid Data input Document :1G5-0177 Rev.2 Page 10 VIS 2.4 Operative Command Table (note 1) HCurrent state CS Idle H L L L L L L L Row active H L L L L L L L Read H L L L L L L L L Write H L L L L L L L L RAS CAS WE X H H H L L L L X H H H L L L L X H H H H L L L L X H H H H L L L L X H L L H H L L X H L L H H L L X H H L L H H L L X H H L L H H L L X X H L H L H L X X H L H L H L X H L H L H L H L X H L H L H L H L X X BA, CA, A10 BA, CA, A10 BR, RA BA, A10 X Op-Code X X BA, CA, A10 BA, CA, A10 BA, RA BA, A10 X Op-Code X X X BA, CA, A10 BA, CA, A10 BA, RA BA, A10 X Op-Code X X X BA, CA, A10 BA, CA, A10 BA, RA BA, A10 X Op-Code Address VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM (1/3) Command DESL NOP or BST READ/READA WRIT/WRITA ACT PRE/PALL REF/SELF MPS DESL NOP or BST READ/READA WRIT/WRITA ACT PRE/PALL REF/SELF MRS DESL NOP BST READ/READA WRIT/WRITA ACT PRE/PALL REF/SELF MRS DESL NOP BST READ/READA WRIT/WRITA ACT PRE/PALL REF/SELF MRS Action Nop or Power down Nop or Power down ILLEGAL ILLEGAL Row active Nop Refresh or Self refresh Mode register access Nop Nop Begin read : Determine AP Begin write : Determine AP ILLEGAL Precharge ILLEGAL ILLEGAL Continue burst to end Continue burst to end Burst stop 5 5 3 6 4 Notes 2 2 3 3 → Row active → Row active 7 7,8 3 → Row active Term burst, new read : Determine AP Term burst, start write : Determine AP ILLEGAL Term burst, precharging ILLEGAL ILLEGAL Continue burst to end Continue burst to end Burst stop → write recovering → write recovering 7,8 7 3 9 → Row active Term burst, start read : Determine AP Term burst, new write : Determine AP ILLEGAL Term burst, precharging ILLEGAL ILLEGAL Document :1G5-0177 Rev.2 Page 11 VIS Current state Read with auto precharge CS RAS CA WE H L L L L L L L L Write with auto precharge H L L L L L L L L Precharging H L L L L L L L L Row activating H L L L L L L L L X H H H H L L L L X H H H H L L L L X H H H H L L L L X H H H H L L L L X H H L L H H L L X H H L L H H L L X H H L L H H L L X H H L L H H L L X H L H L H L H L X H L H L H L H L X H L H L H L H L X H L H L H L H L X X X BA, CA, A10 BA, CA, A10 BA, RA BA, A10 X Op - Code X X X BA, CA, A10 BA, CA, A10 BA, RA BA, A10 X Op - code X X X BA, CA, A10 BA, CA, A10 BA, RA BA, A10 X Op - Code X X X BA, CA, A10 BA, CA, A10 BA, RA BA, A10 X Op - Code Address VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM (2/3) Command DESL NOP BST WRIT/WRITA ACT PRE/PALL PEF/SELF MRS DESL NOP BST Action Continue burst to end Continue burst to end ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL Continue burst to end → write recovering with auto precharte Continue burst to end → write recovering with auto precharge ILLEGAL 11 11 3,11 3,11 Notes Precharging Precharging 11 11 3,11 3,11 → → READ/READA ILLEGAL READ/READA ILLEGAL WRIT/WRITA ACT PRE/PALL REF/SELF MRS DESL NOP BST ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL Nop Nop Nop → → → Enter idle after tRP Enter idle after tRP Enter idle after tRP 3 3 3 READ/READA ILLEGAL WRIT/WRITA ACT PRE/PALL REF/SELF MRS DESL NOP BST ILLEGAL ILLEGAL Nop → Enter idle after tRP ILLEGAL ILLEGAL Nop Nop Nop → → → Enter row active after tRCD Enter row active after tRCD Enter row active after tRCD 3 3 3, 9 3 READ/READA ILLEGAL WRIT/WRITA ACT PRE/PALL REF/SELF MRS ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL Document :1G5-0177 Rev.2 Page 12 VIS Current Write recovering CS H L L L L L L L L Write recovering with auto precharge H L L L L L L L L Auto Refreshing H L L L L Mode register setting H L L L L RAS X H H H H L L L L X H H H H L L L L X H H L L X H H H L CAS X H H L L H H L L X H H L L H H L L X H L H L X H H L X WE X H L H L H L H L X H L H L H L H L X X X X X X H L X X X X X BA, CA, A10 BA, CA, A10 BA, RA BA, A10 X Op - Code X X X BA, CA, A10 BA, CA, A10 BA, RA BA, A10 X Op - Code X X X X X X X X X X Address VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM (3/3) Command DESL NOP BST READ/READA WRIT/WRITA ACT PRE/PALL PEF/SELF MRS DESL NOP BST READ/READA WRIT/WRITA ACT PRE/PALL REF/SELF MRS DESL NOP/BST READ/WRIT ACT/PRE/PALL DESL NOP BST READ/WRITE Nop Nop Nop Action Notes → → → Enter row active after tDPL Enter row active after tDPL Enter row active after tDPL 8 3 3 Start read, Determine AP New write, Determine AP ILLEGAL ILLEGAL ILLEGAL ILLEGAL Nop Nop Nop → → → Enter precharge after tDPL Enter precharge after tDPL Enter precharge after tDPL 3,8,11 3,11 3,11 3 ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL ILLEGAL Nop Enter idle after tRC Nop Enter idle after tRC ILLEGAL ILLEGAL Nop Nop REF/SELF/MRS ILLEGAL → → Enter idle after 2 Clocks Enter idle after 2 Clocks ILLEGAL ILLEGAL ACT/PRE/PALL/ ILLEGAL REF/SELF/MRS Note 1. All entries assume that CKE was active (High level) during the preceding clock cycle. 2. If both banks are idle, and CKE is inactive (Low level), the device will enter Power downmode. All input buffers except CKE will be disabled. 3. Illegal to bank in specified states; Function may be legal in the bank indicated by BankAddress(BA), state of that bank. 4. If both banks are idle, and CKE is inactive (Low level), the device will enter Self refresh mode. All input buffers except CKE will be disabled. 5. Illegal if tRCD is not satisfied. 6. Illegal if tRAS is not satisfied. 7. Must satisfy burst interrupt condition. 8. Must satisfy bus contention, bus turn around, and/or write recovery requirements. 9. Must mask preceding data which don’t satisfy tDPL. 10. Illegal if tRRD is not satisfied. 11. Illegal for single bank, but legal for other banks in multi-bank devices. depending on the Document :1G5-0177 Rev.2 Page 13 VIS 2.5 Command Truth Table for CKE (Note 1) Current state Self refresh (S.R.) CKE n-1 H L L L L L H H H H H H H H L L H L L H H H H H H H H H H L H H L L CKE n X H H H H L H H H H L L L L H L X H L H H H H H L L L L L X H L H L CS X H L L L X H L L L H L L L X X X X X H L L L L H L L L L X X X X X RAS X X H H L X X H H L X H H L X X X X X X H L L L X H L L L X X X X X CAS X X H L X X X H L X X H L X X X X X X X X H L L X X H L L X X X X X VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM WE X X X X X X X X X X X X X X X X X X X X X X H L X X X H L X X X X X Address X X X X X X X X X X X X X X X X X Action INVALID, CLK (n - 1)would exit S.R. S.R. Recovery S.R. Recovery ILLEGAL ILLEGAL Maintain S.R. Idle after tRC Idle after tRC ILLEGAL ILLEGAL Begin clock suspend next cycle Begin clock suspend next cycle ILLEGAL ILLEGAL Exit clock suspend next cycle Maintain clock suspend INVALID, CLK (n - 1) would exit P.D. Notes 2 2 Self refresh recovery 5 5 2 Power down (P.D.) Both banks idle EXIT P.D. → Idle X Maintain power down mode Refer to operations in Operative Command Table Refer to operations in Operative Command Table Refer to operation in Operative Command Table X Auto Refresh Op - Code Refer to operations in Operative Command Table Refer to operations in Operative Command Table Refer to operations in Operative Command Table Refer to operations in Operative Command Table X Self refresh Op - Code Refer to operations in Operative Command Table X X X X X Power down Refer to operations in Operative Command Table Begin clock suspend next cycle Exit clock suspend next cycle Maintain clock suspend 2 3 3 Any state other than listed above 4 Note: 1. H : Hight level, L : low level, X : High or low level (Don't care). 2. CKE Low to High transition will re-enable CLK and other inputs asynchronously. A minimum setup time must be satisfied before any command other than EXIT. 3. Power down and Self refresh can be entered only from the both banks idle state. 4. Must be legal command as defined in Operative Command Table. 5. Illegal if tSREX is not satisfied. Document :1G5-0177 Rev.2 Page 14 VIS 3.Initiallization malfunctioning. VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Before starting normal operation, the following power on sequence is necessary to prevent SDRAM from damged or 1. Apply power and start clock. Attempt to maintain CKE high , DQN high and NOP condition at the inputs. 2. Maintain stable power, table clock , and NOP input conditions for a minimum of 200us. 3. Issue precharge commands for all bank. (PRE or PREA) 4. After all banks become idle state (after tRP), issue 8 or more auto-refresh commands. 5. Issue a mode register set command to initialize the mode regiser. After these sequence, the SDRAM is in idle state and ready for normal operation. 4.Programming the Mode Register The mode register is programmed by the mode register set command using address bits A13 through A0 as data inputs. The register retains data until it is reprogrammed or the device loses power. The mode register has four fields; Options CAS latency Wrap type Burst length : A13 through A7 : A6 through A4 : A3 : A2 through A0 Following mode register programming, no command can be asserted befor at least two clock cycles have elapsed. CAS Latency CAS latency is the most critical parameter being set. It tells the device how many clocks must elapse before the data will be available. The value is determined by the frequency of the clock and the speed grade of the device. The value can be programmed as 2 or 3. Burst Length Burst Length is the number of words that will be output or input in read or write cycle. After a read burst is completed, the output bus will become high impedance. The burst length is programmable as 1, 2, 4, 8 or full page. Wrap Type (Burst Sequence) The wrap type specifies the order in which the burst data will be addressed. The order is programmable as either “Sequential” or “Interleave”. The method chosen will depend on the type of CPU in the system. Document :1G5-0177 Rev.2 Page 15 VIS 5.Mode Register 13 12 11 000 13 12 11 x xx 13 12 00 11 0 6 6 6 10 0 10 x 10 0 9 0 9 1 9 0 8 0 8 0 8 0 7 1 7 0 7 0 5 4 LTMODE 4 LTMODE 5 3 WT 3 WT 5 4 3 VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM 2 2 2 1 1 BL 1 BL 0 JEDEC Standard Test Set 0 Burst Read and Single Write (for Write Through Cache) 0 Burst Read and Burst Write X = Don’t care Bits2 - 0 WT = 0 WT = 1 1 000 1 001 010 Burst length 011 100 101 110 111 Wrap type 0 1 2 4 8 R R R Fullpage 2 4 8 R R R R Sequential Interleave Bits 6-4 000 001 010 Latency mode 011 100 101 110 111 CAS Iatency R R 2 3 R R R R Remark R : Reserved Document :1G5-0177 Rev.2 Page 16 VIS 5.1 Burst Length and Sequence (Burst of Two) Starting Address (column address A0, binary) 0 1 (Burst of Four) Starting Address (column address A1 - A0, binary) 00 01 10 11 (Burst of Eight) Starting Address (column address A2 - A0, binary) 000 001 010 011 100 101 110 111 0, 1 1, 0 VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Sequential Addressing Sequence (decimal) Interleave Addressing Sequence (decimal) 0, 1 1, 0 Sequential Addressing Sequence (decimal) 0, 1, 2, 3 1, 2, 3, 0 2, 3, 0, 1 3, 0, 1, 2 Interleave Addressing Sequence (decimal) 0, 1, 2, 3 1, 0, 3, 2 2, 3, 0, 1 3, 2, 1, 0 Sequential Addressing Sequence (decimal) 0, 1, 2, 3, 4, 5, 6, 7 1, 2, 3, 4, 5, 6, 7, 0 2, 3, 4, 5, 6, 7, 0, 1 3, 4, 5, 6, 7, 0, 1 ,2 4, 5, 6, 7, 0, 1, 2, 3 5, 6 ,7, 0, 1, 2, 3, 4 6, 7 ,0 ,1 ,2 ,3 ,4 ,5 7, 0, 1, 2, 3, 4, 5, 6 Interleave Addressing Sequence (decimal) 0, 1, 2, 3, 4, 5, 6, 7 1, 0, 3, 2, 5, 4, 7, 6 2, 3, 0, 1, 6, 7, 4, 5 3, 2, 1, 0, 7, 6, 5, 4 4, 5, 6, 7, 0, 1, 2, 3 5, 4, 7, 6, 1, 0, 3, 2 6, 7, 4, 5, 2, 3, 0, 1 7, 6, 5, 4, 3, 2, 1, 0 Full page burst is an extension of the above tables of sequential addressing, with the length being 1,024 (for 16Mx4), 512 (for 8M x 8) and 256 (for 4Mx16). Document :1G5-0177 Rev.2 Page 17 VIS 6.Address Bits of Bank-Select and Precharge VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Row A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 A12 A13 (Activate command) A12 0 0 1 1 A13 0 1 0 1 Result Select Bank A “Activate “ command Select Bank B “Activate” command Select Bank C “Activate” command Select Bank D “Activate” command Row A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 A12 A13 (Precharge command) A10 0 0 0 0 1 A12 A13 Result 0 0 1 1 X 0 1 0 1 X Precharge Bank A Precharge Bank B Precharge Bank C Precharge Bank D Precharge All Banks X: Don't care 0 1 Co1. A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11 A12 A13 (CAS strobes) Disables Auto-Precharge (End of Burst) Enables Auto - Precharge (End of Burst) A12 0 0 1 1 A13 0 1 0 1 Result Enables Read/Write commands for Bank A Enables Read/Write commands for Bank B Enables Read/Write commands for Bank C Enables Read/Write commands for Bank D Document :1G5-0177 Rev.2 Page 18 VIS 7.Precharge VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM The precharge command can be asserted anytime after tRAS(min.) is satisfied. Soon after the precharge command is asserted, the precharge operation is performed and the synchronous DRAM enters the idle state after tRP(min.) is satisfied. The parameter tRP is the time required to perform the precharge. The earliest timing in a read cycle that a precharge command can be asserted without losing any data in the burst is as follows. PrechargeE T0 CLK Command Read T1 T2 T3 T4 T5 T6 Burst lengh=4 T7 PRE CAS latency = 2 DQ Q0 Q1 Q2 Q3 Hi - Z Command CAS latency = 3 DQ Read PRE Q0 Q1 Q2 Q3 Hi - Z (tRAS is satisfied) In order to write all data to the memory cell correctly, the asynchronous parameter ”tDPL ” must be satisfied. The tDPL(min.) specification defines the earliest time that a precharge command can be asserted. The minimum number of clocks can be calculated by dividing t DPL(min.) with the clock cycle time. In summary, the precharge command can be asserted relative to the reference clock that indicates the last data word is valid. In the following table, minus means clocks before the reference; plus means time after the reference. CAS latency 2 3 Read -1 -2 Write + tDPL(min.) + tDPL(min.) Document :1G5-0177 Rev.2 Page 19 VIS 8.Auto Precharge begins automatically. VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM During a read or write command cycle, A10 controls whether auto precharge is selected. If A10 is high in the read or write command (Read with Auto precharge command or Write with Auto precharge command), auto precharge is selected and In the write cycle, tDAL(min.) must be satisfied before asserting the next activate command to the bank being precharged. When using auto precharge in the read cycle, knowing when the precharge starts is important because the next activate command to the bank being precharged cannot be executed until the precharge cycle ends. Once auto precharge has started, an activate command to the bank can be asserted after tRP has been satisfied. A Read or Write command without auto - precharge can be terminated in the midst of a burst operation. However, a Read or Write command with auto - precharge can not be interrupted by the same bank commands before the entire burst operation is completed. Therefore use of the same bank Read, Write, Precharge or Burst Stop command is prohibited during a read or write cycle with auto - precharge. It should be noted that the device will not respond to the Auto - Precharge command if the device is programmed for full page burst read or write cycles. The timing when the auto precharge cycle begins depends both on both the CAS Iatency programmed into the mode register and whether the cycle is read or write. 8.1 Read with Auto Precharge During a READA cycle, the auto precharge begins one clock earlier (CL = 2) or two clocks earlier (CL = 3) than the last word output. READ with AUTO PRECHARGE Burst lengh = 4 T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK No New Command to Bank B Command READA B Auto precharge starts CAS latency = 2 DQ QB0 QB1 QB2 QB3 Hi - Z No New Command to Bank B Auto precharge starts Command CAS latency = 3 DQ Remark READA means READ with AUTO PRECHARGE QB0 QB1 QB2 QB3 Hi - Z READA B Document :1G5-0177 Rev.2 Page 20 VIS 8.2 Write with Auto Precharge word input to the device. VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM During a write cycle, the auto precharge starts at the timing that is equal to the value of tDPL(min.) after the last data WRITE with AUTO PRECHRGE Burst lengh = 4 T0 CLK Command WRITA B AUTO PRECHARGE starts T1 T2 T3 T4 T5 T6 T7 T8 CAS latency = 2 DQ DB0 DB1 DB2 tDPL Hi - Z_ DB3 Command CAS latency = 3 DQ AUTO PRECHARGE starts WRITA B tDPL Hi - Z DB0 DB1 DB2 DB3 Remark WRITA means WRITE with AUTO Precharge In summary, the auto precharge cycle begins relative to a reference clock that indicates the last data word is valid. In the table below, minus means clocks before the reference; plus means clocks after the reference. CAS latency 2 3 Read -1 -2 Write + tDPL(min.) + tDPL(min.) Document :1G5-0177 Rev.2 Page 21 VIS 9. Read / Writw Command Interval 9.1 Read to Read Command Interval VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM During a read cycle when a new read command is asserted, it will be effective after the CAS latency, even if the previous read operation has not completed. READ will be interrupted by another READ. Each read command can be asserted in every clock without any restriction. READ to READ Command Interval Burst lengh=4, CAS latency=2 T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK Read A Read B Command DQ QA0 QB0 QB1 QB2 QB3 Hi-Z_ 1 cycle 9.2 Write to Write Command Interval During a write cycle, when a new Write command is asserted, the previous burst will terminated and the new burst will begin with a new write command. WRITE will be interrupted by another WRITE. Each write command can be asserted in every clock without any restriction. WRITE to WRITE Command Interval Burst lengh=4, CAS latency=2 T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK Write A Write B Command DQ QA0 QB0 QB1 QB2 QB3 Hi-Z_ 1 cycle Document :1G5-0177 Rev.2 Page 22 VIS 9.3 Write to Read Command Interval WRITE to READ Command Interval VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM The write command to read command interval is also a minimum of 1 cycle. Only the write data before the read command will be written. The data bus must be Hi-Z at least one cycle prior to the first DOUT. Burst lengh=4 T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK 1 cycle Command CAS latency=2 Hi-Z WRITE A Read B DQ DA0 QB0 QB1 QB2 QB3 Command Write A Read B CAS latency=3 DQ DA0 Hi-Z QB0 QB1 QB2 QB3 9.4 Read to Write Command Interval During a read cycle, READ can be interrupted by WRITE. DQM must be in High at least 3 clocks prior to the write command. There is a restriction to avoid a data conflict. The data bus must be Hi-Z using DQM before Write. Document :1G5-0177 Rev.2 Page 23 VIS READ to WRITE Command Interval T0 T1 T2 VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM T3 T4 T5 T6 T7 CAS latency=2 T8 CLK Command Read Write DQM DQ Hi-Z D0 D1 D2 D3 1 cycle T0 T1 T2 T3 T4 T5 T6 T7 Burst length=8, CAS latency=2 T9 T8 CLK Command Read Write DQM DQ Q0 Q1 Q2 Hi-Z is necessary D0 D1 D2 example: Burst length=4, CAS latency=3 T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK Command Read Write DQM DQ Q2 Hi-Z is necessary D0 D1 D2 Document :1G5-0177 Rev.2 Page 24 VIS 10.BURST Termination 10.1 BURST Stop Command VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM There are two methods to terminate a burst operation other than using a read or a write command. One is the burst stop command and the other is the precharge command. During a read burst, when the burst stop command is issued, the burst read data are terminated and the data bus goes to high-impedance after the CAS latency from the burst stop command. During a write burst, when the burst stop command is issued, the burst write data are termained and data bus goes to Hi-Z at the same clock with the burst stop command. Burst Termination T0 T1 T2 T3 T4 T5 Burst lengh=X, CAS Intency=2,3 T7 T6 CLK BST Command Read CAS latency=2 DQ Q0 Q1 Q2 Hi-Z CAS latency=3 DQ Q0 Q1 Q2 Hi-Z Remark BST: Burst stop command T0 T1 T2 T3 T4 T5 Burst lengh=X, CAS latency=2,3 T7 T6 CLK BST Command Write CAS latency=2,3 Q0 DQ Q0 Q1 Q2 Hi-Z_ Remark BST: Burst command Document :1G5-0177 Rev.2 Page 25 VIS 10.2 PRECHARGE TERMINATION 10.2.1 PRECHARGE TERMINATION in READ Cycle VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM During READ cycle, the burst read operation is terminated by a precharge command. When the precharge command is issued, the burst read operation is terminated and precharge starts. The same bank can be activated again after tRP from the precharge command. When CAS latency is 2, the read data will remain valid until one clock after the precharge command. When CAS latency is 3, the read data will remain valid until two clocks after the precharge command. Precharge Termination in READ Cycle T0 T1 T2 T3 T4 T5 T6 T7 Burst lengh= X T8 CLK Command Read PRE tRP ACT CAS latency=2 DQ Q0 Q1 Q2 Q3 Hi-Z command Read PRE tRP ACT CAS latency=3 DQ Q0 Q1 Q2 Q3 Hi-Z Document :1G5-0177 Rev.2 Page 26 VIS 10.2.2 Precharge Termination in WRITE Cycle VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM During WRITE cycle, the burst write operation is terminated by a precharge command. When the precharge command is issued, the burst write operation is terminated and precharge starts. The same bank can be activated again after tRP from the precharge command. The DQM must be high to mask invalid data in. During WRITE cycle, the write data written prior to the precharge command will be correctly stored. However, invalid data may be written at the same clock as the precharge command. To prevent this from happening, DQM must be high at the same clock as the precharge command. This will mask the invalid data. PRECHARGE TERMINATION in WRITE Cycle T0 CLK Command CAS latency = 2 DQM DQ D0 Write T1 T2 T3 T4 T5 T6 T7 Burst lengh = X T8 PRE ACT D1 D2 D3 D4 tRP Hi - Z command CAS latency = 3 DQM Write PRE ACT DQ D0 D1 D2 D3 D4 Hi - Z tRP Document :1G5-0177 Rev.2 Page 27 VIS VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Timing Diagram Document :1G5-0177 Rev.2 Page 28 VIS Mode Register Set VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM T0 CLK T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 CKE t RSC CS RAS CAS WE BS0,1 A10 Address Key ADD DQM t RP DQ Hi-Z Precharge Command All Banks Mode Register Set Command Command Document :1G5-0177 Rev.2 Page 29 VIS AC Parameters for Write Timing (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CH t CL t CMS t CMH t CK2 Begin Auto Precharge Begin Auto Precharge Bank A Bank B CKE t CKS t CKH CS RAS CAS WE *BS0 A10 t AS tAH ADD DQM tRCD DQ t RRD tRC tDAL tDS t DH t DPL t RP QAa0 QAa1 QAa2 QAa3 QBa0 QBa1 QBa2 QBa3 QAb0 QAb1 QAb2 QAb3 Activate Write with Activate Write with Activate Command Auto Precharge Command Auto Precharge Command Bank A Command Bank A Command Bank B Bank B Bank A Write without Auto Precharge Command Bank A Precharge Command Bank A Activate Command Bank A Activate Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 30 VIS AC Parameters for Write Timing (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 T23 CLK t CL t CH t CK3 t CMS t CMH Begin Auto Precharge Begin Auto Precharge Bank A Bank B t CKH CKE t CKS CS RAS CAS WE *BS0 A10 t AS t AH ADD DQM tRCD DQ t RRD RC t DAL tDS t DH t DPL t RP QAa0 QAa1 QAa2 QAa3 QBa0 QBa1 QBa2 QBa3 QAb0 QAb1 QAb2 QAb3 Activate Command Bank A Write with Activate Write with Auto Precharge Command Auto Precharge Command Bank B Command Bank A Bank B Activate Command Bank A Write without Auto Precharge Command Bank A Precharge Command Bank A Activate Command Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 31 VIS AC Parameters for Read Timing (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=2, CAS Latency=2 T0 CLK tCH tCL T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 tCK2 tCMS t CMH Begin Auto Precharge Bank B t CKH CKE tCKS CS RAS CAS WE *BS0 A10 tAS tAH ADD tRRD tRAS tRC DQM t AC2 tLZ tAC2 tOH QAa0 t RCD tHZ tOH QAa1 QBa0 tRP tHZ QBa1 DQ Hi-Z Activate Command Bank A Read Command Bank A Activate Command Bank B Read with Auto Precharge Command Bank B Precharge Command Bank A Activate Command Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 32 VIS AC Parameters for Read Timing (2 of 2) T0 CLK t CH tCL t CK3 t CMS t CMH VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=2, CAS Latency=3 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 CKE tCKS Begin Auto Precharge Bank B t CKH CS RAS CAS WE *BS0 A10 t AH t AS ADD t RRD t RAS t RC t RP DQM t RCD tAC3 tLZ tAC3 tOH tHZ tOH QAa1 QBa0 t HZ DQ Hi-Z QAa0 QBa1 Activate Command Bank A Read Command Bank A Activate Command Bank B Read with Auto Precharge Command Bank B Precharge Command Bank A Activate Command Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 33 VIS Power on Sequence and Auto Refresh (CBR) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK CKE High level is required t RSC Minimum of 8 Refresh Cycles are required CS RAS CAS WE BS0, 1 A10 Address Key ADD DQM High Level is Necessary t RP t RC DQ Hi-Z Precharge Inputs Command All Banks must be stable for 200us 1st Auto Refresh Command 2nd Auto Refresh Command Mode Register Set Command Command Document :1G5-0177 Rev.2 Page 34 VIS VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Clock Suspension During Burst Read (Using CKE) (1 of 2) Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0 A10 RAa ADD RAa CAa DQM t HZ DQ Hi-Z QAa0 QAa1 QAa2 QAa3 Activate Command Bank A Read Command Bank A Clock Suspended 1 Cycle Clock Suspended 2 Cycles Clock Suspended 3 Cycles * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 35 VIS VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Clock Suspension During Burst Read (Using CKE) (2 of 2) Burst Length=4, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK3 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0 A10 RAa ADD RAa CAa DQM t HZ DQ Hi-Z QAa0 QAa1 QAa2 QAa3 Activate Command Bank A Read Command Bank A Clock Suspended 1 Cycles Clock Suspended 2 Cycles Clock Suspended 3 Cycles * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 36 VIS VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Clock Suspension During Burst Write (Using CKE) (1 of 2) Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0 A10 RAa ADD RAa CAa DQM DQ Hi-Z DAa0 DAa1 DAa2 DAa3 Activate Command Bank A Clock Suspended 1 Cycle Write Command Bank A Clock Suspended 2 Cycles Clock Suspended 3 Cycles * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 37 VIS VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Clock Suspension During Burst Write (Using CKE) (2 of 2) Burst Length=4, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 CLK t CK3 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0 A10 RAa ADD RAa CAa DQM DQ Hi-Z DAa0 DAa1 DAa2 DAa3 Activate Command Bank A Clock Suspended 1 Cycle Write Command Bank A Clock Suspended 2 Cycles Clock Suspended 3 Cycles * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 38 VIS Power Down Mode and Clock Mask VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 t t CKS CKH t CKS CKE VALID CS RAS CAS WE *BS0 A10 RAa ADD RAa CAa DQM DQ Hi-Z QAa0 QAa1 QAa2 QAa3 Activate Command Bank A ACTIVE STANDBY Read Command Bank A Clock Mask Start Clock Mask End Precharge Command Power Down Mode Entry Precharge Standby Power Down Mode Entry Power Down Mode Exit Power Down Mode Exit Command * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 39 VIS Auto Refresh (CBR) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0, 1 A10 RAa ADD RAa CAa DQM t RP t RC t RC Q0 Q1 Q2 Q3 DQ Hi-Z Precharge CBR Refresh Command Command All Banks CBR Refresh Command Activate Read Command Command * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 40 VIS Self Refresh (Entry and Exit) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM CLK can be Stopped** T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t SRX t SRX t CKS t CKS CKE CS RAS CAS WE *BS0 A10 ADD t RC t RC DQM DQ Hi-Z All Banks must be idle Self refresh Entry Self Refresh Exit Self Refresh Entry Self Refresh Exit Activate Command * BS1=”L”, Bank C,D = Idle * Clock can be stopped at CKE=Low. If clock is stopped, it must be restarted/stable for 4 clock cycles before CKE=High Document :1G5-0177 Rev.2 Page 41 VIS VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Random Column Read (Page With Same Bank) (1 of 2) Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0 A10 RAa RAa RAd ADD RAa CAa CAb CAc RAd CAd DQM DQ Hi-Z QAa0 QAa1 QAa2 QAa3 QAb0 QAb1 QAc0 QAc1 QAc2 QAc3 QAd0 QAd1 QAd2 QAd3 Precharge Command Bank A Read Command Bank A Read Read Command Command Bank A Bank A Precharge Activate Read Command Command Command Bank A Bank A Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 42 VIS VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Random Column Read (Page With Same Bank) (2 of 2) Burst Length=4, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK3 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0 A10 RAa RAd ADD RAa CAa CAb CAc RAd CAd DQM DQ Hi-Z QAa0 QAa1 QAa2 QAa3 QAb0 QAb1 QAc0 QAc1 QAc2 QAc3 Activate Command Bank A Read Command Bank A Read Read Command Command Bank A Bank A Precharge Command Bank A Activate Command Bank A Read Command Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 43 VIS VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Random Column Write (Page With Same Bank) (1 of 2) Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0 A10 Ra Rd ADD Ra Ca Cb Cc Rd Cd DQM DQ Hi-Z Da0 Da1 Da2 Da3 Db0 Db1 Dc0 Dc1 Dc2 Dc3 Dd0 Dd1 Dd2 Dd3 Activate Command Bank B Write Command Bank B Write Write Command Command Bank B Bank B Precharge Activate Write Command Command Command Bank B Bank B Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 44 VIS VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Random Column Write (Page With Same Bank) (1 of 2) Burst Length=4, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0 A10 Ra Rd ADD Ra Ca Cb Cc Rd Cd DQM DQ Hi-Z Da0 Da1 Da2 Da3 Db0 Db1 Dc0 Dc1 Dc2 Dc3 Dd0 Dd1 Activate Command Bank B Write Command Bank B Write Command Bank B Write Command Bank B Precharge Command Bank B Activate Command Bank B Write Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 45 VIS Random Row Read (Interleaving Banks) (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=8, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE High CS RAS CAS WE *BS0 A10 ADD t t AC2 t RP DQM RCD DQ Hi-Z QBa0 QBa1 QBa2 QBa3 QBa4 QBa5 QBa6 QBa7 QAa0 QAa1 QAa2 QAa3 QAa4 QAa5 QAa6 QAa7 QBb0 QBb1 Activate Command Bank B Read Command Bank B Activate Command Bank A Precharge Active Command Command Bank B Bank B Read Command Bank A Read Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 46 VIS Random Row Read (Interleaving Banks) (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burs tLength=8, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK3 CKE High CS RAS CAS WE *BS0 A10 ADD t t RCD AC3 t RP DQM DQ Hi-Z QBa0 QBa1 QBa2 QBa3 QBa4 QBa5 QBa6 QBa7 QAa0 QAa1 QAa2 QAa3 QAa4 QAa5 QAa6 QAa7 QBb0 Activate Command Bank B Read Command Bank B Activate Command Bank A Read Command Bank A Precharge Command Bank B Activate Command Bank B Read Precharge Command Command Bank B Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 47 VIS Random Row Write (Interleaving Banks) (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=8, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK2 CKE High CS RAS CAS WE *BS0 A10 ADD DQM t RCD t DPL t RP DQ Hi-Z QAa0 QAa1 QAa2 QAa3 QAa4 QAa5 QAa6 QAa7 QBa0 QBa1 QBa2 QBa3 QBa4 QBa5 QBa6 QBa7 QAb0 QAb1 QAb2 QAb3 QAb4 Activate Command Bank A Write Command Bank A Activate Command Bank B Precharge Active Command Command Bank A Bank A Write Command Bank B Write Command Bank A Precharge Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 48 VIS Random Row Write (Interleaving Banks) (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=8, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE High CS RAS CAS WE *BS0 A10 ADD RBa DQM t DPL t RP t DPL DQ Hi-Z QAa0 QAa1 QAa2 QAa3 QAa4 QAa5 QAa6 QAa7 QBa0 QBa1 QBa2 QBa3 QBa4 QBa5 QBa6 QBb7 QAb0 QAb1 QAb2 QAb3 Activate Command Bank A Write Command Bank A Activate Command Bank B Write Command Bank B Precharge Command Bank A Activate Command Bank A Precharge Write Command Command Bank B Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 49 VIS Read and Write Cycle (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0 A10 RAa ADD RAa C Aa C Ab CAc DQM Hi-Z DQ QAa0 QAa1 QAa2 QAa3 DAb0 DAb1 DAb3 QAc0 QAc1 QAc3 Activate Command Bank A Write Command Bank A The Write Data Write Command is Masked with a Bank A Zero Clock latency Read Command Bank A The Read Data is Masked with Two Clocks Latency * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 50 VIS Read and Write Cycle (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK3 CKE CS RAS CAS WE *BS0 A10 RAa ADD RAa C Aa CAb CAc DQM Hi-Z QAa0 QAa1 QAa2 QAa3 DQ DAb0 DAb1 DAb3 QAc0 QAc1 QAc3 Activate Command Bank A Read Command Bank A Write The Write Data Read Command is Masked with a Command Bank A Bank A Zero Clock Latency The Read Data is Masked with Two Clock Latency * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 51 VIS Interleaved Column Read Cycle (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK2 CKE CS RAS CAS WE *BS0 A10 Ra Ra ADD Ra Cb Ra Ca Cb Cc Cb Cd DQM t RCD t AC2 DQ Hi-Z QAa0 QAa1 QAa2 QAa3 QBa0 QBa1 QBb0 QBb1 QBc0 QBc1 QAb0 QAb1 QBd0 QBd1 QBd2 QBd3 Activate Command Bank A Read Read Read Activate Read Read Read Command Command Command Command Command Command Command Bank A Bank A Bank B Bank B Bank B Bank B Bank B Precharge Command Bank A Precharge Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 52 VIS Interleaved Column Read Cycle (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK3 CKE CS RAS CAS WE *BS0 A10 Ra Ra ADD Ra Ca Ra Ca Cb Cc Cb DQM t RCD t RRD t AC3 DQ Hi-Z QAa0 QAa1 QAa2 QAa3 QBa0 QBa1 QBb0 QBb1 QBc0 QBc1 QAb0 QAb1 QAb2 QAb3 Activate Command Bank A Read Command Bank A Activate Command Bank B Read Read Read Read Precharge Precharge Command Command Command Command Command Command Bank A Bank B Bank B Bank B Bank B Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 53 VIS Interleaved Column Write Cycle (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK2 CKE CS RAS CAS WE *BS0 A10 Ra Ra ADD Ra Ca Ra Ca Cb Cc Cb Cb DQM t RCD t RP t DPL t Hi-Z RRD DQ DAa0 DAa1 DAa2 DAa3 DBa0 DBa1 DBb0 DBb1 DBc0 DBc1 DAb0 DAb1 DBd0 DBd1 DBd2 DBd3 Activate Write Write Write Write Write Activate Command Command Command Command Command Command Command Bank B Bank B Bank A Bank A Bank B Bank B Bank A Precharge Command Bank A Write Command Bank B Precharge Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 54 VIS Interleaved Column Write Cycle (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK3 CKE CS RAS CAS WE *BS0 A10 Ra Ra ADD Ra Ca Ra Ca Cb Cc Cb Cd DQM t RCD t DPL t DPL t Hi-Z RRD t RP DQ QAa0 QAa1 QAa2 QAa3 QBa0 QBa1 QBb0 QBb1 QBc0 QBc1 QAb0 QAb1 QBd0 QBd1 QBd2 QBd3 Activate Command Bank A Write Command Bank A Activate Command Bank B Write Write Write Write Write Command Command Command Command Command Bank A Bank B Bank B Bank B Bank B Precharge Command Bank A Precharge Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 55 VIS Auto Precharge after Read Burst (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK2 Start Auto Precharge Bank B Start Auto Precharge Bank A Start Auto Precharge Bank B CKE High CS RAS CAS WE *BS0 A10 Ra Ra Rb Rc ADD Ra Ca Ra Ca Cb Rb Cb Rc Cc DQM DQ Hi-Z QAa0 QAa1 QAa2 QAa3 QBa0 QBa1 QBa2 QBa3 QAb0 QAb1 QAb2 QAb3 QBb0 QBb1 QBb2 QBb3 QAc0 QAc1 QAc2 Activate Read Activate Read with Command Command Command Auto Precharge Bank A Bank A Bank B Command Bank B Read with Auto Precharge Command Bank A Activate Command Read with Bank A Auto Precharge Command Read with Activate Bank B Auto Precharge Command Command Bank B Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 56 VIS Auto Precharge after Read Burst (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK3 Start Auto Precharge Bank B Start Auto Precharge Bank A Start Auto Precharge Bank B CKE High CS RAS CAS WE *BS0 A10 Ra Ra Rb ADD Ra Ca Ra Ca Cb Rb RBb Cb DQM DQ Hi-Z QAa0 QAa1 QAa2 QAa3 QBa0 QBa1 QBa2 QBa3 QAb0 QAb1 QAb2 QAb3 QBb0 QBb1 QBb2 Activate Command Bank A Activate Command Bank B Read Command Bank A Read with Auto Precharge Command Bank B Read with Auto Precharge Command Bank A Activate Command Bank B Write with Auto precharge Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 57 VIS Auto Precharge after Write Burst (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK2 Start Auto Precharge Bank B Start Auto Precharge Bank A Start Auto Precharge Bank B CKE High CS RAS CAS WE *BS0 A10 Ra Ra Rb Rc ADD Ra Ca Ra Ca Cb Rb Cb Rc Cc DQM DQ Hi-Z QAa0 QAa1 QAa2 QAa3 QBa0 QBa1 QBa2 QBa3 QAb0 QAb1 QAb2 QAb3 QBb0 QBb1 QBb2 QBb3 QAc0 QAc1 QAc2 QAc3 Activate Write Write with Activate Command Command Command Auto Precharge Command Bank A Bank B Bank A Bank B Activate Write with Activate Command Auto Precharge Command Bank A Command Bank B Write with Bank A Auto Precharge Write with Bank A Auto Precharge Command Bank B Start Auto Precharge Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 58 VIS Auto Precharge after Write Burst (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK3 Start Auto Precharge Bank B Start Auto Precharge Bank A Start Auto Precharge Bank B CKE High CS RAS CAS WE *BS0 A10 Ra Ra Rb ADD Ra Ca Ra Ca Cb Rb RBb Cb DQM DQ Hi-Z QAa0 QAa1 QAa2 QAa3 QBa0 QBa1 QBa2 QBa3 QAb0 QAb1 QAb2 QAb3 QBb0 QBb1 QBb2 QBb3 Activate Command Bank A Activate Command Bank B Write Command Bank A Write with Auto Precharge Command Bank B Write with Auto Precharge Command Bank A Activate Command Bank B Write with Auto precharge Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 59 VIS Full Page Read Cycle (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=Full Page, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE High CS RAS CAS WE *BS0 A10 Ra Ra Rb ADD Ra Ca Ra Ca Rb DQM t RP DQ Hi-Z QAa Q Aa+1 QAa+2 QAa-2 QAa-1 QAa QAa+1 QBa QBa+1 QBa+2 QBa+3 QBa+4 QBa+51QBa+6 Activate Command Bank A Read Command Bank A Activate Command Bank B Read Command Bank B The burst counter wraps from the highest order page address back to zero during this time interval Full page burst operation does not terminate when the burst length is satisfied; the burst counter increments and continues bursting beginning with the starting address Precharge Command Bank B Burst Stop Command Activate Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 60 VIS Full Page Read Cycle (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=Full Page, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK3 CKE High CS RAS CAS WE *BS0 A10 Ra Ra Rb ADD Ra Ca Ra Ca Rb DQM DQ Hi-Z QAa QAa+1 QAa+2 QAa-2 QAa-1 QAa QAa+1 QBa0 QBa+1 QBa+2 QBa+3 QBa+4 QBa+5 Activate Command Bank A Read Command Bank A Activate Command Bank B Read Command Bank B The burst counter wraps from the highest order page address back to zero during this time interval Full page burst operation does not teminate when the burst length is satisfied; the burst counter increments and continues bursting beginning with the starting address Precharge Command Bank B Burst Stop Command Activate Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 61 VIS Full Page Write Cycle (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=Full Page, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE High CS RAS CAS WE *BS0 A10 Ra Ra Rb ADD Ra Ca Ra Ca Rb DQM t BDL DQ Hi-Z QAa QAa+1 Q Aa+2 QAa+3 QAa-1 QAa QAa+1 QBa QBa+1 QBa+2 QBa+3 QBa+4 QBa+5 QBa+6 Activate Command Bank A Write Command Bank A Activate Command Bank B The burst counter wraps from the highest order page address back to zero during this time interval Write Command Bank B Data is ignored Precharge Command Bank B Full page burst operation does not terminate when the burst length is satisfied; the burst counter increments and continues bursting beginning with the starting address Burst Stop Command Activate Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 62 VIS Full Page Write Cycle (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=Full Page, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK3 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE High CS RAS CAS WE *BS0 A10 Ra Ra Rb ADD Ra Ca Ra Ca Rb DQM tBDL Data is ignored. DQ Hi-Z DAa D Aa+1 DAa+2 DAa+3 DAa-1 DAa DAa+1 DBa DBa+1 DBa+2 DBa+3 DBa+4 DBa+5 Activate Command Bank A Write Command Bank A Activate Command Bank B The burst counter wraps from the highest order page address back to zero during this time interval Write Command Bank B Full page burst operation does not terminate when the burst length is satisfied; the burst counter increments and continues bursting beginning with the starting address Precharge Command Bank B Burst Stop Command Activate Command Bank B * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 63 VIS Burst Read and Single Write Operation VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=4, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK t CK2 High CKE CS RAS CAS WE *BS0 A10 RAa ADD R Aa CAa C Ab CAc CAd CAe DQM Hi-Z DQ Activate Command Bank A Read Command Bank A Read Single Write Single Write Command Command Command Bank A Bank A Bank A DQs are masked Single Write Command Bank A DQs are masked * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 64 VIS Full Page Random Column Read VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=Full Page, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE BS A10 Ra Ra Rb ADD Ra Ra Ca Ca Cb Cb Cc Cc Rb t RP DQM DQ Hi-Z QAa0 QBa0 QAb0 QAb1 QBb0 QBb1 QAc0 QAc1 QAc2 QBc0 QBc1 QBc2 Activate Command Bank A Activate Command Bank B Read Command Bank B Read Command Bank A Read Command Bank B Read Command Bank A Read Command Bank B Precharge Command Bank B (Bank D) (Precharge Termination) Activate Command Bank B Read Command Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 65 VIS Full Page Random Column Write VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=Full Page, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE CS RAS CAS WE *BS0 A10 Ra Ra Rb ADD Ra Ra Ca Ca Cb Cb Cc Cc Rb t RP DQM DQ Hi-Z QAa0 QBa0 QAb0 QAb1 QBb0 QBb1 QAc0 QAc1 QAc2 QBc0 QBc1 QBc2 Activate Command Bank A Activate Command Bank B Write Command Bank B Write Command Bank A Write Command Bank B Write Command Bank A Write Command Bank B Precharge Command Bank B (Bank D) (Precharge Termination) Write Data is masked Activate Command Bank B Write Command Bank A * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 66 VIS Precharge Termination of a Burst (1 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=8, CAS Latency=2 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK2 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE High CS RAS CAS WE *BS0 A10 RAa RAb RAc ADD RAa CAa RAb CAb RAc CAc t DPL t RP t RP t RP DQM DQ Hi-Z QAa0 QAa1 QAa2 Da3 QAb0 QAb1 QAb2 QAc0 QAc1 QAc2 Activate Command Bank A Write Command Bank A Precharge Command Bank A Activate Command Bank A Read Command Bank A Precharge Command Bank A Activate Command Bank A Read Command Bank A Precharge Command Bank A Precharge Termination of a Write Burst. Write data is masked. Precharge Termination of a Read Burst. * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 67 VIS Precharge Termination of a Burst (2 of 2) VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Burst Length=8, CAS Latency=3 T0 T1 T2 T3 T4 T5 T6 T7 CLK t CK3 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CKE High CS RAS CAS WE *BS0 A10 RAa RAb RAc ADD RAa CAa RAb CAb RAc t DPL t RP t RAS t RP DQM t RCD DQ Hi-Z DAa0 DAa1 QAb0 QAb1 QAb2 QAb3 Activate Command Bank A Write Command Bank A Precharge Command Bank A Activate Command Bank A Read Command Bank A Activate Command Bank A Activate Command Bank A Write Data is masked Precharge Termination of a Write Burst. Precharge Termination of a Read Burst. * BS1=”L”, Bank C,D = Idle Document :1G5-0177 Rev.2 Page 68 VIS Ordering information Part Number VG366440(80/16)41DT(L)-6 VG366440(80/16)41DT(L)-7 VG366440(80/16)41DT(L)-7L VG366440(80/16)41DT(L)-8H VG36644041DT / VG36648041DT / VG36641641DT CMOS Synchronous Dynamic RAM Cycle time 6 ns (166MHz 3/3/3) 7 ns (143MHz 3/3/3) 7.5 ns (133MHz 3/3/3) 10 ns (100MHz 2/2/2) Package 400mil, 54-Pin Plastic TSOP VG36648041DT(L)-7L • VG : VIS Memory Product • 36 : Technology/Design Rule • 64 : 64Mb • 80 : Device Configuration, 40:x4, 80: x8, 16: x16 •4 •1 •D •T •L : Device Infernal Banks : Interface Type, 1: LVTTL : Mask/Design Version : Package Type, T: TSOP : None: normal version; L:low power version • 7L : Cycle time; -6 grade is available only on 4M X16 option Packaging Information • 400mil, 54-Pin Plastic TSOP DIM A A1 A2 b b1 c c1 D ZD e E E1 L R R1 MILLIMETERS MIN. --0.05 0.95 0.30 0.30 0.12 0.12 22.09 NOM. ----1.00 --------22.22 0.71 REF. 0.80 BASIC 11.56 10.03 0.40 0.12 0.12 11.76 10.16 0.50 ----11.96 10.29 0.60 0.25 --0.455 0.395 0.016 0.005 0.005 MAX. 1.20 0.15 1.05 0.45 0.40 0.21 0.16 22.35 MIN. --0.002 0.037 0.012 0.012 0.005 0.005 0.870 INCHES NOM. ----0.039 --------0.875 0.028 REF. 0.0315 BASIC 0.463 0.400 0.020 ----0.471 0.405 0.024 0.010 --MAX. 0.047 0.006 0.041 0.018 0.016 0.008 0.006 0.880 b b1 E1 A1 L RAD R1 54 28 A2 RAD R B B c 0¢X~8¢X DETAIL A SECTION B-B c 1 D 27 c1 BASE METAL WITH PLATING NOTE: 1. CONTROLLING DIMENSION : MILLIMETERS 2. DIMENSION D DOES NOT INCLUDE MOLD PROTRUSION. MOLD PROTRUSION SHALL NOT EXCEED 0.15mm(0.006") PER SIDE. DIMENSION E1 DOES NOT INCLUDE INTERLEAD PROTRUSION. INTERLEAD PROTRUSION SHALL NOT EXCEED 0.25mm(0.01") PER SIDE. 3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSIONS/INTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL NOT CAUSE THE LEAD TO BE WIDER THAN THE MAX b DIMENSION BY MORE THAN 0.13mm. DAMBAR INTRUSION SHALL NOT CAUSE THE LEAD TO BE NARROWER THAN THE MIN b DIMENSION BY MORE THAN 0.07mm. b ZD A DETAIL A e SEATING PLANE 0.100(0.004") E Document :1G5-0177 Rev.2 Page 69
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