W29GL256SL9BTR

W29GL256S 256M-BIT 3.0-VOLT PARALLEL FLASH MEMORY WITH PAGE MODE Publication Release Date: Jul 02, 2014 Revision C 1 W29GL256S TABLE OF CONTENTS 1 General Description ....................................................................................................................... 8 2 FEATURES ................................................................................................................................... 8 3 PIN CONFIGURATION ................................................................................................................. 9 4 BLOCK DIAGRAM....................................................................................................................... 10 5 PIN DESCRIPTION ..................................................................................................................... 11 6 Introduction .................................................................................................................................. 12 7 ARRAY ARCHITECTURE ........................................................................................................... 15 7.1 Flash Main Memory Array ....................................................................................................... 17 7.2 CFI and Device ID (CFI-ID) ..................................................................................................... 17 7.3 Status Register ........................................................................................................................ 18 7.4 Data Polling Status .................................................................................................................. 19 7.5 Sector Protection Control ........................................................................................................ 19 8 7.5.1 Lock Register.................................................................................................................. 19 7.5.2 Individual Protection Bits (IPB) ....................................................................................... 19 7.5.3 IPB Lock ......................................................................................................................... 20 7.5.4 Dynamic Protection Bits (DPB) ...................................................................................... 20 Functional Descriptions ............................................................................................................... 20 8.1 Read ........................................................................................................................................ 20 8.1.1 Random Read ................................................................................................................ 20 8.1.2 Page Read...................................................................................................................... 21 8.2 Device Reset Operations......................................................................................................... 21 8.3 Standby Mode ......................................................................................................................... 22 8.4 Automatic Sleep ...................................................................................................................... 22 8.5 Output Disable Mode ............................................................................................................... 22 8.6 Program Methods .................................................................................................................... 23 8.6.1 Asynchronous Write ....................................................................................................... 23 8.6.2 Word Programming ........................................................................................................ 23 8.6.3 Write Buffer Programming .............................................................................................. 25 8.7 Program Suspend / Program Resume Commands ................................................................. 30 8.8 Erase Methods ........................................................................................................................ 31 8.9 8.8.1 Chip Erase ...................................................................................................................... 31 8.8.2 Sector Erase ................................................................................................................... 32 Erase Suspend / Erase Resume ............................................................................................. 33 8.10 Blank Check............................................................................................................................. 34 Publication Release Date: Jul 02, 2014 Revision C 2 W29GL256S 8.11 Enhanced Sector Protection Methods ..................................................................................... 35 8.11.1 Enhanced Sector Protection (ESP) ................................................................................ 35 8.11.2 IPB Lock ......................................................................................................................... 37 8.11.3 Individual Protection Bits (IPB) ....................................................................................... 37 8.11.4 Dynamic Protection Bits (DPB) ...................................................................................... 37 8.11.5 Sector Protection Bit Status Summary ........................................................................... 38 8.11.6 Lock Register.................................................................................................................. 38 8.12 Security Sector Region ............................................................................................................ 39 8.13 Monitoring Device Status......................................................................................................... 40 8.13.1 Status Register ............................................................................................................... 40 8.13.2 Data Polling Status ......................................................................................................... 41 8.14 Enhanced Variable I/O ............................................................................................................ 47 8.15 Ready/#Busy ........................................................................................................................... 47 8.16 Hardware Data Protection Options .......................................................................................... 48 8.16.1 Write Protect (#WP)........................................................................................................ 48 8.16.2 Write Pulse “Glitch” Protection ....................................................................................... 48 8.16.3 Power Up Write Inhibit .................................................................................................... 48 8.16.4 Logical Inhibit.................................................................................................................. 48 8.17 Inherent Data Protection.......................................................................................................... 49 8.17.1 Command Protection ...................................................................................................... 49 8.18 Operating Modes and Signal States Table.............................................................................. 50 8.19 Instruction Definition Tables .................................................................................................... 51 8.20 Common Flash Interface and Device ID (CFI-ID) ................................................................... 57 9 Electrical Specifications ............................................................................................................... 62 9.1 Absolute Maximum Ratings ..................................................................................................... 62 9.1.1 9.2 Input Signal Overshoot ................................................................................................... 62 Operating Ranges ................................................................................................................... 63 9.2.1 Temperature Ranges...................................................................................................... 63 9.2.2 Power Supply Voltages .................................................................................................. 63 9.2.3 Power Up and Power-Down ........................................................................................... 63 9.3 DC Characteristics ................................................................................................................... 65 9.4 Capacitance Characteristics .................................................................................................... 67 10 Timing Specifications................................................................................................................... 68 10.1 AC Test Conditions .................................................................................................................. 68 10.2 Power Up Reset and Hardware Reset .................................................................................... 69 Publication Release Date: Jul 02, 2014 Revision C 3 W29GL256S 10.2.1 Power Up Reset ............................................................................................................. 69 10.2.2 Hardware Reset.............................................................................................................. 71 10.3 AC Characteristics ................................................................................................................... 72 10.3.1 Internal Algorithm Performance Table............................................................................ 72 10.3.2 Asynchronous Read Operations .................................................................................... 73 10.3.3 Asynchronous Write Operations..................................................................................... 75 10.3.4 Alternate #CE Controlled Write Operations ................................................................... 81 11 Package Dimensions ................................................................................................................... 83 11.1 TSOP 56-pin 14x20mm ........................................................................................................... 83 11.2 Thin & Fine-Pitch Ball Grid Array, 56 ball, 7x9mm (TFBGA56) .............................................. 84 11.3 Low-Profile Fine-Pitch Ball Grid Array, 64-ball 11x13mm (LFBA64)....................................... 85 12 Ordering Information.................................................................................................................... 86 12.1 Ordering Part Number Definitions ........................................................................................... 86 12.2 Valid Part Numbers and Top Side Marking ............................................................................. 87 13 History ......................................................................................................................................... 88 Publication Release Date: Jul 02, 2014 Revision C 4 W29GL256S TABLE OF TABLES Table 5-1 Pin Description ..................................................................................................................... 11 Table 6-1 W29GL256S Address Map................................................................................................... 14 Table 7-1 W29GL256S Sector and Memory Address Map .................................................................. 17 Table 7-2 CFI-ID Address Map Overview ............................................................................................ 18 Table 8-1 Write Buffer Programming Command Sequence ................................................................. 30 Table 8-2 Sector Protection Status....................................................................................................... 38 Table 8-3 Lock Register ....................................................................................................................... 38 Table 8-4 Security Sector Region......................................................................................................... 39 Table 8-5 Status Register ..................................................................................................................... 40 Table 8-6 Data Polling Status ............................................................................................................... 47 Table 8-7 Interface Conditions ............................................................................................................. 50 Table 8-8 Read, Write, Program and Erase Definitions ....................................................................... 51 Table 8-9 CFI-ID (Autoselect) Definitions ............................................................................................. 52 Table 8-10 Security Sector Region Command Definitions ................................................................... 52 Table 8-11 Lock Register Command Set Definitions ........................................................................... 53 Table 8-12 IPB Non-Volatile Sector Protection Command Set Definitions .......................................... 53 Table 8-13 Global Non-Volatile Sector Protection Freeze Command Set Definitions ......................... 54 Table 8-14 DPB Volatile Sector Protection Command Set Definitions ................................................ 54 Table 8-15 ID (Autoselect) Address Map ............................................................................................ 57 Table 8-16 CFI Query Identification String ........................................................................................... 59 Table 8-17 CFI System Interface String ............................................................................................... 59 Table 8-18 CFI Device Geometry Definition ......................................................................................... 60 Table 8-19 CFI Primary Vendor-Specific Extended Query .................................................................. 61 Table 9-1 Absolute Maximum Ratings ................................................................................................. 62 Table 9-2 Power Up/Power-Down Voltage and Timing ........................................................................ 63 Table 9-3 DC Characteristics ............................................................................................................... 65 Table 9-4 Connector Capacitance for FBGA (LFBGA64) Package ..................................................... 67 Table 9-5 Connector Capacitance for TSOP (TSOP56) Package ....................................................... 67 Table 9-6 Connector Capacitance for TFBGA (TFBGA56) Package ................................................... 67 Table 10-1 Test Specification ............................................................................................................... 68 Table 10-2 Power ON and Reset Parameters...................................................................................... 69 Table 10-3 Internal Algorithm Characteristics ...................................................................................... 72 Table 10-4 Read Operation EVIO = 1.65V to VCC, VCC = 2.7V to 3.6V ............................................ 73 Table 10-5 Write Operations ................................................................................................................ 75 Publication Release Date: Jul 02, 2014 Revision C 5 W29GL256S Table 10-6 Erase/Program Operations ................................................................................................ 78 Table 10-7 Alternate #CE Controlled Write Operations ....................................................................... 81 Table 12-1 Valid Part Numbers and Markings ..................................................................................... 87 Table 13-1 Revision History ................................................................................................................. 88 TABLE OF FIGURES Figure 3-1 LFBGA64 TOP VIEW (Face Down) ...................................................................................... 9 Figure 3-2 56-PIN STANDARD TSOP (Top View) ................................................................................. 9 Figure 3-3 TFBGA56 TOP VIEW (Face Down) ...................................................................................... 9 Figure 4-1 Simplified Block Diagram .................................................................................................... 10 Figure 8-1 Word Program Operation .................................................................................................... 25 Figure 8-2 Write Buffer Programming Operation with Data Polling Status .......................................... 28 Figure 8-3 Write Buffer Programming Operation with Status Register ................................................ 29 Figure 8-4 Sector Erase operation ....................................................................................................... 33 Figure 8-5 Enhanced Sector Protection IPB Program Algorithm ......................................................... 36 Figure 8-6 Data# Polling Algorithm....................................................................................................... 42 Figure 8-7 Toggle Bit Program ............................................................................................................. 46 Figure 9-1 Max Negative Overshoot Waveform ................................................................................... 62 Figure 9-2 Positive Overshoot Waveform ............................................................................................ 62 Figure 9-3 Power-up ............................................................................................................................. 64 Figure 9-4 Power-down and Voltage Drop ........................................................................................... 64 Figure 10-1 Device Under Test Setup .................................................................................................. 68 Figure 10-2 Input Switching Test Waveforms ...................................................................................... 68 Figure 10-3 Power Up Reset ................................................................................................................ 70 Figure 10-4 Hardware Reset ................................................................................................................ 71 Figure 10-5 Back to Back Read (tACC) Operation............................................................................... 73 Figure 10-6 Back to Back Read Operation (tRC) ................................................................................. 74 Figure 10-7 Page Read ........................................................................................................................ 74 Figure 10-8 Back to Back Write Operation ........................................................................................... 75 Figure 10-9 Back to Back (#CE VIL) Write Operation .......................................................................... 76 Figure 10-10 Write to Read (tACC) Operation ..................................................................................... 76 Figure 10-11 Write to Read (tCE) Operation ........................................................................................ 77 Figure 10-12 Read to Write (#CE VIL) Operation ................................................................................ 77 Figure 10-13 Read to Write (#CE Toggle) Operation ........................................................................... 78 Publication Release Date: Jul 02, 2014 Revision C 6 W29GL256S Figure 10-14 Program Operation.......................................................................................................... 79 Figure 10-15 Chip/Sector Erase Operation .......................................................................................... 79 Figure 10-16 Data# Polling (During Internal Algorithms) ..................................................................... 80 Figure 10-17 Toggle Bit (During Internal Algorithms) ........................................................................... 80 Figure 10-18 DQ2 vs. DQ6 Comparison Timing .................................................................................. 81 Figure 10-19 Back to Back (#CE) Write Operation .............................................................................. 82 Figure 10-20 (#CE) Write to Read Operation ....................................................................................... 82 Figure 11-1 TSOP 56-pin 14x20mm Package ..................................................................................... 83 Figure 11-2 TFBGA-56, 7x9mm package ............................................................................................ 84 Figure 11-3 LFBGA 64-ball 11x13mm Package................................................................................... 85 Figure 12-1 Ordering Part Numbering .................................................................................................. 86 Publication Release Date: Jul 02, 2014 Revision C 7 W29GL256S 1 GENERAL DESCRIPTION The W29GL256S Parallel Flash memory provides a storage solution for embedded system applications that require better performance, lower power consumption and higher density. This product fabricated on 58 nm process technology. This device offers a fast page access time as fast as 15ns with a corresponding random access time as fast as 90ns. It features a Write Buffer that allows a maximum of 256 words (512 bytes) to be programmed in one operation, resulting in faster effective programming time than standard programming algorithms. The W29GL256S also offers special features such as Compatible Manufacturer ID that makes the device industry standard compatible without the need to change firmware. 2 FEATURES  58 nm Technology  x16 data bus  256-WORD (512-byte) Programming Buffer o Programming in Page multiples, up to a maximum of 512 bytes  Asynchronous 32-byte Page Read  Single word and multiple program on same word options  Sector Erase o Uniform 128-kbyte sectors  Enhanced Sector Protection (ESP)  Volatile and non-volatile protection methods for each sector  Security Sector Region  1024-byte One Time Program (OTP) array divided into two 512-Byte lockable regions          Suspend and Resume commands for Program and Erase operations Status Register, Data Polling, and Ready/Busy pin methods to determine device status CFI (Common Flash Interface) support Single supply (VCC) for read / program / erase (2.7V to 3.6V) Enhanced Variable I/O Feature o Enhanced I/O voltage range (EVIO): 1.65V to VCC Wide Temperature Range (-40°C to +85°C) More than 100,000 erase/program cycles 20-year data retention typical Packaging Options o 56-pin TSOP, 14x20mm o 56-ball TFBGA, 7x9mm o 64-ball LFBGA, 13x11 mm Publication Release Date: Jul 02, 2014 Revision C 8 W29GL256S 3 PIN CONFIGURATION Figure 3-1 LFBGA64 TOP VIEW (Face Down) A8 B8 C8 D8 E8 F8 G8 Figure 3-2 56-PIN STANDARD TSOP (Top View) A23 A22 A15 A14 A13 A12 A11 A10 A9 A8 A19 A20 #WE #RESET A21 #WP RY/#BY A18 A17 A7 A6 A5 A4 A3 A2 A1 RFU DNU H8 NC A22 A23 EVIO VSS NC NC NC A7 B7 C7 D7 E7 F7 G7 H7 VSS A13 A12 A14 A15 A16 RFU DQ15 A6 B6 C6 D6 E6 F6 G6 H6 A9 A8 A10 A11 DQ7 DQ14 DQ13 DQ6 A5 B5 C5 D5 E5 F5 G5 H5 #WE #RESET A21 A19 DQ5 DQ12 VCC DQ4 A4 B4 C4 D4 E4 F4 G4 H4 RY/#BY #WP A18 A20 DQ2 DQ10 DQ11 DQ3 A3 B3 C3 D3 E3 F3 G3 H3 A7 A17 A6 A5 DQ0 DQ8 DQ9 DQ1 A2 B2 C2 D2 E2 F2 G2 H2 A3 A4 A2 A1 A0 #CE #OE VSS A1 B1 C1 D1 E1 F1 G1 H1 NC NC NC NC DNU EVIO RFU NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 NC NC A16 RFU VSS DQ15 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 VCC DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 #OE VSS #CE A0 RFU EVIO Figure 3-3 TFBGA56 TOP VIEW (Face Down) B8 C8 D8 E8 F8 G8 A15 A21 A22 A16 RFU VSS A7 B7 C7 D7 E7 F7 G7 H7 A11 A12 A13 A14 RFU DQ15 DQ7 DQ14 A6 B6 C6 D6 E6 F6 G6 H6 A8 A19 A9 A10 DQ6 DQ13 DQ12 DQ5 A5 B5 C5 F5 G5 H5 #WE A23 A20 DQ4 EVIO RFU A4 B4 C4 #WP #RESET RY/#BY F4 G4 H4 DQ3 VCC DQ11 A3 B3 C3 D3 E3 F3 G3 H3 NC NC A18 A17 DQ1 DQ9 DQ10 DQ2 A2 B2 C2 D2 E2 F2 G2 H2 A7 A6 A5 A4 VSS #OE DQ0 DQ8 B1 C1 D1 E1 F1 G1 A3 A2 A1 A0 #CE DNU Publication Release Date: Jul 02, 2014 Revision C 9 W29GL256S 4 BLOCK DIAGRAM Figure 4-1 Simplified Block Diagram VCC EVIO VSS #CE #OE CONTROL OUTPUT BUFFER DECODER MAIN ARRAY #WE RY/#BY #RESET #WP A0 . . . . . . . . . . . . . . . . . . . . . A23 DQ0 . . . . . . . . . . . . . . DQ15 Publication Release Date: Jul 02, 2014 Revision C 10 W29GL256S 5 PIN DESCRIPTION Table 5-1 Pin Description SYMBOL SIGNAL TYPE A0-A23 DQ0-DQ15 #CE #OE #WE #WP #RESET Input I/O Input Input Input Input Input RY/#BY Output VCC EVIO VSS Power Supply Power Supply Power Supply NC - PIN NAME Address Inputs Data Inputs/Outputs Chip Enable, Device selected at VIL Output Enable, Output at VIL and HIGH-Z at VIH Write Enable, Write Mode at VIL and Read Mode at VIH Hardware Write Protect, Highest & Lowest Sector Protect at VIL Hardware Reset, device logic to standby and ready to read. Ready/Busy Status, Indicates whether an Embedded Algorithm is in progress or complete. At VIL, the device is actively engaged in an Embedded Algorithm such as erasing or programming. At HIGH-Z, the device is ready for read or a new command write requires external pull-up resistor to detect the HIGH-Z state. Multiple devices may have their RY/#BY outputs tied together to detect when all devices are ready. Power Supply Enhanced Variable IO Supply Ground No Connection Publication Release Date: Jul 02, 2014 Revision C 11 W29GL256S 6 INTRODUCTION The W29GL256S is a 3V, 256-Mbit, non-volatile, flash memory device with variable I/O. The device has a bus width of 16-bits (2-Bytes/1-Word) and word address boundaries are what are used. All read accesses provide 16 bits of data on every bus cycle. Every write cycle transfers 16 bits of data on the bus. XIP and Data Storage flash memories are combined features of the W29GL256S. This enables the ability of fast programming speeds and reduced random access time of XIP flash in higher densities. Read access to any random location takes 90 ns to 100 ns depending on device I/O power supply voltage. Each random access reads an aligned group of data of 32-bytes called a Page. Other words within the same Page may be read by changing only the low order 4 bits of word address. While in the same Page, access could take between 15 ns to 30 ns. This read operation is referred as Page Mode. Higher word address bits will select a different Page and begin another initial access. All read accesses are asynchronous. The device control logic is divided into two parallel operating subsections, the Command State Machine (CSM) and the Write State Controller. Device level signals with the host system during read and write transfers are monitored by the CSM as needed for the inputs and drive outputs. CSM delivers data from the current entered address map on read operations; places write address and data information into the Write State Controller command memory; signals the Write State Controller of power level changes, write operations and hardware reset, The Write State Controller looks in the command memory, after a write operation, for correct command sequences and performs Internal Algorithms that are related. Within the W29GL256S lie internal complex sequential operations or algorithms that are necessary to change the state of non-volatile data in the memory array. The internal Write State Controller manages all device algorithms. The main array data, programming and erasure are the main algorithms that are performed. When the host system sends command instructions to the flash device address space and Write State Controller receives these commands, provides status information during the progress of internal algorithms and performs all the necessary steps to complete the command. A logical 1 bit is considered an erased cell. Changing a bit from a logical 1 to a logical 0 is considering programming. Note, only an erase operation is able to change a 0 to a 1. A restriction to an erase operation is a minimum of an entire sector (sector erase), which is a 128-kbyte aligned and length group of data is erased or the entire array can be erased (chip erase). Winbond ships the W29GL256S with all sectors erased. Publication Release Date: Jul 02, 2014 Revision C 12 W29GL256S The W29GL256S programming algorithm transfers volatile data from a write buffer to a non-volatile memory array line; this is called Write Buffer Programming. The size of the buffer is 256-Words (512Bytes). 1 to 256 words can be written at any location in the Write Buffer prior to executing the programming operation. The programming operation can only be performed on an aligned group of 512 bytes in the flash array which is referred to as a Line. After the completion of any Write Buffer operation or a reset, the buffer is refreshed to all 1’s. By default any location that has not be written to a 0 are filled with 1’s. Each page of data that was loaded into the Write Buffer during a programming operation, the memory array data is unaffected by 1’s in the Write Buffer as it is transferred to a memory array Line. Program and Erase operations may be affected by the Enhanced Sector Protection (ESP) methods, preventing any erasure or programming in a sector that may have been previously protected. Publication Release Date: Jul 02, 2014 Revision C 13 W29GL256S Table 6-1 W29GL256S Address Map Addresses A3 - A0 A7 - A0 A15 - A4 A15 - A8 A23 - A16 Value 16 256 4096 256 256 Description Word Selection Write Buffer Internal Address Page Selection Write-Buffer-Line Selection Sector Selection Publication Release Date: Jul 02, 2014 Revision C 14 W29GL256S 7 ARRAY ARCHITECTURE There are several separate address spaces (i.e., Memory Map Overlay) that may appear within the address range of the flash memory device. Only one MMO can exist or be entered at a time.  Main Memory Array  This non-volatile area is used for storage of data that may be randomly accessed by asynchronous read operations.  ID/CFI  A Winbond factory programmed area for device characteristics information. It contains the Common Flash Interface (CFI) and Device Identification (ID) information tables.  Security Sector Region (SSR)  A Non-volatile / One Time Programmable (OTP) memory array used for Winbond factory and customer programmable permanent data.  Lock Register  This OTP non-volatile word is used to configure the Enhanced Sector Protection (ESP) features and lock the SSR.  Individual Protection Bits (IPB):  A non-volatile flash memory array with one bit for its associated sector. Programming this bit protects that sector from programming and erasure.  IPB Lock  Program and erase protection for the IPB bits. When the volatile register bit is enabled no programming or erasing of the IPB bits is prohibited.  Dynamic Protection Bits (DPB)  Similar to the IPB scheme, this volatile array with one bit for each sector can protect its associated sector from erasure and programming while the device is powered.  Status Register  Internal algorithm status monitoring can be done using this volatile register.  Data Polling Status:  Legacy software compatible volatile register used as an alternative to the Status Register to monitor internal algorithm status. The Main Memory Array is the primary and default address space. This area at any time may be overlaid by one other address space. All the aforementioned address spaces are considered as a Memory Map Overlay (MMO). Each MMO replaces the entire address range of the main array. Addresses outside the current MMO address map are considered as not defined and are reserved for Publication Release Date: Jul 02, 2014 Revision C 15 W29GL256S future use. Read access is possible outside of an MMO address map and will return non-valid (undefined) data. What appears in the flash device address space at any given time is one of four address map modes:  Read Mode  Memory Map Overlay (MMO) Mode  Status Register (SR) Mode  Data Polling Mode In Read Mode the entire Flash Memory Array may be directly read. Read mode is entered during Power Up, after a Hardware Reset, Command Reset completion, or when an internal algorithm is suspended, all of which is controlled by the Write State Controller. While in the Read Mode, command accesses are permitted when an internal algorithm is suspended. There are subsets of commands that will be accepted in Read Mode while an Internal Algorithm is suspended. The Status Register read command can be issued in any mode. This execution will cause the MMO of the Status Register to appear in the device address space at every word address location. To do this, the device interface waits for a read access, ignoring any write access. The content of the Status Register is presented at the next read access, after which it exits the Status Register MMO, and returns to the previous mode in which the Status Register read command was received. While the Write State Controller is performing an internal algorithm, such as a non-volatile memory array program or an erase operation, none of the Main Memory Array is accessible because, the entire flash device address space is replaced by the MMO of the Data Polling Status at every word location in the device address space. While in an internal algorithm operation, only the Status Register Read command or a Program / Erase suspend command will be accepted, ignoring all other commands. Hence, no other MMO may be entered. The Data Polling MMO is visible during an internal algorithm operation and once a suspend command has been executed it is present up to the moment the device suspends the internal algorithm. When the internal algorithm is suspended the Data Polling MMO is exited and the Main Memory Array data is available again. The Data Polling MMO is activated again when the suspended internal algorithm operation is resumed. At the completion of an internal algorithm operation, the Data Polling MMO is exited and the device goes back to operation from which it was called. Publication Release Date: Jul 02, 2014 Revision C 16 W29GL256S As mentioned previously, only one MMO may exist at any one time. Device commands affect only the currently entered MMO. Not all commands are valid for each MMO. For a listed of valid commands, see the Command Definition Tables in MMO sections of the table. Some MMOs have non-volatile data that can be programmed  Individual Protection Bits (IPB), also erase capable  Lock Register  Security Sector Region Operating in a non-volatile MMO mode while performing a program or erase command, the MMO is not readable while the internal algorithms is active. As soon as the function has completed, the MMO mode remains active and is again readable. Suspend and Resume commands are ignored for these non-volatile modes while these internal algorithms are active. 7.1 Flash Main Memory Array The W29GL256S family is comprised of uniform 128KB sector size architecture. The table below shows the sector architecture of the W29GL256S device. Table 7-1 W29GL256S Sector and Memory Address Map Sector Sector Address A23-A16 Sector Size (KByte) X16 Start / Finish SA00 0000000 128 0000000h 000FFFFh SA01 0000001 128 0010000h 001FFFFh . . . . . . . . . . . . . . . SA254 11111110 128 0FE0000h 0FEFFFFh SA255 11111111 128 0FF0000h 0FFFFFFh Note: This table has been reduced to show relative sector information for the entire device’s individual sectors and their address ranges (sectors SA02-SA253 are not shown). 7.2 CFI and Device ID (CFI-ID) There are two methods for systems to identify the type of flash memory installed in the system. The first method is called the Common Flash Interface (CFI). The second method called Autoselect, which is now referred to as Device Identification (ID). Device Identification (ID), a command is used to enable a Memory Map Overlay where up to 16 word locations can be read to get JEDEC manufacturer identification (ID), device ID, and some configuration and protection status information from the flash memory. Publication Release Date: Jul 02, 2014 Revision C 17 W29GL256S The Common Flash Interface (CFI) command enables a Memory Map Overlay where a table of standard information about how the flash memory is organized and operates can be read. Typically, these two address spaces have used separate commands and had separate overlays and are non-overlapping, so they actually can be combined in a single overlay. Either of these two commands can be used to access the combined Autoselect (ID) and CFI overlay. The CFI-ID address map overlays the Flash Array data of the sector selected by the address used in the CFI-ID enter command. While the CFI-ID MMO is entered, the content of all other sectors is undefined. Address map starts at location 0 of the selected sector. Data is considered as undefined past the maximum defined address of the CFI-ID MMO to the maximum address of the selected sector. To enter the Manufacturer ID (Autoselect) and Common Flash Interface (CFI) MMO command modes see the Instruction Definition Table. Table 7-2 CFI-ID Address Map Overview Word Address (SA) + 0000h to 000Fh (SA) + 0010h to 0079h (SA) + 0080h to FFFFh Description Device ID (traditional Autoselect values) CFI data structure Undefined Read / Write Read Only Read Only Read Only For the complete address map see the Device ID and Common Interface Tables. 7.3 Status Register The Status Register, Memory Map Overlay (MMO) contains status for Internal Algorithms in a single volatile word format. When the read command for the Status Register is issued, status at the time of captured is presented in the register and the MMO is entered. All word locations in the device address space contain the Status Register information. Status Register exits the MMO mode after the first read access and returns to the address space map in use when the Status Register read command was issued. Publication Release Date: Jul 02, 2014 Revision C 18 W29GL256S 7.4 Data Polling Status The Data Polling Status, Memory Map Overlay (MMO) monitors the progress of Internal Algorithms which is contained in a single volatile word. Following the last write cycle of any command sequence that initiates an Internal Algorithms, the Data Polling Status will be entered. Internal Algorithms are initiated by one of the following commands:  Blank Check  Chip Erase  Sector Erase  Erase Resume / Program Resume  Word Program  Program Buffer to Flash  Program Resume Enhanced Method  Lock Register Program  IPB Program  All IPB Erase At all word locations in the device address space, the Data Polling Status word appears. Data Polling Status MMO is exited and the device address space returns to the address map mode where the Internal Algorithms was started at the completion of the Internal Algorithms. 7.5 Sector Protection Control 7.5.1 Lock Register The Lock Register, Memory Map Overlay (MMO) mode contains a single word of One Time Programmable (OTP) memory. When the MMO mode is entered the Lock Register appears at all word locations in the device address space. Winbond recommends for future compatibility to read or program the Lock Register only at location 0 of the device address space. 7.5.2 Individual Protection Bits (IPB) The IPB, Memory Map Overlay (MMO) mode contains a non-volatile bit in each sector in the device. When the mode is entered, the IPB bit for a chosen sector appears in the Least Significant Bit (LSB) of each word in that sector. The non-volatile protection status for that sector is displayed by reading any word location, where the LSB indicates whether or not the sector is protected. The sector is protected against programming and erase operations if the bit is has been programmed to a 0. The sector is not protected by the IPB if the bit has been erased to a 1. Note; there are other features of Publication Release Date: Jul 02, 2014 Revision C 19 W29GL256S the Enhanced Sector Protection (ESP) that can protect sectors. Winbond recommends for future compatibility, to read or program the IPB only at word location 0 of the sector. 7.5.3 IPB Lock The IPB Lock, Memory Map Overlay (MMO) contains a single volatile bit of memory. Programming or erasing of the IPB is controlled by IPB Lock. IPB is protected against programming and erase operations, if the bit is 0. The IPB is not protected, if the bit is 1. When the IPB Lock mode is entered, the IPB Lock bit appears in the Least Significant Bit (LSB) of each word in the device address space. Winbond recommends for future compatibility, to read or program the IPB Lock only at word location 0 of the device. 7.5.4 Dynamic Protection Bits (DPB) The DPB Memory Map Overlay (MMO) contains one volatile bit of memory for each Sector. The DPB bit for a sector appears in the Least Significant Bit (LSB) of each word in the sector after entering the DPB mode. Reading any word in a sector displays the protection status for that sector. Sectors are protected during program and erase operations, if the DPB is 0 and unprotected if the bit is 1. Note there are other features of ESP that can protect the sector. Winbond recommends for future compatibility to read, set, or clear the DPB only at word location 0 of the sector. 8 FUNCTIONAL DESCRIPTIONS 8.1 Read 8.1.1 Random Read The memory device is selected by driving Chip Enable (#CE) LOW and the device will leave the Standby mode. If Write Enable (#WE) is disabled, driven HIGH while #CE is LOW, a random read operation is started. The particular data output will depends on the MMO mode and the specific address provided. The data output is presented on DQ15-DQ0 when #CE is LOW, Output Enable (#OE) is LOW, #WE is HIGH, address is stable, and the asynchronous access times are met. The Address access time (tACC) is defined to be equal to the delay from stable addresses to valid output data. The chip enable access time (tCE) is defined as the delay from a stable #CE to valid data on the outputs. The #OE signal must be LOW for at least the period of the output enable time (tOE), before valid read data is available at the outputs. Publication Release Date: Jul 02, 2014 Revision C 20 W29GL256S Device outputs will provide valid read data from the currently active address map mode at the end of the random read access time from address stable (tACC), #OE active (tOE), or #CE active (tCE), whichever happens last. A list of other transitional states during Random Read operation;  A new random read access begins if #CE remains LOW and any Address[23:4] signals change to a new value.  In order to get Back to Back accesses, requires an address change to initiate the second access and #CE to remains LOW between accesses Read mode with Outputs Disable, If #CE remains LOW and #OE goes .  Write mode, if #CE remains LOW, #OE goes HIGH, and #WE goes LOW.  Standby mode, if #CE returns HIGH. 8.1.2 Page Read As in the Random Read mode, a random read access sequence is required. Then if #CE remains LOW, #OE remains LOW, Address[23:4] signals remains unchanged, and any of the Address[3:0] signals have change, then a new access within the same Page (32-byte) begins with data appearing on DQ15-DQ0. The Page Read is much faster (tPACC) than a Random Read access. If #CE goes HIGH and returns LOW for another access, a random read access is performed and time is required (tACC or tCE). 8.2 Device Reset Operations The Hardware Reset (#RESET) input pin provides a hardware method of resetting the device to a standby mode. Immediately after issuing a Hardware Reset, driving #RESET LOW for at least a period of tRP:  Any operations in progress are terminated,  Memory Map Overlays (MMO) is exited.  All outputs are set to HIGH-Z.  The Status Register is reset.  The Write State Controller goes to the standby mode.  #CE is ignored for a period of (tRPH), during the reset operation.  #CE must be held HIGH to meet the Reset current specification (ICC5). Note: An operation that was interrupted should be reinitiated to ensure data integrity. An operation command sequence should be executed once the device is ready. Publication Release Date: Jul 02, 2014 Revision C 21 W29GL256S 8.3 Standby Mode Standby is the default, minimum power condition while the device is not selected (#CE = HIGH). All inputs are ignored in this mode and all outputs, except RY/#BY are at HIGH-Z. The Write State Controller direct output of the RY/#BY determines its state and is not controlled by other devices or interfaces. 8.4 Automatic Sleep When addresses remain stable for tACC + 30 ns, the device will automatically enter the Auto Sleep mode and latches the output data. Data on the output pins depends on the level of the #OE signal. The automatic sleep mode is designed to reduce device interface current (ICC6). #OE signal levels are independent of the automatic sleep mode current. The automatic sleep mode current (ICC6) specifications can be found in the DC Characteristics Tables. It’s important to note that slow clock durations help reduce current consumption when the Automatic Sleep mode goes active. During slow clock periods, read and write cycles may extend many times their length versus when the clock is operating at high speed. Even when the chip enable is LOW throughout these extended data transfer cycles, the memory device Command State Machine (CSM) will enter the Automatic Sleep mode. This keeps the device in the Automatic Sleep power level for most of the extended duration of the data transfer cycles. Obviously this method is beneficial rather than consuming full read power all the time that the device is selected. Note, the Write State Controller operates independent of the automatic sleep mode of the Command State Machine (CSM) and will continue to draw current during an active Internal Algorithm. Only when both entities are in their standby modes is the standby level current minimized. 8.5 Output Disable Mode When the #CE signal is driven LOW, either a controlled read or write data transfer may begin. When there is a period at the start of a data transfer when Chip Enable is LOW, Address has become valid, #WE is HIGH and Output Enable (#OE) is HIGH. During this point a Random Read process is started while the data outputs remain at HIGH-Z (Output Disabled). Driving the #OE signal LOW, the device interface transitions to the Random Read mode and output data is actively driven. If in the event the Write Enable (#WE) signal is driven LOW, the device interface transitions to the Write mode. The host system interface should never drive #OE and #WE LOW at the same time; this will prevent conflicts with the device. Publication Release Date: Jul 02, 2014 Revision C 22 W29GL256S 8.6 Program Methods 8.6.1 Asynchronous Write When #WE goes LOW after CE is LOW, there is a transition from one of the read modes to the Write mode. If #WE is LOW before #CE goes LOW, there is a transition from the Standby mode directly to the Write mode without beginning a read access. At this point setting Output Enable (#OE) HIGH will start a write data transfer. Address is captured by the falling edge of #WE or #CE, whichever occurs last. Data is captured by the rising edge of #WE or #CE, whichever occurs first. A #WE controlled Write access is when the #CE goes LOW before #WE goes LOW and stays LOW after #WE goes HIGH. When #WE are HIGH and #CE goes HIGH, there is a transition to the Standby mode. If #CE remains LOW and #WE goes HIGH, there is a transition to the Read with Output Disable state. A #CE controlled write mode is when #WE is LOW before #CE goes LOW, the write transfer is started by #CE going LOW. Then if #WE goes LOW after #CE goes HIGH, the address and data is latch by the rising edge of #CE. Another #CE controlled write mode access is when #WE is LOW before #CE goes LOW and remains LOW after #CE goes HIGH. This is a #CE controlled Write transitions to the Standby mode. An address change is required to initiate a Read access following a Write access, if #CE remains LOW between accesses. An address change is required to initiate the second write access in a Back to Back write in which #CE remains LOW between accesses. The Write State Controller command memory array is not readable by the host system and has no MMO. Its purpose is to examine the address and data in each write transfer to determine if the write is a legal command sequence. If the command sequence is correct, the Write State Controller will initiate the appropriate Internal Algorithms. 8.6.2 Word Programming Word programming programs a single word anywhere in the Main Memory Array. The Word Programming command is a four write cycle sequence. This is done by writing the unlock write command in the first two cycles, a program set up command in the third cycle and finally, in the Publication Release Date: Jul 02, 2014 Revision C 23 W29GL256S fourth cycle the program address and data are written. This will initiate the Internal Word Program algorithm. No further input controls are required. The Internal Algorithm generates all the programming pulses and programmed cell verifications. When the Internal Word Program algorithm is complete, the Write State Controller then returns to its standby mode. Program operation status can be determined by monitoring the RY/#BY output, reading the Status Register, or by using Data Polling Status. Program Suspend is the only command that can be written to the device during the Internal Program Algorithm, all others are ignored. However, a hardware reset (#RESET = VIL) will immediately terminates the programming operation. Then after tRPH time, returns the device to read mode. It is recommended to reinitiate the Word Program command sequence after the device has completed the hardware reset operation to insure data integrity. The Security Sector Region (SSR) mode may also use the Word Programming command when is entered. The Word Programming command has a modified version without unlock write cycles when it is used for programming the Lock Register and IPB MMOs. The same command is also used to change volatile bits when entered in to the IPB Lock, and DPB MMOs. See the Instruction Definition Tables for program command sequences. Publication Release Date: Jul 02, 2014 Revision C 24 W29GL256S Figure 8-1 Word Program Operation 8.6.3 Write Buffer Programming A 512-byte address range write buffer is used to program data within an aligned 512-byte boundary Line, (example, addresses: 100h to 1FFh). Hence, a Write Buffer Programming operation must be setup on a Line boundary. If the Programming operation is less than 512-bytes, it may start on any word boundary, but may not cross a Write-Buffer-Line boundary. All bit locations in the buffer at the start of a Write Buffer programming operation are in the One’s state (FFFFh/Word). Thus, any locations not loaded will retain the existing data. The Main Memory Array and the Secure Sector Region (SSR) are the areas that are supported by the Write Buffer Programming operation. It is possible to program from 1 bit, up to 512 bytes in one Write Buffer Programming operation. The recommended write buffer method is to only write each page once in a multi-page scenario. Programming should be done in full Lines of 512 bytes setup on 512byte boundaries, for the very best performance. To initiate a Write Buffer Programming operation, the first 2 cycles are the unlock write commands. The 3rd write cycle contains the Write to Buffer command with the program targeted Sector Address (SA). The fourth cycle is to write the number of planned word locations minus 1. This will indicate the Publication Release Date: Jul 02, 2014 Revision C 25 W29GL256S number of write buffer addresses that are to be loaded with data. This also indicates when to expect the Program Buffer to flash confirm command. The Write to Buffer command and the Write Word Count command Sector Addresses must match. In order to program, the sector must be unlocked (unprotected). Cycle 5, the starting address / data combination is written. This will be the first address / data pair to be programmed, and selects the write-buffer-Line address. The operation will abort and return to the initiating state if the Sector Address does not match the Write to Buffer Sector Address. In the following cycles, each address / data pairs must be in sequential order and all write buffer addresses must be within the same Line, otherwise the operation will abort and return to the initiating state. For each data write operation, the WC counter will decrement and every write is data being loaded into the write buffer. During the write buffer loading period no commands are accepted. The only way to stop writing data to the write buffer is to abort the Write to Buffer command. This is done by writing an invalid address that is outside the Write Buffer Line of the programming operation. The Program Buffer to Flash command must be issued immediately after the specified number of write buffer locations has been loaded at the sector address. At this point the program algorithm starts and the device status will be busy. The Internal Program Algorithm will program and verifies the data that has been programmed into the selected sector of the Main Memory Array. No control signals or timing parameters during this internal operation is required. The operation will abort and return to the initiating state anytime an incorrect number of write buffer locations have been loaded. The abort occurs because anything other than the expect Program Buffer to Flash command happened at the end of the word count. The write-buffer internal programming operation can be suspended using the Program Suspend command. When the Internal Program Algorithm is complete, the Write State Controller then returns to the Write State Controller standby mode where the programming operation was started. Under the following conditions the Write Buffer Programming sequence will be aborted:  The Word Count cannot exceed a value greater than the buffer size, which is 255 (256 minus 1).  The Write to Buffer command cannot contain an address that is outside the Line.  After the Write Word Count number of data words is loaded the Program Buffer to Flash command is not issued Data Polling Status, reading the Status Register, or monitoring the RY/#BY output can determine the status of the program operation. An abort of the Write Buffer command will occur immediately after an invalid condition, and will indicate a Program Fail in the Status Register at Program Status Bit (Bit Publication Release Date: Jul 02, 2014 Revision C 26 W29GL256S 4=1), because of the Write Buffer Abort Status Bit (Bit 3) equals 1. A Clear Status Register command may be issued to clear the Program Status Bit or the next successful program operation will clear the failure status bit. Caution should be taken when stopping the Write Buffer Programming Sequence by the following methods: Power cycling the device or a Hardware Reset. Using either of these methods may leave the area being programmed in an unknown state with unstable or invalid data. If this is the case reprogrammed with the same data or performing an erased to ensure data values are properly programmed or erased. Publication Release Date: Jul 02, 2014 Revision C 27 W29GL256S Figure 8-2 Write Buffer Programming Operation with Data Polling Status Write to Buffer CMD (SA) Word Count minus-1, (SA) Write beginning Add/Data WC=0? YES NO Write to a different (SA) YES Abort Write to Buffer NO Write to Buffer Aborted. Must “Write to Buffer Abort Reset” to return to Read mode Write next Add/Data4 WC=WC - 1 Write Program to Flash Confirm (SA) Read DQ[7:0] /w Add=Last Loaded Add DQ7=Data? NO NO DQ1=1? YES DQ5=1? NO YES YES Read DQ[7:0] /w Add=Last Loaded Add DQ7=Data? YES NO Fail / Abort2 Pass Notes: 1. 2. 3. 4. DQ7 should be rechecked even if DQ5 = 1 because DQ7 may change simultaneously with DQ5. If this flowchart location was reached because DQ5 = 1, then the device FAILED. If this flowchart location was reached because DQ1 = 1, then the Write Buffer operation was ABORTED. In either case the proper RESET command must be written to the device to return the device to READ mode. Write-Buffer-Programming-Abort-Rest if DQ1 = 1, either Software RESET or Write-Buffer-Programming-Abort-Reset if DQ5 = 1. See Instruction Definitions Tables for the command sequence as required for Write Buffer Programming. When Sector Address is specified, any address in the selected sector is acceptable. However, when loading WriteBuffer address locations with data, all addresses MUST fall within the selected Write-Buffer Page. Publication Release Date: Jul 02, 2014 Revision C 28 W29GL256S Figure 8-3 Write Buffer Programming Operation with Status Register Notes: 1. See Instruction Definitions Tables for the command sequence as required for Write Buffer Programming. 2. When Sector Address is specified, any address in the selected sector is acceptable. However, when loading WriteBuffer address locations with data, all addresses MUST fall within the selected Write-Buffer Page. Publication Release Date: Jul 02, 2014 Revision C 29 W29GL256S Table 8-1 Write Buffer Programming Command Sequence Address Data 555 AA Unlock Command 1. 2AA 55 Unlock Command 2. SA 0025h SA WC Starting Address WBL PD PD WBL PD SA 0029h Sequence Comment Write to Buffer Command at Sector Address. Number of Locations at Sector Address. WC = number of words to program minus 1 WC set to 1 = 2 words to program. Example Write Starting Address / Data pair. Selects Write-Buffer-Page and loads first Address/Data Pair. Write next Address / Data pair. All addresses MUST be within the selected write-buffer-page boundaries, and have to be loaded in sequential order. Write LAST Address/Data pair. All addresses MUST be within the selected write-buffer-page boundaries, and have to be loaded in sequential order. Write Buffer Program Confirm at Sector Address. This command MUST follow the last write buffer location loaded, or the operation will ABORT. Device goes busy. Legend: SA = Sector Address (Non-Sector Address bits are don't care. Any address within the Sector is sufficient.) WBL = Write Buffer Location (MUST be within the boundaries of the Write-Buffer-Line specified by the Starting Address.) WC =Word Count PD = Program Data 8.7 Program Suspend / Program Resume Commands An internal programming operation can be interrupted so that data can read from any non-suspended Boundary Line by using the Program Suspend command. During a programming process and the Program Suspend command is written, the programming operation will halt within the period of tPSL and the status bits will be updated. When writing the Program Suspend command addresses are don't care. Program Suspend has two commands available; The Erase/Program suspend command (B0h command code), which is a combined legacy command. The Program Suspend command (51h Publication Release Date: Jul 02, 2014 Revision C 30 W29GL256S command code). Program resume also has two possible commands; The Erase / Program resume command (30h command code) legacy combined command. Program Resume command (50h command code). It is recommended not to use the combine Erase/Program suspend or the combined Erase/Program resume commands for programming and for the erase suspend and resume use the legacy combined commands. After suspending the programming operation, any non-suspended Line of array data can be read. If during an Erase Suspended operation to start a Programming operation that was suspended, only addresses not in the Erase or Program Suspend may be read. The device returns back to program operation and the status bits are updated after the Program Resume command is executed. Monitoring the Status Register or using the Data Polling method, the programming operation status can be determined. During Program Suspend, valid accesses and commands:  Any non-erase suspended sector can be Read  Any non-program suspended Line can be Read.  Status Read command  Exit MMO or Command Set Exit  Program Resume command Program Resume command must be executed to exit the Program Suspend mode to continue the programming operation. Resume commands are ignored once the device has returned to the programming operation. After the device has resumed programming operation a Program Suspend command can be re-written. Programming operations can be interrupted as often as necessary but, the minimum requirement between a Program Resume and the next Program Suspend must be greater than or equal to tPRS. Not supported is Program suspend and resume mode while entered in an MMO. Likewise, there is no support while in program suspend to enter into MMO. 8.8 Erase Methods 8.8.1 Chip Erase The entire Main Memory Array is erased by chip erase function. The Internal Erase Algorithm will first program and verifies the entire memory prior to an electrical erase. All locations within the device will contain FFFFh after a successful chip erase. There is no need to provide any control signals or timing parameters during this operation. Initiating the chip erase command sequence requires writing two Publication Release Date: Jul 02, 2014 Revision C 31 W29GL256S unlock cycles, the a setup command cycle, two additional unlock write cycles and then the chip erase command, which in turn actives the Internal Erase Algorithm. While the Internal Erase operation is in progress, no data can be read from the device. Chip Erase operation status can be determined by reading the Status Register or using Data Polling. Only a Status Read, Hardware RESET or Power cycle are valid, once the chip erase operation has begun, ignoring all other commands. When the Internal Erase Algorithm has finished, the Write State Controller will return to the standby mode. However, in the case of a Hardware Reset or Power Cycle, the erase operation immediately terminates and returns to read mode after a period of tRPH. In the event the chip erase operation is terminated and to insure the integrity of the device data, the chip erase command sequence should be reinitiated once the device has returned to an idle state. If a sector is protected during chip erase, the Internal Erase Algorithm will ignore the protected sector and move on to the next sector erase. 8.8.2 Sector Erase The sector erase function erases a selected 128-kbyte sector in the main memory array. The Internal Erase Algorithm programs and verifies the select sector prior to an electrical erase. There are no requirements for any control signals or timing parameters during this internal operation. All locations within the erased sector will contain an FFFFh pattern, indicating a successful sector erase. If the sector has been protected, the sector will not be erased. Reading the Status Register or using Data Polling can be used to determine the status of the erase operation. It takes six cycles to perform a sector erase command sequence; writing two unlock cycles, followed by a setup command, writing two more unlock cycles, and the sector erase command that contains the address of the desired sector to be erased. The Status Register Read and Erase Suspend commands are the only valid commands that can be used after the sector erase operation has commenced, ignoring all other commands. The sector erase operation and be terminated abruptly by a hardware reset at which time the device returns to read mode after a period tRPH. If this is the case, the sector erase command procedure must be redone again once the device has completed the reset operation to ensure integrity of the data. Publication Release Date: Jul 02, 2014 Revision C 32 W29GL256S Figure 8-4 Sector Erase operation 8.9 Erase Suspend / Erase Resume The Erase Suspend command interrupts a sector erase operation making it possible to read data or program data in the main memory array. The Erase Suspend command is valid when a sector erase or a program operation is in progress. Executing an Erase Suspend command during a chip erase operation will be ignored. The device requires a maximum of tESL to suspend the erase operation and update the status bits any time the Erase Suspend command is executed during the a sector erase operation. Once in the erase-suspend mode, the Main Memory Array can be read or programmed. Reading at any address outside erase-suspended sectors produces valid data. Reading within the suspended sectors will result in invalid data. Monitoring the Status Register or Data Polling can be used to determine the status of the device actively performing an erase or erase-suspended function. Publication Release Date: Jul 02, 2014 Revision C 33 W29GL256S The Write State Controller will return the device back to the erase-suspend mode after a program operation has completed that was called from the erase suspend mode. The status of the program operation can be determined by reading the Status Register, the same as in the standard program operation. In the event there is a program failure during an Erase Suspend operation, it is necessary to initiate a Clear or Reset command to return the device to the Erase Suspended mode. Before trying another program operation on the main memory array, the erase function will need to be resumed and completed. During Erase Suspend, valid accesses and commands:  Any other non-suspended sector can be read.  Any other non-suspended sector can be programmed.  Status Read command  Enter DPB MMO  DPB Set  DPB Clear  DPB Status Read  Exit MMO or Command Set Exit  Erase Resume command To resume the sector erase operation, an Erase Resume command must be executed. The device will return back to erasing at which point the status bits will be updated. If another Erase Resume is attempted it will be ignored. Once the device has resumed erase operation another Erase Suspend command can be initiated. While entered in an MMO, Erase Suspend and Resume is not supported. Likewise, entry into a MMO while an erase suspend is not supported. 8.10 Blank Check To confirm if a selected sector is erased a Blank Check command should be used. Reads to the main memory array are not supported during a Blank Check operation. Trying to do so will return unknown data. To execute a Blank Check operation on a specific Sector, write the address (SA)555 and the data 33h after the Write State Controller is in the standby mode. If the device is in a programming or erase mode of operation a Blank Check command cannot be written. Publication Release Date: Jul 02, 2014 Revision C 34 W29GL256S The Status Register can confirm if the device is still busy and when it has completed the Blank Check operation, whether or not the sector is blank. Bit 7, Device Ready Bit of the Status Register will show if a Blank Check is being performed by the device. Bit 5, Erase Status Bit of the Status Register will indicate an erased sector when reading a ‘0’ or a non erased sector when reading a ‘1’. The device will immediately halt the Blank Check operation and update the status as soon as any bit in the selected sector is found not to be erased. The Write State Controller will return to the Standby mode, as soon as the Blank Check is completed. 8.11 Enhanced Sector Protection Methods 8.11.1 Enhanced Sector Protection (ESP) Enhanced Sector Protection is a method used to enable or disable program and erase operations, in any or all sectors. Described in the section are the various methods of protecting data stored in the main memory array. An outline of these methods is shown in the following figure. Publication Release Date: Jul 02, 2014 Revision C 35 W29GL256S Figure 8-5 Enhanced Sector Protection IPB Program Algorithm Start Individual Protection Mode (Default) IPB=0 Set IPB Lock Bit IPB lock Bit locked All IPB not changeable IPB=1 IPB Lock bit Unlocked IPB is Changeable Dynamic Write Protect bit (DPB) Sector Array DPB=0 Sector Protect DPB=1 Sector Unprotect Individual Protect bit (IPB) IPB=0 Sector Protect IPB=1 Sector Unprotect DPB 0 SA 0 IPB 0 DPB 1 SA 1 IPB 1 DPB 2 SA 2 IPB 2 . . . . . . . . . . . . DPB + n SA + n IPB + n Each sector has a non-volatile Individual Protection Bit (IPB) and a volatile Dynamic Protection Bit (DPB) associated with it. If in either case the bit is 0, the sector becomes protected from both program and erase operations. Program and erase of the IPB bits are protected when the IPB Lock bit is 0. The Individual Protection mode (default) clears the IPB Lock to a 1 during a Power Up Reset or Hardware Reset. This is done so that the IPB bits are unprotected after device reset. When needed there is a IPB Lock bit command to write the volatile IPB Lock bit to a 0 to protect the all the IPB. There is no command in the Individual Protection mode to clear the IPB Lock bit to 1 after it is programmed to 0, except for the Power Up Reset or Hardware resets. Publication Release Date: Jul 02, 2014 Revision C 36 W29GL256S The selection of the Individual Protection mode is set at the factory by programming OTP bit in the Lock Register. When shipped from Winbond, all the sector IPB bits are erased so that all main memory array sectors are unprotected. 8.11.2 IPB Lock This one per device volatile Individual Protection Bit Lock is a bit that will protect all IPB bits. When programmed to 0, it locks all sector IPBs and if the bit is 1, it allows the all sector IPBs to be changed. Only after the sector IPBs are configured to the desired state should the IPB Lock bit be programmed to 0. Note the IPB Lock command can only program the bit to 0. To erase the IPB Lock bit, only a Power Up Reset or a hardware reset will restore the value to 1 to allow sector IPB bits to be changed. There is no software command operation that can clear the IPB Lock to a 1. 8.11.3 Individual Protection Bits (IPB) The non-volatile Individual Protection Bits (IPB) is located in a separate non-volatile flash array. There is one IPB bit assigned to each sector. When an IPB is 0 their corresponding sectors is protected from program and erase operations. The IPB can be programmed individually, but are erased as a group. Important to note, the Write State Controller takes care of the preprogramming and verification prior to erasure. When programming an IPB bit the typical word programming time is required. To monitor the operation status of an IPB bit programming or erase, DQ6 Toggle Bit I of the Data Polling Status will toggle until the operation is complete. Note; typical sector erase time is required to erasing all the IPBs. Program or erase command will not execute and will time-out, if the IPB Lock is equal 0, without programming or erasing the IPB. The IPB Status Read command can be used to check the protection state of an IPB for a given sector, but you must first enter the IPB MMO mode. See Instruction Definition Tables. 8.11.4 Dynamic Protection Bits (DPB) The volatile Dynamic Protection Bits are exclusive for each sector and can be individually changed. Only sectors that have their IPBs clear to 1 (unprotected) can the DPBs control. By issuing the DPB Set or Clear command sequences, the DPB are clear to 1 or set to 0, thus placing each sector in the Publication Release Date: Jul 02, 2014 Revision C 37 W29GL256S unprotected or protected state respectively. The DPB can be set to 0 or cleared to 1 as often as needed. 8.11.5 Sector Protection Bit Status Summary Sector Protection status base on IPB, DPB and IPB Lock bit weight is as follows: Table 8-2 Sector Protection Status Sector Protection Bit Status Sector Status Unprotected: Protected : Protected: Protected: Unprotected: Protected: Protected: Protected: IPB and DPB are changeable IPB and DPB are changeable IPB and DPB are changeable IPB and DPB are changeable DPB is changeable DPB is changeable DPB is changeable DPB is changeable IPB Lock IPB DPB 1 1 1 1 0 0 0 0 1 1 0 0 1 1 0 0 1 0 1 0 1 0 1 0 8.11.6 Lock Register The Lock Register is a non-volatile One Time Programmable (OTP) register where the bits control protection of the SSR, and the default Individual Protection Mode, programmed at the factory. The Security Sector Region (SSR) protection bits are OTP and once programmed (locked); there is no command for unlocking the protected portion of the Security Sector Region. At this point no program or erase operations are allow in the SSR. The Lock Register programming time is typically the same as word programming. Monitoring Data polling Status DQ6 Toggle Bit I during a Lock Register programming Internal Algorithm will toggle until the operation is finished. Another method to monitor the programming status of the Lock Register can be done reading the Status Register’s bit 4 and 7. See Status Register Operations for information on these status bits. The Reserved Bits must be 1 (masked), when programming the Lock Register Bits. Table 8-3 Lock Register Name Bit 15-9 8 7 6 5 Reserved Reserved Reserved SSR Customer Lock Bit Reserved Default Value 1 0 X 1 1 Publication Release Date: Jul 02, 2014 Revision C 38 W29GL256S Reserved Reserved Reserved Individual Protection Mode (Factory Locked) SSR Factory Lock Bit 4 3 2 1 0 1 1 1 0 0 8.12 Security Sector Region The Security Sector Region (SSR) MMO provides an extra flash memory area that can be programmed once and permanently protected from further changes. The SSR is 1024 bytes in length. It consists of two 512 bytes regions, Factory Locked Security Sector Region and 512 bytes for Customer Locked Security Sector Region. The Secure Silicon Entry command sequence contains the sector address; this will overlay the Security Sector Region address map on the Main Memory Array selected sector. The overlay starts at location 0 in the selected sector. While the SSR MMO is entered the contents of locations exceeding the maximum SSR MMO address of that sector are consider as undefined data. Table 8-4 Security Sector Region Word Address Range Content Size (SA) + 0000h to 00FFh Factory Locked Security Sector Region 512 bytes (SA) + 0100h to 01FFh Customer Locked Security Sector Region 512 bytes (SA) + 0200h to FFFFh Undefined 127 Kbytes Publication Release Date: Jul 02, 2014 Revision C 39 W29GL256S 8.13 Monitoring Device Status Status Register, Data Polling and the Ready/Busy# (RY/#BY) Signal are the three methods for monitoring Internal Algorithms status. 8.13.1 Status Register The Status Register MMO is a 16-bit register that provides status of program and erase operations. The Status Register Read command is a two cycle command. First cycle overlays the contents of the status register in all locations of the device address space. The second cycle reads the information contents of the status register. The Status Register MMO is exited automatically after the read access. After the status register read access, #CE or #OE must go HIGH for a period of tCEPH or tOEPH, respectively to return to the active address space at the time the initial Status Register Read command was executed. Some of the Status Register bits are associated to the results indicating success / failure of the most recently completed Internal Algorithm, while remaining bits are for current status of an Internal Algorithm that is in progress, suspended or has completed. The upper 8 bits DQ[15:8] are reserved. They are undefined bits that should be treated as don't care and ignored. The Clear Status Register Command will turn results related bits to 0, but will not affect the current state bits. Table 8-5 Status Register Bit # Bit Description 15:8 Reserved 7 Device Ready Bit Erase Suspend 6 Status Bit Reset Status X 1 Busy Status Invalid 0 0 Invalid 5 Erase Status Bit 0 Invalid 4 Program Status Bit 0 Invalid 0 Invalid 0 Invalid 0 Invalid 0 Invalid 3 2 1 0 Write Buffer Abort Status Bit Program Suspend Status Bit Sector Lock Status Bit Reserved Read Status X 1 Erase not Suspended=0 Erase is Suspended=1 Erase successful=0 Erase fail=1 Program successful=0 Program fail=1 Program not aborted=0 Program aborted during Write to Buffer command=1 No Program in suspension=0 Program in suspension=1 Sector not locked during operation=0 Sector locked error=1 X Notes: Publication Release Date: Jul 02, 2014 Revision C 40 W29GL256S 1. DQ 7 is ‘1’ when there is no Internal Algorithm in progress in the device. 2. DQ[6:1] are valid only if DQ7 is ‘1’. 3. All bits are put in their reset status by Power-up reset or Hardware reset. 4. DQ[5:3, 1] is cleared to 0 by the Clear Status Register command or Reset command. 5. Upon issuing the Erase Suspend Command, the user must continue to read status until DQ7=1. 6. DQ6=0 by the Erase Resume Command. 7. DQ5 indicates either a success or failure of the most recent erase operation. 8. DQ4 indicates a success or failure of the most recent program operation. 9. During erase suspend, programming to the suspended sector, will cause program failure and set the DQ4=1. 10. Upon issuing the Program Suspend Command, the user must continue to read status until DQ7=1. 11. DQ2=0 by the Program Resume Command. 12. DQ1 indicates the status of the most recent program or erase operation that a program or erase and if the operation failed because the sector was locked. 8.13.2 Data Polling Status During an active Internal Algorithm the Write State Controller switches to the Data Polling MMO to display Internal Algorithms status to any read access. A single word (2-Bytes) of status information is available in all locations of the device address space. In the status word there are several bits to determine the status of an Internal Algorithms. These are the DQ bits as they appear on the I/O data bus during a read access while an Internal Algorithms is in progress. The upper byte (DQ[15:8]), DQ4, and DQ0 are reserved and are undefined data and should be treated as don't care. See Data Polling Status Table. 8.13.2.1 Data# Polling (DQ7) I/O pin DQ7 is the Data# Polling bit that indicates whether the device has an Internal Algorithm in progress or has completed. Data# Polling becomes valid on DQ7 on the last rising edge of #WE after a Program or Erase command sequence. During a Write Buffer Programming operation, the final word being programmed in the write buffer-page is the only time Data# Polling is valid. Polling Status is undefined at any other location. The device outputs complement of the data on DQ7 during an Internal Program algorithm. The same applies during Erase Suspend mode while a programming operation is in effect. The device outputs the programmed data bit to DQ7 of the last word programmed after the Internal Program algorithm has complete. Note the device allows only reading array data during a Program Suspend. A program address falling in a protected sector will cause Data# Polling on DQ7 to be active for approximately 20 μs, at which time the device returns to reading the Main Memory array. Publication Release Date: Jul 02, 2014 Revision C 41 W29GL256S During the Internal Erase or blank check algorithms, Data# Polling produces a 0 on DQ7. When the algorithm is complete, or if the device enters the Erase Suspend mode, Data# Polling produces a 1 on DQ7. This is similar to the complement data polling output described for the Internal Program algorithm. Addresses must be within the sector selected for erase to read valid status on DQ7. If the sector selected for erasing is protected and an erase command sequence is written, DQ7, Data# Polling is active for approx. 100 μs, then the device returns to reading the Main Memory array. When DQ7 has changed from the complement to true data, valid data can be read on DQ[15:0] on the next read cycles. This is because DQ7 may change independently with DQ[6:0] while Output Enable (#OE) is held LOW. See Data# Polling (During Embedded Algorithms) Figure or Data Polling Status Table these shows the outputs for DQ7, Data# polling. Figure for Write Buffer Programming Operation with Data Polling Status shows the Data# polling. DQ7 Data# Polling status may only be read:  At the address of the last word loaded into the Write Buffer for a Write Buffer programming operation;  The location of a single word programming operation.  A location in a sector being erased or blank checked. Figure 8-6 Data# Polling Algorithm Note: DQ7 should be rechecked even if DQ5 = 1 because DQ7 may change simultaneously with DQ5. Publication Release Date: Jul 02, 2014 Revision C 42 W29GL256S 8.13.2.2 DQ6: Toggle Bit I Data IO Pin, DQ6 (Toggle Bit I), when monitored can indicate if there is an Internal Program or Erase algorithm in progress or has completed. It also can indicate whether the device is in a Program or Erase Suspended mode. Toggle Bit I, is valid and can be read at any address after the rising edge of the last #WE pulse in a program or erase operation command sequence. Successive read cycles to any address during an internal program or erase algorithm operation will cause DQ6 to toggle. DQ6 stops toggling when either the program or erase operation has complete. After the execution of an erase command sequence and that selected sector is protected, DQ6 will toggle for about 100μs at which time the Write State Controller returns to the standby mode. Data IO Pins DQ6 and DQ2 together can determine whether a sector is actively erasing or erasesuspended. When the device has an internal erase algorithm in progress, DQ6 will toggle. If the device enters a Program Suspend or Erase Suspend mode, DQ6 will stop toggling. To determine which sectors are erasing or erase suspended, DQ2 must also be monitored. Alternative to this, DQ7 can be used (see DQ7: Data# Polling). During the Erase Suspend Program mode DQ6 also toggles and once the internal program algorithm has finished, DQ6 will stop toggling. Refer to the Data Polling Status Table, Toggle Bit Program flowchart, DQ2: Toggle II section, Reading Toggle Bits DQ6/DQ2 section and the Toggle Bit Timing Diagrams for more information. 8.13.2.3 DQ3: Sector Erase Timer To determine whether or not a sector erase has begun after a sector erase command sequence, DQ3 may be monitored. Refer to Sector Section for more details. After the sector erase command has been entered, it is recommended to read the status of DQ7 (Data# Polling) or DQ6 (Toggle Bit I) to determine that the device has received the command sequence, followed by reading DQ3. If Internal Erase algorithm has begun, then DQ3 should have a value of 1. Refer Data Polling Status Table for more information. 8.13.2.4 DQ2: Toggle Bit II Data IO Pin, DQ2 (Toggle Bit II) when accompanied with DQ6 (Toggle Bit I), monitors whether the selected sector is actively performing an Internal Erase algorithm or if the sector is erase-suspended. Toggle Bit II status becomes valid after the command sequence and the final rising edge of #WE pulse. Publication Release Date: Jul 02, 2014 Revision C 43 W29GL256S DQ2 toggles when read at addresses within the selected sector that which the erase algorithm was started. Use either #OE or #CE to control the read cycles. Monitoring just DQ2 is not enough to tell whether the sector is currently erasing or is in an erase-suspended state. By comparing DQ6 which indicates if the device is currently erasing, or is in an Erase Suspend state, but is not capable of distinguishing the selected sector for erase. So, to discern the correct sector and mode of operation, both status bits is required. Refer to the Data Polling Status Table, Toggle Bit Program flowchart, DQ2: Toggle II section, Reading Toggle Bits DQ6/DQ2 section and the Toggle Bit waveform figure for more information. Publication Release Date: Jul 02, 2014 Revision C 44 W29GL256S 8.13.2.5 Toggle Bits DQ6/DQ2 In order to discern Toggle bit status, DQ7-DQ0 must be read at least twice in a row to determine if a toggle bit is actually toggling. If it is determined that the toggle bit has stopped toggling, this would indicate that the device has either completed the program or erase operation. This being the case, on the next read cycle array data on DQ15-DQ0 can be read. If it is determines that the toggle bit is still toggling, then DQ5 (Exceeded Timing Limits) should be read to see if the current operation has exceeded its timed limit (DQ5=1). If the value of DQ5 is ‘1’ then another read of the toggle bit should be done in case DQ5 went high at the same time the toggle bit stop toggling. A successful completion of a program or erase operation is indicated by the toggle bit has stopped toggling. If the toggle bit is toggling, the operation did not complete successfully and then must issue the reset command to return to reading array data. Refer to Toggle Bit Program Figure. Publication Release Date: Jul 02, 2014 Revision C 45 W29GL256S Figure 8-7 Toggle Bit Program Notes: 1. Read toggle bit twice to determine whether or not it is toggling. See text. 2. Recheck toggle bit because it may stop toggling as DQ5 changes to 1. See text. 8.13.2.6 DQ5: Exceeded Timing Limits There is in place a specified internal pulse count for program or erase operations that when exceeded, DQ5 value will be equal to ‘1’. This is considered a fail for a program or erase operation that has not completed successfully. In this situation, a reset command must be executed to return back to a read array mode. It is possible that the device will continue to indicate busy for up to 2 μs following the reset command. Publication Release Date: Jul 02, 2014 Revision C 46 W29GL256S DQ1: Write-to-Buffer Abort 8.13.2.7 Write-to-Buffer operation was aborted if DQ1 equals ‘1’. If this happens, a Write-to-Buffer-Abort-Reset command sequence must be executed to bring the Write State Controller to standby and clear the Status Register failed bits. For more details, see Write Buffer Programming section. Table 8-6 Data Polling Status DQ72 DQ6 DQ51 DQ3 DQ22 DQ14 RY/#BY DQ7# Toggle 0 N/A No Toggle 0 0 Reading within Erasing Sector 0 Toggle 0 1 Toggle N/A 0 Reading Outside erasing Sector 0 Toggle 0 1 No Toggle N/A 0 Operation Internal Program Algorithm Standard Mode Program Suspend Mode3 Reading within Program Suspended Sector Reading within Non-Program Suspended Sector INVALID (Not INVALID (Not INVALID (Not INVALID (Not INVALID (Not INVALID (Not Allowed) Allowed) Allowed) Allowed) Allowed) Allowed) Data Data Data Data Data Data 1 1 No Toggle 0 N/A Toggle N/A 1 Reading within Non-Erase Suspend Sector Data Data Data Data Data Data 1 Programming within NonErase Suspended Sector DQ7# Toggle 0 N/A N/A N/A 0 BUSY State DQ7# Toggle 0 N/A N/A 0 0 Exceeded Timing Limits DQ7# Toggle 1 N/A N/A 0 0 ABORT State DQ7# Toggle 0 N/A N/A 1 0 Reading within Erase Suspended Sector Erase Suspend Mode Write-toBuffer4 1 Notes: 1. DQ5 switches to '1' when an Internal Program or Internal Erase operation has exceeded the maximum timing limits. See DQ5: Exceeded Timing Limits for more information. 2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details. 3. Data are invalid for addresses in a Program Suspended Line. 4. DQ1 indicates the Write-to-Buffer ABORT status during Write-Buffer-Programming operations. 8.14 Enhanced Variable I/O The Data I/O maximum drive and receive voltages are determined by the EVIO supply. This feature allows the device IO pins to be compatible with signal buses that have different voltage levels than the core device voltage. 8.15 Ready/#Busy The Ready/#Busy (RY/#BY) is a dedicated output pin that indicates whether a Hardware Reset, a Power Up Reset, or an internal algorithm operation is in progress or has finished. A valid output from the RY/#BY is after the falling edge of #RESET, VCC is higher than VCC minimum during Power Up Publication Release Date: Jul 02, 2014 Revision C 47 W29GL256S Reset or after the rising edge of the final #WE pulse during a command sequence. The RY/#BY pin is an open drain output that should have a pull up resistor tied to EVIO. While the Ready/#Busy output is HIGH (Ready), the device is capable of reading data in the Read, Erase Suspend, or in standby modes. When the device is actively performing an erase, program, or reset operation, the RY/#BY output is LOW (Busy), including in an Erase Suspend Programming mode. A reset command needs to be executed and Status Register bits 4 and 5 need to be cleared if a program or erase operation failed as a result of a timeout or a locked sector leaving the RY/#BY in a LOW state (busy). Refer to the Data Polling Status Table for Ready/#Busy output status. 8.16 Hardware Data Protection Options 8.16.1 Write Protect (#WP) The lowest or highest sector is protected from program or erase operations while Write Protect (#WP) equals VIL, independent of the Enhanced Sector Protection (ESP) configuration. Consequently, if #WP equals VIH, the lowest or highest address sector is not protected by the #WP. The Wrote Protect pin has an internal pull-up circuit so the default is at VIH. It is important to note the High or low sector protection depends on the device ordering option. 8.16.2 Write Pulse “Glitch” Protection Glitch pulses of less than 5 ns on the #WE pin will not initiate a write cycle. 8.16.3 Power Up Write Inhibit During Power Up Reset, #RESET, #CE, #WE, and #OE are ignored. The device is unable to be selected, commands are not accepted on the rising edge of #WE, and will not drive outputs during a Power Up Reset. During a Power-up Reset the Command State Machine (CSM) and Write State Controller are reset to their standby modes, ready for reading array data. Before the end of Power Up Reset (tVCS), #CE or #OE must go to VIH. 8.16.4 Logical Inhibit Write cycles are prevented by holding #OE at VIL, or #CE at VIH, or #WE at VIH. To start a write cycle, #CE and #WE must be equal to VIL while #OE is equal to VIH. Publication Release Date: Jul 02, 2014 Revision C 48 W29GL256S 8.17 Inherent Data Protection 8.17.1 Command Protection Internal Algorithms are started by writing command sequences into the Write State Controller command memory. The command memory array is not readable from the bus interface and has no memory map overlay. Each bus interface write is a command or a segment of a command sequence to the device. The Write State Controller analyses the address and data in each write transfer to decide whether the write is part of a legitimate command sequence. When a correct command sequence is finished the Write State Controller will start the appropriate Internal Algorithm. Writing an incorrect command sequence, can most likely result in the Write State Controller returning to its Standby mode. However, there is a possibility that an improper command sequence may cause the device to go into an unknown state, in that case a reset command must be executed or possibly a hardware reset, to return the Write State Controller to its Standby mode. Publication Release Date: Jul 02, 2014 Revision C 49 W29GL256S 8.18 Operating Modes and Signal States Table Table 8-7 Interface Conditions ≥ VCC min EVIO ≥ EVIO min ≤ VCC ≥ EVIO min VIL VIL VIH VIH A[23:4] Valid A[3:0] Modified #CE #OE #WE #RESET A[23:0] DQ[15:0] Valid Output Automatic Sleep1,2 VIL X X VIH ≥ VCC min ≥ EVIO min ≤ VCC VIH X X VIH ≥ VCC min ≥ EVIO min ≤ VCC X X X VIL ≥ VCC min ≥ EVIO min ≤ VCC X X X X Valid Valid X X X Valid Input Available Output HI-Z HI-Z HI-Z Write VIL VIL VIH VIH ≥ VCC min ≥ EVIO min ≤ VCC VIL VIH VIH VIH ≥ VCC min ≥ EVIO min ≤ VCC VIL VIH VIL VIH Valid Valid Valid Output HI-Z ≥ VCC min ≥ EVIO min ≤ VCC Standby Power Up Reset ≥ VCC min Hardware Reset VCC Read without Disabled3 Signal Random Read Page Read Mode This table describes the required condition of each interface signal for each operating mode. Legend: X = Don’t Care Valid = all bus signals have stable L or H level Modified = valid state different from a previous valid state Available = read data is internally stored with output driver controlled by #OE Notes: 1. #WE and #OE cannot be at VIL at the same time. 2. Read with Output Disable is a read initiated with #OE HIGH. 3. Automatic Sleep is a read/write operation where data has been driven on the bus for an extended period, without #CE going HIGH and the device internal logic has gone into standby mode to conserve power. Publication Release Date: Jul 02, 2014 Revision C 50 W29GL256S 8.19 Instruction Definition Tables Table 8-8 Read, Write, Program and Erase Definitions Command Sequence1 Read6 Reset/MMO Cycles Read, Write, Program and Erase Definitions Bus Cycles2-5 1 2 3 4 5 6 7 Add Data Add Data Add Data Add Data Add Data Add Data Add Data 1 RA RD Exit7,14 1 XXX F0 Status Register Read 2 555 70 XXX RD Status Register Clear 1 555 71 Word Program 4 555 AA 2AA 55 555 A0 PA PD Write to Buffer 6 555 AA 2AA 55 SA 25 SA WC WBL PD Program Buffer to Flash (confirm) 1 Write-to-Buffer-Abort Reset11 3 555 AA 2AA 55 555 F0 Chip Erase Sector Erase WBL PD 6 555 AA 2AA 55 555 80 555 AA 2AA 55 555 10 6 555 AA 2AA 55 555 80 555 AA 2AA 55 SA 30 SA 29 Erase Suspend/Program Suspend Legacy 1 XXX B0 Method9 Erase Resume/Program Resume Legacy Method10 1 XXX 30 Program Suspend Enhanced Method 1 XXX 51 Program Resume Enhanced Method 1 XXX 50 Blank Check 1 (SA) 33 555 Publication Release Date: Jul 02, 2014 Revision C 51 W29GL256S Table 8-9 CFI-ID (Autoselect) Definitions Command Sequence1 Cycles CFI-ID (Autoselect) Definitions Bus Cycles2-5 1 2 3 4 5 6 7 Add Data Add Data Add Data Add Data Add Data Add Data Add Data ID (Autoselect) Entry 3 555 AA 2AA 55 CFI Enter8 1 CFI-ID Read 1 XXX RD Reset/MMO Exit7,14 1 XXX F0 (SA) 90 555 (SA) 98 55 Table 8-10 Security Sector Region Command Definitions Command Sequence1 Cycles Security Sector Region Command Definitions Bus Cycles2-5 1 2 3 4 5 (SA) 88 555 3 555 AA 2AA 55 Read6 1 RA RD Word Program 4 555 AA 2AA 55 555 A0 PA PD Write to Buffer 6 555 AA 2AA 55 Program Buffer to Flash 1 SA (confirm) SA 25 SA WC WBL PD WBL PD 29 Write-to-Buffer-Abort Reset11 3 555 AA 2AA 55 555 F0 SSR Exit11 4 555 AA 2AA 55 555 90 Reset/MMO 7 Add Data Add Data Add Data Add Data Add Data Add Data Add Data SSR Entry Exit7,14 6 XX 0 1 XXX F0 Publication Release Date: Jul 02, 2014 Revision C 52 W29GL256S Table 8-11 Lock Register Command Set Definitions Command Sequence1 Cycles Lock Register Command Set Definitions Bus Cycles2-5 1 2 3 4 5 6 7 Add Data Add Data Add Data Add Data Add Data Add Data Add Data Lock Register Entry 3 555 AA 2AA 55 555 40 Program13 2 XXX A0 XXX PD Read13 1 Command Set Exit12,14 2 XXX 90 XXX Reset/MMO Exit7,14 1 XXX F0 0 RD 0 Table 8-12 IPB Non-Volatile Sector Protection Command Set Definitions Command Sequence1 IPB Entry IPB Cycles IPB Non-Volatile Sector Protection Command Set Definitions Bus Cycles2-5 1 2 3 5 6 Add 7 Data Add Data 3 555 AA 2AA 55 555 C0 Program15 2 XXX A0 SA 0 Erase15 2 XXX 80 0 30 All IPB 4 Add Data Add Data Add Data Add Data Add Data RD (0) IPB Read15 1 SA Command Set Exit12,14 2 XXX 90 XXX Reset/MMO Exit7,14 1 XXX F0 0 Publication Release Date: Jul 02, 2014 Revision C 53 W29GL256S Table 8-13 Global Non-Volatile Sector Protection Freeze Command Set Definitions Global Non-Volatile Sector Protection Freeze Command Set Definitions(IPB Lock Bit) Command Sequence1 Cycles Bus Cycles2-5 IPB Lock Entry 3 555 AA 2AA 55 555 50 2 XXX A0 XXX 0 XXX 0 IPB Lock Bit Cleared Read15 IPB Lock Status Command Set 2 3 4 5 6 7 Add Data Add Data Add Data Add Data Add Data Add Data Add Data 1 XXX RD (0) Exit12,14 Reset/MMO Exit14 1 2 XXX 90 1 XXX F0 Table 8-14 DPB Volatile Sector Protection Command Set Definitions DPB Volatile Sector Protection Command Set Definitions Command Sequence1 Cycles Bus Cycles2-5 Add Data Add Data Add Data Add Data Add Data Add Data Add Data DPB MMO Entry 3 555 AA 2AA 55 555 E0 DPB Erase15 2 XXX A0 SA 1 DPB PGM15 2 XXX A0 SA 0 DPB Status Read15 1 XXX 0 1 Reset/MMO Exit 3 4 5 6 7 SA RD (0) Command Set Exit12,14 2 XXX 14 2 1 XXX 90 F0 Publication Release Date: Jul 02, 2014 Revision C 54 W29GL256S Legend: X = Don't care. RA = Address of the memory to be read. RD = Data read from location RA during read operation. PA = Address of the memory location to be programmed. PD = Data to be programmed at location PA. SA = Address of the sector selected. Address bits A23-A16 uniquely select any sector. WBL = Write Buffer Location. The address must be within the same Line. WC = Word Count is the number of write buffer locations to load minus 1. Notes: 1. See Interface Condition Table for description of bus operations. 2. All values are in hexadecimal. 3. Except for the following, all bus cycles are write cycle: read cycle during Read, ID/CFI Read (Manufacturing ID / Device ID), Indicator Bits, Security Sector Region Read, SSR Lock Read, and 2nd cycle of Status Register Read. 4. Data bits DQ15-DQ8 are don't care in command sequences, except for RD, PD, WC and PWD. 5. Address bits A23-A11 is don't care for unlock and command cycles, unless SA or PA required. (A23 is the Highest Address pin.). 6. No unlock or command cycles required when reading array data. 7. The Reset command is required to return to reading array data when device is in the CFI-ID (Autoselect) mode, or if DQ5 goes HIGH (while the device is providing status data). 8. Command is valid when device is ready to read array data or when device is in CFI-ID (Autoselect) mode. 9. The system can read and program/program suspend in non-erasing sectors, or enter the CFI-ID MMO, when in the Erase Suspend mode. The Erase Suspend command is valid only during a sector erase operation. 10. The Erase Resume/Program Resume command is valid only during the Erase Suspend/Program Suspend modes. 11. Issue this command sequence to return to READ mode after detecting device is in a Write-to-Buffer-Abort state. IMPORTANT: the full command sequence is required if resetting out of ABORT. 12. The Exit command returns the device to reading the array. 13. All Lock Register bits are one-time programmable. The program state = 0 and the erase state = 1. Also, the Individual Protection mode Lock Bit cannot be programmed at the same time or the Lock Register Bits Program operation aborts and returns the device to read mode. Lock Register bits that are reserved for future uses are undefined and may be 0’s or 1's. 14. If any of the Entry commands was issued, an Exit command must be issued to reset the device into read mode. Publication Release Date: Jul 02, 2014 Revision C 55 W29GL256S 15. Protected State = 00h, Unprotected State = 01h. The sector address for DPB set, DPB clear, or IPB Program command may be any location within the sector - the lower order bits of the sector address are don't care. Publication Release Date: Jul 02, 2014 Revision C 56 W29GL256S 8.20 Common Flash Interface and Device ID (CFI-ID) The Manufacturer ID, Device ID, Sector Protection status, and basic feature information for the device are available when the Device ID portion of the MMO is read, locations 0h to 0Fh. The sector protection status can be read by entering the CFI-ID command which contains the sector address (SA) and location 02h. If another sector protection status is required, it will be necessary to exit ID MMO and re-enter the CDI-ID command again with the new sector address. Reading location 02h requires an access time of tACC, #CE should go HIGH before the read and to initiate an asynchronous read access #CE should return LOW again. Page mode read is not support for reading between location 02h and the other ID locations. However, Page mode read supports reads between ID locations other than 02h. Table 8-15 ID (Autoselect) Address Map Description Manufacture ID Device ID Protection Verification Indicator Bits DQ15-DQ08 = 1 (Reserved) DQ7: Factory Locked Security Sector Region 1 = Locked, 0 = Not Locked DQ6: Customer Locked Security Sector Region 1 = Locked, 0 = Not Locked DQ5 = 1 (Reserved) DQ4 - WP# Protects 0 = lowest address Sector, 1 = highest address Sector DQ3 - DQ0 = 1 (Reserved) RFU Lower Software Bits Bit 0: Status Register Support 1 = Yes, 0 = No Bit 1:DQ Polling Support 1 = Yes, 0 = No Bit 3-2: Command Set Support 11 = reserved 10 = reserved 01 = Reduced Command Set 00 = Classic Command set Bits 4-15: Reserved = 0 Upper Software Bits Address (SA) + 0000h (SA) + 0001h (SA) + 0002h Data 00EFh 227Eh 0000h/0001h (SA) + 0003h Same as description (SA) + 0004h (SA) + 0005h (SA) + 0006h (SA) + 0007h (SA) + 0008h (SA) + 0009h (SA) + 000Ah (SA) + 000Bh Reserved Reserved Reserved Reserved Reserved Reserved Reserved Reserved (SA) + 000Ch 0003h (SA) + 000Dh Reserved Publication Release Date: Jul 02, 2014 Revision C 57 W29GL256S Description Address (SA) + 000Eh (SA) + 000Fh Device ID Device ID Data 2222h 2201h Publication Release Date: Jul 02, 2014 Revision C 58 W29GL256S Table 8-16 CFI Query Identification String Description Query-unique ASII string “QRY” Primary vendor instruction set and control interface ID code Address for primary algorithm extended query table Alternate vendor instruction set and control interface ID code Address for alternate algorithm extended query table Address Data (SA) + 10h 0051h (SA) + 11h 0052h (SA) + 12h 0059h (SA) + 13h 0006h (SA) + 14h 0000h (SA) + 15h 0040h (SA) + 16h 0000h (SA) + 17h 0000h (SA) + 18h 0000h (SA) + 19h 0000h (SA) + 1Ah 0000h Table 8-17 CFI System Interface String Description Address Data VCC supply minimum program/erase voltage (SA) + 1Bh 0027h VCC supply maximum program/erase voltage (SA) + 1Ch 0036h VPP supply minimum program/erase voltage (SA) + 1Dh 0000h VPP supply maximum program/erase voltage (SA) + 1Eh 0000h (SA) + 1Fh 0008h (SA) + 20h 0009h Typical timeout per individual block erase, 2 ms (SA) + 21h 0008h Typical timeout for full chip erase, 2n ms (00h, not support) (SA) + 22h 0010h (SA) + 23h 0001h (SA) + 24h 0002h (SA) + 25h 0003h (SA) + 26h 0003h n Typical timeout per single word/byte write, 2 µs n Typical timeout for maximum-size buffer write, 2 µs (00h, not support) n n Maximum timeout for word/byte write, 2 times typical n Maximum timeout for buffer write, 2 times typical n Maximum timeout per individual block erase, 2 times typical n Maximum timeout for chip erase, 2 times typical (00h, not support) Publication Release Date: Jul 02, 2014 Revision C 59 W29GL256S Table 8-18 CFI Device Geometry Definition Description n Device size = 2 in number of bytes Flash device interface description (01=asynchronous x16 only) Maximum number of bytes in buffer write = 2n (00h, not support) Number of erase regions within device (01h:uniform, 02h:boot) Index for Erase Bank Area 1: [2E,2D] = # of same-size sectors in region 1-1 [30, 2F] = sector size in multiples of 256K-bytes Index for Erase Bank Area 2 Index for Erase Bank Area 3 Index for Erase Bank Area 4 Address Data (SA) + 27h 0019h (SA) + 28h 0001h (SA) + 29h 0000h (SA) + 2Ah 0009h (SA) + 2Bh 0000h (SA) + 2Ch 0001h (SA) + 2Dh 00FFh (SA) + 2Eh 0000h (SA) + 2Fh 0000h (SA) + 30h 0002h (SA) + 31h 0000h (SA) + 32h 0000h (SA) + 33h 0000h (SA) + 34h 0000h (SA) + 35h 0000h (SA) + 36h 0000h (SA) + 37h 0000h (SA) + 38h 0000h (SA) + 39h 0000h (SA) + 3Ah 0000h (SA) + 3Bh 0000h (SA) + 3Ch 0000h Publication Release Date: Jul 02, 2014 Revision C 60 W29GL256S Table 8-19 CFI Primary Vendor-Specific Extended Query Description Address Data (SA) + 40h 0050h Query - Primary extended table, unique ASCII string, PRI (SA) + 41h 0052h (SA) + 42h 0049h Major version number, ASCII (SA) + 43h 0031h Minor version number, ASCII (SA) + 44h 0035h Unlock recognizes address (SA) + 45h 001Ch Erase suspend (2= to both read and program) (SA) + 46h 0002h Sector protect (N= # of sectors/group) (SA) + 47h 0001h Temporary sector unprotect (1=supported) (SA) + 48h 0000h Sector protect/Chip unprotect scheme (SA) + 49h 0008h Simultaneous R/W operation (0=not supported) (SA) + 4Ah 0000h Burst mode (0=not supported) (SA) + 4Bh 0000h Page mode (0=not supported, 01 = 4 word page, 02 = 8 word page) (SA) + 4Ch 0003h Minimum ACC(acceleration) supply (0= not supported), [D7:D4] for volt, [D3:D0] for 100mV (SA) + 4Dh 0000h Maximum ACC(acceleration) supply (0= not supported), [D7:D4] for volt, [D3:D0] (SA) + 4Eh 0000h for 100mV WP# Protection 04=Uniform sectors bottom WP# protect 05=Uniform sectors top WP# protect (SA) + 4Fh 00xxh Program Suspend (0=not supported, 1=supported) (SA) + 50h 0001h Unlock Bypass (0=Not supported, 1=supported) (SA) + 51h 0000h Secured Silicon Sector (Customer OTP Area) Size 2N (bytes) (SA) + 52h 0009h Software Features bit 0: status register polling (1 = supported, 0 = not supported) bit 1: DQ polling (1 = supported, 0 = not supported) bit 2: new program suspend/resume commands (1 = supported, 0 = not supported) bit 3: word programming (1 = supported, 0 = not supported) bit 4: bit-field programming (1 = supported, 0 = not supported) bit 5: autodetect programming (1 = supported, 0 = not supported) bit 6: RFU bit 7: multiple writes per Line (1 = supported, 0 = not supported) (SA) + 53h 008Fh Page Size = 2N bytes (SA) + 54h 0005h N Erase Suspend Time Maximum 1.8V. 6. If an internal operation is in progress at the beginning of a reset, the current consumption will remain at the internal operation specification until the internal operation is terminated by the reset. If no internal operation is in progress when reset has begun or following the termination of an internal operation, ICC7 will draw current during what’s left Publication Release Date: Jul 02, 2014 Revision C 65 W29GL256S of the tRPH period. At the end of the tRPH period, the device transitions to the standby mode until the next read or write cycle. 7. The RY/#BY suggested pull-up resistor for the output is 5k to 10k Ohms. Publication Release Date: Jul 02, 2014 Revision C 66 W29GL256S 9.4 Capacitance Characteristics Table 9-4 Connector Capacitance for FBGA (LFBGA64) Package Description Parameter Test Setup Typ Max Unit CIN VIN = 0 8 9 pF Output Capacitance COUT VOUT = 0 5 7 pF Control Pin Capacitance CIN2 VIN = 0 4 8 pF RY/#BY VOUT = 0 3 4 pF Input Capacitance Output Capacitance Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz Table 9-5 Connector Capacitance for TSOP (TSOP56) Package Description Parameter Test Setup Typ Max Unit CIN VIN = 0 7 8 pF Output Capacitance COUT VOUT = 0 5 6 pF Control Pin Capacitance CIN2 VIN = 0 3 7 pF RY/#BY VOUT = 0 3 4 pF Input Capacitance Output Capacitance Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz Table 9-6 Connector Capacitance for TFBGA (TFBGA56) Package Description Input Capacitance Parameter Test Setup Typ Max Unit CIN VIN = 0 7 8 pF Output Capacitance COUT VOUT = 0 5 6 pF Control Pin Capacitance CIN2 VIN = 0 3 7 pF RY/#BY VOUT = 0 3 4 pF Output Capacitance Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz Publication Release Date: Jul 02, 2014 Revision C 67 W29GL256S 10 TIMING SPECIFICATIONS 10.1 AC Test Conditions Figure 10-1 Device Under Test Setup Table 10-1 Test Specification Parameter Description Output Load Capacitance, CL Input Rise and Fall Times1 Input Pulse Levels All Speeds Units 30 pF 1.5 ns 0.0-EVIO V Input timing measurement reference levels EVIO/2 V Output timing measurement reference levels EVIO/2 V Note: 1. Measured between VIL max and VIH min. Figure 10-2 Input Switching Test Waveforms Publication Release Date: Jul 02, 2014 Revision C 68 W29GL256S 10.2 Power Up Reset and Hardware Reset Decoupling the VCC and EVIO power supplies are normal precautions that should be taken. Generally, a suitable capacitor would be on the order of 0.1 μF tied close to the package. Table 10-2 Power ON and Reset Parameters Description Parameter Limit Value Unit tVCS Min 300 μs tVIOS Min 300 μs #RESET LOW to #CE LOW tRPH Min 35 μs #RESET Pulse Width tRP Min 200 ns Time between #RESET (HIGH) and #CE (LOW) tRH Min 50 ns #CE Pulse Width HIGH tCEH Min 20 ns VCC Setup Time to first access1,2 EVIO Setup Time to first access1,2 Notes: 1. Not 100% tested. 2. Timing measured from VCC minimum and EVIO minimum to VIH on Reset and VIL on #CE. 3. #RESET low is possible during Power Up Reset. If RESET is asserted during Power Up Reset, the later period of tRPH, tVIOS, or tVCS will determine when #CE may go LOW. If #RESET stays LOW after tVIOS, or tVCS is fulfilled, tRPH is measured from the end of tVIOS, or tVCS. RESET is required also to be HIGH tRH before #CE goes LOW. 4. During power-up, VCC ≥ (EVIO - 200 mV). 5. The ramp rate for VCC and EVIO can be non-linear. 6. tRPH must be  (tRP + tRH). 10.2.1 Power Up Reset The device will draw ICC7 current during Power-up Reset. As power supplies voltage ramps up, the EVIO voltage must remain less than or equal to the VCC voltage. VIH also has to be less than or equal to the EVIO voltage. The Power-up Reset Internal Algorithm requires a period of tVCS to load all of the Write State Controller algorithms and default data from non-volatile memory. All control signals including #CE and #RESET during the Power-up Reset period are ignored. Higher than normal Power Up Reset current during tVCS may occur if #CE is LOW, but the level of #CE will not influence the Power-up Reset Internal Algorithms. For a valid read or write operation, #CE or #OE must transition from HIGH to LOW after the tVCS period. During the period of tVCS, #RESET can be HIGH or LOW. When #RESET is LOW during the period of tVCS, it may stay LOW at the end of tVCS to keep the device in the Hardware Reset mode. The device will go to the Standby mode if #RESET is HIGH at the end of tVCS. Publication Release Date: Jul 02, 2014 Revision C 69 W29GL256S When the power first starts to ramp up and the supply voltage is below VRST, then increases to the operating level minimum, internal device configuration and Hardware reset operations are initiated. The #CE signal level is ignored for the period of the Power Up Reset operation (tVCS or tVIOS). Having #RESET signal LOW during this Power Up Reset period is discretionary. However, if #RESET is asserted LOW during Power up Reset sequence, it must satisfy the Hardware Reset parameters; tRP and tRPH. In that case, the Reset operations will be finished at the later of tVCS, tVIOS or tRPH. Figure 10-3 Power Up Reset Publication Release Date: Jul 02, 2014 Revision C 70 W29GL256S 10.2.2 Hardware Reset Hardware Reset is initiated by the #RESET signal going to VIL. The device will draw ICC7 current during Hardware Reset (tRPH). The device draws CMOS standby current (ICC4), if #RESET is constantly held at VSS, but if #RESET is held at VIL and not VSS, the standby current is higher. If #RESET is asserted LOW after tVCS and Power-up Reset has not completed, in this case the Power-up #RESET Internal Algorithms will be performed instead and not Hardware #RESET, requiring a period of tVCS to complete. After the device has completed Power Up Reset and entered the Standby mode, any transition to the Hardware Reset mode will initiate the Hardware Reset Internal Algorithm. A Hardware Reset is considerably shorter than a Power-up Reset (tRPH) to complete. During the Hardware Reset Internal Algorithms, any Internal Algorithm in progress will be terminated and the Write State Controller is returned to its Power Up Reset mode without reloading Write State Controller algorithms from nonvolatile memory. When the Hardware Reset Internal Algorithms finishes, the device will remain in the Hardware Reset mode, if #RESET stays LOW. If #RESET returns HIGH, the device will go into the Standby mode. If #RESET is HIGH at the end of the Hardware Reset Internal Algorithms, the device will go into the Standby mode. If the Power Up Reset cycle was not properly finished by the end of tVCS period, a transition to the Hardware Reset mode will only cause a transition to the Power Up Reset mode and initiate the Power-up Reset Internal Algorithm. This makes sure the device can complete a Power-up Reset sequence even if some portion of the Power Up voltage ramp-up causes the Power Up Reset to not initiate or finish properly. During Power-up or Hardware reset, the RY/#BY pin is LOW as an indicating the device is busy. Figure 10-4 Hardware Reset Publication Release Date: Jul 02, 2014 Revision C 71 W29GL256S 10.3 AC Characteristics 10.3.1 Internal Algorithm Performance Table Table 10-3 Internal Algorithm Characteristics Type2 Max3 Unit 300 2000 ms 10 200 μs 2-byte1 50 200 32-byte1 80 350 64-byte1 110 450 128byte1 170 850 256byte1 280 1400 512-byte 500 3000 512-byte 1 Parameter Sector Erase Time 128 kbyte5 Single Word Programming Time1 Buffer Programming Time Effective Write Buffer Program Operation per Word Sector Programming Time 128 kB (full Buffer Programming)6 108 Erase Suspend/Erase Resume (tESL) Program Suspend/Program Resume (tPSL) Erase Resume to next Erase Suspend (tERS)7 Program Resume to next Program Suspend (tPRS)7 Blank Check μs μs 192 ms 40 μs 40 μs 100 μs 100 μs 6.2 8.5 ms Notes: 1. Not 100% tested. 2. Program and erase typical times presume the following conditions: 25°C, 3.0V VCC, a random data pattern and 10,000 cycles. 3. 90°C, VCC = 2.70V, 100,000 cycles, and a random data pattern are considered under worst case conditions. 4. Specifications are based upon a 512-byte write buffer for Effective write buffer operations. 5. All words are programmed to 0000h before Sector and Chip erasure as part of the pre-programming step of the Internal Erase algorithm. 6. System-level overhead is the time required to execute the bus-cycle sequence for the program command. 7. In order for Program or Erase operations to progress to completion requires the time period to be ≥ typical periods. However, a minimum of 60 ns is required between Resume and Suspend. Publication Release Date: Jul 02, 2014 Revision C 72 W29GL256S 10.3.2 Asynchronous Read Operations Table 10-4 Read Operation EVIO = 1.65V to VCC, VCC = 2.7V to 3.6V Description Valid Data Output after Address Read Period Time Valid data output after #CE Low Page Access Time Valid data output after #CE Low Output Hold time from addresses, #CE or #OE, Whichever Occurs First Chip Enable or Output Enable to Output HIZ1 Read Output Enable Hold Time1 Toggle and Data# Polling EVIO=VCC EVIO=1.65V to VCC EVIO=VCC EVIO=1.65V to VCC EVIO=VCC EVIO=1.65V to VCC EVIO=VCC EVIO=1.65V to VCC EVIO=VCC EVIO=1.65V to VCC EVIO=VCC EVIO=1.65V to VCC EVIO=VCC EVIO=1.65V to VCC EVIO=VCC EVIO=1.65V to VCC EVIO=VCC EVIO=1.65V to VCC Symbol VCC=2.7~3.6V ALT STD Min TYP Max Unit 90 ns tACC tAA 100 ns 90 ns tRC 100 ns 90 ns tCE 100 ns 15 ns tPACC tPA 25 ns 25 ns tOE 35 ns 0 ns tOH 0 ns 15 ns tDF 20 ns 0 ns 10 ns tOEH 5 8 Note: 1. Not 100% tested. Figure 10-5 Back to Back Read (tACC) Operation Publication Release Date: Jul 02, 2014 Revision C 73 W29GL256S Figure 10-6 Back to Back Read Operation (tRC) Note: A back to back operation, in which #CE remains LOW between accesses, requires an address change to initiate the second access. Figure 10-7 Page Read Note: Word Configuration: Toggle A0, A1, A2, and A3. Publication Release Date: Jul 02, 2014 Revision C 74 W29GL256S 10.3.3 Asynchronous Write Operations Table 10-5 Write Operations EVIO = VCC=2.7~3.6V Symbols Description ALT STD Min Typ Max Unit 1 tWC 60 ns tAS 0 ns Address Setup Time to #OE LOW during toggle bit polling tASO 15 ns Address Hold Time tAH 45 ns Address Hold Time From #CE or #OE HIGH during toggle bit polling tAHT 0 ns Data Setup Time tDS 30 ns Data Hold Time tDH 0 ns Output Enable HIGH during toggle bit polling or following status register read. tOEPH 20 ns Read Recovery Time Before Write (#OE HIGH to #WE LOW) tGHWL 0 ns #CE Setup Time tCS 0 ns #CE Hold Time tCH 0 ns #WE Pulse Width tWP 25 ns #WE Pulse Width HIGH tWPH 20 ns Write Cycle Time Address Setup Time Note: 1. Not 100% tested. Figure 10-8 Back to Back Write Operation Publication Release Date: Jul 02, 2014 Revision C 75 W29GL256S Figure 10-9 Back to Back (#CE VIL) Write Operation Figure 10-10 Write to Read (tACC) Operation Publication Release Date: Jul 02, 2014 Revision C 76 W29GL256S Figure 10-11 Write to Read (tCE) Operation Figure 10-12 Read to Write (#CE VIL) Operation Publication Release Date: Jul 02, 2014 Revision C 77 W29GL256S Figure 10-13 Read to Write (#CE Toggle) Operation Table 10-6 Erase/Program Operations SYMBOL Description ALT STD EVIO = VCC=2.7~3.6V Min Write Buffer Program Operation (512-byte) Effective Write Buffer Program Operation per Typ Max Unit 0.5 Word2, 3 tWHWH15 Program Operation per Word Sector Erase Operation1 tWHWH2 Erase/Program Valid to RY/#BY Delay tBUSY Latency between Read and Write operations4 tSR_W 3 ms μs 1 10 200 μs 0.3 2 s 80 ns 30 ns Erase Suspend Latency tESL 40 μs Program Suspend Latency tPSL 40 μs RY/#BY Recovery Time tRB 0 μs Notes: 1. Not 100% tested. 2. For one 512bytes programmed. 3. Effective write buffer specification is based upon a 256-word write buffer operation 4. Upon the rising edge of #WE, must wait tSR_W before switching to another address. 5. See Internal Algorithm Characteristics table for specific values Publication Release Date: Jul 02, 2014 Revision C 78 W29GL256S Figure 10-14 Program Operation Note: PA = program address, PD = program data, DOUT is the true data at the program address. Figure 10-15 Chip/Sector Erase Operation Note: SA = sector address (for sector erase), VA = valid address for reading status data. Publication Release Date: Jul 02, 2014 Revision C 79 W29GL256S Figure 10-16 Data# Polling (During Internal Algorithms) Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle. Figure 10-17 Toggle Bit (During Internal Algorithms) Note: DQ6 will toggle at any read address while the device is busy. DQ2 will toggle if the address is within the actively erasing sector. Publication Release Date: Jul 02, 2014 Revision C 80 W29GL256S Figure 10-18 DQ2 vs. DQ6 Comparison Timing Note: The system may use #OE or #CE to toggle DQ2 and DQ6. DQ2 toggles only when read at an address within the erasesuspended sector. 10.3.4 Alternate #CE Controlled Write Operations Table 10-7 Alternate #CE Controlled Write Operations SYMBOL Description STD Min tWC 60 ns tAS 0 ns Address Setup Time to #OE LOW during toggle bit polling tASO 15 ns Address Hold Time tAH 45 ns tAHT 0 ns Data Setup Time tDS 30 ns Data Hold Time tDH 0 ns #CE HIGH during toggle bit polling tCEPH 20 ns #OE HIGH during toggle bit polling tOEPH 20 ns Read Recovery Time Before Write (#OE HIGH to #WE LOW) tGHEL 0 ns #WE Setup Time tWS 0 ns #WE Hold Time tWH 0 ns #CE Pulse Width tCP 25 ns #CE Pulse Width HIGH tCPH 20 ns Write Cycle ALT EVIO = VCC=2.7~3.6V Time1 Address Setup Time Address Hold Time From #CE or #OE HIGH during toggle bit polling Typ Max Unit Note: 1. Not 100% tested. Publication Release Date: Jul 02, 2014 Revision C 81 W29GL256S Figure 10-19 Back to Back (#CE) Write Operation Figure 10-20 (#CE) Write to Read Operation Publication Release Date: Jul 02, 2014 Revision C 82 W29GL256S 11 PACKAGE DIMENSIONS 11.1 TSOP 56-pin 14x20mm DFigure 11-1 TSOP 56-pin 14x20mm Package D1 0.10 C 1 56 PIN 1 IDENTIFIER b E e 29 28 BOTTOM EJECTOR PIN CAVITY # MARK A A2 R b WITH PLATING L1 A1 c c1 θ L 0.80 REF BASE METAL b1 Symbol A A1 A2 b b1 c c1 D D1 E L L1 e R θ Dimension in MM MIN NOM MAX 1.2 0.05 0.15 0.95 1.00 1.05 0.17 0.22 0.27 0.17 0.20 0.23 0.10 0.21 0.10 0.13 0.16 20.00 BSC 18.40 BSC 14.00 BSC 0.50 0.60 0.70 0.25 BSC 0.5 BSC 0.08 0.35 0° 8° Dimension Inch MIN NOM MAX 0.047 0.002 0.006 0.037 0.039 0.041 0.007 0.009 0.011 0.007 0.008 0.009 0.004 0.008 0.004 0.005 0.006 0.787 BSC 0.724 BSC 0.551 BSC 0.020 0.024 0.028 0.010 BSC 0.020 BSC 0.003 0.008 0° 8° Publication Release Date: Jul 02, 2014 Revision C 83 W29GL256S 11.2 Thin & Fine-Pitch Ball Grid Array, 56 ball, 7x9mm (TFBGA56) Figure 11-2 TFBGA-56, 7x9mm package Publication Release Date: Jul 02, 2014 Revision C 84 W29GL256S 11.3 Low-Profile Fine-Pitch Ball Grid Array, 64-ball 11x13mm (LFBA64) Figure 11-3 LFBGA 64-ball 11x13mm Package D1 D 0.07 C (2X) eD A H G F E D C B A E 8 7 6 5 4 3 2 1 eE SE E1 Øb PIN A1 CORNER B TOP VIEW SD 0.07 (2X) A A2 PIN A1 CORNER BOTTOM VIEW // 0.25 C A1 C 64X Ø b Ø 0.20 M C A B Ø 0.10 M C SYMBOL A A1 A2 D E D1 E1 n Øb eE eD SD/SE 0.15 C SIDE VIEW DIMENSION (MM) MIN NOM MAX 1.40 0.40 0.60 13.00 BSC 11.00 BSC 7.00 BSC 7.00 BSC 64 0.5 0.6 0.7 1.00 BSC 1.00 BSC 0.50 BSC NONE NOTE PROFILE BALL HEIGHT BODY THICKNESS BODY SIZE BODY SIZE MATRIX FOOTPRINT MATRIX FOOTPRINT BALL COUNT BALL DIAMETER BALL PITCH BALL PITCH SOLDER BALL PLACEMENT DEPOPULATED SOLDER BALLS Publication Release Date: Jul 02, 2014 Revision C 85 W29GL256S 12 ORDERING INFORMATION 12.1 Ordering Part Number Definitions Figure 12-1 Ordering Part Numbering W 29GL 256 S H 9 T Winbond Standard Product W: Winbond Product Family 29GL: 3V (VCC=2.7~3.6V) Density 256: 256Mb Product Version S: 58nm Sector Type H: EVIO=1.65V to VCC (2.7~3.6V), Uniform sector, highest address sector protected L: EVIO=1.65V to VCC (2.7~3.6V), Uniform sector, lowest address sector protected Access Time 9: Industrial 90ns Packages T: TSOP-56, Green (RoHS Compliant) B: LFBGA64, Green (RoHS Compliant) C:TFBGA56, Green (RoHS Compliant) Notes: 1. Winbond reserves the right to make changes to its products without prior notice. 2. Contact Winbond Sales for Secured Sector Lock Options. 3. For more details on Product Version’s Temperature Ranges, contact Winbond. Publication Release Date: Jul 02, 2014 Revision C 86 W29GL256S 12.2 Valid Part Numbers and Top Side Marking The following table provides the valid part numbers for the W29GL256S Parallel Flash Memory. Please contact Winbond for specific availability by density and package type. Winbond Parallel memories use a 12-digit Product Number for ordering. Table 12-1 Valid Part Numbers and Markings PACKAGE TYPE DENSITY PRODUCT NUMBER TOP SIDE MARKING TSOP-56 256Mb W29GL256SH9T W29GL256SH9T TSOP-56 256Mb W29GL256SL9T W29GL256SL9T TFBGA56 256Mb W29GL256SH9C W29GL256SH9C TFBGA56 256Mb W29GL256SL9C W29GL256SL9C LFBGA64 256Mb W29GL256SH9B W29GL256SH9B LFBGA64 256Mb W29GL256SL9B W29GL256SL9B Publication Release Date: Jul 02, 2014 Revision C 87 W29GL256S 13 HISTORY Table 13-1 Revision History VERSION DATE PAGE A 05-07-2013 - DESCRIPTION First Release B 02-21-2014 1. remove TASSB 2. VRST from 1V to 0.8V 3. remove NOP 4. NC Pin change name to RFU/DNU 5. Write performance modified to meet character data C 07-02-2014 Modify some TYPO Trademarks Winbond is a trademark of Winbond Electronics Corporation. All other marks are the property of their respective owner. Important Notice Winbond products are not designed, intended, authorized or warranted for use as components in systems or equipment intended for surgical implantation, atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, or for other applications intended to support or sustain life. Furthermore, Winbond products are not intended for applications wherein failure of Winbond products could result or lead to a situation where in personal injury, death or severe property or environmental damage could occur. Winbond customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Winbond for any damages resulting from such improper use or sales. Information in this document is provided solely in connection with Winbond products. Winbond reserves the right to make changes, corrections, modifications or improvements to this document and the products and services described herein at any time, without notice. Publication Release Date: Jul 02, 2014 Revision C 88