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IRFP440

IRFP440

  • 厂商:

    L3HARRIS

  • 封装:

    TO-247-3

  • 描述:

    MOSFET N-CH 500V 8.8A TO247-3

  • 数据手册
  • 价格&库存
IRFP440 数据手册
IRFP440 Data Sheet January 2002 8.8A, 500V, 0.850 Ohm, N-Channel Power MOSFET This N-Channel enhancement mode silicon gate power field effect transistor is an advanced power MOSFET designed, tested, and guaranteed to withstand a specified level of energy in the breakdown avalanche mode of operation. All of these power MOSFETs are designed for applications such as switching regulators, switching convertors, motor drivers, relay drivers, and drivers for high power bipolar switching transistors requiring high speed and low gate drive power. These types can be operated directly from integrated circuits. Formerly developmental type TA17425. Ordering Information PART NUMBER IRFP440 PACKAGE TO-247 Features • 8.8A, 500V • rDS(ON) = 0.850Ω • Single Pulse Avalanche Energy Rated • SOA is Power Dissipation Limited • Nanosecond Switching Speeds • Linear Transfer Characteristics • High Input Impedance • Related Literature - TB334 “Guidelines for Soldering Surface Mount Components to PC Boards” Symbol BRAND D IRFP440 NOTE: When ordering, include the entire part number. G S Packaging JEDEC STYLE TO-247 SOURCE DRAIN GATE DRAIN (FLANGE) ©2002 Fairchild Semiconductor Corporation IRFP440 Rev. B IRFP440 Absolute Maximum Ratings TC = 25oC, Unless Otherwise Specified Drain to Source Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VDS Drain to Gate Voltage (RGS = 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDGR Continuous Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ID TC = 100oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ID Pulsed Drain Current (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VGS Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .PD Linear Derating Factor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Single Pulse Avalanche Energy Rating (Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . EAS Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, TSTG Maximum Temperature for Soldering Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TL Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Tpkg IRFP440 500 500 8.8 5.6 35 ±20 150 1.2 480 -55 to 150 UNITS V V A A A V W W/oC mJ oC 300 260 oC oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 1. TJ = 25oC to 125oC. Electrical Specifications TC = 25oC, Unless Otherwise Specified PARAMETER SYMBOL Drain to Source Breakdown Voltage BVDSS Gate Threshold Voltage VGS(TH) Zero-Gate Voltage Drain Current IDSS MIN TYP MAX UNITS VGS = 0V, ID = 250µA (Figure 10) TEST CONDITIONS 500 - - V VGS = VDS, ID = 250µA 2.0 - 4.0 V - - 25 µA - - 250 µA 8.8 - - A VDS = Rated BVDSS, VGS = 0V VDS = 0.8 x Rated BVDSS, VGS = 0V, TJ = 125oC On-State Drain Current (Note 2) Gate to Source Leakage Drain to Source On Resistance (Note 2) Forward Transconductance (Note 2) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time ID(ON) IGSS rDS(ON) gfs td(ON) tr VDS > ID(ON) x rDS(ON)MAX, VGS = 10V VGS = ±20V - - ±100 nA VGS = 10V, ID = 4.9A (Figures 8, 9) - 0.800 0.850 Ω 5.3 8.2 - S - 17 21 ns - 23 35 ns - 42 74 ns VDS ≥ 50V, ID = 4.9A (Figure 12) VDD = 250V, ID ≈ 8A, RGS = 9.1Ω, RL = 30.1Ω MOSFET Switching Times are Essentially Independent of Operating Temperature td(OFF) tf Total Gate Charge (Gate to Source + Gate to Drain) Qg Gate to Source Charge Qgs Gate to Drain “Miller” Charge Qgd Input Capacitance CISS Output Capacitance Reverse-Transfer Capacitance VGS = 10V, ID = 8A, VDS = 0.8 x Rated BVDSS Ig(REF) = 1.5mA (Figure 14) Gate Charge is Essentially Independent of Operating Temperature - 18 30 ns - 42 63 nC - 7 - nC - 22 - nC - 1225 - pF COSS - 200 - pF CRSS - 85 - pF - 5.0 - nH - 12.5 - nH - - 0.83 oC/W - - 30 oC/W VGS = 0V, VDS = 25V, f = 1.0MHz (Figure 11) Internal Drain Inductance LD Measured from the drain Lead, 6mm (0.25in) from the Package to the Center of the Die Internal Source Inductance LS Measured from the Source Lead, 6mm (0.25in) from Header to the Source Bonding Pad Modified MOSFET Symbol Showing the Internal Devices Inductances D LD G LS S Junction to Case RθJC Junction to Ambient RθJA ©2002 Fairchild Semiconductor Corporation Free Air Operation IRFP440 Rev. B IRFP440 Source to Drain Diode Specifications PARAMETER SYMBOL Continuous Source to Drain Current ISD Pulse Source to Drain Current (Note 3) ISDM TEST CONDITIONS Modified MOSFET Symbol Showing the Integral Reverse P-N Junction Diode MIN TYP MAX UNITS - - 8.8 A - - 35 A - - 1.8 V 210 460 970 ns 2 4.2 8.9 µC D G S Source to Drain Diode Voltage (Note 2) VSD Reverse Recovery Time trr Reverse Recovered Charge QRR TJ = 25oC, ISD = 8.8A, VGS = 0V (Figure 13) TJ = 25oC, ISD = 8.0A, dISD/dt = 100A/µs TJ = 25oC, ISD = 8.0A, dISD/dt = 100A/µs NOTES: 2. Pulse test: pulse width ≤ 300µs, duty cycle ≤ 2%. 3. Repetitive rating: pulse width limited by Max junction temperature. See Transient Thermal Impedance curve (Figure 3). 4. VDD = 50V, starting TJ = 25oC, L = 11mH, RG = 50Ω, peak IAS = 8.8A. Typical Performance Curves Unless Otherwise Specified 10 1.0 ID, DRAIN CURRENT (A) POWER DISSIPATION MULTIPLIER 1.2 0.8 0.6 0.4 8 6 4 2 0.2 0 0 0 50 100 25 150 50 TC , CASE TEMPERATURE (oC) 75 100 150 125 TC , CASE TEMPERATURE (oC) FIGURE 1. NORMALIZED POWER DISSIPATION vs CASE TEMPERATURE FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs CASE TEMPERATURE ZθJC, THERMAL IMPEDANCE 1 0.5 0.2 0.1 0.1 PDM 0.05 0.02 0.01 10-2 10-3 10-5 t1 t2 t2 SINGLE PULSE NOTES: DUTY FACTOR: D = t1/t2 PEAK TJ = PDM x ZθJC + TC 10-4 10-3 10-2 0.1 1 10 t1 , RECTANGULAR PULSE DURATION (s) FIGURE 3. MAXIMUM TRANSIENT THERMAL IMPEDANCE ©2002 Fairchild Semiconductor Corporation IRFP440 Rev. B IRFP440 Typical Performance Curves Unless Otherwise Specified (Continued) 15 102 100µs 1ms 1 10ms TC = 25oC TJ = MAX RATED SINGLE PULSE 0.1 12 VGS = 6.0V 9 VGS = 5.5V 6 VGS = 5.0V 3 DC 0 103 0 50 100 150 200 VDS , DRAIN TO SOURCE VOLTAGE (V) FIGURE 4. FORWARD BIAS SAFE OPERATING AREA PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 102 VGS = 10V 12 VGS = 6.0V 9 VGS = 5.5V 6 VGS = 5.0V 3 VGS = 4.0V 0 0 VGS = 4.5V 3 6 9 12 VDS , DRAIN TO SOURCE VOLTAGE (V) 15 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX VDS ≥ 50V 10 1 0.1 10-2 0 NORMALIZED DRAIN TO SOURCE ON RESISTANCE VOLTAGE 8 ON RESISTANCE rDS(ON), DRAIN TO SOURCE 3.0 5 VGS = 10V 2 VGS = 20V 0 0 8 16 24 ID , DRAIN CURRENT (A) 32 FIGURE 8. DRAIN TO SOURCE ON RESISTANCE vs GATE VOLTAGE AND DRAIN CURRENT ©2002 Fairchild Semiconductor Corporation 2 4 6 8 VGS , GATE TO SOURCE VOLTAGE (V) 10 FIGURE 7. TRANSFER CHARACTERISTICS PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 4 TJ = 25oC TJ = 150oC FIGURE 6. SATURATION CHARACTERISTICS 10 250 FIGURE 5. OUTPUT CHARACTERISTICS ID(ON), ON STATE DRAIN CURRENT (A) ID, DRAIN CURRENT (A) 15 VGS = 4.5V VGS = 4.0V 102 10 VDS , DRAIN TO SOURCE VOLTAGE (V) 1 ID, DRAIN CURRENT (A) ID, DRAIN CURRENT (A) 10µs 10 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX VGS = 10V OPERATION IN THIS REGION IS LIMITED BY rDS(ON) 40 2.4 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX ID = 4.9A, VGS = 10V 1.8 1.2 0.6 0 -60 -40 -20 0 20 40 60 80 100 120 140 160 TJ , JUNCTION TEMPERATURE (oC) FIGURE 9. NORMALIZED DRAIN TO SOURCE ON RESISTANCE vs JUNCTION TEMPERATURE IRFP440 Rev. B IRFP440 Typical Performance Curves 3000 ID = 250µA 1.15 1.05 0.95 1800 CISS 1200 COSS 0.85 0.75 -60 VGS = 0V, f = 1MHz CISS = CGS + CGD CRSS = CGD COSS ≈ CDS + CGS 2400 C, CAPACITANCE (pF) NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE 1.25 Unless Otherwise Specified (Continued) 600 -40 -20 0 20 40 60 80 0 100 120 140 160 CRSS 1 ISD, SOURCE TO DRAIN CURRENT (A) gfs, TRANSCONDUCTANCE (S) 12 TJ = 25oC TJ = 150oC 6 3 0 20 50 100 FIGURE 11. CAPACITANCE vs DRAIN TO SOURCE VOLTAGE PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX VDS ≥ 50V 9 10 VDS , DRAIN TO SOURCE VOLTAGE (V) FIGURE 10. NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE vs JUNCTION TEMPERATURE 15 5 2 TJ , JUNCTION TEMPERATURE (oC) 102 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX 10 TJ = 150oC 1 TJ = 25oC 0.1 0 3 6 9 ID , DRAIN CURRENT (A) 12 15 0 FIGURE 12. TRANSCONDUCTANCE vs DRAIN CURRENT 0.3 0.6 0.9 1.2 VSD , SOURCE TO DRAIN VOLTAGE (V) 1.5 FIGURE 13. SOURCE TO DRAIN DIODE VOLTAGE VGS, GATE TO SOURCE VOLTAGE (V) 20 ID = 8A 16 VDS = 100V 12 VDS = 250V VDS = 400V 8 4 0 0 12 24 36 48 60 Qg , GATE CHARGE (nC) FIGURE 14. GATE TO SOURCE VOLTAGE vs GATE CHARGE ©2002 Fairchild Semiconductor Corporation IRFP440 Rev. B IRFP440 Test Circuits and Waveforms VDS BVDSS L tP VARY tP TO OBTAIN IAS + RG REQUIRED PEAK IAS - VGS VDS VDD VDD DUT tP 0V IAS 0 0.01Ω tAV FIGURE 15. UNCLAMPED ENERGY TEST CIRCUIT FIGURE 16. UNCLAMPED ENERGY WAVEFORMS tON tOFF td(ON) td(OFF) tf tr RL VDS 90% 90% + RG - VDD 10% 10% 0 DUT 90% VGS VGS 0 FIGURE 18. RESISTIVE SWITCHING WAVEFORMS VDS (ISOLATED SUPPLY) CURRENT REGULATOR 0.2µF 50% PULSE WIDTH 10% FIGURE 17. SWITCHING TIME TEST CIRCUIT 12V BATTERY 50% VDD Qg(TOT) SAME TYPE AS DUT 50kΩ Qgd 0.3µF VGS Qgs D VDS DUT G 0 IG(REF) S 0 IG CURRENT SAMPLING RESISTOR VDS ID CURRENT SAMPLING RESISTOR FIGURE 19. GATE CHARGE TEST CIRCUIT ©2002 Fairchild Semiconductor Corporation IG(REF) 0 FIGURE 20. GATE CHARGE WAVEFORMS IRFP440 Rev. B TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx™ Bottomless™ CoolFET™ CROSSVOLT™ DenseTrench™ DOME™ EcoSPARK™ E2CMOSTM EnSignaTM FACT™ FACT Quiet Series™ FAST  FASTr™ FRFET™ GlobalOptoisolator™ GTO™ HiSeC™ ISOPLANAR™ LittleFET™ MicroFET™ MicroPak™ MICROWIRE™ OPTOLOGIC™ OPTOPLANAR™ PACMAN™ POP™ Power247™ PowerTrench  QFET™ QS™ QT Optoelectronics™ Quiet Series™ SILENT SWITCHER  SMART START™ STAR*POWER™ Stealth™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic™ TruTranslation™ UHC™ UltraFET  VCX™ STAR*POWER is used under license DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or 2. A critical component is any component of a life systems which, (a) are intended for surgical implant into support device or system whose failure to perform can the body, or (b) support or sustain life, or (c) whose be reasonably expected to cause the failure of the life failure to perform when properly used in accordance support device or system, or to affect its safety or with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only. Rev. H4
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