URG2012L-682-L-T05

Metal thin film chip resistors (the highest reliability and precision) ■URG series AEC-Q200 Compliant Features ・ The tightest resistance tolerance: +/-0.01% ・ The smallest temperature coefficient of resistance: ±1ppm/℃ URG series Thin film surface mount resistors ・ Long term stability with inorganic passivation ・ Thin film structure enabling low noise and anti-sulfur Applications ・ Industrial measurement, electrical scales ・ High precision sensors, medical electronics ◆Part numbering system URG 2012 L - 102 - L - T1 Packaging quantity: T1(1,000pcs), T05(500pcs), T01(100pcs) Series code Size: URG1608, URG2012, URG3216, URG5025, URG6432 Resistance tolerance Nominal resistance value (E-24: 3 digit, E-96: 4 digit, URG3216, URG5025, URG6432: all 4 digit) Temperature coefficient of resistance ◆Electrical Specification Type Power ratings Temperature coefficient of resistance Resistance range(Ω) Resistance tolerance ±0.01% (L) ±0.02% (P) ±0.05% (W) ±0.1% (B) Maximum voltage Resistance value series Operating temperature Packaging quantity ±0.5% (D) *1 ±1（K） URG1608 1/16W ±2（L） *2 250 ≦R ≦7.5K 100≦R≦7.5k 100V 250 ≦R ≦36K 100≦R≦36k 150V ±1（K）*1 URG2012 1/10W T1 ±２ （L） *2 -55℃ ~ *1 ±1（K） URG3216 1/4W ±２ （L） *2 250 ≦R ≦68K 100≦R≦68k 200V E24, E96 1/2W URG6432 3/4W ±２ （L） *2 250 ≦R ≦100K 100≦R≦150k 300V 250 ≦R ≦100K 100≦R≦200k 300V *1 ±1（K） ±２ （L） *2 *1: Applicable TCR K (±1.0) at temperature range 25℃∼ 65℃ Applicable TCR K (±1.5) at temperature range -20℃∼ 25℃, 65℃~125℃ *2: Applicable TCR L at temperature range -20℃∼ 125℃ *Contact us for requirements not listed in above table. 11 T05 T01 *1 ±1（K） URG5025 155℃ ◆Dimensions L a Size Type a W (inch) L W a b t 0603 1.60±0.20 0.80＋0.25/−0.20 0.30±0.20 0.30±0.20 0.40＋0.15/−0.10 URG2012 0805 2.00±0.20 1.25＋0.25/−0.20 0.40±0.20 0.40±0.20 0.40＋0.15/−0.10 URG3216 1206 3.20±0.20 1.60±0.25 0.50±0.25 0.50±0.20 0.40＋0.15/−0.10 URG5025 2010 5.00±0.20 2.50±0.25 0.60±0.25 0.60±0.25 0.45±0.10 URG6432 2512 6.40＋0.20/−0.40 3.20±0.25 0.75±0.25 0.80±0.20 0.45±0.20 t b ◆Reliability specification Standard Test items Condition (test methods (MIL-PRF-55342/JIS C5201-1) Short time overload 2.5 x rated voltage, 5seconds Life (biased) 70℃, rated voltage, 90min on 30min off, 2000hours High temperature high humidity 85℃, 85%RH, 1/10 of rated power, 90min on 30min off, 1000hours ±0.05％+0.01Ω Temperature shock -65℃ (15min) ∼ 150℃ (15min) 100cycles ±0.02％+0.01Ω High temperature exposure 155℃, no bias, 1000hours ±0.05％+0.01Ω Resistance to soldering heat 235±5℃, 30 seconds (reflow), (by MIL-PRF-55342) ±0.0１％+0.01Ω *1 *1 ±0.02％+0.01Ω ±0.02％+0.01Ω(R≧250Ω) ±0.05％+0.01Ω(R＜250Ω) *1 Rated voltage is given by E= RxP E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W) If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage. 12 URG series （unit：mm） Thin film surface mount resistors URG1608 Metal thin film chip resistors (the highest reliability and precision) ■URG series ◆Reliability test data ○Biased life test 1000 800 URG2012 600 LL70℃_0.25W, n = 20 400 200 0 -200 -400 -600 250Ω 1kΩ -800 20kΩ 32kΩ URG series -1000 10kΩ Resistance drift (ppm) Resistance drift (ppm) Thin film surface mount resistors 1000 800 URG3216 600 LL70℃_0.25W, n = 20 400 200 0 -200 -400 -600 10           100           1000         10000 Test duration(h) 250Ω -800 -1000 1kΩ 68kΩ 110           100           1000         10000 Test duration(h) ○High temperature high humidity (biased) 500 400 URG2012 300 THB 85 ℃, 85 %, n = 20 200 100 0 -100 -200 -300 250Ω 1kΩ -400 20kΩ 32kΩ -500 10kΩ Resistance drift (ppm) Resistance drift (ppm) 500 400 URG3216 300 THB 85 ℃, 85 %, n = 20 200 100 0 -100 -200 -300 -500 10           100           1000         10000 Test duration(h) 250Ω -400 1kΩ 68kΩ 10           100           1000         10000 Test duration(h) ○Temperature shock 150 100 200 URG2012, n = 10 Thermal Shock_-65℃ to +150℃ 50 0 -50 -100 -150 -200 250Ω 1kΩ 68kΩ Resistance drift (ppm) Resistance drift (ppm) 200 150 100 Thermal Shock_ -65℃ to +150℃ 50 0 -50 -100 -150 -200 10           10            100          1000 Number of cycles URG3216, n = 10 250Ω 1kΩ 68kΩ 10           10            100          1000 Number of cycles ○High temperature exposure URG2012, n = 20 300 High Temperature Exposure,155℃ 200 100 0 -100 -200 -300 -400 -500 13 500 400 250Ω 1kΩ 32kΩ 10           100           1000         10000 Test duration(h) Resistance drift (ppm) Resistance drift (ppm) 500 400 URG3216, n = 20 300 High Temperature Exposure,155℃ 200 100 0 -100 -200 -300 -400 -500 250Ω 1kΩ 68kΩ 10           100           1000         10000 Test duration(h) ◆Temperature coefficient of Resistance ○URG2012 1000 800 URG2012-1kΩ No.1 No.2 No.3 No.4 No.5 No.6 No.7 No.8 No.9 No.10 400 200 0 -200 -400 -600 ±2ppm / ℃ ±5ppm / ℃ -800 Resistance drift (ppm) 600 1000 Variation of resistance with temperature 600 Variation of resistance with temperature URG2012-32kΩ 200 0 -200 -400 -600 ±2ppm / ℃ ±5ppm / ℃ -800 -1000 No.1 No.2 No.3 No.4 No.5 No.6 No.7 No.8 No.9 No.10 400 -1000 -75  -50  -25   0  25  50  75  100 125 Ambient temperature (℃) 150  175 -75  -50  -25   0  25  50  75  100 125 Ambient temperature (℃) 150  175 1000 600 1000 Variation of resistance with temperature 800 URG3216-1kΩ No.1 No.2 No.3 No.4 No.5 No.6 No.7 No.8 No.9 No.10 400 200 0 -200 -400 -600 ±2ppm / ℃ ±5ppm / ℃ -800 Resistance drift (ppm) Resistance drift (ppm) 800 URG series ○URG3216 600 Variation of resistance with temperature URG3216-68kΩ 200 0 -200 -400 ±2ppm / ℃ ±5ppm / ℃ -800 -1000 No.1 No.2 No.3 No.4 No.5 No.6 No.7 No.8 No.9 No.10 400 -600 -1000 -75  -50  -25   0  25  50  75  100 125 Ambient temperature (℃) 150  175 -75  -50  -25   0  25  50  75  100 125 Ambient temperature (℃) 150  175 Ratio to rated power (％) ◆Derating Curve 100 50 0 -55     Thin film surface mount resistors Resistance drift (ppm) 800 0     50 70  100     155 Ambient temperature (℃) 14