AP3P3R0MT
Halogen-Free Product
Advanced Power
Electronics Corp.
P-CHANNEL ENHANCEMENT MODE
POWER MOSFET
▼ 100% Rg & UIS Test
▼ Simple Drive Requirement
D
▼ Ultra Low On-resistance
BVDSS
RDS(ON)
ID4
-30V
3mΩ
-125A
G
▼ RoHS Compliant & Halogen-Free
S
D
Description
D
AP3P3R0 series are from Advanced Power innovated design and silicon
process technology to achieve the lowest possible on-resistance and
fast switching performance. It provides the designer with an extreme
efficient device for use in a wide range of power applications.
®
The PMPAK 5x6 package is special for voltage conversion application
using standard infrared reflow technique with the backside heat sink to
achieve the good thermal performance.
D
D
S
S
S
G
®
PMPAK 5x6
o
Absolute Maximum Ratings@Tj=25 C(unless otherwise specified)
VDS
Drain-Source Voltage
VGS
Gate-Source Voltage
ID@TC=25℃
ID@TC=25℃
ID@TA=25℃
ID@TA=70℃
.
Parameter
Symbol
Drain Current (Chip), VGS @ 10V
4
4
Drain Current, VGS @ 10V (Package Limited)
3
Drain Current , VGS @ 10V
3
Drain Current , VGS @ 10V
1
IDM
Pulsed Drain Current
PD@TC=25℃
Total Power Dissipation
PD@TA=25℃
Total Power Dissipation
5
Rating
Units
-30
V
+20
V
-125
A
-60
A
-33.5
A
-26.8
A
-200
A
69.4
W
5
W
45
mJ
EAS
Single Pulse Avalanche Energy
TSTG
Storage Temperature Range
-55 to 150
℃
TJ
Operating Junction Temperature Range
-55 to 150
℃
Thermal Data
Symbol
Parameter
Rthj-c
Maximum Thermal Resistance, Junction-case
Rthj-a
Maximum Thermal Resistance, Junction-ambient
Data and specifications subject to change without notice
3
Value
Unit
1.8
℃/W
25
℃/W
1
201602251
AP3P3R0MT
Electrical Characteristics@Tj=25oC(unless otherwise specified)
Symbol
BVDSS
RDS(ON)
Parameter
Test Conditions
Drain-Source Breakdown Voltage
Static Drain-Source On-Resistance
2
Min.
Typ.
Max. Units
VGS=0V, ID=-250uA
-30
-
-
V
VGS=-10V, ID=-20A
-
-
3
mΩ
VGS=-4.5V, ID=-10A
-
-
4.5
mΩ
VGS(th)
Gate Threshold Voltage
VDS=VGS, ID=-250uA
-1
-
-3
V
gfs
Forward Transconductance
VDS=-5V, ID=-20A
-
67
-
S
IDSS
Drain-Source Leakage Current
VDS=-24V, VGS=0V
-
-
-10
uA
IGSS
Gate-Source Leakage
VGS=+20V, VDS=0V
-
-
+100
nA
Qg
Total Gate Charge
ID=-20A
-
76
122
nC
Qgs
Gate-Source Charge
VDS=-15V
-
24
-
nC
Qgd
Gate-Drain ("Miller") Charge
VGS=-4.5V
-
26
-
nC
td(on)
Turn-on Delay Time
VDS=-15V
-
19
-
ns
tr
Rise Time
ID=-1A
-
12
-
ns
td(off)
Turn-off Delay Time
RG=3.3Ω
-
160
-
ns
tf
Fall Time
VGS=-10V
-
74
-
ns
Ciss
Input Capacitance
VGS=0V
-
9400 15040
pF
Coss
Output Capacitance
VDS=-15V
Crss
Rg
-
1230
-
pF
Reverse Transfer Capacitance
.
f=1.0MHz
-
680
-
pF
Gate Resistance
f=1.0MHz
-
3
6
Ω
Min.
Typ.
IS=-20A, VGS=0V
-
-
-1.2
V
Source-Drain Diode
Symbol
Parameter
2
Test Conditions
Max. Units
VSD
Forward On Voltage
trr
Reverse Recovery Time
IS=-20A, VGS=0V,
-
36
-
ns
Qrr
Reverse Recovery Charge
dI/dt=100A/µs
-
30
-
nC
Notes:
1.Pulse width limited by Max. junction temperature.
2.Pulse test
2
3.Surface mounted on 1 in copper pad of FR4 board, t
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