ACE2305
Technology
Description
The ACE2305 is the P-Channel logic enhancement mode power field effect transistors are produced using high cell density, DMOS trench technology. This high density process is especially tailored to minimize on-state resistance. These devices are particularly suited for low voltage application such as cellular phone and notebook computer power management and Battery powered circuits, and low in-line power loss are needed in a very small outline surface mount package.
P-Channel Enhancement Mode MOSFET
Features
• • • • • • • • • • • • •
-15V/-3.5A, RDS(ON)=70mΩ@VGS=-4.5V -15V/-3.0A, RDS(ON)=85mΩ@VGS=-2.5V -15V/-2.0A, RDS(ON)=105mΩ@VGS=-1.8V Super high density cell design for extremely low RDS(ON) Exceptional on-resistance and maximum DC current capability SOT-23-3L package design
Application
Power Management in Note book Portable Equipment Battery Powered System DC/DC Converter Load Switch DSC LCD Display inverter
Absolute Maximum Ratings
(TA=25℃ Unless otherwise noted)
Parameter Drain-Source Voltage Gate-Source Voltage Continuous Drain Current (TJ=150℃) Pulsed Drain Current Continuous Source Current (Diode Conduction) Power Dissipation TA=25℃ TA=70℃ TA=25℃ TA=70℃
Symbol Typical Unit VDSS VGSS ID IDM IS PD TJ TSTG RθJA -15 ±12 -3.5 -2.8 -10 -1.6 1.25 0.8 150 120 V V A A A W ℃ ℃/W
Operating Junction Temperature Storage Temperature Range Thermal Resistance-Junction to Ambient
-55/150 ℃
VER 1.2
1
ACE2305
Technology
Packaging Type
SOT-23-3
3
P-Channel Enhancement Mode MOSFET
Pin 1 2 3
1 2
Description Gate Source Drain
Ordering information
Selection Guide ACE2305 XX + Pb - free BM: SOT-23-3
VER 1.2
2
ACE2305
Technology
Electrical Characteristics
(TA=25℃, Unless otherwise noted)
P-Channel Enhancement Mode MOSFET
Parameter Static Drain-Source Breakdown Voltage Gate Threshold Voltage Gate Leakage Current Zero Gate Voltage Drain Current On-State Drain Current Drain-Source On-Resistance Forward Transconductance Diode Forward Voltage Dynamic Total Gate Charge Gate-Source Charge Gate-Drain Charge Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Time Turn-Off Time
Symbol V(BR)DSS VGS(th) IGSS IDSS ID(ON) RDS(ON) Gfs VSD Qg Qgs Qgd Ciss Coss Crss td(on) tr td(off) tf
Conditions
Min.
Typ
Max.
Unit V nA uA A Ω S V
VGS=0V, ID=-250uA -15 VDS=VGS, ID=-250uA -0.35 -0.85 VDS=0.V, VGS=±10V ±100 VDS=-12V, VGS=0V -1 -10 VDS=-12V, VGS=0V TJ=55℃ VDS≦-5V, VGS=-4.5V -4 -2 VDS≦-5V, VGS=-2.5V VGS=-4.5V, ID=-3.5A 0.055 0.70 VGS=-2.5V, ID=-3.0A 0.065 0.85 VGS=-1.8V, ID=-2.0A 0.085 0.105 VDS=-5.0V, ID=-3.5A 8.5 IS=-1.5A, VGS=0V -0.8 -1.2 VDS=-6V, VGS=-4.5V, ID≣-2.8A VDS=-6V, VGS=0V, f=1MHz VDD=-6V, RL=6Ω ID≡-1.0A, VGEN=-4.5V RG=6Ω 4.8 1.0 1.0 485 85 40 10 13 18 15 8
nC
pF 16 23 25 20
ns
VER 1.2
3
ACE2305
Technology
Typical Characteristics
Output Characteristics Transfer Characteristics
P-Channel Enhancement Mode MOSFET
VDS – Drain to Source Voltage (V)
VGS – Gate to Source Voltage (V) Capacitance
On-Resistance vs. Drain Current
ID – Drain Current (A)
VDS – Drain to Source Voltage (V)
VER 1.2
4
ACE2305
Technology
Typical Characteristics
Gate Charge On-Resistance vs. Junction Temperature
P-Channel Enhancement Mode MOSFET
Oq Total Gate Charge (nC) Source-Drain Diode Forward Voltage
TJ – Junction Temperature (℃) On-Resistance vs. Gate-to-Source Voltage
VSD Source to Drain Voltage (V)
VGS – Gate to Source Voltage (V)
VER 1.2
5
ACE2305
Technology
Typical Characteristics
Threshold Voltage Single Pulse Power
P-Channel Enhancement Mode MOSFET
TJ – Temperature
Time(sec)
Normalized Thermal Transient Impedance, Junction-to-Ambient
Square Wave Pulse Duration(sec)
VER 1.2
6
ACE2305
Technology
Packing Information
P-Channel Enhancement Mode MOSFET
VER 1.2
7
ACE2305
Technology P-Channel Enhancement Mode MOSFET
Notes ACE does not assume any responsibility for use as critical components in life support devices or systems without the express written approval of the president and general counsel of ACE Electronics Co., LTD. As sued herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and shoes failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
ACE Technology Co., LTD. http://www.ace-ele.com/
VER 1.2
8
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