APT15GP60B
APT15GP60S
600V
POWER MOS 7 IGBT
®
The POWER MOS 7® IGBT is a new generation of high voltage power IGBTs.
Using Punch Through Technology this IGBT is ideal for many high frequency,
high voltage switching applications and has been optimized for high frequency
switchmode power supplies.
• Low Conduction Loss
• 100 kHz operation @ 400V, 19A
• Low Gate Charge
• 200 kHz operation @ 400V, 12A
• Ultrafast Tail Current shutoff
• SSOA rated
C
G
E
MAXIMUM RATINGS
Symbol
All Ratings: TC = 25°C unless otherwise specified.
Parameter
APT15GP60B_S
VCES
Collector-Emitter Voltage
600
VGE
Gate-Emitter Voltage
±20
Gate-Emitter Voltage Transient
±30
VGEM
I C1
Continuous Collector Current @ TC = 25°C
56
I C2
Continuous Collector Current @ TC = 110°C
27
I CM
Pulsed Collector Current
SSOA
PD
TJ,TSTG
TL
1
UNIT
Volts
Amps
65
@ TC = 25°C
65A @ 600V
Switching Safe Operating Area @ TJ = 150°C
250
Total Power Dissipation
Watts
-55 to 150
Operating and Storage Junction Temperature Range
°C
300
Max. Lead Temp. for Soldering: 0.063" from Case for 10 Sec.
STATIC ELECTRICAL CHARACTERISTICS
BVCES
Collector-Emitter Breakdown Voltage (VGE = 0V, I C = 250µA)
600
VGE(TH)
Gate Threshold Voltage
VCE(ON)
I CES
I GES
TYP
MAX
4.5
6
Collector-Emitter On Voltage (VGE = 15V, I C = 15A, Tj = 25°C)
2.2
2.7
Collector-Emitter On Voltage (VGE = 15V, I C = 15A, Tj = 125°C)
2.1
3
(VCE = VGE, I C = 1mA, Tj = 25°C)
Collector Cut-off Current (VCE = 600V, VGE = 0V, Tj = 25°C)
2
Collector Cut-off Current (VCE = 600V, VGE = 0V, Tj = 125°C)
250
2
Gate-Emitter Leakage Current (VGE = ±20V)
Volts
µA
2500
±100
CAUTION: These Devices are Sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.
APT Website - http://www.advancedpower.com
UNIT
nA
5-2006
MIN
Rev C
Characteristic / Test Conditions
050-7413
Symbol
1
APT15GP60B_S
DYNAMIC CHARACTERISTICS
Symbol
Characteristic
Test Conditions
1685
VGE = 0V, VCE = 25V
210
Reverse Transfer Capacitance
f = 1 MHz
15
Gate-to-Emitter Plateau Voltage
Gate Charge
VGE = 15V
7.5
VCE = 300V
12
15
Input Capacitance
Coes
Output Capacitance
Cres
VGEP
Qge
TYP
Capacitance
Cies
Qg
MIN
Total Gate Charge
3
Gate-Emitter Charge
Qgc
Gate-Collector ("Miller ") Charge
I C = 15A
SSOA
Switching Safe Operating Area
TJ = 150°C, R G = 5Ω, VGE =
MAX
UNIT
pF
V
55
nC
65
A
15V, L = 100µH,VCE = 600V
td(on)
tr
td(off)
tf
Turn-on Delay Time
Current Rise Time
I C = 15A
Turn-on Switching Energy (Diode)
Eoff
Turn-off Switching Energy
td(on)
Turn-on Delay Time
Eon1
Eon2
Eoff
8
12
VGE = 15V
69
I C = 15A
Current Fall Time
55
ns
88
R G = 5Ω
44
Turn-on Switching Energy (Diode)
µJ
121
Inductive Switching (125°C)
VCC = 400V
Turn-off Delay Time
Turn-off Switching Energy
152
6
Current Rise Time
Turn-on Switching Energy
130
TJ = +25°C
5
ns
58
R G = 5Ω
4
Eon2
tf
29
Current Fall Time
Turn-on Switching Energy
td(off)
12
VGE = 15V
Turn-off Delay Time
Eon1
tr
8
Inductive Switching (25°C)
VCC = 400V
130
TJ = +125°C
267
66
µJ
268
THERMAL AND MECHANICAL CHARACTERISTICS
Symbol
Characteristic
MIN
TYP
MAX
RΘJC
Junction to Case (IGBT)
.50
RΘJC
Junction to Case (DIODE)
N/A
Package Weight
5.90
WT
UNIT
°C/W
gm
1 Repetitive Rating: Pulse width limited by maximum junction temperature.
2 For Combi devices, Ices includes both IGBT and FRED leakages
3 See MIL-STD-750 Method 3471.
4 Eon1 is the clamped inductive turn-on-energy of the IGBT only, without the effect of a commutating diode reverse recovery current
adding to the IGBT turn-on loss. (See Figure 24.)
5 Eon2 is the clamped inductive turn-on energy that includes a commutating diode reverse recovery current in the IGBT turn-on switching
loss. A Combi device is used for the clamping diode as shown in the Eon2 test circuit. (See Figures 21, 22.)
6 Eoff is the clamped inductive turn-off energy measured in accordance with JEDEC standard JESD24-1. (See Figures 21, 23.)
050-7413
Rev C
5-2006
Microsemi reserves the right to change, without notice, the specifications and information contained herein.
TYPICAL PERFORMANCE CURVES
TC=25°C
10
0
TC=-55°C
TC=125°C
5
FIGURE 1, Output Characteristics(VGE = 15V)
100
40
TJ = 25°C
20
TJ = 125°C
3.5
TJ = 25°C.
250µs PULSE TEST
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