APT25GP120B
1200V
®
POWER MOS 7 IGBT
A new generation of high voltage power IGBTs. Using punch-through
technology and a proprietary metal gate, this IGBT has been optimized for
very fast switching, making it ideal for high frequency, high voltage switchmode power supplies and tail current sensitive applications. In many cases,
the POWER MOS 7® IGBT provides a lower cost alternative to a Power
MOSFET.
• Low Conduction Loss
• 100 kHz operation @ 800V,11A
• Low Gate Charge
• 50 kHz operation @ 800V, 19A
• Ultrafast Tail Current shutoff
• RBSOA Rated
MAXIMUM RATINGS
Symbol
TO-247
G
C
E
C
G
E
All Ratings: TC = 25°C unless otherwise specified.
Parameter
APT25GP120B
VCES
Collector-Emitter Voltage
1200
VGE
Gate-Emitter Voltage
±20
Gate-Emitter Voltage Transient
±30
VGEM
I C1
Continuous Collector Current @ TC = 25°C
69
I C2
Continuous Collector Current @ TC = 110°C
33
I CM
Pulsed Collector Current
RBSOA
PD
TJ,TSTG
TL
1
UNIT
Volts
Amps
90
@ TC = 25°C
90A @ 960V
Reverse Bias Safe Operating Area @ TJ = 150°C
Watts
417
Total Power Dissipation
-55 to 150
Operating and Storage Junction Temperature Range
Max. Lead Temp. for Soldering: 0.063" from Case for 10 Sec.
°C
300
STATIC ELECTRICAL CHARACTERISTICS
BVCES
Collector-Emitter Breakdown Voltage (VGE = 0V, I C = 250µA)
1200
VGE(TH)
Gate Threshold Voltage
VCE(ON)
I CES
I GES
TYP
MAX
4.5
6
Collector-Emitter On Voltage (VGE = 15V, I C = 25A, Tj = 25°C)
3.3
3.9
Collector-Emitter On Voltage (VGE = 15V, I C = 25A, Tj = 125°C)
3.0
3
(VCE = VGE, I C = 1mA, Tj = 25°C)
Collector Cut-off Current (VCE = 1200V, VGE = 0V, Tj = 25°C)
2
Collector Cut-off Current (VCE = 1200V, VGE = 0V, Tj = 125°C)
250
2
Gate-Emitter Leakage Current (VGE = ±20V)
Volts
µA
2500
±100
CAUTION: These Devices are Sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.
APT Website - http://www.advancedpower.com
UNIT
nA
4-2003
MIN
Rev B
Characteristic / Test Conditions
050-7411
Symbol
APT25GP120B
DYNAMIC CHARACTERISTICS
Symbol
Characteristic
Test Conditions
MIN
TYP
Cies
IInput Capacitance
Capacitance
2090
Coes
Output Capacitance
VGE = 0V, VCE = 25V
200
Cres
Reverse Transfer Capacitance
f = 1 MHz
40
VGEP
Gate-to-Emitter Plateau Voltage
Gate Charge
VGE = 15V
7.5
110
VCE = 600V
15
I C = 25A
50
Qg
Qge
Qgc
RBSOA
Total Gate Charge
3
Gate-Emitter Charge
Gate-Collector ("Miller ") Charge
Reverse Bias Safe Operating Area
TJ = 150°C, R G = 5Ω, VGE =
MAX
UNIT
pF
V
nC
90
A
15V, L = 100µH,VCE = 960V
td(on)
tr
td(off)
tf
Turn-on Delay Time
Current Rise Time
Turn-on Switching Energy (Diode)
Eoff
Turn-off Switching Energy
td(on)
Turn-on Delay Time
Eon1
Eon2
Eoff
70
I C = 25A
39
µJ
438
Inductive Switching (125°C)
VCLAMP(Peak) = 600V
12
VGE = 15V
109
I C = 25A
88
Turn-off Delay Time
Current Fall Time
Turn-off Switching Energy
1092
6
14
R G = 5Ω
4
Turn-on Switching Energy (Diode)
ns
500
TJ = +25°C
5
Current Rise Time
Turn-on Switching Energy
14
R G = 5Ω
4
Eon2
tf
VGE = 15V
Current Fall Time
Turn-on Switching Energy
td(off)
12
Turn-off Delay Time
Eon1
tr
Inductive Switching (25°C)
VCLAMP(Peak) = 600V
5
ns
500
TJ = +125°C
1577
6
µJ
1187
THERMAL AND MECHANICAL CHARACTERISTICS
Symbol
Characteristic
MIN
TYP
MAX
RΘJC
Junction to Case (IGBT)
.30
RΘJC
Junction to Case (DIODE)
N/A
Package Weight
5.90
WT
UNIT
°C/W
gm
1 Repetitive Rating: Pulse width limited by maximum junction temperature.
2 For Combi devices, Ices includes both IGBT and FRED leakages
3 See MIL-STD-750 Method 3471.
4 Eon1 is the clamped inductive turn-on-energy of the IGBT only, without the effect of a commutating diode reverse recovery current
adding to the IGBT turn-on loss. (See Figure 24.)
5 Eon2 is the clamped inductive turn-on energy that includes a commutating diode reverse recovery current in the IGBT turn-on switching
loss. (See Figures 21, 22.)
6 Eoff is the clamped inductive turn-off energy measured in accordance wtih JEDEC standard JESD24-1. (See Figures 21, 23.)
050-7411
Rev B
4-2003
APT Reserves the right to change, without notice, the specifications and information contained herein.
TYPICAL PERFORMANCE CURVES
APT25GP120B
60
VGE = 15V.
250µs PULSE TEST
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